JP7508998B2 - Scattering prediction device and 3D modeling device - Google Patents

Description

The present invention relates to a scattering prediction device and a three-dimensional modeling device.

Three-dimensional modeling devices directly model three-dimensional objects. They repeat the operation of spreading powdered material such as metal and solidifying the powdered material by irradiating it with an energy beam. For example, Patent Document 1 discloses technology related to powdered metal material used in three-dimensional modeling devices.

JP 2019-178425 A JP 2015-507092 A

There is a known phenomenon in which the powder material scatters due to the irradiation of the powder material with an energy beam. This phenomenon is also called the smoke phenomenon. The scattering of the powder material affects the irradiation of the energy beam on the powder material. For example, if the energy beam is scattered due to the scattering of the powder material, the intensity of the energy beam irradiated on the powder material changes. This affects the quality of the modeled object. Therefore, if a modeling process is performed in a state where powder material scattering has occurred, some kind of response will be required after the fact.

Patent Document 2 points out the problem that scattering of powder material affects the quality of the electron beam. The technology disclosed in Patent Document 2 attempts to solve the problem caused by scattering of powder material by controlling the pressure inside the vacuum chamber. However, this technology deals with the scattering of powder material after the fact. Dealing with the issue after the fact can make it difficult to continue the modeling operation smoothly.

The present invention aims to provide a scattering prediction device that can predict the scattering of powder material and a three-dimensional modeling device that can smoothly continue modeling processing.

One aspect of the present invention is a scattering prediction device that predicts the occurrence of scattering of powder material due to irradiation of a powder material with an energy beam. The scattering prediction device has a light source that irradiates light onto the powder material, a spectrum acquisition unit that obtains the spectrum of light emitted from the powder material irradiated with light, and a processing unit that uses the spectrum to predict the occurrence of scattering of the powder material.

In the scattering prediction device, light is irradiated from a light source onto the powder material. Then, a spectrum of the light emitted from the powder material irradiated with the light is obtained. When there is a high possibility that the powder material will scatter, the spectrum will contain characteristics that do not appear when the powder material will not scatter. In other words, the spectrum can be used to predict the occurrence of powder material scattering. As a result, it is possible to know the occurrence of powder material scattering before the energy beam is irradiated. Therefore, the scattering of the powder material can be predicted.

In one embodiment, the processing unit may include an evaluation value calculation unit that calculates a measurement evaluation value based on the intensity of at least one target wavelength included in the spectrum, and an evaluation unit that predicts the occurrence of scattering of the powder material by comparing the measurement evaluation value with a threshold value. With this configuration, scattering of the powder material can be appropriately predicted.

In one embodiment, the processing unit includes a storage unit that stores a weighting factor set for each intensity of the target wavelength, and the evaluation value calculation unit may calculate a value as the measurement evaluation value by adding up the results of multiplying the intensity of the target wavelength by the weighting factor. With this configuration, it is possible to more appropriately predict the scattering of the powder material.

Another aspect of the present invention is a three-dimensional modeling device that obtains a three-dimensional model by irradiating a powder material with an energy beam. The three-dimensional modeling device includes an irradiation unit that irradiates the powder material with an energy beam, and a scattering prediction unit that predicts the occurrence of scattering of the powder material due to the irradiation of the energy beam to the powder material. The scattering prediction unit includes a light source that irradiates the powder material with light, a spectrum acquisition unit that obtains the spectrum of light emitted from the powder material irradiated with light, and a processing unit that uses the spectrum to predict the occurrence of scattering of the powder material. Since the three-dimensional modeling device includes the scattering prediction unit, it is possible to predict the scattering of the powder material in advance. As a result, it is possible to take the desired action, and the modeling process can be continued smoothly.

The present invention provides a scattering prediction device that can predict scattering of powder material, and also provides a three-dimensional modeling device that can smoothly continue modeling processing.

FIG. 1 is a diagram showing a three-dimensional modeling apparatus according to an embodiment. FIG. 2 is a block diagram showing the configuration of a scattering prediction device according to an embodiment. FIG. 3 is a graph for explaining the principle of predicting scattering. FIG. 4 is a diagram showing a flow of forming an object by a three-dimensional device equipped with a scattering prediction device. FIG. 5 is a block diagram showing the configuration of a scattering prediction device included in a three-dimensional printing apparatus according to a modified example.

Embodiments of the present invention will be described below with reference to the drawings. Note that in the description of the drawings, the same elements are given the same reference numerals, and duplicate descriptions will be omitted.

Figure 1 shows the configuration of a three-dimensional modeling device 1 according to an embodiment. The three-dimensional modeling device 1 models a three-dimensional object by irradiating powder material A with an electron beam B. The three-dimensional modeling device 1 has an electron beam irradiation unit 2, a modeling unit 3, an observation unit 5, and a controller 6.

In this embodiment, an electron beam B is exemplified as an energy beam. The electron beam irradiation unit 2 emits the electron beam B to the powder material A. The emission of the electron beam B is used for pre-heating the powder material A before the molding operation. The emission of the electron beam B is also used for melting the powder material A in the molding operation. Note that the energy beam is not limited to the electron beam B. For example, the energy beam may be a laser.

The electron beam irradiation unit 2 has an electron gun 21, a convergence coil 22, and a deflection coil 23. The electron gun 21, the convergence coil 22, and the deflection coil 23 are installed, for example, inside a cylindrical column 24. The electron gun 21 is electrically connected to the controller 6. The electron gun 21 is arranged at a position facing a modeling table 31 described later. The electron gun 21 generates an electron beam B based on a control signal from the controller 6. The convergence coil 22 is electrically connected to the controller 6. The convergence coil 22 is arranged to surround the electron beam B. The convergence coil 22 performs an operation to converge the electron beam B based on a control signal from the controller 6. The deflection coil 23 is electrically connected to the controller 6. The deflection coil 23 is arranged to surround the electron beam B. The deflection coil 23 is arranged at a position closer to the powder material A than the convergence coil 22. The deflection coil 23 adjusts the position at which the electron beam B is irradiated in the powder material A based on a control signal from the controller 6. The deflection coil 23 electromagnetically controls the irradiation direction of the electron beam B.

The modeling section 3 has a chamber 30, a modeling table 31, a table lifting mechanism 32, and a powder material supply mechanism 33.

The modeling table 31 supports the object to be modeled. The modeling table 31 has a circular shape in a plan view, for example. The modeling table 31 can also have a plate-like shape. The modeling table 31 is disposed on an extension of the emission direction of the electron beam B. The main surface of the modeling table 31 that supports the modeled object intersects with the emission direction of the electron beam B. A table lifting mechanism 32 is attached to the rear surface of the modeling table 31. The modeling table 31 can be moved up and down by the table lifting mechanism 32.

The table lifting mechanism 32 lifts and lowers the modeling table 31 in the vertical direction. The table lifting mechanism 32 has a lifting stage 32a and a drive mechanism 32b. The lifting stage 32a holds the powder material A deposited in the modeling tank 34. Specifically, the lifting stage 32a has a planar shape that follows the inner peripheral surface of the modeling tank 34. With this configuration, the lifting stage 32a functions as the bottom surface of the modeling tank 34. The gap between the modeling tank 34 and the lifting stage 32a is set to a degree that allows the lifting stage 32a to move smoothly relative to the modeling tank 34 and prevents the powder material A from leaking out. The drive mechanism 32b is electrically connected to the controller 6. The drive mechanism 32b controls the position of the modeling table 31 based on a control signal from the controller 6. There is no particular limitation on the specific configuration of the drive mechanism 32b. Any mechanism or power source may be used as long as the lifting stage 32a can be moved back and forth in the vertical direction.

The powder material supply mechanism 33 has a hopper 33a and a rake 33b. The hopper 33a stores powder material A. The bottom of the hopper 33a is provided with a discharge port for discharging the powder material A. The powder material A discharged from the hopper 33a is moved to the modeling table 31 by the rake 33b. A rod-shaped or plate-shaped member is used for the rake 33b. The rake 33b moves horizontally to transport the powder material A from the bottom of the hopper 33a to the modeling table 31. Furthermore, the rake 33b smoothes the surface of the powder material A on the modeling table 31. For example, the operation of transporting the powder material A and the operation of smoothing the surface of the transported powder material A may be collectively referred to as the "operation of spreading powder material A."

The powder material A includes a large number of powder bodies. For example, a metal powder may be used as the powder material A. In addition, as the powder material A, particles having a larger particle size than the powder may be used as long as they can be melted and solidified by irradiation with the electron beam B.

The observation section 5 has a light source 5a and an imaging device 5b. The light source 5a irradiates light onto the powder material A. The light source 5a is disposed inside the chamber 30. The light source 5a may also be disposed outside the chamber 30. In this case, light is irradiated onto the powder material A through a window provided in the chamber 30. The specific configuration of the light source 5a may be selected according to the wavelength of the light to be irradiated onto the powder material A. For example, a halogen lamp, an LED light source, a xenon lamp, or the like may be used as the light source 5a.

The imaging device 5b captures an image of the powder material A illuminated by the light of the light source 5a. The imaging area of the imaging device 5b includes, for example, the entire main surface of the modeling table 31. In other words, the imaging area includes an area that can be irradiated with the electron beam B. The imaging device 5b is disposed inside the chamber 30, similar to the light source 5a. The imaging device 5b may also be disposed outside the chamber 30. In this case, the imaging device 5b captures an image of the powder material A through a window provided in the chamber 30.

The imaging device 5b is a so-called hyperspectral camera. The image data output by a general camera includes the intensity of the red component (R component), the intensity of the green component (G component), and the intensity of the blue component (B component) for each pixel. In other words, there are three wavelength components. The image data output by a hyperspectral camera includes even more wavelength components. If the number of wavelength components of a general camera is three, then it can be said that the number of wavelength components of a hyperspectral camera is four or more. With this increase in wavelength components, a spectrum showing the intensity of each wavelength component of the received light can be obtained.

A hyperspectral camera obtains a spectrum of light for each pixel. There are no particular limitations on the format of image data output by the imaging device 5b, which is a hyperspectral camera. In this embodiment, the imaging device 5b outputs one piece of image data for each imaging session. This image data includes information about the spectrum for each pixel. For example, by focusing on a certain pixel, it is possible to know the distribution of the intensity of the light components for each wavelength at that pixel. Note that the wavelength band of light targeted by the imaging device 5b is not limited to visible light. For example, the wavelength band of light targeted by the imaging device 5b may include the wavelength band of infrared light in addition to the wavelength band of visible light.

The controller 6 is an electronic control unit that controls the entire 3D modeling device 1, and is, for example, a computer including a CPU, ROM, and RAM. The controller 6 controls the operation of the electron beam irradiation unit 2 and the modeling unit 3. The controller 6 also controls the operation of the observation unit 5, and processes data input from the observation unit 5.

The observation unit 5 and the controller 6 constitute a scattering prediction device 7 (scattering prediction unit) shown in FIG. 2. The scattering prediction device 7 is applied to the three-dimensional modeling device 1, and predicts the occurrence of scattering of the powder material A using the results of observing the powder material A. For example, the controller 6 uses the results of the evaluation to determine whether or not to start the modeling operation, i.e., the irradiation of the electron beam B. The results output by the scattering prediction device 7 may be used for purposes other than controlling the irradiation of the electron beam B. For example, the results may be used to determine whether to discard the powder material A that is used repeatedly, or to determine whether to replace the powder material A. Furthermore, the results may be used to determine whether to mix a new powder material A with a powder material A that has been used multiple times.

The controller 6 has a processing unit 8 for predicting the scattering of powder material A. The processing unit 8 is a functional component. Furthermore, the processing unit 8 has a number of functional components that execute individual processes for predicting the scattering of powder material A. These functional components are realized by the CPU executing a program. The functional components are described in detail below.

The memory unit 8a stores information used in the process of predicting the scattering of powder material A. This information includes prediction conditions used in the prediction and thresholds that constitute the prediction conditions. The memory unit 8a may also temporarily store image data, etc.

The inventors have come to realize that there is a difference in the characteristics of the light caused by powder material A when comparing powder material A that has undergone scattering with powder material A that has not undergone scattering. The light caused by powder material A that is prone to scattering contains characteristic wavelength components. In other words, the scattering prediction device 7 uses these wavelength components to predict the degree of the possibility of scattering occurring. It is believed that this difference in wavelength components is caused by the layer structure on the surface of powder material A.

For example, information about characteristic wavelength components can be indicated using a certain measurement evaluation value. This measurement evaluation value is calculated using a weighting coefficient set for each wavelength and the intensity for each wavelength. The intensity for each wavelength is obtained from the spectrum. Then, each wavelength is multiplied by a weighting coefficient, and all the obtained values are added together. Here, the relevance to the occurrence of scattering of powder material A can be taken into consideration using the weighting coefficient set for each wavelength. Wavelengths that are estimated to be highly relevant to the occurrence of scattering of powder material A are given more importance in the evaluation. Therefore, a weighting coefficient with a large absolute value is set. Note that the weighting coefficient may be either positive or negative.

Figure 3 is a graph showing an example of the relationship between the number of uses of powder material A and the evaluation value. Referring to Figure 3, it can be seen that the evaluation value tends to decrease as the number of uses increases. When using the analysis results shown in Figure 3, an example of a prediction condition is "whether the measurement evaluation value is equal to or less than a threshold value," and 0.5 can be shown as an example of the threshold value. In other words, if the measurement evaluation value is greater than 0.5, it can be evaluated that there is a low possibility that scattering of powder material A will occur. On the other hand, if the measurement evaluation value is less than 0.5, it can be evaluated that there is a high possibility that scattering of powder material A will occur.

The parameters and weighting coefficients used in the prediction may be calculated using a desired statistical processing method. For example, principal component analysis may be used as a statistical processing method. Alternatively, factor analysis or analysis using an ISO map may be used as another method.

The image data input unit 8b receives image data from the hyperspectral camera, which is the imaging device 5b. As described above, the imaging device 5b outputs one piece of image data for each imaging operation. This image data includes a spectrum for each pixel. The image data input unit 8b outputs the received image data to the storage unit 8a. Note that the image data input unit 8b may output the image data to the image segmentation processing unit 8c when processing is performed for each imaging operation.

The image segmentation processing unit 8c and the representative spectrum calculation unit 8d compress the image data. Since image data contains a spectrum for each pixel, the amount of data is enormous. Therefore, the image segmentation processing unit 8c and the representative spectrum calculation unit 8d compress the data to an amount that corresponds to the processing capacity of the controller 6. Note that if the processing capacity of the controller 6 is sufficient and processing is possible for each pixel, the image segmentation processing unit 8c and the representative spectrum calculation unit 8d may be omitted.

The image segmentation processing unit 8c selects multiple pixels. The image segmentation processing unit 8c sets this group of pixels as one processing area. For example, the image segmentation processing unit 8c may select nine pixels. In this case, a 3 x 3 pixel area is set as one processing area. The image segmentation processing unit 8c selects pixels and sets processing areas across the entire image data.

The representative spectrum calculation unit 8d uses the multiple individual spectra to calculate a representative spectrum that represents the characteristics of the multiple individual spectra. The multiple individual spectra are possessed by each of the multiple pixels included in one processing area. There are no particular limitations on the calculation method for calculating one representative spectrum from the multiple individual spectra. For example, the representative spectrum may be the average of the multiple individual spectra.

The evaluation value calculation unit 8e calculates a measurement evaluation value from the representative spectrum. The measurement evaluation value is used to predict the occurrence of scattering of powder material A. This measurement evaluation value is obtained by first obtaining the intensity for each wavelength from the representative spectrum. Next, each intensity is multiplied by a weighting coefficient and then all the intensities are added together.

The evaluation unit 8f evaluates whether the measurement evaluation value satisfies the prediction condition. The prediction condition may be, for example, "the measurement evaluation value is smaller than a threshold value." In other words, when the measurement evaluation value is smaller than the threshold value, the evaluation unit 8f evaluates that there is a high possibility that scattering of powder material A will occur. Conversely, when the measurement evaluation value is larger than the threshold value, the evaluation unit 8f evaluates that there is a low possibility that scattering of powder material A will occur.

The output unit 8g outputs the results of the evaluation unit 8f according to the usage mode of the downstream device. For example, when the results of the evaluation unit 8f are used to evaluate the start of irradiation of the electron beam B, the output unit 8g outputs information to an electron beam control unit (not shown) to permit or prohibit emission.

The operation of the three-dimensional modeling device 1 including the scattering prediction device 7 will be described below with reference to the flow diagram shown in Figure 4.

First, the powder material A is laid (step S1). This operation is performed by the powder material supply mechanism 33. Next, irradiation of the illumination light L is started (step S2). This operation is performed by the light source 5a. The start of irradiation of the illumination light L may be controlled by a control signal output by the controller 6. Next, the powder material A is imaged (step S3). This operation is performed by the imaging device 5b and the image data input unit 8b. Note that the imaging operation by the imaging device 5b may be, for example, a one-time imaging of a two-dimensional image to obtain image data, or may be a so-called line scan to obtain image data. Next, the image data is divided into a plurality of processing regions (step S4). This operation is performed by the image division processing unit 8c. Next, a representative spectrum is obtained for each processing region (step S5). This operation is performed by the representative spectrum calculation unit 8d. Next, a measurement evaluation value is obtained using the representative spectrum (step S6). This operation is performed by the evaluation value calculation unit 8e.

Next, the measurement evaluation value is evaluated (step S7). This operation is performed by the evaluation unit 8f. The evaluation unit 8f performs processing using, for example, "Is the measurement evaluation value smaller than a threshold value?" as a prediction condition. If the measurement evaluation value is smaller than the threshold value, it is evaluated that there is a high possibility that scattering of powder material A will occur (step S7: YES). On the other hand, if the measurement evaluation value is larger than the threshold value, it is evaluated that there is a low possibility that scattering of powder material A will occur (step S7: NO). This step S7 is performed for each processing area. In other words, step S7 is executed multiple times.

The output unit 8g uses the results of the evaluation unit 8f to provide information to another functional component. For example, if the evaluation result indicates that there is a high possibility that the powder material A will scatter and it is not appropriate to continue the modeling operation, the output unit 8g provides information to the element that generates a control signal to the electron beam irradiation unit 2 to the effect that emission is prohibited (step S8a). Conversely, if there is a low possibility that the powder material A will scatter and it is appropriate to continue the modeling operation, the output unit 8g provides information to the element that generates a control signal to the electron beam irradiation unit 2 to the effect that emission is permitted (step S8b).

The three-dimensional modeling device 1 has an electron beam irradiation unit 2 that irradiates powder material A with an electron beam B, and a scattering prediction device 7 that predicts the occurrence of scattering of powder material A caused by the irradiation of powder material A with electron beam B. The scattering prediction device 7 has a light source 5a that irradiates light to powder material A, an imaging device 5b that obtains the spectrum of light emitted from powder material A that is irradiated with light, and a processing unit 8 that predicts the occurrence of scattering of powder material A using the spectrum of light.

The scattering prediction device 7 acquires a two-dimensional spectrum of powder material A using the imaging device 5b, which is a hyperspectral camera. The acquired spectrum is provided to a principal component analysis based on parameters such as the number of times of use and the type of material of powder material A. This analysis makes it possible to know the parameters that are highly related to the occurrence of scattering of powder material A. Then, the imaging device 5b is used to acquire a spectrum of the powder material A to be used in the actual modeling operation. By analyzing the spectrum, it is possible to predict the occurrence of scattering of powder material A before the temperature is raised.

In the scattering prediction device 7, light is irradiated from the light source 5a onto the powder material A. Then, the spectrum of the light emitted from the powder material A irradiated with the light is obtained. If there is a high possibility that scattering of the powder material A will occur when the powder material A is irradiated with the electron beam B, a specific tendency will appear in the spectrum. In other words, the occurrence of scattering of the powder material A is predicted using the spectrum. As a result, it is possible to know the possibility of scattering of the powder material A before irradiating the electron beam B. Therefore, since the possibility of scattering of the powder material A can be known in advance, it is possible to take measures to smoothly continue the modeling process.

In other words, the scattering prediction device 7 makes it possible to predict the occurrence of scattering of the powder material A before the temperature actually rises and scattering of the powder material A occurs. Therefore, it is possible to prevent the modeling operation from being stopped due to the actual scattering of the powder material A. The three-dimensional modeling device 1 makes it possible to evaluate whether the powder material A is usable before actually modeling. Furthermore, the effect of mixing unused powder material A for reuse can be confirmed before the actual modeling operation. Furthermore, the three-dimensional modeling device 1 makes it possible to evaluate the possibility of scattering of the powder material A for each location in the evenly spread powder material A. In other words, even if there is unevenness in the state of the powder material A, it is also possible to identify the location where the powder material A exists where scattering of the powder material A is likely to occur.

The scattering prediction device 7 includes an evaluation value calculation unit 8e that calculates a measurement evaluation value based on the intensity of at least one target wavelength included in the spectrum, and an evaluation unit 8f that predicts the occurrence of scattering of powder material A by comparing the measurement evaluation value with a threshold value. This configuration makes it possible to appropriately evaluate the possibility of scattering of powder material A.

The evaluation unit 8f includes a storage unit 8a that stores a weighting factor set for each intensity of the target wavelength. The evaluation value calculation unit 8e calculates the measurement evaluation value by adding up the values obtained by multiplying the intensity of the target wavelength by the weighting factor. This configuration makes it possible to more appropriately evaluate the possibility of scattering of powder material A.

The scattering prediction device 7 is composed of a light source 5a, an imaging device 5b, and an evaluation unit 8f. The light source 5a irradiates light onto the powder material A. The imaging device 5b obtains the spectrum of light emitted from the powder material A being irradiated with light. The evaluation unit 8f predicts the occurrence of scattering of the powder material A. The scattering prediction device 7 can evaluate the possibility of scattering of the powder material A by utilizing the spectrum of light emitted by the powder material A. Therefore, the scattering prediction device 7 can provide information for smoothly continuing the modeling process.

The present invention has been described in detail above based on the embodiments. However, the present invention is not limited to the above embodiments. The present invention can be modified in various ways without departing from the gist of the invention.

For example, in the embodiment, the imaging device 5b is exemplified as the spectrum acquisition unit. Furthermore, a hyperspectral camera is exemplified as an example of this imaging device 5b. The spectrum acquisition unit is not limited to this configuration. The possibility of scattering of powder material A is evaluated using the light intensity of a specific wavelength. In the embodiment, in the stage of acquiring the spectrum, a method is adopted in which the light intensity of a wide wavelength band is acquired and then the light intensity of a specific wavelength is selected. In a modified example, in the stage of acquiring the spectrum, attention is paid to the light intensity of a specific wavelength component.

As shown in FIG. 5, the scattering prediction device 7A includes an observation unit 5A. The observation unit 5A has a spectrum acquisition unit 5S, which has a spectroscope 5c and an optical sensor 5d. The spectroscope 5c separates light emitted from a position corresponding to the processing area of the powder material A. In other words, the spectroscope 5c extracts wavelength components that are highly related to the scattering of the powder material A. The spectroscope 5c may be, for example, an optical filter that transmits specific wavelength components. The optical sensor 5d acquires the light intensity of the extracted wavelength components. The optical sensor 5d may be a photodetector.

In short, the modified three-dimensional modeling apparatus 1A has a scattering prediction device 7A. The spectrum acquisition unit 5S of the scattering prediction device 7A includes a spectroscope 5c (spectroscope section) that extracts light components of a target wavelength from light, and a light sensor 5d (intensity measurement section) that obtains the intensity of the light components output from the spectroscope 5c. With this configuration, the amount of information contained in the spectrum can be reduced. Therefore, the processing load for evaluating the possibility of scattering of powder material A can be reduced.

In the above embodiment, a flow is illustrated in which the process S1 of spreading powder material A, the processes S2 to S7 of evaluating the scattering of powder material A, and the process S8b of modeling are performed in this order. For example, the processes S2 to S7 of evaluating the scattering of powder material A and the process S8b of modeling may be performed in parallel. In other words, the scattering prediction device 7 may evaluate the possibility of scattering of powder material A in the area ahead in the traveling direction from the position where the electron beam B is irradiated.

The scattering prediction device is not limited to application to three-dimensional modeling devices. The scattering prediction device can be applied to devices that employ a configuration in which an energy beam is irradiated onto a powder material. For example, it may be applied to a transmission electron microscope (TEM) or a scanning electron microscope (SEM).

1 Three-dimensional modeling device 2 Electron beam irradiation unit (irradiation unit)
3 Modeling unit 5 Observation unit 5a Light source 5b Imaging device (spectrum acquisition unit)
6 Controller 7 Scattering prediction device (scattering prediction unit)
8 Processing section 8a Memory section 8b Image data input section 8c Image division processing section 8d Representative spectrum calculation section 8e Evaluation value calculation section 8f Evaluation section 8g Output section A Powder material B Electron beam (energy beam)

Claims (4)

1. A scattering prediction device for predicting the occurrence of scattering of a powder material caused by irradiation of the powder material with an energy beam, comprising:
A light source that irradiates the powder material with light;
a spectrum acquisition unit for acquiring a spectrum of light emitted from the powder material irradiated with the light;
A dispersion prediction device having a processing unit that predicts the occurrence of dispersion of the powder material using a measurement evaluation value obtained by considering at least one target wavelength contained in the spectrum and its relevance to the occurrence of dispersion of the powder material. The processing unit includes:
an evaluation value calculation unit that calculates a measurement evaluation value based on the intensity of at least one target wavelength included in the spectrum;
The scattering prediction device according to claim 1 , further comprising an evaluation unit that predicts the occurrence of scattering of the powder material by comparing the measurement evaluation value with a threshold value. The processing unit includes a storage unit that stores a weighting coefficient set for each intensity of the target wavelength,
The scattering prediction device according to claim 2 , wherein the evaluation value calculation unit calculates, as the measurement evaluation value, a value obtained by adding together results obtained by multiplying the intensities of the target wavelengths by the weighting coefficients. A three-dimensional modeling apparatus for obtaining a three-dimensional object by irradiating a powder material with an energy beam, comprising:
an irradiation unit that irradiates the powder material with an energy beam;
a scattering prediction unit that predicts the occurrence of scattering of the powder material caused by the irradiation of the powder material with the energy beam,
The scattering prediction unit is
A light source that irradiates the powder material with light;
a spectrum acquisition unit for acquiring a spectrum of light emitted from the powder material irradiated with the light;
A three-dimensional printing apparatus comprising: a processing unit that predicts the occurrence of powder material scattering using a measurement evaluation value obtained by considering the relevance of at least one target wavelength included in the spectrum to the occurrence of powder material scattering.

Images