JP7453718B1 - Surface potential measuring device - Google Patents

Surface potential measuring device Download PDF

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JP7453718B1
JP7453718B1 JP2023171212A JP2023171212A JP7453718B1 JP 7453718 B1 JP7453718 B1 JP 7453718B1 JP 2023171212 A JP2023171212 A JP 2023171212A JP 2023171212 A JP2023171212 A JP 2023171212A JP 7453718 B1 JP7453718 B1 JP 7453718B1
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case
surface potential
measuring device
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detection window
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智史 最上
和樹 峯村
剛幸 稲川
隆 池畑
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Kasuga Denki Inc
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Abstract

【課題】 プラズマを用いた除電が必要な真空下でも、正確な測定ができる表面電位測定装置を提供すること。【解決手段】 検出窓2を開口させ、接地された金属製のケース1と、上記ケース1内に配置され、上記検出窓2に対応する位置に設けられた検出電極5と、上記検出電極5が接続された検出回路と、上記検出電極及び検出回路を支持する電気絶縁性の基板6とを備えた表面電位測定装置であって、上記ケース1が永久磁石M1,M2を備え、上記検出窓2上を磁力線Bが通過する構成にした。【選択図】 図2[Problem] To provide a surface potential measuring device capable of accurate measurement even in a vacuum where static elimination using plasma is necessary. [Solution] The surface potential measuring device comprises a grounded metal case 1 with a detection window 2 open, a detection electrode 5 disposed within the case 1 and provided at a position corresponding to the detection window 2, a detection circuit to which the detection electrode 5 is connected, and an electrically insulating substrate 6 supporting the detection electrode and detection circuit, in which the case 1 is equipped with permanent magnets M1, M2, and magnetic field lines B pass over the detection window 2. [Selected Figure] Figure 2

Description

この発明は、表面電位測定装置に関する。 The present invention relates to a surface potential measuring device.

物体の表面電位を非接触で測定する表面電位測定装置が知られている。
この種の測定装置は、例えば、図6に示すように、検出窓2を有する金属製のケース1内に、圧電素子3を付設した振動子4、検出電極5、信号の検出回路及び振動子4の駆動回路などを備えた電気絶縁性の基板6が設けられている。
上記振動子4は検出窓2と検出電極5との間に位置し、その振動によって、検出電極5に対向する検出窓2を開閉する。そして、この振動子4が、検出窓2に正対させた帯電した測定対象である帯電物体Wの表面から検出電極へ向かう電気力線をチョッピングして、上記電気力線を交流電圧として検出回路が検出する。この交流電圧から、測定対象の表面電位を検出するものである(特許文献1,2参照)。
Surface potential measuring devices that measure the surface potential of an object in a non-contact manner are known.
For example, as shown in FIG. 6, this type of measuring device includes a metal case 1 having a detection window 2, a vibrator 4 provided with a piezoelectric element 3, a detection electrode 5, a signal detection circuit, and a vibrator. An electrically insulating substrate 6 having a drive circuit 4 and the like is provided.
The vibrator 4 is located between the detection window 2 and the detection electrode 5, and opens and closes the detection window 2 facing the detection electrode 5 by its vibration. Then, the vibrator 4 chops the lines of electric force from the surface of the charged object W, which is the charged object to be measured, directly facing the detection window 2 toward the detection electrode, and converts the lines of electric force into an alternating current voltage for the detection circuit. is detected. The surface potential of the object to be measured is detected from this AC voltage (see Patent Documents 1 and 2).

特開2007-212209号公報Japanese Patent Application Publication No. 2007-212209 特開2003-021656号公報Japanese Patent Application Publication No. 2003-021656 特開2018-056115号公報JP2018-056115A

このような測定装置は、帯電物体を除電した際に、その除電効果を確認するために用いられることがあり、表面電位測定装置が除電工程の近傍に設けられることがある。
一方、真空下での帯電物体を除電する際には、プラズマを利用することがある。真空中では、コロナ放電などを利用した除電器を用いることができないためである。
上記プラズマを用いた除電装置では、真空チャンバ内に供給されたプラズマが、帯電物体の表面と真空チャンバ壁などの接地体との間を連結する導体として機能し、帯電物体の表面電荷を接地へ流して除電することができる(特許文献3参照)。
Such a measuring device is sometimes used to check the static elimination effect when a charged object is neutralized, and a surface potential measuring device is sometimes provided near the static eliminating process.
On the other hand, plasma may be used to remove static electricity from a charged object in a vacuum. This is because a static eliminator that uses corona discharge or the like cannot be used in a vacuum.
In the above-mentioned plasma-based static eliminator, the plasma supplied into the vacuum chamber functions as a conductor connecting the surface of the charged object and a grounded object such as the wall of the vacuum chamber, and transfers the surface charge of the charged object to the ground. Static electricity can be removed by flowing the electricity (see Patent Document 3).

上記のような真空下で、除電及び表面電位の測定を行なうため、帯電電位測定装置のケース1は、予め真空チャンバ内に設置しておく。
なお、上記真空下とは例えば、1×10-3〔Pa〕程度である。
このような真空下で、除電のためにプラズマを供給すると、プラズマは短時間で拡散する。特にプラズマ中の電子は広がりやすい。そのため、帯電物体Wの近傍に供給されたプラズマ中の電子は、検出窓2からケース1内に入り込んでしまいやすい。
In order to perform static elimination and surface potential measurement under vacuum as described above, the case 1 of the charged potential measuring device is placed in a vacuum chamber in advance.
Note that the above-mentioned vacuum condition is, for example, about 1×10 −3 [Pa].
When plasma is supplied to eliminate static electricity under such a vacuum, the plasma diffuses in a short time. In particular, electrons in plasma spread easily. Therefore, electrons in the plasma supplied near the charged object W tend to enter the case 1 through the detection window 2.

ケース1内には、上記したように電気絶縁性の基板6が設けられている。図6のように、検出窓2からケース1に電子eが入り込めば、基板6は入り込んだ電子eによって帯電してしまう。
ケース1内で、基板6が帯電すると、検出電極5は、測定対象である帯電物体Wの表面電位とともに上記基板6の表面電位も検出してしまう。特に、基板6は、測定対象である帯電物体Wよりも、検出電極5に近いため、基板6の表面電位の影響は大きい。つまり、プラズマ除電を必要とするような環境下で、正確な表面電位測定をすることはできなかった。
Inside the case 1, the electrically insulating substrate 6 is provided as described above. As shown in FIG. 6, if electrons e enter the case 1 through the detection window 2, the substrate 6 will be charged by the electrons e that have entered.
When the substrate 6 is charged in the case 1, the detection electrode 5 detects the surface potential of the substrate 6 as well as the surface potential of the charged object W to be measured. In particular, since the substrate 6 is closer to the detection electrode 5 than the charged object W to be measured, the influence of the surface potential of the substrate 6 is large. In other words, it was not possible to accurately measure the surface potential in an environment that required plasma static elimination.

この発明の目的は、プラズマを用いた除電が必要な真空下でも、正確な測定ができる表面電位測定装置を提供することである。 An object of the present invention is to provide a surface potential measuring device that can perform accurate measurements even under a vacuum that requires static elimination using plasma.

第1の発明は、プラズマが存在する真空下に設置され、測定対象に対向した検出窓を開口させるとともに、接地された金属製のケースと、上記ケース内に配置され、上記検出窓に対応する位置に設けられた検出電極と、上記検出電極が接続された検出回路と、上記検出電極及び検出回路を支持する電気絶縁性の基板とを備えた表面電位測定装置であって、上記ケースが永久磁石を備え、上記検出窓上を磁力線が通過する構成にされ、上記プラズマ中の上記検出窓近傍の電子が上記磁力線によって当該磁力線の周囲を旋回して上記ケースに衝突し、上記ケースを介してアースへ流れる構成にしている。 The first invention includes a metal case that is installed in a vacuum where plasma exists, has a detection window facing the measurement target opened, and is grounded, and a metal case that is placed in the case and corresponds to the detection window. A surface potential measuring device comprising a detection electrode provided at a position, a detection circuit to which the detection electrode is connected, and an electrically insulating substrate supporting the detection electrode and the detection circuit, wherein the case is permanent. A magnet is provided, and the magnetic field lines are configured to pass over the detection window, and the electrons in the plasma near the detection window are rotated around the magnetic field lines by the magnetic field lines, collide with the case, and pass through the case. The configuration is such that it flows to ground .

第2の発明は、上記ケースが非磁性金属で形成され、その外表面に上記検出窓を挟む上記永久磁石を備えている。 In a second aspect of the present invention, the case is made of a non-magnetic metal, and includes the permanent magnet sandwiching the detection window on its outer surface.

第3の発明は、上記ケースが磁性金属で形成されている。 In a third invention, the case is made of magnetic metal.

第1の発明によれば、検出窓に接近したプラズマ中の電子が、永久磁石の磁力によって磁力線の周りを旋回してケースに衝突するので、ケース内に進入することがない。また、ケース内に電子が進入したとしても、電子はケース内でも磁力線の周りを旋回してケースの内壁に衝突する。したがって、ケース内の基板が、検出窓から入り込んだ電子で帯電することはない。さらに、金属製のケースは接地されているので、ケースに衝突した電子は接地へ流れ、ケースを帯電させることもない。
そのため、検出電極は、測定対象の表面電位を正確に測定することができる。
According to the first invention, electrons in the plasma that approach the detection window rotate around the magnetic lines of force due to the magnetic force of the permanent magnet and collide with the case, so that they do not enter the case. Further, even if electrons enter the case, the electrons rotate around the magnetic lines of force within the case and collide with the inner wall of the case. Therefore, the board inside the case will not be charged by electrons that enter through the detection window. Furthermore, since the metal case is grounded, electrons that collide with the case flow to the ground and do not charge the case.
Therefore, the detection electrode can accurately measure the surface potential of the measurement target.

第2の発明によれば、磁力線の方向がケースの形状に影響されにくいので、検出窓から電子が入り込み難い磁界を永久磁石の位置だけで設定できる。 According to the second invention, since the direction of the magnetic lines of force is not easily influenced by the shape of the case, a magnetic field that prevents electrons from entering through the detection window can be set only by the position of the permanent magnet.

第3の発明によれば、磁性金属製のケースによって、ケース外の磁界の広がりを抑えて、検出窓近傍に磁力線を集中させることができる。また、外部の電子機器への磁界の影響を少なくできる。 According to the third invention, the case made of magnetic metal can suppress the spread of the magnetic field outside the case and concentrate the lines of magnetic force near the detection window. Furthermore, the influence of the magnetic field on external electronic equipment can be reduced.

図1は、第1実施形態の外観斜視図である。FIG. 1 is an external perspective view of the first embodiment. 図2は、第1実施形態の断面図である。FIG. 2 is a cross-sectional view of the first embodiment. 図3は、第1実形態の検出窓付近の磁場を示した図である。FIG. 3 is a diagram showing the magnetic field near the detection window of the first embodiment. 図4は、従来装置、第1実施形態との表面電位測定結果を示すグラフである。FIG. 4 is a graph showing the surface potential measurement results of the conventional device and the first embodiment. 図5は、第2実施形態の断面図である。FIG. 5 is a cross-sectional view of the second embodiment. 図6は、従来の表面電位測定装置の断面図である。FIG. 6 is a cross-sectional view of a conventional surface potential measuring device.

[第1実施形態]
図1~3を用いて第1実施形態を説明する。
図1は、第1実施形態の外観斜視図、図2は図1の断面図、図3は磁場を示した図である。外形が四角柱の非磁性金属製のケース1の対向する一対の外側面(外表面)に、永久磁石M1,M2を取り付けた表面電位測定装置である。
上記永久磁石M1,M2以外は、図6に示す従来の測定装置を同じで、ケース1内には、圧電素子3、振動子4,検出電極5及び基板6が設けられている。
また、ケース1は接地されている。
[First embodiment]
The first embodiment will be described using FIGS. 1 to 3.
FIG. 1 is an external perspective view of the first embodiment, FIG. 2 is a sectional view of FIG. 1, and FIG. 3 is a diagram showing a magnetic field. This is a surface potential measuring device in which permanent magnets M1 and M2 are attached to a pair of opposing outer surfaces (outer surfaces) of a case 1 made of non-magnetic metal and having a square prism outer shape.
Except for the permanent magnets M1 and M2, the conventional measuring device shown in FIG. 6 is the same as the conventional measuring device shown in FIG.
Further, the case 1 is grounded.

永久磁石M1,M2は、略平板形状をなしている。永久磁石M1,M2は、非磁性の金属板をコの字状に曲げ加工したカバー7の内側面に取り付けられ、カバー7を介してケース1に取り付けられている。これにより、永久磁石M1,M2は、検出窓2を挟んで同一平面に位置するように配置されている。カバー7には、検出窓2を露出させる開口7aが形成されている。
一対の永久磁石M1,M2は、図2,3に示すように、一方の永久磁石M1のS極と他方の永久磁石M2のN極とが、検出窓2を挟んで対向するように配置されている。したがって、永久磁石M1,M2は、検出窓2の開口面を、細線の矢印で示した磁力線Bが横切る、すなわち検出窓2上を磁力線Bが通過するように表面電位測定装置において構成されている。
Permanent magnets M1 and M2 have a substantially flat plate shape. The permanent magnets M1 and M2 are attached to the inner surface of a cover 7 made of a non-magnetic metal plate bent into a U-shape, and are attached to the case 1 via the cover 7. Thereby, the permanent magnets M1 and M2 are arranged so as to be located on the same plane with the detection window 2 in between. The cover 7 has an opening 7a that exposes the detection window 2.
As shown in FIGS. 2 and 3, the pair of permanent magnets M1 and M2 are arranged such that the S pole of one permanent magnet M1 and the N pole of the other permanent magnet M2 face each other with the detection window 2 in between. ing. Therefore, the permanent magnets M1 and M2 are configured in the surface potential measuring device so that the line of magnetic force B shown by the thin arrow crosses the opening surface of the detection window 2, that is, the line of magnetic force B passes over the detection window 2. .

[作用・効果等]
上記のような表面電位測定装置を真空チャンバ内に設置した状態で、検出窓2に対向配置された測定対象である帯電物体を、プラズマによって除電する場合について説明する。なお、真空チャンバの壁面は接地されている。
除電用に供給されたプラズマは、真空チャンバ内で広がり、帯電物体W表面と接地された真空チャンバの壁面や、ケース1との間を連携する導体として機能し、帯電物体Wの表面の電荷を除電することができる。
[Action/effect, etc.]
A case will be described in which a charged object to be measured, which is placed opposite to the detection window 2, is neutralized by plasma while the surface potential measuring device as described above is installed in a vacuum chamber. Note that the wall surface of the vacuum chamber is grounded.
The plasma supplied for static elimination spreads within the vacuum chamber, functions as a conductor that connects the surface of the charged object W with the grounded wall of the vacuum chamber, and the case 1, and removes the charge on the surface of the charged object W. Static electricity can be removed.

このように、除電に寄与したプラズマ中の電子やイオンのほとんどは、直ちに、図示していない真空チャンバの壁面などの接地体と接触してアースへ流れてしまうが、中には、検出窓2に向かう電子eもある(図6参照)。
このような電子eが、ケース1の検出窓2からケース1内に入り込めば、基板6が帯電してしまう。
In this way, most of the electrons and ions in the plasma that contributed to static elimination immediately come into contact with a grounding object such as the wall of the vacuum chamber (not shown) and flow to the ground. There is also an electron e heading towards (see Figure 6).
If such electrons e enter the case 1 through the detection window 2 of the case 1, the substrate 6 will be charged.

ところが、この第1実施形態では、検出窓2の近傍に検出窓2の開口を横切る磁力線Bがある。そのため、検出窓2に接近した電子は、この磁力線Bの周囲を図3に示す太線の矢印のように旋回しながら移動する。この旋回過程で、電子eはケース1に衝突して、アースへ流れるため、磁力線Bと交差してケース1内に入り込むことはない。したがって、電子eがケース1内で、基板6を帯電させることはない。 However, in the first embodiment, there are lines of magnetic force B near the detection window 2 that cross the opening of the detection window 2. Therefore, the electrons approaching the detection window 2 move around the lines of magnetic force B while turning as indicated by the bold line arrows in FIG. During this swirling process, the electrons e collide with the case 1 and flow to the ground, so they do not intersect the magnetic lines of force B and enter the case 1. Therefore, the electrons e do not charge the substrate 6 within the case 1.

そのため、帯電物体Wを除電処理した後に、その表面電位を測定する際に、基板6の帯電電位が、帯電物体Wの表面電位の測定に影響を与えることはない。つまり、正確な測定結果が得られる。 Therefore, when measuring the surface potential of the charged object W after the charged object W is subjected to static elimination processing, the charged potential of the substrate 6 does not affect the measurement of the surface potential of the charged object W. In other words, accurate measurement results can be obtained.

[確認実験]
第1実施形態の表面電位測定装置と、従来の表面電位測定装置とを比較する実験を行なった。
従来の表面電位測定装置は、永久磁石M1,M2を備えていない以外は、第1実施形態の表面電位測定装置と同じ構成である。
これらの表面電位測定装置それぞれを用いて、真空チャンバ内で、予め表面電位をゼロにし、接地されている金属板の表面電位を測定した。なお、測定時に、真空チャンバ内に、除電用のプラズマを供給した。
[Confirmation experiment]
An experiment was conducted to compare the surface potential measuring device of the first embodiment with a conventional surface potential measuring device.
The conventional surface potential measuring device has the same configuration as the surface potential measuring device of the first embodiment except that it does not include permanent magnets M1 and M2.
Using each of these surface potential measuring devices, the surface potential was set to zero in advance in a vacuum chamber, and the surface potential of a grounded metal plate was measured. Note that during the measurement, plasma for static elimination was supplied into the vacuum chamber.

測定結果は、図4に示すとおりである。
図中、破線のグラフ(1)が、従来の表面電位測定装置での測定結果、実線のグラフ(2)が第1実施形態の表面電位測定装置によるものである。
図4に示すように、従来の表面電位測定装置では、プラズマの供給に伴なって、絶対値が大きくなるマイナスの電位が測定された。
上記金属板は接地されているため、検出電極5が検出した電位は、ケース1内に入り込んだ電子で帯電した基板6の電位の影響を受けたものである。
The measurement results are shown in FIG. 4.
In the figure, the broken line graph (1) is the measurement result with the conventional surface potential measuring device, and the solid line graph (2) is the result of the measurement with the surface potential measuring device of the first embodiment.
As shown in FIG. 4, the conventional surface potential measuring device measures a negative potential whose absolute value increases as plasma is supplied.
Since the metal plate is grounded, the potential detected by the detection electrode 5 is influenced by the potential of the substrate 6, which is charged by electrons that have entered the case 1.

一方、第1実施形態の表面電位測定装置での測定結果は、ゼロ電位を維持している。
このことから、永久磁石M1,M2によって、電子がケース1内に入り込むことを防止できることを確認できた。
On the other hand, the measurement result with the surface potential measuring device of the first embodiment maintains zero potential.
From this, it was confirmed that permanent magnets M1 and M2 can prevent electrons from entering the case 1.

[第2実施形態]
図5は、第2実施形態のケース11の断面図である。ケース11は磁性金属で形成され、検出窓12を備えている。
ケース11は、材質以外は第1実施形態のケース1と同様の構成であり、第1実施形態と同じ構成要素には、図1と符号を用いている。
[Second embodiment]
FIG. 5 is a sectional view of the case 11 of the second embodiment. The case 11 is made of magnetic metal and includes a detection window 12.
The case 11 has the same configuration as the case 1 of the first embodiment except for the material, and the same reference numerals as in FIG. 1 are used for the same components as in the first embodiment.

また、第2実施形態では、永久磁石M3を、ケース11において検出窓12が形成された面と対向する側の底面11aに固定している。永久磁石M3は、その両端のN極とS極とを、それぞれ、上記底面11aの縁から起立する側面11b,11c側に位置させている。
このように配置された永久磁石M3の磁力線Bは、ケース11内を通り、検出窓12上を矢印で示すように通過する。
Further, in the second embodiment, the permanent magnet M3 is fixed to the bottom surface 11a of the case 11 on the side opposite to the surface on which the detection window 12 is formed. The permanent magnet M3 has an N pole and an S pole at both ends located on side surfaces 11b and 11c that stand up from the edge of the bottom surface 11a, respectively.
The lines of magnetic force B of the permanent magnet M3 arranged in this manner pass through the case 11 and above the detection window 12 as shown by the arrow.

[作用・効果等]
この第2実施形態においても、検出窓12に接近した電子は、磁力線Bの周囲を旋回し、ケース11に衝突してアースへ流れる。したがって、例えば、除電用のプラズマが供給されたとしても、電子がケース11内に入り込んで基板6を帯電させるようなことはない。そのため、正確な表面電位測定ができる。
そして、第2実施形態では、ケース11が磁力線を閉じ込めるため、外部への磁場の影響を小さくできる。
[Action/effect, etc.]
Also in this second embodiment, electrons approaching the detection window 12 rotate around the magnetic lines of force B, collide with the case 11, and flow to the ground. Therefore, for example, even if plasma for static elimination is supplied, electrons will not enter the case 11 and charge the substrate 6. Therefore, accurate surface potential measurement can be performed.
In the second embodiment, since the case 11 confines the lines of magnetic force, the influence of the magnetic field on the outside can be reduced.

なお、上記実施形態では、ケース1,11の外形を四角柱にしているが、ケースの外形はどのようなものでもかまわない。
また、検出窓2、12上を磁力線が通過して、電子のケース内への進入を阻止できれば、永久磁石M1,M2,M3の配置は上記に限らない。
In the above embodiments, the outer shapes of the cases 1 and 11 are square prisms, but the outer shapes of the cases may be of any shape.
Further, the arrangement of the permanent magnets M1, M2, and M3 is not limited to the above arrangement as long as magnetic lines of force can pass over the detection windows 2 and 12 to prevent electrons from entering the case.

なお、ケースを磁性体で形成した場合には、磁力線を閉じ込めるため、外部への磁場の影響を抑えることができるが、磁力線の方向がケースの形状の影響を受けることがある。
一方、ケースが非磁性体の場合には、磁力線の方向や地場の強さを永久磁石の配置のみで制御できるメリットがある。ケースの材質、永久磁石の形状および配置、磁力の強さなどは、設置場所や測定対象などを考慮して、適宜設定すればよい。
Note that when the case is made of a magnetic material, the lines of magnetic force are confined and the influence of the magnetic field on the outside can be suppressed, but the direction of the lines of magnetic force may be affected by the shape of the case.
On the other hand, when the case is made of a non-magnetic material, there is an advantage that the direction of the magnetic lines of force and the strength of the magnetic field can be controlled only by the arrangement of the permanent magnets. The material of the case, the shape and arrangement of the permanent magnets, the strength of magnetic force, etc. may be appropriately set in consideration of the installation location, the object to be measured, etc.

プラズマの供給を必要とするような環境下での、表面電位測定に有用である。 It is useful for measuring surface potential in environments that require plasma supply.

1,11 ケース
2,12 検出窓
5 検出電極
6 基板
M1,M2,M3 永久磁石
B 磁力線
1, 11 Case 2, 12 Detection window 5 Detection electrode 6 Substrate M1, M2, M3 Permanent magnet B Lines of magnetic force

Claims (3)

プラズマが存在する真空下に設置され、
測定対象に対向した検出窓を開口させるとともに、接地された金属製のケースと、
上記ケース内に配置され、
上記検出窓に対応する位置に設けられた検出電極と、
上記検出電極が接続された検出回路と、
上記検出電極及び検出回路を支持する電気絶縁性の基板と
を備えた表面電位測定装置であって、
上記ケースは、
永久磁石を備え、上記検出窓上を磁力線が通過する構成にされ、
上記プラズマ中の上記検出窓近傍の電子が上記磁力線によって当該磁力線の周囲を旋回して上記ケースに衝突し、上記ケースを介してアースへ流れる構成にし
表面電位測定装置。
It is installed in a vacuum where plasma exists,
A detection window facing the measurement target is opened, and a grounded metal case is installed.
Placed inside the above case,
a detection electrode provided at a position corresponding to the detection window;
a detection circuit to which the detection electrode is connected;
A surface potential measuring device comprising the above detection electrode and an electrically insulating substrate supporting the detection circuit,
The above case is
It is equipped with a permanent magnet and is configured so that lines of magnetic force pass over the detection window,
A surface potential measuring device configured such that electrons in the plasma near the detection window rotate around the magnetic lines of force, collide with the case, and flow to earth via the case.
上記ケースは、
非磁性金属で形成され、
その外表面に上記検出窓を挟む上記永久磁石を備えた
請求項1に記載の表面電位測定装置。
The above case is
Made of non-magnetic metal,
The surface potential measuring device according to claim 1, further comprising: the permanent magnet sandwiching the detection window on its outer surface.
上記ケースが磁性金属で形成された
請求項1に記載の表面電位測定装置。
The surface potential measuring device according to claim 1, wherein the case is made of magnetic metal.
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Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007212209A (en) 2006-02-08 2007-08-23 Kasuga Electric Works Ltd Surface potential sensor
JP2008116377A (en) 2006-11-07 2008-05-22 Canon Inc Potential measuring instrument and image forming device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007212209A (en) 2006-02-08 2007-08-23 Kasuga Electric Works Ltd Surface potential sensor
JP2008116377A (en) 2006-11-07 2008-05-22 Canon Inc Potential measuring instrument and image forming device

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