JP7377686B2 - Light irradiation test device - Google Patents

Light irradiation test device Download PDF

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JP7377686B2
JP7377686B2 JP2019214552A JP2019214552A JP7377686B2 JP 7377686 B2 JP7377686 B2 JP 7377686B2 JP 2019214552 A JP2019214552 A JP 2019214552A JP 2019214552 A JP2019214552 A JP 2019214552A JP 7377686 B2 JP7377686 B2 JP 7377686B2
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light source
led light
emitting surface
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JP2021085749A (en
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智敏 玉田
卓宏 林
琢磨 藤井
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CI Takiron Corp
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特許法第30条第2項適用 ダイプラ・ウィンテス株式会社が、令和1年6月28日に、玉田智敏、林卓宏、藤井琢磨が発明した光照射試験装置をパナソニック株式会社に卸した。Application of Article 30, Paragraph 2 of the Patent Act On June 28, 2020, Daipra Wintes Co., Ltd. sold a light irradiation test device invented by Tomotoshi Tamada, Takuhiro Hayashi, and Takuma Fujii to Panasonic Corporation.

本発明は、耐光性試験等に用いられる光照射試験装置に関するものである。 The present invention relates to a light irradiation test device used for light resistance tests and the like.

耐光性試験は、光源からの光を試料に照射することにより、その試料の劣化度合い等を評価する試験である。このような耐光性試験においては、各種環境下で光を試料に照射する光照射試験装置が用いられる。従来の光照射試験装置の光源としては、白熱電球やアークランプ等が用いられてきた(特許文献1、2参照)。 The light resistance test is a test that evaluates the degree of deterioration of a sample by irradiating the sample with light from a light source. In such a light resistance test, a light irradiation test device is used that irradiates the sample with light under various environments. Incandescent light bulbs, arc lamps, and the like have been used as light sources in conventional light irradiation test devices (see Patent Documents 1 and 2).

近年、LED光源を用いた照明装置が普及しつつある。LED光源を用いた照明装置を構成する材料については、LED光源から照射される光に対して耐性を有する必要があるため、耐光性試験を行って耐光性に優れた材料を選択しなければならない。 In recent years, lighting devices using LED light sources have become popular. The materials that make up lighting devices using LED light sources must be resistant to the light emitted from the LED light source, so light resistance tests must be conducted to select materials with excellent light resistance. .

特開昭61-3115号公報Japanese Unexamined Patent Publication No. 61-3115 特開2018-169342号公報Japanese Patent Application Publication No. 2018-169342

LED光源を使用すると、光源内部に熱が蓄積されるため、効率的に放熱しないと、不具合や寿命が短くなるという問題が生じる。 When an LED light source is used, heat is accumulated inside the light source, and if the heat is not efficiently dissipated, problems arise such as malfunctions and a shortened lifespan.

ところが、冷媒等を用いてLED光源を急激に冷却すると、LED光源の光量(照度)が低下してしまう。 However, if the LED light source is rapidly cooled using a refrigerant or the like, the amount of light (illuminance) of the LED light source will decrease.

前記に鑑み、本発明は、LED光源を用いた光照射試験装置においてLED光源を適切に冷却して照度を維持できるようにすることを目的とする。 In view of the above, an object of the present invention is to appropriately cool the LED light source in a light irradiation test device using an LED light source to maintain illuminance.

前記の目的を達成するために、本発明に係る光照射試験装置は、試料が載置される試料台と、試料台と対向する発光面を有し且つ当該発光面から試料に光を照射する少なくとも1つのLED光源と、LED光源における発光面の反対側の背面に接するように配置された熱伝導体と、LED光源の背面側に熱伝導体の少なくとも一部分を挟んで配置され且つ冷却液が通液する冷却管と、LED光源に冷却気体を送風する送風機とを備え、送風機から送風される冷却気体が、LED光源の発光面に誘導されるように構成される。 In order to achieve the above object, a light irradiation test device according to the present invention has a sample stage on which a sample is placed, and a light emitting surface facing the sample stage, and irradiates light onto the sample from the light emitting surface. at least one LED light source; a thermal conductor disposed in contact with the back surface opposite to the light emitting surface of the LED light source; and a cooling liquid disposed on the back side of the LED light source with at least a portion of the thermal conductor sandwiched therebetween. The device includes a cooling pipe that passes liquid and a blower that blows cooling gas to the LED light source, and is configured so that the cooling gas blown from the blower is guided to the light emitting surface of the LED light source.

本発明に係る光照射試験装置によると、LED光源の背面側を冷却液によって強く冷却できると共に、LED光源の発光面側を冷却気体によって穏やかに冷却できる。このため、冷却液による冷却と、冷却気体による冷却とを組み合わせることによって、LED光源を過剰に冷却することなく適切に冷却できるので、高照度を維持しながら、光照射試験を行うことができる。 According to the light irradiation test device according to the present invention, the back side of the LED light source can be strongly cooled by the cooling liquid, and the light emitting surface side of the LED light source can be gently cooled by the cooling gas. Therefore, by combining cooling with a cooling liquid and cooling with a cooling gas, the LED light source can be appropriately cooled without excessively cooling it, so a light irradiation test can be performed while maintaining high illuminance.

また、本発明に係る光照射試験装置において、送風機の送風口は、LED光源における発光面と背面とを接続する周面と対向してもよい。このようにすると、送風機から送風される冷却気体を、LED光源の周面側から発光面側に誘導することができる。この場合、送風口における試料台側の端縁が、LED光源の発光面よりも試料台側に位置すると、送風機から送風される冷却気体を、LED光源の発光面に確実に誘導することができる。また、送風口における試料台の反対側の端縁が、熱伝導体よりも試料台の反対側に位置すると、LED光源の背面側も、送風機から送風される冷却気体によって冷却することができる。すなわち、LED光源、熱伝導体及び冷却管を有するLEDモジュールが配置される光源室全体を冷却できるので、LED光源の冷却効率をより向上させることができる。 Moreover, in the light irradiation test device according to the present invention, the air outlet of the blower may face a peripheral surface connecting the light emitting surface and the back surface of the LED light source. In this way, the cooling gas blown from the blower can be guided from the peripheral surface side of the LED light source to the light emitting surface side. In this case, if the edge of the air outlet on the sample stand side is located closer to the sample stand than the light emitting surface of the LED light source, the cooling gas blown from the blower can be reliably guided to the light emitting surface of the LED light source. . Furthermore, when the edge of the air outlet opposite to the sample stand is located on the opposite side of the sample stand than the thermal conductor, the back side of the LED light source can also be cooled by the cooling gas blown from the blower. That is, the entire light source chamber in which the LED module including the LED light source, the heat conductor, and the cooling pipe is arranged can be cooled, so that the cooling efficiency of the LED light source can be further improved.

また、本発明に係る光照射試験装置において、LED光源と試料台との間に、光を透過させる仕切り部材がさらに配置されてもよい。このようにすると、LEDモジュールが配置される光源室と、試料台が配置される試験室とが仕切り部材によって区画されるので、冷却管及び送風機によるLED光源の冷却効率をより向上させることができる。 Furthermore, in the light irradiation test device according to the present invention, a partition member that transmits light may be further disposed between the LED light source and the sample stage. In this way, the light source room where the LED module is placed and the test room where the sample stage is placed are separated by the partition member, so it is possible to further improve the cooling efficiency of the LED light source by the cooling pipe and the blower. .

本発明によると、LED光源を用いた光照射試験装置においてLED光源を適切に冷却して照度を維持することができる。 According to the present invention, in a light irradiation test device using an LED light source, the LED light source can be appropriately cooled and the illuminance can be maintained.

実施形態1に係る光照射試験装置の断面構成図である。1 is a cross-sectional configuration diagram of a light irradiation test device according to Embodiment 1. FIG. 実施形態1の変形例に係る光照射試験装置の断面構成図である。2 is a cross-sectional configuration diagram of a light irradiation test device according to a modification of Embodiment 1. FIG. 実施形態2に係る光照射試験装置の断面構成図である。FIG. 2 is a cross-sectional configuration diagram of a light irradiation test device according to a second embodiment. 実施形態3に係る光照射試験装置の断面構成図である。FIG. 3 is a cross-sectional configuration diagram of a light irradiation test device according to Embodiment 3.

(実施形態1)
以下、実施形態1に係る光照射試験装置1について、図1を参照しながら説明する。
(Embodiment 1)
Hereinafter, a light irradiation test device 1 according to Embodiment 1 will be described with reference to FIG. 1.

図1に示すように、光照射試験装置1のハウジング2の内部は、一例として、照射される光を透過させる仕切り部材3によって、試験室4と光源室5とに区画される。ハウジング2は、例えばステンレス鋼で構成されてもよい。仕切り部材3は、例えば耐熱ガラスで構成されてもよい。本実施形態では、鉛直方向において、試験室4が下側に、光源室5が上側に配置される。 As shown in FIG. 1, the inside of the housing 2 of the light irradiation test device 1 is divided into a test chamber 4 and a light source chamber 5 by, for example, a partition member 3 that transmits the irradiated light. The housing 2 may be made of stainless steel, for example. The partition member 3 may be made of heat-resistant glass, for example. In this embodiment, the test chamber 4 is arranged on the lower side and the light source room 5 is arranged on the upper side in the vertical direction.

試験室4の内部には、試料台6が配置され、光照射試験時には、試料台6上に試験対象の試料7が載置される。試料台6は、例えば金網やエキスパンドメタル等の複数の貫通孔が設けられた部材であることが好ましい。そのような部材であれば、試料台6の蓄熱を抑制できるため、載置された試料7への試料台6からの熱伝導を抑制できるので、試料7への温度影響を抑えることができる。また、試料台6には、試料7を固定するための手段、例えば吸引手段等が設けられていてもよい。試料台6は、例えば試験室4の底部に設けられた保持部材(図示省略)によって保持されてもよい。或いは、試験室4における対向する内壁面の双方に試料台6の位置調整用のフックを設け、そのフックの上に試料台6を支持するようにしてもよい。 A sample stand 6 is arranged inside the test chamber 4, and a sample 7 to be tested is placed on the sample stand 6 during a light irradiation test. The sample stage 6 is preferably a member provided with a plurality of through holes, such as a wire mesh or expanded metal. With such a member, heat accumulation in the sample stage 6 can be suppressed, and therefore heat conduction from the sample stage 6 to the sample 7 placed thereon can be suppressed, so that the influence of temperature on the sample 7 can be suppressed. Further, the sample stage 6 may be provided with means for fixing the sample 7, such as suction means. The sample stage 6 may be held, for example, by a holding member (not shown) provided at the bottom of the test chamber 4. Alternatively, hooks for adjusting the position of the sample stage 6 may be provided on both opposing inner wall surfaces of the test chamber 4, and the sample stage 6 may be supported on the hooks.

光源室5の内部には、仕切り部材3を通して試料7に光を照射するための少なくとも1つのLED光源8が配置される。LED光源8は、LED光源8の発光面8aと試料台6とが互いに対向するように配置される。本実施形態では、LED光源8の発光面8aは、水平面と平行になるように設定される。 At least one LED light source 8 for irradiating light onto the sample 7 through the partition member 3 is arranged inside the light source chamber 5 . The LED light source 8 is arranged so that the light emitting surface 8a of the LED light source 8 and the sample stage 6 face each other. In this embodiment, the light emitting surface 8a of the LED light source 8 is set to be parallel to the horizontal plane.

LED光源8としては、例えば、COB(チップオンボード)やSMD(表面実装デバイス)等のLEDチップを用いてもよいが、特に高照度が求められる光照射試験には、COBを使用することが好ましい。LED光源8は1つであってもよいが、より高照度の光照射試験を行うために、LED光源8を複数用いてもよい。後者の場合、複数のLED光源8をマトリクス状に配置してもよい。また、LED光源8から照射する光の波長は、試料7を使用する環境に合わせて適宜選択すればよい。例えば、屋内用途を想定した場合は、可視光領域(波長380nm~780nm)の光を照射するLED光源8を選択することができる。 As the LED light source 8, for example, an LED chip such as a COB (chip on board) or an SMD (surface mount device) may be used, but it is preferable to use a COB for light irradiation tests that require particularly high illuminance. preferable. Although one LED light source 8 may be used, a plurality of LED light sources 8 may be used in order to perform a light irradiation test with higher illuminance. In the latter case, a plurality of LED light sources 8 may be arranged in a matrix. Further, the wavelength of the light irradiated from the LED light source 8 may be appropriately selected according to the environment in which the sample 7 is used. For example, when assuming indoor use, an LED light source 8 that emits light in the visible light region (wavelength 380 nm to 780 nm) can be selected.

LED光源8の背面8b(発光面8aの反対面)に接するように熱伝導体9が配置される。熱伝導体9の構成材料は、高い熱伝導率を持つ材料であれば特に限定されないが、冷却効率の点で例えばアルミニウムを用いてもよい。熱伝導体9は、例えば光源室5の側壁部や天井部に設けられた保持部材(図示省略)によって保持される。LED光源8は、熱伝導体9に取り付けられる。 A thermal conductor 9 is arranged so as to be in contact with the back surface 8b (the surface opposite to the light emitting surface 8a) of the LED light source 8. The constituent material of the thermal conductor 9 is not particularly limited as long as it has a high thermal conductivity, but from the viewpoint of cooling efficiency, for example, aluminum may be used. The thermal conductor 9 is held by a holding member (not shown) provided, for example, on the side wall or ceiling of the light source chamber 5. LED light source 8 is attached to thermal conductor 9 .

LED光源8の背面8b側には、熱伝導体9の少なくとも一部分を挟んで冷却管10が配置される。冷却管10内には、例えば冷却水等の冷却液11が通液する。冷却管10は、ハウジング2の外側に配置された冷凍機(図示省略)と循環接続される。本実施形態では、一例として、冷却管10は、LED光源8の配列に沿って熱伝導体9内に埋設される。冷却液11の温度は、使用する冷凍機によって調整可能であるが、例えば28~32℃程度に設定してもよい。 A cooling pipe 10 is arranged on the rear surface 8b side of the LED light source 8 with at least a portion of the heat conductor 9 interposed therebetween. A cooling liquid 11 such as cooling water flows through the cooling pipe 10 . The cooling pipe 10 is cyclically connected to a refrigerator (not shown) disposed outside the housing 2 . In this embodiment, as an example, the cooling pipe 10 is embedded in the heat conductor 9 along the arrangement of the LED light sources 8. The temperature of the coolant 11 can be adjusted depending on the refrigerator used, and may be set to about 28 to 32° C., for example.

光源室5の側壁部には、例えば送風ファン等の第1送風機12の第1送風口12aが設けられる。すなわち、本実施形態では、第1送風口12aは、LED光源8の周面(発光面8aと背面8bとを接続する面)と対向する。第1送風機12の本体部(図示省略)は、ハウジング2の外側に配置されており、当該本体部から第1送風口12aまで送風管が延びる。光源室5の側壁部又は天井部には、排気口(図示省略)が設けられる。 A first air outlet 12a of a first air blower 12, such as a blower fan, is provided in the side wall of the light source chamber 5, for example. That is, in this embodiment, the first air outlet 12a faces the peripheral surface of the LED light source 8 (the surface connecting the light emitting surface 8a and the back surface 8b). A main body (not shown) of the first blower 12 is disposed outside the housing 2, and a blow pipe extends from the main body to the first blow port 12a. An exhaust port (not shown) is provided in the side wall or ceiling of the light source chamber 5.

第1送風機12は、LED光源8に、例えば冷却空気等の冷却気体13を送風する。第1送風機12は、温度調節機能を有してもよい。冷却気体13の温度は、使用する第1送風機12により調整可能であるが、例えば25~35℃程度に設定してもよい。 The first blower 12 blows a cooling gas 13 such as cooling air to the LED light source 8 . The first blower 12 may have a temperature adjustment function. The temperature of the cooling gas 13 can be adjusted by the first blower 12 used, and may be set to about 25 to 35° C., for example.

本実施形態の光照射試験装置1は、第1送風機12から送風される冷却気体13が、LED光源8の発光面8aに誘導されるように構成される。具体的には、第1送風機12の第1送風口12aにおける試験室4側(つまり試料台6側)の端縁は、LED光源8の発光面8aよりも試料台6側に位置する。例えば、第1送風口12aにおける試料台6側の端縁は、LED光源8の発光面8aと比べて、鉛直方向において距離dだけ試料台6の近くに位置する。尚、第1送風機12の第1送風口12aにおける試験室4の反対側(つまり試料台6の反対側)の端縁は、熱伝導体9よりも試料台6の反対側に位置する。 The light irradiation test device 1 of this embodiment is configured so that the cooling gas 13 blown from the first blower 12 is guided to the light emitting surface 8a of the LED light source 8. Specifically, the edge of the first air outlet 12a of the first blower 12 on the test chamber 4 side (that is, on the sample stage 6 side) is located closer to the sample stage 6 than the light emitting surface 8a of the LED light source 8. For example, the edge of the first air outlet 12a on the sample stage 6 side is located closer to the sample stage 6 by a distance d in the vertical direction than the light emitting surface 8a of the LED light source 8. Note that the edge of the first air blower 12 a of the first blower 12 on the opposite side of the test chamber 4 (that is, the opposite side of the sample stage 6 ) is located on the opposite side of the sample stage 6 from the thermal conductor 9 .

試験室4の側壁部には、試験室4内を所定の温度に保持するために、例えば送風ファン等の第2送風機14の第2送風口14aが設けられる。第2送風機14の本体部(図示省略)は、ハウジング2の外側に配置されており、当該本体部から第2送風口14aまで送風管が延びる。試験室4の側壁部又は底部には、排気口(図示省略)が設けられる。第2送風機14は、試料7に、例えば空気等の気体15を送風する。第2送風機14は、温度調節機能を有してもよい。気体15の温度は、使用する第2送風機14により調整可能であるが、LED光源8の点灯時において、例えば60~120℃程度に設定してもよい。 A second air outlet 14a of a second blower 14, such as a blower fan, is provided in the side wall of the test chamber 4 in order to maintain the inside of the test chamber 4 at a predetermined temperature. A main body (not shown) of the second blower 14 is disposed outside the housing 2, and a blow pipe extends from the main body to the second blow port 14a. An exhaust port (not shown) is provided in the side wall or bottom of the test chamber 4. The second blower 14 blows a gas 15 such as air onto the sample 7 . The second blower 14 may have a temperature adjustment function. Although the temperature of the gas 15 can be adjusted by the second blower 14 used, it may be set to, for example, about 60 to 120° C. when the LED light source 8 is turned on.

図示はしていないが、光照射試験装置1は、ハウジング2の外壁面等に、LED光源8や送風機12、14等を操作するための操作部(例えばタッチパネル等)を有していてもよい。 Although not shown, the light irradiation test device 1 may have an operation unit (for example, a touch panel) on the outer wall surface of the housing 2 for operating the LED light source 8, the blowers 12, 14, etc. .

以上に説明した本実施形態の光照射試験装置1によると、LED光源8の背面8b側を冷却液11によって強く冷却できると共に、LED光源8の発光面8a側を冷却気体13によって穏やかに冷却できる。このため、冷却液11による冷却と、冷却気体13による冷却とを組み合わせることによって、LED光源8を過剰に冷却することなく適切に冷却できるので、高照度を維持しながら、光照射試験を行うことができる。さらに、LED光源8が蓄熱して故障することを防止することができる。特に、LED光源8の照度が300万ルクス程度以上では、LED光源8が蓄熱して高温になるため、冷却液による冷却が必要となるので、本実施形態の光照射試験装置1による前述の効果は顕著である。 According to the light irradiation test device 1 of the present embodiment described above, the back surface 8b side of the LED light source 8 can be strongly cooled by the cooling liquid 11, and the light emitting surface 8a side of the LED light source 8 can be gently cooled by the cooling gas 13. . Therefore, by combining cooling with the cooling liquid 11 and cooling with the cooling gas 13, it is possible to appropriately cool the LED light source 8 without excessively cooling it, so it is possible to perform the light irradiation test while maintaining high illuminance. I can do it. Furthermore, it is possible to prevent the LED light source 8 from accumulating heat and malfunctioning. Particularly, when the illumination intensity of the LED light source 8 is about 3 million lux or more, the LED light source 8 accumulates heat and becomes high temperature, so cooling with a cooling liquid is necessary. is remarkable.

また、本実施形態の光照射試験装置1において、送風機12の送風口12aが、LED光源8における発光面8aと背面8bとを接続する周面と対向するため、送風機12から送風される冷却気体13を、LED光源8の周面側から発光面8a側に誘導することができる。この場合、送風口12aにおける試料台6側の端縁が、LED光源8の発光面8aよりも試料台6側に位置するため、送風機12から送風される冷却気体13を、LED光源8の発光面8aに確実に誘導することができる。また、送風口12aにおける試料台6の反対側の端縁が、熱伝導体9よりも試料台6の反対側に位置するため、LED光源8の背面8b側も、送風機12から送風される冷却気体13によって冷却することができる。すなわち、LED光源8、熱伝導体9及び冷却管10を有するLEDモジュールが配置される光源室5全体を冷却できるので、LED光源8の冷却効率をより向上させることができる。 In addition, in the light irradiation test device 1 of this embodiment, since the air outlet 12a of the air blower 12 faces the circumferential surface connecting the light emitting surface 8a and the back surface 8b of the LED light source 8, the cooling gas blown from the air blower 12 13 can be guided from the peripheral surface side of the LED light source 8 to the light emitting surface 8a side. In this case, since the edge of the air outlet 12a on the sample stand 6 side is located closer to the sample stand 6 than the light emitting surface 8a of the LED light source 8, the cooling gas 13 blown from the air blower 12 is It can be reliably guided to the surface 8a. In addition, since the edge of the air outlet 12a on the opposite side of the sample stand 6 is located on the opposite side of the sample stand 6 than the thermal conductor 9, the rear surface 8b side of the LED light source 8 is also cooled by the air blowing from the blower 12. It can be cooled by gas 13. That is, since the entire light source chamber 5 in which the LED module including the LED light source 8, the heat conductor 9, and the cooling pipe 10 is arranged can be cooled, the cooling efficiency of the LED light source 8 can be further improved.

また、本実施形態の光照射試験装置1において、光源室5と試験室4との間(つまりLED光源8と試料台6との間)に、LED光源8から照射された光を透過させる仕切り部材3が配置されるため、冷却管10及び送風機12によるLED光源8の冷却効率をより向上させることができる。 Furthermore, in the light irradiation test apparatus 1 of the present embodiment, there is a partition between the light source chamber 5 and the test chamber 4 (that is, between the LED light source 8 and the sample stage 6) that allows the light irradiated from the LED light source 8 to pass through. Since the member 3 is arranged, the cooling efficiency of the LED light source 8 by the cooling pipe 10 and the blower 12 can be further improved.

尚、本実施形態において、冷却気体13の温度を冷却液11の温度と同等以下に設定してもよい。このようにすると、光源室5内に結露が生じにくくなるので、LED光源8等の故障発生を抑制することができる。例えば、冷却気体13及び冷却液11の各温度を同じ30℃に設定してもよい。また、光源室5内での結露発生をより一層抑制するために、光源室5内に、例えば除湿剤等の除湿手段を設けてもよい。 In this embodiment, the temperature of the cooling gas 13 may be set to be equal to or lower than the temperature of the cooling liquid 11. In this way, dew condensation is less likely to occur in the light source chamber 5, so it is possible to suppress the occurrence of failure of the LED light source 8 and the like. For example, the temperatures of the cooling gas 13 and the cooling liquid 11 may be set to the same temperature of 30°C. Furthermore, in order to further suppress the occurrence of dew condensation within the light source chamber 5, a dehumidifying means such as a dehumidifier may be provided within the light source chamber 5.

(実施形態1の変形例)
以下、実施形態1の変形例に係る光照射試験装置1について、図2を参照しながら説明する。尚、図2において、図1に示す実施形態1と同じ構成要素には同じ符号を付す。
(Modification of Embodiment 1)
Hereinafter, a light irradiation test device 1 according to a modification of the first embodiment will be described with reference to FIG. 2. In FIG. 2, the same components as in the first embodiment shown in FIG. 1 are given the same reference numerals.

本変形例の光照射試験装置1が実施形態1と異なっている点は、図2に示すように、試験室4と光源室5とが水平方向に並ぶように配置されることである。ここで、LED光源8の発光面8aは、鉛直面と平行になるように設定される。すなわち、LED光源8は、水平方向に光を照射する。 The light irradiation test apparatus 1 of this modification is different from the first embodiment in that the test chamber 4 and the light source chamber 5 are arranged horizontally, as shown in FIG. Here, the light emitting surface 8a of the LED light source 8 is set to be parallel to the vertical plane. That is, the LED light source 8 emits light in the horizontal direction.

以上に説明した本変形例の光照射試験装置1においても、実施形態1と同様の効果を得ることができる。 Also in the light irradiation test device 1 of this modification described above, the same effects as in the first embodiment can be obtained.

(実施形態2)
以下、実施形態2に係る光照射試験装置1について、図3を参照しながら説明する。尚、図3において、図1に示す実施形態1と同じ構成要素には同じ符号を付す。
(Embodiment 2)
Hereinafter, the light irradiation test device 1 according to the second embodiment will be described with reference to FIG. 3. In FIG. 3, the same components as in the first embodiment shown in FIG. 1 are given the same reference numerals.

本実施形態の光照射試験装置1が実施形態1と異なっている点は、図3に示すように、第1送風機12の第1送風口12aにおける試験室4側(つまり試料台6側)の端縁が、LED光源8の発光面8aよりも試料台6の反対側に位置する一方、LED光源8、熱伝導体9及び冷却管10を有するLEDモジュールと、第1送風口12aとの間に、第1送風機12から送風される冷却気体13をLED光源8の発光面8aに誘導するガイド部材21が設けられることである。 The light irradiation test device 1 of this embodiment is different from the first embodiment as shown in FIG. 3, as shown in FIG. The edge is located on the opposite side of the sample stage 6 from the light emitting surface 8a of the LED light source 8, and is between the LED module having the LED light source 8, the thermal conductor 9, and the cooling pipe 10, and the first air outlet 12a. Additionally, a guide member 21 is provided that guides the cooling gas 13 blown from the first blower 12 to the light emitting surface 8a of the LED light source 8.

以上に説明した本実施形態の光照射試験装置1においても、実施形態1と同様の効果を得ることができる。 Also in the light irradiation test device 1 of this embodiment described above, the same effects as in the first embodiment can be obtained.

尚、本実施形態において、ガイド部材21の設置に代えて、第1送風機12の送風管を光源室5内まで延長して、第1送風口12aをLED光源8の発光面8aの近傍に配置してもよい。 In this embodiment, instead of installing the guide member 21, the air pipe of the first blower 12 is extended into the light source chamber 5, and the first air outlet 12a is arranged near the light emitting surface 8a of the LED light source 8. You may.

(実施形態3)
以下、実施形態3に係る光照射試験装置1について、図4を参照しながら説明する。尚、図4において、図1に示す実施形態1と同じ構成要素には同じ符号を付す。
(Embodiment 3)
Hereinafter, the light irradiation test device 1 according to Embodiment 3 will be described with reference to FIG. 4. In FIG. 4, the same components as in the first embodiment shown in FIG. 1 are given the same reference numerals.

本実施形態の光照射試験装置1が実施形態1と異なっている点は、図4に示すように、光源室5の天井部に第1送風機12の第1送風口12aが設けられる一方、LED光源8、熱伝導体9及び冷却管10を有するLEDモジュールと、光源室5の側壁部との間に、第1送風機12から送風される冷却気体13をLED光源8の発光面8aに誘導するガイド部材22が設けられることである。すなわち、光源室5の天井部の第1送風口12aから吹き出された冷却気体13は、熱伝導体9におけるLED光源8の反対側の面に沿って光源室5の側壁部の方に向かい、ガイド部材22によってLEDモジュールを迂回してLED光源8の発光面8a側に到達する。 The light irradiation test device 1 of this embodiment differs from the first embodiment in that, as shown in FIG. Cooling gas 13 blown from the first blower 12 is guided to the light emitting surface 8a of the LED light source 8 between the LED module having the light source 8, the heat conductor 9, and the cooling pipe 10 and the side wall of the light source chamber 5. A guide member 22 is provided. That is, the cooling gas 13 blown out from the first air outlet 12a in the ceiling of the light source chamber 5 heads toward the side wall of the light source chamber 5 along the surface of the heat conductor 9 on the opposite side of the LED light source 8. The guide member 22 bypasses the LED module and reaches the light emitting surface 8a side of the LED light source 8.

以上に説明した本実施形態の光照射試験装置1においても、実施形態1と同様の効果を得ることができる。 Also in the light irradiation test device 1 of this embodiment described above, the same effects as in the first embodiment can be obtained.

尚、本実施形態において、第1送風機12の送風管は、光源室5の天井部を貫通して第1送風口12aで終端してもよいし、或いは、光源室5の側壁部を貫通して光源室5の天井部に沿って当該天井部中央付近まで延び第1送風口12aで終端してもよい。すなわち、本実施形態及び他の実施形態(変形例を含む)において、第1送風機12の本体部から第1送風口12aまでの送風管の経路や、当該送風管がハウジング2を貫通する位置は、特に限定されるものではない。 In this embodiment, the air pipe of the first air blower 12 may penetrate the ceiling of the light source chamber 5 and terminate at the first air outlet 12a, or may penetrate the side wall of the light source chamber 5. It may extend along the ceiling of the light source chamber 5 to near the center of the ceiling and terminate at the first air outlet 12a. That is, in this embodiment and other embodiments (including modified examples), the route of the air pipe from the main body of the first blower 12 to the first air outlet 12a and the position where the air pipe penetrates the housing 2 are , but is not particularly limited.

また、前述した各実施形態(変形例を含む)に係る光照射試験装置1を用いて、試料7の耐光性を試験する耐光性試験方法が提供される。この耐光性試験方法によれば、LED光源8から高照度の光を照射することが可能であるから、短期間で耐光性を評価することができる。さらに、LED光源8から照射される光の波長が可視光領域(波長380nm~780nm)であれば、屋内用途における試料7の耐光性を適切に評価することができる。 Furthermore, a light resistance test method is provided in which the light resistance of the sample 7 is tested using the light irradiation test device 1 according to each of the above-described embodiments (including modified examples). According to this light resistance test method, it is possible to irradiate high intensity light from the LED light source 8, so that light resistance can be evaluated in a short period of time. Furthermore, if the wavelength of the light emitted from the LED light source 8 is in the visible light region (wavelength 380 nm to 780 nm), the light resistance of the sample 7 for indoor use can be appropriately evaluated.

以上、実施形態及び変形例を説明したが、特許請求の範囲の趣旨及び範囲から逸脱することなく、形態や詳細の多様な変更が可能なことが理解されるであろう。また、以上の実施形態及び変形例は、本開示の対象の機能を損なわない限り、適宜組み合わせたり、置換したりしてもよい。さらに、以上に述べた「第1」、「第2」、…という記載は、これらの記載が付与された語句を区別するために用いられており、その語句の数や順序までも限定するものではない。 Although the embodiments and modifications have been described above, it will be understood that various changes in form and details can be made without departing from the spirit and scope of the claims. Furthermore, the above embodiments and modifications may be combined or replaced as appropriate, as long as the functionality of the object of the present disclosure is not impaired. Furthermore, the descriptions such as "first", "second", etc. mentioned above are used to distinguish the words to which these descriptions are given, and they also limit the number and order of the words. isn't it.

1 光照射試験装置1
2 ハウジング
3 仕切り部材
4 試験室
5 光源室
6 試料台
7 試料
8 LED光源
8a 発光面
8b 背面
9 熱伝導体
10 冷却管
11 冷却液
12 第1送風機
12a 第1送風口
13 冷却気体
14 第2送風機
14a 第2送風口
15 気体
21 ガイド部材
22 ガイド部材
1 Light irradiation test device 1
2 Housing 3 Partition member 4 Test chamber 5 Light source room 6 Sample stand 7 Sample 8 LED light source 8a Light emitting surface 8b Back surface 9 Heat conductor 10 Cooling pipe 11 Coolant 12 First blower 12a First blower 13 Cooling gas 14 Second blower 14a Second ventilation port 15 Gas 21 Guide member 22 Guide member

Claims (6)

試料が載置される試料台と、
前記試料台と対向する発光面を有し、当該発光面から前記試料に光を照射する少なくとも1つのLED光源と、
前記LED光源における前記発光面の反対側の背面に接するように配置された熱伝導体と、
前記LED光源の前記背面側に前記熱伝導体の少なくとも一部分を挟んで配置され、冷却液が通液する冷却管と、
前記LED光源に冷却気体を送風する送風機とを備え、
前記送風機から送風される前記冷却気体が、前記LED光源の前記発光面に誘導されるように構成され、
前記送風機の送風口は、前記LED光源における前記発光面と前記背面とを接続する周面と対向し、
前記LED光源から前記試料台に向かう方向を第1方向として、前記送風口における前記第1方向側の端縁は、前記LED光源の前記発光面よりも前記第1方向側に位置し、
前記試料台から前記LED光源に向かう方向を第2方向として、前記送風口における前記第2方向側の端縁は、前記熱伝導体よりも前記第2方向側に位置する、光照射試験装置。
a sample stage on which the sample is placed;
at least one LED light source having a light emitting surface facing the sample stage and irradiating the sample with light from the light emitting surface;
a thermal conductor disposed in contact with the back surface of the LED light source opposite to the light emitting surface;
a cooling pipe disposed on the back side of the LED light source with at least a portion of the thermal conductor sandwiched therebetween, and through which a cooling liquid flows;
and a blower that blows cooling gas to the LED light source,
The cooling gas blown from the blower is configured to be guided to the light emitting surface of the LED light source ,
The air outlet of the blower faces a peripheral surface connecting the light emitting surface and the back surface of the LED light source,
With a direction from the LED light source toward the sample stage as a first direction, an edge of the air outlet on the first direction side is located closer to the first direction than the light emitting surface of the LED light source,
A light irradiation test device, wherein a direction from the sample stage toward the LED light source is defined as a second direction, and an edge of the air outlet on the second direction side is located closer to the second direction than the thermal conductor.
試料が載置される試料台と、
前記試料台と対向する発光面を有し、当該発光面から前記試料に光を照射する少なくとも1つのLED光源と、
前記LED光源における前記発光面の反対側の背面に接するように配置された熱伝導体と、
前記LED光源の前記背面側に前記熱伝導体の少なくとも一部分を挟んで配置され、冷却液が通液する冷却管と、
前記LED光源に冷却気体を送風する送風機とを備え、
前記送風機から送風される前記冷却気体が、前記LED光源の前記発光面に誘導されるように構成され
前記LED光源が配置される光源室の内部に、前記冷却気体を前記LED光源の前記発光面に誘導するガイド部材が設けられる、光照射試験装置。
a sample stage on which the sample is placed;
at least one LED light source having a light emitting surface facing the sample stage and irradiating the sample with light from the light emitting surface;
a thermal conductor disposed in contact with the back surface of the LED light source opposite to the light emitting surface;
a cooling pipe disposed on the back side of the LED light source with at least a portion of the heat conductor sandwiched therebetween, and through which a cooling liquid flows;
and a blower that blows cooling gas to the LED light source,
The cooling gas blown from the blower is configured to be guided to the light emitting surface of the LED light source ,
A light irradiation test device, wherein a guide member for guiding the cooling gas to the light emitting surface of the LED light source is provided inside a light source chamber in which the LED light source is arranged.
前記送風機の送風口は、前記LED光源における前記発光面と前記背面とを接続する周面と対向する、請求項に記載の光照射試験装置。 The light irradiation test device according to claim 2 , wherein the air blower opening faces a peripheral surface connecting the light emitting surface and the back surface of the LED light source. 前記LED光源から前記試料台に向かう方向を第1方向として、前記送風口における前記第1方向側の端縁は、前記LED光源の前記発光面よりも前記第1方向側に位置する、請求項に記載の光照射試験装置。 A first direction is defined as a direction from the LED light source toward the sample stage, and an edge of the air outlet on the first direction side is located closer to the first direction than the light emitting surface of the LED light source. 3. The light irradiation test device according to 3 . 前記試料台から前記LED光源に向かう方向を第2方向として、前記送風口における前記第2方向側の端縁は、前記熱伝導体よりも前記第2方向側に位置する、請求項又はに記載の光照射試験装置。 Claim 3 or 4 , wherein a direction from the sample stage toward the LED light source is defined as a second direction, and an edge of the air outlet on the second direction side is located closer to the second direction than the thermal conductor. The light irradiation test device described in . 前記LED光源と前記試料台との間に、前記光を透過させる仕切り部材がさらに配置される、請求項1~のいずれか1項に記載の光照射試験装置。 The light irradiation test device according to claim 1, further comprising a partition member that allows the light to pass through between the LED light source and the sample stage .
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JP2007212375A (en) 2006-02-13 2007-08-23 Matsushita Electric Works Ltd Heat-resistance light-resistance testing device
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JP2019086318A (en) 2017-11-02 2019-06-06 株式会社テクノアーク Light exposure method and light exposure apparatus

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