JP7362345B2 - Sample testing equipment - Google Patents

Description

Embodiments of the present invention relate to a sample testing device.

2. Description of the Related Art Conventionally, sample testing devices are known that use antigen-antibody reactions to analyze target substances contained in samples collected from subjects. Such a sample testing device, for example, consists of magnetic particles to which an antibody that specifically binds to a target substance (antigen) is immobilized, an optical waveguide to which an antibody that specifically binds to the target substance is immobilized, and a magnetic field that is generated. The target substance is bound to the optical waveguide surface by an antigen-antibody reaction, and measurement is performed based on the amount of light received through the optical waveguide after the target substance is bound. Here, in the sample testing device, a magnetic field application section is used to promote the antigen-antibody reaction between the target substance and the antibody fixed to the optical waveguide, and to separate the magnetic particles that have not undergone the antigen-antibody reaction from the optical waveguide. A magnetic field is generated, and the magnetic particles are moved in accordance with the generated magnetic field.

FIG. 9A is a diagram for explaining an example of a sample testing device. As shown in FIG. 9A, the specimen testing apparatus 20 includes an optical waveguide sensor chip 200, a light source 210, a light receiving element 211, a first magnetic field applying section 220, a second magnetic field applying section 221, and a control circuit. 230 is provided. A first antibody 201 is immobilized on a part of the surface of the optical waveguide type sensor chip 200. A sample 203 to be measured is made of a liquid containing an antigen 204 contained in a specimen collected from a subject and magnetic particles 206 to which a second antibody 205 is immobilized, and is dropped from a sample dropping port 207. Note that the optical waveguide type sensor chip 200 is fixedly held in a test cartridge 208.

In the sample 203, the antigen 204 undergoes an antigen-antibody reaction with the second antibody 205. Then, in order to cause an antigen-antibody reaction between the antigen 204 and the first antibody 201, the control circuit 230 causes the second magnetic field application section 221 to apply a magnetic field to generate a magnetic force in the direction of the second magnetic field application section. As a result, the magnetic fine particles 206 are attracted to the first antibody 201 along with the second antibody 205 and antigen 204. As a result, the antigen-antibody reaction between the antigen 204 and the first antibody 201 can be promoted. Note that during the antigen-antibody reaction, the control circuit 230 stops application of the magnetic field by the second magnetic field application section 221. Next, the control circuit 230 causes the first magnetic field application section 220 to apply a magnetic field to separate the magnetic particles 206 that have not reacted with the antigen-antibody from the vicinity of the first antibody 201, and causes the first magnetic field application section 220 to apply a magnetic field. to occur. As a result, only the first antibody 201 and the magnetic fine particles 206 to which the second antibody 205 is bound via the antigen 204 remain in the vicinity of the optical waveguide 209, and the first antibody 201 and the second antibody 205 bonded via the antigen 204 remain in the vicinity of the optical waveguide 209. The magnetic fine particles 206 to which the second antibody 205 is not bound are separated from the vicinity of the optical waveguide 209.

Light emitted from the light source 210 propagates within the optical waveguide type sensor chip 200 and is received by the light receiving element 211. The light receiving element 211 measures the amount of light propagated within the optical waveguide type sensor chip 200. The evanescent light near the first antibody 201 on the optical waveguide is generated when the first antibody 201 and the magnetic particles 206 bound to the second antibody 205 via the antigen 204 remain in the vicinity of the optical waveguide 209. Since the light absorption or scattering efficiency increases, the amount of light received by the light receiving element 211 decreases. The sample testing device uses this characteristic to measure the presence or absence of an antigen-antibody reaction.

Japanese Patent Application Publication No. 2015-118055 Japanese Patent Application Publication No. 2012-215553

The problem to be solved by the present invention is to improve the strength of the magnetic field applied to a sensing area containing magnetic fine particles.

The specimen testing device according to the embodiment is a specimen testing device that performs a test using a test cartridge containing a test liquid containing magnetic particles, and includes a first magnetic field application section, a second magnetic field application section, and a mount. and a connecting magnetic part. The first magnetic field applying section applies a magnetic field to the magnetic fine particles including a first magnetic field generating section and a first yoke section. The second magnetic field applying section applies a magnetic field to the magnetic fine particles, which includes a second magnetic field generating section and a second yoke section. A mount is disposed between the first magnetic field applying section and the second magnetic field applying section, and holds the test cartridge. The connection magnetic part magnetically connects the first yoke part and the second yoke part.

FIG. 1A is a diagram showing an example of the configuration of a specimen testing apparatus according to the first embodiment. FIG. 1B is a diagram illustrating an example of the configuration of the specimen testing apparatus according to the first embodiment. FIG. 1C is a diagram showing an example of the configuration of the specimen testing apparatus according to the first embodiment. FIG. 2 is a diagram showing lines of magnetic force in the specimen testing apparatus according to the first embodiment. FIG. 3A is a diagram for explaining a test performed by the sample testing device according to the first embodiment. FIG. 3B is a diagram showing an example of a yoke according to the first embodiment. FIG. 4A is a diagram showing Example 1 of the connection magnetic part according to the first embodiment. FIG. 4B is a diagram showing Example 2 of the connection magnetic part according to the first embodiment. FIG. 4C is a diagram showing Example 3 of the connection magnetic part according to the first embodiment. FIG. 4D is a diagram showing Example 4 of the connection magnetic part according to the first embodiment. FIG. 4E is a diagram showing Example 4 of the connection magnetic part according to the first embodiment. FIG. 5A is a diagram showing Example 5 of the connection magnetic part according to the first embodiment. FIG. 5B is a diagram showing Example 6 of the connection magnetic part according to the first embodiment. FIG. 5C is a diagram showing Example 7 of the connection magnetic part according to the first embodiment. FIG. 6A is a diagram illustrating an example of the configuration of a specimen testing apparatus according to the second embodiment. FIG. 6B is a diagram illustrating an example of the configuration of the specimen testing apparatus according to the second embodiment. FIG. 6C is a diagram illustrating an example of the configuration of the specimen testing apparatus according to the second embodiment. FIG. 7A is a diagram showing Example 8 of the connection magnetic part according to the second embodiment. FIG. 7B is a diagram showing Example 9 of the connection magnetic part according to the second embodiment. FIG. 7C is a diagram showing Example 10 of the connection magnetic part according to the second embodiment. FIG. 7D is a diagram showing Example 11 of the connection magnetic part according to the second embodiment. FIG. 7E is a diagram showing Example 11 of the connection magnetic part according to the second embodiment. FIG. 8A is a diagram showing an example of a yoke according to the third embodiment. FIG. 8B is a diagram showing an example of a yoke according to the third embodiment. FIG. 9A is a diagram for explaining an example of a sample testing device. FIG. 9B is a diagram for explaining the magnetic field strength applied to the sensing area of the specimen testing apparatus shown in FIG. 9A. FIG. 10 is a diagram showing an example of a sample testing device provided with a yoke.

Hereinafter, embodiments of the sample testing device will be described in detail with reference to the accompanying drawings. Furthermore, the specimen testing apparatus according to the present application is not limited to the embodiments described below. Furthermore, the embodiments can be combined with other embodiments or conventional techniques as long as there is no contradiction in content. Furthermore, in the following description, similar components are given common reference numerals, and redundant description will be omitted.

(First embodiment)
The sample testing device according to the present embodiment is a sample testing device that performs a test using a test cartridge containing a test liquid containing magnetic particles, and improves the strength of the magnetic field applied to the sensing area containing the magnetic particles. Here, first, the magnetic field strength applied to the sensing area of the specimen testing apparatus 20 shown in FIG. 9A will be explained using FIG. 9B. FIG. 9B is a diagram for explaining the magnetic field strength applied to the sensing area of the sample testing apparatus 20 shown in FIG. 9A. Note that FIG. 9B schematically shows lines of magnetic force when a magnetic field is applied by the first magnetic field applying section 220.

For example, in the specimen testing apparatus 20, when a magnetic field is applied by the first magnetic field applying section 220, the magnetic field is applied to the optical waveguide type sensor chip 200, which is the sensing area, as shown by the lines of magnetic force in FIG. 9B. Ru. In this way, when a magnetic field is applied to the sensing area, the magnetic particles 206 included in the test cartridge 208 move from the side where the magnetic field is weak (the side where the magnetic flux density is low) to the side where the magnetic field is strong (the side where the magnetic flux density is high). becomes. That is, in the state shown in FIG. 9B, the magnetic fine particles 206 are attracted to the first magnetic field application section 220 side.

However, as shown in FIG. 9B, the lines of magnetic force generated by the first magnetic field applying section 220 wrap around the first magnetic field applying section 220, so there are parts that do not contribute to the sensing area of the optical waveguide type sensor chip 200. The efficiency for controlling the magnetic particles 206 is low.

Therefore, in this embodiment, the efficiency of controlling the magnetic particles is improved by increasing the strength of the magnetic field applied to the sensing area. Here, in order to increase the magnetic field strength, it is conceivable to provide a yoke (yoke) to the specimen testing apparatus, for example. FIG. 10 is a diagram showing an example of a sample testing device 30 provided with a yoke. For example, as shown in FIG. 10, the sample testing device 30 includes a yoke 323, a coil 320a, a magnetic field emitting section 320b, a coil 321a, a magnetic field emitting section 321b, a mount 340, and a guide 350. The test cartridge 308 held by the mount 340 is tested.

Here, the sample testing device 30 is configured such that the magnetic field emitting section 320b and the magnetic field emitting section 321b are arranged at opposing positions with the test cartridge 308 in between, and the yoke 323 is connected to the first magnetic field applying section. 320 side and the second magnetic field applying section 321 side are connected to each other. As a result, when the application of a magnetic field is controlled by the coil 320a or the coil 321a, the yoke 323 becomes a path for the lines of magnetic force, and the lines of magnetic force run in a concentrated manner from one magnetic field emitting part to the other magnetic field emitting part. . That is, in the sample testing device 30, the strength of the magnetic field applied to the test cartridge 308 disposed between the magnetic field emitting section 320b and the magnetic field emitting section 321b increases, increasing the efficiency of controlling the magnetic fine particles 306. I can do it.

In this way, by providing the yoke, it is possible to construct the specimen testing device 30 in which the magnetic field strength applied to the sensing area is improved. There is. For example, in the sample testing device 30 shown in FIG. 10, by moving the mount 340 toward the front in the depth direction in the figure along the guide 350, the mount 340 is pulled out from the inside of the yoke 323, and the test cartridge 308 is attached and removed. be done.

Although not shown, a light source, a light receiving element, etc. are fixed to this mount 340 from the side opposite to the side where the test cartridge 308 is held, and if the yoke 323 is provided to avoid the mount 340, it will become larger. Put it away. Furthermore, it is possible to pass the mount 340 through the light source, the light receiving element, etc., but considering the interference between the yoke 323 and the light source, the light receiving element, etc. when the mount 340 is pulled out to the front in the depth direction in the figure. In the end, upsizing is inevitable. On top of that, if you try to connect the yoke 323 between the first magnetic field applying section 320 side and the second magnetic field applying section 321 side, the width will increase, and the entire sample testing device 30 will become larger. .

Therefore, in the sample testing device according to the present embodiment, the strength of the magnetic field applied to the sensing area is improved while preventing the device from increasing in size. FIGS. 1A to 1C are diagrams showing an example of the configuration of a specimen testing apparatus 10 according to the first embodiment. Here, FIG. 1A is a front view of the specimen testing apparatus 10. FIG. 1B is a side view of the mount in a retracted state. FIG. 1C is a side view of the mount in an extended state.

As shown in FIG. 1, the specimen testing apparatus 10 includes a first magnetic field applying section 2, a connecting magnetic section 2d, a second magnetic field applying section 3, a connecting magnetic section 3d, a mount 4, and a guide. 5, a magnetic body 6, and a control circuit 7. The sample testing apparatus 10 then tests the test cartridge 1 held by the mount 4.

The first magnetic field applying section 2 includes a coil 2a, a first magnetic field emitting section 2b, and a first yoke 2c. The first magnetic field application unit 2 generates a magnetic field and applies the generated magnetic field to the sensing area within the test cartridge 1, thereby changing the position of the magnetic fine particles within the sensing area. For example, the first magnetic field application section 2 applies a magnetic field to the test cartridge, thereby moving the magnetic particles in the direction toward the first magnetic field application section 2 (first direction).

The coil 2a is wound around the first magnetic field emitting section 2b. A current is passed through the coil 2a under the control of the control circuit 7 to generate magnetic force. The first magnetic field emitting section 2b is made of a soft magnetic material, around which the coil 2a is wound, and causes the magnetic force generated by the coil 2a to be emitted to the second magnetic field applying section 3 side. Note that the coil 2a and the first magnetic field emitting section 2b are examples of a first magnetic field generating section. The first yoke 2c is made of a soft magnetic material, is connected to the first magnetic field emitting section 2b, and is formed so as to surround the first magnetic field emitting section 2b. The first yoke 2c serves as a path for lines of magnetic force in the magnetic fields applied by the first magnetic field applying section 2 and the second magnetic field applying section 3. Note that the first yoke 2c is an example of a first yoke portion.

As described above, the first magnetic field applying section 2 according to the present embodiment includes a first magnetic field generating section that includes the coil 2a and the first magnetic field emitting section 2b, and a first magnetic field generating section that is the first yoke section. The yoke 2c applies a magnetic field to the magnetic fine particles. For example, the first magnetic field applying section 2 is formed by an E-shaped yoke. That is, the inner protruding part of the E-shaped yoke becomes the first magnetic field emitting part 2b, the coil 2a is wound around it, and the outer peripheral part becomes the path of the lines of magnetic force.

The second magnetic field applying section 3 includes a coil 3a, a second magnetic field emitting section 3b, and a second yoke 3c, and a connecting magnetic section 3d is fixed thereto. The second magnetic field application unit 3 generates a magnetic field and applies the generated magnetic field to the sensing area within the test cartridge 1, thereby changing the position of the magnetic fine particles within the sensing area. For example, the second magnetic field application section 3 applies a magnetic field to the test cartridge, thereby moving the magnetic particles in the direction toward the second magnetic field application section 3 (second direction).

The coil 3a is wound around the second magnetic field emitting section 3b. A current is passed through the coil 3a under the control of the control circuit 7 to generate magnetic force. The second magnetic field emitting section 3b is made of a soft magnetic material, around which a coil 3a is wound, and causes the magnetic force generated by the coil 3a to be emitted to the first magnetic field applying section 2 side. Note that the coil 3a and the second magnetic field emitting section 3b are examples of a second magnetic field generating section. The second yoke 3c is made of a soft magnetic material, is connected to the second magnetic field emitting section 3b, and is formed so as to surround the second magnetic field emitting section 3b. The second yoke 3c serves as a path for magnetic lines of force in the magnetic fields applied by the first magnetic field applying section 2 and the second magnetic field applying section 3. Note that the second yoke 3c is an example of a second yoke portion.

As described above, the second magnetic field applying section 3 according to the present embodiment includes a second magnetic field generating section that includes the coil 3a and the second magnetic field emitting section 3b, and a second magnetic field generating section that is the second yoke section. The yoke 3c applies a magnetic field to the magnetic fine particles. For example, the second magnetic field applying section 3 is formed by an E-shaped yoke. That is, the inner protruding part of the E-shaped yoke becomes the second magnetic field emitting part 3b, around which the coil 3a is wound, and the outer peripheral part becomes the path of the lines of magnetic force.

The connection magnetic part 2d is arranged between the first yoke 2c and the mount 4, and magnetically connects the first yoke 2c and the second yoke in the second magnetic field application part 3. For example, the connecting magnetic part 2d is formed of a soft magnetic material such as stainless steel, excluding iron, steel, and austenite. Note that details of the connection magnetic part 2d will be described later. The connection magnetic part 3d is arranged between the second yoke 3c and the mount 4, and magnetically connects the second yoke 3c and the first yoke 2c in the first magnetic field application part 2. For example, the connecting magnetic part 3d is formed of a soft magnetic material such as stainless steel, excluding iron, steel, and austenite. Note that details of the connection magnetic part 3d will be described later.

Here, the first magnetic field applying section 2 and the second magnetic field applying section 3 are formed such that the first yoke 2c and the second yoke 3c face each other with the mount 4 in between. That is, the first magnetic field applying section 2 and the second magnetic field applying section 3 are formed such that the connecting magnetic section 2d and the connecting magnetic section 3d face each other with the mount 4 in between.

The mount 4 is arranged between the first magnetic field applying section 2 and the second magnetic field applying section 3 and holds the test cartridge 1. Here, the magnetic body 6 is arranged in a part of the mount 4. Specifically, as shown in FIG. 1B, when the mount 4 is housed and in a position where a magnetic field is applied to the test cartridge 1, the distance between the connection magnetic part 2d and the connection magnetic part 3d in the mount 4 is A magnetic material is placed at the position.

The mount 4 is provided so that its relative position with respect to the first magnetic field applying section 2 and the second magnetic field applying section 3 can be changed. That is, the mount 4 is movably supported with respect to the first magnetic field application section 2 and the second magnetic field application section 3. Specifically, the mount 4 is provided so as to be movable along the guide 5 in the depth direction in FIG. 1A. That is, as shown in FIG. 1B, the mount 4 is configured such that the test cartridge 1 is placed at a position where the first magnetic field emitting part 2b and the second magnetic field emitting part 3b face each other when performing a test. Moving. Then, as shown in FIG. 1C, when the test cartridge 1 is attached or removed, the mount 4 moves so that the test cartridge 1 is separated from the position where the first magnetic field emitting part 2b and the second magnetic field emitting part 3b face each other. .

Note that in this embodiment, an example will be described in which the mount 4 moves relative to the first magnetic field application section 2 and the second magnetic field application section 3, but the embodiment is not limited to this. For example, at least one of the first magnetic field applying section 2 and the second magnetic field applying section 3 may be movably supported with respect to the mount 4. That is, at least one of the first magnetic field applying section 2 and the second magnetic field applying section 3 may be moved so that the test cartridge 1 can be attached and detached.

The guide 5 is a rail or the like for moving the mount 4. Note that any guide 5 may be used as long as it can move the mount 4; It is preferable to use a material that does not affect the magnetic field (non-magnetic material).

The magnetic body 6 is formed of a soft magnetic material such as stainless steel, excluding iron, steel, and austenite, and is arranged in a part of the mount 4. Specifically, as shown in FIGS. 1A and 1B, the magnetic body 6 is connected to the connecting magnetic portion 2d of the mount 4 when the mount 4 is housed and in a position where a magnetic field is applied to the test cartridge 1. The connecting magnetic portion 3d is arranged at a position facing the connecting magnetic portion 3d. For example, when the mount 4 is housed and in a position where a magnetic field is applied to the test cartridge 1, a through hole is formed at a position where the connection magnetic part 2d and the connection magnetic part 3d of the mount 4 face each other. The magnetic material 6 is embedded in the through hole.

Here, the magnetic body 6 may have any shape and size as long as it can come into contact with the connection magnetic part 2d and the connection magnetic part 3d when the mount 4 is housed. For example, the shape of the magnetic body 6 that appears on the surface of the mount 4 may be any shape, and the size of the mount 4 in the thickness direction may not be the same as the thickness of the mount 4.

The control circuit 7 controls the timing of generating the magnetic field and the timing of stopping the generation of the magnetic field in each of the first magnetic field applying section 2 and the second magnetic field applying section 3. Specifically, the control circuit 7 controls the current flowing through the coil 2a and the coil 3a in a state in which the mount 4 is housed, thereby reducing the magnetic field generated by the first magnetic field applying section 2 and the second magnetic field applying section 3. Controls the start and stop of application of

Here, when the mount 4 is stored, the connecting magnetic part 2d magnetically connects the first yoke 2c and the magnetic body 6, and the connecting magnetic part 3d connects the magnetic body 6 and the second magnetic body 6. This is a state in which the yoke 3c is magnetically connected. That is, the first yoke 2c and the second yoke 3c are magnetically connected via the connection magnetic part 2d, the connection magnetic part 3d, and the mount 4. Therefore, under the control of the control circuit 7, when a magnetic field is applied from the first magnetic field applying section 2 or the second magnetic field applying section 3, the first yoke 2c, the connecting magnetic section 2d, the magnetic body 6, The connecting magnetic part 3d and the second yoke 3c serve as paths for the lines of magnetic force, and as shown in FIG. 2, the lines of magnetic force run concentrated between the first magnetic field emitting part 2b and the second magnetic field emitting part 3b. becomes.

As a result, the specimen testing apparatus 10 can improve the magnetic field strength applied to the test cartridge 1 disposed between the first magnetic field emitting section 2b and the second magnetic field emitting section 3b. That is, the specimen testing apparatus 10 can apply a high-intensity magnetic field to the sensing area containing the magnetic particles. Further, in the sample testing device 10, compared to the sample testing device 30 shown in FIG. 10, there is no need to provide a yoke to avoid mounting, and it is possible to prevent the device from increasing in size. Note that FIG. 2 is a diagram showing lines of magnetic force in the specimen testing apparatus 10 according to the first embodiment.

The details of the sample testing device 10 will be described below. FIG. 3A is a diagram for explaining a test performed by the sample testing apparatus 10 according to the first embodiment. FIG. 3A is an enlarged view of the mount 4 and test cartridge 1. As shown in FIG. 3A, the mount 4 has a magnetic body 6 disposed in a part thereof, and a light source 8 and a light receiving element 9 are fixed to the side opposite to the side that holds the test cartridge 1.

As shown in FIG. 3A, the test cartridge 1 held by the mount 4 includes a substrate 1a and an optical waveguide on which a first antibody 1e (primary antibody) that specifically binds to a target substance (antigen) 1h is fixed. 1b, a chamber 1c, a sample dropping port 1d, and magnetic fine particles 1g to which a second antibody 1f (secondary antibody) that specifically binds to the target substance is immobilized. For example, the test cartridge 1 is an optical waveguide type sensor chip. Although not shown, the test cartridge 1 includes a grating that functions as a diffraction grating when the light emitted from the light source 8 is introduced into the optical waveguide 1b and emitted to the light receiving element 9.

The substrate 1a has a flat plate shape and is made of a material that can transmit the light emitted from the light source 8. The substrate 1a can be made of, for example, alkali-free glass or quartz.

The optical waveguide 1b is made of a material that can transmit the light emitted from the light source 8. In such a case, it is desirable that the optical waveguide 1b be formed of a material having a higher refractive index than the substrate 1a. For example, the optical waveguide 1b can be formed from a thermosetting resin such as a phenol resin, an epoxy resin, an acrylic resin, a photocurable resin, or alkali-free glass. For example, the optical waveguide 1b is a planar optical waveguide formed in a planar shape. Note that the first antibody 1e is immobilized on the optical waveguide 1b by hydrophobic interaction or chemical bonding.

The chamber 1c has a reaction space inside and is formed to cover the surface of the optical waveguide 1b to which the first antibody 1e is fixed. The chamber 1c is provided with a sample dropping port 1d for dropping a sample 1i (test liquid containing 1 g of magnetic particles). The chamber 1c holds the dropped sample in the reaction space.

The second antibody 1f is immobilized on the surface of the magnetic fine particles 1g. 1 g of magnetic fine particles includes, for example, fine particles formed from a magnetic material whose surface is coated with a polymer material, or fine particles formed from a polymer material whose surface is coated with a magnetic material. Can be used. Further, the magnetic fine particles 1g may be fine particles themselves formed from a magnetic material, and in such a case, the second antibody 1f is bound to the surface of the fine particles by a hydrophobic bond, a covalent bond, or the like. The magnetic fine particles 1g can be formed from a magnetic material such as various ferrites such as γ-Fe203. In this case, it is preferable to use a superparamagnetic material that quickly loses its magnetism when the application of the magnetic field is stopped.

In addition, in order to improve redispersibility when the application of the magnetic field is stopped, the surface of 1 g of magnetic particles may be charged positively or negatively, and the dispersion medium (for example, sample solution) of 1 g of magnetic particles may be Dispersants such as activators may also be added. In this way, if the surface of 1 g of magnetic fine particles is given a positive or negative charge or a dispersant such as a surfactant is added, it becomes easier to redisperse 1 g of magnetic fine particles when the application of the magnetic field is stopped. However, stirring can be further promoted. This allows for even more accurate measurement.

The light source 8 emits light toward the test cartridge 1 . The light source 8 is, for example, a light emitting diode (LED) or a laser diode (LD). The light receiving element 9 receives light from the test cartridge 1 and measures the light intensity. The light receiving element 9 is, for example, a photodiode.

For example, in the sample testing apparatus 10, a sample 1i containing a sample collected from a subject and 1 g of magnetic particles is dropped from the sample dropping port 1d into the reaction space of the chamber 1c. Here, in the sample 1i, the target substance 1h contained in the specimen and the second antibody 1f immobilized on the magnetic fine particles 1g are combined by an antigen-antibody reaction.

Here, the control circuit 7 controls the test cartridge 1 to apply a magnetic field from the second magnetic field applying section 3 . As a result, the magnetic fine particles 1g move toward the optical waveguide 1b. That is, the target substance 1h bound to the second antibody 1f immobilized on the magnetic fine particles 1g through an antigen-antibody reaction is moved to the optical waveguide 1b side, and the target substance 1h and the first antibody 1e immobilized on the optical waveguide 1b are combined. can promote antigen-antibody reactions. Note that during the antigen-antibody reaction between the target substance 1h and the first antibody 1e, the control circuit 7 stops application of the magnetic field by the second magnetic field application section 3.

The control circuit 7 then controls the test cartridge 1 to apply a magnetic field from the first magnetic field application section 2 . Thereby, the magnetic fine particles 1g bound to the target substance 1h that did not undergo an antigen-antibody reaction with the first antibody 1e can be separated from the vicinity of the optical waveguide 1b, thereby improving the inspection accuracy. Note that the magnetic field applied from the first magnetic field applying section 2 is controlled to an intensity that does not separate the magnetic fine particles 1g that have undergone antigen-antibody reaction with the first antibody 1e.

Thereafter, the light source 8 emits light to the test cartridge 1. The light emitted from the light source 8 propagates while being reflected inside the optical waveguide 1b. Here, near-field light such as evanescent light is generated in the optical waveguide 1b due to the light propagating while being reflected inside the optical waveguide 1b. Near-field light is light generated at the interface between the optical waveguide 1b and the reaction space when the light is totally reflected at the interface. The near-field light is absorbed and scattered by the magnetic particles 1g near the optical waveguide 1b. Here, the absorption and scattering efficiency of near-field light increases according to the amount of 1 g of magnetic fine particles.

Therefore, by calculating the rate of decrease in the light intensity based on the light intensity measured by the light receiving element 9 and the reference light intensity, the amount of the magnetic fine particles 1g in the vicinity of the optical waveguide 1b can be determined. Then, based on the determined amount of 1 g of magnetic fine particles, the amount and concentration of the target substance 1 h in the sample are calculated.

Next, an example of a yoke provided in the first magnetic field applying section 2 and the second magnetic field applying section 3 will be described. FIG. 3B is a diagram showing an example of a yoke according to the first embodiment. For example, two E-shaped yokes shown in FIG. 3B are used as the yokes. Here, each E-shaped yoke is arranged at a position where an inner protruding portion that becomes the first magnetic field emitting portion 2b and an inner protruding portion that becomes the second magnetic field emitting portion 3b face each other. Further, each E-shaped yoke is arranged at a position where an outer protruding portion serving as the first yoke 2c and an outer protruding portion serving as the second yoke 3c face each other.

Next, examples of the connection magnetic part 2d and the connection magnetic part 3d will be described. As described above, in the specimen testing apparatus 10 according to the first embodiment, the connection magnetic part 2d magnetically connects with the first yoke 2c and the magnetic body 6 disposed on the mount 4. Further, the connecting magnetic portion 3d magnetically connects the magnetic body 6 disposed on the mount 4 and the second yoke 3c. Here, the connection magnetic part 2d and the connection magnetic part 3d are configured to be deformable.

For example, the connection magnetic part 2d and the connection magnetic part 3d are respectively fixed to the mount 4 side of the first yoke 2c and the mount 4 side of the second yoke 3c. Here, the connection magnetic part 2d and the connection magnetic part 3d can be formed in various shapes.

(Example 1)
FIG. 4A is a diagram showing Example 1 of the connection magnetic part according to the first embodiment. For example, the connecting magnetic part 2d and the connecting magnetic part 3d can each be formed by a leaf spring, as shown in FIG. 4A. In such a case, the plate springs that are the connection magnetic part 2d and the connection magnetic part 3d are fixed to the mount 4 side of the first yoke 2c and the mount 4 side of the second yoke 3c, respectively. Here, the connection magnetic part 2d and the connection magnetic part 3d are defined by the distance between the connection magnetic part 2d fixed to the first yoke 2c and the connection magnetic part 3d fixed to the second yoke 3c. is installed so that it is narrower than the thickness of the magnetic body 6. As a result, when the mount 4 is inserted when measuring an antigen-antibody reaction, the leaf spring deforms and comes into close contact with the magnetic body 6. In addition, force due to the deformation of the leaf spring is applied to the magnetic body 6, increasing the contact area, making it easier for magnetism to pass between the first yoke 2c and the second yoke 3c. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

(Example 2)
FIG. 4B is a diagram showing Example 2 of the connection magnetic part according to the first embodiment. For example, as shown in FIG. 4B, the connecting magnetic part 2d and the connecting magnetic part 3d can each be formed of a metal scrubber-like object in which metal fibers made of a soft magnetic material are entangled. In such a case, the metal scrubber-shaped connecting magnetic portion 2d and the connecting magnetic portion 3d are respectively fixed to the mount 4 side of the first yoke 2c and the mount 4 side of the second yoke 3c. Here, the connection magnetic part 2d and the connection magnetic part 3d are defined by the distance between the connection magnetic part 2d fixed to the first yoke 2c and the connection magnetic part 3d fixed to the second yoke 3c. is installed so that it is narrower than the thickness of the magnetic body 6. As a result, when the mount 4 is inserted during measurement of an antigen-antibody reaction, the metal scrubber-shaped connection magnetic part 2d and the connection magnetic part 3d are deformed and brought into close contact. That is, like a leaf spring, force is applied to the magnetic body 6 due to the deformation of the metal scrubber-shaped connecting magnetic parts 2d, 3d, increasing the contact area, so that the contact area between the first yoke 2c and the second yoke 3c is makes it easier for magnetism to pass through. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

(Example 3)
FIG. 4C is a diagram showing Example 3 of the connection magnetic part according to the first embodiment. For example, as shown in FIG. 4C, the connection magnetic part 2d and the connection magnetic part 3d can each be formed of a metal brush-like object made of soft magnetic material. In such a case, the gold brush-shaped connecting magnetic portion 2d and the connecting magnetic portion 3d are respectively fixed to the mount 4 side of the first yoke 2c and the mount 4 side of the second yoke 3c. Here, the connection magnetic part 2d and the connection magnetic part 3d are defined by the distance between the connection magnetic part 2d fixed to the first yoke 2c and the connection magnetic part 3d fixed to the second yoke 3c. is installed so that it is narrower than the thickness of the magnetic body 6. As a result, when the mount 4 is inserted during measurement of an antigen-antibody reaction, the gold brush-shaped connection magnetic part 2d and the connection magnetic part 3d are deformed and brought into close contact. That is, similar to a leaf spring or a metal scrubbing brush, a force is applied to the magnetic body 6 due to the deformation of the gold brush-shaped connecting magnetic parts 2d and 3d, increasing the contact area. Magnetism can easily pass between the yoke 3c and the yoke 3c. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

(Example 4)
FIGS. 4D and 4E are diagrams showing Example 4 of the connection magnetic part according to the first embodiment. For example, the connecting magnetic part 2d and the connecting magnetic part 3d can each be formed in an uneven shape, as shown in FIG. 4D. In such a case, the connecting magnetic part 2d and the connecting magnetic part 3d are formed in a convex shape and are fixed to the mount 4 side of the first yoke 2c and the mount 4 side of the second yoke 3c, respectively. Further, a recess is formed on the surface of the magnetic body 6. That is, when the mount 4 is inserted during measurement of an antigen-antibody reaction, the convex connecting magnetic part 2d and the connecting magnetic part 3d fit into the recessed part of the magnetic body 6 and come into close contact. This increases the contact area, making it easier for magnetism to pass between the first yoke 2c and the second yoke 3c. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

Further, for example, the connecting magnetic part 2d and the connecting magnetic part 3d can each be formed by a plunger type, as shown in FIG. 4E. In such a case, for example, the connecting magnetic part 2d and the connecting magnetic part 3d are formed of a spring and a sphere, and are built in the mount 4 side of the first yoke 2c and the mount 4 side of the second yoke 3c, respectively. Ru. Further, a recess is formed on the surface of the magnetic body 6. When the mount 4 is inserted at the time of measuring an antigen-antibody reaction, the connecting magnetic part 2d and the connecting magnetic part 3d of the sphere fit into the recessed part of the magnetic body 6 and come into close contact. This increases the contact area, making it easier for magnetism to pass between the first yoke 2c and the second yoke 3c. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

Furthermore, by forming the plunger type, the sphere at the tip sinks into the interior as the mount 4 is inserted during measurement of an antigen-antibody reaction, making it easier to move the mount 4. For example, even if the accuracy in the out-of-plane direction (in the vertical direction in the figure) when the mount 4 is moved is low, the movement can be easily adjusted because the sphere can follow up and down.

In addition, in FIGS. 4D and 4E, the case where the first yoke 2c and the second yoke 3c side are convex and the magnetic body 6 side is concave has been described, but the embodiments are not limited to this. Alternatively, the first yoke 2c and the second yoke 3c may be concave, and the magnetic body 6 side may be convex. Further, in FIGS. 4A to 4E, the case where the connecting magnetic part 2d and the connecting magnetic part 3d have the same shape has been described, but the embodiments are not limited to this, and different shapes may be combined. It can be anything.

In Examples 1 to 4 described above, the connection magnetic part 2d and the connection magnetic part 3d are fixed to the first yoke 2c and the second yoke 3c. The magnetic part 3d may be fixed to the mount 4. That is, the connection magnetic part 2d and the connection magnetic part 3d are fixed to the first magnetic field application section 2 side of the mount 4 and the second magnetic field application section 3 side of the mount 4, respectively. Here, the connection magnetic part 2d and the connection magnetic part 3d can be formed in various shapes as in the above-mentioned example.

(Example 5)
FIG. 5A is a diagram showing Example 5 of the connection magnetic part according to the first embodiment. For example, the connecting magnetic part 2d and the connecting magnetic part 3d can each be formed by a leaf spring, as shown in FIG. 5A. In such a case, the connecting magnetic part 2d and the connecting magnetic part 3d of the leaf spring are fixed to the first yoke 2c side of the mount 4 and the second yoke 3c side of the mount 4, respectively. Here, the connection magnetic part 2d and the connection magnetic part 3d are installed so as to be wider than the distance between the first yoke 2c and the second yoke 3c. As a result, when the mount 4 is inserted when measuring an antigen-antibody reaction, the leaf springs deform and come into close contact with the first yoke 2c and the second yoke 3c. In addition, force due to the deformation of the leaf spring is applied to the first yoke 2c and the second yoke 3c, increasing the contact area, making it easier for magnetism to pass between the first yoke 2c and the second yoke 3c. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

(Example 6)
FIG. 5B is a diagram showing Example 6 of the connection magnetic part according to the first embodiment. For example, as shown in FIG. 5B, the connecting magnetic part 2d and the connecting magnetic part 3d can each be formed of a metal scrubber-like object in which metal fibers made of a soft magnetic material are entangled. In such a case, the connection magnetic part 2d and the connection magnetic part 3d in the shape of a metal scrubber are fixed to the first yoke 2c side of the mount 4 and the second yoke 3c side of the mount 4, respectively. Here, the connecting magnetic part 2d and the connecting magnetic part 3d are formed in a size that is wider than the distance between the first yoke 2c and the second yoke 3c. As a result, when the mount 4 is inserted during measurement of an antigen-antibody reaction, the metal scrubber-shaped connection magnetic part 2d and the connection magnetic part 3d are deformed and brought into close contact. In other words, force is applied to the first yoke 2c and the second yoke 3c due to the deformation of the metal scrubber-like connecting magnetic parts 2d and 3d, increasing the contact area. Magnetism can easily pass between the two. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

(Example 7)
FIG. 5C is a diagram showing Example 7 of the connection magnetic part according to the first embodiment. For example, as shown in FIG. 5C, the connecting magnetic part 2d and the connecting magnetic part 3d can each be formed of a gold brush-like object made of a brush-like metal made of a soft magnetic material. In such a case, the gold brush-shaped connecting magnetic portion 2d and the connecting magnetic portion 3d are fixed to the first yoke 2c side of the mount 4 and the second yoke 3c side of the mount 4, respectively. Here, the connection magnetic part 2d and the connection magnetic part 3d are installed so as to be longer than the distance between the first yoke 2c and the second yoke 3c. As a result, when the mount 4 is inserted during measurement of an antigen-antibody reaction, the gold brush-shaped connection magnetic part 2d and the connection magnetic part 3d are deformed and brought into close contact. In other words, force is applied to the first yoke 2c and the second yoke 3c due to the deformation of the gold brush-shaped connection magnetic parts 2d and 3d, increasing the contact area, so that the first yoke 2c and the second yoke 3c Magnetism can easily pass between the two. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

Further, in Examples 5 to 7, the case where the connecting magnetic part 2d and the connecting magnetic part 3d have the same shape has been described, but the examples are not limited to this, and different shapes can be used. A combination may also be used. Further, in Examples 5 to 7, the case where the connecting magnetic part 2d, the connecting magnetic part 3d, and the magnetic body 6 are formed separately has been described, but the embodiments are not limited to this. Instead, the connecting magnetic part 2d, the connecting magnetic part 3d, and the magnetic body 6 may be integrally formed.

In Examples 1 to 7 described above, the connection magnetic part 2d and the connection magnetic part 3d are fixed to the first yoke 2c and the second yoke 3c (FIGS. 4A to 4E), and the connection The case where the magnetic part 2d for connection and the magnetic part 3d for connection are fixed to the mount 4 (FIGS. 5A to 5C) has been described. However, the embodiments are not limited to this, and the shapes and fixing positions can be combined arbitrarily. That is, the connection magnetic part 2d and the connection magnetic part 3d are connected to the mount 4 side of the first yoke 2c and the second magnetic field application part 3 side of the mount 4, or the mount 4 side of the second yoke 3c and the mount 4 side. They can also be fixed to the first magnetic field application section 2 side in 4.

As described above, according to the first embodiment, the first magnetic field applying section 2 includes the first magnetic field emitting section 2b and the first yoke 2c, and applies a magnetic field to the magnetic fine particles 1g. The second magnetic field applying section 3 includes a second magnetic field emitting section 3b and a second yoke 3c, and applies a magnetic field to the magnetic fine particles 1g. The mount 4 is arranged between the first magnetic field applying section 2 and the second magnetic field applying section 3 and holds the test cartridge 1. The connecting magnetic part 2d and the connecting magnetic part 3d magnetically connect the first yoke 2c and the second yoke 3c. Therefore, the specimen testing device 10 according to the first embodiment can concentrate the magnetic lines of force on the testing cartridge 1, making it possible to improve the magnetic field strength applied to the sensing area. As a result, the specimen testing apparatus 10 can increase the efficiency of testing by increasing the movement speed of 1 g of magnetic particles and shortening the time required for testing.

Further, according to the first embodiment, the first yoke 2c and the second yoke 3c are magnetically connected via the connection magnetic part 2d, the connection magnetic part 3d, and the mount 4. Therefore, the specimen testing apparatus 10 according to the first embodiment does not need to provide a yoke to avoid the mount 4, and it is possible to prevent an increase in size.

Further, according to the first embodiment, the connection magnetic part 2d and the connection magnetic part 3d are configured to be deformable. Therefore, the specimen testing apparatus 10 according to the first embodiment makes it possible to realize the connecting magnetic part 2d and the connecting magnetic part 3d of various shapes.

Further, according to the first embodiment, the magnetic body 6 is disposed in a part of the mount 4. The connection magnetic part 2d magnetically connects the first yoke 2c and the magnetic body 6. Further, the connection magnetic part 3d magnetically connects the second yoke 3c and the magnetic body 6. Therefore, in the specimen testing apparatus 10 according to the first embodiment, even when the mount is disposed between the first yoke 2c and the second yoke 3c, the first yoke 2c and the second yoke 3c This makes it possible to easily realize a magnetic connection between the two. As a result, the sample testing device 10 can prevent the device from increasing in size.

Further, according to the first embodiment, the mount is supported movably with respect to the first magnetic field application section 2 and the second magnetic field application section 3. Alternatively, at least one of the first magnetic field applying section 2 and the second magnetic field applying section 3 is supported movably with respect to the mount 4. Therefore, the sample testing device 10 according to the first embodiment allows the test cartridge 1 to be easily attached and detached.

Further, according to the first embodiment, the connection magnetic part 2d and the connection magnetic part 3d are respectively fixed to the mount 4 side of the first yoke 2c and the mount 4 side of the second yoke 3c. Further, the connection magnetic section 2d and the connection magnetic section 3d are fixed to the first magnetic field application section 2 side of the mount 4 and the second magnetic field application section 3 side of the mount 4, respectively. Further, the connection magnetic part 2d and the connection magnetic part 3d are connected to the mount 4 side of the first yoke 2c and the second magnetic field application part 3 side of the mount 4, or the mount 4 side of the second yoke 3c and the mount 4 side. 4 to the first magnetic field applying section 2 side. Therefore, the sample testing device 10 according to the first embodiment allows for increased freedom in design and easier manufacturing.

Further, according to the first embodiment, the first magnetic field emitting section 2b and the second magnetic field emitting section 3b are arranged at opposing positions with the test cartridge held by the mount 4 interposed therebetween. Therefore, the sample testing device 10 according to the first embodiment allows the magnetic fine particles 1g to be moved to the side opposite to the optical waveguide 1b.

Further, according to the first embodiment, the connection magnetic part 2d and the connection magnetic part 3d have any one of a plate spring shape, a scrubber shape, a brush shape, an uneven shape, and a plunger shape. Therefore, the specimen testing apparatus 10 according to the first embodiment makes it possible to increase the degree of freedom in designing the connection magnetic part.

Further, according to the first embodiment, the connection magnetic part 2d and the connection magnetic part 3d are formed of a soft magnetic material. Therefore, the specimen testing apparatus 10 according to the first embodiment enables reliable magnetic connection between the first yoke 2c and the second yoke 3c.

(Second embodiment)
In the first embodiment described above, the case where the magnetic body 6 is placed on the mount 4 has been described. In the second embodiment, a case will be described in which the second yoke 3c is inserted into the mount 4.

6A to 6C are diagrams showing an example of the configuration of a sample testing apparatus 10a according to the second embodiment. Here, FIG. 6A is a front view of the specimen testing apparatus 10a. FIG. 6B is a side view of the test cartridge 1 placed between the first magnetic field emitting section 2b and the second magnetic field emitting section 3b. FIG. 6C is a side view of the test cartridge 1 being installed and removed. In addition, in the second embodiment, compared to the first embodiment, the second yoke 3c is inserted into the mount 4, the part that moves when the test cartridge 1 is attached or detached, and the magnetic part for connection are different. The number of is different. These will be mainly explained below.

In the specimen testing apparatus 10a according to the second embodiment, one of the first yoke 2c and the second yoke 3c is inserted into the mount 4. The connection magnetic part magnetically connects the yoke inserted into the mount 4 and the other yoke. For example, in the specimen testing apparatus 10a, the second yoke 3c is inserted into the mount 4, as shown in FIG. 6A. For example, a through hole is formed in a part of the mount 4, and the second yoke 3c is inserted into the through hole. Here, the through holes are formed between the first yoke 2c and the second yoke 3c when the test cartridge 1 is disposed between the first magnetic field emitting section 2b and the second magnetic field emitting section 3b. It is formed at a position between.

In the specimen testing apparatus 10a, as shown in FIG. 6A, the connecting magnetic part 2d is arranged between the first yoke 2c and the second yoke 3c. That is, the connection magnetic part 2d in the specimen testing apparatus 10a magnetically connects the second yoke 3c passing through the mount 4 and the first yoke 2c.

Here, in the specimen testing apparatus 10a, the second yoke 3c passes through the mount 4, so the mount 4 cannot be moved. Therefore, the specimen testing apparatus 10a is provided with a magnetic field application section including the other yoke that is not inserted into the mount 4 so that its relative position with respect to the mount 4 can be changed. For example, in the specimen testing apparatus 10a, a guide 5 is provided above the first magnetic field application section 2, as shown in FIGS. 6A to 6C. Then, the first magnetic field applying section 2 is moved along the guide 5.

For example, when the test cartridge 1 is attached or removed, the first magnetic field application section 2 is moved to a position where it is retracted from above the test cartridge 1, as shown in FIG. 6C. When an inspection is performed, the first magnetic field applying section 2 is operated until the first magnetic field emitting section 2b reaches the upper part of the sensing area on the optical waveguide type sensor chip of the inspection cartridge 1, as shown in FIG. 6B. will be moved. Here, the second magnetic field applying section 3 and the mount 4 are in a relatively fixed state.

The connection magnetic part 2d is fixed to the mount 4 side of the first yoke 2c or the first yoke 2c side of the second yoke 3c. Here, the connecting magnetic part 2d can be formed in various shapes.

(Example 8)
FIG. 7A is a diagram showing Example 8 of the connection magnetic part 2d according to the second embodiment. Here, FIG. 7A shows a case where the connection magnetic part 2d is fixed to the mount 4 side of the first yoke 2c. For example, the connecting magnetic part 2d can be formed of a leaf spring, as shown in FIG. 7A. In such a case, the connecting magnetic portion 2d of the leaf spring is fixed to the mount 4 side of the first yoke 2c. Here, the connection magnetic part 2d is installed so as to be wider than the distance between the first yoke 2c and the second yoke 3c. As a result, when the first yoke 2c and the second yoke 3c face each other, the leaf spring deforms and comes into close contact with the second yoke 3c. In addition, a force due to the deformation of the leaf spring is applied to the second yoke 3c, increasing the contact area, making it easier for magnetism to pass between the first yoke 2c and the second yoke 3c. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

(Example 9)
FIG. 7B is a diagram showing Example 9 of the connection magnetic part 2d according to the second embodiment. Here, FIG. 7B shows a case where the connection magnetic part 2d is fixed to the mount 4 side of the first yoke 2c. For example, as shown in FIG. 7B, the connection magnetic part 2d can be formed of a metal scrubber-like object in which metal fibers made of a soft magnetic material are entangled. In such a case, the connection magnetic part 2d shaped like a metal scrubber is fixed to the mount 4 side of the first yoke 2c. Here, the connection magnetic part 2d is formed to be larger than the distance between the first yoke 2c and the second yoke 3c. As a result, when the first yoke 2c and the second yoke 3c face each other, the metal scrubber-shaped connection magnetic part 2d deforms and comes into close contact with them. In other words, force is applied to the second yoke 3c due to the deformation of the metal scrubber-shaped connection magnetic part 2d, increasing the contact area, making it easier for magnetism to pass between the first yoke 2c and the second yoke 3c. . As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

(Example 10)
FIG. 7C is a diagram showing Example 10 of the connection magnetic part 2d according to the second embodiment. Here, FIG. 7C shows a case where the connection magnetic part 2d is fixed to the mount 4 side of the first yoke 2c. For example, as shown in FIG. 7C, the connecting magnetic portions 2d can be each formed of a metal brush-like object made of soft magnetic material. In such a case, the gold brush-shaped connecting magnetic portion 2d is fixed to the mount 4 side of the first yoke 2c. Here, the connecting magnetic part 2d is installed so as to be longer than the distance between the first yoke 2c and the second yoke 3c. As a result, when the first yoke 2c and the second yoke 3c face each other, the gold brush-shaped connecting magnetic part 2d deforms and comes into close contact with them. In other words, force is applied to the second yoke 3c due to the deformation of the gold brush-shaped connecting magnetic part 2d, increasing the contact area, making it easier for magnetism to pass between the first yoke 2c and the second yoke 3c. . As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

In the embodiments 8 to 10 described above, the case where the connection magnetic part 2d is fixed to the mount 4 side of the first yoke 2c has been described. However, the embodiment is not limited to this, and the connecting magnetic portion 2d may be fixed to the first yoke 2c side of the second yoke 3c. That is, the connection magnetic part 2d of a leaf spring, the metal scrubber-shaped connection magnetic part 2d, and the gold brush-shaped connection magnetic part 2d may be fixed to the first yoke 2c side of the second yoke 3c. .

(Example 11)
FIGS. 7D and 7E are diagrams showing Example 11 of the connection magnetic part 2d according to the second embodiment. When fixing the connection magnetic part 2d to the mount 4 side of the first yoke 2c, the connection magnetic part 2d may be formed in an uneven shape or a plunger shape. For example, the connection magnetic part 2d can be formed in an uneven shape, as shown in FIG. 7D. In such a case, the connecting magnetic portion 2d is formed in a convex shape and is fixed to the mount 4 side of the first yoke 2c. Further, a recess is formed on the surface of the second yoke 3c. As a result, when the first yoke 2c and the second yoke 3c face each other, the convex connecting magnetic part 2d fits into the recessed part of the second yoke 3c and comes into close contact, increasing the contact area and Magnetism can easily pass between the yoke 2c and the second yoke 3c. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

Further, for example, the connecting magnetic part 2d can be formed of a plunger type, as shown in FIG. 7E. In such a case, for example, the connecting magnetic part 2d is formed of a spring and a sphere, and is built in the first yoke 2c on the mount 4 side. Further, a recess is formed on the surface of the second yoke 3c. As a result, when the first yoke 2c and the second yoke 3c face each other, the spherical connecting magnetic part 2d fits into the recess of the second yoke 3c and comes into close contact, increasing the contact area and increasing the contact area between the first and second yokes. Magnetism can easily pass between the yoke 2c and the second yoke 3c. As a result, the specimen testing apparatus 10 can increase the strength of the magnetic field emitted from each magnetic field emitting section 2b, 3b with respect to the sensing area, and can improve testing efficiency.

Furthermore, by forming the plunger type, the sphere at the tip sinks into the interior as the first yoke 2c and the second yoke 3c face each other, making it easier to move the first magnetic field application section 2. Become. For example, even if the accuracy in the out-of-plane direction (vertical direction in the figure) when moving the first magnetic field application unit 2 is low, the movement can be easily adjusted because the sphere can follow the vertical movement.

In the above example, the first yoke 2c side is convex and the second yoke 3c side is concave. However, the embodiment is not limited to this, and the first yoke 2c It is also possible to make the second yoke 3c side concave and convex on the second yoke 3c side.

As described above, according to the second embodiment, the second yoke 3c is inserted into the mount 4. The connection magnetic part 2d magnetically connects the second yoke 3c inserted into the mount 4 and the first yoke 2c. Therefore, the specimen testing apparatus 10a according to the second embodiment enables magnetic connection between the first yoke 2c and the second yoke 3c without providing the magnetic body 6 on the mount 4.

Further, according to the second embodiment, the first magnetic field applying section 2 including the first yoke 2c is provided so that its relative position with respect to the mount can be changed. Therefore, the sample testing device 10a according to the second embodiment allows the test cartridge 1 to be easily attached and detached.

Further, according to the second embodiment, the connection magnetic part 2d is fixed to the mount 4 side of the first yoke 2c or the first yoke 2c side of the second yoke 3c. Therefore, the specimen testing apparatus 10a according to the second embodiment enables magnetic connection between the first yoke 2c and the second yoke 3c using a single connection magnetic section.

(Third embodiment)
Although the first and second embodiments have been described so far, the present invention may be implemented in various different forms in addition to the first and second embodiments described above.

In the embodiment described above, the case where an E-type yoke is used has been described. However, the embodiment is not limited to this, and yokes of various other shapes may be used. FIGS. 8A and 8B are diagrams showing an example of a yoke according to the third embodiment. For example, a yoke having the shape shown in FIG. 8A can be used for the first magnetic field applying section 2 and the second magnetic field applying section 3. Here, as shown in FIG. 8A, each yoke is arranged at a position where an inner protruding part that becomes the first magnetic field emitting part 2b and an inner protruding part that becomes the second magnetic field emitting part 3b face each other. ing. The four protrusions forming the first yoke 2c and the four protrusions forming the second yoke 3c are arranged at opposing positions.

Further, for example, a yoke having a shape shown in FIG. 8B may be used for the first magnetic field applying section 2 and the second magnetic field applying section 3. Here, as shown in FIG. 8B, each yoke is arranged at a position where an inner protruding part that becomes the first magnetic field emitting part 2b and an inner protruding part that becomes the second magnetic field emitting part 3b face each other. ing. A planar rectangle serving as the first yoke 2c and a planar rectangle serving as the second yoke 3c are arranged at opposing positions.

For example, when the yokes shown in FIGS. 8A and 8B are used in the specimen testing apparatus 10 according to the first embodiment, connecting magnetic A portion 2d and a connecting magnetic portion 3d are arranged. For example, when the yokes shown in FIGS. 8A and 8B are used in the specimen testing apparatus 10a in the second embodiment, connections are made at all positions where the first yoke 2c and the second yoke 3c face each other. A magnetic part 2d for use is arranged.

Moreover, the shape and size of each part explained in the embodiment mentioned above can be changed arbitrarily. For example, in the embodiment described above, the first yoke 2c and the second yoke 3c are shown to have approximately the same length, but the ratio of the lengths is arbitrary. may be made longer.

Furthermore, in the embodiments described above, the case where an antigen-antibody reaction is used to detect a target substance has been described. However, the embodiment is not limited to this, and when the target substance is a sugar, the substances described as the first antibody and the second antibody are used as lectins, and when the target substance is a nucleotide chain, The substances described as the first antibody and the second antibody are complementary nucleotide chains, and when the target substance is a ligand, the substances described as the first antibody and the second antibody are It can be used as a receptor for it.

According to at least one embodiment described above, the strength of the magnetic field applied to the sensing area containing magnetic fine particles can be improved.

Although several embodiments of the invention have been described, these embodiments are presented by way of example and are not intended to limit the scope of the invention. These embodiments can be implemented in various other forms, and various omissions, substitutions, and changes can be made without departing from the gist of the invention. These embodiments and their modifications are included within the scope and gist of the invention as well as within the scope of the invention described in the claims and its equivalents.

1 Test cartridge 2 First magnetic field application section 2a, 3a Coil,
2b First magnetic field emitting section 2c First yoke 2d, 3d Connecting magnetic section 3 Second magnetic field applying section 3b Second magnetic field emitting section 3c Second yoke 4 Mount 5 Guide 6 Magnetic body 10, 10a Specimen inspection Device

Claims (19)

A sample testing device that performs a test using a test cartridge containing a test liquid containing magnetic fine particles,
a first magnetic field applying section that applies a magnetic field to the magnetic fine particles, including a first magnetic field generating section and a first yoke section;
a second magnetic field applying section that applies a magnetic field to the magnetic fine particles, the second magnetic field applying section including a second magnetic field generating section and a second yoke section;
a mount disposed between the first magnetic field applying section and the second magnetic field applying section and holding the test cartridge;
a connecting magnetic part that magnetically connects the first yoke part and the second yoke part;
Equipped with
The mount has a magnetic material arranged in a part,
In the specimen testing apparatus , the connection magnetic section magnetically connects the first yoke section and the second yoke section via the magnetic body. The specimen testing apparatus according to claim 1, wherein the first yoke part and the second yoke part are magnetically connected via the connection magnetic part and the mount. The specimen testing device according to claim 1 or 2, wherein the connection magnetic section is configured to be deformable. The connection magnetic part magnetically connects between the first yoke part and the magnetic body and between the second yoke part and the magnetic body, thereby connecting the first yoke part and the magnetic body. The specimen testing apparatus according to claim 1, wherein the yoke part and the second yoke part are magnetically connected. The specimen testing apparatus according to claim 4, wherein the mount is movably supported with respect to the first magnetic field applying section and the second magnetic field applying section. The specimen testing apparatus according to claim 4, wherein at least one of the first magnetic field applying section and the second magnetic field applying section is movably supported with respect to the mount. The specimen according to any one of claims 1 to 6, wherein the connection magnetic part is fixed to at least one of the mount side of the first yoke part and the mount side of the second yoke part. Inspection equipment. The specimen according to any one of claims 1 to 6, wherein the connection magnetic part is fixed to the first magnetic field application section side of the mount and to the second magnetic field application section side of the mount, respectively. Inspection equipment. The connection magnetic section is arranged on the mount side of the first yoke section and the second magnetic field application section side of the mount, or on the mount side of the second yoke section and the first magnetic field application section side of the mount. The specimen testing device according to any one of claims 1 to 6, wherein the specimen testing device is fixed to the magnetic field applying section. In the mount, one of the first yoke part and the second yoke part is inserted,
4. The specimen testing apparatus according to claim 1, wherein the connection magnetic part magnetically connects the yoke part inserted into the mount and the other yoke part. The specimen testing apparatus according to claim 10, wherein the magnetic field application section including the other yoke section is supported movably with respect to the mount. Any one of claims 1 to 3, 10, and 11, wherein the connection magnetic part is fixed to the mount side of the first yoke part or to the first yoke part side of the second yoke part. The sample testing device described in . 13. The first magnetic field generating section and the second magnetic field generating section are arranged at positions facing each other with a test cartridge held in the mount interposed therebetween. Sample testing equipment. The specimen testing device according to any one of claims 1 to 13, wherein the connection magnetic part has any one of a leaf spring shape, a scrubbing brush shape, a brush shape, an uneven shape, and a plunger shape. The specimen testing device according to any one of claims 1 to 14, wherein the connection magnetic part is formed of a soft magnetic material. A sample testing device that performs a test using a test cartridge containing a test liquid containing magnetic fine particles,
a first magnetic field applying section that applies a magnetic field to the magnetic fine particles, including a first magnetic field generating section and a first yoke section;
a second magnetic field applying section that applies a magnetic field to the magnetic fine particles, the second magnetic field applying section including a second magnetic field generating section and a second yoke section;
a mount disposed between the first magnetic field applying section and the second magnetic field applying section and holding the test cartridge;
a connecting magnetic part that magnetically connects the first yoke part and the second yoke part;
Equipped with
The connection magnetic section is fixed to the first magnetic field application section side of the mount and the second magnetic field application section side of the mount, respectively. A sample testing device that performs a test using a test cartridge containing a test liquid containing magnetic fine particles,
a first magnetic field applying section that applies a magnetic field to the magnetic fine particles, including a first magnetic field generating section and a first yoke section;
a second magnetic field applying section that applies a magnetic field to the magnetic fine particles, the second magnetic field applying section including a second magnetic field generating section and a second yoke section;
a mount disposed between the first magnetic field applying section and the second magnetic field applying section and holding the test cartridge;
a connecting magnetic part that magnetically connects the first yoke part and the second yoke part;
Equipped with
The connection magnetic section is arranged on the mount side of the first yoke section and the second magnetic field application section side of the mount, or on the mount side of the second yoke section and the first magnetic field application section side of the mount. Sample testing devices each fixed on the magnetic field application side. A sample testing device that performs a test using a test cartridge containing a test liquid containing magnetic fine particles,
a first magnetic field applying section that applies a magnetic field to the magnetic fine particles, including a first magnetic field generating section and a first yoke section;
a second magnetic field applying section that applies a magnetic field to the magnetic fine particles, the second magnetic field applying section including a second magnetic field generating section and a second yoke section;
a mount disposed between the first magnetic field applying section and the second magnetic field applying section and holding the test cartridge;
a connecting magnetic part that magnetically connects the first yoke part and the second yoke part;
Equipped with
In the mount, one of the first yoke part and the second yoke part is inserted,
The connection magnetic part magnetically connects the yoke part inserted into the mount and the other yoke part. A sample testing device that performs a test using a test cartridge containing a test liquid containing magnetic fine particles,
a first magnetic field applying section that applies a magnetic field to the magnetic fine particles, including a first magnetic field generating section and a first yoke section;
a second magnetic field applying section that applies a magnetic field to the magnetic fine particles, the second magnetic field applying section including a second magnetic field generating section and a second yoke section;
a mount disposed between the first magnetic field applying section and the second magnetic field applying section and holding the test cartridge;
a connecting magnetic part that magnetically connects the first yoke part and the second yoke part;
Equipped with
In the specimen testing device, the connection magnetic part has any one of a plate spring shape, a scrubbing brush shape, a brush shape, an uneven shape, and a plunger shape.

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