JP7161512B2 - Nail measurement method, nail seal manufacturing method, information processing device, nail seal manufacturing system, and program - Google Patents

Description

The present disclosure relates to a nail measuring method, a nail seal manufacturing method, an information processing device, a nail seal manufacturing system, and a program.

2. Description of the Related Art In recent years, the popularity of nail stickers that can easily decorate nails has increased, and various types of nail stickers are widely available on the market. For example, there are a type of nail sticker in which an adhesive sheet is decorated, and a gel nail sticker in which a three-dimensional decoration is given with a liquid photocurable resin. Nail stickers are easy to stick to and remove from nails, and are cheaper than nail treatments at salons, so users can easily change nail stickers and enjoy various designs and colors. be able to.

Recently, the quality of nail stickers has improved, and if the nail stickers can be applied neatly, the nails can be as beautiful as if they had been treated at a salon. However, if the application of the nail sticker fails, the nail sticker looks unsightly and the nail sticker tends to peel off from the nail. In addition, since the nail seals available in the market are not made to fit individual nails, the shape of the nail seals rarely fits one's nails perfectly. The user has to cut off the portion of the nail sticker protruding from the nail by himself, but the cutting causes part of the decoration to be missing or the design to be out of balance.

In Patent Document 1 below, the nail shape is measured using distance measurement methods such as a light section method, a TOF (Time Of Flight) method, a monocular camera measurement method, and a compound eye camera measurement method, and based on the measurement results A method for producing an original nail seal has been proposed. In addition, Patent Document 2 below proposes a method of applying a feature detection technique such as edge detection to a nail image to acquire the shape of the nail, and using the acquired nail shape to produce an original nail sticker. ing.

International Publication No. 2018/016206 JP 2016-85725 A

By using the above proposed method, the user can produce an original nail sticker that matches his/her own nail. However, in the above proposed method, the original nail seal is produced by copying the shape of the nail as it is onto the nail seal, and the measurement mechanism is complicated. In addition, the shape of the nail seal is also affected by contour irregularities and arch distortion. With such a nail sticker, it is difficult to apply it accurately because the surface of the nail can be seen or the nail sticker protrudes from the nail even if there is a slight misalignment at the time of application. In addition, if a device that even sticks to the nail is introduced, the mechanism will become even more complicated.

In view of the circumstances described above, there is a demand for a mechanism for producing an original nail sticker that not only fits the user's nail, but also has a shape that allows the user to attach the sticker relatively easily with their own hands. The feeling of fit to the nail can be realized by skillfully reflecting the shape of the user's nail in the shape of the nail seal for the characteristic part of the nail. Ease of application can be realized by skillfully leaving a shape on the nail sticker that allows the user to easily align the nail with the nail sticker when applying the nail sticker. If you meet these requirements, you will be able to create practical original nail stickers that fit your nails.

According to one aspect of the present disclosure, the purpose of the present disclosure is to provide a nail measuring method and a nail seal using the method for easily producing a practical original nail seal that fits one's nail. It is to provide a manufacturing method.

SUMMARY According to a first aspect of the present disclosure, a method of measuring a nail using a nail model is provided. In this method, the contour of the nail is detected from a first photograph of the flat part of the nail, and the shape of the nail model, which is composed of a plurality of straight lines and a plurality of curves connecting the straight lines, fits the contour of the nail. and correcting the nail model control parameters based on the shape of the curve in the nail arch.

According to a second aspect of the present disclosure, there is provided a nail sticker manufacturing method that receives information on a nail model determined by the method according to the first aspect, and cuts a sticker material based on the information on the nail model. be done.

According to a third aspect of the present disclosure, an information processing device is provided that determines a nail model that defines the shape of a nail seal. This device detects the contour of the nail from a first photograph of the flat portion of the nail, and creates a nail model composed of a plurality of straight lines and a plurality of curves connecting the straight lines so as to fit the contour of the nail. a determining unit for determining control parameters of the nail model; and a correcting unit for correcting the control parameters of the nail model based on the shape of the curve in the arch portion of the nail.

According to a fourth aspect of the present disclosure, an information processing device receives information about a nail model determined by the method according to the first aspect from the information processing device, and cuts a seal material based on the information. A nail seal manufacturing system is provided including a nail seal manufacturing apparatus for manufacturing a nail seal.

According to a fifth aspect of the present disclosure, there is provided a program that causes a computer to execute the process of the method according to at least one of the first aspect and the second aspect. As yet another aspect, a non-transitory computer readable storage medium storing this program can be provided.

According to the present disclosure, it is possible to easily produce a practical original nail seal that fits one's nail.

1 is a block diagram for explaining the system configuration of a nail seal manufacturing system according to an embodiment of the present disclosure; FIG. 2 is a block diagram for explaining a hardware configuration capable of realizing functions of an information processing apparatus according to an embodiment of the present disclosure; FIG. 1 is a block diagram for explaining a hardware configuration capable of realizing functions of a nail sticker manufacturing apparatus according to an embodiment of the present disclosure; FIG. 1 is a block diagram for explaining functions of an information processing device according to an embodiment of the present disclosure; FIG. FIG. 4 is a diagram showing an example of photographic data used for nail model determination; It is a figure for demonstrating a nail model. 4 is a chart for explaining a parameter table; FIG. FIG. 10 is a first diagram for explaining a method of determining a nail model; FIG. FIG. 10 is a second diagram for explaining a method of determining a nail model; FIG. 4 is a chart for explaining a method of correcting control parameters; FIG. FIG. 10 is a diagram for explaining a handle added to the nail model; FIG. 4 is a flow chart for explaining a nail model determination method and a nail seal manufacturing method according to an embodiment of the present disclosure;

Embodiments of the present disclosure will be described below with reference to the accompanying drawings. Elements having substantially the same functions in the present specification and drawings may be denoted by the same reference numerals, thereby omitting redundant description.

[1. Configuration of nail seal manufacturing system]
A system configuration of a nail seal manufacturing system according to an embodiment of the present disclosure will be described with reference to FIG. FIG. 1 is a block diagram for explaining the system configuration of the nail seal manufacturing system according to the embodiment of the present disclosure. A nail seal manufacturing system 10 shown in FIG. 1 is an example of a nail seal manufacturing system according to an embodiment of the present disclosure.

As shown in FIG. 1 , the nail sticker manufacturing system 10 includes an information processing device 11 and a nail sticker manufacturing device 12 . The information processing device 11 is, for example, an electronic device such as a smart phone, a tablet terminal, a PC (Personal Computer), or a game machine. In the example of FIG. 1, the information processing device 11 and the nail sticker manufacturing device 12 are connected via a network NW. The network NW is, for example, a wired LAN (Local Area Network), a wireless LAN, an optical communication network, a mobile phone network, or a combination thereof.

As will be described later, the information processing apparatus 11 determines a nail model that fits the user's nail from a photograph of the nail of the user who desires the original nail sticker, and transmits information on the determined nail model to the nail sticker manufacturing apparatus. 12. The nail model is a two-dimensional model that shows cutting lines for cutting a seal material to produce a nail seal. The nail seal manufacturing device 12 cuts the seal material based on the nail model information received from the information processing device 11 to manufacture an original nail seal that fits the user's nail.

The configuration of the nail sticker manufacturing system 10 shown in FIG. 1 is an example, and the information processing device 11 and the nail sticker manufacturing device 12 may be directly connected by wire or wirelessly. For example, both devices may be connected by a connection form such as USB (Universal Serial Bus), IEEE1394, Bluetooth, IrDA (Infrared Data Association). Moreover, the nail sticker manufacturing apparatus 12 may be a cloud system, and in this case, the functions of the nail sticker manufacturing apparatus 12 are provided as a cloud type service. Such modifications are naturally included in the technical scope of the embodiments of the present disclosure.

(Hardware of information processing device)
Here, a hardware configuration capable of realizing the functions of the information processing apparatus according to the embodiment of the present disclosure will be described with reference to FIG. 2 . FIG. 2 is a block diagram for explaining a hardware configuration capable of realizing the functions of the information processing device according to the embodiment of the present disclosure. The functions of the information processing device 11, which will be described later, can be realized using the hardware elements illustrated in FIG. Also, the functions of the information processing apparatus 11 can be realized by controlling the hardware illustrated in FIG. 2 using a computer program.

In the example of FIG. 2, the information processing device 11 has a camera 11a, a processor 11b, a memory 11c, a display interface (IF) 11d, a communication interface 11e, and an external interface 11f. Note that some elements may be omitted or other elements may be added depending on the mode of implementation.

The camera 11a has an optical system including at least one lens group, a solid-state imaging device such as a CCD (Charge Coupled Device) image sensor or a CMOS (Complementary Metal Oxide Semiconductor) image sensor, and a signal processing circuit that processes image signals. It is a device. Although the camera 11a is built in the information processing apparatus 11 in the example of FIG. 2, the camera 11a may be an external camera connected to an external interface 11f, which will be described later.

The processor 11b is processing circuitry such as a CPU (Central Processing Unit), a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array), and a GPU (Graphic Processing Unit). . The memory 11c is a storage device such as a ROM (Read Only Memory), a RAM (Random Access Memory), an HDD (Hard Disk Drive), an SSD (Solid State Drive), and a flash memory.

The display interface 11d is an interface circuit for connecting display devices such as LCDs (Liquid Crystal Displays) and ELDs (Electro-Luminescence Displays). The communication interface 11e is an interface circuit for connecting to the network NW.

The external interface 11 f is an interface circuit for connecting an external device installed outside the information processing apparatus 11 . The external interface 11f is, for example, a USB port, IEEE1394 port, SCSI (Small Computer System Interface), or the like. For example, input devices such as a keyboard, mouse, and touch panel, and output devices such as a printer can be connected to the external interface 11f. A recording medium 11g, which is a non-transitory computer readable storage medium, can be connected to the external interface 11f. For example, the recording medium 11g is a magnetic recording medium, an optical disk, a magneto-optical disk, a semiconductor memory, or the like.

The processor 11b can read the computer program stored in the recording medium 11g, store it in the memory 11c, and control the operation of the information processing apparatus 11 according to the computer program read from the memory 11c. The computer program that controls the operation of the information processing device 11 may be stored in advance in the memory 11c or may be downloaded via the communication interface 11e.

(Hardware of nail seal manufacturing equipment)
Next, referring to FIG. 3, it is a block diagram for explaining a hardware configuration capable of realizing the functions of the nail seal manufacturing apparatus according to the embodiment of the present disclosure. FIG. 3 is a block diagram for explaining a hardware configuration capable of realizing the functions of the nail seal manufacturing apparatus according to the embodiment of the present disclosure.

As shown in FIG. 3 , the nail sticker manufacturing device 12 has a control device 121 , a printing device 122 and a cutting device 123 . The control device 121, the printing device 122, and the cutting device 123 may be separate units, two of these units may be integrated, or all these units may be integrated. may At least two of the control device 121, printing device 122, and cutting device 123 may be connected using a wired and/or wireless network.

The control device 121 has a processor 121a, a memory 121b, a communication interface 121c, and an external interface 121d. The processor 121a, memory 121b, communication interface 121c, and external interface 121d have functions similar to those of the processor 11b, memory 11c, communication interface 11e, and external interface 11f, respectively. In the example of FIG. 3, a printing device 122 and a cutting device 123 are connected to the control device 121 via the external interface 121d.

The control device 121 receives nail model information and nail sticker decoration information from the information processing device 11 using the communication interface 121c. Further, the control device 121 stores the received information in the memory 121b, controls the operation of the printing device 122 and the cutting device 123 using the processor 121a, and decorates the seal material based on the information stored in the memory 121b. Print and cut nail stickers. The type of decoration, the type of seal material, the printing method, and the cutting method can be arbitrarily selected according to the mode of implementation.

(Function of information processing device)
Next, functions of the information processing apparatus according to the embodiment of the present disclosure will be described with reference to FIG. FIG. 4 is a block diagram for explaining functions of the information processing device according to the embodiment of the present disclosure. Note that the functions of the information processing device 11 illustrated in FIG. 4 are an example of the functions of the information processing device according to the embodiment of the present disclosure.

As shown in FIG. 4 , the information processing device 11 has a storage unit 111 , a contour detection unit 112 , an arch detection unit 113 , a parameter determination unit 114 , a model correction unit 115 and a handle addition unit 116 . Note that the contour detection unit 112, the arch detection unit 113, and the parameter determination unit 114 are one implementation example of the determination unit according to the present disclosure. The model corrector 115 is one implementation of the corrector according to the present disclosure.

The function of the storage unit 111 can be realized by either one of the memory 11c and the recording medium 11g described above. The functions of the contour detection unit 112, the arch detection unit 113, the parameter determination unit 114, the model correction unit 115, and the handle addition unit 116 can be realized mainly by the functions of the processor 11b described above.

The storage unit 111 stores photograph data 111a and a parameter table 111b. As shown in FIG. 5, the photo data 111a includes data of a first photo PCT1 showing the flat part of the nail and data of a second photo PCT2 showing the arch part of the nail in the direction toward the base of the nail. include. FIG. 5 is a diagram showing an example of photograph data used for nail model determination. The photo data 111a may be photo data taken by the camera 11a, or photo data acquired via the network NW or the recording medium 11g. Also, the sizes of the first photo PCT1 and the second photo PCT2 are adjusted to the actual size.

The flat portion of the nail referred to here refers to the portion inside the outline of the nail that can be seen when the nail is viewed from above with the palm facing down on a flat surface and the nail being oriented perpendicular to the plane. In addition, the arch portion of the nail referred to here refers to the curved (so-called lateral arch) portion of the nail that can be seen when looking at the nail along the direction from the tip of the finger to the base of the nail (hereinafter referred to as the depth direction). . The arch portion corresponds to a cross-sectional portion when the nail is cut along a plane perpendicular to the depth direction. Note that the nail is a part of the human body, and even if it is the nail of the same person, its shape changes from day to day. errors can of course be allowed.

The parameter table 111b is a table for storing control parameters of the nail model 20. FIG. The nail model 20 is model information for determining a cutting line for cutting out a nail seal from a seal material. The nail model 20 is composed of a plurality of straight lines and a plurality of curved lines connecting the straight lines. For example, as shown in FIG. 6, the nail model 20 is composed of two parallel straight lines and four curved lines connecting the two straight lines. FIG. 6 is a diagram for explaining the nail model. In the example of FIG. 6, each of the four curves is a cubic Bezier curve.

Here, a straight line connecting the points SP1 and SP3 is called a straight line L1, and a straight line connecting the points SP2 and SP4 is called a straight line L2. A curve connecting points SP1 and EP12 is called curve C1, a curve connecting points SP2 and EP12 is called curve C2, a curve connecting points SP3 and EP34 is called curve C3, and a curve connecting points SP4 and EP34 is called curve C4. Straight lines L1 and L2 are maintained parallel. Since the curves C1, C2, C3, and C4 are each cubic Bezier curves, the shape of each curve is determined by a start point, an end point, and two control points. The control points of curve C1 are points P11 and P12, the control points of curve C2 are points P21 and P22, the control points of curve C3 are points P31 and P32, and the control points of curve C4 are points P41 and P42. be.

Of the two control points that determine the shape of the curve C1, the control point P11, which is close to the connection point (SP1) between the straight line L1 and the curve C1, is arranged on the extension of the straight line L1. Also, of the two control points that determine the shape of the curve C2, the control point P21 that is close to the connection point (SP2) between the straight line L2 and the curve C2 is arranged on the extension of the straight line L2. Of the two control points that determine the shape of the curve C3, the control point P31, which is close to the connection point (SP3) between the straight line L1 and the curve C3, is arranged on the extension of the straight line L1. Of the two control points that determine the shape of the curve C4, the control point P41 near the connection point (SP4) between the straight line L2 and the curve C4 is arranged on the extension of the straight line L2. Such control point arrangement smoothly connects corresponding curves and straight lines.

Of the two control points that determine the shape of the curve C1, the control point P12 and the point EP12 near the connection point (EP12) of the curves C1 and C2. It is arranged on the same straight line as the control point P12 near the connection point (EP12) of C2. Similarly, of the two control points that determine the shape of the curve C3, the control point P32 and the point EP34 near the connection point (EP34) of the curves C3 and C4, and the two control points that determine the shape of the curve C4 are: It is arranged on the same straight line as the control point P42 near the connection point (EP34) of the curves C3 and C4. With such a control point arrangement, the curves C1 and C2 are smoothly connected at the point EP12, and the curves C3 and C4 are smoothly connected at the point EP34.

Here, the XY coordinates of points SP1, SP2, SP3, and SP4 are expressed as (x1, y1), (x2, y2), (x3, y3), and (x4, y4), respectively. Also, the XY coordinates of the points EP12 and EP34 are expressed as (Xa, Ya) and (Xb, Yb). The Y coordinates of points P11, P21, P31, and P41 are denoted by v1, v2, v3, and v4, respectively, and the X coordinates of points P12, P22, P32, and P42 are denoted by h1, h2, h3, and h4, respectively. The axis along the direction from the tip of the claw to the root of the claw is defined as the X axis, and the axis orthogonal to the X axis on a plane substantially parallel to the flat portion of the claw is defined as the Y axis.

Considering the arrangement conditions described above, the coordinates of the control points P11 and P12 of the curve C1 are (x1, v1) and (h1, Ya), respectively. Similarly, the coordinates of control points P21 and P22 of curve C2 are (x2, v2) and (h2, Ya), respectively. Also, the coordinates of the control points P31 and P32 of the curve C3 are (x3, v3) and (h3, Yb), respectively. Similarly, the coordinates of control points P41 and P42 of curve C4 are (x4, v4) and (h4, Yb), respectively.

The relationship between the straight lines L1, L2 and the curves C1, C2, C3, C4 described above and each point, and information about the coordinates of each point are stored in the parameter table 111b shown in FIG. FIG. 7 is a chart for explaining the parameter table. As will be described later, the information processing apparatus 11 determines the shape of the nail model 20 by determining data in the parameter table 111b, and corrects the shape of the nail model 20 by correcting the data.

In addition, although the expressions "start point" and "end point" are used in the explanation, which of the two points associated with the "start point" and "end point" is set arbitrarily. It is possible. For example, in the example of FIG. 7, the start point of the straight line L1 is the point SP1 and the end point is the point SP3, but the start point may be the point SP3 and the end point may be the point SP1. Also, the starting point of the curve C1 is the point SP1 and the end point is the point EP12, but the starting point may be the point EP12 and the end point may be the point SP1. However, in this case, the two control points are also switched, and the control point to be specified first (first control point) is point P12, and the control point to be specified later (second control point) is point P11.

Please refer to FIG. 4 again. The contour detection unit 112 reads the photograph data 111a and detects the contour of the nail from the first photograph PCT1. The contour detection result is input to the parameter determination unit 114 . The arch detection unit 113 reads the photo data 111a and detects the curve of the nail from the second photo PCT2. The curve detection result is input to the model correction unit 115 . Any image processing technique such as edge extraction or object recognition technique may be used for contour detection and curve detection.

(Determination of control parameters)
The parameter determination unit 114 arranges the start and end points of the straight lines L1 and L2 on the contour of the nail, as shown in FIG. FIG. 8 is a first diagram for explaining the nail model determination method. For example, the parameter determination unit 114 detects two straight line portions on the contour that can be approximated by two parallel straight lines, and arranges the start point SP1 and the end point SP3 of the straight line L1 at the two ends of one straight line portion. , the start point SP2 and the end point SP4 of the straight line L2 are arranged at the two ends of the other straight line portion.

Further, the parameter determining unit 114 detects a curve that connects the ends of the two straight lines on the contour, places a connection point EP12 between the curves C1 and C2 at the top of the curve near the fingertip, and determines the base of the nail. A connection point EP34 of the curves C3 and C4 is placed at the top of the curve at a position close to . The top of the curve can be detected, for example, by finding the point of contact between the curve and a straight line perpendicular to the straight lines L1, L2. For the convenience of explanation, the above two curves are distinguished according to the positional relationship between the position closer to the fingertip and the position closer to the base of the nail. It suffices if the user recognizes that, and does not need to recognize the positional relationship.

The parameter determination unit 114 determines a curve C1 that connects the starting point SP1 and the connection point EP12 placed on the contour, and a curve C2 that connects the start point SP2 and the connection point EP12 placed on the contour. The parameter determination unit 114 also determines a curve C3 connecting the starting point SP3 and the connection point EP34 arranged on the contour, and a curve C4 connecting the starting point SP4 and the connection point EP34 arranged on the contour. At this time, the parameter determination unit 114 adjusts the position of each control point so that the curves C1, C2, C3, and C4 fit the contour of the nail.

As shown in FIG. 7, the coordinates of the control point P11 that defines the shape of the curve C1 are (x1, v1), the coordinates of the control point P12 are (h1, Ya), and the adjustable control parameters are the control points The Y coordinate (v1) of P11 and the X coordinate (h1) of the control point P12. The parameter determination unit 114 determines control parameters h1 and v1 that allow the curve C1 to fit the contour of the nail. The parameter determination unit 114 also adjusts the adjustable control parameters h2 and v2 of the curve C2 to determine the control parameters h2 and v2 so that the curve C2 fits the contour of the nail. Similarly, parameter determination unit 114 determines control parameters h3, h4, v3, and v4 for curves C3 and C4.

The control parameters determined by the parameter determination unit 114 by the above method (the coordinates of the starting and ending points of the straight lines L1 and L2, and the coordinates of the control points of the curves C1, C2, C3, and C4) are stored in the parameter table 111b. Stored. The shape of the nail model 20 corresponding to the parameter table 111b at this point does not consider the curvature of the nail arch. Therefore, the function of the model correction unit 115, which will be described later, corrects the nail model 20 so that it has a shape that takes into consideration the curvature. That is, the model correcting unit 115 corrects the nail model 20 so that the width of the nail model 20 (the distance between the straight lines L1 and L2) substantially matches the width of the nail when the nail is spread flat.

(Correction of nail model)
As shown in FIG. 9, the model correction unit 115 fits an arc (curve connecting points A1 and A2 in the figure) to the nail curve in the second photograph PCT2. FIG. 9 is a second diagram for explaining the nail model determination method. An arc is a portion of a circle, for example, the distance between the two ends A1, A2 of the arc (equivalent to the distance between the straight lines L1, L2 in the nail model 20 before correction) and the distance from the center A0 of the arc to the end point The shape of the arc is determined by the angle θ between the two straight lines extending to A1 and A2. Since the end points A1 and A2 are determined, obtaining an arc that fits the curve of the nail corresponds to obtaining the angle θ between straight lines extending from the center A0 to the end points A1 and A2.

After obtaining the angle θ, the model correction unit 115 obtains a correction coefficient k based on the following formula (1). The correction coefficient k is the ratio (d2/d1) of the arc length (d2) to the straight line length (d1) connecting the end points A1 and A2. As shown in FIG. 10, the model correction unit 115 multiplies the X-coordinate value of each coordinate described in the parameter table 111b by a correction coefficient k to correct the control parameters (coordinates of each point) of the parameter table 111b. FIG. 10 is a chart for explaining a method of correcting control parameters.
k=θ/(2·sin(θ/2)) (1)

The above correction determines the shape of the nail model 20 taking into account the curvature of the arch. Information on the nail model 20 is sent to the nail seal manufacturing apparatus 12 . The information of the nail model 20 may be the control parameters themselves described in the parameter table 111b, or may be a diagram (such as a diagram) of the nail model 20 drawn based on the control parameters of the parameter table 111b. . The nail seal manufacturing apparatus 12 that receives the information on the nail model 20 cuts the seal material based on the nail model 20. - 特許庁As a result, an original nail seal that fits the user's nail is manufactured.

(addition of handle)
A handle may be added to the nail seal in order to facilitate the peeling of the nail seal from the sheet and the easy attachment of the nail seal to the nail. The addition of the handle may be performed by the information processing device 11 or may be performed by the nail sticker manufacturing device 12 . In the example of FIG. 4 , the information processing device 11 adds a handle using the function of the handle addition unit 116 . In this case, the handle adding section 116 adds the handle 20a to the nail model 20 as shown in FIG. FIG. 11 is a diagram for explaining the handle added to the nail model.

When the information of the nail model 20 is the control parameter itself, the handle adding unit 116 adds the handle information including the information indicating the shape of the handle and the coordinates of the part to which the handle is connected to the nail model 20 information. , and sent to the nail seal manufacturing device 12. On the other hand, if the information of the nail model 20 is a drawing of the nail model 20 , the handle adding unit 116 creates a drawing of the nail model 20 with the handle added, and sends the drawing to the nail sticker manufacturing apparatus 12 . . In addition, when the nail sticker manufacturing apparatus 12 adds a handle, the function of the handle adding section 116 may be omitted.
The nail seal manufacturing system has been described above.

[2. Operation of nail seal manufacturing system]
Next, a nail model determination method and a nail seal manufacturing method according to an embodiment of the present disclosure will be described with reference to FIG. 12 . FIG. 12 is a flowchart for explaining a nail model determination method and a nail seal manufacturing method according to an embodiment of the present disclosure.

(S101) The information processing device 11 acquires the data of the first photo PCT1 showing the flat portion of the nail and the second photo PCT2 showing the arch portion of the nail, and stores them in the storage unit 111 as photo data 111a. do.

(S102, S103) The information processing device 11 detects the contour of the nail from the first photograph PCT1 by the contour detection unit 112, and adjusts the control parameters of the nail model 20 so as to fit the contour of the nail by the parameter determination unit 114. do.

For example, the parameter determination unit 114 detects two straight line portions on the contour that can be approximated by two parallel straight lines, and arranges the start point SP1 and the end point SP3 of the straight line L1 at the two ends of one straight line portion. , the start point SP2 and the end point SP4 of the straight line L2 are arranged at the two ends of the other straight line portion. Further, the parameter determination unit 114 detects a curve that connects the ends of the two straight lines on the contour, and places a connection point EP12 between the curves C1 and C2 at the top of the curve located near the tip of the nail. A connection point EP34 of the curves C3 and C4 is arranged at the top of the curve located near the root of .

The parameter determination unit 114 also determines a curve C1 connecting the starting point SP1 and the connection point EP12 arranged on the contour, and a curve C2 connecting the starting point SP2 and the connection point EP12 arranged on the contour. The parameter determination unit 114 also determines a curve C3 connecting the starting point SP3 and the connection point EP34 arranged on the contour, and a curve C4 connecting the starting point SP4 and the connection point EP34 arranged on the contour. At this time, the parameter determination unit 114 adjusts the position of each control point so that the curves C1, C2, C3, and C4 fit the contour of the nail.

(S104, S105) The information processing device 11 detects the curve of the nail from the second photograph PCT2 by the arch detection unit 113, and determines the shape of the arc by the model correction unit 115 so that the arc fits the curve of the nail. do. In addition, the model correction unit 115 obtains the correction coefficient k based on the above equation (1), and multiplies the value of the X coordinate for each coordinate described in the parameter table 111b by the correction coefficient k. Correct the control parameters (coordinates of each point).

( S<b>106 ) The information processing apparatus 11 adds the handle 20 a to the nail model 20 by the handle adding section 116 . As a modification, the addition of the handle may be performed by the nail sticker manufacturing apparatus 12, or the processing of S106 itself may be omitted.

(S107) The information processing apparatus 11 acquires setting information such as the design of the nail sticker, and transmits information on the nail model 20 to the nail sticker manufacturing apparatus 12 together with the setting information. The setting information may include information for specifying the material and design of the nail sticker, and the design image of the nail sticker.

( S<b>108 ) The nail sticker manufacturing apparatus 12 manufactures nail stickers based on the setting information and the information of the nail model 20 received from the information processing apparatus 11 . For example, the nail sticker manufacturing apparatus 12 prints the design of the nail sticker using the printing device 122 based on the received setting information, and cuts the nail sticker using the cutting device 123 based on the received information of the nail model 20 . In the case of a gel nail seal, the printing device 122 creates a decoration on the seal base material with a liquid photocurable resin instead of printing or in addition to printing. When the process of S108 is completed, the series of processes shown in FIG. 12 ends.
The operation of the nail seal manufacturing system has been described above.

As described above, in the embodiment of the present disclosure, the nail model 20 composed of straight lines L1, L2 and curved lines C1, C2, C3, C4 is used to measure the shape of the nail, and the nail model 20 is used to measure the original shape of the nail. Create nail stickers. Although the model has a simple structure, it uses a cubic Bezier curve that fits well on the curve of the nail. This reduces the risk of failure during installation. In other words, according to the above-described embodiment, it is possible to manufacture a practical original nail sticker that fits the shape of the nail sufficiently, is easy to stick to an accurate position even when the user sticks it by himself/herself, and is easily and neatly finished. becomes possible. In addition, by sticking neatly, the nail sticker is less likely to peel off from the nail.

Although the preferred embodiments of the present disclosure have been described above with reference to the accompanying drawings, the present disclosure is not limited to such examples. It is obvious that a person skilled in the art can conceive of various modifications or modifications within the scope described in the claims, and these naturally belong to the technical scope of the present disclosure.

REFERENCE SIGNS LIST 10 nail sticker manufacturing system 11 information processing device 11a camera 11b, 121a processor 11c, 121b memory 11d display interface 11e, 121c communication interface 11f, 121d external interface 11g recording medium 12 nail sticker manufacturing device 20 nail model 20a handle 111 storage unit 111a Photograph data 111b Parameter table 112 Contour detection unit 113 Arch detection unit 114 Parameter determination unit 115 Model correction unit 116 Handle addition unit 121 Control device 122 Printing device 123 Cutting device L1, L2 Straight lines C1, C2, C3, C4 Curve NW network PCT1 1st photo PCT2 2nd photo

Claims (11)

A method of measuring a nail using a nail model, comprising:
The contour of the nail is detected from a first photograph of the flat portion of the nail, and the shape of the nail model composed of two parallel straight lines and a plurality of curved lines connecting the two straight lines is determined as the above. determining control parameters of the nail model to fit the contour of the nail;
correcting the control parameters of the nail model based on the shape of the curve in the nail arch. The process further includes detecting a curve in the nail arch from a second photograph of the nail arch oriented toward the base of the nail.
The method of claim 1. each of the plurality of curves is a cubic Bezier curve;
The control parameters of the nail model include a first group of parameters that determine the start and end points of each of the two straight lines, and the start, end and control points of the cubic Bezier curves for each of the plurality of curves. a second set of parameters,
The method of claim 1 . The two ends of the two straight lines are connected by a first Bezier curve and a second Bezier curve,
Of the control points of the first Bezier curve, the first control point near the connection point between the first Bezier curve and the second Bezier curve, and the control point of the second Bezier curve, A second control point close to the connection point is arranged on the same straight line,
4. The method of claim 3 . Among the control points of the first Bezier curve, a third control point far from the connection point is arranged on an extension of a straight line connected to the first Bezier curve,
Among the control points of the second Bezier curve, a fourth control point far from the connection point is arranged on an extension of a straight line connecting with the second Bezier curve.
5. The method of claim 4 . The process of correcting the control parameters of the nail model includes:
fitting an arc to the curve of the nail in a second photograph and correcting control parameters of the nail model using a correction factor based on the shape of the arc;
6. The method of claim 5 . The process of correcting the control parameters of the nail model includes:
An angle formed by a straight line connecting the center of the arc and one end of the arc and a straight line connecting the center of the arc and the other end of the arc is obtained, and the width of the nail model is determined based on the angle. Determining the correction coefficient for correcting the first parameter group and the second parameter group so as to match the width of the nail when spread on a plane,
7. The method of claim 6 . A nail sticker manufacturing method, wherein a computer receives information on the nail model determined by the method according to any one of claims 1 to 7 , and cuts a sticker material based on the information on the nail model. . The contour of the nail is detected from a first photograph of the flat portion of the nail, and a nail model composed of two parallel straight lines and a plurality of curves connecting the two straight lines is the contour of the nail. a determination unit that determines control parameters of the nail model to fit the
an information processing apparatus comprising: a correction unit that corrects control parameters of the nail model based on a shape of a curve in the arch portion of the nail. an information processing device;
a nail sticker manufacturing device that receives information of the nail model determined by the method according to any one of claims 1 to 7 from the information processing device and cuts a sticker material based on the information of the nail model; A nail seal manufacturing system, comprising: A program that causes a computer to execute the process according to any one of claims 1 to 7 .

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