JP6953905B2 - Electromagnetic wave measuring device and electromagnetic wave measuring method - Google Patents

Description

The present invention relates to an electromagnetic wave measuring device and an electromagnetic wave measuring method.

Conventionally, there is known a method of measuring the radiation emission of the object to be measured by rotating the object to be measured to be measured by the radiation emission by a rotation mechanism and moving the antenna for receiving the radiation emission by a predetermined height. (See Patent Document 1).

Japanese Unexamined Patent Publication No. 2001-324524

In the conventional technique, every time the height of the antenna that receives the radiation emission is located at a predetermined height, it is required to stop the movement of the antenna until the rotating mechanism goes around the object to be measured. It may take some time to measure the radiation emissions. Further, in the conventional technique, since the measuring device measures the radiation emission at a predetermined time interval, the radiation of the measured object in a desired direction depends on the timing of the measurement by the measuring device and the orientation of the measured object at the timing. It could have been difficult to get emissions.

The present invention has been made in consideration of such circumstances, shortens the time required for measuring the radiation emission, and also reduces the radiation emission of the object to be measured at a non-measurement point (a point at a position other than the measurement point). An object of the present invention is to provide an electromagnetic wave measuring device and an electromagnetic wave measuring method capable of accurately acquiring the electromagnetic wave.

One aspect of the present invention is parallel to or parallel to a rotation mechanism that rotates the object to be measured, an antenna that receives electromagnetic waves radiated from the object to be measured, and a rotation axis that rotates the object to be measured by the rotation mechanism. The antenna moving mechanism for moving the antenna in substantially parallel directions, a measuring instrument for measuring a value related to the electromagnetic wave received by the antenna, and a state in which the object to be measured is rotated by the rotating mechanism. By controlling the antenna moving mechanism, the first state of stopping the antenna, and after the first state, {(half wavelength of the wavelength set for the measurement by the measuring instrument) × (the subject by the rotating mechanism). A second state in which the antenna is continuously moved in one direction at a speed corresponding to or less than a speed corresponding to (rotational speed at which the measuring body is rotated)}, and a third state in which the antenna is stopped after the second state. The measuring instrument measures a value related to the electromagnetic wave at a position at an interval of half a wavelength or less in the one direction and the third state of the first state and the second state. It is an electromagnetic wave measuring device.

In the electromagnetic wave measuring device of one aspect of the present invention, the measuring device measures a value related to the electromagnetic wave at a position at an interval of half a wavelength or less in a direction in which the object to be measured is rotated by the rotating mechanism.

In the electromagnetic wave measuring device of one aspect of the present invention, in the first state, the control unit stops the antenna for one rotation or substantially one rotation of rotating the object to be measured by the rotation mechanism. In the second state, the control unit continuously moves the antenna in the one direction for a time corresponding to a predetermined distance in the one direction, and the control unit continuously moves the antenna in the third state. The antenna is stopped by the rotation mechanism for a time corresponding to one rotation or substantially one rotation for rotating the object to be measured.

In the electromagnetic wave measuring device of one aspect of the present invention, the measuring instrument is used for each time corresponding to {(time required for one rotation of rotating the object to be measured by the rotating mechanism) / (predetermined integer)}. In the first state, the control unit measures the value related to the electromagnetic wave, and after the measurement of the value related to the electromagnetic wave is started, the control unit returns to the position where the measurement of the value related to the electromagnetic wave is started. The transition to the second state occurs after the value related to the electromagnetic wave is measured at the measurement position and before returning to the position where the measurement of the value related to the electromagnetic wave is started again.

One aspect of the present invention is from the measured body in a direction parallel to or substantially parallel to the rotation axis on which the measured body is rotated by the rotating mechanism in a state where the measured body is rotated by the rotating mechanism. A measuring instrument that measures the value related to the electromagnetic wave received by the antenna after the first state in which the antenna is stopped and the first state by the antenna moving mechanism that moves the antenna that receives the radiated electromagnetic wave. A second method of continuously moving the electromagnetic wave in one direction at a speed equal to or less than (half a wavelength of the wavelength set by the measurement) × (rotational speed at which the object to be measured is rotated by the rotation mechanism)}. A state, a third state in which the antenna is stopped after the second state, and the measuring instrument is used to obtain the half wavelength or less for the one direction and the third state of the first state and the second state. This is an electromagnetic wave measuring method in which a value related to the electromagnetic wave is measured at an interval position.

According to the present invention, it is possible to provide an electromagnetic wave measuring device and an electromagnetic wave measuring method capable of shortening the time required for measuring radiation emissions and accurately acquiring the radiation emissions of an object to be measured even at a non-measurement point. It is possible.

It is a figure which shows an example of the electromagnetic wave measuring apparatus of 1st Embodiment. It is a figure which shows an example of the structure of the mechanism control part of 1st Embodiment. It is a figure which shows the driving example of the rotation mechanism of 1st Embodiment. It is a figure which shows an example of the interpolation of the measurement point and the measurement direction of 1st Embodiment. It is a figure which shows an example of the interpolation of the measurement point and the moving direction of an antenna of 1st Embodiment. It is a figure which shows an example of the interpolation position in the measurement direction of the measuring instrument of 1st Embodiment. It is a figure which shows an example of the interpolation of the measurement direction of 1st Embodiment. It is a figure which shows an example of the interpolation position in the moving direction of the antenna of the measuring instrument of 1st Embodiment. It is a figure which shows an example of the interpolation of the moving direction of the antenna of the measuring instrument of 1st Embodiment. It is a flow chart which shows an example of the operation of the electromagnetic wave measuring apparatus of 1st Embodiment. It is a figure which shows an example of the electromagnetic wave measuring apparatus of the modification 1. It is a flow chart which shows an example of the operation of the electromagnetic wave measuring apparatus of the modification 1. It is a figure which shows an example of the electromagnetic wave measuring apparatus of the modification 2. It is a figure which shows an example of the electromagnetic wave measuring apparatus of the modification 3. It is a figure which shows the other driving example of the rotation mechanism. It is a flow chart which shows another example of the operation of an electromagnetic wave measuring apparatus. It is a figure which shows another example of a measurement point.

Suitable embodiments for carrying out the present invention will be described in detail with reference to the drawings.
The present invention is not limited to the contents described in the following embodiments. In addition, the components described below include those that can be easily assumed by those skilled in the art, those that are substantially the same, and those that have an equal range. Furthermore, the components described below can be combined as appropriate. In addition, various omissions, substitutions or changes of components can be made without departing from the gist of the present invention.

<First Embodiment>
FIG. 1 is a diagram showing an example of the electromagnetic wave measuring device 1 of the first embodiment. The electromagnetic wave measuring device 1 includes a mechanism control unit 10, an antenna moving mechanism 21, a rotating mechanism 22, an antenna 30, and a measuring device 40. The mechanism control unit 10 controls the drive of the antenna moving mechanism 21 and the rotating mechanism 22.

The antenna moving mechanism 21 is attached to the antenna mast M and supports the antenna 30. The antenna mast M is a support column arranged in the direction perpendicular to the surface on which the antenna mast M is installed. In the present embodiment, the surface on which the antenna mast M is installed is the floor surface F. The antenna moving mechanism 21 moves the antenna 30 along the antenna mast M based on the control of the mechanism control unit 10. The antenna 30 moves in the direction perpendicular to the floor surface F by driving the antenna moving mechanism 21. That is, the moving direction of the antenna 30 is the direction perpendicular to the floor surface F. In the present embodiment, the vertical range in which the antenna moving mechanism 21 moves the antenna 30 is substantially the same as the vertical length of the antenna mast M.
Here, in the present embodiment, it is assumed that the floor surface F is a flat surface, and a case where the direction perpendicular to the floor surface F coincides with the direction of gravity (vertical direction) is taken as an example. In addition, another positional relationship may be used as the positional relationship between the surface on which the antenna mast M is installed and the moving direction of the antenna 30.

The rotation mechanism 22 rotates an object arranged on the rotation mechanism 22 under the control of the mechanism control unit 10. The rotation mechanism 22 is, for example, a rotation table. In the present embodiment, the base B is arranged on the rotation mechanism 22. On the table B, an apparatus (hereinafter, referred to as a measured body 50) which is an object (measurement object) to be measured by the measuring instrument 40 is arranged. The rotation mechanism 22 rotates the table B and the object to be measured 50 around a rotation axis (hereinafter, referred to as a rotation axis AX) in a direction (vertical direction) orthogonal to the floor surface F based on the control by the mechanism control unit 10. Let me. The rotation mechanism 22 is preferably arranged so that the rotation axis AX of the rotation mechanism 22 and the antenna mast M are parallel (or substantially parallel). The body 50 to be measured may be arranged on the rotation mechanism 22 without going through the table B.
Here, as the object to be measured 50, any one may be used, and for example, an IT device such as a computer or a portable device may be used.

The antenna 30 receives the electromagnetic wave radiated by the object to be measured 50. In the present embodiment, the antenna 30 receives the horizontally polarized waves of the electromagnetic waves radiated by the object to be measured 50. The measuring device 40 and the antenna 30 are connected, and the measuring device 40 measures the intensity of the electromagnetic wave received by the antenna 30 as the electric field strength of the radiation emission of the object to be measured 50. Here, in the present embodiment, the electromagnetic wave emitted by the object to be measured 50 is also referred to as radiation emission.
The measuring instrument 40 is a measuring instrument capable of collectively measuring the electric field strength in a wide band. The measuring instrument 40 is, for example, a spectrum analyzer. In the following description, the measurement of radiation emission by the object to be measured 50 will be referred to as radiation emission measurement. The measuring instrument 40 of the present embodiment acquires, for example, the electric field strength of radiation emission as measurement information by radiation emission measurement at predetermined time intervals (hereinafter, referred to as measurement intervals). In the following description, the radiation emission measurement of the object to be measured 50 is performed, and the measurement information indicating the electric field strength of the acquired radiation emission is described as the measured value. In addition to the spectrum analyzer, the measuring instrument 40 may be configured to acquire the electric field strength of the electromagnetic wave by a time domain scan. For example, the measuring instrument 40 may convert the information (time domain signal) obtained on the time axis into the information on the frequency axis (frequency domain signal) by FFT (Fast Fourier Transform) or the like. Further, the measuring instrument 40 may, for example, acquire a measured value of a single frequency.

<Structure of mechanism control unit 10>
Hereinafter, the details of the configuration of the mechanism control unit 10 will be described.
FIG. 2 is a diagram showing an example of the configuration of the mechanism control unit 10 of the first embodiment.
As shown in FIG. 2, the mechanism control unit 10 includes a main control unit 110, an input device 120, an output device 130, a storage unit 140, and an internal bus 150. Each unit (main control unit 110, input device 120, output device 130, storage unit 140) included in the mechanism control unit 10 is connected by an internal bus 150 so that information can be transmitted and received. The main control unit 110 is realized by a hardware processor such as a CPU (Central Processing Unit) executing a program (software) stored in the storage unit 140. In addition, some or all of these components are realized by hardware such as LSI (Large Scale Integration), ASIC (Application Specific Integrated Circuit), FPGA (Field-Programmable Gate Array), and GPU (Graphics Processing Unit). It may be done, or it may be realized by the collaboration of software and hardware. The storage unit 140 is realized by, for example, a ROM (Read Only Memory), a flash memory, an SD (Secure Digital) card, a RAM (Random Access Memory), a register, or the like.

The input device 120 is a device for inputting various settings related to radiation emission measurement. Specifically, the input device 120 is used for inputting information necessary for the operation of radiation emission measurement and inputting an instruction for the operation of each part. For example, information indicating the moving speed and the moving direction of the antenna moving mechanism 21 and information indicating the rotating speed and the rotating direction of the rotating mechanism 22 are input to the input device 120.
The output device 130 outputs various information related to the operation of the radiation emission measurement. The output device 130 outputs the various information to the display device, for example. The display device displays various information output from the output device 130. Further, the output device 130 is connected to, for example, a collecting device that collects the various information via a network, and outputs the various information to the collecting device.

<Overview of driving>
Hereinafter, the details of driving the rotation mechanism 22 will be described with reference to the drawings.
FIG. 3 is a diagram showing a driving example of the rotation mechanism 22 of the first embodiment.
The measurement direction D shown in FIG. 3 indicates a direction in which radiation emission measurement is performed as the rotation mechanism 22 is driven. The rotation mechanism 22 constantly rotates the object to be measured 50 under the control of the mechanism control unit 10 during the radiation emission measurement. In the present embodiment, the measurement point (hereinafter referred to as the measurement point MP) at which the antenna 30 measures the electromagnetic wave radiated from the object to be measured 50 is in the direction perpendicular to the rotation axis AX from the rotation axis AX of the rotation mechanism 22. It is a position separated by a distance r. The distance r is, for example, the distance from the rotation axis AX of the rotation mechanism 22 to the antenna 30. Here, the body to be measured 50 is arranged at a position close to the rotation axis AX of the rotation mechanism 22 or at a position where the rotation axis AX passes through the body to be measured 50. Therefore, the distance r is the same (or substantially the same) as the distance from the object to be measured 50 to the antenna 30.
When the value of the angle at which the rotation mechanism 22 rotates at the time of the measurement interval is shown as θ and the wavelength of the maximum frequency (that is, the shortest wavelength) of the electromagnetic wave measured by the measuring instrument 40 is shown as λ, the relationship between θ, r and λ. Was set under the conditions represented by the equation (1).

rθ≤λ / 2 ... (1)

Here, in the present embodiment, the case where rθ = λ / 2 will be described. The maximum frequency of the electromagnetic wave measured by the measuring instrument 40 may be the maximum frequency that the antenna 30 can receive, or may be a frequency set as the maximum frequency of the electromagnetic wave to be measured measured by the measuring instrument 40. , The maximum frequency of the electromagnetic wave estimated to be emitted by the object to be measured 50 may be used. The range of electromagnetic waves measured by the measuring instrument 40 is, for example, 30 M [Hz] to 1 [GHz]. When the maximum frequency of the electromagnetic wave measured by the measuring instrument 40 is 1 [GHz] and the propagation speed of the electromagnetic wave is about 300,000 kilometers per second, λ is about 300 [mm].

The measuring instrument 40 starts the radiation emission measurement after a predetermined time has elapsed from the rotation mechanism 22 starting to rotate the object to be measured 50, for example. Further, the measuring instrument 40 supplies, for example, information indicating that the radiation emission measurement has been started to the mechanism control unit 10. The mechanism control unit 10 controls the antenna moving mechanism 21 and the rotating mechanism 22 according to the acquisition of the information. Based on the control of the mechanism control unit 10, the antenna moving mechanism 21 stops the antenna 30 at the lower side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction. In the following description, the state in which the rotating mechanism 22 is stopped at the end (lower side) of the antenna mast M until the object to be measured 50 is rotated once in the rotation direction is referred to as a first state.
Further, after the first state, the antenna moving mechanism 21 moves the antenna 30 in the direction away from the floor surface F (upward) based on the control by the mechanism control unit 10. Here, the angular velocity when the rotating mechanism 22 rotates the object to be measured 50 is indicated by ω, and the velocity when the antenna moving mechanism 21 continuously moves the antenna 30 upward (hereinafter, referred to as a moving speed) is v. In the case of showing, the relationship between ω and v was set under the condition shown by the equation (2).

v ≦ λω / 4π… (2)

Here, in the present embodiment, the case where v = λω / 4π will be described. In this case, the moving speed v is the rotation speed (this) in which the object to be measured 50 is rotated by the rotation mechanism 22 to the value of the half wavelength (λ / 2 in this example) of the wavelength set for the measurement by the measuring device 40. In one example, it corresponds to the value obtained by multiplying the value of ω / 2π).
The antenna moving mechanism 21 moves the antenna 30 from the lower side to the other end (upper side) of the antenna mast M at the moving speed v represented by the equation (2). In the following description, the state in which the antenna moving mechanism 21 continuously moves the antenna 30 upward from the lower side to the upper side by the moving speed v after the first state is described as the second state.
Further, after the second state, the antenna moving mechanism 21 stops the antenna 30 on the upper side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction under the control of the mechanism control unit 10. .. In the following description, the state in which the antenna 30 is stopped at the upper side until the rotation mechanism 22 rotates the object to be measured 50 once in the rotation direction is referred to as a third state. The mechanism control unit 10 supplies, for example, information indicating that the antenna 30 has been stopped at the upper side to the measuring instrument 40. The measuring instrument 40 ends the radiation emission measurement in response to the acquisition of the information from the mechanism control unit 10. Specifically, the measuring instrument 40 ends the radiation emission measurement after the time has elapsed from the acquisition of the information from the mechanism control unit 10 until the rotating mechanism 22 rotates the object to be measured 50 once. In the following description, all radiation emissions are collectively referred to as radiation emission measurements performed between the start of the radiation emission measurement by the measuring instrument 40 in the first state and the end of the radiation emission measurement in the third state. Described as measurement.

By controlling the antenna moving mechanism 21 and the rotating mechanism 22 as described above by the mechanism control unit 10, the locus of the measurement point MP draws a circle at the lower side, moves upward in a spiral shape, and draws a circle at the upper side. Move to. Therefore, the measuring instrument 40 performs radiation emission measurement in a round slice shape at the lower limit height and the upper limit height of the vertical movement range of the antenna 30. Further, the measuring instrument 40 spirally performs radiation emission measurement between the lower limit height and the upper limit height. The measurement point MP exists on the side surface of the cylinder existing around the object to be measured 50. The cylindrical shape has a cross section of a circle having a radius of r about the rotation axis AX of the rotation mechanism 22, and has a height (height from the lower limit height to the upper limit height) of the moving range of the antenna 30. Hereinafter, the details of the measurement point MP will be described with reference to the drawings.

FIG. 4 is a diagram showing an example of interpolation of the measurement point MP and the measurement direction D of the first embodiment. FIG. 4 is a development view of a cylindrical shape in which the measurement point MP exists. In the present embodiment, the length of the circumference of the circle of the lower side surface and the upper side surface of the cylinder is λ / 2 × 5. Therefore, in the first state, the number of measurement points MP measured by the measuring instrument 40 is five (measurement points MP1 to MP5 in the figure). As described above, the antenna moving mechanism 21 arranges the antenna 30 on the lower side in the first state and stops the antenna 30. Therefore, the measuring instrument 40 performs the radiation emission measurement of the measuring points MP1 to the measuring point MP6 during the first state. Further, as described above, the antenna moving mechanism 21 continuously moves the antenna 30 upward in the second state. Therefore, the measuring instrument 40 performs radiation emission measurement from the measuring point MP7 to the measuring point MP20 during the second state. Further, as described above, the antenna moving mechanism 21 arranges the antenna 30 on the upper side in the third state and stops the antenna 30. Therefore, the measuring instrument 40 performs the radiation emission measurement of the measuring points MP21 to the measuring point MP26 during the third state.

The measuring instrument 40 acquires (interpolates) the electromagnetic wave radiated by the object to be measured 50 at the position between the measurement points MP existing adjacent to the measurement direction D (hereinafter, referred to as the interpolation position CP). The measuring instrument 40 acquires, for example, the electromagnetic wave radiated by the object to be measured 50 at the interpolation position CP between the measuring points MP by performing zero interpolation based on the measurement result of the measuring instrument 40. Specifically, the measuring instrument 40 is based on the measurement result of the measuring instrument 40 at the measuring points MP (the measuring point MP4 and the measuring point MP5 shown) at both ends of the measuring direction D of the interpolation position CP (the illustrated interpolation position CP1). Then, the measured value at the interpolation position CP1 is acquired. Specifically, the measuring instrument 40 performs zero interpolation (adding data having a value of zero) to the interpolation position CP between the measured measurement points MP. The measuring instrument 40 applies a low-pass filter to the zero-interpolated interpolation position CP to perform interpolation. In the following description, the process of the measuring instrument 40 acquiring the measured value at the interpolation position CP will be referred to as the interpolation process. The interpolation processing performed by the measuring instrument 40 is performed on the series data in the height direction and the series data in the angular direction for each measurement frequency. In the interpolation process, the measuring instrument 40 sets the cutoff frequency of the low-pass filter to a frequency corresponding to the frequency band of the electromagnetic wave to be measured and performs filtering. In this case, the information of the electromagnetic wave having a frequency exceeding the cutoff frequency is smoothed. As described above, the distance between the measurement points MP is a distance having a length of λ / 2 or less. Therefore, the measuring instrument 40 measures the radiation emission at intervals of half a wavelength (λ / 2) or less of the maximum frequency. This satisfies the sampling theorem in the spatial direction. Therefore, the measuring instrument 40 is an interpolation position CP that has not been measured based on the measured value of the radiation emission measured at the measurement point MP, and is an interpolation position CP between the measurement points MP existing in the measurement direction D. The value of radiation emission can be calculated by interpolation.
When rθ is smaller than λ / 2 (for example, λ / 4 or the like), the plurality of measurement point MPs used to calculate the interpolation result of the interpolation position CP satisfy the conditions of the sampling theorem. It is also possible that the measurement points MP existing in the measurement direction D are not adjacent to each other.

FIG. 5 is a diagram showing an example of interpolation in the moving direction of the measurement point MP and the antenna 30 of the first embodiment. As described above, the speed at which the antenna moving mechanism 21 moves the antenna 30 is the moving speed v. In this case, the vertical interval of the measurement point MP is λ / 2 or less. The measuring instrument 40 acquires the measured value of the radiation emission of the object to be measured 50 at the interpolation position CP between the measuring points MP existing adjacent to the moving direction of the antenna 30 by interpolation. That is, based on the measurement result at the measurement point MP, the measuring instrument 40 performs interpolation processing on the interpolation position CP between the measurement points MP existing in the moving direction of the antenna 30.
In the illustrated example, the measuring instrument 40 is a measuring instrument between measurement points MP (measurement point MP14 and measurement point MP19 shown) existing adjacent to the moving direction of the antenna 30 at the interpolation position CP (interpolation position CP2 shown). Based on the measurement result of 40, the interpolation process at the interpolation position CP2 is performed. As described above, the distance between the measurement points MP is a distance having a length of λ / 2 or less. That is, the measuring instrument 40 measures the radiation emission at intervals of half a wavelength (λ / 2) or less of the maximum frequency, and satisfies the sampling theorem in the spatial direction. Therefore, the measuring instrument 40 is an interpolation position CP that has not been measured based on the measured value at the measurement point MP, and the radiation emission at the interpolation position CP between the measurement points MP existing in the moving direction of the antenna 30. The value can be calculated by interpolation. In the following description, the value of radiation emission at the interpolation position CP calculated (acquired) by the measuring instrument 40 will be referred to as an interpolation value.
When the moving speed v is smaller than λω / 4π (for example, λω / 8π, etc.), the plurality of measurement point MPs used to calculate the interpolation result of the interpolation position CP are subject to the conditions of the sampling theorem. If it is satisfied, it may be a measurement point MP that is not adjacent to the measurement points MP existing in the moving direction of the antenna 30.

Further, the measuring instrument 40 performs interpolation processing on the interpolation position CP (interpolation position CP3 shown in the figure) which is a position other than between the measurement points MP in the measurement direction D and a position other than between the measurement points MP in the movement direction of the antenna 30. May be good. In this case, the measuring instrument 40 has the interpolation positions at both ends of the measurement direction D of the interpolation position CP3 and both ends of the movement direction of the antenna 30 of the interpolation position CP3 based on the measured values at the measurement points MP existing around the interpolation position CP3. The interpolation value at the CP is acquired, and the interpolation process at the interpolation position CP3 is performed.
Specifically, the measuring instrument 40 performs interpolation processing at the interpolation position CP4 based on the measured values at the measurement points MP5 and the measurement points MP10, and acquires the interpolation values. Further, the measuring instrument 40 performs interpolation processing at the interpolation position CP5 based on the acquired interpolation value at the interpolation position CP4 and the measurement value at the measurement point MP9, and acquires the interpolation value. Further, the measuring instrument 40 performs the interpolation process at the interpolation position CP3 based on the interpolation values acquired at the interpolation position CP1 and the interpolation position CP5, and acquires the interpolation value.

The interpolation position CP may have a configuration designated by an input device (not shown) included in the measuring instrument 40. Further, although the case where the measuring instrument 40 performs the interpolation processing has been described above, the present invention is not limited to this. The measuring instrument 40 may have a configuration in which, for example, the measurement result at the measurement point MP is output and an external device performs interpolation processing based on the measurement result. Here, the external device is, for example, a PC (Personal Computer).

FIG. 6 is a diagram showing an example of the interpolation position CP in the measurement direction (horizontal direction) of the measuring instrument 40 of the first embodiment. Specifically, FIG. 6 is a diagram showing an example of the interpolation position CP in the measurement direction D, which is the interpolation position CP between the measurement points MP1 and the measurement points MP5. The measuring instrument 40 provides, for example, two interpolation position CPs between the measurement points MP and performs interpolation processing at the interpolation position CP. The vertical axis of FIG. 6 shows the measured value (electric field strength) of the radiation emission measured by the measuring instrument 40 (antenna 30), and the horizontal axis shows the circumference at the lower side of the cylinder in which the measurement point MP exists. ..
In the illustrated example, the measuring instrument 40 performs zero interpolation at the interpolation position CP11 and the interpolation position CP12 based on the values measured at the measurement point MP1 and the measurement point MP2. Further, the measuring instrument 40 performs zero interpolation at the interpolation position CP13 and the interpolation position CP14 based on the values measured at the measurement point MP2 and the measurement point MP3. Further, the measuring instrument 40 performs zero interpolation at the interpolation position CP15 and the interpolation position CP16 based on the values measured at the measurement points MP3 and the measurement point MP4. Further, the measuring instrument 40 performs zero interpolation at the interpolation position CP17 and the interpolation position CP18 based on the values measured at the measurement point MP4 and the measurement point MP5.
FIG. 7 is a diagram showing an example of interpolation in the measurement direction of the first embodiment. Specifically, FIG. 7 is an interpolation position CP provided between the measurement points MP1 to the measurement point MP5 in FIG. 6, and is an interpolation of the radiation emission of the interpolation position CP11 to the interpolation position CP18 acquired by the measuring instrument 40. It is a figure which shows the value (electric field strength).

FIG. 8 is a diagram showing an example of the interpolation position CP in the moving direction (vertical direction) of the antenna 30 of the measuring instrument 40 of the first embodiment. Specifically, FIG. 8 is a diagram showing an example of the interpolation position CP in the vertical direction, which is the interpolation position CP between the measurement point MP6, the measurement point MP11, the measurement point MP16, and the measurement point MP21. The vertical axis of FIG. 8 shows the measured value (electric field strength) of the radiation emission measured by the measuring instrument 40 (antenna 30), and the horizontal axis shows the height of the cylindrical shape in which the measuring point exists on the side surface. The measuring instrument 40 provides, for example, two interpolation position CPs between the measurement points MP existing in the moving direction of the antenna 30, and performs interpolation processing at the interpolation position CP.
In the illustrated example, the measuring instrument 40 performs interpolation processing at the interpolation position CP21 and the interpolation position CP22 based on the values measured at the measurement point MP6 and the measurement point MP11. Further, the measuring instrument 40 performs interpolation processing at the interpolation position CP23 and the interpolation position CP24 based on the values measured at the measurement points MP11 and the measurement point MP16. Further, the measuring instrument 40 performs interpolation processing at the interpolation position CP25 and the interpolation position CP26 based on the values measured at the measurement point MP16 and the measurement point MP21.
FIG. 9 is a diagram showing an example of interpolation in the moving direction of the antenna 30 of the measuring instrument 40 of the first embodiment. Specifically, FIG. 9 is an interpolation position CP provided between the measurement point MP6, the measurement point MP11, the measurement point MP16, and the measurement point MP21 in FIG. 8, and is the interpolation position CP21 to acquired by the measuring instrument 40. It is a figure which shows the interpolation value (electric field strength) of the interpolation position CP26.

FIG. 10 is a flow chart showing an example of the operation of the electromagnetic wave measuring device 1 of the first embodiment.
When this measurement is started, the mechanism control unit 10 controls the antenna moving mechanism 21 and stops the antenna 30 at the lower side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction (the first). 1 state) (step S110). When the measurement on the lower side is completed, the mechanism control unit 10 controls the antenna moving mechanism 21 and continuously moves the antenna 30 upward by the moving speed v from the lower side to the upper side (second state) (step S120). When the antenna 30 reaches the upper side, the mechanism control unit 10 controls the antenna moving mechanism 21 and stops the antenna 30 on the upper side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction (first). 3 states) (step S130).

<Comparison with conventional examples>
Hereinafter, the difference between the total radiation emission measurement by the electromagnetic wave measuring device 1 and the time required for the total radiation emission measurement by the conventional technique will be described. First, the total radiation emission measurement of the present embodiment will be described, and then the total radiation emission measurement of the conventional example will be described.
In this example, the range of the electromagnetic wave measured by the measuring instrument 40 is 30 [MHz] to 1 [GHz]. Therefore, the shortest wavelength is about 300 [mm] (1/2 of the shortest wavelength is 150 [mm]).
The speed at which the rotation mechanism 22 of the present embodiment rotates the object to be measured 50 is 10 [rpm]. In this case, the angular velocity of the rotation mechanism 22 is represented by the equation (3).

ω = (2π / 60) × 10 = π / 3 [rad / s]… (3)

That is, when the rotation mechanism 22 rotates the object to be measured 50 by 5 degrees at each measurement interval, the measuring instrument 40 radiates at 71 measurement points MP until the object 50 to be measured makes one rotation. Emission measurement is performed.
In this case, the moving speed v is expressed by the equation (4).

v = λω / 4π = 0.3 × (π / 3) × (1 / 4π) = 2.5 [cm / s]… (4)

Here, when the lower side of the antenna mast M is at a height of 1 [m] from the floor surface F and the upper side is at a height of 4 m from the floor surface F, the antenna moving mechanism 21 is the antenna 30. Is continuously moved upward by a distance of 3 m. In this case, the electromagnetic wave measuring device 1 controls each part, the time required for the first state is 6 seconds, the time required for the second state is 120 seconds, and the time required for the third state is 6 seconds. Is. Therefore, the time required for the electromagnetic wave measuring device 1 to control each part and to measure the total radiation emission is 132 seconds.

Next, the conventional technique will be described.
In contrast to the present embodiment, in the prior art, the antenna 30 is moved and stopped at predetermined distances (in this example, λ / 2 (= 150 [mm])) along the antenna mast M. The time required for traveling a distance of 15 cm is, for example, about 3 seconds including the time required for acceleration / deceleration. Further, the antenna 30 is 150 at a height of 1 to 4 [m] of the antenna mast M. It moves 20 times for each [mm]. The time required for this movement is 60 seconds. As described above, it is required for the rotation mechanism 22 to make one rotation of the object to be measured 50 at each position of the antenna mast M. The time is 6 seconds. Further, the measuring instrument performs the radiation emission measurement every time the antenna 30 is arranged at each position of the antenna mast M. Therefore, the time required for the measurement is 126 seconds. That is, the time required to measure the total radiation emission by the conventional technique is 186 seconds.
In this example, the electromagnetic wave measuring device 1 of the present embodiment can reduce the time required for total radiation emission measurement by 54 seconds as compared with the conventional technique.

<Summary of the first embodiment>
As described above, the electromagnetic wave measuring device 1 of the present embodiment includes a mechanism control unit 10, an antenna moving mechanism 21, a rotating mechanism 22, an antenna 30, and a measuring device 40. The antenna moving mechanism 21 moves the antenna 30 in the direction along the antenna mast M based on the control of the mechanism control unit 10. The rotation mechanism 22 is driven under the control of the mechanism control unit 10 to rotate the object to be measured 50. The direction along the antenna mast M is parallel (or substantially parallel) to the rotation axis AX that rotates the object to be measured 50 by the rotation mechanism 22. The antenna 30 receives the electromagnetic wave radiated from the object to be measured 50. The measuring instrument 40 measures a value related to the electromagnetic wave received by the antenna 30. The mechanism control unit 10 controls the antenna moving mechanism 21 and controls the antenna 30 to the positions of the first state, the second state, and the third state. The first state is a state in which the antenna 30 is stopped (in this example, at the lower side) while the object to be measured 50 is rotated by the rotation mechanism 22. The second state is a state in which the antenna 30 is continuously moved in one direction (upward in this example) at a moving speed v after the first state. The third state is a state in which the antenna 30 is stopped (at the upper side in this example) after the second state. The electromagnetic wave measuring device 1 of the present embodiment performs radiation emission measurement while moving the antenna moving mechanism 21 in the order of the first state, the second state, and the third state. The measuring instrument 40 measures the radiation emission in one direction at a position at an interval equal to or less than the shortest wavelength.

Since the electromagnetic wave measuring device 1 of the present embodiment does not repeatedly move and stop the antenna 30 as in the conventional example, the vibration applied to the antenna 30 is small. When the shape of the antenna 30 is large and the vibration applied to the antenna 30 is large, it is necessary to provide a waiting time until the vibration of the antenna 30 stops. In this case, the time required for the total radiation emission measurement may be increased by the amount of the standby time. Since the electromagnetic wave measuring device 1 of the present embodiment has less vibration applied to the antenna 30, it is not necessary to provide a standby time, and the time required for total radiation emission measurement can be shortened.
Further, since the electromagnetic wave measuring device 1 of the present embodiment continuously moves the antenna moving mechanism 21 (antenna 30) in the second state, the antenna 30 moves from the lower side to the upper side of the antenna mast M during the measurement by the measuring instrument 40. The time to move can be shortened.
The electromagnetic wave measuring device 1 of the present embodiment does not need to repeat the process of temporarily stopping the actual measurement of the electric field strength and then measuring it again, such as while the antenna 30 is moving, as in the conventional example. Therefore, the electromagnetic wave measuring device 1 of the present embodiment does not need to provide a waiting time after the antenna 30 is moved until the object to be measured 50 moves to the measurement start position, as in the conventional example. Further, in the electromagnetic wave measuring device 1 of the present embodiment, since the rotating mechanism 22 rotates the object to be measured 50 from the start of the measurement to the end of the measurement, the measurement timing of the measuring instrument and the rotation mechanism are as in the conventional example. There is no fluctuation in the measured value of radiation emission due to the tolerance with the angular resolution of. Therefore, the electromagnetic wave measuring device 1 of the present embodiment can perform radiation emission measurement with higher accuracy than the conventional example.

Further, in the electromagnetic wave measuring device 1 of the present embodiment, the antenna moving mechanism 21 moves the antenna 30 according to the moving speed v. As a result, the distance that the antenna 30 moves in the vertical direction while the object to be measured 50 is rotated once by the rotation mechanism 22 is λ / 2. Therefore, according to the electromagnetic wave measuring device 1 of the present embodiment, the measuring device 40 has an interpolation position CP between the measuring points MP existing in the moving direction of the antenna 30 based on the electric field strength of the radiation emission acquired at the measuring point MP. The interpolated value (electric field strength) in can be obtained.

Further, in the electromagnetic wave measuring device 1 of the present embodiment, the distance between adjacent measurement points MP is λ / 2 in the measurement interval in the direction in which the rotation mechanism 22 rotates the object to be measured 50 (in this example, the measurement direction D). Move to the following position. Therefore, according to the electromagnetic wave measuring device 1 of the present embodiment, the measuring device 40 has a certain measuring point MP and another measuring point MP in the measuring direction D based on the electric field strength of the radiation emission acquired at the measuring point MP. It is possible to acquire the interpolation value (electric field strength) at the interpolation position CP between.

Further, the mechanism control unit 10 of the electromagnetic wave measuring device 1 of the present embodiment controls the antenna moving mechanism 21 in the order of the first state, the second state, and the third state. The first state is a state in which the antenna 30 is stopped while the object to be measured 50 is rotated by the rotation mechanism 22. The second state is a state in which the antenna 30 is continuously moved in one direction (upward in this example) at a moving speed v after the first state. The third state is a state in which the antenna 30 is stopped after the second state. The electromagnetic wave measuring device 1 of the present embodiment performs radiation emission measurement while moving the antenna moving mechanism 21 in the order of the first state, the second state, and the third state. As a result, the electromagnetic wave measuring device 1 of the present embodiment can shorten the time required for the total radiation emission measurement.

<Modification 1: Switching between horizontally polarized waves and vertically polarized waves>
Hereinafter, the details of the electromagnetic wave measuring device 1a of the first modification will be described with reference to FIG.
FIG. 11 is a diagram showing an example of the electromagnetic wave measuring device 1a of the modified example 1.
In the first embodiment, the case where the antenna 30 receives the horizontally polarized wave of the electromagnetic wave radiated by the object to be measured 50 has been described. In this case, the process of steps S110 to S130 is performed by changing the installation direction of the antenna 30 by 90 degrees so that the antenna 30 receives the vertically polarized waves of the electromagnetic waves radiated by the object to be measured 50.
On the other hand, the electromagnetic wave measuring device 1a of the modified example 1 includes an antenna rotation mechanism 60 that changes the installation direction of the antenna 30. The antenna rotation mechanism 60 is, for example, a motor. The antenna rotation mechanism 60 and the antenna 30 are connected, and the antenna rotation mechanism 60 rotates the antenna 30 and changes the installation direction of the antenna 30 by 90 degrees. The antenna rotation mechanism 60 is, for example, in the installation direction of the antenna 30 after the mechanism control unit 10 has finished controlling the first state, the second state, and the third state in the installation direction in which the antenna 30 receives the horizontally polarized waves of electromagnetic waves. Is changed (90 degrees) in the direction in which the antenna 30 receives the vertically polarized wave of the electromagnetic wave. After that, the mechanism control unit 10 executes the radiation emission measurement in the direction opposite to the vertical direction. If such a series of measurements are continuously performed without stopping the movements of the antenna rotation mechanism 60 and the antenna movement mechanism 21, for example, the entire measurement (measurement of horizontal polarization and measurement of vertical polarization) is required. The time can be shortened.

Hereinafter, the operation of the electromagnetic wave measuring device 1a of the modified example 1 will be described with reference to the drawings.
FIG. 12 is a flow chart showing an example of the operation of the electromagnetic wave measuring device 1a of the modified example 1.
The mechanism control unit 10 of the electromagnetic wave measuring device 1a controls the antenna moving mechanism 21 and stops the antenna 30 at the lower side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction (first state). (Step S210). The mechanism control unit 10 controls the antenna moving mechanism 21 and continuously moves the antenna 30 upward by the moving speed v from the lower side to the upper side (second state) (step S220). The mechanism control unit 10 controls the antenna moving mechanism 21 and stops the antenna 30 on the upper side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction (third state) (step S230).

Here, the antenna rotation mechanism 60 changes the angle (installation direction) of the antenna 30 by 90 degrees after the measuring instrument 40 finishes the measurement of all radiation emissions of horizontally polarized waves in the third state (step S240). The antenna rotation mechanism 60 changes the angle of the antenna 30 in response to, for example, acquiring information indicating that the measuring instrument 40 has completed the measurement in the third state. The mechanism control unit 10 controls the antenna moving mechanism 21 and stops the antenna 30 on the upper side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction (fourth state) (step S250). The mechanism control unit 10 controls the antenna moving mechanism 21 and continuously moves the antenna 30 downward from the upper side to the lower side according to the moving speed v (fifth state) (step S260). The mechanism control unit 10 controls the antenna moving mechanism 21 and stops the antenna 30 at the lower side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction (sixth state) (step S270).
As a result, the electromagnetic wave measuring device 1b of the modified example 1 shortens the time required for the entire measurement of the horizontally polarized light and the vertically polarized light (measurement of the horizontally polarized light and the vertically polarized light) of the object to be measured 50. Can be done.

<Modification 2: Measurement of horizontally polarized waves and vertically polarized waves>
Hereinafter, the details of the electromagnetic wave measuring device 1b of the modified example 2 will be described with reference to FIG.
FIG. 13 is a diagram showing an example of the electromagnetic wave measuring device 1b of the modified example 2.
In the first embodiment, the case where the antenna 30 receives the horizontally polarized wave of the electromagnetic wave radiated by the object to be measured 50 has been described. In this case, the electromagnetic wave measuring device 1 changes the installation direction of the antenna 30 by 90 degrees so that the antenna 30 receives the vertically polarized waves of the electromagnetic waves radiated by the object to be measured 50, and performs the processes of steps S110 to S130. conduct.
On the other hand, the electromagnetic wave measuring device 1b of the second modification has two systems, an antenna 30-1 for receiving the vertically polarized wave of the electromagnetic wave radiated by the object to be measured 50 and an antenna 30-2 for receiving the horizontally polarized wave. Be prepared. Further, the electromagnetic wave measuring device 1b includes an antenna mast M1 that supports the antenna 30-1 and an antenna mast M2 that supports the antenna 30-2. Further, the electromagnetic wave measuring device 1b measures the electric field strength of the vertically polarized wave of the electromagnetic wave received by the antenna 30-1 and the electric field strength of the horizontally polarized wave of the electromagnetic wave received by the antenna 30-2. It is provided with a measuring instrument 40-2. For example, the antennas 30-1 and the antennas 30-2 are set apart at an angular interval at which the mutual coupling between the antennas is sufficiently small. Further, the electromagnetic wave measuring device 1b includes an antenna moving mechanism 21-1 for moving the antenna 30-1 and an antenna moving mechanism 21-2 for moving the antenna 30-2 based on the control of the mechanism control unit 10b. The speed at which the antenna moving mechanism 21-1 moves the antenna 30-1 and the speed at which the antenna moving mechanism 21-2 moves the antenna 30-2 are the same as the moving speed v described above. As a result, the electromagnetic wave measuring device 1b of the modified example 2 can simultaneously perform the radiation emission measurement of the horizontally polarized wave and the vertically polarized wave of the object to be measured 50, and the time required for these total radiation emission measurement is shortened. can do.

<Modification 3: Measurement of horizontally polarized waves and vertically polarized waves>
Hereinafter, the details of the electromagnetic wave measuring device 1c of the modification 3 will be described with reference to FIG.
FIG. 14 is a diagram showing an example of the electromagnetic wave measuring device 1c of the modified example 3.
In the first embodiment, the case where the antenna 30 receives the horizontally polarized wave of the electromagnetic wave radiated by the object to be measured 50 has been described. In this case, the electromagnetic wave measuring device 1 changes the installation direction of the antenna 30 by 90 degrees so that the antenna 30 receives the vertically polarized waves of the electromagnetic waves radiated by the object to be measured 50, and performs the processes of steps S110 to S130. conduct.
On the other hand, the electromagnetic wave measuring device 1c of the third modification includes an antenna 30c capable of simultaneously receiving the vertically polarized waves and the horizontally polarized waves of the electromagnetic waves radiated by the object to be measured 50. Further, the electromagnetic wave measuring device 1c includes a measuring device 40-1 for measuring the electric field strength of the vertically polarized wave of the electromagnetic wave received by the antenna 30c and a measuring device 40 for measuring the electric field strength of the horizontally polarized wave of the electromagnetic wave received by the antenna 30c. -2 is provided. As a result, the electromagnetic wave measuring device 1c of the modified example 3 can simultaneously perform the radiation emission measurement of the horizontally polarized wave and the vertically polarized wave of the object to be measured 50, and the time required for these radiation emission measurement is further shortened. be able to.

<When moving the antenna 30 from the upper side to the lower side>
In the examples of FIGS. 3 to 10, the case where the antenna moving mechanism 21 moves the antenna 30 from the lower side to the upper side of the antenna mast M has been described, but the present invention is not limited to this. The antenna moving mechanism 21 may move the antenna 30 downward from the upper side to the lower side of the antenna mast M.
FIG. 15 is a diagram showing another driving example of the rotation mechanism 22.
As shown in FIG. 15, the measurement direction D is the direction from the upper side to the lower side, which is the opposite direction to the example shown in FIG.

FIG. 16 is a flow chart showing another example of the operation of the electromagnetic wave measuring device 1.
When this measurement starts, the mechanism control unit 10 controls the antenna moving mechanism 21 and stops the antenna 30 on the upper side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction (first state). ) (Step S310). When the measurement on the upper side is completed, the mechanism control unit 10 controls the antenna moving mechanism 21 and continuously moves the antenna 30 downward by the moving speed v from the upper side to the lower side (second state) (step S320). When the antenna 30 reaches the lower side, the mechanism control unit 10 controls the antenna moving mechanism 21 and stops the antenna 30 at the lower side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction (first). 3 states) (step S330).

In the above description, in the first state and the third state, the antenna moving mechanism 21 has described the case where the antenna 30 is stopped until the rotating mechanism 22 rotates the object to be measured 50 once, but the present invention is limited to this. I can't. The antenna moving mechanism 21 may be configured to stop the antenna 30 until the rotating mechanism 22 makes substantially one rotation of the object to be measured 50, for example. The period until approximately one rotation is, for example, the measurement measured first after the radiation emission measurement is performed at the measurement point MP one before the measurement point returns to the position of the measurement point MP that was first measured. It may be before returning to the position of the measurement point MP next to the point MP and performing the radiation emission measurement. That is, on the upper side and the lower side, for example, the radiation emission measurement may be performed at the measurement point MP for about one rotation, but if there is a sufficient measurement point MP in the stage before one rotation, it is more than one rotation. The antenna 30 may be moved upward or downward before the antenna 30 is moved upward or downward, and conversely, the antenna 30 may be moved upward or downward when the antenna 30 is rotated more than one rotation.

<When transitioning to the second state before the object to be measured 50 makes one rotation>
Further, in the above description, the case where the antenna moving mechanism 21 is stopped until the object to be measured 50 is rotated once by the rotating mechanism 22 in the first state has been described, but the present invention is not limited to this. In the first state, the antenna moving mechanism 21 may move the antenna 30 toward another end when the object to be measured 50 is rotated substantially once by the rotating mechanism 22.
FIG. 17 is a diagram showing another example of the measurement point MP.
In this example, when the measurement is started, the rotation mechanism 22 rotates the object to be measured 50 approximately once, that is, the measurement point MP of the measuring instrument 40 is located at the position of the first measurement point MP (measurement point MP1 shown in the figure). Before returning again, the antenna moving mechanism 21 moves the antenna 30 upward toward the other end (upper side in this example). In the example shown in FIG. 17, the antenna moving mechanism 21 has a measurement point MP (measurement point MP5 shown) that is one measurement point before the measurement point MP returns to the position of the first measurement point MP (measurement point MP1 shown in the figure). The antenna 30 is stopped at a predetermined position after the measuring instrument 40 has performed the radiation emission measurement and before returning to the position of the first measurement point MP (first state). Further, the antenna moving mechanism 21 is after the measuring instrument 40 has performed radiation emission measurement at the measuring point MP5 immediately before the measuring point MP1 and before returning to the position of the measuring point MP1 again. The antenna 30 is started to be moved upward (at the predetermined measurement point described above) and is continuously moved as it is (second state). In the mechanism control unit 10, for example, information indicating the positional relationship between the object to be measured 50, the rotation mechanism 22 and the antenna 30, ω and v is input in advance, and the position (or timing, etc.) of the first measurement point MP is also input. Good) has a function to detect.

When the antenna 30 reaches the upper side, the antenna moving mechanism 21 stops the antenna 30 on the upper side until the rotating mechanism 22 rotates the object to be measured 50 once in the rotation direction on the upper side (third state). In the example of FIG. 17, the measurement is stopped on the upper side before the measurement point MP returns to the first measurement point MP25 on the upper side again, whereby the same measurement point MP (for example, the measurement point MP25) on the upper side is stopped. ) Is prevented from being performed twice, and the measurement time is shortened.
As a result, the electromagnetic wave measuring device 1 can further shorten the time required for the total radiation emission measurement.
Although the case where the antenna 30 is moved from the lower side to the upper side is shown here, conversely, the antenna 30 may be moved from the upper side to the lower side.

Although the embodiments of the present invention have been described in detail with reference to the drawings, the specific configuration is not limited to this embodiment, and design changes and the like within a range not deviating from the gist of the present invention are also included.

1, 1a, 1b ... Electromagnetic wave measuring device, 10 ... Mechanism control unit, 20 ... Drive mechanism, 21, 21-1, 21-2 ... Antenna movement mechanism, 22 ... Rotation mechanism, 30, 30-1, 30-2 ... Antenna, 40, 40-1, 40-2 ... Measuring instrument, 50 ... Object to be measured, 60 ... Antenna rotation mechanism, M, M1, M2 ... Antenna mast, 110 ... Main control unit, 120 ... Input device, 130 ... Output Device, 140 ... Storage unit, CP, CP1, CP2, CP11, CP12, CP13, CP14, CP15, CP16, CP17, CP18, CP21, CP22, CP23, CP24, CP25, CP26 ... Interpolation position, MP, MP1, MP2, MP3, MP4, MP5, MP6, MP9, MP10, MP11, MP14, MP16, MP19, MP21, MP26 ... Measurement points

Claims (5)

A rotation mechanism that rotates the object to be measured,
An antenna that receives electromagnetic waves radiated from the object to be measured, and
An antenna moving mechanism that moves the antenna in a direction parallel to or substantially parallel to the rotation axis that rotates the object to be measured by the rotating mechanism.
A measuring instrument that measures the value related to the electromagnetic wave received by the antenna, and
In the state where the object to be measured is rotated by the rotation mechanism, by controlling the antenna moving mechanism, the antenna is stopped in the first state, and after the first state {(by the measuring instrument). A second state in which the antenna is continuously moved in one direction at a speed equal to or less than (half the wavelength of the wavelength set for the measurement) × (rotational speed at which the object to be measured is rotated by the rotation mechanism)}. A control unit for setting the antenna to a third state after the second state is provided.
The measuring instrument measures a value related to the electromagnetic wave at a position at an interval of half a wavelength or less in the one direction and the third state of the first state and the second state.
Electromagnetic wave measuring device. The measuring instrument measures a value related to the electromagnetic wave at a position at an interval of half a wavelength or less in a direction in which the object to be measured is rotated by the rotation mechanism.
The electromagnetic wave measuring device according to claim 1. In the first state, the control unit stops the antenna for a time corresponding to one rotation or substantially one rotation in which the object to be measured is rotated by the rotation mechanism.
In the second state, the control unit continuously moves the antenna in the one direction for a time corresponding to a predetermined distance in the one direction.
In the third state, the control unit stops the antenna for a time corresponding to one rotation or substantially one rotation in which the object to be measured is rotated by the rotation mechanism.
The electromagnetic wave measuring device according to any one of claims 1 and 2. The measuring instrument measures a value related to the electromagnetic wave every time corresponding to {(time required for one rotation of rotating the object to be measured by the rotation mechanism) / (predetermined integer)}.
In the first state, the control unit relates to the electromagnetic wave at a measurement position one before returning to the position where the measurement of the value related to the electromagnetic wave is started after the measurement of the value related to the electromagnetic wave is started. The transition to the second state occurs after the value has been measured and before returning to the position where the measurement of the value relating to the electromagnetic wave was started.
The electromagnetic wave measuring device according to any one of claims 1 to 3. In a state where the object to be measured is rotated by the rotation mechanism, the electromagnetic wave radiated from the object to be measured is received in a direction parallel to or substantially parallel to the rotation axis for rotating the object to be measured by the rotation mechanism. A first state in which the antenna is stopped by an antenna moving mechanism for moving the antenna, and after the first state {(wavelength set for measurement by a measuring instrument for measuring a value related to the electromagnetic wave received by the antenna). (Half wavelength) × (rotational speed at which the object to be measured is rotated by the rotation mechanism)}, a second state in which the antenna is continuously moved in one direction at a speed equal to or less than the second state. After that, the third state of stopping the antenna is set.
With the measuring instrument, the value related to the electromagnetic wave is measured at a position at an interval of half a wavelength or less in the one direction and the third state of the first state and the second state.
Electromagnetic wave measurement method.

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