JP6866717B2 - Structure analysis device, structure analysis system and structure analysis method - Google Patents

Description

The present invention relates to a structure analysis apparatus, a structure analysis system, and a structure analysis method.

Conventionally, as a method of investigating the state of deterioration and damage of the strength of civil engineering structures and building structures due to aging, earthquakes, etc., in addition to the visual method, as shown in Patent Document 1 below, the structure is vibrated. However, there is known a method in which a sensor detects a response to vibration as an electric signal and calculates a natural frequency from the detected electric signal. In this method, it is necessary to calculate a plurality of natural frequencies at intervals and analyze the structure based on the changes in the plurality of natural frequencies.

Japanese Unexamined Patent Publication No. 2008-39534

However, in the conventional method, it is necessary to generate vibration each time analysis is required, which occurs in the structure with continuous changes in the characteristics of the structure over time and with the passage of time between the installed sensors. It was difficult to capture the phenomenon.
The present invention has been made in view of the above-mentioned problems, and based on the vibration data detected from the structure, the characteristic change with the passage of time of the structure is continuously captured, and in particular, between the installed sensors. The purpose is to capture the phenomena that occur in structures over time.

The present invention has been made to solve at least a part of the above-mentioned problems, and can be realized as the following application example or form.

[Application Example 1] The structure analysis apparatus according to this application example has an acquisition unit for acquiring the outputs of the first inertial sensor and the second inertial sensor installed on the ground or a structure, and the output is the first. It is divided into a frequency region 1 and a second frequency region, and in the first frequency region, the first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor, and the output ratio is calculated. In the second frequency region, the second output ratio of the output is calculated by the first inertial sensor and the second inertial sensor, and the change with time between the first output ratio and the second output ratio is used. It is characterized by including an analysis unit for analyzing the ground or the structure.

According to this application example, the output of vibration data detected by the first inertial sensor and the second inertial sensor installed on the ground or a structure is divided into a first frequency region and a second frequency region. Then, the first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor in the first frequency region, and the first inertial sensor and the second inertial sensor in the second frequency region calculate the first output ratio. By calculating the second output ratio of the output and analyzing the change over time between the first output ratio and the second output ratio, it occurs in the ground or structure between the first inertial sensor and the second inertial sensor. It is possible to capture the phenomenon.

[Application Example 2] In the structure analysis apparatus described in the above application example, the first frequency region is defined as
It is preferably a region including the frequency of the natural vibration of the ground or the structure.

According to this application example, since the first frequency region is the region including the frequency of the natural vibration of the ground or the structure, the influence of the vibration caused by the ground or the structure can be analyzed, and the ground or the structure can be analyzed. It is possible to accurately analyze the phenomenon that occurred in.

[Application Example 3] In the structure analysis apparatus described in the above application example, the first frequency region is defined as
It is preferably in the frequency range of 0.1 Hz or more and 10 Hz or less.

According to this application example, since the first frequency region is the frequency region of 0.1 Hz or more and 10 Hz or less, the frequency of the natural vibration of the ground or the structure is included, and the influence of the vibration caused by the ground or the structure is affected. It can be analyzed, and phenomena that occur in the ground or structures can be analyzed more accurately.

[Application Example 4] In the structure analysis apparatus described in the above application example, it is preferable that the first frequency region and the second frequency region are different frequency regions.

According to this application example, since the first frequency region and the second frequency region are different frequency regions, the influence of vibration caused by the ground or structure and the vibration caused by something other than the ground or structure It is possible to analyze the influence of the above separately, and it is possible to analyze the phenomenon occurring in the ground or the structure more accurately.

[Application Example 5] In the structure analysis apparatus described in the above application example, it is preferable to perform a fast Fourier transform process of the output and divide the output into the first frequency region and the second frequency region.

According to this application example, by performing the Fast Fourier Transform process on the output, the output can be expressed as the magnitude of energy corresponding to the Fast Fourier Transform frequency, which is caused by the ground or the structure in the first frequency region. The vibration energy and the vibration energy caused by something other than the ground or structure in the second frequency domain can be analyzed separately, and the phenomenon generated in the ground or structure can be analyzed more accurately. it can.

[Application Example 6] The structure analysis system according to this application example includes a first inertial sensor and a second inertial sensor installed on the ground or a structure, the first inertial sensor, and the second inertial sensor.
The structure analysis device includes a structure analysis device that analyzes the output of the inertial sensor.
An acquisition unit that acquires the outputs of the first inertial sensor and the second inertial sensor, and the output is divided into a first frequency region and a second frequency region, and in the first frequency region,
The first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor, and the first output ratio is calculated.
In the second frequency region, the second output ratio of the output is calculated by the first inertial sensor and the second inertial sensor, and the change over time between the first output ratio and the second output ratio is used. It is characterized by including an analysis unit for analyzing the ground or the structure.

According to this application example, a first inertial sensor and a second inertial sensor installed on the ground or structure.
The structure analysis device includes a structure analysis device that analyzes the outputs of the first inertial sensor and the second inertial sensor, and the structure analysis device detects the first inertial sensor and the second inertial sensor. The output of the vibration data is divided into a first frequency region and a second frequency region, and the first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor in the first frequency region. , The second output ratio of the output is calculated by the first inertial sensor and the second inertial sensor in the second frequency region, and the change with time between the first output ratio and the second output ratio is analyzed. It is possible to capture the phenomenon that occurs in the ground or structure between the inertial sensor and the second inertial sensor.

[Application Example 7] In the structure analysis method according to this application example, the output of the first inertial sensor and the second inertial sensor installed on the ground or the structure is acquired, and the output is first. In the first frequency region, the first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor. And, in the second frequency region, the second output ratio of the output is calculated by the first inertial sensor and the second inertial sensor, and the first output ratio and the second output ratio are It is characterized by including analyzing the ground or the structure from the change with time.

According to this application example, the outputs of the first inertial sensor and the second inertial sensor installed on the ground or the structure are acquired, and the acquired outputs are used as the first frequency region and the second frequency region. The first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor in the first frequency region, and the first inertial sensor and the second inertial sensor in the second frequency region are calculated. By calculating the second output ratio of the output and analyzing the change over time between the first output ratio and the second output ratio, the ground or structure between the first inertial sensor and the second inertial sensor It is possible to capture the phenomenon that occurred in.

The figure explaining the structure of the structure analysis system which concerns on 1st Embodiment. Histogram diagram showing how often the mean amplitude appears. Histogram diagram showing the index amplitude for each day of the week. The figure of the histogram which shows the change of the index amplitude over a long period of time. The figure of the histogram which shows the change of the mode value of an index frequency. The figure of the histogram which shows the change of the frequency value of the index frequency. The figure which shows the relationship between the output ratio and a structure phenomenon. The figure which shows the output result of two inertia sensors before the reinforcement work. The figure which shows the FFT processing result of the 1st inertial sensor output before the reinforcement work. The figure which shows the FFT processing result of the 2nd inertial sensor output before the reinforcement work. The figure which shows the FFT processing result of the 1st inertial sensor output after the reinforcement work. The figure which shows the FFT processing result of the 2nd inertial sensor output after the reinforcement work. The figure which shows the relationship between the output ratio and the ground phenomenon. A flowchart showing the flow of analysis processing of physical characteristic fluctuations. A flowchart showing the flow of the phenomenon analysis process of the structure. The figure explaining the structure of the structure analysis system which concerns on 2nd Embodiment. The figure which shows an example of the screen displayed on the display part. The figure which shows an example of the screen displayed on the display part.

Hereinafter, the structure analysis apparatus, structure analysis system, and structure analysis method of the present invention will be described.
A suitable configuration example thereof will be described with reference to the accompanying drawings.

(First Embodiment)
[Structure analysis system]
First, the structure analysis system 1 according to the first embodiment of the present invention will be described with reference to FIG.
FIG. 1 is a diagram for explaining the configuration of the structure analysis system 1 according to the first embodiment. This structure analysis system 1 has a function of analyzing physical properties and phenomena of the ground or structure based on vibration information related to vibration of the ground or structure. In this embodiment, an example of analyzing the physical properties and phenomena of structures such as bridges and buildings will be described.

As shown in FIG. 1, the structure analysis system 1 includes two sensor units 10 and 12, a structure analysis device 70, and an information processing device 80.
In the two sensor units 10 and 12, one sensor unit 10 is composed of a first inertial sensor S1 and a first temperature sensor T1, and the other sensor unit 12 is a second inertial sensor S2. It is composed of a second temperature sensor T2. The first inertial sensor S1 and the second inertial sensor S2 include an acceleration sensor and an IMU (Internal Measureme).
The first temperature sensor T1 and the second temperature sensor T2 are a thermal diode, a thermistor, a thermoelectric pair, and the like. The two sensor units 10 and 12 are installed in a structure such as a bridge or a building, detect the vibration and temperature of the structure, and output vibration data and temperature data corresponding to the detected vibration and temperature.
It should be noted that the temperature sensor may not be provided and the temperature data may be provided from the outside.
As a mode given from the outside, it can be assumed that the mode is acquired from an external organization such as the Japan Meteorological Agency or mass media such as television and radio via a network such as the Internet.

The structure analysis device 70 is mounted on a box-shaped housing, for example, and has two sensor units 10, 12
At the same time, it is installed in a structure such as a bridge or a building to detect the vibration information of the structure, and the physical properties and phenomena of the structure are analyzed based on the fluctuation of the detected vibration information with the passage of time. Further, the structure analysis device 70 has a function of transmitting information regarding the analysis result to the information processing device 80 via communication.
In the present embodiment, the information processing device 80 is assumed to be a server device, a personal computer, a multifunctional mobile terminal such as a tablet, a high-performance mobile phone such as a smartphone, or the like.

The structure analysis device 70 includes an acquisition unit 16, a power supply unit 18, a control unit 20, a storage unit 60, and a communication unit 65.
The acquisition unit 16 acquires vibration data and temperature data corresponding to the vibration and temperature detected by the two sensor units 10 and 12, and outputs the vibration data and the temperature data to the control unit 20.
The control unit 20 acquires the vibration data and the temperature data output by the acquisition unit 16, and the storage unit 6
Store in 0.

The power supply unit 18 assumes, for example, a solar panel that receives sunlight to generate electricity and a rechargeable secondary battery, and the structure analysis device 70 is driven by the electric power obtained by the power supply unit 18.
The storage unit 60 assumes a non-volatile storage medium such as a flash memory or a hard disk, and is sent from a program (for example, a physical property analysis program) for the control unit 20 to control the operation of each function or from the control unit 20. Stores various data.
The communication unit 65 transmits various information output from the control unit 20 to the information processing device 80.

In the present embodiment, the communication unit 65 is, for example, Bluetooth® (BTLE).
: Including Bluetooth Low Energy), Wi-Fi (registered trademark) (Wi-Fi: Wireless Fid)
elity), Zigbee®, NFC (Near Field Communication), ANT +
It is assumed that communication is compatible with wireless communication standards such as (registered trademark).
The control unit 20 includes a representative value calculation unit 30, a distribution tendency analysis unit 40, an index value calculation unit 50, a temperature correction unit 52, an index value fluctuation analysis unit 54, and an analysis unit 56, and performs each function of the structure analysis device 70. Control.
Each functional unit of the control unit 20 shows a functional configuration realized by the cooperation of hardware such as a CPU and RAM, which is not shown, and software stored in the storage unit 60. The specific implementation form is not particularly limited. Therefore, it is not always necessary to implement hardware corresponding to each functional unit individually, and it is possible to configure a configuration in which the functions of a plurality of functional units are realized by executing a program by one processor.

Further, a part of the functions realized by the software may be realized by the hardware, or a part of the functions realized by the hardware may be realized by the software.
The representative value calculation unit 30 randomly divides the vibration data stored in the storage unit 60 into sections at 10-second intervals (first period), and calculates a representative value (analysis value) for each section. Representative value calculation unit 30
Is a statistical processing unit 32 that calculates the average value, the average difference value, the difference value between the maximum value and the minimum value, etc. as the representative value, and the frequency and quality coefficient (hereinafter referred to as FFT) as the representative value by the fast Fourier transform (hereinafter referred to as FFT) processing. A Fourier transform unit 34 for calculating (Q value) is provided. The representative value calculation unit 30 stores each representative value calculated for each section in the storage unit 60.
Further, the representative value calculation unit 30 may acquire the temperature data stored in the storage unit 60 and calculate the average value (temperature analysis value) of the temperature data acquired in a predetermined time range. Representative value calculation unit 30
May store the average value of the calculated temperature data in the storage unit 60.

The distribution tendency analysis unit 40 analyzes the distribution tendency with respect to each representative value for each section stored in the storage unit 60 over a second period (for example, one day to several years) longer than the first period. The distribution tendency analysis unit 40 includes a histogram generation unit 45. The histogram generation unit 45 generates a histogram showing the number of appearances (appearance frequency) of each representative value in the second period. The distribution tendency analysis unit 40 analyzes the distribution tendency from the histogram generated by the histogram generation unit 45.
For example, the distribution tendency analysis unit 40 can analyze the output frequency of acceleration from the histogram of the average value of the vibration data. Further, the distribution tendency analysis unit 40 can analyze the difference frequency of acceleration from the histogram of the average difference value of the vibration data. Further, the distribution tendency analysis unit 40 can analyze the amplitude frequency from the histogram of the difference value between the maximum value and the minimum value of the vibration data. In addition, distribution tendency analysis unit 4
When 0, the peak frequency value can be analyzed from the histogram of the quality coefficient of the vibration data. Further, the distribution tendency analysis unit 40 can analyze the frequency frequency from the frequency histogram of the vibration data.

Further, the distribution tendency analysis unit 40 can analyze the output frequency of the temperature from the histogram of the average value of the temperature data.
The index value calculation unit 50 is based on the histogram generated by the distribution tendency analysis unit 40.
Calculate the index value corresponding to the characteristics of the histogram.
Here, as an example of calculating the index value, it will be described with reference to FIG. FIG. 2 is a histogram in which the average value (peak value) of the amplitude is on the horizontal axis and the frequency of appearance is on the vertical axis. The index value calculation unit 50 may use the center of gravity value shown by the histogram, the weighted center of gravity value (80% amplitude position), the mode value, or the like as an index. FIG. 2 shows that the index value (index amplitude) is 5 mG.

Further, the least squares method may be applied to the histogram, and the inclination angle of the histogram may be calculated as an index value. Further, the rate of change or the index value of the event log may be calculated from the histogram of the average difference value.
Further, the index value (index frequency) of the maximum peak frequency may be calculated from the histogram of the quality coefficient by performing the FFT process in the Fourier transform unit 34. Further, the index value (index frequency) of the maximum peak position may be calculated from the frequency histogram.
The temperature correction unit 52 can perform temperature correction on the index value calculated by the index value calculation unit 50 and eliminate the influence of temperature fluctuations.

For example, the distribution tendency analysis unit 40 analyzes the temperature output frequency from the fluctuation of the average value of the temperature data calculated by the representative value calculation unit 30, and the index value calculation unit 50 is based on the most frequent value of the temperature output frequency.
The index value calculated by may be corrected.
In this case, the inclination of the structure can be temperature-corrected by adopting the index value of the inclination angle obtained from the histogram of the average value. As a result, when analyzing the inclination of the structure, the influence of the temperature fluctuation on the inertial sensor can be excluded, and the change in the physical properties of the structure can be analyzed for many years.

The index value fluctuation analysis unit 54 analyzes changes in the physical properties of the structure based on the index value or the temperature-corrected index value corrected by the temperature correction unit 52 over time. Information indicating the analysis result is transmitted to the information processing apparatus 80.
The information processing device 80 receives the information regarding the change in physical properties transmitted from the structure analysis device 70, processes the information as necessary, and displays it to the user. The information processing device 80 receives information from each of a plurality of structure analysis devices 70 installed in one structure or a plurality of structures, and processes and displays the received plurality of information in a multifaceted manner. Is also good.

Here, with reference to FIGS. 3 to 6, an analysis example of changes in the physical properties of the structure is shown.

In FIG. 3, in a structure such as a bridge, the index amplitude was calculated by integrating the interval and frequency from the histogram of the difference value between the maximum value and the minimum value of the vibration data in the daily analysis for each day of the week. This is an example of generating a histogram. In this case, the fluctuation of the index amplitude is shown for each day of the week by performing the moving average in multiples of 7. In FIG. 3, it can be seen that the day of the week dependence, that is, the fluctuation of the traffic volume depending on the day of the week appears.
Further, FIG. 4 is a histogram showing the time course of the index amplitude over a period of about one year. Fluctuations in the index amplitude at a predetermined time indicate a decrease in traffic volume due to long holidays such as so-called Silver Week, Golden Week, and the year-end and New Year holidays.
As is well known, there is a characteristic that the fluctuation of the index amplitude becomes constant by taking a moving average of the number of days to be analyzed, that is, on a weekly basis. Therefore, excluding the influence of day of the week dependence and long holidays, if the physical properties of the bridge do not change, the fluctuation of the index amplitude is small and stable.
In addition, it can be seen that the Young's modulus of the bridge decreased as the amplitude decreased with the passage of time. In addition, if the amplitude increases due to construction work, etc., it can be seen that the Young's modulus has increased due to reinforcement.

Further, as a method of excluding the influence of the fluctuation of the traffic volume in the change of the index amplitude with time, for example, the vibration data obtained by installing one of the sensor units 10 at a robust part of the bridge where the vibration due to the traffic does not occur. , A method of taking a difference from the vibration data output by the other sensor unit 12 can be adopted.

Further, FIGS. 5 and 6 show FF in the Fourier transform unit 34 for a structure such as a bridge.
6 is a histogram showing the transition of the moving average of the mode value of the index frequency (FIG. 5) and the frequency value of the index frequency (FIG. 6) calculated by performing T processing for 7 days.
From FIG. 5, the mode value of the index frequency is stable around 5.1 Hz, but it is 1 in 2016.
Fluctuations with non-linearity in the moon can be confirmed. This fluctuation may be affected by bad weather, for example. FIG. 6 shows that the vibration is attenuated by heavy snow and the quality coefficient is lowered. As described above, since the index frequency and the index frequency obtained by the FFT process correspond to the fluctuation caused by the weather and the construction work, the fluctuation regarding the physical properties of the structure can be estimated based on the index frequency and the index frequency.
With the above-described configuration, changes in physical properties of the structure over time can be continuously captured based on the vibration data detected from the structure.

The analysis unit 56 performs FFT processing on the vibration data detected by the first inertial sensor S1 and the second inertial sensor S2 installed in the structure such as a bridge or a building in the representative value calculation unit 30. The outputs of the sensor S1 and the second inertial sensor S2 are output to the first frequency domain and the second inertial sensor S2.
Divide into the frequency domain of. By processing the vibration data by FFT, the vibration data can be expressed as the magnitude of the vibration energy according to the FFT frequency, and the phenomenon generated in the structure can be easily analyzed. Further, the first frequency region and the second frequency region are different frequency regions, the first frequency region is a frequency region of 10 Hz or less, and the frequency of the natural vibration of the structure (for example, about 3 Hz to 5 Hz) is set. Includes. Therefore, the state of vibration energy caused by the structure can be analyzed. In a skyscraper or the like, the frequency of natural vibration is about 0.1 Hz to 0.5 Hz, so the lower limit of the first frequency region is set to 0.
It can be set to about 1 Hz. Further, since the second frequency region is a frequency region higher than 10 Hz, it is possible to analyze the state of vibration energy caused by an object other than a structure, for example, an automobile or the like.

Then, in a first frequency range, the maximum value A1L _b of PSD (Power Spectral Density) of the first inertia sensor S1 and the second inertia sensor S2, the A2L _b elect respectively,
First output ratio _{RL b (= A2l b / A1l} b) is calculated. Further, in the second frequency region, the maximum PSD values A1h _b , A of the first inertial sensor S1 and the second inertial sensor S2.
2h _b is selected respectively, and the second output ratio RH _b (= A2h _b / A1h _b ) is calculated. The calculated first output ratio RL _b and second output ratio RH _b are stored in the storage unit 60.

Next, after a lapse of a predetermined period of time, the first inertial sensor S1 and the second inertial sensor S1 and the second inertial sensor are FFT-processed from the vibration data detected by the first inertial sensor S1 and the second inertial sensor S2 installed in the structure. Based on the output of S2, the first output ratio RL _a and the second output ratio RH _a are calculated and compared with _{the first output ratio RL b} and the second output ratio RH _b stored in the storage unit 60.

As a result, by analyzing whether the first output ratio RL _a and the second output ratio RH _a calculated this time are increased or decreased with respect to the first output ratio RL _b and the second output ratio RH _{b calculated last time.} Due to the difference in the first output ratio RL, the state of vibration energy caused by the structure that can be analyzed in the first frequency region due to the change over time is caused by, for example, an automobile other than the structure that can be analyzed in the second frequency region. The state of vibration energy can be analyzed by the difference in the second output ratio RH. Therefore, it is possible to analyze the phenomenon that occurs in the structure due to the change with time between the position A1 where the first inertial sensor S1 is installed and the position A2 where the second inertial sensor S2 is installed.

FIG. 7 is a diagram showing the relationship between fluctuations in the first output ratio RL and the second output ratio RH and the structure phenomenon. For example, when RL increases and RH decreases, A1-A2 Structural deterioration between
That is, cracks and rust on the steel frame occur between A1 and A2. In addition, RL decreases,
When the RH is increased, the structure between A1 and A2 is strengthened, that is, reinforcement work is performed between A1 and A2. Further, when RL is decreased and RH is decreased, it can be analyzed that structural separation between A1-A2, that is, rupture of the structure between A1-A2 has occurred.

Here, with reference to FIGS. 8 to 12, an analysis example of a phenomenon occurring in the structure due to aging is shown.
In this analysis example, an example in which reinforcement work is performed between the position A1 of the first inertial sensor S1 installed on the bridge and the position A2 of the second inertial sensor S2 will be described.
FIG. 8 shows vibration data detected by the first inertial sensor S1 and the second inertial sensor S2 before the reinforcement work, and the measurement time is on the horizontal axis and the acceleration output in the gravity direction is on the vertical axis. 9 and 10 show the FFT processing result of the output of the first inertial sensor S1 and the second inertial sensor S2 before the reinforcement work, that is, the result of FFT processing of the vibration data shown in FIG. And FIG. 12 is the FFT processing result of the output of the first inertial sensor S1 and the second inertial sensor S2 after the reinforcement work. In FIGS. 9 to 12, the FFT frequency is on the horizontal axis and PSD (Power Spectral Density) is on the vertical axis.

In FIGS. 9 and 10, the first frequency region (≦ 10) in which the FFT frequency is 10 Hz or less.
The maximum value of the PSD in _{Hz) (A1l b, A2l b} ) is in the first inertial sensor S1 A
A 1l _b = 0.072, a A2L _b = 0.162 in the second inertial sensor S2.
Further, PS in the second frequency region (10 Hz <) in which the FFT frequency is higher than 10 Hz.
The maximum value of D (A1h _b , A2h _{b ) is A1h b} = 0.077 in the first inertial sensor S1.
In the second inertial sensor S2, A2h _b = 0.059. Accordingly, the first output ratio _{RL b (= A2l b / A1l} b) before reinforcement work is 2.25, RH second output ratio _b (= A
2h _b / A1h _b ) is 0.67.

11 and 12, the first maximum value of the PSD in the frequency domain _{(≦ 10Hz) (A1l a,} A2l a) is a A1L _a = 0.177 in the first inertial sensor S1,
In the second inertia sensor S2 as a A2l _a = 0.378. Also, the second frequency region (1)
The maximum value of the PSD in _{0Hz <) (A1h a, A2h} a) is in the first inertial sensors S1 is A1h _a = 0.144, a A2h _a = 0.125 in the second inertial sensor S2. Therefore, the first output ratio RL _a (= A2 l _a / A1 l _a ) after the reinforcement work is 2.13.
The second output ratio _{RH a (= A2h a / A1h} a) is 0.87.

First output ratio RL (RL _a , RL _b ) and second output ratio RH (RH _a , RH _{b) before and after reinforcement work}
), The first output ratio RL decreased from 2.25 before the reinforcement work to 2.13 after the reinforcement work, and the second output ratio RH was 0.87 after the reinforcement work from 0.67 before the reinforcement work. Is increasing. Therefore, as shown in FIG. 7, the first output ratio RL decreases and the second output ratio RH increases, and the position A1 where the first inertial sensor S1 is installed and the position A2 where the second inertial sensor S2 is installed.
It is possible to analyze the phenomenon that occurs in the structure where the structure is strengthened, that is, the reinforcement work is performed.

In this embodiment, an example in which two sensor units 10 and 12 having a first inertial sensor S1 and a second inertial sensor S2 are installed on a structure such as a bridge or a building has been described.
Two sensor units 10 and 12 having a first inertial sensor S1 and a second inertial sensor S2 may be installed on the ground for analysis. See FIG. 13 for the analysis results of the phenomenon that occurred in the ground due to the change over time between the ground position A1 where the first inertial sensor S1 was installed and the ground position A2 where the second inertial sensor S2 was installed. I will explain.

FIG. 13 is a diagram showing the relationship between fluctuations in the first output ratio RL and the second output ratio RH and the ground phenomenon. For example, when RL increases and RH decreases, between A1 and A2. The ground structure is weakened, that is, the soil moisture increases and the ground surface is covered with snow between A1 and A2. Also,
When RL decreases and RH increases, the ground strengthening between A1-A2, that is, A1-A
Pavement and compaction are applied between the two. If RL is decreasing and RH is decreasing,
It can be analyzed that the ground separation between A1 and A2, that is, landslides and landslides occur between A1 and A2.

In the present embodiment, a configuration using two inertial sensors, a first inertial sensor S1 and a second inertial sensor S2, has been described, but the present invention is not limited to this, and a plurality of two or more inertial inertias are used. A configuration using a sensor may be used. By increasing the installation positions of the inertial sensors, for example, it is possible to more accurately identify the position where the structure is torn or the position where the ground crack is occurring.

[Structure analysis method]
Next, the processing flow of the structure analysis method in the structure analysis device 70 will be described with reference to FIGS. 14 and 15.
FIG. 14 is a flowchart showing a processing flow of the structure analysis method by the structure analysis device 70.
When the process is started, the control unit 20 acquires vibration data related to vibration every 10 ms.
The acquired vibration data is stored (step S200).
Next, the control unit 20 divides and reads out the stored vibration data for each first period, and calculates a representative value from the plurality of vibration data (step S202).
Next, the control unit 20 analyzes the distribution tendency in the second period with respect to the calculated representative value (step S204).
Next, the control unit 20 calculates an index value from the analyzed distribution tendency (step S206).
Next, the control unit 20 determines whether or not to perform temperature correction on the index value (step S).
208).

Here, when it is determined that the temperature correction is performed on the index value (Yes in step S208).
, The control unit 20 corrects the index value based on the temperature fluctuation (step S210), and step S
Proceed to 212.
On the other hand, when it is determined that the temperature correction is not performed on the index value (No in step S208).
), Proceed to step S212.
In step S212, the control unit 20 analyzes the change in the physical properties of the structure based on the change in the index value with the passage of time (step S212).
In step S214, the control unit 20 analyzes the phenomenon that has occurred in the structure based on the fluctuation of the representative value over time (step S214). The details of this analysis will be described with reference to FIG.
Next, the control unit 20 sends information on the physical property change of the analyzed structure and information on the phenomenon occurring in the analyzed structure to the information processing apparatus 80 (step S216), and ends a series of processes.

FIG. 15 analyzes the phenomenon that occurred in the structure based on the time-dependent fluctuation of the representative value (
Step S214) It is a flowchart which shows the flow of processing.
In step S214, the analysis unit 56 first divides the representative value subjected to the Fourier transform into a first frequency region and a second frequency region (step S300).
Next, in the first frequency region, the first inertial sensor S1 and the second inertial sensor S2
The first output ratio RL of the representative value is calculated by and (step S302).
Next, in the second frequency region, the first inertial sensor S1 and the second inertial sensor S2
The second output ratio RH of the representative value is calculated by and (step S304).
The calculated first output ratio RL and second output ratio RH are stored in the storage unit 60.
Next, the first output ratio RL and the second output ratio R to be compared, which are stored in the storage unit 60.
H is selected, and the phenomenon of the structure is analyzed from the time course of the first output ratio RL and the second output ratio RH (step S306).
This completes the analysis process of the phenomenon that occurs in the structure due to the change with time between the first inertial sensor S1 and the second inertial sensor S2.

According to the structure analysis system 1 and the structure analysis device 70 according to the first embodiment described above, the following effects are obtained.
In the past, when performing visual inspections, tapping sounds, and vibration inspections of structures, etc., it was necessary for inspectors to go to the site, and in some cases, large-scale preparations such as road closures were required. In No. 1, changes in physical properties and phenomena of structures and the like can be grasped only by measuring naturally occurring environmental vibrations (vibrations of structures caused by changes in the environment around the structures).

Further, the output of the vibration data detected by the inertial sensors S1 and S2 is extracted for each first period, and the vibration data is extracted.
The analysis values are calculated based on the extracted vibration data, the distribution tendency of the analysis values in the second period longer than the first period is analyzed, and the index value corresponding to the distribution tendency is calculated. It is possible to continuously grasp the index value corresponding to the above, and to analyze the change in the physical properties of the structure from the continuous change of the index value with the passage of time.

Further, the output of the vibration data detected by the first inertial sensor S1 and the second inertial sensor S2 installed on the ground or the structure is divided into a first frequency region and a second frequency region.
The first output ratio RL of the output is calculated by the first inertial sensor S1 and the second inertial sensor S2 in the first frequency region, and the first inertial sensor S1 and the second inertial sensor in the second frequency region are calculated. By calculating the second output ratio RH of the output with S2 and analyzing the change with time between the first output ratio RL and the second output ratio RH, the positions A1 and the second where the first inertial sensor S1 is installed are located. It is possible to capture a phenomenon that has occurred in the ground or a structure between the inertial sensor S2 and the position A2 where the inertial sensor S2 is installed.

Further, since the first frequency region and the second frequency region are different frequency regions, the first frequency region is a frequency region of 10 Hz or less, and includes the frequency of the natural vibration of the ground or the structure, the first frequency region is included. Since the state of vibration energy caused by the ground or structure can be analyzed in the frequency domain, the phenomenon generated in the ground or structure can be accurately analyzed.

Further, the output, which is the vibration data detected by the first inertial sensor S1 and the second inertial sensor S2, is subjected to FFT processing and divided into a first frequency region and a second frequency region to obtain the ground or a structure. Vibration energy caused by, and objects other than the ground or structures, such as
Since the vibration energy caused by an automobile or the like can be analyzed separately, the phenomenon generated in the ground or the structure can be analyzed more accurately.

(Second Embodiment)
[Structure analysis system]
Next, the structure analysis system 1a according to the second embodiment of the present invention will be described with reference to FIG. In the following description, the same parts as those already described will be designated by the same reference numerals and the description thereof will be omitted.
In the first embodiment, the structure analysis device 70 acquires vibration data, and based on the acquired vibration data, analyzes the physical properties and phenomena of the ground or the structure, but in the second embodiment, the information processing device. Based on the vibration data acquired in 80a, the physical properties and phenomena of the ground or structure are analyzed. FIG. 16 is a diagram illustrating a configuration of the structure analysis system 1a according to the second embodiment.
In the structure analysis system 1a, the structure analysis device 70a acquires vibration data and sends the acquired vibration data to the information processing device 80a. The information processing device 80a is a structure analysis device 70a.
Analyze the physical properties and phenomena of the ground or structure based on the vibration data sent from.

The structure analysis device 70a includes an acquisition unit 16 for acquiring vibration data and temperature data detected by the two sensor units 10 and 12, a power supply unit 18, a data processing unit 25, a storage unit 60, and a data output unit 68.
The information processing device 80a includes a data acquisition unit 82, a control unit 84, a storage unit 86, an operation unit 88, and a display unit 90.
The data processing unit 25 stores the vibration data and the temperature data output from the acquisition unit 16 in the storage unit 60, generates a data group at a predetermined timing, and outputs the generated data group from the data output unit 68.
The data output unit 68 may be the communication unit 65 described in the first embodiment. in this case,
The data group may be transmitted in real time, or may be collectively transmitted at a predetermined timing.

Further, the data output unit 68 may be a writing device to a storage medium that can be attached to and detached from the structure analysis device 70a, such as a memory card or a USB memory.
Similarly, the data acquisition unit 82 may be a communication device capable of communicating with the communication unit 65. Further, the data acquisition unit 82 may be a reading device to which the storage medium written by the structure analysis device 70a can be attached and can read the information written in the storage medium.
Further, the control unit 84 has the same functions as the control unit 20 described in the first embodiment, that is, the representative value calculation unit 30, the distribution tendency analysis unit 40, the index value calculation unit 50, the temperature correction unit 52, and the index value fluctuation analysis. Part 5
4 and an analysis unit 56 are provided.

Further, the storage unit 86 has the same function as the storage unit 60 described in the first embodiment. Operation unit 88
Can give various instructions to the structure analysis system 1a by being operated by the user.
In addition, the display unit 90 can display information on the physical properties and phenomena of the ground or structure so that the user can visually recognize the information. 17 and 18 are diagrams showing an example of a screen displayed on the display unit 90 of a monitor or the like, and FIG. 17 shows a continuous change of the index amplitude over a period of about one year by moving average in chronological order. Is displayed. Therefore, it becomes easy to understand long-term fluctuations in data. In addition, since FIG. 18 simultaneously displays event logs during long holidays such as Obon, Silver Week, New Year's holidays, and Golden Week, it is easy to understand that the reason for the decrease in index amplitude is the decrease in traffic volume. I can understand. Further, the event log may be displayed when the data to be displayed exceeds the threshold value. In addition, by displaying the data for several years in different colors for each year, it is easy to grasp the characteristic physical properties and phenomena that occur in the ground or structure for each year.

In the present embodiment, the control unit 84 has the same function as the control unit 20 described in the first embodiment, but is not limited thereto. For example, some functions of the representative value calculation unit 30 may be executed by the data processing unit 25 of the structure analysis device 70a. Further, the communication unit 65 is the sensor unit 10.
, 12, the communication unit 65 of the sensor units 10 and 12 may transmit vibration data to a server or the like via a network, and the server may analyze the vibration data with the structure analysis device 70 or the information processing device 80. ..

The structure analysis system 1, 1a, the structure analysis devices 70, 70a, and the structure analysis method of the present invention have been described above based on the illustrated embodiments, but the present invention is not limited thereto. , The configuration of each part can be replaced with an arbitrary configuration having the same function. Further, any other constituents may be added to the present invention. In addition, each of the above-described embodiments may be combined as appropriate.

1,1a ... Structure analysis system, 10,12 ... Sensor unit, 16 ... Acquisition unit, 18 ... Power supply unit, 20 ... Control unit, 25 ... Data processing unit, 30 ... Representative value calculation unit, 32 ... Statistical processing unit, 34
... Fourier transform unit, 40 ... distribution tendency analysis unit, 45 ... histogram generation unit, 50 ... index value calculation unit, 52 ... temperature correction unit, 54 ... index value fluctuation analysis unit, 56 ... analysis unit, 60 ... storage unit, 65
... Communication unit, 68 ... Data output unit, 70, 70a ... Structure analysis device, 80, 80a ... Information processing device, 82 ... Data acquisition unit, 84 ... Control unit, 86 ... Storage unit, 88 ... Operation unit, 90 ... Display unit, A1 ... position where the first inertial sensor is installed, A2 ... position where the second inertial sensor is installed, RL, RL _a , RL _b ... first output ratio, RH, RH _a , RH _b ... 2nd output ratio, S1 ... 1st inertial sensor, S2 ... 2nd inertial sensor.

Claims (7)

The first inertial sensor installed at the first ground position of the ground or the first position of the structure and the above
An acquisition unit that acquires the output of the second inertial sensor installed at the second ground position of the ground or the second position of the structure, and
The output is divided into a first frequency domain and a second frequency domain.
In the first frequency region, the first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor.
In the second frequency region, the second output ratio of the output is calculated by the first inertial sensor and the second inertial sensor.
It is provided with an analysis unit that analyzes the ground or the structure from the time course of the first output ratio and the second output ratio.
When the first output ratio is increasing and the second output ratio is decreasing, the analysis unit said.
Between the first ground position and the second ground position, or between the first position of the structure and the second of the structure
It is analyzed that the structure between the position and the position has deteriorated, the first output ratio decreases, and the second output ratio becomes
If it is increasing, it is between the first ground position and the second ground position, or the first of the structure.
It is analyzed that the structure between the 1st position and the 2nd position of the structure is strengthened, and the 1st output ratio is analyzed.
When is decreasing and the second output ratio is decreasing, the first ground position and the second ground position
The structure is separated from or between the first position of the structure and the second position of the structure.
Structure analysis apparatus characterized by analyzing a. The structure analysis apparatus according to claim 1, wherein the first frequency region is a region including the frequency of the natural vibration of the ground or the structure. The structure analysis apparatus according to claim 1 or 2, wherein the first frequency region is a frequency region of 0.1 Hz or more and 10 Hz or less. The structure analysis apparatus according to any one of claims 1 to 3, wherein the first frequency region and the second frequency region are different frequency regions. The structure analysis according to any one of claims 1 to 4, wherein the output is subjected to a fast Fourier transform process and divided into the first frequency region and the second frequency region. apparatus. A first inertial sensor and a second inertial sensor installed on the ground or structure,
A structure analysis device for analyzing the outputs of the first inertial sensor and the second inertial sensor is provided.
The structure analysis device includes an acquisition unit that acquires the outputs of the first inertial sensor and the second inertial sensor, and an acquisition unit.
The output is divided into a first frequency domain and a second frequency domain.
In the first frequency region, the first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor.
In the second frequency region, the second output ratio of the output is calculated by the first inertial sensor and the second inertial sensor.
It is provided with an analysis unit that analyzes the ground or the structure from the time course of the first output ratio and the second output ratio.
When the first output ratio is increasing and the second output ratio is decreasing, the analysis unit said.
Between the first ground position and the second ground position, or between the first position of the structure and the second of the structure
It is analyzed that the structure between the position and the position has deteriorated, the first output ratio decreases, and the second output ratio becomes
If it is increasing, it is between the first ground position and the second ground position, or the first of the structure.
It is analyzed that the structure between the 1st position and the 2nd position of the structure is strengthened, and the 1st output ratio is analyzed.
When is decreasing and the second output ratio is decreasing, the first ground position and the second ground position
The structure is separated from or between the first position of the structure and the second position of the structure.
Structure analysis system, characterized in that the analysis as. Acquiring the output of the first inertial sensor and the second inertial sensor installed on the ground or structure,
Dividing the output into a first frequency domain and a second frequency domain,
In the first frequency region, the first output ratio of the output is calculated by the first inertial sensor and the second inertial sensor, and
In the second frequency region, the second output ratio of the output is calculated by the first inertial sensor and the second inertial sensor, and
It includes analyzing the ground or the structure from the time course of the first output ratio and the second output ratio.
When the first output ratio is increasing and the second output ratio is decreasing, it is the same as the first ground position.
Structure between the second ground position or between the first position of the structure and the second position of the structure
When it is analyzed that the structure is deteriorated, the first output ratio is decreasing, and the second output ratio is increasing.
In that case, between the first ground position and the second ground position, or between the first position of the structure and the structure.
It is analyzed that the structure between the structure and the second position is strengthened, and the first output ratio is reduced.
If the second output ratio is decreasing, it may be between the first ground position and the second ground position.
Is a structure analysis method characterized in that the structure between the first position of the structure and the second position of the structure is analyzed as being separated.

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