JP6759937B2 - Lens measuring device - Google Patents

Description

The present disclosure relates to a lens measuring device for measuring the optical characteristics of a lens.

As a lens measuring device, a measuring optical system that measures the optical characteristics (for example, the degree of refraction) of a lens by projecting a measured light beam onto the lens and imaging the measured light beam passing through the lens and an index plate with an imaging element. A lens meter comprising the above is known (see, for example, Patent Document 1). Further, the optical characteristics of the lens are acquired by projecting the measured luminous flux onto the lens, projecting the measured luminous flux passing through the lens and the index plate onto the screen, and imaging the measured luminous flux projected on the screen with the imaging element. A device for determining a mounting position of a cup for processing a lens is known (see, for example, Patent Document 2).

For example, when measuring a progressive power lens (hereinafter referred to as a progressive lens) in a lens measuring device as described above, the examiner moves the lens with respect to the lens measurement area to obtain an optimum distance portion. The alignment operation to search is performed, and the distance portion is measured.

Japanese Unexamined Patent Publication No. 2008-241694 Japanese Unexamined Patent Publication No. 2000-079545

By the way, when measuring a progressive lens, the examiner performs an alignment operation for searching for the optimum distance portion while moving the lens with respect to the lens measurement area, which is complicated for an inexperienced examiner. It took a lot of time to measure.

Further, when measuring a progressive lens, the measurement position of the distance portion changes depending on how the examiner moves the lens (alignment operation method). For example, even with the same progressive lens, the measurement position of the distance portion may change each time depending on how the lens is moved by the examiner. Therefore, it is difficult to obtain the measurement result of the distance portion with good reproducibility.

In the present disclosure, in view of at least one of the above problems, it is possible to easily measure the distance portion in the measurement of the progressive lens and to obtain the measurement result of the distance portion with good reproducibility. A technical issue is to provide a lens measuring device.

(1) The lens measuring device according to the first aspect of the present disclosure is a lens measuring device that measures the optical characteristics of a lens by using a measuring optical system for measuring the optical characteristics of the lens, and includes a first hidden mark and a first hidden mark. The first imaging optical system for capturing one of the hidden marks of the lens to which the second hidden mark is attached and the second for capturing a hidden mark different from the hidden mark imaged by the first imaging optical system. An imaging optical system is provided, and the first imaging region on the lens of the first imaging optical system and the second imaging region on the lens of the second imaging optical system are different imaging regions. The measurement optical system is characterized in that a central region between the first imaging region and the second imaging region includes a measurement region on the lens by the measurement optical system.

It is a schematic block diagram of the appearance in the lens measuring apparatus which concerns on this Example. It is a figure of an example which shows the unprocessed progressive lens from the surface side. It is a figure which shows the optical system in the lens measuring apparatus which concerns on this Example. It is a figure which shows the positional relationship of a measurement optical system and an image pickup optical system. It is a figure which shows an example of the structure which arranged each optical system linearly. It is a figure which shows the index board. It is a figure which shows the index pattern image. It is a figure of an example which shows the structure of the retroreflective member. It is a schematic block diagram of the control system in the lens measuring apparatus which concerns on this Example. It is a figure for demonstrating the state which a stamp mechanism is in a standby position. It is a figure for demonstrating the state which the stamp point mechanism is in a stamp point position. It is a figure which shows the measurement screen of a progressive lens.

Hereinafter, embodiments of the present disclosure will be described with reference to the drawings. In the present disclosure, as an example of the lens measuring device, a lens meter used for measuring the optical characteristics of the lens LE will be described. The lens measuring device in the present disclosure may have a measuring optical system for measuring the optical characteristics of the lens and an imaging optical system for capturing a hidden mark on the lens. That is, the lens measuring device includes a measuring optical system that measures the optical characteristics of the lens by projecting a light beam onto the lens and imaging the light beam that has passed through the lens and the index plate with an imaging element, and the light beam is measured. Any lens meter may be any lens meter provided with an imaging optical system that captures a hidden mark on the lens by projecting light onto the lens, passing through the lens, and imaging the light beam reflected by the reflecting member with the imaging element. Further, the lens measuring device may be a cup mounting device provided with the above-mentioned measuring optical system and imaging optical system, which is used to determine the mounting position of the cup to be mounted when processing the lens LE.

In the present disclosure, the depth direction (front-back direction seen from the examiner) is the Z direction, the horizontal direction on the plane perpendicular to the depth direction (the left-right direction seen from the examiner) is the X direction, and the depth toward the lens meter 1. The vertical direction (vertical direction seen from the examiner) on the plane perpendicular to the direction will be described as the Y direction. Further, the substantially parallel state in the present disclosure includes a completely parallel state. Further, substantially the same in the present disclosure includes a completely identical state.

<Overview>
The lens measuring device (for example, lens meter 1) in the present embodiment measures the optical characteristics of a lens by using a measuring optical system (for example, measuring optical system 10) for measuring the optical characteristics of the lens. For example, the lens measuring device includes a first imaging optical system (for example, a first imaging optical system 20) and a second imaging optical system (second imaging optical system 30).

For example, the first imaging optical system images one of the hidden marks of the lens to which the first hidden mark and the second hidden mark are attached. For example, the second imaging optical system images another hidden mark different from the hidden mark imaged by the first imaging optical system.

For example, a first imaging region (for example, the first imaging region A2) on the lens of the first imaging optical system and a second imaging region (for example, the second imaging region A3) on the lens of the second imaging optical system. And may be different imaging regions. For example, the measurement optical system includes a measurement region (for example, measurement region A1) on the lens by the measurement optical system in a central region (for example, central region B) between the first imaging region and the second imaging region. May be good.

For example, in the present embodiment, when measuring a progressive power lens (progressive lens), when the distance portion is arranged in the measurement area of the measurement optical system when the lens is aligned with the hidden mark, the lens can be easily arranged. It is possible to measure the distance portion. Further, for example, when measuring a progressive lens, when the distance portion is aligned with the hidden mark, the distance portion can always be measured at the same position, so that the distance portion can be measured again with the same lens. Even in this case, it is possible to obtain the measurement result of the distance portion with good reproducibility.

For example, the arrangement of the first imaging region and the second imaging region includes the first imaging center position (for example, center C2) of the first imaging region and the second imaging center position (for example, center C3) in the second imaging region. , May be arranged at positions symmetrical with respect to the measurement center position (center C1) in the measurement region. For example, the center position of the first imaging region in the first imaging optical system for imaging the hidden mark applied to the progressive lens and the center position of the second imaging region in the second imaging optical system are measurement optics for measuring optical characteristics. By being arranged symmetrically from the center position of the measurement region in the system, when measuring the progressive lens, the hidden marks formed at a fixed position on the left and right from the geometric center position of the progressive lens are easily aligned. be able to.

For example, the horizontal distance from the measurement center position to the first imaging center position and the horizontal distance from the measurement area center position to the second imaging center position are from the distance point of the lens to the center position of the hidden mark. It may be made to be substantially the same as the distance in the horizontal direction. For example, the distance in the horizontal direction from the center position of the measurement region in the measurement optical system to the center position of the first imaging region in the first imaging optical system is in the horizontal direction from the distance measurement point of the progressive lens to the hidden mark. By being substantially the same as the distance, the hidden mark can be easily aligned when measuring the progressive lens. Further, for example, the distance in the horizontal direction from the center position of the measurement region in the measurement optical system to the center position of the second imaging region in the second imaging optical system is the horizontal distance from the distance measurement point of the progressive lens to the hidden mark. By being substantially the same as the distance in the direction, the hidden mark can be easily aligned when measuring the progressive lens.

For example, the measurement optical system may be arranged so as to include the measurement region in a region deviated by a predetermined distance in the vertical direction on a perpendicular line passing through the center of a straight line connecting the first imaging center position and the second imaging center position. For example, the measurement region in the measurement optical system is on a perpendicular line passing through the center of a straight line connecting the center position of the first imaging region in the first imaging optical system and the center position of the second imaging region in the second imaging optical system. By locating the hidden marks of the progressive lens by a predetermined distance in the vertical direction, the measurement region of the measurement optical system can be easily arranged in the far portion of the progressive lens.

For example, the predetermined distance may be substantially the same as the distance in the vertical direction from the distance point of the lens to the geometric center of the lens. For example, the distance from the center of the straight line connecting the center position of the first imaging region and the center position of the second imaging region to the measurement region of the measurement optical system is the geometric center position from the distance measurement point of the progressive lens. Since it is substantially the same as the distance in the vertical direction up to, when the hidden mark of the progressive lens is aligned, the measurement area of the measurement optical system can be easily arranged by the distance diopter measurement point of the progressive lens.

For example, the first image pickup optical system includes a first light source (for example, a light source 11), a first reflection member (for example, a first reflection member 27), and a first image pickup element (for example, a first image pickup element 26). May have. In this case, for example, the first imaging optical system irradiates the light emitted from the first light source from the surface side of the lens arranged at a predetermined position, and reflects the light passing through the lens by the first reflecting member. The first hidden mark may be imaged by passing the lens through the lens again and receiving the light that has passed through the lens again by the first image pickup element.

For example, the second imaging optical system includes a second light source (for example, a light source 11), a second reflecting member (for example, a second reflecting member 37), and a second imaging element (for example, a second imaging element 36). The light emitted from the second light source is irradiated from the surface side of the lens arranged at a predetermined position, the light passing through the lens is reflected by the second reflecting member and passed through the lens again, and the lens is again passed. The second hidden mark may be imaged by receiving the light that has passed through the second image pickup element. For example, the first light source is reflected by the first reflecting member, and the first image sensor images a predetermined position of the progressive lens, so that the first hidden mark can be more easily detected. Further, for example, the second light source is reflected by the second reflecting member, and the second image sensor images a predetermined position of the progressive lens, so that the second hidden mark can be more easily detected.

For example, the first imaging optical system and the second imaging optical system may be optical systems in which at least a part of the optical members are also used. In this case, for example, at least the first image sensor and the second image sensor may be separately provided. Further, for example, the first imaging optical system and the second imaging optical system may be separately provided.

For example, the measurement optical system is a measurement optical system for measuring the optical characteristics of a lens arranged on a nose piece (for example, nose piece 4), and the optical axis of the measurement optical system passes through the nose piece. You may do so. In this case, for example, the first imaging region and the second imaging region may be arranged outside the nosepiece. For example, the first imaging region in the first imaging optical system and the second imaging region in the second imaging optical system are arranged outside the nosepiece, so that the imaging optics for imaging the hidden mark of the progressive lens. The optical characteristics of the lens can be measured by the measuring optical system without being disturbed by the system.

For example, the lens measuring device may include a stamping mechanism (for example, a stamping mechanism 9). For example, the stamp mechanism includes a first stamp member (for example, a first stamp member 85a), a second stamp member (for example, a second stamp member 85b), and a third stamp member (for example, a third stamp member). 3 mark point member 85c) and may be provided. For example, the first marking member may be provided with a first marking that defines either the first hidden mark position or the second hidden mark. For example, the second marking member may be provided with a second marking that defines the position of the first hidden mark or the other of the second hidden marks. For example, the third stamping member may be subjected to the third stamping point.

For example, the first marking axis (for example, the first marking axis S1) of the first marking member may intersect with the first imaging center position when the first marking is applied. For example, the second marking axis (for example, the first marking axis S2) of the second marking member may intersect the second imaging center position when the second marking is applied. For example, the third stamp axis (for example, the third stamp axis S3) of the third stamp member may intersect the measurement center position when the third stamp is applied. For example, a first marking point intersecting the center position of the first imaging region, a second marking point intersecting the center position of the second imaging region, and a third marking point intersecting the center position of the measurement region are applied. By being a possible marking point member, marking points can be easily applied to the first hidden mark, the second hidden mark, and the distance dioptric power measurement point of the progressive lens.

<Example>
Hereinafter, examples of the present disclosure will be described with reference to the drawings. FIG. 1 is a schematic external view of the lens meter 1. For example, the lens meter 1 includes a display (monitor) 2, an input switch 3, a nose piece 4, a lens retainer 5, a lens table 6, a lever 7, a READ switch 8, a marking mechanism 9, and the like. The configuration of the lens meter 1 in this embodiment is not limited to this. The lens meter 1 in this embodiment may include at least a measurement optical system 10, a first imaging optical system 20, and a second imaging optical system 30, which will be described later.

For example, an LCD (Liquid Crystal Display) is used for the display 2. In this embodiment, a configuration in which an LCD is used as the display 2 will be described as an example, but the present invention is not limited to this. For example, the display 2 may be configured to use an organic EL (Electro Luminescence) display or a plasma display.
For example, the display 2 is a touch panel. That is, in this embodiment, the display 2 functions as an operation unit (controller). Of course, the display 2 does not have to be a touch panel type. Further, for example, the display 2 may be configured to use a plurality of displays in combination.

For example, the display 2 outputs a signal corresponding to the input operation instruction to the control unit 70 (see FIG. 9) described later. Of course, the display 2 and the operation unit may be provided separately. For example, as the operation unit, a configuration using at least one of a mouse, a joystick, a keyboard, a mobile terminal, and the like can be mentioned.

For example, various information is displayed on the display 2. For example, various information includes optical characteristics of the lens (for example, spherical power S, pillar power C, astigmatic axis angle A, prism amount Δ, etc.). Further, for example, when the optical characteristics of the progressive lens are measured using the lens meter 1, hidden marks (that is, first hidden mark M1 and second hidden mark M2, which will be described later) and the like are displayed on the progressive lens. Will be done.

For example, the input switch 3 is used when inputting signals for causing the lens meter 1 to execute various processes. For example, various processes include switching of measurement modes and the like. For example, in this embodiment, the input switch 3 is electronically displayed on the screen of the display 2. That is, the input switch 3 can be operated by touching the screen of the display 2. The configuration of the input switch 3 is not limited to this embodiment. For example, the input switch 3 may be installed on the display cover 2a or the like.

For example, the nose piece 4 is a mounting table for mounting a lens. For example, the lens retainer 5 is for pressing the lens from above and holding it stably. For example, the lens table 6 is used when measuring the optical characteristics of the lens framed in the spectacle frame. For example, the lower ends of the left and right rims of the spectacle frame are brought into contact with the lens table 6. For example, the lever 7 is for moving the lens table 7 in the front-rear direction (Z direction). For example, the READ switch 8 is used to read the optical characteristics of the lens. For example, the stamping mechanism 9 is for applying stamping points to the lens. The marking mechanism 9 will be described in detail later.

For example, the lens meter 1 in this embodiment can detect a hidden mark M (see FIG. 2) of a progressive lens described later. Further, for example, the lens meter 1 in this embodiment can easily measure the optical characteristics at the distance dioptric power measurement point 100 (see FIG. 2) of the progressive lens described later. Therefore, first, the features of the progressive lens will be described. The lens meter 1 in this embodiment can also measure the optical characteristics of a lens other than the progressive lens.

FIG. 2 is an example of an unprocessed progressive lens LE shown from the surface side (convex surface side). For example, the progressive lens LE is set with a distance dioptric power measurement point 100, a distance dioptric power measurement point 101, a near dioptric power measurement point 102, a near vision eye point 103, and the like. These set positions and set areas are printed as print marks on the surface of the progressive lens LE. Further, for example, the progressive lens LE is provided with a hidden mark M.

For example, the distance dioptric power of the progressive lens LE is measured at the distance dioptric power measurement point 100. For example, the center position C of the distance dioptric power measurement point 100 is located at a predetermined distance (for example, 4 mm) upward from the distance eye point 101. For example, the distance eye point 101 is used to match the pupil positions of the spectacle wearer. That is, it is prescribed so that the line of sight when the spectacle wearer makes a front view passes through the distance eye point 101. Further, for example, the distance eye point 101 is located at a predetermined distance (for example, 2 mm) upward from the geometric center position O (in other words, the center position O of the progressive lens LE) in the progressive lens LE. There is. For example, the near dioptric power of the progressive lens LE is measured at the near dioptric power measurement point 102. For example, the near eye point 103 is located at a predetermined distance downward from the geometric center position O in the progressive lens LE. For example, the distance between the near eye point 103 and the far eye point 101 in the left-right direction (horizontal direction) indicates the amount of inward alignment in the near portion of the progressive lens. The distance between the near eye point 103 and the far eye point 101 in the vertical direction (vertical direction) indicates the progressive zone length of the progressive lens.

For example, as the hidden mark M, symbols and numerical values (not shown) indicating the type of the progressive lens LE, the addition power, the refractive index, the progressive band length, and the like are displayed. For example, the hidden mark M includes a first hidden mark M1 and a second hidden mark M2. For example, the first hidden mark M1 and the second hidden mark M2 are applied in the left-right direction (horizontal direction) with respect to the geometric center position O of the progressive lens LE. For example, in this embodiment, the first hidden mark M1 is formed at a position 17 mm to the right from the geometric center position O of the progressive lens LE. Further, for example, in the present embodiment, the second hidden mark M2 is formed at a position 17 mm to the left from the geometric center position O of the progressive lens LE. That is, in this embodiment, the first hidden mark M1 and the second hidden mark M2 are formed symmetrically with respect to the geometric center position O of the progressive lens LE.

As described above, in the progressive lens LE, the distance eye point 101 and the hidden mark M are located at positions separated from the geometric center position O by predetermined distances in the upward and horizontal directions, respectively. Therefore, if the position of the hidden mark M applied to the progressive lens LE is used as a reference, the positions of the geometric center position O, the distance eye point 101, and the like can be specified.

FIG. 3 is a diagram showing an optical system of the lens meter 1. For example, the optical system in this embodiment includes a measurement optical system 10, a first imaging optical system 20, and a second imaging optical system 30. For example, the lens meter 1 in this embodiment can image different regions on the lens by including two imaging optical systems, a first imaging optical system 20 and a second imaging optical system 30. ..

For example, the measurement optical system 10 is an optical system for measuring the optical characteristics of the lens LE. For example, the first imaging optical system 20 is an optical system for imaging one of the hidden marks (for example, the first hidden mark M1) in the progressive lens LE provided with the first hidden mark M1 and the second hidden mark M2. Is. For example, the second imaging optical system 30 is an optical system for imaging the other hidden mark (for example, the second hidden mark M2) in the progressive lens LE provided with the first hidden mark M1 and the second hidden mark M2. Is. The first imaging optical system 20 and the second imaging optical system 30 may be configured to image either the first hidden mark M1 or the second hidden mark M2.

For example, the measurement optical system 10 includes a light source 11, a collimating lens 12, a half mirror 13, a half mirror 14, an index plate 15, an image sensor 16, an aperture 18, and the like. For example, the optical axis L1 in the measurement optical system 10 has a relationship perpendicular to the plane of the opening 4a of the nose piece. For example, the optical axis L1 passes through the center of the opening 4a of the nose piece. For example, the opening 4a of the nose piece is circular with a diameter of 8 mm. For example, the light source 11 is composed of an LED (Light Emitting Diode). For example, the light source 11 is arranged on the optical axis L1. For example, the index plate 15 has a measurement index 40 (see FIG. 6) described later. For example, the index plate 15 is held by the holding member 17 of the lens meter main body 1. For example, the image sensor 16 is configured by using a CCD (Charge Coupled Device).

For example, in the measurement optical system 10, the light beam emitted from the light source 11 arranged on the optical axis L1 becomes a parallel light beam via the diaphragm 18 and the collimating lens 12, and passes through the half mirror 13 and the half mirror 14. The light is projected onto the lens LE. Further, the luminous flux transmitted through the lens LE passes through the opening 4a of the nose piece and the measurement index 40 (see FIG. 6) of the index plate 15. For example, the image sensor 16 images an index pattern image formed by passing the measured luminous flux through the measurement index 40.

For example, in the measurement optical system 10, the luminous flux emitted from the light source 11 is branched into a luminous flux toward the half mirror 14 and a luminous flux toward the half mirror 23 by the half mirror 13. The light flux directed toward the half mirror 23 is reflected by the half mirror 23 and coincides with the optical axis L2 of the first imaging optical system 20 described later. Further, the luminous flux emitted from the light source 11 is branched by the half mirror 14 into a luminous flux toward the opening 4a of the nose piece and a luminous flux toward the half mirror 34 described later. The light flux directed toward the half mirror 34 is reflected by the half mirror 34 and coincides with the optical axis L3 of the second imaging optical system 30 described later.

For example, the first image pickup optical system 20 includes a first reflection member 27, a half mirror 24, a half mirror 23, a condenser lens 22, an aperture 25, an image pickup element 26, and the like. For example, the optical axis L2 in the first imaging optical system 20 is arranged so as to be perpendicular to the position of one of the hidden marks (for example, the first hidden mark M1) applied to the progressive lens LE. For example, the first image sensor 26 is configured by using a CCD. For example, the first reflecting member 27 reflects the light flux incident from the surface side of the lens LE mounted on the nose piece 4.

For example, in the first imaging optical system 20, the luminous flux emitted from the light source 11 becomes a parallel luminous flux via the diaphragm 18 and the collimating lens 12, is reflected by the half mirror 13 and the half mirror 23, and then has an optical axis. Matches L2. When this light beam is projected onto the lens LE via the half mirror 24, it is reflected by the first reflecting member 27, passes through the lens LE, the half mirror 24, and the half mirror 23, and passes through the condenser lens 22 and the aperture 25. Then, the image is taken by the first image pickup element 26. That is, for example, in the first imaging optical system 20, the light beam emitted from the light source 11 and applied to the lens LE via the half mirror 13, the half mirror 23, and the half mirror 24 is transmitted to the first reflecting member 27 and the half. An image is taken by the image pickup element 26 via the mirror 24, the half mirror 23, the condenser lens 22, and the aperture 25. For example, the first image sensor 26 images the first hidden mark M1 applied to the progressive lens LE.

In this embodiment, the half mirror 24 is installed in the first imaging optical system 20. For example, the half mirror 24 is irradiated from the light source 11, reflected by the half mirror 13 and the half mirror 23, and the luminous flux corresponding to the optical axis L2 is directed toward the first reflecting member 27 and the luminous flux toward the outside of the optical path of the optical axis L2. Branches into a luminous flux. For example, the light flux directed to the outside of the optical path is absorbed by a light absorbing member (for example, a black member that absorbs the light beam) (not shown). As a result, the amount of light flux imaged by the first image sensor 26 of the first image pickup optical system 20 and the amount of light flux imaged by the second image sensor 36 of the second image pickup optical system 30, which will be described later, are made equal to each other. be able to.

In this embodiment, by setting the half mirror 24, the amount of the light flux imaged by the first image sensor 26 and the amount of the light flux imaged by the second image sensor 36 are matched as an example. I explained, but it is not limited to this. For example, when the imaging results of the first image sensor 26 and the second image sensor 36 are displayed on the screen of the display 2, the imaging results of the first image sensor 26 and the second image sensor 36 can be observed with the same brightness. As described above, the configuration may be such that the brightness value is adjusted.

For example, the second image pickup optical system 30 includes a second reflection member 37, a half mirror 34, a condenser lens 32, an aperture 35, a second image pickup element 36, and the like. For example, the optical axis L3 in the second imaging optical system 30 is arranged so as to be perpendicular to the position of the other hidden mark (for example, the second hidden mark M2) applied to the progressive lens. For example, the second image sensor 36 is configured by using a CCD. For example, the second reflecting member 37 reflects the luminous flux incident from the surface side of the lens LE mounted on the nose piece 4.

For example, in the second imaging optical system 30, the light beam emitted from the light source 11 arranged on the optical axis L1 becomes a parallel light beam via the diaphragm 18 and the collimating lens 12, passes through the half mirror 13, and passes through the half mirror 13. After being reflected by the half mirror 14 and the half mirror 34, respectively, they coincide with the optical axis L3. When this luminous flux is projected onto the lens LE, it is reflected by the second reflecting member 37, passes through the lens LE and the half mirror 34, and is imaged by the second imaging element 36 via the condenser lens 32 and the aperture 35. .. That is, for example, the second imaging optical system 30 emits the light beam emitted from the light source 11 and irradiated to the lens LE via the half mirror 13, the half mirror 14, and the half mirror 34, and the second reflecting member 37 and the half. An image is taken by the image pickup element 36 via the mirror 34, the condenser lens 32, and the aperture 35. For example, the second image sensor 36 images the second hidden mark M2 applied to the progressive lens LE.

For example, in the second imaging optical system 30, the luminous flux emitted from the light source 11 and passed through the half mirror 13 is divided into a luminous flux toward the half mirror 34 and a luminous flux toward the opening 4a of the nosepiece by the half mirror 14. It is branched. The luminous flux toward the half mirror 34 is reflected by the half mirror 34 and coincides with the optical axis L3.

In this embodiment, the light source 11 of the measurement optical system 10 for irradiating the lens LE with a luminous flux for measuring the optical characteristics of the lens LE and the lens LE for photographing the hidden mark M are irradiated with the luminous flux. The configuration in which the light source and the light source are also used has been described as an example, but the present invention is not limited to this. For example, these light sources may be separately provided. In this case, for example, the measurement optical system 10 for measuring the optical characteristics of the lens LE, the projection optical system for imaging the first hidden mark M1, and the projection optical system for imaging the second hidden mark M2. And may be provided respectively. Further, for example, two optical systems may be used in combination among the above optical systems.

In this embodiment, lenses, mirrors, and the like in the measurement optical system 10, the first imaging optical system 20, and the second imaging optical system 30 are separately provided, but the present invention is not limited to this. These lenses, mirrors, and the like may have at least a part of the members in the measurement optical system and the imaging optical system.

In this embodiment, the first reflecting member 27 in the first imaging optical system 20 and the second reflecting member 37 in the second imaging optical system 30 are separately provided, but the present invention is not limited to this. The first reflective member 27 and the second reflective member 37 may be shared. For example, the first reflecting member 27 and the second reflecting member 37 may have a configuration capable of reflecting the light flux on the optical axis L2 and the light flux on the optical axis L3. In this case, for example, if the reflecting member has a disk shape centered on the nose piece 4 and covers the periphery, the first reflecting member in the first imaging optical system 20 and the second reflecting member in the second imaging optical system 30. The reflective member can also be used as one reflective member. Further, for example, even if the reflective member has a rectangular shape, the first reflective member and the second reflective member can be combined with one reflective member. The shape of the reflective member is not limited to this embodiment. Various shapes can be applied to the reflective member in this embodiment.

For example, for the first reflecting member 27 and the second reflecting member 37 in this embodiment, it is preferable to use a retroreflective member whose incident direction and reflection direction of the light beam are substantially parallel (details on the retroreflective member). Will be described later). In this embodiment, a configuration in which a retroreflective member is used as the reflective member will be described as an example, but the present invention is not limited to this. The reflecting member in this embodiment may be a member capable of reflecting incident light. That is, for example, as the reflecting member, a screen or the like that enhances the scattering action of incident light can be used. In this embodiment, the image pickup element is used to image the front surface side of the lens LE, but if the image pickup element is used to image the back surface side of the lens LE, the reflective member may not be used.
Hereinafter, the measurement region in which the measurement is performed by the optical system and the imaging region in which the measurement is performed by the optical system will be described. FIG. 4 is a diagram showing the positional relationship between the measurement optical system 10, the first imaging optical system 20, and the second imaging optical system 30. For example, in this embodiment, the measurement area A1, the first imaging area A2, and the second imaging area A3 are provided.

For example, the measurement region A1 indicates a region that can be measured by the measurement optical system 10. That is, the measurement region A1 indicates the measurement range of the measurement optical system 10. For example, the measurement region A1 is formed in a predetermined range about the optical axis L1 of the measurement optical system 10.
For example, the first imaging region A2 indicates an region that can be imaged by the first imaging optical system 20. That is, the first imaging region A2 indicates the imaging range of the first imaging optical system 20. For example, the first imaging region A2 is formed in a predetermined range about the optical axis L2 of the first imaging optical system 20.

For example, the second imaging region A3 indicates an region that can be imaged by the second imaging optical system 30. That is, the second imaging region A3 indicates the imaging range of the second imaging optical system 30. For example, the second imaging region A3 is formed in a predetermined range about the optical axis L3 of the second imaging optical system 30.

For example, the measurement region A1 is located in a region (central region B) between the first imaging region A2 and the second imaging region A3. For example, in this embodiment, the measurement region A1 is located in the central region B, and the regions do not overlap with the first imaging region A2 and the second imaging region A3 (in other words, the first imaging optical system 20 and The second imaging optical system 30 is arranged outside the nosepiece 4). Of course, the measurement region A1 may be located in the central region B, and at least a part of the first imaging region A2 and the second imaging region A3 may be overlapped with each other.

In this embodiment, the region from the first imaging center position C2 of the first imaging region A2 to the second imaging center position center C3 of the second imaging region A3 is defined as the central region B. Of course, the central region B is not limited to this. For example, the central region B may be a region from the right end of the first imaging region A2 to the left end of the second imaging region A3. Further, for example, the central region B may be a region from the left end of the first imaging region A2 to the right end of the second imaging region A3.

For example, in this embodiment, the measurement region A1 has substantially the same diameter (circle with a diameter of 8 mm) as the opening 4a of the nose piece. For example, in this embodiment, the first imaging region A2 is a region having a predetermined diameter (for example, a circle having a diameter of 2 cm). Further, for example, in the present embodiment, the second imaging region A3 imaged by the second imaging optical system 30 is a region having a predetermined diameter (for example, a circle having a diameter of 2 cm).

In this embodiment, the first imaging region A2 and the second imaging region A3 are each a circular region having a diameter of 2 cm, but the present invention is not limited to this. For example, the sizes of the first imaging region A2 and the second imaging region A3 may be any size as long as they can image the hidden mark M applied to the progressive lens. That is, the size of the first imaging region A2 and the second imaging region A3 may be wider than the hidden mark M provided on the progressive lens.

In this embodiment, for example, the first imaging center position (hereinafter referred to as the center) C2 in the first imaging region A2 and the second imaging center position (hereinafter referred to as the center) C3 in the second imaging region A3 are The measurement center position (hereinafter referred to as the center) C1 in the measurement region A1 is arranged symmetrically with respect to the center. In this embodiment, for example, the center C1 of the measurement region A1 coincides with the center position of the opening 4a of the nose piece. That is, the center C1 of the measurement region A1 coincides with the optical axis L1 of the measurement optical system 10. In this embodiment, for example, the center C2 of the first imaging region A2 coincides with the optical axis L2 of the first imaging optical system 20. In this embodiment, for example, the center C3 of the second imaging region A3 coincides with the optical axis L3 of the second imaging optical system 30.

For example, in this embodiment, the measurement region A1 of the measurement optical system 10, the first imaging region A2 of the first imaging optical system 20, and the second imaging region A3 of the second imaging optical system 30 are triangular. Arranged in shape. That is, the optical axis L1 of the measurement optical system 10 is not located on the straight line connecting the optical axis L2 of the first imaging optical system 20 and the optical axis L3 of the second imaging optical system 30.

In this embodiment, when the progressive lens is arranged on the nose piece 4 and the alignment is performed, the distance dioptric power measurement point 100 of the progressive lens is in the measurement area A1, and the hidden mark M is the first imaging area A2. The arrangement of each optical system is set so as to be arranged within the second imaging region A3. That is, each optical so that the arrangement relationship between the distance dioptric power measurement point 100 and the position of the hidden mark M in the progressive lens and the arrangement relationship of the measurement area A1, the first imaging area A2, and the second imaging area A3 are similar. The system is arranged.

For example, the first imaging optical system 20 and the second imaging optical system 30 are arranged in the horizontal direction (horizontal direction) with respect to the geometric center O of the progressive lens LE. That is, the first imaging optical system 20 and the second imaging optical system 30 are arranged at positions of hidden marks M formed on the left and right with the geometric center O as the center. Further, for example, the measurement optical system 10 is arranged in the direction perpendicular to the geometric center O of the progressive lens LE (vertical direction). That is, the measurement optical system 10 is arranged at the position of the distance dioptric power measurement point 100 formed in at least one of the vertical directions with the geometric center O as the center. The measurement optical system 10 may be arranged in either the upward direction or the downward direction with respect to the geometric center O of the progressive lens LE.

Hereinafter, the arrangement of each optical system will be described in more detail. For example, in this embodiment, the center C1 of the measurement region A1 is the center of the line segment connecting the center C2 of the first imaging region A2 and the center C3 of the second imaging region A3 (that is, the geometry of the progressive lens LE). The measurement optical system 10 is arranged so as to be arranged at a position separated by a predetermined distance in the vertical direction (for example, in the upward direction in this embodiment) on the perpendicular line passing through the central position O).

For example, the predetermined distance is the distance (for example, 8 mm) in the vertical direction from the geometric center position O of the progressive lens LE to the center position C of the distance dioptric power measurement point 100. In other words, the vertical distance from the center C1 of the measurement region A1 to the geometric center position O in the progressive lens LE is from the center C of the distance diopter measurement point 100 in the progressive lens LE to the geometric center position O. It is set to be approximately the same as the distance in the vertical direction.

For example, in this embodiment, the first imaging optical system 20 is arranged so that the center C2 of the first imaging region A2 is located at a predetermined distance to the right from the geometric center position O of the progressive lens LE. ing. For example, the predetermined distance is the distance (that is, 17 mm) from the geometric center position O of the progressive lens LE to the first hidden mark M1. The distance dioptric power measurement point 100 is located in the upward direction of the geometric center position O in the progressive lens LE. Therefore, the horizontal distance from the center C2 of the first imaging region A2 to the center C1 of the measurement region A1 is the horizontal distance from the first hidden mark M1 in the progressive lens LE to the center of the distance dioptric power measurement point 100. It will be almost the same.

For example, in this embodiment, the second imaging optical system 30 is arranged so that the center C3 of the second imaging region A3 is located at a predetermined distance to the left from the geometric center position O of the progressive lens LE. ing. For example, the predetermined distance is the distance (that is, 17 mm) from the geometric center position O of the progressive lens LE to the second hidden mark M2. Therefore, the horizontal distance from the center C3 of the second imaging region A3 to the center C1 of the measurement region A1 is the horizontal distance from the second hidden mark M2 in the progressive lens LE to the center of the distance dioptric power measurement point 100. It will be almost the same.

With the above configuration, the imaging of the hidden mark M applied to the progressive lens LE and the measurement of the optical characteristics at the distance dioptric power measurement point 100 of the progressive lens LE can be performed at the same time. More specifically, for example, the examiner places the progressive lens LE on the nosepiece 4. For example, the examiner moves the progressive lens LE mounted on the nose piece 4 so that the first hidden mark M1 coincides with the optical axis L2 of the first imaging optical system 20 and the second hidden mark M2. Is aligned on the optical axis L3 of the second imaging optical system 30. For example, when the first hidden mark M1 and the second hidden mark M2 coincide with the optical axis L2 of the first imaging optical system 20 and the optical axis L3 of the second imaging optical system 30, the distance diopter measurement of the progressive lens LE is performed. The point 100 coincides with the optical axis L1 of the measurement optical system 10. Therefore, the examiner can easily measure the distance dioptric power in the progressive lens LE only by aligning the hidden mark M. Further, for example, in the present embodiment, if the hidden mark M of the progressive lens LE is aligned, the distance dioptric power measurement point 100 always coincides with the optical axis L1 of the measurement optical system 10, so that the same lens is used for distance. No matter how many times the frequency is measured, the measurement result can be obtained with good reproducibility.

In this embodiment, the center C2 of the first imaging region and the center C3 of the second imaging region are arranged at the position of the hidden mark M provided on the progressive lens LE, but the present invention is not limited to this. For example, the center of the imaging region does not necessarily have to be arranged at the position of the hidden mark M applied to the progressive lens LE. That is, the hidden mark positions provided on the progressive lens LE may be arranged in the first imaging region A2 and the second imaging region A3.

For example, in this embodiment, the configuration in which the measurement optical system 10, the first imaging optical system 20, and the second imaging optical system 30 are arranged in a triangular shape has been described as an example, but the present invention is limited to this. Not done. For example, these measurement optical systems and imaging optical systems may be arranged in a straight line, respectively, arranged in the horizontal direction. In such a case, after imaging the hidden mark M applied to the progressive lens LE, the progressive lens LE or the measurement optical system 10 is moved in the vertical direction by a predetermined distance to measure the distance diopter of the progressive lens LE. The optical characteristics at 100 may be measured.

Hereinafter, the configurations in which these measurement optical systems and imaging optical systems are arranged in a horizontal direction and linearly are described in more detail. For example, FIG. 5 is a diagram showing an example of a configuration in which each optical system is arranged linearly. For example, the optical axis L1 of the measurement optical system 10, the optical axis L2 of the first imaging optical system 20, and the optical axis L3 of the second imaging optical system 30 may be arranged linearly in the horizontal direction. .. In this case, for example, the center C1 of the measurement region A1 in the measurement optical system 10 (the optical axis L1 of the measurement optical system 10) may be arranged so as to coincide with the geometric center position O of the progressive lens LE.

In the case of the above configuration, for example, even if the hidden mark M provided on the progressive lens LE is aligned in the first imaging region A2 and the second imaging region A3, the progressive lens LE is used for distance. Since the power measurement point 100 is located at a position shifted in the vertical direction of the geometric center position O, the distance power measurement point 100 of the progressive lens LE is not arranged in the measurement area A1.

Therefore, for example, the lens meter 1 is provided with a moving mechanism for moving the measurement optical system 10 or the progressive lens LE in the vertical direction, so that the distance dioptric power measurement point 100 of the progressive lens LE is provided in the measurement area A1. May be arranged. In this case, for example, the movement of the progressive lens LE or the measurement optical system 10 may be performed automatically or manually by the examiner.

For example, when the above movement is automatically performed, a detection means for detecting that the hidden mark M of the progressive lens LE coincides with the first imaging region A2 and the second imaging region A3 may be provided. Good. With such a configuration, the control unit 70, which will be described later, can determine whether or not the alignment of the hidden mark M applied to the progressive lens is completed.

For example, when the progressive lens LE or the progressive lens LE is automatically moved, the control unit 70 automatically moves the measurement optical system 10 or the progressive lens LE in the vertical direction based on the completion of the alignment of the hidden mark M. Move. As a result, the distance dioptric power measurement point 100 of the progressive lens LE is arranged in the measurement area A1.

More specifically, for example, when the examiner aligns the hidden mark M, the first hidden mark M1 and the second hidden mark M2 coincide with each of the first imaging region A2 and the second imaging region A3 by the detection means. It is detected that it has been done. For example, the control unit 70, which will be described later, drives the movement mechanism to move the measurement optical system 10 in the upward direction (front direction as seen from the examiner) of FIG. 5 by a predetermined distance (for example, 8 mm). As a result, the distance dioptric power measurement point 100 of the progressive lens LE is aligned within the measurement region A1 of the measurement optical system 10, and the distance dioptric power can be measured. In this embodiment, the configuration in which only the measurement optical system moves has been described as an example, but the configuration in which the measurement optical system and the imaging optical system move integrally may be used.

Further, when the progressive lens LE or the measurement optical system 10 is manually moved, for example, when the examiner aligns the hidden mark M, the detection means is used to move the progressive lens LE or the measurement optical system 10 into the first imaging region A2 and the second imaging region A3, respectively. It is detected that the first hidden mark M1 and the second hidden mark M2 match. For example, the examiner confirms that the first hidden mark M1 and the second hidden mark M2 match, and by selecting a movement switch (not shown), the control unit 70, which will be described later, drives the movement mechanism to progress. The lens LE is moved downward in FIG. 5 (in the back direction as seen from the examiner) by a predetermined distance (for example, 8 mm). As a result, the distance dioptric power measurement point 100 of the progressive lens LE is aligned within the measurement region A1 of the measurement optical system 10, and the distance dioptric power can be measured.

For example, when the above movement is performed manually, a guide display indicating the movement direction of the lens LE may be displayed on the screen of the display 2. For example, the guide display is displayed on the screen of the display 2 by the control unit 70 described later when the alignment of the hidden mark M applied to the progressive lens LE is completed. The examiner moves the progressive lens LE according to the guide display, and aligns the distance dioptric power measurement point 100 of the progressive lens LE within the measurement region A1 of the measurement optical system 10. Thereby, the distance dioptric power of the progressive lens LE can be measured.

In this embodiment, the measurement optical system 10 or the progressive lens LE is moved when the measurement optical system and the imaging optical system are arranged linearly, but the present invention is not limited to this. In this embodiment, it is sufficient that the measurement optical system 10 can measure the optical characteristics of the distance dioptric power measurement point 100 in the progressive lens LE. That is, for example, if the distance dioptric power measurement point 100 of the progressive lens LE falls within the measurement region A1 in the measurement optical system 10, the measurement optical system 10 or the progressive lens LE may not be moved. In this case, for example, a configuration in which the measurement region A1 of the measurement optical system 10 is widely set may be used.

FIG. 6 is a diagram showing an index plate. For example, a large number of measurement indexes 40 are formed on the index plate 15. For example, the measurement index includes a central hole 41 and a small hole 42. For example, the central hole 41 is located at the center of the index plate 15. For example, the central hole 41 has a circular shape with a diameter of 0.4 mm. For example, the small holes 42 are arranged at equal intervals (for example, at 0.5 mm intervals) and in a grid pattern. For example, the small hole 42 has a circular shape with a diameter of 0.2 mm. For example, the light beam emitted from the light source 11 is projected onto the index plate 15. Therefore, the index pattern image 50, which will be described later, is formed by the luminous flux that has passed through the measurement index. For example, the image sensor 16 of the measurement optical system 10 images the index pattern image. The index pattern image captured by the image sensor 16 shows a grid-like pattern shape because the measurement indexes 40 are arranged in a grid shape. In this embodiment, a configuration in which the measurement indexes 40 are arranged in a grid pattern will be described as an example, but the present invention is not limited to this. For example, the measurement indexes 40 may be arranged at non-equal intervals. Further, for example, the measurement index 40 may be arranged radially or concentrically. In this case, the image sensor 16 images the radial or concentric index pattern image 50.

FIG. 7 is a diagram showing an index pattern image 50. FIG. 7A is a diagram showing an index pattern image 50 in the 0D reference state. FIG. 7B is a diagram showing an example of the index pattern image 50 in a state where the lens is placed on the nose piece 4. For example, the index pattern image 50 in the "0D reference" state in which the lens LE is not placed on the nose piece 4 is used for calculating the optical characteristics in the lens LE. For example, the index pattern image 50 in the “0D reference” state is stored in the non-volatile memory 71 of the control unit 70, which will be described later.

For example, the index pattern image 50 is formed by an image 51 of a central hole and an image 52 of a small hole. For example, the image 51 of the central hole is a reference index for grasping the positional relationship between the image 51 of the central hole and the image 52 of the small hole. That is, by using the image 51 of the central hole, the image 52a of a small hole formed in the index pattern image 50 in the 0D reference state is changed by placing the lens LE on the nose piece 4. It is possible to identify which of the images of the small holes formed in. In this embodiment, one reference index (center hole) is arranged in the center of the index plate 15, but the present invention is not limited to this. The reference index in this embodiment may be any one that can be distinguished from other measurement indexes (small holes). That is, the number, shape, position, etc. of the reference index may be different from those in this embodiment.

For example, when the lens LE is placed on the nose piece 4, the luminous flux emitted from the light source 11 is refracted by the lens LE. Therefore, the index pattern image 50 imaged by the image sensor 16 changes according to the refraction of the lens. For example, the index pattern image 50 when the lens LE having only the spherical power is placed is enlarged or reduced in a circular shape and equidistant with respect to the index pattern image in the 0D reference state. For example, the spherical power of the lens LE is obtained based on the amount of enlargement or reduction of the index pattern image 50. For example, the control unit 70, which will be described later, calculates the optical characteristics of the lens LE by obtaining the amount of change in the index pattern image 50 when the lens LE is mounted on the index pattern image 50 indicating the 0D reference state. .. A well-known technique (Japanese Unexamined Patent Publication No. 2008-241694) can be referred to for a method of measuring the optical characteristics of the lens LE using the index pattern image.

Further, for example, the control unit 70, which will be described later, measures the refractive power at a plurality of positions of the lens LE at one time by analyzing the index pattern image 50 imaged by the image sensor 16. Therefore, the control unit 70 calculates the optical characteristics at one time for each position measured by the lens LE. For example, the optical characteristics of the lens LE can be calculated as a set of four (at least three) adjacent small hole images out of the small hole images 52 forming the index pattern image 50. Alternatively, small hole images such as 3 × 3, 4 × 4, or 5 × 5 can be calculated as a set. As for the method of measuring the optical characteristics of the lens LE using the index pattern image, a well-known technique (see Japanese Patent Application Laid-Open No. 2008-241694) can be referred to.

In this embodiment, the configuration in which the measurement index 40 is formed by the central hole 41 and the small hole 42 has been described as an example, but the present invention is not limited to this. For example, the measurement index can also be formed by a light-transmitting portion that transmits the light flux emitted from the light source and a light-shielding portion that blocks the light flux emitted from the light source. In this case, for example, the translucent portion and the light-shielding portion are arranged with respect to the index plate so that the translucent portion has a grid-like pattern. For example, the light-transmitting portion and the light-shielding portion can be formed by applying a coating or the like to the index plate.

FIG. 8 is an example diagram showing the configuration of the retroreflective member. For example, the retroreflective member 60 is a plate having a thickness of about 100 μm. For example, the retroreflective member 60 includes a fine glass sphere 61, a reflective film 62, a light transmitting cover 63, a substrate 64, and the like. For example, the incident light T1 incident on the retroreflective member 60 passes through the light transmitting cover 63, is refracted by the glass globules 61, and is focused at one point near the spherical surface of the glass globules 61. The incident light T1 is reflected by the reflective film 62 to become the reflected light T2. The reflected light T2 is refracted again by the glass globules 61, becomes substantially parallel to the incident light T1, and is reflected in the original direction. The configuration of the retroreflective member 60 is not limited to this embodiment. The retroreflective member in this embodiment may be any as long as it can reflect the light flux in substantially the same direction as the incident direction. That is, as the configuration of the retroreflective member, not only a glass sphere but also a micro-corner cube, a micro prism, or the like can be used.

For example, the retroreflective member 60 in this embodiment moves at high speed by a motor or the like (not shown). As a result, the uneven reflection caused by the uneven distribution of the glass globules and the reflective film in the retroreflective member can be made uniform. As for the movement of the retroreflective member 60, it is possible to apply a configuration in which the retroreflective member 60 moves in various ways. For example, the movement of the retroreflective member 60 may be a rotational movement, a linear movement, or an elliptical movement. Further, in this embodiment, the configuration in which the retroreflective member 60 is moved has been described as an example, but the retroreflective member 60 may not be moved.

FIG. 9 is a schematic configuration diagram of a control system in the lens meter 1. For example, the control unit 70 controls and controls the entire device of the lens meter 1. For example, a display 2, a READ switch 8, a non-volatile memory 71, and the like are connected to the control unit 70. Further, for example, the control unit 70 is connected to the light source 11 in the measurement optical system 10, the image sensor 16, the first image sensor 26 in the first image sensor 20, the second image sensor 36 in the second image sensor 30, and the like. Will be done.

For example, the control unit 70 includes a CPU (processor), RAM, ROM, and the like. For example, the CPU of the control unit performs various arithmetic processes (for example, arithmetic processing such as optical characteristics of a lens). For example, the RAM of the control unit 70 temporarily stores various types of information. For example, the ROM of the control unit 70 stores a program executed by the CPU, initial values, and the like. The control unit 70 may be composed of a plurality of control units (that is, a plurality of processors).

For example, the control unit 70 in this embodiment detects the position of the image 52 of each small hole by image processing the index pattern image 50 of the lens LE imaged by the image sensor 16, and calculates the optical characteristics of the lens. .. Further, for example, the control unit 70 in the present embodiment performs image processing on the lens images imaged by the first image sensor 26 and the second image sensor 36 to perform image processing on the hidden mark M (that is, the first hidden mark M) applied to the lens. The mark M1 and the second hidden mark M2) and the like are detected.
For example, the non-volatile memory 71 is a non-transient storage medium that can retain the stored contents even when the power supply is cut off. For example, as the non-volatile memory 71, a hard disk drive, a flash ROM, a USB memory, or the like can be used. For example, the non-volatile memory 71 stores the index pattern image 50 in the 0D reference state of the lens, the measurement result of the optical characteristics, and the like.

FIG. 10 is a diagram for explaining a state in which the stamping mechanism 9 is in the standby position. FIG. 10A is a view showing a state in which the stamp point member is in the standby position from the right side surface. FIG. 10B is a front view showing a state in which the stamp point member is in the standby position. For example, the stamp mechanism 9 includes an arm 80, a stamp support base 81, a lever 82, a relay member 83, a base 84, a stamp member 85, and the like. For example, the arm 80 moves in the vertical direction (Y direction) of the lens meter 1 by a slide mechanism (not shown). For example, one end of the arm 80 is attached to the stamp point support base 81. For example, the stamp point support base 81 includes a spring (not shown) inside. For example, the stamp point support base 81 is always urged in one rotation direction by the force of a spring (not shown). Therefore, the stamping mechanism 9 is always in the standby position. For example, the lever 82 is fixed to the stamp point support base 81. Further, for example, the relay member 83 is fixed to the stamp point support base 81. For example, the base 84 is fixed to the relay member 83. For example, the relay member 83 rotates integrally around the axis of the stamp point support base 81. For example, a stamp member 85 is attached to the base 84.

For example, the stamp point member 85 has an ink pen or an ink pen tip at the tip. Further, for example, the stamping member 85 has an ink bottle inside. For example, the stamp member 85 includes a first stamp member 85a, a second stamp member 85b, and a third stamp member 85c. For example, the first stamp member 85a and the second stamp member 85b are arranged linearly in the horizontal direction with the third stamp member 85c as the center. Further, for example, the third marking member 85c is vertical and downward by a predetermined distance (for example, 8 mm) from the center of the straight line connecting the first marking member 85a and the second marking member 85b (FIG. 10A). It is placed in the downward direction in the standby position of.

FIG. 11 is a diagram for explaining a state in which the stamp point mechanism 9 is at the stamp point position. FIG. 11A is a view showing a state in which the stamp point member is at the stamp point position from the right side surface. FIG. 11B is a front view showing a state in which the stamp point member is in the stamp point position. For example, when the stamping point member is in the stamping point position, the first stamping point axis S1 of the first stamping point member 85a intersects the center C2 of the first imaging region A2 in the first imaging optical system 20. 1 Mark point member 85a is arranged. Since the optical axis L2 passes through the center C2 of the first imaging region A2 (see FIG. 4), the first marking axis S1 coincides with the optical axis L2. As a result, a marking point can be applied to the position of one of the first hidden mark M1 and the second hidden mark M2 (for example, the first hidden mark M1) on the progressive lens LE.

Further, for example, when the stamping point member is in the stamping point position, the second stamping point axis S2 of the second stamping point member 85b intersects the center C3 of the second imaging region A3 in the second imaging optical system 30. , The second marking member 85b is arranged. Since the optical axis L3 passes through the center C3 of the second imaging region A3 (see FIG. 4), the second marking axis S2 coincides with the optical axis L3. Thereby, the marking point can be applied to the position of the other side (for example, the second hidden mark M2) of the first hidden mark M1 or the second hidden mark M2 on the progressive lens LE.

Further, for example, in a state where the stamp point member is at the stamp point position, the third mark is such that the third mark point axis S3 of the third mark point member 85c intersects the center C1 of the measurement region A1 in the measurement optical system 10. A point member 85c is arranged. Since the optical axis L1 passes through the center C1 of the measurement region A1 (see FIG. 4), the third marking axis S3 coincides with the optical axis L1. As a result, a marking point can be applied to the position of the distance dioptric power measurement point 100 on the progressive lens LE.

For example, in this embodiment, when the examiner tilts the lever 82 backward, the stamp point support base 81, the relay member 83, the base 84, the stamp point member 85, and the like rotate integrally, and the stamp point mechanism 9 From the standby position shown in FIG. 10 to the mark point position shown in FIG. At the stamp position, the pen tip of the first stamp member 85a faces downward and is arranged on the optical axis L2. Further, the pen tip of the second stamping member 85b faces downward and is arranged on the optical axis L3. Further, the pen tip of the third marking member 85c faces downward and is arranged on the optical axis L1. Further, from this state, when the examiner pushes the lever 82 downward, the arm 80, the marking point support base 81, the relay member 83, the base 84, the marking point member 85, etc. are integrally moved downward to mark. The pen tip of the point member comes into contact with the lens LE, and a marking point is applied. For example, the first stamping member 85a applies the first stamping point on the progressive lens LE. For example, the second marking member 85b applies the second marking on the progressive lens LE. For example, the third stamping member applies the third stamping point on the progressive lens LE.

In this embodiment, the stamp member 85 has a configuration in which the arrangement of the stamp members (first stamp member 85a, second stamp member 85b, third stamp member 85c) is fixed. It is used, but it is not limited to this. For example, the stamping mechanism 9 in this embodiment may include a moving mechanism for sliding the stamping member 85 in the front-rear direction (Z direction).

For example, in this embodiment, by sliding the first stamp member 85a and the second stamp member 85b, the third stamp point is in the center of the straight line connecting the first stamp member 85a and the second stamp member 85b. The member 85c can be arranged. That is, by sliding the first stamp member 85a and the second stamp member 85b, the first stamp member 85a, the second stamp member 85b, and the third stamp member 85c are moved in the horizontal direction. It can be arranged in a straight line.

For example, when the examiner does not slide the marking mechanism 9, the examiner tilts the lever 82 backward and further pushes down the lever 82 to obtain the first hidden mark M1 and the second hidden mark M1 of the progressive lens LE. Marking points can be applied to the hidden mark M2 and the distance dioptric power measuring point 100. Further, for example, when the examiner slides the marking mechanism 9, the examiner tilts the lever 82 backward and further pushes down the lever 82 to obtain the distance dioptric power measurement point 100 and its left and right horizontal. Marking points can be applied in the direction. For example, when the first marking member 85a and the second marking member 85b are slidably moved, the marking can be applied to the geometric center position (optical center position) of the single focus lens.

In this embodiment, the configuration in which the first stamping member 85a and the second stamping member 85b move among the stamping member 85 has been described as an example, but the present invention is not limited to this. For example, the movement of the stamp point member 85 may be configured such that the third stamp point member 85c slides in the front-rear direction. Further, by sliding the entire marking mechanism 9 in the front-rear direction, the first marking member 85a, the second marking member 85b, and the third marking member 85c all slide in the front-rear direction. You may. In this case, for example, the first marking member 85a, the second marking member 85b, and the third marking member 85c may be arranged in a straight line.

In this embodiment, a configuration in which only the first marking member 85a and the second marking member 85b are arranged in a straight line has been described as an example, but the present invention is not limited to this. For example, the first marking member 85a, the second marking member 85b, and the third marking member 85c may all be arranged in a straight line in advance. In this case, for example, if a slide configuration is provided in which the entire marking mechanism 9 moves in the front-rear direction, the hidden mark M of the progressive lens LE and the distance dioptric power measurement point 100 can be marked. It is possible, and the same effect as that of this embodiment can be obtained.

In this embodiment, the marking mechanism 9 is provided with three marking members, a first marking member 85a, a second marking member 85b, and a third marking member 85c, but the present invention is limited to this. Not done. For example, the stamping mechanism 9 may be provided with a fourth stamping member in advance. In such a case, for example, in addition to the first marking member, the second marking member, and the third marking member, the fourth marking member may be aligned with the geometric center position O of the progressive lens. Deploy. By operating the lever 82 in this state, the examiner marks the hidden mark M of the progressive lens LE and the distance dioptric power measurement point 100, and at the same time, also at the geometric center position O of the progressive lens LE. Marking points can be applied. Further, in the configuration in which the marking mechanism 9 is provided with the fourth marking member, the first marking point, the second marking point, and the fourth marking point applied by the fourth marking member are horizontal. Since the lenses are arranged linearly in the direction, the geometric center position (optical center position) of the single focus lens is provided by providing a mechanism for moving the first stamp member, the second stamp member, and the fourth stamp member. ) Can also be marked.

The operation of measuring the optical characteristics of the progressive lens LE will be described using the lens meter 1 having the above configuration. For example, the examiner places the progressive lens LE on the nosepiece 4. More specifically, the examiner refers to the print mark printed on the surface of the progressive lens so that the distance dioptric power measurement point 100 is on the front side and the near dioptric power measurement point 102 is on the back side. Is placed on the nose piece 4.

For example, the display 2 shows a measurement mode setting switch (not shown). The measurement mode setting switch (not shown) is for setting the measurement mode provided in the lens meter 1. For example, the measurement mode can be switched by operating a measurement mode setting switch (not shown). The measurement mode switching in this embodiment may be a configuration that is manually performed by the examiner or a configuration that is automatically switched. For example, the measurement mode may include a progressive lens measurement mode for measuring the optical characteristics of the progressive lens, a single focus lens measurement mode for measuring the optical characteristics of the single focus lens, and the like.

For example, the examiner operates a measurement mode setting switch (not shown) to select a progressive lens measurement mode. When the examiner selects the progressive lens measurement mode, the control unit 70 switches the lens meter setting to the progressive lens measurement mode. Further, when the control unit 70 is set to the progressive lens measurement mode, the control unit 70 displays a measurement screen for measuring the optical characteristics of the progressive lens LE on the screen of the display 2. Further, when the control unit 70 is set to the progressive lens measurement mode, the control unit 70 turns on the light source 11 in the measurement optical system 10.

For example, FIG. 12 is a diagram showing an example of a measurement screen of the progressive lens LE. For example, two cross marks K1 and K2 are displayed on the measurement screen 90 of the progressive lens. For example, the cross mark K1 electronically displays the center C2 of the imaging region A2 in the first imaging optical system 20 (the optical axis L2 of the first imaging optical system 20). For example, the cross mark K1 is used to align the first hidden mark M1 applied to the progressive lens LE with the optical axis L2. For example, the cross mark K2 electronically displays the center C3 of the imaging region A3 in the second imaging optical system 30 (optical axis L3 of the second imaging optical system 30). For example, the cross mark K2 is used to align the second hidden mark M2 applied to the progressive lens LE with the optical axis L3.

Further, for example, on the measurement screen 90 of the progressive lens, a part area of the progressive lens LE placed on the nose piece 4 is displayed. The partial region of the progressive lens LE is a region of the progressive lens LE located within the range of the first imaging region A2 imaged by the first image sensor 26 and a second imaging region imaged by the second image sensor 36. This is the region of the progressive lens LE located within the range of A3. Therefore, if the first hidden mark M1 applied to the progressive lens LE is within the range of the first imaging region A2, the first hidden mark M1 is displayed on the image of the progressive lens displayed on the measurement screen 90. Will be done. Further, if the second hidden mark M2 applied to the progressive lens LE is within the range of the second imaging region A3, the second hidden mark M2 is displayed on the image of the progressive lens displayed on the measurement screen 90. Will be done. For example, the control unit 70 performs image processing on the captured lens image and detects the hidden mark M from the lens image.

For example, the examiner moves the progressive lens LE on the nosepiece 4 so that the image of the first hidden mark M1 displayed on the measurement screen 90 coincides with the cross mark K1. Further, for example, the examiner moves the lens LE on the nose piece 4 so that the image of the second hidden mark M2 displayed on the measurement screen 90 coincides with the cross mark K2. When the image of the first hidden mark M1 and the image of the second hidden mark M2 coincide with the cross mark, the alignment of the progressive lens LE is completed.

For example, in this embodiment, when the alignment of the lens LE is completed, the distance dioptric power measurement point 100 of the progressive lens LE is located on the nose piece 4. Further, when the alignment of the lens LE is completed, the distance dioptric power measurement point 100 of the progressive lens LE is within the range of the measurement region A1 in the measurement optical system 10.

For example, the examiner can measure the optical characteristics of the distance dioptric power measuring point 100 in the progressive lens by pressing the READ switch 8 after aligning the image of the hidden mark with the position of the cross mark. When the READ switch 8 is operated by the examiner, the control unit 70 displays the measurement result of the optical characteristics on the screen of the display 2. Further, the control unit 70 stores the measurement result of the optical characteristics in the non-volatile memory 71. The measurement of the optical characteristics and the display of the measurement result on the display may be automatically performed by the control unit 70 determining whether or not the alignment of the progressive lens LE is completed.

In this way, the examiner can complete the alignment of the hidden mark M applied to the progressive lens LE and at the same time measure the optical characteristics at the distance dioptric power measurement point of the progressive lens. Further, by using the above-mentioned marking mechanism 9 in this state, marking points can be applied to the positions of the hidden mark position and the distance dioptric power measurement point of the progressive lens LE.

Next, an operation of measuring the optical characteristics of the single focus lens LE will be described using a lens meter having the above configuration. For example, the examiner places the single focus lens LE on the nosepiece 4 and operates a measurement mode setting switch (not shown) to select the single focus lens measurement mode. The control unit 70 switches the lens meter setting to the single focus lens measurement mode, and displays a measurement screen for measuring the optical characteristics of the single focus lens LE on the screen of the display 2. Further, the control unit 70 turns on the light source 11 in the measurement optical system 10 when the single focus lens measurement mode is set.

For example, on the measurement screen of the single focus lens LE, an index for aligning the geometric center position (optical center position) of the single focus lens is displayed. This index electronically displays the center C1 of the measurement region A1 in the measurement optical system 10 (the optical axis L1 of the measurement optical system 10). Further, the optical center position of the single focus lens is electronically displayed on the measurement screen of the single focus lens LE. The optical center position of the single focus lens is displayed based on the optical characteristics measured by the measurement optical system 10. Further, the optical center position of the single focus lens is changed by the control unit 70 as the lens moves. For example, the examiner moves the lens LE on the nosepiece 4 so that the optical center position of the single focus lens matches the index, and completes the alignment of the lens LE. Here, the examiner presses the READ switch 8 and measures the optical characteristics at the optical center position of the single focus lens. When the READ switch 8 is operated by the examiner, the control unit 70 displays the measurement result of the optical characteristics on the screen of the display 2. Further, the control unit 70 stores the measurement result of the optical characteristics in the non-volatile memory 71.

In this way, the examiner can complete the alignment of the optical center position in the single focus lens LE and measure the optical characteristics. Further, in this state, the examiner operates the slide mechanism provided in the above-mentioned marking mechanism 9 to change the marking member 85 from the triangular shape to the linear arrangement, thereby moving the marking point member 85 to the optical center position of the single focus lens. Marking points can be applied.

When measuring the optical characteristics of the single focus lens, the light beam from the light source 11 is shielded from light so as not to coincide with the optical axis L2 of the first imaging optical system 20 and the optical axis L3 of the second imaging optical system 30. It may be configured to provide a plate. For example, in this embodiment, even when measuring the optical characteristics of the single focus lens, a part of the single focus lens is imaged by the first imaging optical system 20 and the second imaging optical system 30. Since the first imaging optical system 20 and the second imaging optical system 30 are located outside the nose piece 4, they do not affect the measurement of optical characteristics by the measuring optical system 10, but by providing a light-shielding plate, a single focus lens is provided. It is possible to prevent the imaging of the image.

In this embodiment, the configuration in which the measurement optical system 10 is arranged in front of the first imaging optical system 20 and the second imaging optical system 30 by a predetermined distance has been described as an example. Not limited. The measurement optical system 10 may be arranged behind the first imaging optical system 20 and the second imaging optical system 30 by a predetermined distance. In this case, the examiner may place the progressive lens on the nose piece 4 so that the distance dioptric power measurement point 100 faces the back side and the near dioptric power measurement point 102 faces the front side. The imaging of the hidden mark and the measurement of the optical characteristics can be performed by the same operation as described above.

In this embodiment, the configuration in which the optical axis L1 of the measurement optical system 10 is arranged at the center position C of the distance dioptric power measurement point 100 has been described as an example, but the present invention is not limited to this. For example, the optical axis L1 of the measurement optical system 10 may be arranged at the distance eye point position.

As described above, for example, in the present embodiment, when the progressive lens is measured, the distance portion is arranged in the measurement area of the measurement optical system when the progressive lens is aligned with the hidden mark, so that the lens can be easily measured. It is possible to measure the distance portion of. Further, for example, when measuring a progressive lens, when the distance portion is aligned with the hidden mark, the distance portion can always be measured at the same position, so that the distance portion can be measured again with the same lens. Even in this case, it is possible to obtain the measurement result of the distance portion with good reproducibility.

Further, for example, in the present embodiment, the center position of the first imaging region in the first imaging optical system for imaging the hidden mark applied to the progressive lens and the center position of the second imaging region in the second imaging optical system are By being arranged symmetrically from the center position of the measurement region in the measurement optical system for measuring optical characteristics, it is formed at a fixed position on the left and right from the geometric center position of the progressive lens when measuring the progressive lens. Hidden marks can be easily aligned.

Further, for example, in the present embodiment, the distance in the horizontal direction from the center position of the measurement region in the measurement optical system to the center position of the first imaging region in the first imaging optical system is the distance measurement point of the progressive lens. By being substantially the same as the horizontal distance from to the hidden mark, the hidden mark can be easily aligned when measuring the progressive lens.

Further, for example, in the present embodiment, the distance in the horizontal direction from the center position of the measurement region in the measurement optical system to the center position of the second imaging region in the second imaging optical system is the distance measurement point of the progressive lens. By being substantially the same as the horizontal distance from to the hidden mark, the hidden mark can be easily aligned when measuring the progressive lens.

Further, for example, in the present embodiment, the measurement region in the measurement optical system is a straight line connecting the center position of the first imaging region in the first imaging optical system and the center position of the second imaging region in the second imaging optical system. When the hidden mark of the progressive lens is aligned by being positioned at a predetermined distance in the vertical direction on the perpendicular line passing through the center of the measurement optical system, the measurement area of the measurement optical system can be easily arranged in the distance portion of the progressive lens. Can be done.

Further, for example, the distance from the center of the straight line connecting the center position of the first imaging region and the center position of the second imaging region to the measurement region of the measurement optical system is geometrically determined from the distance measurement point of the progressive lens. By being substantially the same as the vertical distance to the center position, the measurement area of the measurement optical system can be easily arranged by the distance diopter measurement point of the progressive lens when the hidden mark of the progressive lens is aligned. ..

The technique in the present disclosure is not limited to the case where it is applied to the lens meter of the present embodiment. For example, a measurement optical system for measuring optical characteristics by a phase difference method can be applied to the measurement optical system of the lens meter in this embodiment. Further, for example, a measurement optical system for measuring optical characteristics over a wide range of the lens LE can be applied to the measurement optical system of the lens meter in this embodiment (for example, Japanese Patent Application Laid-Open No. 2002-534665). See publication).

1 Lens meter 2 Display (monitor)
9 Marking mechanism 10 Measuring optical system 11 Light source 15 Indicator plate 20 1st imaging optical system 30 2nd imaging optical system 40 Measuring index 70 Control unit 71 Non-volatile memory 85 Marking point member 100 Distance frequency measurement point 101 Distance eye point

Claims (5)

A lens measuring device that measures the optical characteristics of a lens using a measuring optical system for measuring the optical characteristics of the lens.
A first imaging optical system for imaging one of the hidden marks of the lens to which the first hidden mark and the second hidden mark are attached, and
A second imaging optical system for imaging a hidden mark different from the hidden mark imaged by the first imaging optical system,
With
The first imaging region on the lens of the first imaging optical system and the second imaging region on the lens of the second imaging optical system are different imaging regions.
The measuring optical system is a lens measuring apparatus comprising a measurement region on a lens by the measuring optical system in a central region between the first imaging region and the second imaging region. In the lens measuring device of claim 1,
The feature is that the first imaging center position in the first imaging region and the second imaging center position in the second imaging region are arranged symmetrically with respect to the measurement center position in the measurement region. Lens measuring device. In the lens measuring device of claim 2,
The horizontal distance from the measurement center position to the first imaging center position and the horizontal distance from the measurement area center position to the second imaging center position are from the distance point of the lens to the center position of the hidden mark. A lens measuring device characterized in that it is substantially the same as the distance in the horizontal direction of. In the lens measuring device according to any one of claims 1 to 3.
The first imaging optical system includes a first light source, a first reflecting member, and a first imaging element, and the surface side of a lens in which light emitted from the first light source is arranged at a predetermined position. The first hidden mark is imaged by irradiating light from the lens, reflecting the light passing through the lens by the first reflecting member, passing the light through the lens again, and receiving the light passing through the lens again by the first imaging element.
The second imaging optical system has a second light source, a second reflecting member, and a second imaging element, and the light emitted from the second light source is on the surface side of a lens arranged at a predetermined position. The second hidden mark is imaged by irradiating from the lens, reflecting the light passing through the lens by the second reflecting member, passing the light through the lens again, and receiving the light passing through the lens again by the second imaging element. A lens measuring device characterized by. In the lens measuring device according to any one of claims 1 to 4.
The measurement optical system is a measurement optical system for measuring the optical characteristics of a lens arranged on the nose piece, and the optical axis of the measurement optical system passes through the nose piece.
A spectacle lens measuring device characterized in that the first imaging region and the second imaging region are arranged outside the nose piece.