JP6736965B2 - Measuring probe unit - Google Patents

Description

The present invention relates to a measurement probe unit, and in particular, it can prevent a short circuit and a ground fault when the probe is brought into contact with an electrode, and can improve the work efficiency of measurement, and is applied to a wider range of electrode structures. To obtain a measurement probe unit.

When inspecting the electrical characteristics of electrical equipment, electrical equipment and the like, a probe is connected to a measuring instrument and the probe of the probe is brought into contact with the electrode or the like of the object to be measured to measure the voltage or the like. For example, the inspection of the power supply device of the automatic voltage regulator installed in a thermal power plant is performed by periodically measuring the output voltage of the power supply device.

FIG. 9 is an explanatory diagram for explaining the work of measuring the output voltage of the power supply device in the automatic voltage regulator. In the figure, the power supply device is protected by a housing (cover) 105, and contact with the (output terminal) electrodes 101 and 102 of the power supply device is opened in the housing 105 so as to face the electrodes 101 and 102. This is a structure performed through the opening 105a. In this case, the probes 21 and 22 are connected to the measuring instrument 100, and the probes of the probes 21 and 22 are brought into contact with the electrodes 101 and 102, respectively, and the output voltage is measured.

However, since the housing 105 of the power supply device is usually made of a metal member (having conductivity), when the probes of the probes 21 and 22 are brought into contact with the electrodes 101 and 102, respectively, the probe 21, The probe 22 may contact the edge of the opening 105a of the housing 105 to cause a short circuit or ground fault. In addition, when the distance between the electrodes 101 and 102 is short, a short circuit accident between the electrodes 101 and 102 may occur, which requires careful attention for the measurement work, resulting in poor work efficiency.

In order to deal with such a situation, Patent Document 1 proposes a technique for preventing a short circuit by covering substantially the entire area of the probe with a protective cover. Insert a spring seat into the spring, insert the spring into the probe that is the shaft, loosely penetrate the probe into the hole at the tip, and attach a protective cover to the spring seat so that the probe slightly protrudes. The structure of the protective cover is disclosed in which the protective cover compresses the spring and exposes the probe as much as necessary for the electrical measurement inspection.

Patent Document 2 proposes a measurement probe that includes a cover member that covers the tip and the outer periphery of the probe held by the grip, and the exterior member that constitutes the cover member has a position that covers the probe and a probe. A structure is disclosed that is slidable between a position where a needle is exposed and is biased by a spring to a position where the probe is covered.

JP-A-7-234247 JP, 2010-164386, A

However, in the technique of Patent Document 1 described above, a step is required between the position where the protective cover contacts the electrode of the measurement target or the periphery of the electrode, and the position where the probe contacts the electrode, which limits the application of the technique. However, there is a circumstance that the measurement is limited to, for example, an electrode in the hole on the receiving side of the outlet.

Also in the basic structure of Patent Document 2, a step is required between the position where the cover member contacts the electrode of the measurement object or the periphery of the electrode and the position where the probe contacts the electrode, which limits the application of the technique. There is. Further, when the cover member is made of an elastic member, the application restriction of the step structure of the electrode is solved, but it is necessary to strongly press the measurement probe against the electrode for reliable measurement.

Further, since the technique of Patent Document 1 and Patent Document 2 has a structure in which the probe is covered with the cover, the probe and the electrode are brought into contact at the time when the measurer contacts the electrode of the measurement target. It is difficult to visually confirm, and therefore, it is necessary to carefully position the tip portion (cover) of the measurement probe, and there is also a situation in which work efficiency cannot be improved.

Therefore, an object of the present invention is to prevent a short circuit and a ground fault when the probe is brought into contact with an electrode and improve the work efficiency of measurement, and to provide a more general-purpose measurement probe unit. To do.

In order to solve the above-mentioned problems, the invention of claim 1 includes two probes, each of which has a probe that comes into contact with an object to be measured, and a grip portion to which at least an outer peripheral surface is formed of an insulating member and to which the probe is attached. And a connector for holding the two measurement probes, which is formed of an insulating member in a substantially rectangular parallelepiped shape, the connector including a plurality of measurement objects. One or more locking mechanisms for locking the connector on the edge of the opening of the housing of the device or on the wall of the opening of the device in which the plurality of measurement objects are arranged; A large diameter hole formed so that the grip portion of the measurement probe can be inserted and removed from the surface on the measurement probe insertion side to the vicinity of the surface facing the surface, and the probe of the measurement probe on the measurement probe insertion side surface. A plurality of hole portions formed so as to be capable of projecting from a surface facing each other and having a small diameter hole portion communicating with the large diameter hole portion, the plurality of hole portions being arranged to face the plurality of measurement objects. Is characterized by.

According to a second aspect of the present invention, in the measurement probe unit according to the first aspect, the connector is fixed to the plurality of holes, one end of which is fixed to a bottom surface of the large diameter hole, and the probe of the measurement probe is inserted therethrough. It is characterized in that each of the springs is provided with a spring that is capable of being inserted and that the grip portion of the measurement probe cannot be inserted.

According to a third aspect of the present invention, in the measurement probe unit according to the first or second aspect, the connector includes a locking internal space formed inside the connector, and a locking internal space formed in the connector. A plate-shaped member having a convex first protrusion whose side surface is in contact with the inner surface of the housing, and a convex pressing portion arranged so as to be positioned outside the housing when the connector is locked. An elastic member for urging the plate-shaped member from the inside to the outside of the connector, and a pressing hole portion for inserting the pressing part so that the pressing part of the plate-shaped member protrudes to the outside of the connector when urged. A first locking hole portion that is inserted through the first protrusion so that the first protrusion of the plate-shaped member projects to the outside of the connector when biased.

According to a fourth aspect of the present invention, in the measurement probe unit according to the third aspect, the plate-shaped member of the locking mechanism has a convex second protrusion portion, one side surface of which is in contact with the outer side surface of the housing when biased. And the connector has a second locking hole portion that is inserted into the locking mechanism such that the second protruding portion of the plate-shaped member projects to the outside of the connector when biased. It is characterized by being provided.

According to a fifth aspect of the present invention, in the measurement probe unit according to the first or second aspect, the connector includes the locking mechanism, a locking internal space formed inside the connector, and an upper surface when biased. Is a convex protrusion that is in pressure contact with the wall surface of the opening of the device in which the plurality of measurement objects are arranged, and a convex protrusion that is positioned outside the housing when the connector is locked. A plate-shaped member having a pressing portion, an elastic member for urging the plate-shaped member from the inside to the outside of the connector, and the pressing portion so that the pressing portion of the plate-shaped member projects to the outside of the connector when urged. And a locking hole for inserting the projection so that the projection of the plate-shaped member projects to the outside of the connector when biased.

According to a sixth aspect of the present invention, in the measurement probe unit according to any one of the first to fifth aspects, the connector penetrates between a surface on the measurement probe insertion side and a surface facing the surface. A substantially rectangular parallelepiped sliding inner space, and a plurality of holder modules slidable in the sliding inner space in parallel with the alignment direction of the plurality of measurement objects, The holder module has a large-diameter hole portion formed so that the grip portion of the measurement probe can be inserted and removed from the surface on the measurement probe insertion side to the vicinity of the surface facing the surface, and the probe of the measurement probe, A plurality of small-diameter holes that are formed so as to project from the surface facing the measurement probe insertion side and that communicate with the large-diameter holes, and that are arranged facing the plurality of measurement objects. It is characterized by comprising a hole and a module fixing mechanism for fixing the holder module to the connector.

According to a seventh aspect of the present invention, in the measurement probe unit according to the sixth aspect, the two measurement probes include a second spring formed so that the grip portion can be inserted therethrough, and one end of the second spring. A spring fixing portion that is fixed to the grip portion, a pipe main body that is joined to the other end of the second spring and is slidable within a large-diameter hole formed in the connector or the holder module, and A tube-shaped movable member that has a tube end that cannot be inserted into the radial hole portion and that can insert the grip portion, and the connector or the holder module is on the surface on the measurement probe insertion side. Then, each of the plurality of holes is provided with a movable member fixing mechanism for fixing the other end of the tube of the movable member of the measurement probe to the connector or the holder module, at a position near the large diameter hole. To do.

According to an eighth aspect of the present invention, in the measurement probe unit according to any one of the first to seventh aspects, the auxiliary plate member is joined to the upper surface with one end of the auxiliary plate member, and the bottom surface is plural. A plurality of adapters each having a close contact fixing member that is in close contact with the device including one measurement target are provided, and the locking mechanism of the connector locks the connector to the other end of the auxiliary plate member of the adapter. It is characterized by doing.

According to a ninth aspect of the present invention, in the measurement probe unit according to the eighth aspect, the adapter has a leg portion whose length can be adjusted between one end portion of the auxiliary plate member and the close contact fixing member. Is characterized by.

According to the invention of claim 1, the direction and path for pushing the measurement probe by the large-diameter hole portion are substantially determined, and the small-diameter hole portion (hole portion) is arranged so as to face the object to be measured. The probe of the measurement probe can be surely brought into contact with the object to be measured by simply pushing. In addition, the movable range (movable angle) of the probe of the measurement probe protruding to the outside of the connector is limited to a narrow range, so it is possible to almost certainly prevent short circuits and ground faults when the probe contacts the measurement object. As a result, damage to the device can be prevented and the safety of the measurement operation can be ensured. Further, unlike the conventional case, it is not necessary to carefully position the measurement probe and visual confirmation is not necessary, so that the work efficiency of measurement can be improved.

According to the invention of claim 2, the measuring probe can be locked in the hole of the connector by the spring when the measuring probe is inserted in the hole of the connector. It is possible to reliably prevent a short circuit or a ground fault without exposing the probe of to the outside of the connector. As a result, it is possible to prevent damage to the device and to ensure the safety of the measurement operation.

According to the invention of claim 3, the locking mechanism for locking the connector to the edge portion of the opening of the housing is configured in the locking internal space inside the connector, and the convex first projection and the convex The plate-shaped member that has a pressing portion with a shape has a structure in which the elastic member urges the connector from the inside to the outside, so it is possible to attach and detach the connector with a simpler structure, and as a result, to attach and detach the connector. The operation becomes easier, and the measurement work efficiency can be improved.

According to the invention of claim 4, since the locking mechanism for locking the connector to the edge of the opening of the housing has the structure in which the plate-shaped member has the second projecting portion having the convex shape, The mechanism contacts the side surface of one of the housings to lock the connector, which enables more stable locking and fixing of the connector.

According to the invention of claim 5, the locking mechanism for locking the connector is formed in the locking internal space inside the connector on the wall surface of the opening of the device in which the measurement object is arranged. Since the plate-shaped member having the protrusion and the depressed portion having the convex shape is biased from the inside of the connector to the outside by the elastic member to press the wall surface of the opening of the device under pressure, the connector can be attached with a simpler structure. -Can be detached, and as a result, the attachment/detachment operation of the connector becomes easier and the work efficiency of measurement can be improved. In particular, even when the measurement target is placed on the bottom surface of the concave opening, the locking mechanism presses the wall surface of the device to lock the connector, so that the applicable range of the measurement probe unit can be further expanded. You can

According to the invention of claim 6, in the connector, the module structure in which one hole is one module is adopted, and the holder module can be slid and fixed by the module fixing mechanism. The probe of the measurement probe can be finely aligned, the probe can be more reliably brought into contact with the object to be measured, and as a result, it is possible to reliably prevent a short circuit or a ground fault.

According to the invention of claim 7, the measuring probe is provided with the movable member, and the movable member fixing mechanism is used to fix the other end of the tube of the movable member to the connector or the holder module. It is pressed against the object to be measured by the bias of the second spring or the spring and the second spring, and it is not necessary to press the measuring probe locked in the hole of the connector toward the object to be measured at the time of measurement. Therefore, after fixing the movable member to the connector or the holder module, no operation is required, so that the measurement work efficiency can be improved.

According to the invention of claim 8, since the connector is locked to the adapter having the auxiliary plate member and the contact fixing member, the outer peripheral shape of the connector does not match the opening of the housing or the opening of the device. In any case, since the connector can be attached, the applicable range of the measurement probe unit of the present invention can be further expanded.

According to the invention of claim 9, the structure is such that the adapter is provided with the leg portion whose length can be adjusted, so that the connector can be adjusted to an arbitrary height, and the electrode structure of various modes and the electrode periphery The measurement probe unit of the present invention can be applied to a case having the device structure of, and as a result, the applicable range of the measurement probe unit can be further expanded.

It is a perspective view of a measurement probe unit according to Embodiment 1 of the present invention. FIG. 5 is an explanatory diagram illustrating a cross-sectional structure of the measurement probe unit according to the first embodiment before measurement. FIG. 5 is an explanatory diagram illustrating a cross-sectional structure at the time of measurement of the measurement probe unit according to the first embodiment. FIG. 9 is an explanatory diagram illustrating a cross-sectional structure of the measurement probe unit according to the second embodiment at a pre-measurement stage. FIG. 7 is an explanatory diagram illustrating a cross-sectional structure at the time of measurement of the measurement probe unit according to the second embodiment. It is explanatory drawing explaining the structure of the measurement probe unit of Embodiment 3, FIG.6(a) is a front view, FIG.6(b) is a side view. It is explanatory drawing explaining the structure of the measurement probe unit of the modification 1, FIG.7(a) is a side view, FIG.7(b) is a front view. It is explanatory drawing explaining the structure of the measurement probe unit of other modifications, FIG.8(a) is a side view of the measurement probe unit of modification 2, FIG.8(b) is a side surface of the measurement probe unit of modification 3. FIG. It is a figure. It is explanatory drawing explaining the conventional work which measures the output voltage of the power supply device in an automatic voltage regulator.

Hereinafter, the present invention will be described based on the illustrated embodiments.

[Embodiment 1]
FIG. 1 is a perspective view of the measurement probe unit 10 according to the first embodiment of the present invention as seen from the side where the measurement probe 21.22 is inserted. 2 and 3 are explanatory views for explaining the cross-sectional structure of the measurement probe unit 10 according to the first embodiment as seen from the side surface direction. FIG. 2 shows a stage before measurement, and FIG. 3 shows a stage during measurement. Shown respectively. In addition, an example of a specific measurement mode by the measurement probe unit in the following embodiments is the inspection of the power supply device of the automatic voltage regulator installed in the thermal power plant, as in the conventional technique (FIG. 9). Yes, it is the measurement of the output voltage of the power supply device that is performed regularly.

The measurement probe unit 10 according to the first embodiment includes the probes 21c and 22c that come into contact with the electrodes 101 and 102 that are measurement objects, and a grip part to which at least the outer peripheral surface is formed of an insulating member and the probes 21c and 22c are attached. 21b and 22b and two lead wires 21a and 22a, and two measuring probes 21.22, and a connector formed of an insulating member in a substantially rectangular parallelepiped shape and holding the two measuring probes 21.22. 30 is provided. The two measuring probes 21.22 are connected to the measuring instrument 100 such as a multi-tester.

In addition, the connector 30 includes two locking mechanisms 35A and 35B that lock the connector 30 at the edge of the opening 105a of the housing 105 of the apparatus including the measurement target (electrodes 101 and 102). Two hole portions 31A and 31B for inserting and holding the book measurement probe 21.22 are provided. The insulating member forming the connector 30 is, for example, hardened plastic or the like.

The shape of the opening 105a of the housing 105 of the power supply device is a vertically long, substantially rectangular shape, and the cross-sectional shape of the connector 30 in the direction perpendicular to the side circumferential surface is also adapted to this. The locking mechanism 35A is arranged on the upper surface side of the side periphery of the connector 30, and the locking mechanism 35B is arranged on the bottom surface side.

The locking mechanism 35A will be described representatively. In the locking mechanism 35A, one side surface contacts the locking inner space 36A formed inside the connector 30, and one side surface contacts the inner side surface of the housing 105 when biased by the elastic member 38A. A plate-like member 37A having a substantially convex first protrusion 37Ab and a convex push-down portion 37Aa arranged so as to be located outside the housing 105 when the connector 30 is locked, and a plate-like member 37A. An elastic member 38A that urges the connector 30 from the inside to the outside, and a depression hole portion that inserts the depression portion 37Aa so that the depression portion 37Aa of the plate-shaped member 37A projects to the outside of the connector 30 when urged by the elastic member 38A. A first locking hole portion that is inserted through the first protrusion 37Ab so that the first protrusion 37Ab of the plate-shaped member 37A projects to the outside of the connector 30 when being biased by the elastic member 38A. Similarly, the locking mechanism 35B includes a locking internal space 37B, a plate-shaped member 37B having a first protrusion 37Bb and a pressing portion 37Ba, an elastic member 38B, a pressing hole portion, and a first locking hole portion. Prepare

The two holes 31A and 31B are arranged so as to face the measurement object (electrodes 101 and 102). Explaining the hole 31A as a representative, a large-diameter hole 31Aa formed so that the grip 21b of the measurement probe 21 can be inserted and removed from the surface 30a on the measurement probe insertion side to the vicinity of the surface 30b facing the surface, The probe 21c of the measuring probe 21 is formed so as to project from the surface 30b facing the surface 30a on the measuring probe insertion side, and has a small diameter hole portion 31Ab communicating with the large diameter hole portion 31Aa. Further, one end is fixed to the bottom surface of the large diameter hole portion large diameter hole portion 31Aa in the hole portion 31A so that the probe 21c of the measurement probe 21 can be inserted and the grip portion 21b of the measurement probe 21 cannot be inserted. A spring 32A and a receiving member 33A that is connected to the other end of the spring 32A, has a hole in the center for allowing the probe 21c of the measuring probe 21 to be inserted, and receives the end of the grip 21b of the measuring probe 21. I have it. Similarly, the hole portion 31B has a structure having a large diameter hole portion 31Ba and a small diameter hole portion 31Bb, and a spring 32B and a receiving member 33B are provided inside the hole portion 31B.

Next, attachment of the measurement probe unit 10 to the opening 105a of the housing 105 will be described. The measurement probe unit 10 is attached with the measurement probe 21.22 inserted into the holes 31A and 31B of the connector 30 (see FIG. 2; the measurement probe is shown in FIG. 2 for easy understanding of the internal structure). 22 is not shown). As shown in FIG. 2, in the state where the measurement probe 21.22 is simply inserted, the measurement probe 21.22 has the spring 32A. 32B and receiving member 33A. 33B, the probe 21c. 22c is located inside the holes 31A and 31B of the connector 30 without being exposed to the outside of the connector 30, and it is possible to reliably prevent a short circuit or a ground fault even during the operation of mounting the connector 30. is there.

The connector 30 is fitted into the opening 105a of the housing 105 by pushing down both the push-down portions 37Aa and 37Ba of the connector 30, and the push-down portions 37Aa and 37Ba are opened, whereby the elastic member 38A, The first protrusions 37Ab and 37Bb of the plate-shaped members 37A and 37B respectively project to the outside of the connector 30 by the bias of 38B, and the connector 30 is locked in the opening 105a of the housing 105.

As shown in FIG. 3, the measurement probe unit 10 measures the output voltage of the power supply device by pressing the two measurement probes 21.22 from the insertion side by the measurer to move the probe 21c of the measurement probe 21. The probe 22c of the measurement probe 22 is brought into contact with the electrode 101 and the electrode 102, respectively. Large diameter hole 31Aa. The direction and path for pushing the measurement probe 21.22 by 31Ba are substantially fixed, and the small diameter hole 31Ab. 31Bb is arranged so as to face the electrodes 101 and 102, the probe 21c. of the measurement probe 21.22 can be simply operated by pressing the measurement probe 21.22. 22c will surely contact the electrodes 101.102. That is, the probe 21c. It is possible to surely prevent a short circuit and a ground fault when the electrode 22c is brought into contact with the electrodes 101.102. As a result, it is possible to prevent damage to the device and to ensure the safety of the measurement operation. be able to. Further, unlike the conventional case, it is not necessary to carefully position the measurement probe and visual confirmation is not necessary, so that the work efficiency of measurement can be improved.

In the measurement probe unit 10 according to the first embodiment, the connector 30 is provided with the two locking mechanisms 35A and 35B, but the configuration may be provided with only one locking mechanism. As described above, since the cross-sectional shape of the connector 30 in the direction perpendicular to the side peripheral surface is a shape that matches the shape of the opening 105a of the housing 105 of the power supply device, only one locking mechanism is provided. Even with the modified configuration, the connector can be fixed to the casing 105 of the power supply device by the one locking mechanism, and the same effect as the above effect can be obtained.

Further, as described above, in the measurement probe unit 10 of the first embodiment, the springs 32A. 32B and receiving member 33A. 33B is the probe 21c. of the measurement probe 21.22 during the mounting operation of the connector 30. 22c is provided in the holes 31A and 31B so as to surely prevent a short circuit and a ground fault. 32B and receiving member 33A. 33B may be omitted. Even in the case of this modified configuration, the probe 21c. Since the movable range (movable angle) of 22c is limited, it is obvious that a short circuit/ground fault can be almost certainly prevented.

[Embodiment 2]
Next, the measurement probe unit 11 according to Embodiment 2 of the present invention will be described. 4 and 5 are explanatory views for explaining the sectional structure of the measurement probe unit 11 according to the second embodiment as seen from the side direction. FIG. 4 shows a stage before measurement, and FIG. 5 shows a stage during measurement. ..

The measurement probe unit 11 according to the second embodiment includes two measurement probes 23.24 and a connector 40 formed of an insulating member in a substantially rectangular parallelepiped shape and holding the two measurement probes 23.24. It has a different structure. The two measuring probes 23.24 are connected to the measuring instrument 100 such as a multi-tester as in the first embodiment.

Similar to the first embodiment, the measurement probe 23.24 is attached with the probes 23c and 24c that are in contact with the electrodes 101 and 102 that are the measurement objects, and the probes 23c and 24c whose outer peripheral surface is formed of an insulating member. The grip portions 23b and 24b and the lead wires 23a and 24a are provided, respectively. Furthermore, the measurement probe 23.24 has second springs 23g, 24g formed so that the grips 23b, 24b can be inserted therethrough, and springs for fixing one end of the second springs 23g, 24g to the grips 23b, 24b. Pipe main body portions 23e and 24e slidable inside the large diameter hole portion 41Aa formed in the connector 40 by joining the fixing portions 23d and 24d and the other ends of the second springs 23g and 24g, and the large diameter portions. The other end portions of the tubes 23f and 24f, which cannot be inserted into the holes, are provided, and the tubular movable members are provided so that the grip portions 23b and 24b can be inserted. In addition, each member of the movable member is formed of an insulating member.

Further, the connector 40 has two locking mechanisms 45A and 45B for locking the connector 40 and two measuring probes 23.24 inserted and held in the edge of the opening 105a of the housing 105. The individual hole portions 41A and 41B are provided. The insulating member forming the connector 40 is, for example, hardened plastic or the like.

Further, a locking mechanism 45A is arranged on the upper surface side of the connector 40, and a locking mechanism 45B is arranged on the bottom surface side. The structures of the locking mechanisms 45A and 45B are the same as those of the locking mechanisms 35A and 35B in the first embodiment.

Further, the two hole portions 41A and 41B are arranged so as to face the measurement object (electrodes 101 and 102). Like the holes 31A and 31B of the first embodiment, the holes 41A and 41B have a structure having large diameter holes 41Aa and 41Ba and small diameter holes 41Ab and 41Bb, and the holes 41A and 41B have springs inside them. 42A, 42B and receiving members 43A, 43B are provided.

Further, the connector 40 is provided on the surface 40a on the measurement probe insertion side at a position near the large diameter holes 41Aa, 41Ba of the two holes 41A, 41B, and at the other end of the movable member of the measurement probe 23.24. Movable member fixing mechanisms 46A and 47A, 46B and 47B for fixing 23f and 24f to the connector 40 are provided, respectively. The movable member fixing mechanism 46A will be described representatively. The movable member fixing mechanism 46A includes a rotating shaft 46Ac embodied by a screw, a key hand portion 46Aa rotatable about the rotating shaft 46Ac, and a protrusion for installing the rotating shaft. The side 46Ab is provided, and the key hand portion 46Aa can be rotated by loosening the screw of the rotary shaft 46Ac, and the rotation angle of the key hand portion 41Aa is fixed by tightening the screw of the rotary shaft 46Ac.

Next, attachment of the measurement probe unit 11 to the opening 105a of the housing 105 will be described. The measurement probe unit 11 is attached with the measurement probes 23.24 inserted into the holes 41A and 41B of the connector 40 (see FIG. 4; the measurement probe is shown in FIG. 4 for easy understanding of the internal structure). 24 is not shown). As shown in FIG. 4, in the state where the measurement probe 23.24 is simply inserted, the measurement probe 23.24 has the spring 42A. 42B and the receiving member 43A. 43B, the probe 23c. Since 24c is located inside the holes 41A and 41B of the connector 40 without being exposed to the outside of the connector 40, it is possible to reliably prevent a short circuit or a ground fault even during the operation of mounting the connector 40. is there.

By pushing down the connector 40 while pushing down the push-down portions of the locking mechanisms 45A and 45B of the connector 40, the connector 40 is fitted into the opening 105a of the housing 105, and the push-down portions are opened, respectively. The first protrusions of the plate-shaped member respectively project to the outside of the connector 40 by the bias, and the connector 40 is locked in the opening 105a of the housing 105.

Then, when the output voltage of the power supply device is measured by the measurement probe unit 11, as shown in FIG. 5, the measurer inserts the movable members of the two measurement probes 23.24 from the insertion side into the other end of the pipe. 23f, 24f are pushed in until they reach the surface of the connector 40, and the key hand portions 41Aa, 47Aa, 46Ba, 47Ba of the movable member fixing mechanisms 46A, 47A, 46B, 47B are rotated, and the concave key hand surface and the other end portion of the tube are rotated. By fixing the rotary shafts 46Ac, 47Ac, 46Bc, 47Bc in a state in which the convex portions of 23f, 24f are engaged, the other ends 23f, 24f of the movable members of the measurement probe 23.24 are fixed to the connector 40. To do. In this state, the probe 23c of the measuring probe 23 is pressed against the electrode 101 by the bias of the spring 42A and the second spring 23g, and the probe 24c of the measuring probe 24 is pressed by the spring 42B and the second spring 24g. It is pressed against the electrode 102 by the bias. Large diameter hole portion 41Aa. The direction and route for pushing the measurement probe 23.24 by the 41Ba are substantially fixed, and the small diameter hole portion 41Ab. Since 41Bb is arranged to face the electrodes 101 and 102, the probe of the measurement probe 21.22 can be simply operated by fixing the tube other end portions 23f and 24f of the movable member of the measurement probe 23.24 to the connector 40. 21c. 22c is surely pressed against the electrodes 101.102. That is, the probe 21c. It is possible to reliably prevent a short circuit and a ground fault when the electrode 22c is brought into contact with the electrodes 101.102, and no operation is required after fixing the movable member of the measuring probe 23.24 to the connector 40. Therefore, the work efficiency of measurement can be improved.

[Embodiment 3]
Next, a measurement probe unit according to Embodiment 3 of the present invention will be described. 6A and 6B are explanatory views for explaining the structure of the measurement probe unit according to the third embodiment. FIG. 6A is a front view and FIG. 6B is a side view. The measurement probe unit of the third embodiment differs from that of the first embodiment in that a second protrusion is added to the locking mechanism of the connector, and a module structure in which one hole in the connector is one module is adopted. That is the point. As the measurement probe, the same measurement probes 21 and 22 as in the first embodiment are used.

First, the locking mechanisms 55A and 55B of the connector 50 will be described. A locking mechanism 55A is arranged on the upper surface side of the side periphery of the connector 50, and a locking mechanism 55B is arranged on the bottom surface side.

The locking mechanism 55A will be representatively described. In the locking mechanism 55A, one side surface contacts the locking inner space 56A formed inside the connector 50, and one side surface contacts the inner side surface of the housing 105 when biased by the elastic member 58A. The first protrusion 57Ab having a substantially convex shape, the second protrusion 57Ac having a convex shape whose one side is in contact with the outer surface of the housing 105 when biased by the elastic member 58A, and the outside of the housing 105 when the connector 50 is locked. A plate-shaped member 57A having a convex pressing portion 57Aa arranged so as to be located at a position, an elastic member 58A for urging the plate-shaped member 57A from the inside of the connector 50 to the outside, and an urging by the elastic member 58A. The pressing portion 57Aa of the plate-shaped member 57A projects through the pressing portion 57Aa so that the pressing portion 57Aa protrudes to the outside of the connector 50, and the first protruding portion 57Ab of the plate-shaped member 57A when the elastic member 58A urges the pressing portion 57Aa. The first locking hole portion through which the first protrusion 57Ab is inserted so as to protrude to the outside, and the second protrusion 57Ac of the plate member 57A so as to protrude to the outside of the connector 50 when biased by the elastic member 58A. And a second locking hole portion through which the two protrusions 57Ac are inserted. Similarly, the locking mechanism 55B also includes the locking internal space 57B, the plate-shaped member 57B having the first protrusion 57Bb, the second protrusion 57Bc, and the pressing portion 57Ba, the elastic member 58B, the pressing hole portion, and the first pressing portion 57B. A locking hole portion and a second locking hole portion are provided.

As described above, the locking mechanism includes the first protrusions 57Ab and 57Bb whose one side is in contact with the inner surface of the housing 105 and the second protrusions 57Ac and 57Bc whose one side is in contact with the outer surface of the housing 105. By configuring 55A and 55B, it becomes possible for the locking mechanisms 55A and 55B to contact one of the side surfaces of the housing to lock the connector 50, and more stable locking becomes possible. For example, when the elastic coefficients of the springs 32A and 32B are small and the force of pushing the measurement probes 21 and 22 at the time of measurement is strong, the force transmitted to the connector 50 becomes large, and the connector is on the electrode side (left side in FIG. 6B). ), the connector 50 is locked by the joint between one side surface of the second protrusion 57Ac and the outer side surface of the housing 105.

Next, the connector 50 module structure will be described. The connector 50 has a substantially rectangular parallelepiped sliding internal space 50f penetrating between a surface 50a on the insertion side of the measurement probes 21 and 22 and a surface 50b facing the surface 50a, and a sliding internal space 50f. This is a configuration including two holder modules 60A and 60B that are slidable in parallel with the arrangement direction of the electrodes 101 and 102.

In addition, the holder modules 60A and 60B include hole portions 61A and 61B for inserting and holding the measurement probe 21.22, and module fixing mechanisms 62 to 69 (66 to 69 for fixing the holder modules 60A and 60B to the connector 60). Schematically shown).

The hole 61A will be described as a representative example. A large-diameter hole formed so that the grip portion 21b of the measurement probe 21 can be inserted and removed from the surface (50a) on the measurement probe insertion side to the vicinity of the surface (50b) facing the surface (50b). The portion 61Aa and the small diameter hole portion 61Ab which is formed so that the probe 21c of the measurement probe 21 can project from the surface (50b) facing the surface (50a) on the measurement probe insertion side and communicates with the large diameter hole portion 61Aa. It is a structure that has. Further, in the hole portion 61A, a spring and a receiving member are provided as in the first embodiment. Similarly, the hole portion 61B has a structure having a large diameter hole portion 61Ba and a small diameter hole portion 61Bb, and a spring and a receiving member are provided inside the hole portion 61B.

Further, regarding the module fixing mechanism 62, 63, 66, 67 (not shown) for sliding or fixing the holder module 60A, the module fixing mechanism 62 will be described as a representative. The long hole 62c formed on the side surface of the connector 50 is The holder module 60A becomes slidable by loosening the bolt screw 62a that penetrates and is coupled to the nut portion 62b embedded in the holder module 60A side, and the holder module 60A is fixed by tightening the bolt screw 62a. Will be done.

Similarly, regarding the module fixing mechanism 64, 65, 68, 69 (not shown) for sliding or fixing the holder module 60B, the module fixing mechanism 64 will be described as a representative. The long hole 64c formed in the side surface of the connector 50 will be described. The holder module 60B becomes slidable by loosening the bolt screw 64a that is connected to the nut portion 64b embedded on the holder module 60B side by passing through the holder module 60B, and by tightening the bolt screw 64a, the holder module 60B becomes It will be fixed.

As described above, in the connector 50, the module structure in which one hole is one module is adopted, the hole 61A for holding the measurement probe 21 is the holder module 60A, and the hole 61B for holding the measurement probe 22 is the holder. The holder module 60A, 60B can be slid and fixed by the module fixing mechanism, and further, the holder module 60A, 60B can be slid and fixed by the module fixing mechanism. Positioning becomes possible, and the probe 21c. 22c can be more surely brought into contact with the electrodes 101.102, and as a result, it is possible to reliably prevent a short circuit/ground fault.

Further, also in the second embodiment, similarly to the third embodiment, a module structure in which one hole and the movable member fixing mechanism are used as one module is adopted, and the hole and the movable member for holding the measurement probe 23. It is possible to configure the fixing mechanism with one holder module, the hole for holding the measurement probe 24 and the movable member fixing mechanism with another holder module, respectively, and further slide and fix each holder module by the module fixing mechanism. It may be configured. Even with the measurement probe unit having such a configuration, fine alignment of the probes 23c and 24c of the measurement probes 23 and 24 with respect to the electrodes 101 and 102 is possible, and the probes 23c. 24c can be more surely brought into contact with the electrodes 101.102, and as a result, it is possible to reliably prevent a short circuit/ground fault.

[Modification]
Next, a measurement probe unit according to a modification of the above embodiment will be described. 7A and 7B are explanatory views for explaining the structure of the measurement probe unit of the modified example 1, FIG. 7A is a side view, and FIG. 7B is a front view.

In this modification 1, a terminal block 104A is formed on one surface 111 of the device, and electrodes 101A and 102A are formed on the terminal block 104A. In addition, there is no case that protects the device, and there is no object that locks the connector. In such a case, the connector 50 is locked using the adapters 71 and 72 provided with the auxiliary plate members 71a and 72a, the leg portions 71c and 72c, and the close contact fixing members 71b and 72b.

The auxiliary plate-shaped members 71a, 72a are plate-shaped members having a plate thickness less than the distance between the first protrusions 57Ab, 57Bb and the second protrusions 57Ac, 57Bc of the locking mechanisms 55A, 55B of the connector 50. .. Further, in the configuration in which the connector 50 is locked by the locking mechanisms 55A and 55B arranged at two places like the structure of the modified example 1, in order to make fixation by locking more stable, It is desirable that the auxiliary plate members 71a and 72a have a planar shape as shown in FIG. By fitting the outer periphery of the connector 50 and the edges of the auxiliary plate-shaped members 71a and 72a over a longer distance, the stability of locking and fixing can be improved.

In addition, the leg portions 71c and 72c are rod-shaped members whose one end is joined to one end portion of the auxiliary plate-shaped members 71a and 72a and the other end is joined to the close contact fixing members 71b and 72b, and whose length is adjustable. is there. The lengths of the legs 71c and 72c may be adjusted by exchanging rod-shaped members having different lengths from each other, or the legs 71c and 72c may be provided with a known length adjusting mechanism. By making the lengths of the legs 71c and 72c adjustable, the measurement probe unit of the present invention can be applied to cases having various types of electrode structures and device structures around the electrodes, and the measurement probe unit can be applied. The scope of application of can be expanded.

Further, the close contact fixing members 71b and 72b are for fixing the adapters 71 and 72 on the device surface 111. For example, magnets, screws, or changes such as holes, protrusions, and recesses on the device surface 111 can be applied. It may be used to lock and fix with a key claw structure or a gripping mechanism.

Next, FIG. 8A is a side view of the measurement probe unit according to the second modification. In the second modification, a recess 112a is present on one surface 112 of the device, a terminal block 104B is formed on the bottom surface of the recess 112a, and electrodes 101B and 102B are formed on the terminal block 104B. Further, at least the distance from the surface on which the locking mechanism 55A of the connector 50 is arranged to the surface on which the locking mechanism 55B is arranged matches the distance in the electrode arrangement direction of the recess 112a, so that the connector 50 is placed in the recess 112a. It is a case that can be fitted.

In such a case, by pressing the connector 50 into the recess 112a while pressing down both the pressing portions 55Aa and 55Ba of the locking mechanisms 55A and 55B of the connector 50, the connector 50 is fitted into the recess 112a and the pressing portions 55Aa and 55Ba are respectively pressed. Even if they are opened, the upper surfaces of the first protrusions 57Ab, 57Bb and the second protrusions 57Ac, 57Bc of the plate-shaped members 57A, 57B are pressed against the side wall surfaces of the recess 112a by the bias of the elastic members 58A, 58B. The connector 50 is locked in the recess 112a.

Although not mentioned in the third embodiment, in the locking mechanisms 55A and 55B, the plate is formed on the upper surface of each of the first protrusions 57Ab and 57Bb and the second protrusions 57Ac and 57Bc of the plate members 57A and 57B. The shape is such that it has a surface parallel to the cylindrical member, and the force due to the biasing of the elastic members 58A and 58B is easily transmitted to the side wall surface of the recess 112a.

As described above, when the connector 50 can be fitted into the recess 112a of the device surface 112 where the electrodes 101B and 102B are formed, the first protrusions 57Ab and 57Bb and the first protrusions 57Ab and 57Bb of the locking mechanisms 55A and 55B and the first and second protrusions 57Ab and 57Bb. The connector 50 can be locked in the recess 112a by pressing the side surfaces of the recess 112a by the upper surfaces of the two protrusions 57Ac and 57Bc.

Next, FIG. 8B is a side view of the measurement probe unit of Modification 3. Similar to FIG. 8A, a recess 113a is present on one surface 113 of the device, a terminal block 104C is formed on the bottom surface of the recess 113a, and electrodes 101C and 102C are formed on the terminal block 104C. However, the distance from the surface of the connector 50 where the locking mechanism 55A is arranged to the surface where the locking mechanism 55B is arranged is considerably shorter than the distance of the recess 112a in the electrode arrangement direction, and the depth of the recess 113a is large. In this case, since the connector 50 is shallow, the connector 50 cannot be fitted into the recess 113a.

In such a case, the connector 50 can be locked using the adapters 73 and 74 provided with the auxiliary plate members 73a and 74a and the close contact fixing members 73b and 74b.

Although the embodiment and the modified example of the present invention have been described above, the specific configuration is not limited to the above-described embodiment and the modified example, and a design change or the like within a range not departing from the gist of the present invention is possible. Even if it is included in this invention. For example, in the above-described embodiments and modifications, the measurement of the output voltage of the power supply device has been described as an example, but the type of the measurement target device is not limited to this, and any device having electrical characteristics can be used. Any device may be used, and the type of electrical characteristics is not limited to voltage, and may be other electrical characteristics.

10, 11 Measuring probe unit 21.22, 23.24 Measuring probe 21a, 22a, 23a. 24a lead wires 21b, 22b, 23b. 24b Grips 21c, 22c, 23c. 24c probe 23d, 24d spring fixing part 23e, 24e pipe main body 23f, 24f pipe other end 23g, 24g second spring 30, 40, 50 connector 30a, 30b, 40a, 40b, 50a, 50b surface 31A, 31B , 41A, 41B, 61A, 61B Holes 31Aa, 31Ba, 41Aa, 41Ba, 61Aa, 61Ba Large diameter holes 31Ab, 31Bb, 41Ab, 41Bb, 61Ab, 61Bb Small diameter holes 32A, 32B, 42A, 42B Spring 33A, 33B , 43A, 43B Receiving member 35A, 35B, 45A, 45B, 55A, 55B Locking mechanism 36A, 36B, 56A, 56B Locking internal space 37A, 37B, 57A, 57B Plate-shaped member 37Aa, 37Ba, 57Aa, 57Ba Press down Part 37Ab, 37Bb, 57Ab, 57Bb First projection (projection)
57Ac, 57Bc Second protrusion (projection)
38A, 38B, 58A, 58B Elastic member 46A, 47A, 46B, 47B Movable member fixing mechanism 46Aa, 47Aa, 46Ba, 47Ba Key hand part 46Ab, 47Ab, 46Bb, 47Bb Protrusion side 46Ac, 47Ac, 46Bc, 47Bc Rotating shaft 50f Sliding Dynamic inner space 60A, 60B Holder module 62-69 Module fixing mechanism 62a-69a Bolt screw 62b-69b Nut part 62b-69b Long hole 71, 72, 73, 74 Adapter 71a, 72a, 73a, 74a Auxiliary plate member 71b, 72b, 73b, 74b Contact fixing member 71c, 72c Leg 100 Measuring instrument 101, 101A, 101B, 101C Electrode 102, 102A, 102B, 102C Electrode 104, 104A, 104B, 104C Terminal block 105 Housing (cover)
105a Openings 111, 112, 113 Surfaces 112a, 113a Recesses

Claims (9)

Two measuring probes each including a probe that comes into contact with an object to be measured, and a grip portion to which at least an outer peripheral surface is formed of an insulating member and to which the probe is attached,
A measuring probe unit having a connector that holds the two measuring probes, the connector being formed of an insulating member in a substantially rectangular parallelepiped shape.
The connector is
One that locks the connector on the edge of the opening of the housing of the device including a plurality of measurement objects or on the wall surface of the opening of the device in which the plurality of measurement objects are arranged The above locking mechanism,
A large-diameter hole portion formed so that the grip portion of the measurement probe can be inserted and removed from the surface on the measurement probe insertion side to the vicinity of the surface facing the surface, and the probe of the measurement probe on the measurement probe insertion side. A plurality of hole portions that are formed so as to project from a surface that faces the surface, have a small diameter hole portion that communicates with the large diameter hole portion, and that are arranged to face the plurality of measurement objects.
A measurement probe unit comprising: The connector, the plurality of holes, one end is fixed to the bottom surface of the large-diameter hole, a spring formed so that the probe of the measurement probe can be inserted and the grip of the measurement probe cannot be inserted, respectively. The measurement probe unit according to claim 1, wherein the measurement probe unit is provided. The connector, the locking mechanism,
An internal space for locking formed inside the connector,
A convex first protrusion whose one side is in contact with the inner surface of the casing when biased; and a convex push-down portion arranged so as to be located outside the casing when the connector is locked. A plate-shaped member,
An elastic member for urging the plate-shaped member from the inside to the outside of the connector,
A push-down hole portion through which the push-down portion of the plate-shaped member is inserted so that the push-down portion projects toward the outside of the connector when biased;
A first locking hole portion that is inserted through the first protrusion so that the first protrusion of the plate member projects to the outside of the connector when biased;
The measurement probe unit according to claim 1 or 2, further comprising: The plate-shaped member of the locking mechanism has a second projecting portion having a convex shape, one side of which is in contact with the outer surface of the housing when biased,
The connector includes, in the locking mechanism, a second locking hole portion through which the second projection of the plate-shaped member is inserted so as to project to the outside of the connector when biased. The measurement probe unit according to claim 3, wherein The connector, the locking mechanism,
An internal space for locking formed inside the connector,
A convex projecting portion whose upper surface is in pressure contact with the wall surface of the opening of the device in which the plurality of measurement objects are arranged when biased, and is arranged so as to be located outside the housing when the connector is locked. A plate-shaped member having a convex pressing portion,
An elastic member for urging the plate-shaped member from the inside to the outside of the connector,
A push-down hole portion through which the push-down portion of the plate-shaped member is inserted so as to project to the outside of the connector when biased
A locking hole portion through which the projection of the plate-shaped member is inserted so as to project to the outside of the connector when biased;
The measurement probe unit according to claim 1 or 2, further comprising: The connector is
A substantially rectangular parallelepiped sliding internal space that penetrates between the surface on the measurement probe insertion side and the surface facing the surface,
A plurality of holder modules that are slidable in the sliding internal space in parallel with the alignment direction of the plurality of measurement objects;
The holder module is
The grip portion of the measurement probe, the large-diameter hole portion formed so as to be removable from the surface on the measurement probe insertion side to the vicinity of the surface facing the surface, and the probe of the measurement probe, the measurement probe insertion A plurality of hole portions that are formed so as to project from the surface facing the side surface, have a small diameter hole portion that communicates with the large diameter hole portion, and that are arranged to face the plurality of measurement objects.
A module fixing mechanism for fixing the holder module to the connector,
The measurement probe unit according to any one of claims 1 to 5, further comprising: The two measuring probes are
A second spring formed so that the grip portion can be inserted therethrough;
A spring fixing portion that fixes one end of the second spring to the grip portion;
A pipe main body which is joined to the other end of the second spring and is slidable in a large diameter hole formed in the connector or the holder module, and the other end of the pipe which cannot be inserted into the large diameter hole. And, each having a movable member formed in a tubular shape through which the grip portion can be inserted,
In the connector or the holder module, the other end of the tube of the movable member of the measurement probe is attached to the connector or the holder at a position near the large diameter hole of the plurality of holes on the surface on the measurement probe insertion side. A movable member fixing mechanism for fixing to the module,
The measurement probe unit according to claim 6, wherein the measurement probe units are provided respectively. A plurality of adapters each having an auxiliary plate-shaped member, a top surface of which is joined to one end of the auxiliary plate-shaped member, and a bottom surface of which is closely attached to a device that is provided with a plurality of measurement objects;
The measurement probe unit according to any one of claims 1 to 7, wherein the locking mechanism of the connector locks the connector to the other end of the auxiliary plate member of the adapter. 9. The measurement probe unit according to claim 8, wherein the adapter has a leg portion whose length can be adjusted between one end portion of the auxiliary plate member and the close contact fixing member.

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