JP6717201B2 - 検出方法および検出装置 - Google Patents

検出方法および検出装置 Download PDF

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Publication number
JP6717201B2
JP6717201B2 JP2016564806A JP2016564806A JP6717201B2 JP 6717201 B2 JP6717201 B2 JP 6717201B2 JP 2016564806 A JP2016564806 A JP 2016564806A JP 2016564806 A JP2016564806 A JP 2016564806A JP 6717201 B2 JP6717201 B2 JP 6717201B2
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metal film
light
substance
detected
temperature
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Expired - Fee Related
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JP2016564806A
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Japanese (ja)
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JPWO2016098653A1 (ja
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貴紀 村山
貴紀 村山
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Konica Minolta Inc
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Konica Minolta Inc
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence

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  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2016564806A 2014-12-15 2015-12-09 検出方法および検出装置 Expired - Fee Related JP6717201B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2014253407 2014-12-15
JP2014253407 2014-12-15
PCT/JP2015/084492 WO2016098653A1 (fr) 2014-12-15 2015-12-09 Procédé de détection et dispositif de détection

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JPWO2016098653A1 JPWO2016098653A1 (ja) 2017-09-21
JP6717201B2 true JP6717201B2 (ja) 2020-07-01

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JP (1) JP6717201B2 (fr)
WO (1) WO2016098653A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019082637A1 (fr) * 2017-10-25 2019-05-02 株式会社堀場製作所 Appareil d'analyse de résonance de plasmon de surface, et procédé d'analyse de résonance de plasmon de surface

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0517930B1 (fr) * 1991-06-08 1995-05-24 Hewlett-Packard GmbH Procédé et appareil pour détecter la présence et/ou la concentration de biomolécules
JPH09257699A (ja) * 1996-03-19 1997-10-03 Toto Ltd 表面プラズモン共鳴センサ装置
JP2003065947A (ja) * 2001-08-29 2003-03-05 Matsushita Electric Ind Co Ltd 屈折率測定装置、屈折率測定方法、および定性定量分析装置
JP3910498B2 (ja) * 2002-07-08 2007-04-25 富士フイルム株式会社 測定装置
US20050186565A1 (en) * 2003-02-10 2005-08-25 American Environmental Systems, Inc. Method and spectral/imaging device for optochemical sensing with plasmon-modified polarization
US20060194346A1 (en) * 2004-02-18 2006-08-31 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. Surface plasmon-field-enhanced diffraction sensor
JP2010038624A (ja) * 2008-08-01 2010-02-18 Fujifilm Corp 検出方法及び検出装置
JP5640873B2 (ja) * 2011-04-07 2014-12-17 コニカミノルタ株式会社 表面プラズモン励起蛍光計測装置及び表面プラズモン励起蛍光計測方法
JP2012225778A (ja) * 2011-04-20 2012-11-15 Konica Minolta Holdings Inc 検査チップ及び計測装置
JP5363631B2 (ja) * 2011-09-28 2013-12-11 富士フイルム株式会社 蛍光粒子を用いた検出対象物質の検出方法

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JPWO2016098653A1 (ja) 2017-09-21
WO2016098653A1 (fr) 2016-06-23

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