JP6554881B2 - Semiconductor device and storage medium control method - Google Patents

Description

  The present invention relates to a semiconductor device and a storage medium control method.

  An information processing apparatus such as a computer uses a storage medium having a plurality of sectors such as a flash memory and a hard disk as an external storage device. The first sector of the storage medium is called a master boot record (hereinafter also referred to as MBR (Master Boot Record)), and is first accessed when the storage medium is activated.

  For example, a computer to which a hard disk is connected as a startup disk starts up an operating system (OS) based on information stored in the MBR of the hard disk when the power is turned on. Therefore, when information stored in the MBR of the hard disk is destroyed, it is difficult for the computer to start the OS.

  For this reason, a computer that restores information stored in the MBR when the information read from the MBR is not normal has been proposed (for example, see Patent Document 1). This type of computer copies information stored in the MBR to an area different from the MBR of the hard disk (hereinafter also referred to as backup MBR). For example, when the information stored in the MBR is destroyed, the computer copies the information stored in the backup MBR to the MBR and starts the OS based on the information copied to the MBR. In this way, the computer repairs the MBR of the hard disk used as the boot disk when the OS is booted. Then, when the power is turned off, the computer copies the information held in the MBR when the power is turned off to the backup MBR.

  In order to safely start the OS, there has been proposed a method of starting the OS after confirming the safety of data used for the OS startup process (see, for example, Patent Documents 2-4). In this type of method, a hash value of data used for the OS activation process is calculated, and the safety of the data is confirmed using the calculated hash value.

  In the flash memory from which data is erased in a predetermined block unit, boot data including information necessary for accessing the flash memory is stored in, for example, the first block. Hereinafter, a block in which boot data is stored is also referred to as a boot block. For example, when starting the flash memory, the control device that controls the flash memory first reads the boot data stored in the boot block of the flash memory. Thereafter, the control device that controls the flash memory executes access to the flash memory based on the boot data read from the boot block.

  Therefore, when the boot data stored in the boot block of the flash memory is destroyed, normal access to the flash memory may not be executed. For this reason, an external storage device including a flash memory that stores two boot data in a boot block has been proposed (see, for example, Patent Document 5). This type of external storage device refers to two boot blocks when the external storage device is activated.

JP 2012-243199 A JP 2006-323814 A JP 2007-102791 A JP 2009-521760 A JP-A-11-110141

  In a storage medium that stores information stored in the MBR in an area different from the MBR, information stored in an area other than the MBR (a backup of information stored in the MBR), information stored in the MBR, and Both may be destroyed at the same time. In this case, the MBR of the storage medium may not be repaired normally. For this reason, the reliability of a storage medium falls.

  In one aspect, the semiconductor device and the storage medium control method disclosed herein are intended to improve the reliability of the storage medium.

According to one aspect, the semiconductor device receives boot information stored in a boot area referred to when starting the storage medium and identification information for identifying the storage medium from the first storage medium that is the storage medium to be accessed. When the access unit to be read and the first boot information read from the first storage medium are normal, read from the first storage medium to the storage unit storing the boot information and the identification information of each of the plurality of storage media. A backup unit that stores the first boot information that is associated with the first identification information of the first storage medium, the first boot information read from the first storage medium is not normal, and the first storage medium When the first identification information is stored in the storage unit, the second boot information corresponding to the first identification information of the first storage medium is read from the storage unit and stored in the boot area of the first storage medium. boot Possess a restoration unit for repair using the second boot information read the broadcast from the storage unit, if the first boot information read from the first storage medium is normal, backup unit, a first storage medium A first hash value is calculated using the first boot information read from the first boot information, the first boot information read from the first storage medium is associated with the first identification information of the first storage medium, and the storage unit , The second boot information corresponding to the first identification information of the first storage medium is read from the storage unit, a second hash value is calculated using the second boot information read from the storage unit, Is equal to the second hash value, the second hash value is stored in the storage unit in association with the first identification information of the first storage medium.

According to another aspect, in the storage medium control method, the boot information stored in the boot area referred to when the storage medium is started and the identification information for identifying the storage medium are the storage medium to be accessed. When the first boot information read from the first storage medium is normal and the first boot information read from the first storage medium is normal, the first boot information read from the first storage medium is stored in the storage unit storing the boot information and the identification information of each of the plurality of storage media. The issued first boot information is stored in association with the first identification information of the first storage medium, the first boot information read from the first storage medium is not normal, and the first boot information of the first storage medium When one identification information is stored in the storage unit, the second boot information corresponding to the first identification information of the first storage medium is read from the storage unit, and the first boot information stored in the boot area of the first storage medium Read from the memory Repair using the second boot information issued, when the first boot information read from the first storage medium is normal, first using the first boot information read from the first storage medium After calculating the hash value and storing the first boot information read from the first storage medium in the storage unit in association with the first identification information of the first storage medium, the first boot information is stored in the first identification information of the first storage medium. When the corresponding second boot information is read from the storage unit, the second hash value is calculated using the second boot information read from the storage unit, and the first hash value is equal to the second hash value, the second Are stored in the storage unit in association with the first identification information of the first storage medium.

  The semiconductor device and the storage medium control method disclosed herein can improve the reliability of the storage medium.

It is a figure which shows one Embodiment of the control method of a semiconductor device and a storage medium. It is a figure which shows another embodiment of the control method of a semiconductor device and a storage medium. It is a figure which shows an example of the memory | storage part shown in FIG. FIG. 3 is a diagram illustrating an example of operation of the semiconductor device illustrated in FIG. 2. FIG. 5 is a diagram illustrating an example of a backup process illustrated in FIG. 4. It is a figure which shows an example of the repair process shown in FIG. FIG. 3 is a diagram illustrating another example of the operation of the semiconductor device illustrated in FIG. 2. It is a figure which shows another embodiment of the control method of a semiconductor device and a storage medium. FIG. 3 is a diagram illustrating an example of a hardware configuration of the semiconductor device illustrated in FIG. 2.

  Hereinafter, embodiments will be described with reference to the drawings.

  FIG. 1 shows an embodiment of a method for controlling a semiconductor device and a storage medium. The dashed arrows in FIG. 1 indicate the flow of information such as signals. The semiconductor device 10 shown in FIG. 1 may be realized only by hardware, or may be realized by controlling hardware by software such as a storage medium control program.

  The semiconductor device 10 is connected to a storage medium 30 such as a USB (Universal Serial Bus) memory, an SD memory card, and a hard disk, and a storage unit 20 such as a nonvolatile memory. For example, the semiconductor device 10 is mounted on an information processing apparatus such as a computer and a portable device to which the storage medium 30 is detachably connected.

  The storage medium 30 includes a master boot record (hereinafter also referred to as MBR) 32 that is first accessed by the semiconductor device 10 when the storage medium 30 is started up, and data that can be accessed after the storage device 30 is recognized by the semiconductor device 10. Region 34. The MBR 32 is a head sector of a plurality of sectors, and is an example of a boot area that is referred to when the storage medium 30 is activated. For example, boot information BINF 1 including a partition table and the like that is referred to when the storage medium 30 is started is stored in the MBR 32 that is the first sector of the storage medium 30. The partition table has information regarding each partition when the data area 34 of the storage medium 30 is divided into a plurality of areas (partitions). The storage medium 30 may use the data area 34 as one partition. Further, for example, identification information IDINF such as a serial number for identifying the storage medium 30 is stored in an area determined by the standard of the storage medium 30.

  When the storage medium 30 is connected, the semiconductor device 10 first accesses the MBR 32 of the storage medium 30 and reads the boot information BINF1 stored in the MBR 32. Then, when the boot information BINF1 read from the MBR 32 is normal, the semiconductor device 10 accesses the data area 34 of the storage medium 30 based on the boot information BINF1. When the boot information BINF1 read from the MBR 32 is not normal, the semiconductor device 10 restores the boot information BINF1 stored in the MBR 32 of the storage medium 30 using the boot information BINF2 stored in the storage unit 20. For example, if the storage medium 30 cannot be recognized using the boot information BINF1 read from the MBR 32, the semiconductor device 10 determines that the boot information BINF1 is not normal. The repair of the MBR 32 by the semiconductor device 10 is executed based on, for example, a storage medium control method.

  The semiconductor device 10 includes an access unit 12, a backup unit 14, and a repair unit 16. When the access target storage medium 30 is connected to the semiconductor device 10, the access unit 12 receives the boot information BINF 1 stored in the MBR 32 of the storage medium 30 and the identification information IDINF for identifying the storage medium 30. Read from. Then, the access unit 12 transfers the boot information BINF1 and the identification information IDINF read from the storage medium 30 to the backup unit 14 and the restoration unit 16.

  When the boot information BINF1 received from the access unit 12 is normal, the backup unit 14 sets the boot information BINF1 received from the access unit 12 as the boot information BINF2, and associates the boot information BINF2 and the identification information IDINF with each other. 20. That is, when the boot information BINF1 read from the storage medium 30 is normal, the backup unit 14 associates the boot information BINF1 read from the storage medium 30 with the identification information IDINF of the storage medium 30 as the boot information BINF2. And stored in the storage unit 20. For example, when a plurality of different storage media 30 are connected to the semiconductor device 10 at the same time or at different times, the storage unit 20 stores the boot information BINF2 and the identification information IDINF of the plurality of storage media 30.

  The restoration unit 16 corresponds to the identification information IDINF of the storage medium 30 when the boot information BINF1 read from the storage medium 30 is not normal and the identification information IDINF of the storage medium 30 is stored in the storage unit 20. Boot information BINF2 to be read from the storage unit 20. Then, the repair unit 16 repairs the boot information BINF1 stored in the MBR 32 of the storage medium 30 using the boot information BINF2 read from the storage unit 20.

  For example, when the boot information BINF1 received from the access unit 12 is not normal, the restoration unit 16 determines whether or not the identification information IDINF received from the access unit 12 is stored in the storage unit 20. When the identification information IDINF received from the access unit 12 is stored in the storage unit 20, the restoration unit 16 reads the boot information BINF 2 corresponding to the identification information IDINF received from the access unit 12 from the storage unit 20. Then, the restoration unit 16 stores the boot information BINF2 read from the storage unit 20 as the boot information BINF1 in the MBR 32 of the storage medium 30 via the access unit 12. Thereby, the boot information BINF1 stored in the MBR 32 of the storage medium 30 is restored.

  As described above, since the boot information BINF2 of the plurality of storage media 30 is stored in the storage unit 20 in association with the identification information IDINF, the semiconductor device 10 can store the MBR 32 even when the plurality of storage media 30 are used. Boot information BINF2 used for restoration can be selected. Therefore, the semiconductor device 10 can repair the MBR 32 of the storage medium 30 in which the boot information BINF1 stored in the MBR 32 is destroyed even when a plurality of storage media 30 are used.

  The configuration of the semiconductor device 10 is not limited to the example illustrated in FIG. For example, the storage unit 20 may be included in the semiconductor device 10. The storage unit 20 may be a removable disk such as a USB memory. Alternatively, when power is always supplied to the storage unit 20, the storage unit 20 may be a volatile memory.

  As described above, in the embodiment shown in FIG. 1, the reliability of the storage medium 30 can be improved. For example, boot information BINF2 that is a backup of the boot information BINF1 is stored in a storage unit 20 that is different from the storage medium 30. Thereby, it is possible to suppress the simultaneous destruction of the boot information BINF1 stored in the MBR 32 of the storage medium 30 and the boot information BINF2 that is a backup of the boot information BINF1.

  Here, in the conventional method of storing the boot information BINF2 and the boot information BINF1 which are backups of the boot information BINF1 in the same storage medium, the boot information BINF1 and the boot information BINF2 stored in the MBR of the storage medium are destroyed at the same time. There is a fear. For example, even when the storage medium is not connected to the semiconductor device, the boot information BINF2 (boot information BINF1) stored in a different area from the MBR of the storage medium due to the factor that destroyed the boot information BINF1 stored in the MBR of the storage medium. Backup) may also be destroyed.

  In contrast, in the embodiment shown in FIG. 1, when the storage medium 30 is not connected to the semiconductor device 10, the storage medium 30 is not connected to the storage unit 20. For this reason, when the storage medium 30 is not connected to the semiconductor device 10, the factor that destroyed the boot information BINF 1 stored in the MBR 32 of the storage medium 30 does not affect the storage unit 20 that stores the boot information BINF 2. Therefore, in the embodiment shown in FIG. 1, it is possible to prevent the boot information BINF1 and the boot information BINF2 (backup of the boot information BINF1) stored in the MBR 32 of the storage medium 30 from being destroyed at the same time. Thereby, in the embodiment shown in FIG. 1, it is possible to prevent the MBR 32 of the storage medium 30 from being repaired, and to prevent the data area 34 of the storage medium 30 from being accessed. As a result, the reliability of the storage medium 30 can be improved.

  In the method of storing the boot information BINF2 in the storage unit 20 without using the identification information IDINF, when a plurality of storage media 30 are connected to the semiconductor device 10, the MBR2 of the storage media 30 is the wrong boot information BINF2. May be repaired.

  On the other hand, in the embodiment shown in FIG. 1, the boot information BINF2 is stored in the storage unit 20 in association with the identification information IDINF. Therefore, even when a plurality of storage media 30 are connected to the semiconductor device 10, MBR32 can be repaired. For example, when a plurality of different storage media 30 are connected to the semiconductor device 10 at the same time or at different times, the backup unit 14 uses the boot information BINF2 of the plurality of storage media 30 as the identification information IDINF of the plurality of storage media 30. And stored in the storage unit 20. Further, the restoration unit 16 selects and reads the boot information BINF2 corresponding to the identification information IDINF of the storage medium 30 to be restored from among the plurality of boot information BINF2 stored in the storage unit 20. Then, the restoration unit 16 stores the boot information BINF2 read from the storage unit 20 as the boot information BINF1 in the MBR 32 of the storage medium 30 via the access unit 12. As described above, in the embodiment illustrated in FIG. 1, the MBR 32 of the storage medium 30 in which the boot information BINF1 stored in the MBR 32 is destroyed among the plurality of storage media 30 connected to the semiconductor device 10 can be restored.

  FIG. 2 shows another embodiment of a method for controlling a semiconductor device and a storage medium. The same or similar elements as those described in FIG. 1 are denoted by the same or similar reference numerals, and detailed description thereof will be omitted. The dashed arrows in FIG. 2 indicate the flow of information such as signals. The semiconductor device 100 shown in FIG. 2 may be realized only by hardware, or may be realized by controlling hardware by software such as a control program for a storage medium. The semiconductor device 100 is connected to a storage medium 300 such as a USB memory, an SD memory card, or a hard disk. For example, the semiconductor device 100 is mounted on an information processing apparatus such as a computer and a portable device to which the storage medium 300 is detachably connected.

  The storage medium 300 has an MBR 320 and a data area 340. The storage medium 300, MBR 320, and data area 340 are the same as or similar to the storage medium 30, MBR 32, and data area 34 shown in FIG. For example, the MBR 320 is the first sector of a plurality of sectors, and is an example of a boot area that is referred to when the storage medium 300 is activated. Therefore, the boot information BINF1 including the partition table and the like that is referred to when the storage medium 300 is started is stored in the MBR 320 that is the first sector of the storage medium 300. Further, for example, identification information IDINF such as a serial number for identifying the storage medium 300 is stored in an area determined by the standard of the storage medium 300 or the like.

  The semiconductor device 100 includes a plurality of interface units 120 (120A, 120B, 120C), a control unit 110 that controls the operation of the semiconductor device 100, and a storage unit 200 such as a nonvolatile memory. The semiconductor device 100 may be defined excluding the storage unit 200.

  When the boot information BINF1 read from the MBR 320 of the storage medium 300 is normal, the semiconductor device 100 accesses the data area 340 of the storage medium 300 based on the boot information BINF1. Further, when the boot information BINF1 read from the MBR 320 of the storage medium 300 is not normal, the semiconductor device 100 uses the boot information BINF1 stored in the MBR 320 of the storage medium 300 using the boot information BINF2 stored in the storage unit 200. to repair. The repair of the MBR 320 by the semiconductor device 100 is executed based on, for example, a storage medium control method.

  The interface unit 120 is an interface of a storage medium 300 such as a USB memory, an SD memory card, or a hard disk, and is connected to the storage medium 300 used in the semiconductor device 100. The plurality of interface units 120 may be interfaces of the same type of storage medium 300 (for example, a USB memory) or may be interfaces of different types of storage media 300 (for example, a USB memory and an SD memory card).

  For example, the interface unit 120 to which the storage medium 300 is connected outputs information such as control signals and data supplied from the control unit 110 to the storage medium 300, and information such as control signals and data supplied from the storage medium 300. Is output to the control unit 110.

  The control unit 110 includes an access control unit 122, a backup unit 140, and a restoration unit 160. When the access target storage medium 300 is connected to the interface unit 120, the access control unit 122 reads the boot information BINF 1 and the identification information IDINF stored in the MBR 320 from the storage medium 300 via the interface unit 120. Then, the access control unit 122 transfers the boot information BINF1 and the identification information IDINF read from the storage medium 300 to the backup unit 140 and the restoration unit 160.

  That is, the interface unit 120 and the access control unit 122 are examples of an access unit that reads the boot information BINF1 stored in the MBR 320 of the storage medium 300 and the identification information IDINF that identifies the storage medium 300 from the access target storage medium 300. It is.

  The backup unit 140 is the backup unit shown in FIG. 1 except that the hash value HASH2 of the boot information BINF2 (hereinafter also referred to as the second hash value HASH2) is stored in the storage unit 200 in association with the identification information IDINF. 14 or the same.

  For example, when the boot information BINF1 received from the access control unit 122 is normal, the backup unit 140 calculates the first hash value using the boot information BINF1 received from the access control unit 122.

  Further, the backup unit 140 stores the boot information BINF1 received from the access control unit 122 in the storage unit 200 as boot information BINF2 in association with the identification information IDINF of the storage medium 300. Thereafter, the backup unit 140 reads the boot information BINF2 corresponding to the identification information IDINF of the storage medium 300 from the storage unit 200.

  Then, the backup unit 140 calculates the second hash value HASH2 using the boot information BINF2 read from the storage unit 200. When the first hash value is equal to the second hash value HASH2, the backup unit 140 stores the second hash value HASH2 in the storage unit 200 in association with the identification information IDINF of the storage medium 300.

  If the first hash value is different from the second hash value HASH2, there is a possibility that writing of the boot information BINF2 to the storage unit 200 has failed. Therefore, when the first hash value is different from the second hash value HASH2, the backup unit 140 rewrites the boot information BINF1 read from the storage medium 300 as the boot information BINF2 in the storage unit 200. Also good. Thereby, it is possible to prevent the boot information BINF2 that is not normal from being stored in the storage unit 200.

  In this way, when the boot information BINF1 read from the storage medium 300 is normal, the backup unit 140 associates the boot information BINF2 and the hash value HASH2 calculated from the boot information BINF2 with the identification information IDINF. Store in the storage unit 200. For example, when a plurality of different storage media 300 are connected to the semiconductor device 100 at the same time or at different times, the storage unit 200 identifies the boot information BINF2 of the plurality of storage media 300 and the hash value HASH2 of the boot information BINF2. Information IDINF is stored.

  The repair unit 160 is the same as or similar to the repair unit 16 shown in FIG. 1 except that the boot information BINF2 read from the storage unit 200 is normal using the hash value HASH2 of the boot information BINF2. is there.

  For example, when the boot information BINF1 received from the access control unit 122 is not normal, the restoration unit 160 determines whether or not the identification information IDINF received from the access control unit 122 is stored in the storage unit 200. When the identification information IDINF received from the access control unit 122 is stored in the storage unit 200, the restoration unit 160 receives the boot information BINF2 and the second hash value HASH2 corresponding to the identification information IDINF received from the access control unit 122. Read from the storage unit 200.

  Then, the restoration unit 160 calculates a third hash value using the boot information BINF2 read from the storage unit 200. When the hash value HASH2 is equal to the third hash value, the restoration unit 160 sets the boot information BINF2 read from the storage unit 200 as the boot information BINF1 to the MBR 320 of the storage medium 300 via the access control unit 122 and the interface unit 120. Store. As a result, the boot information BINF1 stored in the MBR 320 of the storage medium 300 is restored.

  If the hash value HASH2 is different from the third hash value, the restoration unit 160 stops restoring the boot information BINF1 stored in the MBR 320 of the storage medium 300. In this way, the restoration unit 160 stops the restoration of the MBR 320 when the boot information BINF1 read from the storage medium 300 is not normal and the identification information IDINF of the storage medium 300 is stored in the storage unit 200. It is determined using the hash value HASH2.

  For example, when reading of the boot information BINF2 from the storage unit 200 fails or when the boot information BINF2 stored in the storage unit 200 is destroyed, the second hash value HASH2 is stored in the third hash value. Different from the value. Therefore, the restoration unit 160 can prevent the MBR 320 from being restored with the abnormal boot information BINF2 by stopping the restoration of the MBR 320 when the second hash value HASH2 is different from the third hash value.

  Note that the configuration of the semiconductor device 100 is not limited to the example illustrated in FIG. For example, the storage unit 200 may be provided outside the semiconductor device 100. The storage unit 200 may be a removable disk such as a USB memory. Alternatively, when power is always supplied to the storage unit 200, the storage unit 200 may be a volatile memory.

  FIG. 3 shows an example of the storage unit 200 shown in FIG. The storage unit 200 includes a plurality of areas 210 that store boot information BINF2, hash value HASH2, and identification information IDINF. Each area 210 stores identification information IDINF, boot information BINF2 and hash value HASH2 associated with the identification information IDINF. For example, the sizes of the plurality of regions 210 are fixed to the same size. Note that the sizes of the predetermined number of regions 210 among the plurality of regions 210 may be different from each other. The storage unit 200 may change the size of each of the plurality of areas 210 for each identification information IDINF in accordance with the amount of data such as the identification information IDINF stored.

  FIG. 4 shows an example of the operation of the semiconductor device 100 shown in FIG. The operation shown in FIG. 4 may be realized only by hardware, or may be realized by controlling hardware by software such as a control program for a storage medium. The operation illustrated in FIG. 4 is executed each time the storage medium 300 is connected to the semiconductor device 100, for example. In FIG. 4, the operation of the semiconductor device 100 will be described by taking as an example the case where the storage medium 300 is connected to the interface unit 120A.

  In step S100, the control unit 110 acquires the boot information BINF1 stored in the MBR 320 of the storage medium 300 connected to the interface unit 120A and the identification information IDINF for identifying the storage medium 300 from the storage medium 300. For example, the access control unit 122 reads the boot information BINF1 and the identification information IDINF from the storage medium 300 via the interface unit 120A.

  In step S200, the control unit 110 executes initial processing based on the boot information BINF1 acquired in step S100. The initial process is, for example, a process for recognizing the storage medium 300. When the storage medium 300 is successfully recognized, the data area 340 of the storage medium 300 becomes accessible.

  In step S220, the control unit 110 determines whether or not the boot information BINF1 acquired in step S100 is normal. For example, the control unit 110 determines that the boot information BINF1 is normal when the initial process in step S200 is successful. In other words, when the recognition of the storage medium 300 fails, the control unit 110 determines that the boot information BINF1 is not normal.

  Note that the processing in step S220 may be executed by blocks other than the blocks (access control unit 122, backup unit 140, and restoration unit 160) illustrated in FIG. 2 among the blocks in the control unit 110. FIG. May be executed in any of the blocks shown in FIG. For example, the process of step S220 may be executed by the access control unit 122 of the control unit 110. Alternatively, the process of step S220 may be executed by one of the backup unit 140 and the restoration unit 160, or may be executed by both the backup unit 140 and the restoration unit 160.

  When the boot information BINF1 acquired in step S100 is normal, the operation of the semiconductor device 100 proceeds to step S300. On the other hand, when the boot information BINF1 acquired in step S100 is not normal, the operation of the semiconductor device 100 proceeds to step S700.

  In step S300, the backup unit 140 determines whether a backup of the MBR 320 of the storage medium 300 connected to the interface unit 120A is stored in the storage unit 200. For example, the backup unit 140 determines that the backup of the MBR 320 of the storage medium 300 is stored in the storage unit 200 when the identification information IDINF acquired in step S100 is stored in the storage unit 200.

  When the backup of the MBR 320 of the storage medium 300 is stored in the storage unit 200, the operation of the semiconductor device 100 proceeds to step S400. On the other hand, when the backup of the MBR 320 of the storage medium 300 is not stored in the storage unit 200, the operation of the semiconductor device 100 proceeds to step S600.

  In step S400, the backup unit 140 acquires boot information BINF2 that is a backup of the boot information BINF1 acquired in step S100 from the storage unit 200. For example, the backup unit 140 reads the boot information BINF2 corresponding to the identification information IDINF acquired in step S100 from the storage unit 200.

  In step S500, the backup unit 140 determines whether or not the boot information BINF2 (backup of the boot information BINF1) acquired in step S400 is normal. For example, the backup unit 140 determines whether or not the content of the boot information BINF2 conforms to the content determined by the standard of the storage medium 300 or the like. Note that the backup unit 140 may determine whether or not the storage medium 300 is successfully recognized when the initial processing based on the boot information BINF2 is executed.

  When the boot information BINF2 acquired in step S400 is normal, the operation of the semiconductor device 100 proceeds to step S520. On the other hand, when the boot information BINF2 acquired in step S400 is not normal, the operation of the semiconductor device 100 proceeds to step S600.

  In step S520, the backup unit 140 determines whether there is a difference between the boot information BINF2 acquired in step S400 (backup of the boot information BINF1) and the boot information BINF1 acquired in step S100. For example, the backup unit 140 directly compares the contents of the boot information BINF2 and the contents of the boot information BINF1, and determines whether there is a difference between the boot information BINF2 and the boot information BINF1.

  Note that the backup unit 140 may determine whether or not there is a difference between the boot information BINF2 and the boot information BINF1 using the hash value. For example, the backup unit 140 reads the hash value HASH2 (second hash value HASH2) corresponding to the identification information IDINF acquired in step S100 from the storage unit 200. In addition, the hash value (first hash value) of the boot information BINF1 acquired in step S100 is calculated. Then, the backup unit 140 compares the first hash value and the second hash value HASH2, and determines whether there is a difference between the boot information BINF2 and the boot information BINF1. When a hash value is used for the process in step S520, the process in step S400 and the process in step S500 may be omitted.

  If there is no difference between the boot information BINF2 and the boot information BINF1, the processing of the semiconductor device 100 when the storage medium 300 is connected to the semiconductor device 100 ends. On the other hand, when there is a difference between the boot information BINF2 and the boot information BINF1, the operation of the semiconductor device 100 proceeds to step S600.

  In step S600, the backup unit 140 executes a backup process for storing the backup of the boot information BINF1 acquired in step S100 in the storage unit 200. Details of the backup processing will be described with reference to FIG.

  In step S700, the restoration unit 160 determines whether the backup of the MBR 320 of the storage medium 300 connected to the interface unit 120A is stored in the storage unit 200. For example, when the identification information IDINF acquired in step S100 is stored in the storage unit 200, the restoration unit 160 determines that the backup of the MBR 320 of the storage medium 300 is stored in the storage unit 200.

  When the backup of the MBR 320 of the storage medium 300 is stored in the storage unit 200, the operation of the semiconductor device 100 proceeds to step S800. On the other hand, when the backup of the MBR 320 of the storage medium 300 is not stored in the storage unit 200, the operation of the semiconductor device 100 proceeds to step S920.

  In step S800, the repair unit 160 executes a repair process for repairing the boot information BINF1 stored in the MBR 320 of the storage medium 300. Details of the repair process will be described with reference to FIG.

  In step S900, the control unit 110 executes initial processing based on the boot information BINF1 restored in step S800. For example, when the boot information BINF1 is successfully restored in step S800, the semiconductor device 100 recognizes the storage medium 300 and ends the process when the storage medium 300 is connected. On the other hand, when the restoration of the boot information BINF1 in step S800 has failed, the semiconductor device 100 ends the process when the storage medium 300 is connected in a state where the storage medium 300 has failed to be recognized.

  In step S920, the restoration unit 160 notifies the outside of the semiconductor device 100 (for example, a display device connected to the semiconductor device 100) such as no backup of the MBR 320 of the storage medium 300. Note that the process of step S920 may be omitted.

  Thus, the semiconductor device 100 stores the backup of the MBR 320 of the storage medium 300 in the storage unit 200 when the storage medium 300 is connected. Further, when the MBR 320 of the storage medium 300 connected to the semiconductor device 100 is destroyed, the semiconductor device 100 restores the MBR 320 of the storage medium 300 using the backup stored in the storage unit 200. Thereby, the reliability of the storage medium 300 can be improved.

  Note that the operation of the semiconductor device 100 is not limited to the example illustrated in FIG. For example, in step S220, the semiconductor device 100 may determine whether or not the boot information BINF1 is normal by a determination method similar to the process in step S520. In this case, the process of step S200 may be executed after the process of step S600. For example, when the process of step S200 is omitted, the semiconductor device 100 may execute the process of step S900 after executing the process of step S600.

  Moreover, the process of step S500 may be omitted. For example, if the boot information BINF2 is not normal, it is determined in the process of step S520 that there is a difference between the boot information BINF2 and the normal boot information BINF1, so the backup process of step S600 is executed.

  FIG. 5 shows an example of the backup process (step S600) shown in FIG. That is, FIG. 5 shows an example of the operation of the backup unit 140 shown in FIG. In FIG. 5, the operation of the backup unit 140 will be described by taking as an example a case where the storage medium 300 is connected to the interface unit 120A.

  In step S610, the backup unit 140 stores the boot information BINF2 and the identification information IDINF of the storage medium 300 in the storage unit 200. For example, the backup unit 140 stores the boot information BINF1 acquired in step S100 of FIG. 4 in the storage unit 200 as boot information BINF2 of the storage medium 300 in association with the identification information IDINF acquired in step S100 of FIG.

  In step S620, the backup unit 140 reads the boot information BINF2 stored in the storage unit 200 in step S610.

  In step S630, the backup unit 140 calculates the hash value HASH2 of the boot information BINF2 read from the storage unit 200. That is, the backup unit 140 calculates the hash value HASH2 from the boot information BINF2 read in step S620.

  In step S640, the backup unit 140 calculates a hash value HASH1 (first hash value) of the boot information BINF1 read from the storage medium 300. That is, the backup unit 140 calculates the hash value HASH1 from the boot information BINF1 acquired in step S100 in FIG.

  In step S650, the backup unit 140 determines whether or not the hash value HASH2 calculated in step S630 is equal to the hash value HASH1 calculated in step S640. When the hash value HASH2 is equal to the hash value HASH1, the operation of the backup unit 140 proceeds to step S660. On the other hand, when the hash value HASH2 is different from the hash value HASH1, the operation of the backup unit 140 proceeds to step S670.

  In step S660, the backup unit 140 stores the hash value HASH2 calculated in step S630 in the storage unit 200 in association with the identification information IDINF acquired in step S100 of FIG. Thereby, the backup process ends normally.

  In step S670, the backup unit 140 determines whether to rewrite the boot information BINF2 (boot information BINF1 acquired in step S100 of FIG. 4). For example, when the hash value HASH2 is different from the hash value HASH1, the writing of the boot information BINF2 into the storage unit 200 may have failed. For this reason, for example, the backup unit 140 displays a message or the like for selecting whether or not to rewrite data on a display device or the like connected to the semiconductor device 100 and indicates whether or not to rewrite data. Wait until you receive.

  When rewriting the boot information BINF2, the operation of the backup unit 140 proceeds to step S680. On the other hand, when the boot information BINF2 is not rewritten, the operation of the backup unit 140 proceeds to step S690.

  In step S680, the backup unit 140 reads the boot information BINF1 from the MBR 320 of the storage medium 300 via the access control unit 122 and the interface unit 120A. After the process of step S680 is executed, the operation of the backup unit 140 returns to step S610. Thereby, the boot information BINF1 read from the storage medium 300 in step S680 is stored in the storage unit 200 as the boot information BINF2.

  In step S690, the backup unit 140 deletes the backup corresponding to the identification information IDINF acquired in step S100 of FIG. 4 (boot information BINF2, identification information IDINF, etc. stored in the storage unit 200 in step S610) from the storage unit 200. To do. In this case, the backup process ends without backing up the boot information BINF1.

  As described above, the backup unit 140 determines whether or not the boot information BINF2 that is the backup of the boot information BINF1 has been normally written in the storage unit 200 by using the hash value HSAH1 of the boot information BINF1 and the HASH2 of the boot information BINF2. . Thereby, it is possible to prevent the boot information BINF2 that is not normal from being stored in the storage unit 200.

  Note that the operation of the backup unit 140 is not limited to the example shown in FIG. For example, the backup unit 140 may attempt to re-execute the writing of the boot information BINF2 until a predetermined number of retries is reached. In this case, in step S670, the backup unit 140 determines whether or not the number of re-executions of the boot information BINF2 is less than the number of retries. If the number of re-executions of writing the boot information BINF2 is less than the number of retries, the operation of the backup unit 140 proceeds to step S680. On the other hand, when the number of re-executions of writing the boot information BINF2 is equal to or greater than the number of retries, the operation of the backup unit 140 proceeds to step S690.

  Further, the process of step S680 may be omitted. In this case, the backup unit 140 reuses the boot information BINF1 acquired in step S100 in FIG. 4 and rewrites the boot information BINF2.

  FIG. 6 shows an example of the repair process (step S800) shown in FIG. That is, FIG. 6 shows an example of the operation of the restoration unit 160 shown in FIG. In FIG. 6, the operation of the restoration unit 160 will be described by taking as an example a case where the storage medium 300 is connected to the interface unit 120A.

  In step S810, the restoration unit 160 reads the boot information BINF2 and the hash value HASH2 corresponding to the identification information IDINF acquired in step S100 of FIG.

  In step S820, the restoration unit 160 calculates the hash value HASH3 (third hash value) of the boot information BINF2 read from the storage unit 200. That is, the restoration unit 160 calculates the hash value HASH3 from the boot information BINF2 read in step S810.

  In step S830, the restoration unit 160 determines whether or not the hash value HASH2 read in step S810 is equal to the hash value HASH3 calculated in step S820. When the hash value HASH2 is equal to the hash value HASH3, the operation of the restoration unit 160 proceeds to step S850. On the other hand, when the hash value HASH2 is different from the hash value HASH3, the operation of the restoration unit 160 proceeds to step S840.

  In step S840, the restoration unit 160 determines whether to stop the restoration of the MBR 320. For example, when the hash value HASH2 is different from the hash value HASH3, the boot information BINF2 stored in the storage unit 200 may be destroyed. Therefore, for example, the repair unit 160 displays a message or the like for selecting whether or not to repair the MBR 320 on a display device or the like connected to the semiconductor device 100 and indicates whether or not to repair the MBR 320. Wait until control information is received.

  When stopping the repair of the MBR 320, the repair unit 160 ends the repair process without repairing the boot information BINF1 stored in the MBR 320. In this case, it is possible to prevent the MBR 320 from being repaired with the boot information BINF2 that is not normal. On the other hand, when the restoration of the MBR 320 is not stopped, the operation of the restoration unit 160 proceeds to step S850.

  In step S850, the restoration unit 160 stores the boot information BINF2 read from the storage unit 200 as the boot information BINF1 in the MBR 320 of the storage medium 300 via the access control unit 122 and the interface unit 120A. As a result, the repair process ends. For example, when the hash value HASH2 is equal to the hash value HASH3, the boot information BINF1 stored in the MBR 320 of the storage medium 300 is normally restored by the process of step S850, and the restoration process ends normally.

  The operation of the restoration unit 160 is not limited to the example illustrated in FIG. For example, when the hash value HASH2 is different from the hash value HASH3, the repair unit 160 may end the repair process without executing the process of step S840. That is, the process of step S840 may be omitted.

  Alternatively, the restoration unit 160 may repeatedly execute the reading of the boot information BINF2 until a predetermined number of times is reached. In this case, the restoration unit 160 determines in step S840 whether or not the number of re-executions of reading the boot information BINF2 is less than a predetermined number. When the number of times of re-reading the boot information BINF2 is less than the predetermined number, the operation of the restoration unit 160 returns to step S810. As a result, it is possible to suppress the failure of the repair process due to the failure of reading the boot information BINF2. On the other hand, when the number of times of re-reading the boot information BINF2 is equal to or greater than the predetermined number, the restoration unit 160 ends the restoration process without restoring the boot information BINF1 stored in the MBR 320.

  FIG. 7 shows another example of the operation of the semiconductor device 100 shown in FIG. The operation illustrated in FIG. 7 may be realized only by hardware, or may be realized by controlling hardware by software such as a control program for a storage medium. The operation illustrated in FIG. 7 is executed each time a process of disconnecting the storage medium 300 and the semiconductor device 100 (storage medium extraction process) is executed, for example. Note that the operation illustrated in FIG. 7 may be executed when the boot information BINF1 stored in the MBR 320 of the storage medium 300 is updated.

  In the operation illustrated in FIG. 7, the processing in step S200 and the processing in step S900 are omitted from the operation illustrated in FIG. 4, and the processing in step S910 is added to the operation illustrated in FIG. 4. Steps that are the same as or similar to the steps described in FIG. 4 are given the same or similar reference numerals, and detailed descriptions thereof are omitted. In FIG. 7, the operation of the semiconductor device 100 will be described by taking as an example a case where the storage medium 300 and the interface unit 120 </ b> A are disconnected.

  In step S100, the control unit 110 acquires the boot information BINF1 stored in the MBR 320 of the storage medium 300 connected to the interface unit 120A and the identification information IDINF for identifying the storage medium 300 from the storage medium 300. After the control unit 110 executes the process of step S100, the operation of the semiconductor device 100 proceeds to step S220.

  In step S220, the control unit 110 determines whether or not the boot information BINF1 acquired in step S100 is normal by a determination method similar to the processing in step S520 described with reference to FIG.

  In step S300, the backup unit 140 determines whether a backup of the MBR 320 of the storage medium 300 connected to the interface unit 120A is stored in the storage unit 200.

  In step S400, the backup unit 140 acquires boot information BINF2 that is a backup of the boot information BINF1 acquired in step S100 from the storage unit 200.

  In step S500, the backup unit 140 determines whether or not the boot information BINF2 (backup of the boot information BINF1) acquired in step S400 is normal.

  In step S520, the backup unit 140 determines whether there is a difference between the boot information BINF2 acquired in step S400 (backup of the boot information BINF1) and the boot information BINF1 acquired in step S100.

  If there is no difference between the boot information BINF2 and the boot information BINF1, the operation of the semiconductor device 100 proceeds to step S910. On the other hand, when there is a difference between the boot information BINF2 and the boot information BINF1, the operation of the semiconductor device 100 proceeds to step S600.

  In step S600, the backup unit 140 executes the backup process described with reference to FIG.

  In step S700, the restoration unit 160 determines whether the backup of the MBR 320 of the storage medium 300 connected to the interface unit 120A is stored in the storage unit 200.

  In step S800, the repair unit 160 executes the repair process described with reference to FIG. After the restoration unit 160 executes the process of step S800, the operation of the semiconductor device 100 proceeds to step S910.

  In step S <b> 910, the control unit 110 notifies the outside of the semiconductor device 100 of permission to take out the storage medium 300. For example, the control unit 110 displays a message indicating that the storage medium 300 may be taken out from the semiconductor device 100 on a display device connected to the semiconductor device 100.

  In step S920, the restoration unit 160 notifies the outside of the semiconductor device 100 (for example, a display device connected to the semiconductor device 100) such as no backup of the MBR 320 of the storage medium 300. Note that the process of step S920 may be omitted.

  As described above, the semiconductor device 100 stores the backup of the MBR 320 of the storage medium 300 in the storage unit 200 when the storage medium 300 is removed from the semiconductor device 100. Thus, even when the boot information BINF1 stored in the MBR 320 of the storage medium 300 is updated after the storage medium 300 is connected to the semiconductor device 100, the backup of the MBR 320 of the storage medium 300 is stored in the storage unit 200. Can do. Further, when the MBR 320 of the storage medium 300 connected to the semiconductor device 100 is destroyed, the semiconductor device 100 restores the MBR 320 of the storage medium 300 using the backup stored in the storage unit 200. Thereby, the reliability of the storage medium 300 can be improved.

  Note that the operation of the semiconductor device 100 is not limited to the example illustrated in FIG. For example, the process of step S500 may be omitted. Moreover, the process of step S220, the process of step S700, the process of step S800, and the process of step S920 may be omitted.

  As described above, also in the embodiment shown in FIGS. 2 to 7, the same effect as that of the embodiment shown in FIG. 1 can be obtained. For example, the semiconductor device 100 associates boot information BINF2 that is a backup of the boot information BINF1 stored in the MBR 320 of the storage medium 300 with the identification information IDINF of the storage medium 300, and is a storage unit 200 different from the storage medium 300. To store. Thereby, the reliability of the storage medium 300 can be improved.

  Furthermore, the semiconductor device 100 compares the hash value HASH1 calculated from the boot information BINF1 before writing to the storage unit 200 and the hash value HASH2 calculated from the boot information BINF2 after writing to the storage unit 200. Then, the semiconductor device 100 determines whether or not the boot information BINF2 has been normally written in the storage unit 200 based on the comparison result between the hash value HASH1 and the hash value HASH2. Thereby, it is possible to prevent the boot information BINF2 that is not normal from being stored in the storage unit 200.

  Further, when the semiconductor device 100 restores the MBR 320 of the storage medium 300, the hash value HASH3 calculated from the boot information BINF2 read from the storage unit 200 is compared with the hash value HASH2 read from the storage unit 200. Then, the semiconductor device 100 determines whether or not the boot information BINF2 read from the storage unit 200 is destroyed based on the comparison result between the hash value HASH2 and the hash value HASH3. As a result, it is possible to prevent the MBR 320 from being repaired with the abnormal boot information BINF2.

  FIG. 8 shows another embodiment of a method for controlling a semiconductor device and a storage medium. The same or similar elements as those described in FIGS. 1 to 7 are denoted by the same or similar reference numerals, and detailed description thereof will be omitted. The dashed arrows in FIG. 8 indicate the flow of information such as signals. The semiconductor device 102 shown in FIG. 8 may be realized only by hardware, or may be realized by controlling hardware by software such as a storage medium control program.

  In the semiconductor device 102, the storage unit 200 illustrated in FIG. 2 is omitted from the semiconductor device 100, and the storage unit 202 is connected to the interface unit 120. Further, the semiconductor device 102 includes a control unit 112 instead of the control unit 110 illustrated in FIG. Other configurations of the semiconductor device 102 are the same as or similar to those of the semiconductor device 100 illustrated in FIG.

  The operation of the semiconductor device 102 is the same as that of the semiconductor device 100 shown in FIG. For example, the semiconductor device 102 is mounted on an information processing apparatus such as a computer and a portable device to which the storage medium 300 is detachably connected, and is based on the storage medium control method similar to the embodiment described with reference to FIGS. Thus, the MBR 320 of the storage medium 300 is repaired.

  The semiconductor device 102 includes a plurality of interface units 120 (120A, 120B, 120C) and a control unit 112 that controls the operation of the semiconductor device 102. In addition, a storage unit 202 such as a nonvolatile memory and a storage medium 300 are connected to the semiconductor device 102. In the example illustrated in FIG. 8, the storage medium 300 is connected to the interface unit 120A, and the storage unit 202 is connected to the interface unit 120B. The semiconductor device 102 may be defined including the storage unit 202.

  The storage unit 202 is a removable disk such as a USB memory, and includes an MBR 220 and a data area 240. The MBR 220 and the data area 240 in the storage unit 202 are the same as or similar to the MBR 32 and the data area 34 shown in FIG. The storage unit 202 is the same as the storage unit 200 shown in FIG. 2 except that it is connected to the control unit 112 via the interface unit 120 (in the example shown in FIG. 8, the interface unit 120B). . For example, the storage unit 202 stores the boot information BINF2 of the plurality of storage media 300, the hash value HASH2 of the boot information BINF2, and the identification information IDINF in the data area 240.

  For example, the interface unit 120B to which the storage unit 202 is connected outputs information such as boot information BINF2, hash value HASH2, and identification information IDINF supplied from the control unit 112 to the storage unit 202. Further, the interface unit 120B outputs information such as the boot information BINF2, the hash value HASH2, and the identification information IDINF supplied from the storage unit 202 to the control unit 112.

  The control unit 112 includes an access control unit 122, a backup unit 142, and a restoration unit 162. In FIG. 8, the operation of the access control unit 122 and the like will be described by taking as an example a case where the storage medium 300 is connected to the interface unit 120A and the storage unit 202 is connected to the interface unit 120B.

  When the access target storage medium 300 is connected to the interface unit 120A, the access control unit 122 reads the boot information BINF1 and the identification information IDINF stored in the MBR 320 from the storage medium 300 via the interface unit 120A. Then, the access control unit 122 transfers the boot information BINF1 and the identification information IDINF read from the storage medium 300 to the backup unit 142 and the restoration unit 162. The access control unit 122 accesses the storage unit 202 via the interface unit 120B when the storage medium 300 is connected to the interface unit 120A while the storage unit 202 is connected to the interface unit 120B.

  The backup unit 142 is the same as the backup unit 140 shown in FIG. Note that data transfer between the backup unit 142 and the storage unit 202 is executed via the access control unit 122 and the interface unit 120B.

  For example, the backup unit 142 stores the boot information BINF1 read from the storage medium 300 as the boot information BINF2 in the data area 240 of the storage unit 202 via the access control unit 122 and the interface unit 120B. Further, the backup unit 142 reads the boot information BINF2 from the data area 240 of the storage unit 202 via the access control unit 122 and the interface unit 120B.

  The restoration unit 162 is the same as the restoration unit 160 illustrated in FIG. Note that data transfer between the restoration unit 162 and the storage unit 202 is executed via the access control unit 122 and the interface unit 120B. For example, the restoration unit 162 reads the boot information BINF2 and the hash value HASH2 from the data area 240 of the storage unit 202 via the access control unit 122 and the interface unit 120B.

  Note that the structure of the semiconductor device 102 is not limited to the example illustrated in FIG. For example, a plurality of storage units 202 may be provided. In this case, one of the plurality of storage units 202 may store the boot information BINF1 stored in the MBR 220 of the other storage unit 202.

  As described above, also in the embodiment shown in FIG. 8, the same effects as those in the embodiment shown in FIGS. 1 to 7 can be obtained. For example, the semiconductor device 102 associates boot information BINF2 that is a backup of the boot information BINF1 stored in the MBR 320 of the storage medium 300 with the identification information IDINF of the storage medium 300, and is a storage unit 202 different from the storage medium 300. To store. Thereby, the reliability of the storage medium 300 can be improved.

  Further, the semiconductor device 102 compares the hash value HASH1 calculated from the boot information BINF1 before writing to the storage unit 202 and the hash value HASH2 calculated from the boot information BINF2 after writing to the storage unit 202. Then, the semiconductor device 102 determines whether or not the boot information BINF2 has been normally written in the storage unit 202 based on the comparison result between the hash value HASH1 and the hash value HASH2. Thereby, it is possible to prevent the boot information BINF2 that is not normal from being stored in the storage unit 202.

  Further, when the semiconductor device 102 restores the MBR 320 of the storage medium 300, the hash value HASH3 calculated from the boot information BINF2 read from the storage unit 202 is compared with the hash value HASH2 read from the storage unit 202. Then, the semiconductor device 102 determines whether or not the boot information BINF2 read from the storage unit 202 is destroyed based on the comparison result between the hash value HASH2 and the hash value HASH3. As a result, it is possible to prevent the MBR 320 from being repaired with the abnormal boot information BINF2.

  FIG. 9 shows an example of the hardware configuration of the semiconductor device 100 shown in FIG. The same elements as those described in FIGS. 2 to 7 are denoted by the same reference numerals, and detailed description thereof will be omitted.

  The computer 500 includes, for example, an LSI (Large Scale Integration) 510, a nonvolatile memory 560, and an optical drive 570. The LSI 510 and the nonvolatile memory 560 are mounted on, for example, an LSI board.

  The LSI 510 includes a CPU (Central Processing Unit) 520, USB interface circuits 530 and 532, an SD interface circuit 534, a memory 540, and a hard disk 550. The CPU 520, the memory 540, the hard disk 550, the USB interface circuits 530 and 532, the SD interface circuit 534, the nonvolatile memory 560, and the optical drive 570 are connected to the bus BUS.

  The CPU 520 functions as the control unit 110 illustrated in FIG. 2 by executing an application program such as a storage medium control program stored in the memory 540, for example. Therefore, the function of the control unit 110 shown in FIG.

  The USB interface circuits 530 and 532 are interfaces of the USB memory 600 (600A and 600B), and the SD interface circuit 534 is an interface of the SD memory card 602. The USB memory 600 and the SD memory card 602 correspond to the storage medium 300 shown in FIG. That is, the USB interface circuits 530 and 532 and the SD interface circuit 534 correspond to the interface unit 120 illustrated in FIG.

  The memory 540 stores the operating system of the computer 500, for example. The memory 540 stores application programs such as a storage medium control program for the CPU 520 to execute the operation of the semiconductor device 100. Note that application programs such as a storage medium control program may be stored in the hard disk 550.

  The nonvolatile memory 560 stores boot information BINF2 of a storage medium such as the USB memory 600 and the SD memory card 602, a hash value HASH2 of the boot information BINF2, and identification information IDINF. That is, the nonvolatile memory 560 corresponds to the storage unit 200 illustrated in FIG.

  Therefore, the function of the semiconductor device 100 shown in FIG. 2 is realized by the LSI 510 and the nonvolatile memory 560, for example. Note that the functions of the semiconductor device 10 shown in FIG. 1 and the functions of the semiconductor device 102 shown in FIG. For example, the function of the control unit 112 illustrated in FIG. 8 is realized by the CPU 520.

  The optical drive 570 can be mounted with a removable disk 580 such as an optical disk, and reads and records information recorded on the mounted removable disk 580.

  An application program such as a storage medium control program can be recorded on a removable disk 580 such as an optical disk and distributed. For example, the computer 500 may read an application program such as a storage medium control program from the removable disk 580 via the optical drive 570 and store the application program in the memory 540 or the hard disk 550. Further, the computer 500 may download an application program such as a control program for a storage medium via a communication device connected to a network such as the Internet and store it in the memory 540 or the hard disk 550.

  The hardware configuration of the semiconductor device 100 is not limited to the example shown in FIG. For example, in the computer 500, the optical drive 570 may be omitted.

The invention described in the above embodiments is organized and disclosed as an appendix.
(Appendix 1)
An access unit that reads the boot information stored in the boot area referred to when starting the storage medium and the identification information for identifying the storage medium from the first storage medium that is the storage medium to be accessed;
When the first boot information read from the first storage medium is normal, the storage unit that stores the boot information and the identification information of each of the plurality of storage media stores the read information from the first storage medium. A backup unit that stores first boot information in association with first identification information of the first storage medium;
When the first boot information read from the first storage medium is not normal and the first identification information of the first storage medium is stored in the storage unit, the first storage medium The second boot information corresponding to the first identification information is read from the storage unit, and the first boot information stored in the boot area of the first storage medium is read from the storage unit. A semiconductor device comprising: a repair portion that is repaired by using the semiconductor device.
(Appendix 2)
In the semiconductor device according to attachment 1,
When the first boot information read from the first storage medium is normal, the backup unit
Using the first boot information read from the first storage medium to calculate a first hash value;
After the first boot information read from the first storage medium is stored in the storage unit in association with the first identification information of the first storage medium, the first identification information of the first storage medium The second boot information corresponding to is read from the storage unit, a second hash value is calculated using the second boot information read from the storage unit,
When the first hash value is equal to the second hash value, the second hash value is stored in the storage unit in association with the first identification information of the first storage medium. Semiconductor device.
(Appendix 3)
In the semiconductor device according to attachment 2,
When the first boot information read from the first storage medium is not normal and the first identification information of the first storage medium is stored in the storage unit, the restoration unit is
A third hash value is calculated using the second boot information read from the storage unit,
Reading the second hash value corresponding to the first identification information of the first storage medium from the storage unit;
When the second hash value read from the storage unit is equal to the third hash value, the second boot information read from the storage unit is stored in the boot area of the first storage medium; If the hash value of 2 is different from the third hash value, the restoration of the first boot information stored in the boot area of the first storage medium is stopped.
(Appendix 4)
In the semiconductor device according to appendix 2 or appendix 3,
When the first hash value is different from the second hash value, the backup unit corresponds to the first identification information of the first storage medium and the first identification information of the first storage medium. 2 Boot information is deleted from the said memory | storage part. The semiconductor device characterized by the above-mentioned.
(Appendix 5)
In the semiconductor device according to any one of appendix 1 to appendix 4,
The semiconductor device, wherein the boot area is a head sector of a storage medium.
(Appendix 6)
In a storage medium control method,
Read boot information stored in a boot area referred to when starting the storage medium and identification information for identifying the storage medium from the first storage medium that is the storage medium to be accessed;
When the first boot information read from the first storage medium is normal, the storage unit that stores the boot information and the identification information of each of the plurality of storage media stores the read information from the first storage medium. Storing first boot information in association with first identification information of the first storage medium;
When the first boot information read from the first storage medium is not normal and the first identification information of the first storage medium is stored in the storage unit, the first storage medium The second boot information corresponding to the first identification information is read from the storage unit, and the first boot information stored in the boot area of the first storage medium is read from the storage unit. A storage medium control method characterized by using and repairing.

  From the above detailed description, features and advantages of the embodiments will become apparent. This is intended to cover the features and advantages of the embodiments described above without departing from the spirit and scope of the claims. Also, any improvement and modification should be readily conceivable by those having ordinary knowledge in the art. Therefore, there is no intention to limit the scope of the inventive embodiments to those described above, and appropriate modifications and equivalents included in the scope disclosed in the embodiments can be used.

  DESCRIPTION OF SYMBOLS 10, 100, 102 ... Semiconductor device; 12 ... Access part; 16, 160, 162 ... Restoration part; 14, 140, 142 ... Backup part; 20, 200, 202 ... Storage part; 30, 300 ... Storage medium; 220, 320, MBR; 34, 240, 340, data area; 120, interface unit; 122, access control unit; 500, computer; 510, LSI, 520, CPU; 530, 532, USB interface circuit; Circuit: 540 Memory: 550 Hard disk; 560 Non-volatile memory; 570 Optical drive; 580 Removable disk

Claims (4)

An access unit that reads the boot information stored in the boot area referred to when starting the storage medium and the identification information for identifying the storage medium from the first storage medium that is the storage medium to be accessed;
When the first boot information read from the first storage medium is normal, the storage unit that stores the boot information and the identification information of each of the plurality of storage media stores the read information from the first storage medium. A backup unit that stores first boot information in association with first identification information of the first storage medium;
When the first boot information read from the first storage medium is not normal and the first identification information of the first storage medium is stored in the storage unit, the first storage medium The second boot information corresponding to the first identification information is read from the storage unit, and the first boot information stored in the boot area of the first storage medium is read from the storage unit. have a and repair parts to repair using,
When the first boot information read from the first storage medium is normal, the backup unit
Using the first boot information read from the first storage medium to calculate a first hash value;
After the first boot information read from the first storage medium is stored in the storage unit in association with the first identification information of the first storage medium, the first identification information of the first storage medium The second boot information corresponding to is read from the storage unit, a second hash value is calculated using the second boot information read from the storage unit,
When the first hash value is equal to the second hash value, the second hash value is stored in the storage unit in association with the first identification information of the first storage medium. Semiconductor device. The semiconductor device according to claim 1 ,
When the first boot information read from the first storage medium is not normal and the first identification information of the first storage medium is stored in the storage unit, the restoration unit is
A third hash value is calculated using the second boot information read from the storage unit,
Reading the second hash value corresponding to the first identification information of the first storage medium from the storage unit;
When the second hash value read from the storage unit is equal to the third hash value, the second boot information read from the storage unit is stored in the boot area of the first storage medium; If the hash value of 2 is different from the third hash value, the restoration of the first boot information stored in the boot area of the first storage medium is stopped. The semiconductor device according to claim 1 or 2 ,
When the first hash value is different from the second hash value, the backup unit corresponds to the first identification information of the first storage medium and the first identification information of the first storage medium. 2 Boot information is deleted from the said memory | storage part. The semiconductor device characterized by the above-mentioned. In a storage medium control method,
Read boot information stored in a boot area referred to when starting the storage medium and identification information for identifying the storage medium from the first storage medium that is the storage medium to be accessed;
When the first boot information read from the first storage medium is normal, the storage unit that stores the boot information and the identification information of each of the plurality of storage media stores the read information from the first storage medium. Storing first boot information in association with first identification information of the first storage medium;
When the first boot information read from the first storage medium is not normal and the first identification information of the first storage medium is stored in the storage unit, the first storage medium The second boot information corresponding to the first identification information is read from the storage unit, and the first boot information stored in the boot area of the first storage medium is read from the storage unit. used to repair,
When the first boot information read from the first storage medium is normal, a first hash value is calculated using the first boot information read from the first storage medium,
After the first boot information read from the first storage medium is stored in the storage unit in association with the first identification information of the first storage medium, the first identification information of the first storage medium The second boot information corresponding to is read from the storage unit, a second hash value is calculated using the second boot information read from the storage unit,
When the first hash value is equal to the second hash value, the second hash value is stored in the storage unit in association with the first identification information of the first storage medium. A storage medium control method.

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