JP6433530B2 - Waveform analysis auxiliary device and waveform analysis auxiliary system - Google Patents

Description

  The present invention relates to a waveform analysis auxiliary device and a waveform analysis auxiliary system that handle waveform data obtained in a repetitive cycle.

  Conventionally, analog signals such as vibration values, temperatures, and current values measured during a work process are digitally converted, and digital data for one cycle of the work process is stored in time series, and the stored digital data and subsequent cycles are stored. The upper and lower limit values are determined and the vibration value, temperature, current value, etc. measured during the subsequent work process are compared with the upper and lower limit values, and the compared values deviate from the upper and lower limit values. There is known a monitoring method that issues an alarm when the alarm occurs (see, for example, Patent Document 1).

Japanese Patent Laid-Open No. 06-201398

  By the way, when it deviates from the upper limit value and the lower limit value set by the above-described monitoring method, it is determined that the abnormality is obvious. However, although it is not abnormal, waveform data showing a value different from other cycles may be obtained. . By analyzing the waveform data having such a small difference that does not lead to such an abnormality, it becomes possible to prevent a failure of the apparatus and improve the performance of the apparatus. However, such small differences are buried in data variations and are difficult to find.

  An object of the present invention is to provide a waveform analysis auxiliary device and waveform analysis auxiliary that can easily find waveform data that is different from other waveform data from among a plurality of waveform data obtained in a repetitive cycle. Is to provide a system.

  A waveform analysis auxiliary device according to the present invention includes a storage unit that stores waveform data representing a numerical value obtained in accordance with the passage of time in each cycle in a repeated cycle, and a display unit that has a display screen that displays an image. And a time axis corresponding to the time and a value axis corresponding to the numerical value are set on the display screen, and reference feature points having predetermined characteristics of the waveform data are matched on the time axis. A display processing unit configured to display a correction waveform on which the waveform data is superimposed on the display screen while adjusting a display position of the waveform data on the time axis.

  According to this configuration, a plurality of waveform data corresponding to the repetitive cycle is not a correction waveform in which the reference feature points having predetermined characteristics of each waveform data are not aligned with each other on the time axis. Is displayed. As a result, since each waveform data is displayed in a state where the variation from the beginning of the cycle is canceled at the position of the reference feature point, the possibility that a small difference is buried in the variation in the data is reduced. As a result, it becomes easy to find waveform data that is different from other waveform data from among a plurality of waveform data obtained in the repetition cycle.

  In addition, the display processing unit adjusts the display position of the waveform data on the time axis so that the start points at which the cycles of the waveform data are started coincide on the time axis. The first display processing unit for displaying the collective waveform on which the waveform data is superimposed on the display screen, and the waveform data in the collective waveform so that the reference feature points in the waveform data are matched on the time axis. And a second display processing unit for displaying the correction waveform on the display screen by translating along the time axis.

  According to this configuration, the first display processing unit displays a collective waveform obtained by superimposing a plurality of waveform data corresponding to the repetitive cycle in a state where the start points at which the cycle is started coincide on the time axis. This makes it easy to grasp the cycle operation from the start of the cycle from the waveform data. Furthermore, since the second display processing unit displays a corrected waveform in which the reference feature points having predetermined characteristics of each waveform data are aligned on the time axis, the cycle operation from the start of the cycle is displayed. While facilitating grasping, it becomes easy to find waveform data that is different from other waveform data.

  The reference feature point is that the numerical value becomes a predetermined threshold in the rising direction at a predetermined number of times from the start of each cycle, and the numerical value is predetermined in the falling direction at a predetermined number of times from the start of each cycle. Any one of a point that becomes a threshold, a point that becomes a convex peak upwards a predetermined number of times from the start of each cycle, and a point that becomes a convex peak downwards a predetermined number of times from the start of each cycle It is preferable that

  The point where the numerical value becomes a predetermined threshold in the rising direction at a predetermined number of times from the start of each cycle, the point where the numerical value becomes a predetermined threshold in the falling direction at the predetermined number of times from the start of each cycle, from the start of each cycle A point that has a convex peak upwards a predetermined number of times and a point that has a convex peak downwards a predetermined number of times from the start of each cycle are both suitable as feature points.

  Each waveform data preferably includes a plurality of repetitive waveforms.

  For example, waveform data obtained with the operation of an apparatus that includes a plurality of steps in one cycle often includes a plurality of repetitive waveforms. Displaying the correction waveform in such a case makes it easy to find small differences in the repetitive waveform after the waveform including the reference feature point, so that it is easy to obtain information about the subsequent process from the waveform data. Become.

  Further, for at least one of the collective waveform and the correction waveform, the time at which an analysis feature point having a predetermined characteristic for analyzing the at least one waveform appears in each waveform data corresponding to each cycle An analysis time position acquisition unit that acquires a feature appearance time indicating time on the axis for each waveform data included in the waveform, a cycle axis that indicates the number of cycles corresponding to each waveform data on the display screen, and the time axis And an analysis display processing unit that plots the feature appearance time corresponding to each cycle on the display screen.

  According to this configuration, it is easy to find a data tendency such that the timing at which the analysis feature point appears at a predetermined cycle interval varies.

  The analysis feature point is that the numerical value becomes a predetermined threshold in the rising direction at a predetermined number of times from the start of each cycle, and the numerical value is predetermined in the falling direction at a predetermined number of times from the start of each cycle. Any one of a point that becomes a threshold, a point that becomes a convex peak upwards a predetermined number of times from the start of each cycle, and a point that becomes a convex peak downwards a predetermined number of times from the start of each cycle It is preferable that

  The point where the numerical value becomes a predetermined threshold in the rising direction at a predetermined number of times from the start of each cycle, the point where the numerical value becomes a predetermined threshold in the falling direction at the predetermined number of times from the start of each cycle, from the start of each cycle A point that becomes a convex peak upwards a predetermined number of times and a point that becomes a convex peak downwards a predetermined number of times from the start of each cycle are both suitable as analysis feature points.

  The waveform analysis auxiliary system according to the present invention includes the waveform analysis auxiliary device described above, a signal detection unit that detects a signal that changes with time in each cycle, and a timing at which each cycle is started. A trigger signal receiving unit that receives the trigger signal indicated by the trigger signal receiving unit, and a period from when the trigger signal is received to when the trigger signal is received again by the trigger signal receiving unit as one cycle. A waveform data generation unit that generates the waveform data for one cycle from the received signal.

  According to this configuration, since each waveform data is generated with the timing at which the trigger signal is received as the start point of the cycle, the correspondence accuracy between the cycle and the waveform data can be improved.

  The waveform analysis auxiliary device and the waveform analysis auxiliary system configured as described above can easily find waveform data that is different from other waveform data from among a plurality of waveform data obtained in a repetitive cycle. Is possible.

It is a block diagram showing an example of composition of a waveform analysis auxiliary system provided with a waveform analysis auxiliary device concerning one embodiment of the present invention. It is a wave form chart for explaining an example of a plurality of waveform data memorized by a storage part. It is a screen figure which shows an example of the collective waveform displayed on the display apparatus by the 1st display process part shown in FIG. FIG. 4 is a screen diagram illustrating a waveform of a selection range enlarged and displayed by a display processing unit when a user selects a waveform selection range on the display screen illustrated in FIG. 3. It is a screen figure which shows the setting reception screen which receives the input of the setting used as the characteristic of a reference | standard feature point. It is a screen figure which shows an example of the correction | amendment waveform displayed by the 2nd display process part shown in FIG. FIG. 7 is a screen diagram illustrating a correction waveform of a selection range enlarged and displayed by a display processing unit when a user selects a selection range of a second waveform of the correction waveform on the display screen illustrated in FIG. 6. It is a screen figure which shows the setting reception screen which receives the input of the setting used as the characteristic of an analysis feature point. It is a screen figure which shows the graph which connected by the line the plot of the feature appearance time corresponding to each cycle displayed by the analysis display process part shown in FIG.

  Embodiments according to the present invention will be described below with reference to the drawings. In addition, the structure which attached | subjected the same code | symbol in each figure shows that it is the same structure, The description is abbreviate | omitted. FIG. 1 is a block diagram showing an example of the configuration of a waveform analysis assistance system including a waveform analysis assistance device according to an embodiment of the present invention.

  A waveform analysis auxiliary system 1 shown in FIG. 1 includes a waveform analysis auxiliary device 2 and a signal observation device 3. The signal observation device 3 includes, for example, a signal detection unit 31, a trigger signal reception unit 32, and a waveform data generation unit 33.

  The signal observation device 3 is a nonvolatile memory such as a CPU (Central Processing Unit) that executes predetermined arithmetic processing, a RAM (Random Access Memory) that temporarily stores data, a flash memory that stores predetermined control programs, and the like. A storage device, a communication circuit for communicating with the waveform analysis auxiliary device 2, an AD (analog / digital) converter, an I / O port, and peripheral circuits thereof are configured. Then, the signal observation device 3 functions as the waveform data generation unit 33 by executing a predetermined control program.

  The signal observation device 3 is connected to a device that performs a repeated cycle operation. The signal observation device 3 acquires the signal detected with the cycle operation as waveform data for each cycle based on the trigger signal indicating the start of the cycle obtained from the device.

  An apparatus that repeatedly performs a cycle operation is, for example, an NC machine tool (Numerically Controlled Machine Tools). In an NC machine tool, a period for machining one workpiece corresponds to one cycle. As a signal detected with the cycle operation of the NC machine tool, for example, a signal indicating a drive current of a drive motor for driving a drill or a metal saw is exemplified. For example, a current sensor is attached to the drive motor, and a signal detected by the current sensor is input to the signal detection unit 31. Further, the NC machine tool outputs a trigger signal indicating the start of the machining cycle to the trigger signal receiving unit 32.

  The signal detection unit 31 is configured using, for example, an AD converter. The signal detector 31 detects a signal that changes with time in each cycle, for example, a detection signal of the above-described current sensor. The trigger signal receiving unit 32 is, for example, an I / O port. The trigger signal receiving unit 32 receives a trigger signal indicating the timing at which the machining cycle of the NC machine tool is started.

  The waveform data generation unit 33 sets the period from when the trigger signal is received by the trigger signal reception unit 32 to when the trigger signal is received again as one cycle, from the signal received by the signal detection unit 31 during that period to one cycle. Generate minute waveform data. Then, the waveform data generation unit 33 transmits the waveform data for each cycle obtained in this way to the waveform analysis auxiliary device 2. The waveform data generation unit 33 stores the waveform data for each cycle thus obtained in a storage medium such as a memory card, and causes the waveform analysis auxiliary device 2 to read the data in the storage medium. It may be.

  The waveform analysis auxiliary device 2 includes, for example, a main body unit 4, a storage unit 5, a display device 6 (display unit), a mouse 7 (operation reception unit), and a keyboard 8 (operation reception unit). The waveform analysis auxiliary device 2 is configured using, for example, a personal computer. The display device 6 is a display device such as a liquid crystal display device or an EL (Electro-Luminescence) display.

  The storage unit 5 is configured using a storage device such as an HDD (Hard Disk Drive) or an SSD (Solid State Drive). Alternatively, the storage unit 5 may be a storage medium such as a USB (Universal Serial Bus) memory or an SD memory card. The storage unit 5 stores n (n is an integer of 2 or more) waveform data D1 to Dn. Hereinafter, the waveform data D1 to Dn are collectively referred to as waveform data D. Each waveform data is represented as a waveform data Di by adding the number i of cycles in which the waveform data is obtained to the symbol D.

  Each of the waveform data D1 to Dn is data acquired as time elapses, for example, by sampling a sensor value (numerical value) that is a detection value detected by a predetermined sensor, for example, at a constant time interval. Such data can be grasped as a waveform by plotting on a coordinate plane (two-dimensional coordinates) composed of a time axis corresponding to time and a numerical axis corresponding to a sensor value.

  A plurality of sensor values constituting one waveform data D are assigned sample numbers in order from 0 in the order sampled for each waveform data D. That is, the sensor value of sample number 0 is the first sensor value at which the cycle is started, and thereafter, the elapsed time from the start of the cycle is obtained by sampling interval × sample number. That is, the sample number means an elapsed time since the sampling was started. The sampling interval is, for example, 10 ms.

  The above-described sensor is a current sensor that detects a load current of a processing motor of a processing machine that processes a workpiece, for example. The sensor value obtained by sampling a plurality of times during one cycle from the start to the end of the machining process for machining one workpiece is used as one waveform data D. By repeating such a cycle n times, a waveform is obtained. Data D1 to Dn are obtained.

  Here, in the waveform data D1 to Dn corresponding to the number of cycles 1 to n, the subscript number i increases with the passage of time (increase in the number of cycles) in the order of the number of cycles.

  The sensor is not limited to a current sensor. For example, a voltage sensor, a temperature sensor, a torque sensor, or a pressure sensor may be used. The numerical value of the waveform data D is not limited to the value detected by the sensor, and may be a numerical value obtained with the passage of time.

  2A to 2D are waveform diagrams for explaining an example of the waveform data D1 to Dn stored in the storage unit 5. FIG. The waveform diagrams shown in FIGS. 2A to 2D show waveform data D1 on a coordinate plane (two-dimensional coordinates) having the horizontal axis (time axis) as time and the vertical axis (numerical value axis) as sensor values. , D2, D3, Dn are plotted. As shown in FIGS. 2A to 2D, the waveform data D1, D2, D3, and Dn are obtained by repeating a cycle of machining the same type of workpiece. Waveforms representing Dn are substantially similar.

  In the example shown in FIG. 2, the waveform of the waveform data D3 shown in FIG. 2C is slightly different from the other waveforms at the time positions around the sample number 1000 (10 seconds). It is difficult to determine whether the waveform data D3 is abnormal or whether the difference between the waveform data D3 and other waveform data is within the range of data variation by simply looking at the waveform in FIG.

  The number n of waveform data D is, for example, 200 to 2000. For this reason, it is difficult and cumbersome for the user to visually recognize such a large number of waveforms one by one and discriminate abnormal waveform data from the large number of waveform data.

  The main unit 4 includes, for example, a CPU (Central Processing Unit) that executes predetermined arithmetic processing, a RAM (Random Access Memory) that temporarily stores data, a communication circuit for communicating with the signal observation device 3, and their peripherals A circuit is provided. The main body 4 functions as a display processing unit 40, an analysis time position acquisition unit 43, and an analysis display processing unit 44 by executing the control program stored in the storage unit 5. The display processing unit 40 includes a first display processing unit 41 and a second display processing unit 42.

  The main body unit 4 may store the waveform data D1 to Dn received from the signal observation device 3 or the waveform data D1 to Dn read from the storage medium in the storage unit 5, for example. Alternatively, a storage medium in which the waveform data D1 to Dn are stored may be used as the storage unit 5.

  The first display processing unit 41 adjusts the display position of the waveform data D1 to Dn on the time axis so that the start points at which the cycles of the waveform data D1 to Dn start are matched on the time axis, while the waveform data D1 The collective waveform on which .about.Dn is superimposed is displayed on the display screen of the display device 6.

  The second display processing unit 42 displays the corrected waveform by translating the waveform data D1 to Dn in the collective waveform along the time axis so that the reference feature points in the waveform data D1 to Dn match on the time axis. Display on the screen.

  The analysis time position acquisition unit 43 analyzes at least one of the collective waveform displayed by the first display processing unit 41 and the correction waveform displayed by the second display processing unit 42. The feature appearance sample numbers (feature appearance times) indicating the time on the time axis at which the analysis feature points having the predetermined features appear in the waveform data D1 to Dn corresponding to each cycle are represented by the waveform data D1 to Dn included in the waveform. Get about.

  The analysis display processing unit 44 sets a cycle axis and a time axis indicating the number of cycles corresponding to the waveform data D1 to Dn on the display screen of the display device 6, and a feature appearance sample number (corresponding to each cycle) on the display screen. Plot feature appearance time).

  FIG. 3 is a screen diagram showing an example of the collective waveform G2 displayed on the display device 6 by the first display processing unit 41 shown in FIG. In the display screen G1 shown in FIG. 3, the horizontal axis is a time axis indicating the elapsed time from the start of the cycle as a sample number, and the vertical axis is a numerical axis indicating the sensor value. The collective waveform G2 is obtained by plotting the cycle numbers of the waveform data D1 to Dn on the display screen G1 as they are along the time axis, and is a waveform in which the waveform data D1 to Dn are overlapped with the time axis aligned at the cycle start timing. It has become.

  In the portion A of the collective waveform G2, the waveform is a thick line, and the thickness of this line corresponds to the variation of the waveform data D1 to Dn.

  In the example shown in FIG. 3, two steps are included in one cycle. For example, this corresponds to a case where two holes are sequentially drilled in one workpiece with an NC machine tool. In the collective waveform G2 shown in FIG. 3, a waveform G21 corresponding to the first step and a waveform G22 corresponding to the second step are displayed.

  The display processing unit 40 enlarges and displays a portion selected by the user by operating the mouse 7. FIG. 4 is a screen diagram showing the waveform G22 of the selection range G23 enlarged and displayed by the display processing unit 40 when the user selects the selection range G23 of the waveform G22 on the display screen G1. In the screen diagram shown in FIG. 4, the waveform of the portion E seems to vary substantially uniformly within a certain range, and it is difficult to find waveform data that is different from other waveform data for a reason different from variation. It is.

  5 and 6 are explanatory diagrams for explaining the correction waveform display operation by the second display processing unit 42. FIG. 5 is a screen diagram illustrating a setting reception screen that receives an input of a setting that is a feature of the reference feature point.

  When the user operates the mouse 7 or the keyboard 8 to input a correction waveform display instruction, the second display processing unit 42 causes the display device 6 to display a setting reception screen G3 shown in FIG. In the setting reception screen G3, a “start:” field and a “length:” field for designating a range for searching for a reference feature point by the number of samples are displayed. In addition, a cycle input field G31 for setting what cycle is targeted, a selection field G32 for selecting rising, falling, upwardly convex peak, and downwardly convex peak, and threshold values A “detection level:” field for setting is provided. The user can operate the mouse 7 or the keyboard 8 to make desired settings in each column.

  In the example shown in FIG. 5, 120 is input in the “Start:” field, 100 in the “Length:” field, “First” in the cycle input field G31, 20 in the selection field G32, and 20 in the “Detection level:” field. The second display processing unit 42 displays the cursor B corresponding to the setting content input on the setting reception screen G3 on the display screen G1 shown in FIG.

  In the example shown in FIGS. 3 and 5, the waveform data D1 to Dn when the waveform data D1 to Dn pass in the rising direction through the cursor B displayed on the display screen G1 has a threshold value (detection level). The second display processing unit 42 acquires the reference feature points of the waveform data D1 to Dn.

  FIG. 6 is a screen diagram showing an example of a correction waveform displayed by the second display processing unit 42 shown in FIG. The second display processing unit 42 translates the waveform data D1 to Dn in the collective waveform along the time axis so that the reference feature points of the waveform data D1 to Dn are matched on the time axis (horizontal axis). The corrected waveform G41 corrected by the above is displayed on the display screen G4.

  In the correction waveform G41 shown in FIG. 6, in the portion C corresponding to the portion A in the collective waveform G2, the correction waveform G41 of the portion C is thinner than the collective waveform G2 of the portion A. That is, in the correction waveform G41, as a result of matching the reference feature points of the waveform data D1 to Dn on the time axis (horizontal axis), the correction waveform G41 is narrowed at the portion C corresponding to the reference feature points. .

  FIG. 7 shows the correction waveform G41 of the selection range G42 enlarged and displayed by the display processing unit 40 when the user selects the selection range G42 of the waveform G22 in the second step of the correction waveform G41 on the display screen G4. FIG. As shown in FIG. 7, in the corrected waveform G41, it can be confirmed that the waveform data D1 to Dn are divided into approximately two different groups in the portion F of the enlarged selection range G42. Thus, according to the correction waveform G41, it becomes easy to find waveform data that is different from other waveform data from among the plurality of waveform data D1 to Dn obtained in the repetition cycle.

  In the collective waveform G2 shown in FIG. 3 and FIG. 4, the variations generated in the waveform G21 in the first step are accumulated and appear in the waveform G22 in the second step. For this reason, the difference between the waveform data D1 to Dn in the waveform G22 in the second step is obscured by the accumulation of variations generated in the waveform G21, and therefore, the difference between the waveform data D1 to Dn is found in the collective waveform G2. Becomes difficult.

  On the other hand, in the correction waveform G41 shown in FIGS. 6 and 7, the waveform data D1 to D1 in the collective waveform G2 is set by the second display processing unit 42 so that the reference feature points in the waveform data D1 to Dn are matched on the time axis. As a result of the parallel movement of Dn along the time axis, the variation occurring in the waveform G21 is canceled, so that, as shown in FIG. 7, from among the plurality of waveform data D1 to Dn obtained in the repetitive cycle, the other It becomes easy to find the waveform data that is different from the waveform data.

  8 and 9 are explanatory diagrams for explaining operations of the analysis time position acquisition unit 43 and the analysis display processing unit 44. FIG. FIG. 8 is a screen diagram illustrating a setting reception screen that receives an input of a setting that is a feature of an analysis feature point.

  When the collective waveform G2 shown in FIG. 3 or FIG. 4 or the correction waveform G41 shown in FIG. 6 or FIG. 7 is displayed, the user operates the mouse 7 or the keyboard 8 to input a timing analysis waveform display instruction. The analysis time position acquisition unit 43 causes the display device 6 to display a setting reception screen G5 shown in FIG. In the setting reception screen G5, a “start:” field and a “length:” field for designating a range to search for analysis feature points by using the displayed waveform as a processing target are displayed. In addition, a cycle input field G31 for setting what cycle is targeted, a selection field G32 for selecting rising, falling, upwardly convex peak, and downwardly convex peak, and threshold values A “detection level:” field for setting is provided. The user can operate the mouse 7 or the keyboard 8 to make desired settings in each column.

  In the example shown in FIG. 8, 770 is entered in the “Start:” field, 30 is entered in the “Length:” field, “First” is entered in the cycle entry field G31, 20 is entered in the Selection field G32, and 20 is entered in the “Detection level:” field. ing. When the correction waveform G41 shown in FIG. 7 is to be processed, the analysis time position acquisition unit 43 displays the cursor H corresponding to the setting content input on the setting reception screen G5 on the correction waveform G41 shown in FIG. .

  In the example shown in FIGS. 7 and 8, the waveform data is that the waveform data D <b> 1 to Dn when the waveform data D <b> 1 to Dn of the correction waveform G <b> 41 passes through the cursor H in the rising direction becomes a threshold value (detection level). It is set as each analysis feature point of D1-Dn. The analysis time position acquisition unit 43 acquires a feature appearance sample number indicating the time on the time axis of each analysis feature point by a sample number. The feature appearance sample number corresponds to an example of the feature appearance time. When the correction waveform G41 is targeted, the feature appearance sample number is the sample number (time) on the time axis after being corrected by the second display processing unit.

  FIG. 9 is a screen diagram G6 showing a graph G61 displayed by the analysis display processing unit 44 shown in FIG. 1 and connecting plots of feature appearance times corresponding to the respective cycles with lines. In the screen diagram G6 shown in FIG. 9, the horizontal axis is the cycle axis indicating the number of cycles corresponding to the waveform data D1 to Dn, and the vertical axis is the feature appearance sample number corresponding to each cycle (waveform data D1 to Dn). ing.

  The analysis display processing unit 44 plots the feature appearance sample numbers for each cycle (waveform data D1 to Dn) in the screen diagram G6 and causes the display device 6 to display the graph G61.

  According to the graph G61, it can be seen that the feature appearance sample number decreases every four cycles. In the correction waveform G41 shown in FIG. 7, it can only be understood that the waveform data D1 to Dn are divided into two groups. However, by displaying the graph G61 shown in FIG. 9 by the analysis time position acquisition unit 43 and the analysis display processing unit 44, it is possible to generate a waveform having a small feature appearance sample number and different from other cycles every four cycles. Can be easily found.

  As described above, according to the analysis time position acquisition unit 43 and the analysis display processing unit 44, it is easy to obtain information regarding the tendency of generating waveform data that is different from other waveform data.

DESCRIPTION OF SYMBOLS 1 Waveform analysis auxiliary system 2 Waveform analysis auxiliary device 3 Signal observation apparatus 4 Main body part 5 Memory | storage part 6 Display apparatus (display part)
7 mouse 8 keyboard 31 signal detection unit 32 trigger signal reception unit 33 waveform data generation unit 40 display processing unit 41 first display processing unit 42 second display processing unit 43 analysis time position acquisition unit 44 analysis display processing units D, D1 to Dn Waveform data G1 Display screen G2 Collective waveform G21, G22 Waveform G23 Selection range G3 Setting reception screen G31 Cycle input field G32 Selection field G4 Display screen G41 Correction waveform G42 Selection range G5 Setting reception screen G6 Screen diagram G61 Graph

Claims (2)

A storage unit for storing waveform data representing a numerical value obtained in accordance with the passage of time in each cycle in a repetitive cycle;
A display unit having a display screen for displaying an image;
An operation accepting unit for accepting an input of a range of time from the start of each of the cycles for designating a range in which each waveform data has a predetermined feature to be searched for;
A time axis corresponding to the time and a value axis corresponding to the numerical value are set on the display screen, and the reference feature points of the waveform data within the time range received by the operation receiving unit are A display processing unit for displaying a correction waveform on which the waveform data is superimposed on the display screen while adjusting the display position of the waveform data on the time axis so as to match on the time axis,
The display unit, the cursor that indicates the range of the operation accepting unit the time received by said displayed waveform analyzer aid that displays on the screen. The waveform analysis auxiliary device according to claim 1 ;
A signal detector that detects a signal that changes with time in each cycle;
A trigger signal receiving unit for receiving a trigger signal indicating a timing at which each cycle is started;
The period of time from when the trigger signal is received by the trigger signal receiving unit to when the trigger signal is received again is defined as one cycle, and the waveform data for one cycle from the signal received by the signal detection unit during the period A waveform analysis auxiliary system comprising a waveform data generation unit for generating a waveform data.