JP6366054B2 - Method for producing composite layer structure and method for producing cathode of solid oxide fuel cell - Google Patents

Description

  The present invention relates to a composite layer structure, a method for producing the same, and a method for producing a cathode of a solid oxide fuel cell, and can be used particularly as a thin film cathode of a solid oxide fuel cell (SOFC). The present invention relates to a composite layer structure having a mixed conductor of oxide ions and electrons (hereinafter referred to as “oxide oxide / electron mixed conductor”), a manufacturing method thereof, and a cathode manufacturing method of a solid oxide fuel cell.

  The solid oxide fuel cell has advantages in that, among various types of fuel cells, the power generation efficiency is high, the load on the environment is low, and various fuels can be used. There are various solid oxide fuel cell structures. For example, an anode (fuel electrode) having a porous structure, a dense solid electrolyte (eg, a dense membrane layer) made of an oxide ion conductor, and a porous structure. Examples thereof include a solid oxide fuel cell having a structure in which cathodes (air electrodes) are sequentially stacked. The solid oxide fuel cell having such a structure is operated by supplying a fuel gas (for example, hydrogen gas, methane gas, etc.) to the anode and supplying an oxygen-containing gas to the cathode.

Currently, in the solid oxide fuel cell, a zirconium dioxide (ZrO ₂ ) -based solid electrolyte and a lanthanum cobalt trioxide (LaCoO ₃ ) -based perovskite oxide are used as cathodes, and reactions at their interfaces In order to suppress the product, a cerium dioxide (CeO ₂ ) -based cathode thin film intermediate layer is used (for example, see Non-Patent Document 1).

However, a composite layer structure in which an oxide ion / electron mixed conductor obtained from an organometalate solution is provided on a CeO ₂ thin film intermediate layer by low-temperature annealing at 700 ° C. to 950 ° C. is known. Absent.

H. Uchida, S. Arisaka, and M. Watanabe, Solid State Ionics, 135, 347 (2000).

Regarding the reaction activity associated with the baking of the cathode material, when a powder having a large specific surface area excellent in low-temperature activity is baked on the electrolyte, the specific surface area is decreased. There is a trade-off relationship between the adhesion of the cathode material to the electrolyte and the specific surface area after baking. In the case of high-temperature firing at about 1,000 to 1,150 ° C. in which the cathode material is directly baked on the CeO ₂ -based thin film intermediate layer, the adhesion is good, but the specific surface area decreases as the cathode particles become coarse. On the other hand, in the case of low temperature baking, the particle size does not change, but there is a conflicting problem that the adhesion between the cathode material and the solid electrolyte is poor.

The object of the present invention is to solve the problems of the prior art, and the same material as the cathode by the organometallic salt pyrolysis (MOD) method on the SOFC CeO ₂ solid electrolyte substrate or CeO ₂ thin film intermediate layer By constructing a composite layer structure comprising a mixed oxide ion / electron conductor (cathode nanocoat), low temperature baking of the cathode is possible, thereby reducing the surface area of the cathode particles and reducing the raw material powder It is an object of the present invention to provide a composite layer structure that can provide high-performance cathode performance and a method for manufacturing the same, and a method for manufacturing a cathode of a solid oxide fuel cell. Furthermore, another object is to provide a composite layer structure in which the cathode nanocoat itself has a cathode function.

The composite layer structure of the present invention comprises oxide ions / electrons made of the same material system as the cathode by the organometallic acid salt thermal decomposition (MOD) method on the SOFC CeO ₂ solid electrolyte substrate or CeO ₂ thin film intermediate layer. A mixed conductor layer (cathode nanocoat) is provided.

The method for producing a composite layer structure of the present invention uses a CeO ₂ -based solid electrolyte substrate or a CeO ₂ -based thin film intermediate layer as a substrate, and an organometallic acid salt solution is applied onto the substrate to mix oxide ions and electrons. A conductor layer precursor is formed, dried in air at a predetermined temperature, and then thermally annealed at 700 ° C. to 950 ° C. to form a desired oxide ion / electron mixed conductor layer, thereby forming a composite layer structure It is characterized by manufacturing. However, the thermal annealing treatment temperature is within the above thermal annealing temperature range (500 ° C. to 950 ° C., preferably 600 ° C.) in order to avoid the change over time of the oxide ion / electron mixed conductor during the SOFC operation. It is necessary to set the temperature to be equal to or higher than the temperature determined within the range of 700C to 900C, more preferably 700C to 900C.

  When the thermal annealing temperature is less than 700 ° C., cubic BSCF tends to be not formed, and when it exceeds 950 ° C., Co volatilization in BSCF tends to be concerned.

The cathode manufacturing method for a solid oxide fuel cell according to the present invention uses a SOFC CeO ₂ -based solid electrolyte substrate or CeO ₂ -based thin film intermediate layer, on which an organometallic acid salt solution is applied to form an oxide ion. An electron mixed conductor layer precursor is formed, dried in air, and then thermally annealed at 700 ° C. to 950 ° C. to form an oxide ion / electron mixed conductor layer. In order to prevent thermal deterioration of the conductor layer, either the temperature range between the operating temperature of the SOFC and the thermal annealing temperature, or the operating temperature range of the SOFC and a temperature range lower than 100 ° C., either one of the narrow temperature ranges The method is characterized in that the cathode is baked at a low temperature.

According to the present invention, oxide ions are formed by thermal annealing at a low temperature (700 to 950 ° C.) using a metal salt solution on a CeO ₂ solid electrolyte substrate or a CeO ₂ thin film intermediate layer by a MOD method.・ By forming the electronic conductor layer, the obtained oxide ion and electronic conductor layer (cathode nanocoat) itself can have excellent cathode performance, and the cathode can be baked on the electrolyte at low temperature. It has the effect of making it possible.

Sectional drawing of the composite layer structure of this invention. The graph which shows the measurement result of the differential heat | fever (DTA) and thermogravimetry (TG) of BSCF in this invention. Ba _0.5 Sr _0.5 Co _0.8 Fe _0.2 O _3-δ in the present invention (BSCF: δ is a variation due to oxygen deficiency and is a value determined to satisfy the electrical neutral condition.) The graph which shows the XRD diffraction result with respect to a layer. The spectrum which shows the result after deleting a background peak from the XRD diffraction result with respect to the BSCF layer in this invention. The photograph which shows the result of having observed the surface of the BSCF layer formed at 950 degreeC on the NGO single crystal substrate by SEM. The photograph which shows the result of having observed the fracture surface of the BSCF layer in this invention by SEM. The graph which shows the temperature dependence of the electrical conductivity of the BSCF layer in this invention. It is a photograph which shows the result of having observed the surface of the BSCF layer in this invention by SEM, (a) is a case where thermal annealing temperature is 700 degreeC, (b) is a case where thermal annealing temperature is 950 degreeC. In the present invention, Nyquist plots of impedance spectra at 575 ° C. under various oxygen partial pressures (0.01 atm to 0.50 atm). In the present invention, at various oxygen partial pressure (0.01atm~0.50atm), graphs showing specific area polarization resistance of the sample 1 for 1000 / T the _{(ASR pol).} In the present _invention, the graph for comparison in pO 2 = 0.05 atm and 575 ° C., the DRT spectrum obtained on the thin film cathode for the samples 1 and 3. In the present invention, Nyquist plots of impedance spectra at various oxygen partial pressures (0.01 atm to 0.50 atm). It is a photograph which shows the SEM image of the samples 1 and 3 after a test, (a) is the case of the sample 1 and (b) is the case of the sample 3.

  Embodiments of the present invention will be described below with reference to the drawings. First, an outline of the embodiment will be described, and then, this component will be described in detail.

According to the embodiment of the composite layer structure according to the present invention, the composite layer structure is a CeO ₂ -based layer, for example, a ceria-based layer doped with a rare earth element (for example, Gd-doped Ce _0.9 Gd _{0 .1} O _1.95 polycrystalline layer) is used as a substrate (CGO substrate), and an oxide ion / electron mixed conductor (for example, Ba _0.5 Sr _0.5 Co _0.8 Fe ₀ ) is formed on the substrate. _.2 O _3-δ (δ is a variation due to oxygen deficiency and is a value determined to satisfy the electrical neutral condition), etc.).

For example, in the composite layer structure shown in FIG. 1, a mixture of oxide ions and electrons is formed on a CeO ₂ thin film substrate 1 formed at a low temperature by a MOD method and by a low temperature thermal annealing method using an organometallic acid salt solution. A cathode nanocoat 2 made of a conductor layer is provided. The cathode material 3 is baked at a low temperature on the cathode nanocoat. In this case, the cathode nanocoat itself is very active as a nanocathode and has excellent cathode performance. Even when the cathode material is baked at a low temperature, the adhesion is good, the specific surface area does not decrease, and the cathode particles maintain the activity close to that of the raw material powder.

The oxide ion / electron mixed conductor layer (cathode nanocoat) in the present invention is made of the same material system as the cathode material. Examples of the cathode material include (La _1-x Sr _x ) (Co _1-y Fe _y ). O _3-δ , (Ba _1-x Sr _x ) (Co _1-y Fe _y ) O _{3-δ, and the} like can be given. In this case, the cathode nanocoat does not necessarily have the same composition as the cathode material. Examples of the CeO ₂ -based material include Ce _1-x M _x O _{2 -α} (M = trivalent rare earth element: Y, Gd, Sm, Dy, etc.).

Example 1
In the MOD method, grasping the decomposition temperature of the MOD solution is important in determining the film forming temperature (firing temperature, thermal annealing temperature). For example, since BSCF contains elements with high basicity of Ba and Sr, there is a high possibility that a carbonate is formed immediately after the organometallic acid salt is decomposed. The formation of carbonate has been confirmed to affect the subsequent BSCF oxide phase formation in the end, and in order to eliminate the influence of this carbonate, the carbonate is adjusted by adjusting the heating rate at the time of temperature increase. It is considered necessary to suppress the generation of. Therefore, in order to clarify the relationship between the decomposition temperature zone of the MOD solution and the heating rate of thermal annealing, differential thermal measurement (DSC404, manufactured by Netzsch, Germany) and thermogravimetry (TG439, manufactured by Netzsch, Germany) were performed. It was. FIG. 2 shows the measurement results of differential heat (DTA) and thermogravimetry (TG). The horizontal axis in FIG. 2 is the measurement temperature (° C.), and the vertical axis is the relative mass (Δm /%) and DTA (μVmg ⁻¹ ). In this measurement, the heating rate was set to 1 ° C./min and 15 ° C./min. As is apparent from FIG. 2, at any rate of temperature increase, in region I, significant weight loss accompanying the volatilization of the organic solvent and endotherm accompanying volatilization occur. Thereafter, in region II, heat generation and weight reduction accompanying thermal decomposition of the organometallic acid salt were confirmed. From this result, it was considered that the thermal decomposition of the organometallic acid salt was completed by about 450 ° C. After pyrolysis, formation of some hydroxides, carbonates, and oxides is considered to have started in region III. However, from the measurement principle, the formation process of multiple products is determined from the measurement of weight and heat quantity. Cannot be analyzed qualitatively. In the region IV, the weight reduction is finally over at 700 ° C. or higher. From this, it was speculated that at 700 ° C. or higher, the formation of the product accompanied by an increase or decrease in weight was completed, and an oxide close to the final product was formed. From the above, regarding the temperature rise in the film formation (annealing), it is desirable to bring it into the oxide formation region immediately after the decomposition of the organometallic acid salt which is completed by 450 ° C., and that the temperature rise rate in the film formation is faster. Since it is known that a densified result can be obtained, the present invention will be described by employing a heating rate of 15 ° C./min. It was also found that the phase identification of the film product is desirably performed at a temperature of 700 ° C. or higher.

(Example 2)
As a supporting substrate, a ceria-based oxide ion conductive oxide having a thickness of 400 μm and a diameter of 25 mm (CeO ₂ -based substrate doped with 10 mol% Gd as a CeO ₂ -based layer (CGO: Ce _0.9 Gd _0.1 O _{1 .95} polycrystalline substrate, manufactured by Daiichi Elemental Chemical Co., Ltd.)). On this substrate, each of the organometallic salts of Ba, Sr, Co, and Fe has a molar ratio of Ba, Sr, Co, and Fe of 0.5, 0.5, 0.8, and 0, respectively. A coating solution (MOD solution) dissolved in an ester organic solvent adjusted to be 2 is applied by one spin coating to form a uniform precursor layer, and then in air for 5 minutes at 200 ° C. After being dried at 600 ° C. to 950 ° C. (600 ° C., 700 ° C., 800 ° C., 850 ° C., 900 ° C., 950 ° C.) for 5 minutes, Ba _0.5 Sr _0.5 Co _{0. 8} Fe _0.2 O _3-δ (δ is a variation due to oxygen deficiency and is a value determined so as to satisfy the electrical neutral condition.) Cathode nanocoat layer (thin film cathode layer) composed of (BSCF) layer (conventional In technology, 1050-110 To prepare a composite layer structure composed of a sintered to have produced) at ° C.. The heating rate of thermal annealing was 15 ° C./min. The number of spin coatings can be changed as appropriate.

(Example 3)
As described in Example 2, a BSCF layer was formed on the CGO substrate by the MOD method, and the BSCF phase formation temperature was confirmed. That is, the organometallic acid salt solution for the BSCF layer is applied on the CGO substrate by one spin coating, and after drying, 600 ° C. to 950 ° C. (600 ° C., 700 ° C., 800 ° C., 850 ° C., Ba _0.5 Sr _0.5 Co _0.8 Fe _0.2 O _3-δ (δ is a variation due to oxygen deficiency) by performing thermal annealing at 900 ° C. and 950 ° C. (temperature increase rate: 15 ° C./min). It is a value determined so as to satisfy the electrical neutral condition.) A cathode nanocoat (thin film cathode layer) layer composed of layers was formed and analyzed by XRD diffraction. The X-ray diffraction results thus obtained are shown in FIG.

  For XRD measurement on this BSCF layer, Siemens D5000 (manufactured by Bruker-AXS, Germany) was used, and the X-ray incident angle was set to 1 °, and measurement was performed by the oblique incidence XRD method.

In the above-described TG measurement and DTA measurement, the formation of the product accompanied by increase / decrease in weight was completed at 700 ° C. or higher, and it was assumed that an oxide close to the final product was formed. From the diffraction results, at temperatures lower than 700 ° C., it was confirmed that hexagonal Ba _0.75 Sr _0.25 CoO _3-δ and hexagonal BSCF were formed before BSCF was formed. At 800 ° C., no hexagonal Ba _0.5 Sr _0.5 CoO ₃ was produced, and it was confirmed that hexagonal BSCF and cubic BSCF were produced. When the temperature was further increased, it was confirmed that a cubic BSCF single phase was produced at 900 ° C. Thus, it has been found that BSCF, which is a perovskite oxide, can be easily formed at a low temperature, which is a feature of the MOD method, in a CGO polycrystalline substrate.

Example 4
The physical property value (conductivity) of the BSCF layer formed as described above was measured. However, an NdGaO _three- layer substrate (NGO (110) single crystal substrate) was used instead of the ceria-based substrate. This is to prevent the measurement of physical property values from being affected. This physical property value measurement is performed at 950 ° C., which is the highest film formation temperature (thermal annealing temperature) that is considered to have the smallest influence of a small amount of the second phase. The phase of the formed BSCF layer was identified.

  FIG. 4 shows a result obtained by deleting the background peak from the XRD measurement result by the oblique incidence method with respect to the formed BSCF layer. The cubic BSCF literature value (Powder Diffr., 18, (2003) 56)) and the peak position almost coincided, so that the obtained layer could be identified as a cubic BSCF polycrystalline layer.

  Further, FIG. 5 shows the result of SEM observation of the surface of the BSCF layer formed at 950 ° C. on the NGO single crystal substrate having a smooth surface. In visual observation, the film surface appeared to be a perfect mirror surface, but in SEM observation, the BSCF layer was formed almost smoothly on the surface of the NGO substrate as compared with the surface of the CGO substrate.

  The fracture surface of the BSCF layer obtained as described above was observed with an SEM, and the result is shown in FIG. As film formation conditions, spin coating was performed five times, and then baked at 950 ° C. for 60 minutes. The obtained BSCF layer was dense, and the thickness was 61 nm in this SEM observation. As a result of a plurality of experiments, it was confirmed that the thickness was in the range of about 50 nm to 100 nm. A very uniform and smooth product was obtained.

Next, physical property values (conductivity) of the formed BSCF layer were measured. As described above, an NdGaO _three- layer substrate (NGO (110) single crystal substrate) is used as a substrate, and a BSCF layer is formed on the substrate at a firing temperature (thermal annealing temperature) of 950 ° C. according to the above and used for measurement. did.

  The conductivity was measured as follows. Gold electrodes were vapor-deposited on both ends of the BSCF layer sample by magnetron DC sputtering, and then a lead gold wire was spot-welded to the electrode portion and mounted on each of the current and voltage terminals of the measurement jig for measurement. The resistance measurement was performed using an Agilent 34420 micro-ohmmeter with a two-terminal method at intervals of 20 seconds between 300 and 800 ° C. while raising the temperature in an electric furnace at 15 ° C./min. The actual resistance was measured by a current method (10 μA to 1 mA). Thereafter, conductivity [S / cm] (S (Siemens) = 1 / Ω) was obtained by calculation as cell constant [1 / cm] ÷ measured resistance [Ω]. Cell constant = thickness × sample width / distance between electrodes = 61 nm × 10 mm / 6.5 mm.

FIG. 7 shows the result of calculating the conductivity from the resistance value measured as described above. In FIG. 7, the horizontal axis is the measurement temperature (° C.), and the vertical axis is the conductivity (σ / Scm ⁻¹ ). In FIG. 7, the conductivity measured by the BSCF bulk body and the conductivity of the BSCF thin film physically formed by the pulse laser deposition (PLD) method are shown. As is apparent from FIG. 7, the conductivity of the BSCF layer formed by the MOD method is smaller than that of the epitaxially grown film, but higher than that of the bulk body. Therefore, it can be seen that the obtained BSCF layer is useful as a thin film cathode or the like.

  As is apparent from FIG. 7, regarding the temperature dependence of the conductivity, the bulk body has no change in the value accompanying the temperature rise at 500 ° C. or higher, but rather decreases around 450 ° C. as the maximum value. However, the electrical conductivity of the BSCF layer formed by the MOD method or the thin film formed by the PLD method increases as the temperature increases. This is considered to be due to the fact that BSCF is a mixed conductor of oxide ions and electrons. In an air atmosphere, it is known that the contribution of oxide ion conduction increases with increasing temperature and the contribution of electronic conduction decreases in the air atmosphere, thereby reducing the total total conductivity. It can be considered that the result of FIG. 7 has a difference in the contributions of oxide ion conduction and electronic conduction accompanying the temperature rise. That is, in the BSCF thin film formed by the PLD method, the contribution of conductivity is small due to oxide ions, and the decrease in the contribution of electrical conduction is small, so that the decrease in total conductivity is suppressed. That is, it means that the electronic conductivity is higher than the bulk body and the oxide ion conductivity is low. In the present invention, the BSCF layer formed at a low temperature by the MOD method has no orientation and is a polycrystalline BSCF layer as a result of XRD analysis. The dependence is considered to be close to the temperature dependence of the bulk body.

(Example 5)
According to the description in Example 2, the surface state of the BSCF layer formed on the CGO substrate at the thermal annealing temperatures of 700 ° C. and 950 ° C. was observed by SEM, and the results are shown in FIGS. FIG. 8A shows the case where the thermal annealing temperature is 700 ° C., and FIG. 8B shows the case where the thermal annealing temperature is 950 ° C. When the thermal annealing temperature is 700 ° C., a BSCF layer is formed by spin coating the MOD solution once, and when the thermal annealing temperature is 950 ° C., the BSCF layer is formed by spin coating the MOD solution five times. did.

  As is clear from FIGS. 8A and 8B, when the temperature is lower than 700 ° C., from the results of XRD diffraction, the formation of BSCF layer has not yet occurred, and the surface has innumerable nano-sized pores. However, in the case of 950 ° C., nano-sized pores were lost. Although it seems that there is an influence of five times of spin coating, it has been found that a sufficiently densified BSCF layer can be formed on the CGO substrate by thermal annealing at 950 ° C. This BSCF layer was formed with good adhesion to the CGO substrate, and no peeling or the like due to heat treatment during the formation was observed.

Then, according to the description of Example 2, on the Ce _0.9 Gd _0.1 O _1.95 electrolyte substrate, by spin coating of the MOD solution, followed by thermal decomposition of the organometallic precursor according to the MOD method, The cathode reaction process will be described for a thin film cathode (cathode nanocoat) composed of a nano-sized Ba _0.5 Sr _0.5 Co _0.8 Fe _0.2 O _3-δ layer deposited with a film thickness of 100 nm or less. Electrochemical impedance spectroscopy was performed with systematic variation in the temperature (T = 500-625 ° C.) and oxygen partial pressure (pO ₂ = 0.01 atm to 0.5 atm) ranges. The impedance data was then analyzed by calculating the relaxation time (DRT) distribution and performing a composite / complex nonlinear least squares (CNLS) fitting. Five processes were identified in the cathode reaction. A specific area polarization resistance as low as ASR _pol = 39 mΩcm ² was found at 600 ° C.

In accordance with the description in Example 2, after spin coating the MOD solution on both sides of a CeO ₂ based substrate having a diameter of 25 mm and a thickness of 0.4 mm, it was dried in air at 200 ° C. for 5 minutes, and then to 500 ° C. The temperature was raised at 15 ° C./min, and then raised to 700 ° C. at 3 ° C./min to obtain a BSCF nanocathode coat (in this case, the nanocathode coat was a cubic BSCF as shown in Example 3). Need not be single phase). Thereafter, a commercially available BSCF cathode powder was baked on both sides with a 1 cm ² area. This was used as a symmetrical cell for the test (Sample 1). Sample 2 was not coated with a nano-cathode, but was directly baked with BSCF cathode powder at 1 cm ² area on both sides of the CeO ₂ substrate. In each case, the cathode powder was baked at 700 ° C., which is considerably lower than the conventional baking temperature of 1,000 to 1,150 ° C.

FIG. 9 shows a Nyquist plot of the impedance spectrum of Sample 1 performed at 575 ° C. with various oxygen partial pressures ranging from pO ₂ = 0.01 to 0.5 atm. For better comparison, the resistance loss value was subtracted from the real part of the data. FIG. 10 shows ASR _pol . The polarization loss was reduced to ASR _pol = 0.039 Ωcm ² at 600 ° C. and pO ₂ = 0.2 atm. This value is extremely low.

DRT spectra obtained for sample 1 (with cathode nanocoat) and sample 2 (without cathode nanocoat) at a low temperature cathode baking of the cathode powder on the cathode nanocoat by the MOD method at pO ₂ = 0.05 atm and 575 ° C. A comparison of these is shown in FIG. Sample 1 was spin-coated with a MOD solution on a CGO substrate according to the description in Example 2, then dried in air for 5 minutes at 200 ° C., and then heated at 500 ° C. at a rate of 15 ° C./min. Then, thermal annealing was performed at 700 ° C. at a rate of temperature increase of 3 ° C./min.

As a result of the DRT analysis and the AC impedance analysis in FIG. 11, it can be seen that the elementary processes P4 and P5 corresponding to the interface resistance are almost eliminated by low-temperature cathode baking with the cathode nanocoat (point A in the figure). Further, from FIG. 12 (Nyquist plot of impedance spectra performed at various oxygen partial pressures in the range of pO ₂ = 0.01 atm to 0.5 atm), by inserting BSCF cathode nanocoat by MOD method into the BSCF cathode. It can be seen that the interfacial resistance (elementary process P4 + P5) disappears (point A in the figure) and the cathode performance (elementary process P2 + P3) clearly improves (point B in the figure).

  Further, when the cathode powder was baked at a low temperature on the cathode nanocoat by the MOD method, SEM images of the cross section were compared between the case where the BSCF thin film cathode nanocoat was provided and the case where it was not provided (FIG. 13 (a) and (B)). As is apparent from FIG. 13 (a) when the BSCF cathode nanocoat is provided, the nanostructure remains clearly on the BSCF cathode surface after the test and retains the activity (point A in the figure). It can be seen that there is continuity at the electrolyte interface (point B in the figure). From FIG. 13B when the BSCF cathode nanocoat is not provided, the nanostructure remains on the BSCF cathode surface after the test (point A ′ in the figure), but the continuity of the activity at the electrolyte interface is impaired. (B 'point in the figure).

As described above, the precursor is formed by spin coating using the MOD method, and then thermally annealed at a low temperature to prepare nano-sized Ba _0.5 Sr _0.5 Co _0.8 prepared on the CGO electrolyte. As described above, the Fe _0.2 O _3-δ -based thin film cathode (cathode nanocoat) was able to achieve a low polarization resistance of ASR _pol = 0.039 Ωcm ² at 600 ° C. and pO ₂ = 0.2 atm. Electrochemical analysis of nano-sized BSCF-based thin film cathodes using DRT calculations and CNLS fitting clearly demonstrated the existence of up to five different elementary processes related to cathode polarization. Therefore, by providing a nano-sized thin-film cathode composite layer structure (cathode nanocoat), the cathode powder is baked at a lower temperature (test operating temperature) without being subjected to conventional high-temperature baking. It can provide a high performance cathode with low polarization resistance.

  According to the present invention, the cathode powder can be baked at a low temperature on the cathode nanocoat prepared by the MOD method, and the surface area of the cathode particles is not decreased, and the activity close to that of the raw material powder can be maintained. Since the structure and the manufacturing method thereof can be provided, the obtained cathode thin film (cathode nanocoat layer) is used in a solid oxide fuel cell, a solid oxide electrolysis cell (Solid Oxide Electrolyzer Cell), and its industrial field. Is possible.

1 CeO ₂ -based thin film substrate 2 Cathode nanocoat 3 Cathode material

Claims (2)

Using a solid oxide fuel cell (SOFC) CeO ₂ -based solid electrolyte substrate or CeO ₂ -based thin-film intermediate layer, an organometallic acid salt solution is applied on it and mixed with oxide ions and electrons A conductor layer precursor is formed, dried in air, and then thermally annealed at 700 ° C. to 950 ° C. to form a mixed oxide ion / electron conductor layer to produce a composite layer structure. A method for producing a composite layer structure. Using an SOFC CeO ₂ solid electrolyte substrate or CeO ₂ thin film intermediate layer, an organometallic acid salt solution is applied on it to form a mixed oxide ion / electron conductor layer precursor, which is then dried in air. Then, the oxide ion / electron mixed conductor layer is formed by thermal annealing at 700 ° C. to 950 ° C., and then the cathode is baked at a low temperature near the operating temperature of SOFC. A method for producing a cathode of a fuel cell.