JP6311791B2 - Time-of-flight mass spectrometer - Google Patents

Description

  The present invention relates to a time-of-flight mass spectrometer (hereinafter abbreviated as “TOFMS”). More specifically, the present invention relates to an orthogonal acceleration TOFMS and an ion trap that temporarily holds ions. The present invention relates to an ion trap TOFMS that ejects ions from a trap and introduces them into a flight space.

  In general, in TOFMS, a constant kinetic energy is applied to ions derived from a sample component to fly in a space of a fixed distance, the time required for the flight is measured, and the mass-to-charge ratio of the ions is calculated from the flight time. For this reason, when ions are accelerated and flight is started, if there are variations in the position of ions or the initial energy of ions, variations in the flight time of ions with the same mass-to-charge ratio will result in a decrease in mass resolution and mass accuracy. It leads to. One of the techniques to solve these problems is the orthogonal acceleration (also called “vertical acceleration” or “orthogonal extraction”) method that accelerates ions in the direction perpendicular to the incident direction of the ion beam and sends them to the flight space. It has been.

  The orthogonal acceleration method TOFMS includes an orthogonal acceleration unit in which an extrusion electrode that forms an electric field that has an action of pushing out ions and an extraction electrode that forms an electric field that pulls out ions (or only one of them) are arranged, When ions are incident on the orthogonal acceleration portion, a predetermined pulsed acceleration voltage is applied to the extrusion electrode and the extraction electrode, respectively, so that the ions are accelerated in a direction substantially orthogonal to the incident direction. In the orthogonal acceleration part, only ions existing in the orthogonal acceleration part (strictly speaking, a region between the extrusion electrode and the extraction electrode) are accelerated at the timing when the acceleration voltage is applied. Therefore, if the ions vary in the traveling direction due to the difference in mass-to-charge ratio before various ions emitted from the ion source or the like are introduced into the orthogonal acceleration unit, the mass of ions accelerated in the orthogonal acceleration unit The charge ratio range is narrowed. As a result, only one mass spectrum in a narrow mass-to-charge ratio range can be obtained by one measurement (one injection of ions from the orthogonal acceleration unit).

  Patent Document 1 discloses a mass spectrometer corresponding to such a problem. The mass spectrometer described in this document passes ions generated by an ion source by a matrix-assisted laser desorption ionization (MALDI) method through a first flight space and a second flight space including a collision cell. And having a configuration to be introduced into the orthogonal acceleration unit of the orthogonal acceleration method TOFMS. An acceleration region is provided between the first flight space and the second flight space, and the strength of the acceleration electric field formed in the acceleration region is changed with time.

Various ions emitted from the ion source are separated according to the mass-to-charge ratio while passing through the first flight space, and pass through the acceleration region in order from the ions with the lowest mass-to-charge ratio. Therefore, the temporal change of the acceleration electric field is appropriately determined so that the larger the mass-to-charge ratio is, the larger the acceleration energy is given. Thereby, the flight speed of ions having a large mass-to-charge ratio that progresses later than ions having a small mass-to-charge ratio that progresses earlier increases, and the ions that are delayed while flying in the second flight space gradually increase. Catch up with the ion that precedes. As a result, ions having a small mass-to-charge ratio and ions having a large mass to charge ratio are introduced into the orthogonal acceleration portion almost simultaneously.
In this way, ions in a wide mass-to-charge ratio range from low to large mass-to-charge ratios are introduced into the orthogonal acceleration section almost simultaneously, so by applying an acceleration voltage at that timing, the ions can be combined all at once. Accelerate and send to flight space. Thereby, a mass spectrum in a wide mass-to-charge ratio range can be acquired by one measurement.

  However, in the mass spectrometer described in Patent Document 1, ions having different mass-to-charge ratios are introduced into the orthogonal acceleration unit almost simultaneously, but the energy of each ion at that time is not necessarily uniform. The direction in which the ions accelerated in the orthogonal acceleration part jump out depends on the energy component in the ion incident axis direction that each ion has immediately before, so if the energy of each ion varies, the ion The pop-out direction (angle) will also vary. As a result, some ions cannot reach the detector, and the range of the mass-to-charge ratio is narrowed accordingly, or the amount of ions reaching the detector is reduced, resulting in a decrease in sensitivity. In addition, for ions that can reach the detector, the flight distance may deviate from the ideal state due to the deviation of the jumping direction, which may reduce the mass accuracy.

U.S. Patent No. 7087897 JP 2002-184349 A

  The present invention has been made to solve the above-mentioned problems, and the object of the present invention is to perform mass spectrometry over a wide range of mass-to-charge ratios in a single measurement, as well as high analytical sensitivity and high To provide a time-of-flight mass spectrometer capable of ensuring mass accuracy.

The first aspect of the present invention, which has been made to solve the above problems, is to separate the accelerated ions according to the mass-to-charge ratio, and an orthogonal acceleration unit that accelerates the incident ions in a direction orthogonal to the incident axis. An orthogonal acceleration type time-of-flight mass spectrometer comprising:
a) an ion holding unit that cools ions to be measured and temporarily holds the ions;
b) A conductive material having an entrance end face and an exit end face provided between the ion holding part and the orthogonal acceleration part and provided with slits for restricting the width of the ion beam in the acceleration direction of the orthogonal acceleration part, respectively. A beam shaping unit that is a cylindrical body;
c) After holding ions in the ion holding unit, a first voltage application for controlling the voltage applied to the ion holding unit so as to release the held ions toward the beam shaping unit at a predetermined timing. And
d) In the first region between the exit end of the ion holding unit and the entrance end of the beam shaping unit, ions emitted from the ion holding unit have a greater acceleration as they pass through the first region with a delay. Forming an electric field whose strength changes over time, and in the second region between the exit end of the beam shaping unit and the entrance end of the orthogonal acceleration unit, the first region and the beam The difference in position and energy of ions having different mass-to-charge ratios generated when the ions that have passed through the region in the shaping unit pass through the second region at the timing of passing through the first region and the region in the beam shaping unit. A second voltage applying unit that applies a DC voltage that changes with time to the beam shaping unit so as to form an electric field whose strength changes with time so as to adjust the difference between
It is characterized by having.

In addition, the second aspect of the present invention, which was made to solve the above-described problems, is that ions are emitted almost simultaneously by applying acceleration energy to the ions at a predetermined timing after capturing the incident ions by the action of an electric field. A time-of-flight mass spectrometer comprising: an ion trap unit that performs separation and a detection unit that separates and detects ions ejected from the ion trap unit according to a mass-to-charge ratio;
a) an ion holding unit that cools ions to be measured and temporarily holds the ions;
b) A beam shaping unit that is a conductive cylindrical body that is disposed between the ion holding unit and the ion trap unit and has an entrance end surface and an exit end surface each provided with a slit that regulates the diameter of the ion beam. When,
c) After holding ions in the ion holding unit, a first voltage application for controlling the voltage applied to the ion holding unit so as to release the held ions toward the beam shaping unit at a predetermined timing. And
d) In the first region between the exit end of the ion holding unit and the entrance end of the beam shaping unit, ions emitted from the ion holding unit have a greater acceleration as they pass through the first region with a delay. An electric field whose strength changes over time as formed, and in the second region between the exit end of the beam shaping unit and the entrance end of the ion trap unit, the first region and the beam The difference in position and energy of ions having different mass-to-charge ratios generated when the ions that have passed through the region in the shaping unit pass through the second region at the timing of passing through the first region and the region in the beam shaping unit. A second voltage applying unit that applies a DC voltage that changes with time to the beam shaping unit so as to form an electric field whose strength changes with time so as to adjust the difference between
It is characterized by having.

  In the time-of-flight mass spectrometer according to the first and second aspects of the present invention, the ion holding unit may be a linear ion trap disposed in a collision cell that dissociates ions.

  Typically, the linear ion trap is arranged so that four cylindrical rod electrodes arranged in parallel to each other around the central axis and perpendicular to the central axis with the four rod electrodes interposed therebetween. An inlet-side gate electrode and an outlet-side gate electrode. A high-frequency voltage is applied to the rod electrode to form a high-frequency electric field that converges ions in a space surrounded by four rod electrodes, and the rod electrode is applied to the inlet side gate electrode and the outlet side gate electrode. The ions are confined between both gate electrodes by applying a DC voltage that generates a potential higher than the potential caused by the DC voltage. The inlet side gate electrode and the outlet side gate electrode can be the inlet side end face and the outlet side end face of the collision cell.

  By changing the applied potential to the outlet side gate electrode so that the potential at the position of the outlet side gate electrode is at least lower than the potential at the position of the rod electrode, the ions held as described above are transferred to the beam shaping unit. In this case, in order to emit ions in a state that is as clumped as possible (that is, in the form of packets), the end on the outlet side of the rod electrode when holding the ions. It is desirable that ions be accumulated near the portion. In order to accumulate ions in the vicinity of the outlet side end of the rod electrode in this way, for example, by using the configuration described in Patent Document 2, the axial direction is inclined downward toward the outlet side end of the rod electrode. A potential gradient of

  In the time-of-flight mass spectrometer according to the first aspect of the present invention, the ion holding unit cools ions to be measured using collision with a cooling gas or the like. Thereby, the energy of all ions is made to be equal to each other regardless of the mass-to-charge ratio. When the voltage applied from the first voltage application unit to the ion holding unit is changed, the ions held in the ion holding unit are released to some extent. On the other hand, the second voltage application unit changes the voltage applied to the beam shaping unit in a predetermined pattern from the time when ions are released from the ion holding unit. That is, immediately after ions are released from the ion holding portion, an application is performed so that an electric field that is accelerated more rapidly as ions passing through the first region are formed in the first region in a period in which the ions pass through the first region. Change the voltage. As a result, more energy is imparted to ions having a larger mass-to-charge ratio than ions having a smaller mass-to-charge ratio that pass through the first region in advance because they are easy to move, thereby increasing the speed.

  Ions having a relatively large mass-to-charge ratio, which has been given a large energy when passing through the first region, enter the beam shaping unit behind the ions having a relatively small mass-to-charge ratio, but have a high velocity. Therefore, it gradually catches up with preceding ions while passing through the space inside the beam shaping unit. Therefore, as in the invention described in Patent Document 1, by appropriately adjusting the electric field in the first region without using the electric field in the second region, ions having different mass to charge ratios are orthogonally accelerated almost simultaneously. It is possible to reach the part. However, in that case, ions having a large mass-to-charge ratio have a larger energy than ions having a relatively small mass-to-charge ratio, and the energy of each ion is not uniform.

  Therefore, in the present invention, in the second region between the beam shaping unit and the orthogonal acceleration unit, the energy of ions having a large mass-to-charge ratio is reduced, or the energy of ions having a small mass-to-charge ratio is increased, or By both of them, the energy of each ion is adjusted just before the orthogonal acceleration unit. However, for example, if the energy is increased in the second region, the speed increases. Therefore, in order to align the position at the time of incidence on the orthogonal acceleration portion, ions having a larger mass-to-charge ratio enter the second region in advance. To. In order to realize this, a large energy is given to ions that are delayed in the first region, and ions having a relatively large mass-to-charge ratio in the middle of passing through the internal space of the beam shaping unit are preceded by mass It is only necessary to catch up and overtake ions with a relatively small charge ratio.

  That is, in the time-of-flight mass spectrometer according to the present invention, the second voltage application unit overtakes the ions incident earlier while the ions incident on the beam shaping unit pass through the beam shaping unit. When the ions pass through the first region, an electric field whose intensity changes with time is formed in the first region so that the ions emitted from the beam shaping unit are second. A structure in which an electric field whose intensity changes in time is formed in the second region so as to increase the energy of ions emitted from the beam shaping unit with a delay while passing through the region. It is good to do.

  As a result, even when the mass-to-charge ratios of the ions to be measured are various, when the ions are introduced into the orthogonal acceleration part, the ions with various mass-to-charge ratios are not substantially spread in the ion traveling direction and are almost clustered. Introduced. Thereby, ions over a wide mass-to-charge ratio range can be accelerated and sent to the flight space. In addition, since variation in energy of each ion during acceleration at the orthogonal acceleration portion is suppressed, variation in ejection direction due to acceleration is also reduced.

  In the time-of-flight mass spectrometer according to the second aspect of the present invention, similarly to the time-of-flight mass spectrometer according to the first aspect, the first region, the beam shaping unit, and the second region are sequentially passed. Immediately thereafter, ions enter the ion trap section. At this time, since the spread of ions in the ion traveling direction is small, ions over a wide mass-to-charge ratio range can be trapped in the ion trap portion without wasting. In addition, since the energy of the ions introduced into the ion trap part is substantially uniform, the ions pass through the ion trap part without being captured by the high frequency electric field, or contact the inner surface of the electrode constituting the ion trap part. Can be avoided.

As described above, when the linear ion trap disposed in the collision cell is used as the ion holding unit, the degree of vacuum in the vacuum chamber in which the collision cell is disposed is the collision gas supplied to the collision cell from the outside. It is easy to fall under the influence of.
Therefore, in the time-of-flight mass spectrometer according to the present invention, the ion holding unit, the orthogonal acceleration unit and the separation detection unit, or the ion trap unit and the separation detection unit are different vacuum chambers separated by a partition wall. It is preferable that the beam shaping unit is arranged across both vacuum chambers with the partition wall interposed therebetween.

  According to the time-of-flight mass spectrometer according to the first aspect of the present invention, ions in a wide mass-to-charge ratio range are introduced into the orthogonal acceleration unit without spreading in the ion traveling direction, and therefore these ions are measured at a time. Can do. Thereby, a mass spectrum over a wide mass-to-charge ratio range can be obtained by a single measurement. In addition, since the variation in the direction of ion emission from the orthogonal acceleration unit to the flight space is reduced, the detection sensitivity can be improved by allowing a larger amount of ions to reach the detector, and the variation in the flight distance is also increased. By reducing the size, the mass accuracy is also improved.

  Moreover, according to the time-of-flight mass spectrometer according to the second aspect of the present invention, ions in a wide mass-to-charge ratio range can be captured in the ion trap part and used for mass analysis without being wasted. Therefore, as in the time-of-flight mass spectrometer according to the first aspect, a highly sensitive mass spectrum over a wide mass-to-charge ratio range can be obtained by a single measurement.

BRIEF DESCRIPTION OF THE DRAWINGS The whole Q-TOFMS block diagram which is one Example of this invention. The detailed block diagram from the collision cell in FIG. 1 to an orthogonal acceleration part. The figure which shows the time change of the DC voltage applied to a beam slicer in Q-TOFMS of a present Example. The figure which shows the result of having simulated the relationship between the position of the ion from a collision cell exit to an orthogonal acceleration part entrance, and flight time in Q-TOFMS of a present Example. The figure which shows the result of having simulated the relationship between the energy of the ion from a collision cell exit to an orthogonal acceleration part entrance, and flight time in Q-TOFMS of a present Example.

Q-TOFMS, which is an embodiment of the present invention, will be described with reference to the accompanying drawings.
FIG. 1 is an overall configuration diagram of the Q-TOFMS of this embodiment.

  The Q-TOFMS of the present embodiment has a multi-stage differential exhaust system configuration, and the first to the first vacuum chambers are provided between the ionization chamber 2 that is an atmosphere of substantially atmospheric pressure and the high vacuum chamber 6 having the highest degree of vacuum. Three intermediate vacuum chambers 3, 4, 5 are arranged in the chamber 1.

  The ionization chamber 2 is provided with an ESI spray 7 for performing electrospray ionization (ESI). When a sample liquid containing a target compound is supplied to the ESI spray 7, a charge that is offset by the tip of the spray 7 is applied. Then, ions derived from the target compound are generated from the sprayed droplets. The ionization method is not limited to this. For example, when the sample is liquid, atmospheric pressure ionization methods such as APCI and PESI other than ESI can be used, and the sample is solid. The MALDI method or the like can be used. When the sample is in a gaseous state, the EI method or the like can be used.

  The generated various ions are sent to the first intermediate vacuum chamber 3 through the heating capillary 8, converged by the ion guide 9, and sent to the second intermediate vacuum chamber 4 through the skimmer 10. Further, the ions are converged by the octopole ion guide 11 and sent to the third intermediate vacuum chamber 5. In the third intermediate vacuum chamber 5, a quadrupole mass filter 12 and a collision cell 13 in which a quadrupole ion guide 14 functioning as a linear ion trap is provided. Various ions derived from the sample are introduced into the quadrupole mass filter 12, and only ions having a specific mass-to-charge ratio corresponding to the voltage applied to the quadrupole mass filter 12 pass through the quadrupole mass filter 12. . These ions are introduced into the collision cell 13 as precursor ions, and the precursor ions are dissociated by contact with the CID gas supplied from the outside into the collision cell 13 to generate various product ions.

  The ion guide 14 functions as a linear ion trap, and the generated product ions are temporarily held. The held ions are emitted from the collision cell 13 at a predetermined timing, and are introduced into the high vacuum chamber 6 through the beam slicer 15. The beam slicer 15 is disposed across the third intermediate vacuum chamber 5 and the high vacuum chamber 6.

  In the high vacuum chamber 6, an orthogonal acceleration unit 17 that is an ion emission source, a flight space 20 including a reflector 21 and a back plate 22, and an ion detector 23 are provided. The ions introduced in the X-axis direction are accelerated in the Z-axis direction at a predetermined timing to start flying. The ions ejected from the orthogonal acceleration unit 17 first fly free, and then are folded back by a reflected electric field formed by the reflector 21 and the back plate 22, and then freely fly again and reach the ion detector 23. The time of flight from when the ions leave the orthogonal acceleration unit 17 until they reach the ion detector 23 depends on the mass-to-charge ratio of the ions. Therefore, the data processing unit (not shown) that receives the detection signal from the ion detector 23 calculates the mass-to-charge ratio from the flight time of each ion, and creates a mass spectrum based on the calculation result, for example.

FIG. 2 is a detailed configuration diagram from the collision cell 13 to the orthogonal acceleration unit 17 in FIG.
The front end surface and the rear end surface of the collision cell 13 are an entrance side gate electrode 131 and an exit side gate electrode 132, respectively. The entrance side gate electrode 131, the exit side gate electrode 132, and the ion guide 14 function as a linear ion trap. To do.

  The beam slicer 15 is a conductive cylindrical body having an axis C as a central axis, and an entrance slit 152 is formed on the entrance end surface 151, and an exit slit 154 is formed on the exit end surface 153. The main function of the beam slicer 15 is to suppress the spread of the ion beam introduced into the orthogonal acceleration unit 17 in the Z-axis direction by sequentially passing ions through two slits 152 and 154 that are separated by a predetermined distance in the axis C direction. That is.

  The orthogonal acceleration unit 17 includes an entrance electrode 171 having an opening on the axis C, an extrusion electrode 172 and a grid-shaped extraction electrode 173 arranged to face each other with the axis C interposed therebetween.

Under the control of the control unit 30, the entrance-side gate electrode power supply unit 31 applies a predetermined DC voltage to the entrance-side gate electrode 131, and the ion guide power supply unit 32 applies high-frequency voltage to the four rod electrodes constituting the ion guide 14. a predetermined voltage obtained by adding a DC voltage, the outlet-side gate electrode power supply unit 33 applies each a predetermined DC voltage to the exit side gate electrode 13 2. Similarly, the slicer power supply unit 34 applies a predetermined DC voltage to the beam slicer 15, the orthogonal acceleration inlet electrode power supply unit 35 applies a predetermined DC voltage to the inlet electrode 171, and the orthogonal acceleration power supply unit 36 outputs the extrusion electrode 172 and the extraction electrode. A predetermined DC voltage is applied to each of 173.

  In the Q-TOFMS of this embodiment, as described above, CID gas is introduced into the collision cell 13, and the ions introduced into the collision cell 13 are brought into contact with the CID gas to cause cleavage to generate various product ions. To do. This product ion is the ion to be measured. Here, the ions to be measured are positive ions, but in the case of negative ions, the polarity of the DC voltage applied to each part may be reversed.

  As described above, when generating product ions, the outlet-side gate electrode power supply unit 33 applies a predetermined DC voltage higher than the DC voltage applied to the ion guide 14 to the outlet-side gate electrode 132. As a result, a potential barrier that suppresses ions is formed between the outlet end of the ion guide 14 and the outlet-side gate electrode 132, whereby the ions are generally held inside the ion guide 14. Ions are captured by a high-frequency electric field formed by a high-frequency voltage applied to the ion guide 14 from the ion guide power supply unit 32. At that time, the ions are cooled by being deprived of energy by contacting the CID gas. . By this cooling, each trapped ion has almost zero energy, and the initial energy is aligned.

  Note that the ion guide 14 has an internal space that is long in the direction of the axis C, and ions are released from the ion guide 14 if the ions vary greatly in the axial direction when ions are held in the internal space. At this time, the spread of ions in the axial direction is likely to occur due to the time difference until the acceleration electric field is reached. Therefore, when the ions are held in the internal space of the ion guide 14 (or at least immediately before the ions are released), the ions are accumulated at a position close to the exit side end portion of the ion guide 14. Is preferred. For this purpose, it is preferable to use the configuration described in Patent Document 2 and form an axial potential gradient that is inclined downward as it goes from the inlet end to the outlet end of the ion guide 14.

  As described above, in a state where ions to be measured are held in the internal space of the ion guide 14, the outlet side gate electrode power supply unit 33 temporarily applies the applied voltage so as to lower the potential at the position of the outlet side gate electrode 132. Lower. Thereby, ions held by the ion guide 14 are emitted in the direction of the beam slicer 15. As described above, when an axial potential gradient is formed in the ion guide 14, ions having various mass-to-charge ratios are emitted in a packet shape.

  The slicer power supply unit 34 changes the DC voltage applied to the beam slicer 15 with the passage of time in a pattern as shown in FIG. In the first region P1 between the exit-side gate electrode 132 and the entrance end surface 151 of the beam slicer 15, a difference between the DC voltage applied to the exit-side gate electrode 132 and the DC voltage applied to the beam slicer 15 is determined. An accelerating electric field is formed. Since various ions emitted from the ion guide 14 enter the first region P1 immediately after that, in FIG. 3, approximately 0 to 4 [μsec] is a time range in which the ions pass through the first region P1.

  In this time range, the voltage applied to the beam slicer 15 is substantially constant at the beginning, and then is sharply lowered. The potential difference indicated by arrow A in FIG. 3 corresponds to the intensity of the acceleration electric field in the first region P1 (in other words, the magnitude of energy applied to the ions). That is, in the first region P1, ions are hardly accelerated at first, but thereafter, the ions receive large energy as time passes. Since the initial energies of the ions introduced into the first region P1 are almost uniform, initially, ions having a small mass-to-charge ratio have a higher speed than ions having a large mass-to-charge ratio, and pass through the first region P1. In this case, ions having a small mass-to-charge ratio precede the ions having a large mass-to-charge ratio. As a result, since ions having a small mass-to-charge ratio pass through the first region P1 before the voltage applied to the beam slicer 15 is greatly reduced, the energy received when passing through the first region P1 is small. On the other hand, an ion with a larger mass-to-charge ratio at a position delayed when passing through the first region P1 passes through a stronger acceleration electric field, so that the energy received when passing through the first region P1 is larger. Become. Accordingly, when passing through the first region P1 and entering the beam slicer 15 through the entrance slit 152, the ions with a larger mass-to-charge ratio entering later have higher energy and higher speed.

  After almost all the ions are incident on the beam slicer 15, the ions are not affected by the electric field while passing through the internal space of the beam slicer 15. Accordingly, the ions fly almost freely at the speed they have when they enter the beam slicer 15. As described above, ions having a large mass-to-charge ratio enter the beam slicer 15 later than ions having a small mass-to-charge ratio. Further overtake. As a result, contrary to when entering the beam slicer 15, when exiting from the beam slicer 15 via the exit slit 154, ions having a high mass and a large mass-to-charge ratio are preceded by a large velocity. .

  In the second region P2 between the exit end face 153 of the beam slicer 15 and the entrance electrode 171 of the orthogonal acceleration unit 17, the difference between the DC voltage applied to the beam slicer 15 and the DC voltage applied to the entrance electrode 171 is provided. A deceleration electric field corresponding to is formed. Here, since it takes about 15 [μsec] or more for the ions introduced into the beam slicer 15 to pass through the internal space, in FIG. 3, approximately 21 to 28 [μsec] are in the second region P2. Is the time range that passes through. In this time range, the voltage applied to the beam slicer 15 is increased from the predetermined voltage with a substantially constant slope. The potential difference indicated by the arrow B in FIG. 3 corresponds to the strength of the deceleration electric field in the second region P2 (in other words, the magnitude of energy deprived from the ions), and the potential difference indicated by the arrow D is equal to the second region P2. Corresponds to the strength of the acceleration electric field.

  That is, the ions are initially decelerated in the second region P2, but the deceleration rate decreases with time, and after acceleration and deceleration are not performed, this time, the ions gradually increase greatly as time elapses. Change to receive. As described above, since ions having a large mass-to-charge ratio having a large energy are incident on the second region P2 in advance, such ions are decelerated and deprived of energy. On the other hand, ions with a smaller mass-to-charge ratio that are overtaken in the internal space of the beam slicer 15 receive more energy as they are delayed, that is, ions with a smaller mass-to-charge ratio. In this way, since the speed of each ion is adjusted in the second region P2, the positional deviation in the direction of the axis C is corrected and passes through the second region P2 to some extent, that is, without spreading in the direction of the axis C. Then, it is introduced into the orthogonal acceleration unit 17 through the inlet electrode 171. In addition, since the energy is increased or decreased so that the energy of each ion is aligned when passing through the second region P2, the spread of the energy of each ion when introduced into the orthogonal acceleration unit 17 is also reduced.

  FIG. 4 is a result of simulating the relationship between the ion position from the collision cell 13 exit to the orthogonal acceleration unit 17 entrance and the flight time when the voltage applied to the beam slicer 15 is changed according to the pattern shown in FIG. FIG. FIG. 5 is a diagram showing the result of simulating the relationship between the ion energy from the collision cell 13 exit to the orthogonal acceleration unit 17 entrance and the flight time. In these simulations, only 4 types of 100, 200, 300, and 400 were assumed as the ion mass-to-charge ratio m / z.

  As is apparent from FIG. 4, m / z 100 ions having a relatively low mass to charge ratio have a relatively large mass to charge ratio while passing through the internal space of the beam slicer 15. Although it is overtaken by ions of 300 and 400, it is suddenly accelerated during the period of passing through the second region P2 and finally reaches the same position almost simultaneously. On the other hand, as apparent from FIG. 5, the energy of ions when passing through the internal space of the beam slicer 15 increases as the mass-to-charge ratio increases, and when passing through the beam slicer 15, It is maintained substantially constant. The energy of ions having a large mass-to-charge ratio that rushes into the second region P2 first decreases and then returns slightly. However, ions having relatively small mass-to-charge ratio that rushes into the second region P2 later enter the second region P2. The energy increases greatly without decreasing and finally converges to almost the same energy.

  Also from this simulation result, in the Q-TOFMS of this embodiment, when ions are introduced into the orthogonal acceleration unit 17, the position in the axis C direction is aligned regardless of the mass-to-charge ratio, and the energy of each ion is also aligned. Can be confirmed.

  The orthogonal acceleration power supply unit 36 applies a predetermined acceleration voltage to the extrusion electrode 172 and the extraction electrode 173 at a timing delayed by a predetermined delay time from the time when ions are released from the ion guide 14. As a result, ions traveling in the X-axis direction through the orthogonal acceleration unit 17 are accelerated in the Z-axis direction. At this time, ions having a predetermined length in the X-axis direction are accelerated. However, since the spread of ions in the X-axis direction according to the mass-to-charge ratio is suppressed as described above, the delay time is appropriately determined. Thus, ions having a wide range of mass-to-charge ratios can accelerate ions that exist between the extrusion electrode 172 and the extraction electrode 173. That is, ions having a wide mass-to-charge ratio can be sent to the flight space 20 without waste, and a mass spectrum over a wide range of mass-to-charge ratio can be obtained. As a result, a mass spectrum (product ion spectrum) in a wide mass-to-charge ratio range can be created by a single measurement.

  Moreover, since the energy of each ion is uniform when accelerating toward the flight space 20, there is little variation in the emission direction. As a result, the ions that have returned in flight in the flight space 20 reliably reach the ion detector 23, so that high sensitivity can be achieved. Further, since the flight distance of each ion is close to an ideal state, the accuracy of the mass-to-charge ratio calculated from the flight time can be increased.

  In the above description, the product ions generated by the cleavage in the collision cell 13 are temporarily held in the internal space of the ion guide 14 and then measured by the orthogonal acceleration method TOFMS. Alternatively, ions that are not mass-separated at 12 or ions that are not cleaved by the collision cell 13 may be temporarily held in the inner space of the ion guide 14 and may be measured by orthogonal acceleration type TOFMS after cooling the ions.

  Moreover, although the said Example applies this invention to Q-TOFMS using orthogonal acceleration type TOFMS, this invention is linear TOFMS or reflectron TOFMS which used the three-dimensional quadrupole ion trap as the ion injection source. It can also be applied to. In that case, what is necessary is just to replace the orthogonal acceleration part 17 in the structure of the said Example with the three-dimensional quadrupole ion trap. In other words, the ions that have passed through the first region P1, the beam slicer 15, and the second region P2 may be introduced into the ion trap from the ion entrance of the three-dimensional quadrupole ion trap. In this case, it is necessary to limit the time during which ions are introduced into the inside of the three-dimensional quadrupole ion trap through the ion entrance, but by using the configuration of the above embodiment, Ions having a wide mass-to-charge ratio range can be introduced into the ion trap. Thereby, the mass-to-charge ratio range of the mass spectrum obtained by mass analysis of the ions trapped in the ion trap can be expanded. Also, by introducing energy into each ion trap with a certain level of ion energy, ions with large energy are not trapped but collide with the electrode or are discharged to the outside. Can be reduced.

  Moreover, the said Example is an example of this invention, and even if it changes suitably, amends, additions, etc. in the range of the meaning of this invention, it is clear that it is included in the claim of this application.

DESCRIPTION OF SYMBOLS 1 ... Chamber 2 ... Ionization chamber 3, 4, 5 ... Intermediate vacuum chamber 6 ... High vacuum chamber 7 ... ESI spray 8 ... Heating capillary 9 ... Ion guide 10 ... Skimmer 11 ... Ion guide 12 ... Quadrupole mass filter 13 ... Collision Cell 131 ... Entrance side gate electrode 132 ... Exit side gate electrode 14 ... Ion guide 15 ... Beam slicer 151 ... Entrance end face 152 ... Entrance slit 153 ... Exit end face 154 ... Exit slit 17 ... Orthogonal acceleration part 171 ... Inlet electrode 172 ... Extrusion electrode 173 ... Extraction electrode 20 ... Flight space 21 ... Reflector 22 ... Back plate 23 ... Ion detector 30 ... Control part 31 ... Inlet side gate electrode power supply part 32 ... Ion guide power supply part 33 ... Outlet side gate electrode power supply part 34 ... Slicer Power supply unit 35 ... orthogonal acceleration inlet electrode power supply unit 36 ... orthogonal acceleration power supply unit C ... shaft

Claims (6)

An orthogonal acceleration type time-of-flight type comprising an orthogonal acceleration unit for accelerating incident ions in a direction orthogonal to the incident axis and a separation detection unit for separating and detecting the accelerated ions according to the mass-to-charge ratio A mass spectrometer comprising:
a) an ion holding unit that cools ions to be measured and temporarily holds the ions;
b) A conductive material having an entrance end face and an exit end face provided between the ion holding part and the orthogonal acceleration part and provided with slits for restricting the width of the ion beam in the acceleration direction of the orthogonal acceleration part, respectively. A beam shaping unit that is a cylindrical body;
c) After holding ions in the ion holding unit, a first voltage application for controlling the voltage applied to the ion holding unit so as to release the held ions toward the beam shaping unit at a predetermined timing. And
d) In the first region between the exit end of the ion holding unit and the entrance end of the beam shaping unit, ions emitted from the ion holding unit have a greater acceleration as they pass through the first region with a delay. Forming an electric field whose strength changes over time, and in the second region between the exit end of the beam shaping unit and the entrance end of the orthogonal acceleration unit, the first region and the beam The difference in position and energy of ions having different mass-to-charge ratios generated when the ions that have passed through the region in the shaping unit pass through the second region at the timing of passing through the first region and the region in the beam shaping unit. A second voltage applying unit that applies a DC voltage that changes with time to the beam shaping unit so as to form an electric field whose strength changes with time so as to adjust the difference between
A time-of-flight mass spectrometer. After trapping the incident ions by the action of the electric field, the ion trap part that gives acceleration energy to the ions at a predetermined timing and ejects the ions almost simultaneously, and the ions ejected from the ion trap part to the mass-to-charge ratio A time-of-flight mass spectrometer comprising:
a) an ion holding unit that cools ions to be measured and temporarily holds the ions;
b) A beam shaping unit that is a conductive cylindrical body that is disposed between the ion holding unit and the ion trap unit and has an entrance end surface and an exit end surface each provided with a slit that regulates the diameter of the ion beam. When,
c) After holding ions in the ion holding unit, a first voltage application for controlling the voltage applied to the ion holding unit so as to release the held ions toward the beam shaping unit at a predetermined timing. And
d) In the first region between the exit end of the ion holding unit and the entrance end of the beam shaping unit, ions emitted from the ion holding unit have a greater acceleration as they pass through the first region with a delay. An electric field whose strength changes over time as formed, and in the second region between the exit end of the beam shaping unit and the entrance end of the ion trap unit, the first region and the beam The difference in position and energy of ions having different mass-to-charge ratios generated when the ions that have passed through the region in the shaping unit pass through the second region at the timing of passing through the first region and the region in the beam shaping unit. A second voltage applying unit that applies a DC voltage that changes with time to the beam shaping unit so as to form an electric field whose strength changes with time so as to adjust the difference between
A time-of-flight mass spectrometer. A time-of-flight mass spectrometer of the mounting serial to claim 1,
The second voltage application unit has a speed such that ions that are incident on the beam shaping unit after the first time pass over the ions that have entered earlier while passing through the beam shaping unit. When passing through one region, an electric field whose intensity changes in time is formed in the first region, and ions emitted from the beam shaping unit are delayed from the beam shaping unit when passing through the second region. The time-of-flight mass spectrometer is characterized in that an electric field whose intensity changes with time is formed in the second region so as to increase the energy of ions emitted and increase the velocity. The time-of-flight mass spectrometer according to claim 3,
Wherein the ion-retaining portion and the front Symbol orthogonal acceleration section and the separating and detecting unit is arranged in different vacuum chamber was Hedatare with a septum, the beam shaping section, that is disposed to extend over both the vacuum chamber across the partition wall A time-of-flight mass spectrometer. A time-of-flight mass spectrometer of the mounting serial to claim 2,
The second voltage application unit has a speed such that ions that are incident on the beam shaping unit after the first time pass over the ions that have entered earlier while passing through the beam shaping unit. When passing through one region, an electric field whose intensity changes in time is formed in the first region, and ions emitted from the beam shaping unit are delayed from the beam shaping unit when passing through the second region. The time-of-flight mass spectrometer is characterized in that an electric field whose intensity changes with time is formed in the second region so as to increase the energy of ions emitted and increase the velocity. The time-of-flight mass spectrometer according to claim 5 ,
Wherein the ion-retaining portion and the front SL ion trap section and said separating and detecting unit is arranged in different vacuum chamber was Hedatare with a septum, the beam shaping section, that is disposed to extend over both the vacuum chamber across the partition wall A time-of-flight mass spectrometer.

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