JP6111793B2 - Soft polishing pad and method for manufacturing soft polishing pad - Google Patents

Soft polishing pad and method for manufacturing soft polishing pad Download PDF

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JP6111793B2
JP6111793B2 JP2013070027A JP2013070027A JP6111793B2 JP 6111793 B2 JP6111793 B2 JP 6111793B2 JP 2013070027 A JP2013070027 A JP 2013070027A JP 2013070027 A JP2013070027 A JP 2013070027A JP 6111793 B2 JP6111793 B2 JP 6111793B2
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polishing
polishing pad
polished
slurry
groove
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智浩 岩尾
智浩 岩尾
良 古賀
良 古賀
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Fujibo Holdins Inc
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Description

本発明は、軟質研磨パッド及び軟質研磨パッドの製造方法に関し、特に、湿式成膜法を用いて製造された軟質研磨パッド及びその製造方法に関する。   The present invention relates to a soft polishing pad and a method for manufacturing a soft polishing pad, and more particularly to a soft polishing pad manufactured using a wet film forming method and a method for manufacturing the same.

従来から、半導体ウェハや液晶ディスプレイ用ガラス基板、フォトマスク用ガラス基板、磁気ディスク用ガラス基板等の被研磨物の表面を研磨して平坦化する方法として、化学的機械的研磨法(CMP法)が用いられている。CMP法を用いて被研磨物を研磨する際は、研磨パッドの研磨面上に被研磨物をセットし、被研磨物の上方に保持定盤を押し当て所定の圧力をかけて被研磨物を研磨パッドの研磨面に押し当てる。そして研磨時には、研磨パッドと被研磨物との間に研磨スラリーを供給し、保持定盤によって被研磨物に研磨圧をかけながら研磨パッドと被研磨物とを回転させる。そして研磨が終了したら、研磨パッドと被研磨物の回転を停止した後、保持定盤による研磨圧を解除し、被研磨物を研磨パッド上から取り除く。   Conventionally, a chemical mechanical polishing method (CMP method) has been used as a method for polishing and flattening the surface of an object to be polished such as a semiconductor wafer, a glass substrate for a liquid crystal display, a glass substrate for a photomask, or a glass substrate for a magnetic disk. Is used. When polishing an object to be polished using the CMP method, set the object to be polished on the polishing surface of the polishing pad, press the holding surface plate above the object to be polished and apply a predetermined pressure to the object to be polished. Press against the polishing surface of the polishing pad. During polishing, a polishing slurry is supplied between the polishing pad and the object to be polished, and the polishing pad and the object to be polished are rotated while applying a polishing pressure to the object to be polished by the holding surface plate. When the polishing is completed, the rotation of the polishing pad and the object to be polished is stopped, the polishing pressure by the holding surface plate is released, and the object to be polished is removed from the polishing pad.

また、近年では、研磨スラリーを被研磨物の表面に均等かつ十分に行き渡らせて被研磨物を一様で高精度に平坦化すること、高価な研磨スラリーの消費を抑えること、及びスクラッチの原因となる研磨屑を効率的に排出することを達成するために、研磨パッドの研磨面に様々な形状のスラリー溝を形成する技術が多用されている。   In recent years, the polishing slurry is evenly and sufficiently spread over the surface of the object to be polished, and the object to be polished is flattened uniformly and with high accuracy, the consumption of expensive polishing slurry is suppressed, and the cause of scratching In order to achieve efficient discharge of the polishing debris, a technique for forming slurry grooves of various shapes on the polishing surface of the polishing pad is frequently used.

そして表面にスラリー溝が形成された研磨パッドとしては、特許文献1に記載されたものが知られている。   And what was described in patent document 1 is known as a polishing pad by which the slurry groove | channel was formed in the surface.

特許第4920965号公報Japanese Patent No. 4920965

しかしながら、スラリー溝付の研磨パッドを用いた場合、研磨パッド及び被研磨物の回転を停止してから研磨圧を解除するまでの間に、スラリー溝の間の研磨面部分に残留している研磨スラリーが被研磨物を侵食し、その結果、スラリー溝の形状(又は研磨面部分の形状)が被研磨物に転写されてしまうという問題があった。即ち、研磨パッド及び被研磨物の回転を停止させたときには、未だ研磨パッドと被研磨物に加えられている研磨圧は解除されていないため被研磨物は、研磨パッドとの接触部、即ちスラリー溝の間の研磨面部分に押し付けられている状態となる。そして研磨パッド及び被研磨物の回転を停止させたときには研磨面部分の上部には研磨スラリーが残留しているため、研磨パッド及び被研磨物の回転を停止してから研磨圧を解除するまでの間に研磨スラリーが被研磨物を侵食してしまう。この現象は、被研磨物と研磨パッドとの接触部分が研磨パッドの研磨面部分に限られており、研磨パッドを上面視したときのスラリー溝の面積の割合が増えるに従って研磨面部分の面積が減り、その結果、研磨スラリーが付着している研磨面部分から被研磨物に加わる単位面積当たりの圧力が増加してしまい、研磨スラリーを被研磨物に押し付ける圧力が増加してしまうことに起因するものと考えられる。そして研磨スラリーによって被研磨物が侵食されると、被研磨物の表面品質を悪化させてしまう。この問題は、特に反応性が高い研磨スラリーを用いた場合に顕著に生じる。   However, when a polishing pad with a slurry groove is used, the polishing remaining on the polishing surface portion between the slurry grooves after the polishing pad and the workpiece are stopped until the polishing pressure is released There is a problem that the slurry erodes the object to be polished, and as a result, the shape of the slurry groove (or the shape of the polished surface portion) is transferred to the object to be polished. That is, when the rotation of the polishing pad and the object to be polished is stopped, the polishing pressure applied to the polishing pad and the object to be polished is not released yet, so the object to be polished is in contact with the polishing pad, that is, the slurry. It will be in the state pressed against the grinding | polishing surface part between groove | channels. When the rotation of the polishing pad and the object to be polished is stopped, the polishing slurry remains on the upper part of the polishing surface portion. Therefore, the rotation of the polishing pad and the object to be polished is stopped until the polishing pressure is released. In the meantime, the polishing slurry erodes the object to be polished. In this phenomenon, the contact portion between the object to be polished and the polishing pad is limited to the polishing surface portion of the polishing pad, and the area of the polishing surface portion increases as the proportion of the area of the slurry groove when the polishing pad is viewed from above is increased. As a result, the pressure per unit area applied to the object to be polished from the polishing surface portion to which the polishing slurry is adhered increases, and the pressure for pressing the polishing slurry against the object to be polished increases. It is considered a thing. When the object to be polished is eroded by the polishing slurry, the surface quality of the object to be polished is deteriorated. This problem is particularly noticeable when a highly reactive polishing slurry is used.

そこで本発明は、上述した課題を解決するためになされたものであり、被研磨物と研磨パッドの回転を停止させてから研磨圧を解除するまでの間に、研磨スラリーが被研磨物を侵食して被研磨物にスラリー溝の形状が転写されるのを防止することができる研磨パッド及びその製造方法を提供することを目的とする。   Therefore, the present invention has been made to solve the above-described problems, and the polishing slurry erodes the object to be polished after the rotation of the object to be polished and the polishing pad is stopped until the polishing pressure is released. Then, it aims at providing the polishing pad which can prevent that the shape of a slurry groove | channel is transcribe | transferred to a to-be-polished object, and its manufacturing method.

上述した課題を解決するために、本発明は、湿式成膜法を用いて製造され、涙形の気泡が内部に形成されている発泡ポリウレタン製の研磨層を有する軟質研磨パッドであって、研磨層の研磨面と反対面側に形成された複数の溝と隣接する溝の間に形成された支持部とを有しており、溝の底と研磨面との間には、隣接する支持部を連結する架橋部が形成されており、この架橋部は、研磨スラリーが流れるときの液圧によって研磨面と反対面側に湾曲する厚みを有していることを特徴とする。   In order to solve the above-described problems, the present invention provides a soft polishing pad having a polyurethane polyurethane polishing layer, which is manufactured using a wet film formation method and has teardrop-shaped bubbles formed therein. A plurality of grooves formed on the side opposite to the polishing surface of the layer and a support portion formed between adjacent grooves, and an adjacent support portion between the bottom of the groove and the polishing surface A cross-linking portion is formed, and the cross-linking portion is characterized in that it has a thickness that curves to the surface opposite to the polishing surface due to the hydraulic pressure when the polishing slurry flows.

このように構成された本発明によれば、隣接する支持部の間に形成された架橋部を有する研磨パッドを提供することができる。そして、架橋部の厚みを、研磨スラリーが流れるときの液圧によって研磨面と反対面側に湾曲する程度の厚みとすることにより、研磨スラリーが流れているときだけ架橋部を研磨パッドの研磨面と反対面側に湾曲させて架橋部の研磨面側にスラリーを流すための溝を形成することができる。そして、研磨スラリーが流れていないとき、即ち研磨パッドの回転を停止したときには、発泡ポリウレタンの復元力によって架橋部が元の平坦な形状に戻り、架橋部の研磨面側のスラリー溝が実質的に無くなる。即ち、本発明によれば、発泡ポリウレタン製の軟質研磨パッドの圧縮特性及びその復元力を利用して、研磨スラリーが流れるときの液圧が架橋部の研磨面側に加わっている間だけ研磨面に研磨スラリーを流すための溝を形成することができる。そして、研磨パッド及び被研磨物の回転を停止させ、研磨スラリーが流れるのを停止させると、スラリー溝が研磨面上から実質的に消滅するため、研磨パッド及び被研磨物の回転の停止後にスラリー溝の形状が被研磨物に転写されるのを防止することができる。また、スラリー溝が研磨面上から実質的に消滅すると、被研磨物と研磨面の接触面積が研磨時よりも増加する。従って、研磨面から被研磨物に加わる単位面積当たりの圧力、ひいては研磨スラリーが被研磨物に押し付けられる力を研磨時よりも減らすことができ、これにより、研磨スラリーによる被研磨物の侵食を抑制することができる。   According to this invention comprised in this way, the polishing pad which has a bridge | crosslinking part formed between adjacent support parts can be provided. Then, by setting the thickness of the bridging portion to such a thickness that it is curved to the side opposite to the polishing surface by the hydraulic pressure when the polishing slurry flows, the bridging portion is only polished when the polishing slurry is flowing. It is possible to form a groove for flowing the slurry on the polishing surface side of the bridging portion by curving to the opposite surface side. When the polishing slurry is not flowing, that is, when the rotation of the polishing pad is stopped, the crosslinked portion returns to the original flat shape by the restoring force of the polyurethane foam, and the slurry groove on the polishing surface side of the crosslinked portion is substantially Disappear. That is, according to the present invention, by utilizing the compression characteristics of a soft polishing pad made of polyurethane foam and its restoring force, the polishing surface is only applied while the hydraulic pressure when the polishing slurry flows is applied to the polishing surface side of the bridge portion. A groove for flowing the polishing slurry can be formed. Then, when the rotation of the polishing pad and the object to be polished is stopped and the flow of the polishing slurry is stopped, the slurry groove substantially disappears from the polishing surface, so that the slurry after the rotation of the polishing pad and the object to be polished is stopped. It is possible to prevent the shape of the groove from being transferred to the object to be polished. Further, when the slurry groove is substantially eliminated from the polishing surface, the contact area between the object to be polished and the polishing surface is increased compared to that during polishing. Accordingly, the pressure per unit area applied to the object to be polished from the polishing surface, and hence the force with which the polishing slurry is pressed against the object to be polished, can be reduced as compared with polishing, thereby suppressing the erosion of the object to be polished by the polishing slurry. can do.

本発明において研磨層の圧縮率は5〜20%であると好ましい。圧縮率が5%未満であると架橋部が十分に撓むことができないため、研磨屑の排出が円滑に行われず、その結果スクラッチが発生し易い。他方、圧縮率が20%より高いと軟質すぎて摩耗が進行しやすく、架橋部が消失し易い。   In the present invention, the compressibility of the polishing layer is preferably 5 to 20%. If the compression ratio is less than 5%, the bridging portion cannot be sufficiently bent, so that the polishing waste is not discharged smoothly, and as a result, scratches are likely to occur. On the other hand, when the compressibility is higher than 20%, the wear is likely to be too soft and the cross-linked portion tends to disappear.

また、本発明において好ましくは、涙形の気泡は、溝内に開口していない。   In the present invention, it is preferable that the teardrop-shaped bubbles are not opened in the groove.

このように構成された本発明によれば、研磨面側から涙形の気泡内に入った研磨スラリーが研磨面と反対面側に流れるのを抑制することができる。これにより、研磨パッドを研磨定盤に貼り付けるための接着剤等の粘着力が研磨スラリーによって低下するのを抑制することができる。   According to the present invention configured as described above, it is possible to suppress the polishing slurry that has entered the teardrop-shaped bubbles from the polishing surface side from flowing to the surface opposite to the polishing surface. Thereby, it can suppress that adhesive force, such as an adhesive agent for affixing a polishing pad to a polishing surface plate, falls by polishing slurry.

また、本発明において好ましくは、上述した研磨パッドの製造方法であって、上面に複数の凸部が形成された成膜用基材上に、DMF溶液に溶解したポリウレタン樹脂溶液を塗布する工程と、ポリウレタン樹脂溶液が塗布された成膜用基材を水中に浸漬し、ポリウレタン樹脂溶液を凝固させる工程と、凝固したポリウレタン樹脂を成膜用基材から剥離する工程とを備えることを特徴としている。   Preferably, in the present invention, the method for producing a polishing pad described above, the step of applying a polyurethane resin solution dissolved in a DMF solution on a film-forming substrate having a plurality of protrusions formed on the upper surface; The film forming substrate coated with the polyurethane resin solution is immersed in water to solidify the polyurethane resin solution, and the solidified polyurethane resin is separated from the film forming substrate. .

以上のように、本発明によれば、被研磨物と研磨パッドの回転を停止させてから研磨圧を解除するまでの間に、被研磨物にスラリー溝の形状が転写されるのを防止し、かつ研磨スラリーによる被研磨物の侵食を抑制することができる。   As described above, according to the present invention, it is possible to prevent the shape of the slurry groove from being transferred to the object to be polished after the rotation of the object to be polished and the polishing pad is stopped until the polishing pressure is released. In addition, erosion of the object to be polished by the polishing slurry can be suppressed.

本発明の実施形態による研磨パッドが適用されている片面研磨装置を示す断面図である。1 is a cross-sectional view showing a single-side polishing apparatus to which a polishing pad according to an embodiment of the present invention is applied. 本発明の実施形態による研磨パッドの垂直方向断面図である。1 is a vertical sectional view of a polishing pad according to an embodiment of the present invention. 本発明の実施形態による研磨パッドの垂直方向断面図である。1 is a vertical sectional view of a polishing pad according to an embodiment of the present invention.

以下、図面を参照して、本発明の実施形態による軟質研磨パッド及びその製造方法について説明する。図1は、本発明の実施形態による研磨パッドが適用されている片面研磨装置を示す断面図である。   Hereinafter, a soft polishing pad and a manufacturing method thereof according to an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a cross-sectional view showing a single-side polishing apparatus to which a polishing pad according to an embodiment of the present invention is applied.

先ず、図1に示すように、片面研磨装置1は、CMP法により被研磨物3の面を平坦化するものである。片面研磨装置1は、回転軸周りに回転する研磨定盤5と、研磨定盤5の上面に固定された研磨パッド7と、研磨パッド7の研磨面9を目立てするためのドレッサ11と、被研磨物3を保持するための保持定盤13と、研磨スラリーを研磨面9に供給するための研磨スラリー供給装置15とを備えている。   First, as shown in FIG. 1, a single-side polishing apparatus 1 flattens a surface of an object to be polished 3 by a CMP method. The single-side polishing apparatus 1 includes a polishing surface plate 5 that rotates about a rotation axis, a polishing pad 7 that is fixed to the upper surface of the polishing surface plate 5, a dresser 11 that sets the polishing surface 9 of the polishing pad 7, and a coated surface. A holding surface plate 13 for holding the polished article 3 and a polishing slurry supply device 15 for supplying polishing slurry to the polishing surface 9 are provided.

研磨定盤5は、円板形状を有しており、その底面にシャフトが取り付けられている。そして片面研磨装置1は、シャフトをその軸周りに回転させることによって研磨定盤5を回転させる。研磨パッド7は、研磨定盤5の径とほぼ同一の径を有しており、接着剤や両面テープを用いて研磨定盤5の上面に取り付けられている。   The polishing surface plate 5 has a disk shape, and a shaft is attached to the bottom surface thereof. The single-side polishing apparatus 1 rotates the polishing surface plate 5 by rotating the shaft around its axis. The polishing pad 7 has substantially the same diameter as the polishing surface plate 5 and is attached to the upper surface of the polishing surface plate 5 using an adhesive or a double-sided tape.

保持定盤13は、被研磨物3に対応する、例えば円板形状を有しており、被研磨物3の研磨時に、被研磨物3に対して所定の研磨圧をかけて被研磨物3を研磨パッド7の研磨面に押し付ける。保持定盤13は、研磨パッド7のほぼ半分の径を有しており、研磨パッド7の回転軸と、外周との間に位置するように保持されている。   The holding surface plate 13 has, for example, a disk shape corresponding to the object to be polished 3, and when the object to be polished 3 is polished, a predetermined polishing pressure is applied to the object to be polished 3. Is pressed against the polishing surface of the polishing pad 7. The holding surface plate 13 has a diameter approximately half that of the polishing pad 7 and is held so as to be positioned between the rotating shaft of the polishing pad 7 and the outer periphery.

このような片面研磨装置1は、研磨スラリー供給装置15から研磨パッド7の研磨面9のほぼ中央に研磨スラリーを供給しながら、研磨定盤5及び保持定盤13を回転させることによって、保持定盤13に保持された被研磨物3の表面を平坦化するようになっている。   Such a single-side polishing apparatus 1 rotates the polishing surface plate 5 and the holding surface plate 13 while rotating the polishing surface plate 5 and the holding surface plate 13 while supplying the polishing slurry to the approximate center of the polishing surface 9 of the polishing pad 7 from the polishing slurry supply device 15. The surface of the workpiece 3 held on the board 13 is flattened.

次に、本発明の実施形態による研磨パッド7について詳述する。   Next, the polishing pad 7 according to the embodiment of the present invention will be described in detail.

研磨パッド7は、研磨層が発泡ポリウレタン製であって、該研磨層の研磨面と反対側に研磨パッド基材(図示せず)が貼り合された軟質研磨パッドであり、仕上げ研磨に多用される。研磨パッド7の研磨層の厚さは、0.3〜2.1mm程度であることが好ましい。   The polishing pad 7 is a soft polishing pad in which the polishing layer is made of polyurethane foam and a polishing pad base material (not shown) is bonded to the opposite side of the polishing surface of the polishing layer, and is often used for finish polishing. The The thickness of the polishing layer of the polishing pad 7 is preferably about 0.3 to 2.1 mm.

図2は、研磨パッドの垂直方向断面図である。図2に示すように研磨パッド7の上面は、被研磨物3を研磨するための研磨面9を構成している。研磨パッド7の研磨面9は、研磨時以外には、平坦面を構成しているが、研磨時には、後述するように、研磨スラリーの液圧によって研磨スラリーを流すためのスラリー溝が形成される。   FIG. 2 is a vertical sectional view of the polishing pad. As shown in FIG. 2, the upper surface of the polishing pad 7 constitutes a polishing surface 9 for polishing the workpiece 3. The polishing surface 9 of the polishing pad 7 forms a flat surface except during polishing, but at the time of polishing, a slurry groove for flowing the polishing slurry is formed by the hydraulic pressure of the polishing slurry, as will be described later. .

また研磨パッド7の研磨面9と反対面19には研磨パッド基材(図示せず)が配されており、この研磨パッド基材は、接着剤や両面テープを用いて研磨定盤5の上面に貼り付けられている。また、研磨パッド7の反対面19には、複数の溝21が形成されている。溝21は、例えば格子状、連子状、又は放射状に形成されている。また、図2では、溝21の断面を長方形状としているが、溝の形状はこれに限られるものではなく、三角形断面や半円形断面のものを用いてもよい。   Further, a polishing pad base material (not shown) is disposed on the surface 19 opposite to the polishing surface 9 of the polishing pad 7, and this polishing pad base material is an upper surface of the polishing surface plate 5 using an adhesive or a double-sided tape. Is pasted. A plurality of grooves 21 are formed on the opposite surface 19 of the polishing pad 7. The grooves 21 are formed, for example, in a lattice shape, a continuous shape, or a radial shape. In FIG. 2, the cross section of the groove 21 is rectangular, but the shape of the groove is not limited to this, and a triangular cross section or a semicircular cross section may be used.

また、溝21の底23と、研磨面9との間には、架橋部25が形成されている。架橋部25は、隣接する溝21の間に形成された支持部27同士を連結している。また、支持部27及び架橋部25内には、多数の涙形気泡29が形成されている。涙形気泡29は、研磨面9から反対面19側に向って垂れるように延びている。そして研磨パッド7内の涙形気泡29は、研磨パッド7内に包含されており、研磨パッド7外部には開口していない。よって、涙形気泡29が溝21内にも開口していない。このため、研磨パッド7の研磨面9側を目立て処理により開口させても、研磨時に涙形気泡29内に研磨スラリーを保持することができ、この結果研磨パッドを研磨定盤に貼り付けるための接着剤や研磨層と基材との間の接着剤に作用して接着剤の粘着力を低下させることがない。なお、溝21内に涙形気泡29が開口していないとは、溝21の内部を電子顕微鏡を用いて倍率100倍にて観測した際に、実質的に涙形気泡29の開口が露出していないことを意味する。   A bridging portion 25 is formed between the bottom 23 of the groove 21 and the polishing surface 9. The bridging portion 25 connects support portions 27 formed between adjacent grooves 21. A large number of tear bubbles 29 are formed in the support portion 27 and the bridging portion 25. The tear bubble 29 extends so as to hang from the polishing surface 9 toward the opposite surface 19. The tear bubble 29 in the polishing pad 7 is included in the polishing pad 7 and does not open outside the polishing pad 7. Therefore, the tear bubble 29 is not opened in the groove 21. For this reason, even if the polishing surface 9 side of the polishing pad 7 is opened by the sharpening process, the polishing slurry can be held in the tear bubble 29 at the time of polishing, and as a result, the polishing pad is attached to the polishing surface plate. It does not act on the adhesive between the adhesive or the polishing layer and the substrate to reduce the adhesive strength of the adhesive. Note that the tear-shaped bubble 29 does not open in the groove 21 means that the opening of the tear-shaped bubble 29 is substantially exposed when the inside of the groove 21 is observed at a magnification of 100 using an electron microscope. Means not.

溝21の深さ、及び架橋部25の厚みは、研磨パッド7の研磨層の圧縮率が5〜20%に属するよう適宜調整可能である。この圧縮率の範囲に属するように、架橋部25の厚みを、研磨パッド7の中心からの距離に応じて変化させても良い。この場合、架橋部25の厚みを、研磨パッド7の中心付近において薄くし、周辺付近において厚くすることが好ましい。これにより、遠心力の作用が弱く研磨スラリーの液圧が低い研磨パッド7の中心付近において架橋部25を変形し易くし、一方で遠心力の作用が強く研磨スラリーの液圧が高い研磨パッド7の周辺付近において架橋部25を変形し難くすることができる。そしてこのように架橋部25の厚みを変化させることによって、研磨面9全面にわたって研磨スラリーの量をより均一にすることができる。また、溝21の深さは、0.1〜0.8mm程度であることが好ましく、架橋部25の厚みは、0.2〜1.3mm程度であることが好ましい。   The depth of the groove 21 and the thickness of the bridging portion 25 can be adjusted as appropriate so that the compressibility of the polishing layer of the polishing pad 7 belongs to 5 to 20%. You may change the thickness of the bridge | crosslinking part 25 according to the distance from the center of the polishing pad 7 so that it may belong to the range of this compression rate. In this case, it is preferable that the thickness of the bridging portion 25 is reduced near the center of the polishing pad 7 and increased near the periphery. Thus, the bridging portion 25 is easily deformed near the center of the polishing pad 7 where the action of the centrifugal force is weak and the polishing slurry has a low hydraulic pressure, while the polishing pad 7 has a strong action of centrifugal force and a high hydraulic pressure of the polishing slurry. It is possible to make it difficult for the bridging portion 25 to be deformed in the vicinity of the periphery. By changing the thickness of the bridging portion 25 in this way, the amount of the polishing slurry can be made more uniform over the entire polishing surface 9. Moreover, it is preferable that the depth of the groove | channel 21 is about 0.1-0.8 mm, and it is preferable that the thickness of the bridge | crosslinking part 25 is about 0.2-1.3 mm.

溝21及び架橋部25は、湿式成膜法を用いて研磨パッド7を製造するときに、溝21と相補的な形状の型を用いることで形成されている。   The groove 21 and the bridging portion 25 are formed by using a mold having a shape complementary to the groove 21 when the polishing pad 7 is manufactured using the wet film forming method.

具体的には、湿式成膜法では、先ず、ポリウレタン樹脂をDMF溶液に溶解し、これを所定の成膜用基材上に塗布する。この成膜用基材は、最終的に製造される研磨パッドの反対面の形状と相補的な関係を有しているので、溝21を形成するためには、上面に溝21と相補的な形状の凸部が形成された成膜用基材を型として用いる。そしてポリウレタン樹脂溶液を塗布した成膜用基材を水槽に沈めることによって樹脂を水中で凝固再生させる。成膜用基材を水槽に沈めると、樹脂が水と接触している樹脂溶液の表面に厚さ数μm程度のスキン層が形成される。その後、ポリウレタン樹脂溶液中のDMFと凝固液との置換の進行によりポリウレタン樹脂が成膜用基材の片面にシート状に凝固再生する。DMFがポリウレタン樹脂溶液から脱溶媒し、DMFと凝固液とが置換することにより、スキン層の内側(ポリウレタン樹脂中)に発泡が形成される。このとき、成膜用基材のPET製フィルムが水を浸透させないため、ポリウレタン樹脂溶液の表面側(スキン層側)で脱溶媒が生じて成膜用基材側が表面側より大きな発泡が形成され、スキン層から厚さ方向に向けて垂れるような涙形となる。この脱溶媒の速度により発泡の大小が左右され、脱溶媒に時間のかかる支持部27の発泡は架橋部25よりも大きなものとなる。そしてポリウレタン樹脂が完全に凝固した後、凝固物を成膜用基材から剥がす。このような製造工程により、上面にスキン層を有し、反対面に成膜用基材の凸部と相補的な形状の溝を有し、さらに内部に涙形の気泡を有する研磨パッドを製造することができる。   Specifically, in the wet film forming method, first, a polyurethane resin is dissolved in a DMF solution and applied onto a predetermined film forming substrate. Since this film-forming substrate has a complementary relationship with the shape of the opposite surface of the polishing pad to be finally produced, in order to form the groove 21, it is complementary to the groove 21 on the upper surface. A film-forming substrate on which convex portions having a shape are formed is used as a mold. Then, the resin is solidified and regenerated in water by sinking the film-forming substrate coated with the polyurethane resin solution in a water tank. When the film-forming substrate is submerged in a water tank, a skin layer having a thickness of several μm is formed on the surface of the resin solution in which the resin is in contact with water. Thereafter, the polyurethane resin coagulates and regenerates into a sheet shape on one side of the film-forming substrate by the progress of substitution between the DMF in the polyurethane resin solution and the coagulating liquid. When DMF is desolvated from the polyurethane resin solution and DMF and the coagulating liquid are replaced, foam is formed inside the skin layer (in the polyurethane resin). At this time, since the PET film of the film forming substrate does not allow water to permeate, desolvation occurs on the surface side (skin layer side) of the polyurethane resin solution, and a larger foam is formed on the film forming substrate side than the surface side. , It becomes a teardrop shape that hangs down in the thickness direction from the skin layer. The size of the foaming depends on the speed of the solvent removal, and the foaming of the support portion 27, which takes time to remove the solvent, is larger than that of the bridging portion 25. Then, after the polyurethane resin is completely solidified, the solidified product is peeled off from the film-forming substrate. By such a manufacturing process, a polishing pad having a skin layer on the upper surface, a groove having a shape complementary to the convex portion of the film-forming substrate on the opposite surface, and further having tear-shaped bubbles inside is manufactured. can do.

次に、本発明の実施形態による研磨パッド7の作用について詳述する。   Next, the operation of the polishing pad 7 according to the embodiment of the present invention will be described in detail.

研磨パッド7を用いて被研磨物3を研磨するとき、先ず、研磨パッド7上に被研磨物3を配置し、保持定盤13を用いて被研磨物3に所定の研磨圧を加える。このとき、被研磨物3が研磨パッド7に押し付けられる力は、被研磨物3の被研磨面全面にわたって均一であり、研磨パッド7の研磨面は平坦なままである。そして研磨定盤5及び保持定盤13をその中心軸周りに回転させながら、研磨スラリー供給装置15によって研磨スラリーを研磨パッド7の中央付近に供給する。回転している研磨パッド7上に研磨スラリーが供給されると、研磨スラリーは遠心力によって研磨パッド7の径方向に流れる。そして研磨スラリーが研磨パッド7と被研磨物3との間に侵入すると、その間の圧力が上昇する。そして研磨パッド7は、圧縮率が5〜20%の軟質のものであるから、研磨パッド7と被研磨物3との間の圧力が上昇すると、より柔らかい研磨パッド7の研磨面9が変形する。研磨面9の変形は、厚みのある支持部27に相当する位置よりも、比較的薄い架橋部25に相当する位置で特に大きく発生する。   When the workpiece 3 is polished using the polishing pad 7, first, the workpiece 3 is placed on the polishing pad 7, and a predetermined polishing pressure is applied to the workpiece 3 using the holding surface plate 13. At this time, the force with which the object 3 is pressed against the polishing pad 7 is uniform over the entire surface to be polished of the object 3, and the polishing surface of the polishing pad 7 remains flat. Then, the polishing slurry is supplied to the vicinity of the center of the polishing pad 7 by the polishing slurry supply device 15 while rotating the polishing surface plate 5 and the holding surface plate 13 around the central axis thereof. When the polishing slurry is supplied onto the rotating polishing pad 7, the polishing slurry flows in the radial direction of the polishing pad 7 by centrifugal force. When the polishing slurry enters between the polishing pad 7 and the object to be polished 3, the pressure therebetween increases. Since the polishing pad 7 is a soft one having a compressibility of 5 to 20%, when the pressure between the polishing pad 7 and the workpiece 3 increases, the polishing surface 9 of the softer polishing pad 7 is deformed. . The deformation of the polishing surface 9 occurs particularly greatly at a position corresponding to the relatively thin bridging portion 25 than at a position corresponding to the thick support portion 27.

図3は、研磨時の研磨パッドの垂直方向断面図である。図3に示すように、研磨時には、研磨パッド7と被研磨物3との間に侵入した研磨スラリーの液圧によって架橋部25が反対面19側に向けて撓む。そして架橋部25が撓むと、架橋部25の研磨面9側には、被研磨物3との間に空間が形成される。研磨パッド7を上面視したときの空間の形状は、研磨パッド7の反対面19に形成された溝21を投影したものである。被研磨物3と架橋部25との間に形成された空間は、研磨スラリーを流すためのスラリー溝として機能する。そして被研磨物3の研磨が終了して研磨装置1を停止させる場合には、先ず、研磨定盤5及び保持定盤13の回転を停止させると共に、研磨スラリー供給装置15も停止させる。研磨定盤5を停止させると、研磨スラリーに遠心力が作用しなくなるため、研磨スラリーの流れは停止する。そうすると、被研磨物3と研磨パッド7との間にある研磨スラリーから研磨パッド7に作用する液圧は低下し、研磨パッド7の形状は、元の平らな形状に復元する。これにより、研磨定盤5の回転を停止させた後は、実質的にスラリー溝が存在しないため、その形状が被研磨物3に転写されるのを防止することができる。また、研磨定盤5及び保持定盤13の回転を停止させると、被研磨物3と研磨パッド7との間にある研磨スラリーは、被研磨物3と研磨パッド7との間から、被研磨物3の径方向に押し出される。このとき被研磨物3と研磨パッド7との間の全ての研磨スラリーは押し出されず、一部は残留するが、研磨スラリーに遠心力が作用していない状態では、研磨パッド7の研磨面9にスラリー溝が実質的に存在しないため、残留した研磨スラリーは、一部に偏って残留せずに、被研磨物3と研磨パッド7との間に一様に広がる。そして、研磨パッド7の研磨面9にスラリー溝が実質的に存在していない状態では、被研磨物3の被研磨面の全面が研磨面9と接触しているため、研磨面9と被研磨物3との間の単位面積当たりの圧力は、研磨面上にスラリー溝が存在している場合よりも低くなる。従って、この状態では、研磨スラリーによる被研磨物の侵食が起こりにくくなり、被研磨物の平坦性を維持することができる。   FIG. 3 is a vertical sectional view of the polishing pad during polishing. As shown in FIG. 3, at the time of polishing, the bridging portion 25 bends toward the opposite surface 19 due to the hydraulic pressure of the polishing slurry that has entered between the polishing pad 7 and the workpiece 3. When the bridging portion 25 is bent, a space is formed between the bridging portion 25 and the workpiece 3 on the polishing surface 9 side. The shape of the space when the polishing pad 7 is viewed from above is a projection of the groove 21 formed on the opposite surface 19 of the polishing pad 7. A space formed between the workpiece 3 and the bridging portion 25 functions as a slurry groove for flowing polishing slurry. When the polishing of the workpiece 3 is finished and the polishing apparatus 1 is stopped, the rotation of the polishing surface plate 5 and the holding surface plate 13 is first stopped and the polishing slurry supply device 15 is also stopped. When the polishing platen 5 is stopped, centrifugal force does not act on the polishing slurry, so that the flow of the polishing slurry stops. If it does so, the hydraulic pressure which acts on the polishing pad 7 from the polishing slurry between the to-be-polished object 3 and the polishing pad 7 will fall, and the shape of the polishing pad 7 will be restored to the original flat shape. Thereby, after the rotation of the polishing surface plate 5 is stopped, since the slurry groove does not substantially exist, it is possible to prevent the shape from being transferred to the workpiece 3. Further, when the rotation of the polishing surface plate 5 and the holding surface plate 13 is stopped, the polishing slurry between the object to be polished 3 and the polishing pad 7 is polished from between the object to be polished 3 and the polishing pad 7. The object 3 is extruded in the radial direction. At this time, all of the polishing slurry between the object to be polished 3 and the polishing pad 7 is not pushed out, and a part of the polishing slurry remains, but in a state where centrifugal force is not acting on the polishing slurry, the polishing surface 9 of the polishing pad 7 is applied. Since the slurry groove does not substantially exist, the remaining polishing slurry does not remain partially biased and spreads uniformly between the workpiece 3 and the polishing pad 7. In the state where the slurry groove is not substantially present on the polishing surface 9 of the polishing pad 7, the entire surface to be polished of the workpiece 3 is in contact with the polishing surface 9. The pressure per unit area between the objects 3 is lower than that in the case where slurry grooves are present on the polishing surface. Therefore, in this state, the object to be polished is hardly eroded by the polishing slurry, and the flatness of the object to be polished can be maintained.

以上のように本発明の実施形態にかかる研磨パッドによれば、研磨パッド7を回転させている研磨時にのみ、一時的に研磨面9にスラリー溝を形成することができ、研磨パッド7の回転を停止させた後は、スラリー溝を除去することができる。これにより、研磨パッド7の回転を停止させた後に、スラリー溝の形状が被研磨物3に転写されるのを防止することができる。また、研磨パッド7の回転を停止させた後は、研磨パッド7の研磨面9には実質的にスラリー溝が存在しないため、研磨スラリーが被研磨物3に押し付けられる力を分散させることができる。これにより、被研磨物3に加わる単位面積当たりの圧力を低下させることができるので、研磨スラリーが被研磨物に強く押し付けられ、研磨スラリーによって被研磨物が侵食されるのを抑制することができる。   As described above, according to the polishing pad according to the embodiment of the present invention, the slurry groove can be temporarily formed on the polishing surface 9 only during polishing while the polishing pad 7 is rotated. After stopping, the slurry groove can be removed. Thereby, after the rotation of the polishing pad 7 is stopped, the shape of the slurry groove can be prevented from being transferred to the object to be polished 3. Further, after the rotation of the polishing pad 7 is stopped, the polishing surface 9 of the polishing pad 7 has substantially no slurry groove, so that the force with which the polishing slurry is pressed against the workpiece 3 can be dispersed. . As a result, the pressure per unit area applied to the object to be polished 3 can be reduced, so that the polishing slurry is strongly pressed against the object to be polished and the object to be polished can be prevented from being eroded by the polishing slurry. .

次に本発明の実施例について説明する。
(実施例1)
実施例1では、100%モジュラスが18.5MPaのポリエーテル系ポリウレタン樹脂15部及びDMF溶液35部を含む溶液50部に、粘度調整用のDMF24部、及び顔料のカーボンブラックを含むDMF分散液(固形分であるカーボンブラックをその全体量に対して20%含む。)19部を混合して、樹脂溶液を調製した。
Next, examples of the present invention will be described.
Example 1
In Example 1, 50 parts of a solution containing 15 parts of a polyether polyurethane resin having a 100% modulus of 18.5 MPa and 35 parts of a DMF solution, 24 parts of DMF for viscosity adjustment, and a DMF dispersion containing carbon black as a pigment ( Carbon black, which is a solid content, is contained in an amount of 20% with respect to the total amount.) 19 parts were mixed to prepare a resin solution.

なお、モジュラスとは、樹脂の硬さを表す指標であり、100%モジュラスとは、無発泡の樹脂シートを100%伸ばしたときに掛かる荷重を単位面積で割った値である。そして100%モジュラスの値が高い程、硬い樹脂である事を意味する。   The modulus is an index representing the hardness of the resin, and the 100% modulus is a value obtained by dividing the load applied when the non-foamed resin sheet is stretched 100% by the unit area. A higher 100% modulus value means a harder resin.

次に成膜用基材として、凹凸を有するPETフィルムを用意した。PETフィルムの塗布面には、正方形の平面形状を有する凹部が互いに離間して複数個配列された格子パターンが形成されていた。この成膜用基材の塗布面に、樹脂溶液を、ナイフコーターを用いて塗布して塗膜を得た。   Next, an uneven PET film was prepared as a substrate for film formation. On the coated surface of the PET film, a lattice pattern was formed in which a plurality of concave portions having a square planar shape were arranged apart from each other. A resin solution was applied to the coating surface of the film forming substrate using a knife coater to obtain a coating film.

次いで、得られた塗膜を凝固浴である水からなる室温の凝固浴に浸漬し、該樹脂含有溶液を凝固させた後、洗浄・乾燥させて、厚み0.9mmの樹脂シートを得た。得られた樹脂シートは、その表面に、互いに離れて配置された複数の略正方形凸部が形成されており、複数の凸部の間に格子パターンの溝が形成されていた。溝の深さは0.6mm、幅は2.0mm、間隔は13mm、架橋部厚みは0.3mmであった。   Next, the obtained coating film was immersed in a room temperature coagulation bath made of water as a coagulation bath to coagulate the resin-containing solution, and then washed and dried to obtain a resin sheet having a thickness of 0.9 mm. In the obtained resin sheet, a plurality of substantially square convex portions arranged apart from each other were formed on the surface, and a lattice pattern groove was formed between the plurality of convex portions. The depth of the groove was 0.6 mm, the width was 2.0 mm, the interval was 13 mm, and the bridge portion thickness was 0.3 mm.

次いで両面テープを介して、凹凸が形成された樹脂シートの面を、研磨パッド基材であるPETフィルム(厚さ:188μm)に貼り付け、研磨パッドを得た。   Subsequently, the surface of the resin sheet on which the irregularities were formed was attached to a PET film (thickness: 188 μm) as a polishing pad substrate through a double-sided tape to obtain a polishing pad.

(実施例2)
100%モジュラスを11.8MPaに変更する以外は、実施例1と同様の方法で研磨パッドを得た。
(Example 2)
A polishing pad was obtained in the same manner as in Example 1 except that the 100% modulus was changed to 11.8 MPa.

(実施例3)
100%モジュラスを8.5MPaに変更する以外は、実施例1と同様の方法で研磨パッドを得た。
(Example 3)
A polishing pad was obtained in the same manner as in Example 1 except that the 100% modulus was changed to 8.5 MPa.

(比較例1)
100%モジュラスを23MPaに変更する以外は、実施例1と同様の方法で研磨パッドを得た。
(Comparative Example 1)
A polishing pad was obtained in the same manner as in Example 1 except that the 100% modulus was changed to 23 MPa.

(比較例2)
比較例2では、第1成分のプレポリマとして2,4−TDIの385部、水添MDIの385部、数平均分子量約2000のPTMG1000部を反応させたイソシアネート含有量が15.4%の末端イソシアネート基含有ウレタンプレポリマを用い、これを80℃に加熱し減圧下で脱泡した。また第2成分としては、MOCAの100部に、数平均分子量約1000のPTMGの100部、触媒(トヨキャットET、東ソー株式会社製)の2部、シリコン系界面活性剤(SH−193、ダウコーニング社製)の2部をそれぞれ添加し50℃で攪拌混合した後、減圧下で脱泡した。
(Comparative Example 2)
In Comparative Example 2, as a prepolymer of the first component, 385 parts of 2,4-TDI, 385 parts of hydrogenated MDI, and 1000 parts of PTMG having a number average molecular weight of about 2000 were reacted with a terminal isocyanate having an isocyanate content of 15.4%. Using a group-containing urethane prepolymer, this was heated to 80 ° C. and degassed under reduced pressure. As the second component, 100 parts of MOCA, 100 parts of PTMG having a number average molecular weight of about 1000, 2 parts of catalyst (Toyocat ET, manufactured by Tosoh Corporation), silicon surfactant (SH-193, Dow) 2 parts of Corning) were added and stirred and mixed at 50 ° C., and then degassed under reduced pressure.

そして得られた第1成分及び第2成分を重量比で100部:61部の割合で混合槽に供給した。混合工程では、攪拌条件を剪断回数1689回、剪断速度9425/秒に設定した。このとき、混合槽内に空気を30L/minの流量で供給した。得られた混合液を型枠に注型し硬化させた後、形成されたポリウレタン発泡体を型枠から抜き出した。この発泡体を厚さ0.9mmにスライスしてウレタンシートを作製し、研磨パッドを得た。得られた研磨パッドの研磨定盤と貼り付ける面側に、溝加工機にて格子状の溝(深さ:0.6mm、幅:2.0mm、間隔:13mm)を形成した。   And the obtained 1st component and 2nd component were supplied to the mixing tank in the ratio of 100 parts: 61 parts by weight ratio. In the mixing step, the stirring conditions were set to a shear rate of 1689 times and a shear rate of 9425 / second. At this time, air was supplied into the mixing tank at a flow rate of 30 L / min. After the obtained mixed liquid was poured into a mold and cured, the formed polyurethane foam was extracted from the mold. This foam was sliced to a thickness of 0.9 mm to produce a urethane sheet, and a polishing pad was obtained. A grid-like groove (depth: 0.6 mm, width: 2.0 mm, interval: 13 mm) was formed by a groove processing machine on the surface of the obtained polishing pad to be bonded to the polishing surface plate.

(比較例3)
実施例2と同様に樹脂溶液を調製した後、平坦な成膜用基材上に樹脂溶液を塗布して塗膜を得た。次いで、得られた塗膜を凝固浴である水からなる室温の凝固浴に浸漬し、該樹脂含有溶液を凝固させた後、洗浄・乾燥させて厚み0.9mmの樹脂シートを得た。続いて両面テープを介して樹脂シートのスキン層と反対面側と成膜用基材であるPETフィルム(厚さ:188μm)を貼り合わせ、研磨パッドを得た。得られたポリウレタンシートのスキン層側に溝加工機にて格子溝(深さ:0.6mm、幅:2.0mm、間隔:13mmを)形成した。
(Comparative Example 3)
After preparing a resin solution in the same manner as in Example 2, the resin solution was applied onto a flat film-forming substrate to obtain a coating film. Subsequently, the obtained coating film was immersed in a room temperature coagulation bath made of water as a coagulation bath to coagulate the resin-containing solution, and then washed and dried to obtain a resin sheet having a thickness of 0.9 mm. Subsequently, a surface opposite to the skin layer of the resin sheet and a PET film (thickness: 188 μm) as a substrate for film formation were bonded together through a double-sided tape to obtain a polishing pad. A lattice groove (depth: 0.6 mm, width: 2.0 mm, interval: 13 mm) was formed on the skin layer side of the obtained polyurethane sheet with a groove processing machine.

上述した実施例1乃至3及び比較例1乃至3で得られた研磨パッドについて、以下の条件で物性評価及び研磨試験を行った。   The polishing pads obtained in Examples 1 to 3 and Comparative Examples 1 to 3 described above were subjected to physical property evaluation and polishing tests under the following conditions.

(物性評価)
圧縮率は日本工業規格(JIS L 1021)に従い、ショッパー型厚さ測定器(加圧面:直径1cmの円形)を使用して求めた。具体的な測定条件、以下の通りである。
(Evaluation of the physical properties)
The compression rate was determined according to Japanese Industrial Standard (JIS L 1021) using a shopper type thickness measuring instrument (pressurized surface: circular shape with a diameter of 1 cm). Specific measurement conditions are as follows.

無荷重状態から初荷重を30秒間かけた後の厚さt0を測定し、次に、厚さt0の状態から最終圧力を300秒間かけた後の厚さt1を測定した。圧縮率は、圧縮率(%)=100×(t0−t1)/t0の式で算出した(なお、初荷重は100g/cm2、最終圧力は1120g/cm2であった)。測定は架橋部を除く5箇所で行い、その平均値を本発明品の圧縮率とした。 The thickness t 0 after applying the initial load for 30 seconds from the unloaded state was measured, and then the thickness t 1 after applying the final pressure from the state of thickness t 0 for 300 seconds was measured. The compressibility was calculated by the formula of compressibility (%) = 100 × (t 0 −t 1 ) / t 0 (note that the initial load was 100 g / cm 2 and the final pressure was 1120 g / cm 2 ). The measurement was performed at five locations excluding the cross-linked portion, and the average value was taken as the compression rate of the product of the present invention.

(研磨試験)
得られた研磨パッドを研磨機(スピードファム社製、商品名「9B−5Pポリッシングマシン」)の所定位置に設置し、被研磨物として95mmφハードディスク用アルミニウム基板を用いて研磨加工を実施した。このときの研磨条件は、研磨速度(回転数)30rpm、研磨圧力100g/cm2、研磨剤はコロイダルシリカスラリ(pH:1.5)を使用し、研磨剤吐出量100cc/min、研磨時間300秒間とした。
(Polishing test)
The obtained polishing pad was placed at a predetermined position of a polishing machine (trade name “9B-5P polishing machine” manufactured by Speed Fam Co., Ltd.), and polishing was performed using an aluminum substrate for 95 mmφ hard disk as an object to be polished. The polishing conditions at this time are a polishing rate (rotation number) of 30 rpm, a polishing pressure of 100 g / cm 2 , a polishing agent using colloidal silica slurry (pH: 1.5), a polishing agent discharge rate of 100 cc / min, and a polishing time of 300. Seconds.

(転写の有無)
研磨終了後、研磨定盤の回転を停止した状態で、研磨圧力100g/cm2の負荷を与えた状態で1分間放置した。その後、目視にて被研磨物表面への転写の有無を調べた。
(Presence / absence of transcription)
After the polishing was completed, the polishing platen was stopped rotating for 1 minute with a polishing pressure of 100 g / cm 2 applied. Thereafter, the presence or absence of transfer onto the surface of the workpiece was examined visually.

(スクラッチ)
スクラッチの発生状況については、研磨加工後のアルミニウム基板の表面を顕微鏡観察することで確認した。スクラッチが0〜4カ所確認されたものを「○」、スクラッチが5〜9カ所確認され他ものを「△」、スクラッチが10カ所以上確認されたものを「×」と評価した。
(scratch)
The occurrence of scratches was confirmed by observing the surface of the polished aluminum substrate with a microscope. The case where 0 to 4 scratches were confirmed was evaluated as “◯”, the case where 5 to 9 scratches were confirmed and “△” as the other scratches, and the case where 10 or more scratches were confirmed as “X”.

(結果)
上述した試験の結果を表1に示す。

Figure 0006111793
(result)
Table 1 shows the results of the test described above.
Figure 0006111793

表1から分かるように、比較例1の研磨パッドを使用した場合は、実施例1から3にかかる研磨パッドを使用した場合よりもスクラッチが多く発生した。これは、比較例1にかかる研磨パッドの圧縮率が低く架橋部が十分に撓むことができず、研磨屑の排出が円滑に行われなかったことが原因と考えられる。なお、比較例1の研磨パッドは、研磨面に溝が形成されていないため、被研磨物に転写は生じなかった。   As can be seen from Table 1, when the polishing pad of Comparative Example 1 was used, more scratches were generated than when the polishing pad according to Examples 1 to 3 was used. This is considered to be because the polishing pad according to Comparative Example 1 has a low compressibility and the bridging portion cannot be sufficiently bent, and the polishing waste is not discharged smoothly. In addition, since the groove | channel was not formed in the grinding | polishing surface, the polishing pad of the comparative example 1 did not produce transfer to to-be-polished material.

また、実施例1から3にかかる研磨パッドを使用した場合、圧縮率が適正であったためスクラッチの量が少なく、研磨パッドの品質として問題はなかった。また、実施例1から3にかかる研磨パッドは、研磨面が平坦であるため被研磨物に転写が生じなかった。   Further, when the polishing pad according to Examples 1 to 3 was used, the amount of scratches was small because the compression rate was appropriate, and there was no problem with the quality of the polishing pad. Further, since the polishing pad according to Examples 1 to 3 had a flat polishing surface, no transfer occurred on the object to be polished.

また、比較例2の研磨パッドは、比較例1の研磨パッドと同様に圧縮率が低く架橋部が十分に撓むことができず、研磨屑の排出が円滑に行われなかったためスクラッチが多く見受けられた。また比較例2の研磨パッドも研磨面に溝が形成されていないため、被研磨物に転写は生じなかった。   In addition, the polishing pad of Comparative Example 2 has a low compression ratio and the bridging portion cannot be sufficiently bent as in the polishing pad of Comparative Example 1, and polishing scraps are not discharged smoothly, so that there are many scratches. It was. Moreover, since the groove | channel was not formed in the polishing surface also in the polishing pad of the comparative example 2, transcription | transfer did not arise in the to-be-polished object.

また、比較例3の研磨パッドは、圧縮率が適正であったためスクラッチの量が少なく、研磨パッドの品質として問題はなかった。しかしながら、研磨面に溝が形成されているため、転写が生じた。   Moreover, since the compression rate of the polishing pad of Comparative Example 3 was appropriate, the amount of scratches was small, and there was no problem with the quality of the polishing pad. However, transfer occurred because of the grooves formed on the polished surface.

1 研磨装置
3 被研磨物
7 研磨パッド
9 研磨面
19 研磨パッドの反対面
21 溝
23 溝の底
25 架橋部
27 支持部
29 涙形気泡
DESCRIPTION OF SYMBOLS 1 Polishing apparatus 3 To-be-polished object 7 Polishing pad 9 Polishing surface 19 The opposite surface 21 of a polishing pad 21 Groove 23 Groove bottom 25 Bridging part 27 Support part 29 Tear-shaped bubble

Claims (4)

湿式成膜法を用いて製造され、涙形の気泡が内部に形成されている、発泡ポリウレタン製の研磨層を有する軟質研磨パッドであって、
前記研磨層の研磨面とは反対面に形成された複数の溝と隣接する溝の間に形成された支持部とを有しており、
前記溝の底と前記研磨面との間には、隣接する支持部を連結する架橋部が形成されており、この架橋部は、研磨スラリーが流れるときの液圧によって研磨面とは反対面側に湾曲する厚みを有していることを特徴とする、軟質研磨パッド。
A soft polishing pad having a polishing layer made of polyurethane foam, which is manufactured using a wet film formation method and in which teardrop-shaped bubbles are formed,
A plurality of grooves formed on the surface opposite to the polishing surface of the polishing layer and a support portion formed between adjacent grooves;
Between the bottom of the groove and the polishing surface, a bridging portion that connects adjacent support portions is formed, and this bridging portion is opposite to the polishing surface due to the hydraulic pressure when the polishing slurry flows. A soft polishing pad characterized by having a thickness that is curved in a straight line.
前記研磨層の圧縮率が5〜20%である、請求項1に記載の軟質研磨パッド。 The soft polishing pad according to claim 1, wherein the polishing layer has a compressibility of 5 to 20%. 前記涙形の気泡は、前記溝内に開口していない、請求項1又は2に記載の軟質研磨パッド。   The soft polishing pad according to claim 1, wherein the teardrop-shaped bubbles are not opened in the groove. 請求項1に記載の軟質研磨パッドの製造方法であって、
上面に複数の凸部が形成された成膜用基材上に、DMF溶液に溶解したポリウレタン樹脂溶液を塗布する工程と、
ポリウレタン樹脂溶液が塗布された前記成膜用基材を水中に浸漬し、ポリウレタン樹脂溶液を凝固させる工程と、
凝固したポリウレタン樹脂を前記成膜用基材から剥離する工程とを備えることを特徴とする、軟質研磨パッドの製造方法。
A method for producing a soft polishing pad according to claim 1,
Applying a polyurethane resin solution dissolved in a DMF solution on a film-forming substrate having a plurality of convex portions formed on the upper surface;
Immersing the film-forming substrate coated with the polyurethane resin solution in water to solidify the polyurethane resin solution; and
And a step of peeling the solidified polyurethane resin from the film-forming substrate.
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