JP5934516B2 - Inspection area display device and inspection area display method - Google Patents

Description

  The present invention relates to an inspection area display device and an inspection area display method for displaying an inspection area for each image processing tool that performs product inspection based on a captured image as a thumbnail image for each image processing tool that has received a selection.

  When the product quality determination is performed by the product inspection system, an image of the inspection object is captured and the captured image is compared with the reference image serving as a reference. Thumbnail images are often used to improve the list of captured images. By arranging the thumbnail images in parallel with the reference image, it is possible to visually confirm the validity of the pass / fail judgment result.

  For example, in Patent Document 1, it is determined whether or not a thumbnail image is added to an image in a designated area. If it is determined that a thumbnail image is not added, an image that automatically adds a thumbnail image at a predetermined timing is determined. A processing device is disclosed. Thereby, it is possible to prevent forgetting to add a thumbnail image.

JP 2007-201935 A

  In Patent Document 1, although a thumbnail image can be surely added, only one corresponding thumbnail image is added to an image obtained by imaging an inspection object. That is, while a plurality of image processing tools can be set for one image, there is only one kind of thumbnail image to be added, and a thumbnail image at a predetermined timing is added. When the inspection area is set for each processing tool, or when the inspection areas of a plurality of image processing tools are set simultaneously, there is a problem that a thumbnail image cannot be added.

  The present invention has been made in view of such circumstances, and an inspection area display device and an inspection that easily generate and display a thumbnail image capable of visually confirming the setting state of the inspection area for the image processing tool An object is to provide an area display method.

In order to achieve the above object, an inspection area display device according to a first invention is connected to an imaging unit that images an inspection object, performs image processing on an image captured by the imaging unit, and performs image processing. An inspection area display device that displays an inspection area, which is an area for determining pass / fail of an inspection object based on a result, includes a plurality of image processing tools, and includes a plurality of images necessary for inspection based on desired inspection contents. The selection of the image processing tool is received in advance, and for each image processing tool that has received the selection, an inspection area setting unit that sets an inspection area for the image of the inspection object, and an inspection object including the set inspection area images, each image processing tool accepts the selection, a thumbnail image generation unit for generating a thumbnail image sequentially thumbnails, all the thumbnail images generated for each image processing tool E Bei and Shimesuru thumbnail image display unit, and an image of the inspection object which is imaged by the imaging unit, and the inspection area for each set image processing tool by the inspection area setting unit, is displayed on one screen When changing the inspection area that has already been set for each image processing tool, the thumbnail image display unit accepts selection of a thumbnail image for changing the inspection area from among the plurality of displayed thumbnail images, The image of the inspection object and the inspection area set for the image processing tool corresponding to the selected thumbnail image are overlaid and displayed, and after changing the contents of the inspection area, the corresponding thumbnail image is changed. It is characterized by displaying .

  The inspection area display device according to a second aspect of the present invention is the inspection area display device according to the first aspect, wherein the thumbnail image generation unit superimposes an image related to the inspection area on a reduced image of a reference image that is a reference for determining the quality of the inspection object. Generating the thumbnail image.

In the inspection area display device according to a third aspect of the present invention, in the first aspect, the thumbnail image generation unit adds an image related to the inspection area to the captured image obtained by reducing the image of the inspection target image captured by the imaging unit. The thumbnail image is generated by superimposing the thumbnail images.
In the inspection area display device according to a fourth aspect of the present invention, in the second aspect, as the image of the inspection object imaged by the imaging unit, the reference image is set for each image processing tool set by the inspection area setting unit. It is characterized by being displayed on one screen together with the inspection area.
The inspection area display device according to a fifth aspect of the present invention is the inspection area display device according to the third aspect, wherein each of the image processing tools in which the captured image is set by the inspection area setting unit as the image of the inspection object imaged by the imaging unit. It is characterized by being displayed on one screen together with the inspection area.

In the inspection area display device according to a sixth aspect of the present invention, in any one of the first to fifth aspects, the thumbnail image generation unit groups images related to a plurality of set inspection areas and displays the thumbnail images. It is characterized by generating.

Next, in order to achieve the above object, an inspection area display method according to a seventh aspect of the present invention is connected to an imaging unit that images an inspection object, performs image processing on an image captured by the imaging unit, In an inspection area display method that can be executed by an inspection area display device that displays an inspection area that is an area for judging pass / fail of an inspection object based on a result of image processing, the inspection area display device includes a plurality of Based on the desired inspection content, the selection of a plurality of image processing tools necessary for the inspection is received in advance, and the image of the inspection object is received for each image processing tool that has received the selection . and setting an inspection area, an image of the inspection object including the set examination area, for each image processing tool accepts the selection, and generating a thumbnail image sequentially thumbnails See containing and displaying all thumbnail images generated for each image processing tools, and the image of the inspection object which is imaged by the imaging unit, and the inspection area of each image processing tool is set, one screen When changing the inspection area that is displayed above and is already set for each image processing tool, it accepts the selection of the thumbnail image that changes the inspection area from the displayed thumbnail images, and the image of the inspection object And the inspection area set for the image processing tool corresponding to the selected thumbnail image are displayed in an overlapping manner, and after changing the contents of the inspection area, the corresponding thumbnail image is changed and displayed. It is characterized by.

The inspection area display method according to an eighth aspect of the present invention is the seventh aspect of the invention, wherein the thumbnail image is generated by superimposing an image relating to the inspection area on a reduced image of a reference image that is a reference for determining the quality of an inspection object It is characterized by that.

The inspection area display method according to a ninth invention, in the seventh invention, an image on the captured image obtained by reducing the inspection object captured by the imaging unit, the thumbnail image by superposing an image related to the examination region It is characterized by generating.
An inspection area display method according to a tenth aspect of the present invention is the image processing tool according to the eighth aspect, wherein the reference image is set as the inspection object image picked up by the image pickup unit for each image processing tool set by the inspection area setting portion. It is characterized by being displayed on one screen together with the inspection area.
An inspection area display method according to an eleventh aspect of the present invention is the inspection area display method according to the ninth aspect, wherein each of the image processing tools in which the captured image is set by the inspection area setting unit as an image of the inspection object imaged by the imaging unit. It is characterized by being displayed on one screen together with the inspection area.

An inspection area display method according to a twelfth aspect of the invention is characterized in that, in any one of the seventh to eleventh aspects, the thumbnail images are generated by grouping images related to a plurality of set inspection areas. .

In the first and seventh aspects of the invention, the image processing unit is connected to an image capturing unit that captures an image of the inspection target, performs image processing on the image captured by the image capturing unit, and determines whether the inspection target is acceptable based on the result of the image processing. An inspection area, which is an area for determining whether or not, is displayed. From the plurality of image processing tools provided in the inspection area display device, the selection of a plurality of image processing tools necessary for the inspection is received in advance based on the desired inspection content, and for each image processing tool that has received the selection The inspection area is set for the image of the inspection object . For each image processing tool that has received a selection, an image of the inspection object including the set inspection area is sequentially thumbnailed, and all thumbnail images generated for each image processing tool are displayed. . When the image of the inspection object imaged by the imaging unit and the inspection area for each set image processing tool are displayed on one screen and the inspection area already set for each image processing tool is changed, An inspection area set for the image processing tool corresponding to the image of the inspection object and the selected thumbnail image is accepted from among the plurality of displayed thumbnail images. Are superimposed and displayed, and after changing the contents of the inspection area, the corresponding thumbnail image is changed and displayed. Instead of simply reducing the displayed screen to generate thumbnail images, the thumbnail images are generated using the image of the inspection object including the set inspection area. The thumbnail image can be easily generated, and a desired image processing tool can be selected while visually checking the inspection area. In addition, when changing the contents of the inspection area, the changed contents can be easily overwritten, so that the inspection contents can be easily reset, and the thumbnail image can be easily changed according to the inspection contents.

In the second and eighth inventions, a thumbnail image is generated by superimposing an image related to an inspection area on a reduced image of a reference image that serves as a reference for determining pass / fail of an inspection object. Instead of generating a thumbnail image, a thumbnail image can be generated by superimposing an image related to the inspection area on the reference image, and the desired image processing tool can be selected with the thumbnail image while visually checking the inspection area. It becomes possible to do.

In the third and ninth inventions, a thumbnail image is generated by superimposing an image related to the inspection region on the captured image obtained by reducing the image of the inspection object imaged by the imaging unit, so that the inspection object actually inspected by the user A thumbnail image based on the image of the object can be generated, and a desired image processing tool can be selected with the thumbnail image while visually confirming the inspection area.
In the fourth invention and the tenth invention, the reference image is displayed on one screen as the image of the inspection object imaged by the imaging unit together with the inspection area for each set image processing tool. The inspection areas can be displayed in an overlapping manner without depending on the mounted position.
In the fifth and eleventh inventions, the captured image is displayed on one screen as an image of the inspection object imaged by the imaging unit together with the inspection area for each set image processing tool. The inspection areas can be displayed in an overlapped manner according to the state.

In the sixth and twelfth inventions, thumbnail images are generated by grouping images related to a plurality of set inspection areas. Therefore, not only generating thumbnail images for each image processing tool but also a plurality of image processing tools. The inspection area can be displayed as a single thumbnail image, or only the inspection areas to be displayed can be collected and displayed as thumbnail images.

In the present invention, the thumbnail image is generated using the image of the inspection object including the set inspection area, instead of simply reducing the displayed screen and generating the thumbnail image. The thumbnail image to be generated can be easily generated, and the thumbnail image can be used to select a desired image processing tool while visually confirming the inspection area. In addition, when changing the contents of the inspection area, the changed contents can be easily overwritten, so that the inspection contents can be easily reset, and the thumbnail image can be easily changed according to the inspection contents.

It is a mimetic diagram showing the composition of the product inspection system containing the inspection field display device concerning an embodiment of the invention. It is a block diagram which shows the structure of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is a schematic diagram which shows the parameter which sets an imaging environment of the product inspection system containing the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the edge position measurement tool of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the edge angle measurement tool of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the edge width measurement tool of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the edge pitch measurement tool of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the pair edge measurement tool of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the screen which displayed the binarized image of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the pattern search measurement tool of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is a schematic diagram which shows the movement state of the segment for determining presence of a flaw with the flaw measuring tool of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is a functional block diagram of the inspection area display device concerning an embodiment of the invention. It is a flowchart which shows the process sequence of CPU of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the thumbnail display screen of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the thumbnail display screen of another format of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the screen at the time of the setting change of a test | inspection area | region of the test | inspection area | region display apparatus which concerns on embodiment of this invention. It is an illustration figure of the screen at the time of the setting change of a test | inspection area | region of the test | inspection area | region display apparatus which concerns on embodiment of this invention.

  Embodiments of the present invention will be described below with reference to the drawings. Note that elements having the same or similar configuration or function are denoted by the same or similar reference numerals throughout the drawings referred to in the description of this embodiment, and detailed description thereof is omitted.

  FIG. 1 is a schematic diagram showing a configuration of a product inspection system including an inspection area display device according to an embodiment of the present invention. As shown in FIG. 1, the product inspection system according to the present embodiment is connected to an imaging device (imaging unit) 1 and a connection cable 3 so as to be able to perform data communication with the imaging device 1 and execute image processing. It is comprised with the test | inspection area display apparatus 2 provided with FPGA, DSP, etc. The inspection area display device 2 is connected to a display device (not shown) and includes an image processing control unit 201 and an illumination control unit 202.

  Moreover, the illumination control part 202 is connected with the connection cable 3 so that data communication with the illuminating device 4 is possible. The inspection object 6 moving on the conveyor 5 is irradiated with light by the illumination device 4 and imaged by the imaging device 1. Based on the captured image of the inspection object 6, it is determined whether the inspection object 6 is a good product or a defective product.

  The imaging device 1 includes a camera module having an imaging device that images the inspection object 6. The imaging device includes a CMOS substrate. For example, a captured color image is converted into an HDR image based on conversion characteristics that widen the dynamic range on the CMOS substrate. Note that another type of image sensor such as a CCD may be used as the image sensor.

  FIG. 2 is a block diagram showing a configuration of the inspection area display device 2 according to the embodiment of the present invention. The inspection area display device 2 according to the embodiment of the present invention includes at least a CPU (Central Processing Unit) 21, a memory 22, a storage device 23, an I / O interface 24, a video interface 25, a portable disk drive 26, and a communication interface 27. And an internal bus 28 for connecting the hardware described above.

  The CPU 21 is connected to the above-described hardware units of the inspection area display device 2 via the internal bus 28, controls the operation of the above-described hardware units, and stores the computer program 100 stored in the storage device 23. Various software functions are executed according to the above. The memory 22 is composed of a volatile memory such as SRAM or SDRAM, and a load module is expanded when the computer program 100 is executed, and stores temporary data generated when the computer program 100 is executed.

  The storage device 23 includes a built-in fixed storage device (hard disk), a ROM, and the like. The computer program 100 stored in the storage device 23 is downloaded by a portable disk drive 26 from a portable recording medium 90 such as a DVD or CD-ROM in which information such as programs and data is recorded, and from the storage device 23 at the time of execution. The program is expanded into the memory 22 and executed. Of course, a computer program downloaded from an external computer connected via the communication interface 27 may be used.

  The communication interface 27 is connected to an internal bus 28, and by connecting to an external network such as the Internet, a LAN, or a WAN, data can be transmitted / received to / from the imaging device 1, the lighting device 4, an external computer, and the like. It has become.

  The I / O interface 24 is connected to input devices such as a keyboard 501 and a mouse 502, and receives data input. The video interface 25 is connected to a display device 503 such as a CRT display or a liquid crystal display, and displays a predetermined image.

  FIG. 3 is a schematic diagram showing parameters for setting the imaging environment of the product inspection system including the inspection area display device 2 according to the embodiment of the present invention. As shown in FIG. 3, the product inspection system according to the present embodiment adjusts the position coordinates (X, Y, Z) of the imaging device 1 and the swing inclination angle θ on the XY plane as parameters. Can do. The imaging device 1 can adjust the focus and brightness. Specifically, the focus is adjusted with the focus ring, and the brightness is adjusted with the aperture ring.

  Similarly, the product inspection system can adjust the position coordinates (X, Y) of the inspection object 6 and the swing inclination angle θ on the XY plane as parameters. Since the inspection object 6 is placed on the pedestal, there is no moving mechanism in the Z-axis direction.

  In addition, the illumination device 4 can adjust the position coordinates (X, Y, Z) and the irradiation angle α of the illumination device 4, and can also adjust the illuminance via the illumination controller 41. By adjusting these, it is possible to capture an image in the same imaging environment as the reference image stored in the storage device 23.

  The inspection area display device 2 having the above-described configuration includes a plurality of image processing tools that execute various types of image processing on the image of the inspection object 6 imaged by the imaging device 1. The user selects in advance one or a plurality of image processing tools for the inspection object 6 based on the desired inspection content. The pass / fail determination is executed using the selected plurality of image processing tools.

  First, a representative image processing tool among a plurality of image processing tools provided in the inspection area display device 2 will be described. The user selects one or a plurality of image processing tools used for the inspection from the plurality of image processing tools, and adjusts the parameters set for each of the selected image processing tools. In the following, the functions of the image processing tool and representative examples of how to use the image processing tool are merely shown, and it goes without saying that an image processing tool corresponding to any image processing is an object of the present invention.

  First, the edge position measurement tool, for example, sets an inspection area where the user wants to detect an edge position by setting a window on a screen on which an image of the inspection object 6 is displayed, and within the set inspection area. Scan in any direction to detect multiple edges. The specification of one edge is received from the detected plurality of edges, and the position of the edge that has received the specification is measured.

  For example, labels are divided according to the shape of the inspection area. Specifically, the label is divided according to the shape, such as a label “1” when the inspection area is a rectangular area and a label “0” when the inspection area is an arc area. In this case, the setting information to be set for each label is different. The label of the inspection area, that is, the label “1” or the label “2” is one of the parameters in the edge position measurement tool.

  FIG. 4 is an exemplary view of an edge position measurement tool of the inspection area display device 2 according to the embodiment of the present invention. FIG. 4A shows a case where the inspection area is a rectangular area, and FIG. 4B shows a case where the inspection area is an arc area.

  As shown in FIG. 4A, when the inspection area 50 is a rectangular area, the edge detection direction is switched to the positive direction of the X axis (the direction of the arrow 51), and the edge detection position is switched from light to dark. In addition, by specifying each of them, three edges 52 can be detected in FIG. Then, the coordinates of the midpoint of the detected edge 52 are measured as the position of the edge 52. For example, the coordinate (X, Y) = (560, 460) of the middle point 53 of the middle edge 52 can be set as the position of the middle edge 52.

  Further, as shown in FIG. 4B, when the inspection area 54 is an arc area, the edge detection direction is switched clockwise (the rotation direction of the arrow 55), and the edge detection position is switched from light to dark. In FIG. 4B, one edge 56 can be detected by designating each of them. Then, the rotation angle 57 from a predetermined position passing through the origin is measured as the position of the detected edge 56. For example, for the edge 56, the rotation angle 57 from a predetermined position passing through the origin is 240 degrees, and 240 degrees can be set as the position of the edge 56. Note that the position where the light switches to dark and the specified edge detection position are also parameters in the edge position measurement tool, and conversely, the position where the light switches from dark to light may be specified as a parameter. Further, if necessary, both the position where the light switches from dark to light and the position where the light switches to dark may be specified as parameters.

  Note that the edge is detected based on the difference, not the absolute value of the pixel value. Then, by adjusting the edge sensitivity N that is one of the parameters, it is possible to adjust whether or not N% or less of the maximum intensity of the detected edge is not detected as noise, that is, whether or not it is detected as an edge. The same applies to other image processing tools that detect edges.

  Next, the edge angle measurement tool sets two segments in the inspection region that has received the setting, and measures the inclination angle of the inspection object 6 from the edge detected in each segment. In the present embodiment, the inclination angle is positive in the clockwise direction for convenience.

  FIG. 5 is an exemplary view of an edge angle measurement tool of the inspection area display device 2 according to the embodiment of the present invention. As shown in FIG. 5, an inspection area 60 that is a rectangular area is set for an image of the inspection object 6 captured in an inclined state. Two different segments 61 and 62 are set in the inspection area 60, and edges 63 and 64 are detected in the respective segments 61 and 62.

  The edges 63 and 64 can be detected for each of the segments 61 and 62 by designating the edge detection direction to the positive direction of the X axis and the edge detection position to a position where the edge detection position switches from light to dark, respectively. Then, from a predetermined position passing through the center of the inspection region 60, the slope of the line segment connecting the detected representative point of the two edges 63 and the representative point of the edge 64 (the intercept at the upper side of the segments 61 and 62 in FIG. 5). The angle 65 is measured as the edge angle. For example, in FIG. 5, it is possible to measure that the inclination angle 65 is 75 degrees and the edge angle is 75 degrees with the starting point of the inclination angle as the X-axis direction.

  Next, the edge width measurement tool detects a plurality of edges by scanning in an arbitrary direction within the inspection region where the setting is received, and measures the distances between the detected plurality of edges.

  FIG. 6 is an exemplary view of an edge width measurement tool of the inspection area display device 2 according to the embodiment of the present invention. FIG. 6A shows a case where the inspection area is a rectangular area, and FIG. 6B shows a case where the inspection area is an arc area.

  As shown in FIG. 6A, when the inspection area 70 is a rectangular area, the edge detection direction is switched to the positive direction of the X axis (the direction of the arrow 71) and the edge detection position is cut from light to dark as parameters. A plurality of edges can be detected by designating the switching position and the switching position from dark to bright. Then, by accepting designation of the two edges 72 and 73 for measuring the distance from the plurality of detected edges, the distance between the two edges 72 and 73 that have accepted the designation is measured as an edge width 74. For example, it can be measured that the edge width 74 is '100'.

  Further, as shown in FIG. 6B, when the inspection area 75 is an arc area, the edge detection position is switched clockwise (the rotation direction of the arrow 76), and the edge detection position is switched from light to dark. A plurality of edges can be detected by designating each of the positions that are switched from dark to bright. Then, by accepting designation of two edges 77 and 78 for measuring distances from the plurality of detected edges, the angle between the two edges 77 and 78 that have accepted the designation is measured as an edge width 79. For example, it can be measured that the edge width 79 is 69 degrees.

  Next, the edge pitch measurement tool detects a plurality of pairs of edges by scanning in an arbitrary direction within the inspection region in which the setting has been received. The maximum value / minimum value or average value of the distances between the detected pairs of edges is obtained.

  FIG. 7 is an exemplary view of an edge pitch measurement tool of the inspection area display device 2 according to the embodiment of the present invention. FIG. 7A shows a case where the inspection area is a rectangular area, and FIG. 7B shows a case where the inspection area is an arc area.

  As shown in FIG. 7A, when the inspection area 80 is a rectangular area, the edge detection direction is the positive direction of the X axis (the direction of the arrow 81), and the edge detection position is switched from light to dark. In addition, by designating that the distance between the detected plurality of pairs of edges is to be measured at the position where the light is switched from dark to bright, it is possible to detect a plurality of pairs of edges. Then, the distances between the detected multiple pairs of edges are each measured. That is, the distance between the adjacent edges 82 and 83 is measured as the edge width 84 for all of the plurality of pairs. For example, when the edge width 84 is ‘200’, ‘180’, and ‘190’, the maximum value can be ‘200’, the minimum value can be ‘180’, and the average value can be ‘190’.

  Also, as shown in FIG. 7B, when the inspection area 85 is an arc area, the edge detection direction is switched counterclockwise (rotation direction of the arrow 86), and the edge detection position is switched from light to dark. A plurality of pairs of edges can be detected in the inspection region 85 by designating that the distances between the midpoints of the detected pairs of edges are respectively measured at the position and the position where the light is switched from dark to bright. . Then, the distance between the midpoints of the detected plurality of pairs of edges is measured. That is, the midpoint between the adjacent edges 87 and 88 is obtained for all of the plurality of pairs, and the angle between the adjacent midpoints is measured as the edge width 89. For example, when the edge width 89 is “46 degrees”, “45 degrees”, “47 degrees”, and “46 degrees”, the maximum value is “47 degrees”, the minimum value is “45 degrees”, and the average value is “46”. Can be 'degree'.

  Next, the pair edge measurement tool detects a plurality of pairs of edges by scanning twice in an arbitrary direction within the inspection region in which the setting is received. The maximum value / minimum value or average value of the distances between the detected pairs of edges is obtained.

  FIG. 8 is an exemplary view of a pair edge measurement tool of the inspection area display device 2 according to the embodiment of the present invention. FIG. 8A shows a case where the distance between the detected pairs of edges is measured, and FIG. 8B shows a case where the distance between the midpoints of the detected pairs of edges is measured. Yes.

  As shown in FIG. 8A, when measuring the distance between a plurality of pairs of detected edges, the edge detection direction is the positive direction of the X axis (the direction of the arrow 91), and the edge detection position is bright to dark. A plurality of pairs of edges can be detected in the inspection region 95 by designating that the distance between the detected plurality of pairs of edges is to be measured at the position where switching to dark and the position where switching from dark to bright is performed. Then, the distances between the detected multiple pairs of edges are each measured. That is, the distance between the adjacent edges 97 and 98 is measured as the edge width 94 for all of the plurality of pairs. For example, when the edge width 94 is ‘200’, ‘180’, and ‘190’, the maximum value can be ‘200’, the minimum value can be ‘180’, and the average value can be ‘190’.

  Also, as shown in FIG. 8B, when measuring the distance between the midpoints of the detected pairs of edges, the edge detection direction is the positive direction of the X axis (the direction of the arrow 96), and the edge detection is performed. By specifying that the distance between the midpoints of the detected plurality of pairs of edges is to be measured at the position where the position is switched from light to dark and the position where the position is switched from dark to light, respectively. Edges can be detected. Then, the distance between the midpoints of the detected plurality of pairs of edges is measured. That is, the midpoint between the adjacent edges 97 and 98 is obtained for all the plural pairs, and the distance between the adjacent midpoints is measured as the edge width 99. For example, when the edge width 99 is ‘100’, ‘110’, and ‘120’, the maximum value can be ‘120’, the minimum value can be ‘100’, and the average value can be ‘110’.

  Next, the area measurement tool binarizes the image of the inspection target 6 imaged by the imaging device 1 and measures the area of the white region or the black region. For example, the area of the white region or the black region is measured by accepting designation of a white region or a black region as one of the parameters.

  In addition, the blob measurement tool binarizes the image of the inspection object 6 imaged by the imaging apparatus 1, and sets a number of parameters for the set (blob) of pixels having the same luminance value (255 or 0). Measure area, center of gravity, etc. FIG. 9 is an exemplary view of a screen displaying a binarized image of the inspection area display device 2 according to the embodiment of the present invention.

  As shown in FIG. 9, a binarized image obtained by binarizing the captured image of the inspection object 6 is displayed in the image display area 101. And it adjusts by inputting into the threshold value adjustment area | region 102 as a parameter the threshold value used for a binarization process. Of course, the histogram 103 may be used for adjustment.

  The histogram 103 shows the pixel value distribution of the binarized image. Usually, the lower limit value of the area filter is dragged with the mouse 502 or the like so that the portion where the pixel value is close to “255” is not filtered. Adjust by etc. In the example of FIG. 9, the lower limit value of the area filter, which is one of the parameters, is '128', and a pixel having a lower pixel value is ignored as noise. It goes without saying that the threshold value adjusted on the histogram 103 is linked to the threshold value adjustment region 102 and the lower limit value fluctuates.

  Note that the area measurement tool and the blob measurement tool can detect only the characteristic portion to be detected by adjusting the threshold value of the binarization process as one of the parameters. Further, by adjusting the lower limit value of the area filter, it is also possible to adjust so that a group having a certain area or less is not detected as a blob.

  Next, the pattern search measurement tool stores an image pattern to be compared in advance in the storage device 23, and measures the position, tilt angle, and correlation value of the image pattern, thereby imaging the inspection object 6 that has been imaged. An image pattern similar to the stored image pattern is detected from the images. FIG. 10 is an exemplary view of a pattern search measurement tool of the inspection area display device 2 according to the embodiment of the present invention. FIG. 10A shows an example of a screen when an image pattern is stored, and FIG. 10B shows an example of a screen when an image pattern similar to the stored image pattern is detected. , Respectively.

  As shown in FIG. 10A, the setting of the search area 111 is accepted by setting a window on the screen in a state where the image of the inspection object 6 imaged by the imaging device 1 is displayed at the center of the screen. An image pattern existing in the search area 111 is detected, and the setting of the pattern area 112 is accepted as an area surrounding the stored image pattern. Of course, the setting of the representative point 113 of the image pattern in the pattern area 112 may be accepted. The image pattern 114 in the pattern area 112 is stored in the storage device 23.

  At the time of pattern search by the pattern search measurement tool, as shown in FIG. 10B, an image pattern similar to the stored image pattern 114 is searched in the search area 115. In the example of FIG. 10, the pattern area 119 is specified by the position coordinates of the representative point 118 of the image pattern and the inclination angle 117, and the correlation value between the image pattern in the pattern area 119 and the stored image pattern 114 is a parameter. If it is larger than a predetermined threshold, which is one of the above, it is determined that they are similar.

  Of course, the pattern search method is not limited to this. For example, an edge is detected for each of the stored image pattern and the image of the inspection object 6 imaged by the imaging apparatus 1 and the edge intensity is similar. The position, inclination angle, and correlation value of the image pattern may be measured in the vicinity of the existing position.

  Note that the pattern search measurement tool can be adjusted to detect only image patterns with higher similarity by increasing the lower limit value of the correlation value set as the threshold value. In addition, parameters such as search sensitivity and search accuracy can be adjusted.

  Next, the flaw measurement tool calculates a mean density value of pixel values by moving a small area (segment) within the inspection area where the setting is accepted, and if a flaw exists at a position where the density difference is equal to or greater than the threshold value. judge. FIG. 11 is a schematic diagram showing a segment movement state for determining the presence of a flaw with the flaw measuring tool of the inspection area display device 2 according to the embodiment of the present invention. Hereinafter, in FIGS. 11A to 11D, the hatched portions indicate segments.

  First, as shown in FIG. 11A, when the segment 121 is located at the left end of the inspection region 120 (hereinafter referred to as “current segment”), the average density value in the segment 121 is set to “95”. Then, the segments 121 sequentially move in the direction of the arrow 122 at a predetermined interval.

  FIG. 11B shows a case where “1” is moved from the current segment (“current segment + 1”), and the average density value in the segment 121 in this case is “80”. In the following, FIG. 11C shows a case where “2” is moved from the current segment (referred to as “current segment + 2”). In this case, the average density value in the segment 121 is set to “100”. FIG. 11D shows a case where “3” is moved from the current segment (“current segment + 3”), and the average density value in the segment 121 in this case is “120”.

  In the example of FIG. 11, the average density value in the four segments 121 is measured. Then, the difference between the maximum density value and the minimum density value is measured as the “scratch level”. In the example of FIG. 11, the “scratch level” is the maximum density value 120 (current segment + 3) −minimum density value 80 (current segment + 1) = 40.

  When the “scratch level” exceeds a predetermined threshold which is one of the parameters, it is determined that a “scratch level” exists in the “current segment”. The “scratch amount” is measured as the number of segments determined to have a scratch.

  It should be noted that by adjusting a predetermined threshold value for determining the presence of a flaw, the size of a segment to be matched to the assumed size of the flaw, and the like, it is possible to change the determination result of whether or not a flaw exists.

  In addition to the various image processing tools described above, the OCR recognition tool that recognizes character strings by cutting out character information in the inspection area and collating it with dictionary data, etc., while shifting the window (area) set on the image It also has a trend edge tool that has the function of repeating edge detection at each window position, and a shading tool that has the function of measuring the average and deviation of shades in the set window, and accepts selection as necessary. . The determination result processed by each image processing tool, that is, the non-defective / defective product determination result is associated with information for identifying the inspection object 6 and information for identifying the image processing tool, and the storage device of the inspection area display device 2 23. The plurality of image processing tools described above are set in the order of image processing desired by the user based on the image processing flow desired by the user, and can execute image processing sequentially.

  FIG. 12 is a functional block diagram of the inspection area display device 2 according to the embodiment of the present invention. The reference image storage unit 301 stores a reference image serving as a reference for pass / fail determination in the storage device 23 in association with identification information for identifying the inspection object 6. One reference image may be stored for one inspection object 6, or a plurality of reference images may be stored. In the following embodiments, the reference image has an imaging area having the same size as the input image, that is, the size of the imaging area set in the imaging element of the imaging apparatus 1, but is not particularly limited thereto. It may be the size of the image area necessary for executing all the selected image processing tools set in the imaging area, and corresponds to each image processing tool selected by the user. It may be a partial image.

  The image acquisition unit 302 acquires an image of the inspection object 6 captured by the imaging device 1. The image display unit 303 displays either the acquired image of the inspection object 6 or the stored reference image. Which image is displayed is determined by accepting a user's selection.

  The inspection area setting unit 304 sets an inspection area for each image processing tool. The thumbnail image generation unit 305 generates a thumbnail image obtained by converting the image of the inspection object 6 including the set inspection region into a thumbnail. The image of the inspection object 6 may be a reference image stored in the reference image storage unit 301 or may be an image of the inspection object acquired by the image acquisition unit 302 and acquired by the image acquisition unit 302. . That is, the thumbnail image generation unit 305 may generate an image related to the inspection region set for each image processing tool by superimposing the reduced image of the reference image that is a reference for determining whether the inspection object 6 is acceptable, Alternatively, an image related to the inspection area set for each image processing tool may be superimposed on the captured image obtained by reducing the image of the inspection object 6 captured by the imaging device 1.

  The thumbnail image display unit 306 displays the generated thumbnail image. By accepting selection by the user from one or a plurality of displayed thumbnail images, it is possible to easily select an image processing tool used for inspection.

  FIG. 13 is a flowchart showing a processing procedure of the CPU 21 of the inspection area display device 2 according to the embodiment of the present invention. In FIG. 13, the CPU 21 of the inspection area display device 2 acquires a reference image that is a reference for pass / fail determination, and stores it in the storage device 23 in association with identification information for identifying the inspection object 6 (step S1301). One reference image may be stored for one inspection object 6, or a plurality of reference images may be stored.

  The CPU 21 acquires an image of the inspection target 6 imaged by the imaging device 1 (step S1302). The CPU 21 accepts selection of either the acquired image of the inspection object 6 or the stored reference image (step S1303), and displays the accepted image on the display device 503 (step S1304).

  FIG. 14 is a view showing an example of a thumbnail display screen of the examination area display device 2 according to the embodiment of the present invention. FIG. 15 is a view showing an example of another type of thumbnail display screen of the examination area display device 2 according to the embodiment of the present invention. As illustrated in FIG. 14, when the selection of “camera“ 1 ”” is accepted as the imaging device 1 in the imaging device selection area 141, the thumbnail image of the image processing tool associated with “camera“ 1 ”” is displayed. It is displayed in the thumbnail image display area 142. In the example of FIG. 14, thumbnail images are generated by superimposing images related to the inspection region set in the stored reference image. Specifically, in the present embodiment, images of various edge detection tools such as a pattern search measurement tool, a trend edge tool, and an edge width measurement tool are selected by the user from the image processing tools provided in the inspection area display device 2. It can be seen that a processing tool is selected and an inspection area is set for each image processing tool.

  On the other hand, the image display area 140 displays an image (input image) of the inspection object 6 imaged as an inspection object. Then, positioning correction by the selected image processing tool, for example, a pattern search measurement tool, is performed on the displayed input image, and the position of the inspection region set in the reference image is also corrected, whereby the reference image is displayed. All set inspection areas are displayed superimposed on the input image.

  14 and FIG. 15 is provided with selection means (not shown) on the user interface so that all inspection areas set by the user as reference images are displayed superimposed on the input image (corresponding to the display in FIG. 14). ) Or the selection of a mode (corresponding to the display in FIG. 15) in which only the inspection area set for the image processing tool designated by the user from the thumbnail image display area 142 is displayed superimposed on the input image. it can. Further, a mode for displaying only the input image may be added to the two modes.

  Returning to FIG. 13, the CPU 21 of the inspection area display device 2 sets an inspection area for each image processing tool (step S <b> 1305), and displays a thumbnail image obtained by thumbnailing the image of the inspection object 6 including the set inspection area. Generate (step S1306). In the example of FIG. 14, the stored reference image is used as the image of the inspection target 6, but of course, the image of the inspection target 6 captured by the imaging device 1 may be used. In other words, an image related to the inspection area set for each image processing tool may be superimposed on the reduced image of the reference image that is a reference for determining the quality of the inspection object 6, or may be captured by the imaging device 1. Alternatively, a captured image obtained by reducing the image of the inspection object 6 may be generated by superimposing an image related to the inspection region set for each image processing tool.

  In the thumbnail image display area 142 shown in FIG. 14, for each image processing tool selected by the user and used as the image inspection function, a thumbnail image in which the set inspection area is displayed superimposed on the reference image is generated. ing. More specifically, as can be understood from the “find an edge” image inspection function of the thumbnail image display area 142, even for the same image processing tool, a thumbnail image is generated for each inspection area. . However, it goes without saying that a thumbnail image in which all set inspection areas are displayed may be generated for each image processing tool.

  The screen shown in FIG. 15 is an overlay display method in another form of the input image displayed in the image display area 140 and the inspection area. The mode is switched and selected by the user as compared with the screen shown in FIG. Since “find an edge” is designated in the thumbnail image display area 142 for displaying a plurality of thumbnail images corresponding to the designated image processing tool, the “edge” designated in the reference image is displayed in the image display area 140. Only the inspection areas set for the “Find” image inspection function are displayed superimposed.

  In addition, when the setting of the inspection area is changed, the thumbnail image is immediately changed with the change of the inspection area. 16 and 17 are examples of screens when changing the setting of the inspection area of the inspection area display device 2 according to the embodiment of the present invention. FIG. 16 illustrates a screen when setting the inspection area, and FIG. 17 illustrates a screen when changing the inspection area. In order to shift from the screen shown in FIG. 14 and the screen shown in FIG. 15 to the screen shown in FIG. 16, the “edit” button at the lower right of the screen shown in FIG. 14 or the screen shown in FIG. Accept. As a result, the image display area 140 displays the reference image and all the inspection areas set in the reference image.

  As another method, when the user clicks a specific inspection area displayed in the image display area 140 on the screen shown in FIG. 14 or the screen shown in FIG. 15, the reference image is displayed in the image display area 140. Alternatively, it may be automatically switched so that all the inspection areas set in the reference image are displayed in an overlapping manner.

  When the screen shown in FIG. 14 or the screen shown in FIG. 15 is displayed, an image processing tool desired by the user is selected from a plurality of image processing tools already provided in the inspection area display device 2, and each image processing tool is selected. The parameter is set. Therefore, by executing image processing on the input image, the determination result is displayed together with the input image in the image display area 140 shown in FIG. Specifically, when the determination result is NG, the color of the inspection area set for the image processing tool is changed and displayed. Thereby, the user can easily visually check which inspection region is the cause of the determination result being NG, and if necessary, the parameters, position, size, etc. of the inspection region It can be easily changed on the screen shown in FIG.

  As illustrated in FIG. 16, the inspection area display device 2 accepts selection of an image processing tool that changes the setting of the inspection area from the thumbnail images displayed in the thumbnail image display area 142. FIG. 16 illustrates a screen when the selection of the thumbnail image 161 of the pattern search measurement tool displayed at the left end of the thumbnail image display area 142 is received.

  At this time, the rectangular inspection area 162 is set over substantially the entire surface of the image display area 140. Here, as shown in FIG. 17, the rectangular inspection area 162 is reduced on the image display area 140 and changed to a new inspection area 172. In this case, also for the thumbnail image 171 displayed in the thumbnail image display area 142, the inspection area displayed is changed in accordance with the change of the inspection area on the image display area 140.

  This is not to simply reduce the screen displayed in the image display area 140 to generate a thumbnail image, but to reduce the image of the imaged inspection object 6 or the stored reference image, This is an effect that can be achieved because the images related to the inspection area are displayed in a superimposed manner. In the conventional method of simply generating a thumbnail image by reducing the screen, the thumbnail image is not changed in real time.

  Returning to FIG. 13, the CPU 21 of the examination area display device 2 displays the generated thumbnail image (step S1307). That is, the generated thumbnail image is displayed in the thumbnail image display area 142 of FIGS. By accepting selection by the user from one or a plurality of displayed thumbnail images, it is possible to easily select an image processing tool used for inspection.

  Note that the thumbnail image generation unit 305 may generate thumbnail images by grouping images related to a plurality of set inspection areas. That is, by grouping the set inspection areas according to a certain rule, it is easier to intuitively grasp the inspection areas than to generate thumbnail images for each image processing tool.

  For example, image processing tools arbitrarily selected by the user are grouped, and thumbnail images are generated for each group. In this case, by grouping a plurality of image processing tools set for one inspection object 6 as one group, the inspection area group set for one inspection object 6 is collectively displayed. be able to.

  A plurality of image processing tools may be grouped by type. Here, “type” means the type of image processing tool. For example, “scratch” -related image processing tools such as a scratch measurement tool may be grouped together, or “edge” -related image processing tools such as an edge position measurement tool may be grouped together.

  Furthermore, the image processing tools may be grouped for each category. Here, “category” means the type of use of the image processing tool. For example, image processing tools that perform appearance inspection such as a flaw measurement tool may be grouped together, and image processing tools that perform position inspection of the inspection object 6 such as edge position measurement tools may be grouped as one group. You may summarize.

  In addition, when position correction is performed on an image obtained by imaging the inspection object 6, when there are a plurality of position correction source images, these images may be grouped as one group. Since vertical movement, horizontal movement, and rotational movement are performed for one grouped image, there is no need to remember which image processing tool has performed position correction for each image, and which image from the thumbnail image at a glance. It is possible to check whether the position correction has been performed with the processing tool.

  Furthermore, for image processing tools that involve numerical operations, it is only necessary to display the inspection area group of the image processing tools cited by the numerical operations. Thereby, it is possible to intuitively grasp from the thumbnail image which image processing tool is used for the numerical calculation.

  As described above, according to this embodiment, instead of simply reducing the displayed screen and generating a thumbnail image, the thumbnail image is generated using the image of the inspection object 6 including the set inspection region. Since it is generated, it is possible to easily generate a thumbnail image desired by the user, and it is possible to select a desired image processing tool while visually confirming the inspection area by using the thumbnail image.

  The present invention is not limited to the above-described embodiments, and various changes and improvements can be made within the scope of the present invention. For example, the imaging device 1 and the inspection area display device 2 are not limited to the form directly connected by the connection cable 3, and needless to say, they may be connected via a network network such as a LAN or WAN.

1 Imaging device (imaging unit)
2 Inspection Area Display Device 4 Illumination Device 6 Inspection Object 301 Reference Image Storage Unit 302 Image Acquisition Unit 303 Image Display Unit 304 Inspection Area Setting Unit 305 Thumbnail Image Generation Unit 306 Thumbnail Image Display Unit

Claims (12)

Connected to an imaging unit for imaging the inspection object;
In an inspection area display device that performs image processing on an image captured by the imaging unit and displays an inspection area that is an area for determining the quality of an inspection object based on a result of the image processing.
It has multiple image processing tools,
Based on the desired inspection content, we accept in advance selection of multiple image processing tools necessary for inspection,
For each image processing tool that has received a selection, an inspection area setting unit that sets an inspection area for the image of the inspection object;
A thumbnail image generation unit that generates thumbnail images that are sequentially thumbnailed for each image processing tool that has received a selection of an image of an inspection object including a set inspection region;
A thumbnail image display unit for displaying all thumbnail images generated for each image processing tool,
The image of the inspection object imaged by the imaging unit and the inspection area for each image processing tool set by the inspection area setting unit are displayed on one screen,
When changing the inspection area that has already been set for each image processing tool, the thumbnail image display unit accepts selection of a thumbnail image for changing the inspection area from among the plurality of displayed thumbnail images, and the inspection object The image and the inspection area set for the image processing tool corresponding to the selected thumbnail image are displayed in a superimposed manner, and after changing the contents of the inspection area, the corresponding thumbnail image is changed and displayed. An inspection area display device characterized in that:   2. The thumbnail image generation unit according to claim 1, wherein the thumbnail image generation unit generates the thumbnail image by superimposing an image related to the inspection region on a reduced image of a reference image that is a reference for determining whether the inspection target is acceptable or not. Inspection area display device.   The thumbnail image generation unit generates the thumbnail image by superimposing an image related to the inspection region on a captured image obtained by reducing the image of the inspection target image captured by the imaging unit. The inspection area display device described.   The reference image is displayed on one screen together with an inspection area for each image processing tool set by the inspection area setting section as an image of the inspection object imaged by the imaging section. 3. The inspection area display device according to 2.   The image of the inspection object imaged by the imaging unit is displayed on one screen together with the inspection area for each image processing tool set by the inspection area setting unit. 3. The inspection area display device according to 3.   The inspection area display device according to claim 1, wherein the thumbnail image generation unit generates the thumbnail image by grouping images related to a plurality of set inspection areas. Connected to an imaging unit for imaging the inspection object;
It is possible to execute image processing on an image captured by the imaging unit, and to perform it on an inspection area display device that displays an inspection area that is an area for determining the quality of an inspection object based on the result of the image processing In the inspection area display method,
From among a plurality of image processing tools provided in the inspection area display device, based on the desired inspection content, in advance selection of a plurality of image processing tools necessary for the inspection,
For each image processing tool that has received a selection, a step of setting an inspection area for the image of the inspection object;
Generating a thumbnail image that sequentially thumbnails the image of the inspection object including the set inspection region for each image processing tool that has received selection;
Displaying all thumbnail images generated for each image processing tool; and
The image of the inspection object imaged by the imaging unit and the inspection area for each set image processing tool are displayed on one screen,
When changing the inspection area that has already been set for each image processing tool, selection of the thumbnail image for changing the inspection area was received from the displayed thumbnail images, and the image and selection of the inspection object were received An inspection characterized by overlaying and displaying the inspection area set for the image processing tool corresponding to the thumbnail image, changing the contents of the inspection area, and then changing and displaying the corresponding thumbnail image Area display method.   The inspection area display method according to claim 7, wherein the thumbnail image is generated by superimposing an image relating to the inspection area on a reduced image of a reference image that is a reference for determining whether the inspection object is good or bad.   The inspection area display method according to claim 7, wherein the thumbnail image is generated by superimposing an image related to the inspection area on a captured image obtained by reducing an image of the inspection object imaged by the imaging unit.   The reference image is displayed on one screen together with an inspection area for each image processing tool set by the inspection area setting section as an image of the inspection object imaged by the imaging section. 9. The inspection area display method according to 8. The image of the inspection object imaged by the imaging unit is displayed on one screen together with the inspection area for each image processing tool set by the inspection area setting unit. 10. The inspection area display method according to 9.   The inspection area display method according to claim 7, wherein the thumbnail images are generated by grouping images related to a plurality of set inspection areas.