JP5683430B2 - 連続値回帰分析において用いられる特徴を選択する方法 - Google Patents

連続値回帰分析において用いられる特徴を選択する方法 Download PDF

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JP5683430B2
JP5683430B2 JP2011230987A JP2011230987A JP5683430B2 JP 5683430 B2 JP5683430 B2 JP 5683430B2 JP 2011230987 A JP2011230987 A JP 2011230987A JP 2011230987 A JP2011230987 A JP 2011230987A JP 5683430 B2 JP5683430 B2 JP 5683430B2
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regression analysis
value
feature
features
continuous
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JP2012123782A (ja
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ケヴィン・ダブリュ・ウィルソン
ユボ・チェン
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Mitsubishi Electric Research Laboratories Inc
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00Pattern recognition
    • G06F18/20Analysing
    • G06F18/21Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/211Selection of the most significant subset of features

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JP2011230987A 2010-12-07 2011-10-20 連続値回帰分析において用いられる特徴を選択する方法 Expired - Fee Related JP5683430B2 (ja)

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US12/961,895 2010-12-07
US12/961,895 US8429101B2 (en) 2010-12-07 2010-12-07 Method for selecting features used in continuous-valued regression analysis

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JP2012123782A5 JP2012123782A5 (https=) 2014-10-02
JP5683430B2 true JP5683430B2 (ja) 2015-03-11

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US10007643B2 (en) * 2014-04-07 2018-06-26 International Business Machines Corporation Robust regression analysis techniques using exponential random variables
JP6187977B2 (ja) 2014-06-20 2017-08-30 インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Machines Corporation 解析装置、解析方法及びプログラム
US9398047B2 (en) * 2014-11-17 2016-07-19 Vade Retro Technology, Inc. Methods and systems for phishing detection
US10621535B1 (en) 2015-04-24 2020-04-14 Mark Lawrence Method and apparatus to onboard resources
JP6926978B2 (ja) * 2017-11-15 2021-08-25 日本電信電話株式会社 パラメータ推定装置、トリップ予測装置、方法、及びプログラム
US11315030B2 (en) 2018-03-06 2022-04-26 Tazi AI Systems, Inc. Continuously learning, stable and robust online machine learning system
EP4105881B1 (en) * 2020-02-13 2025-07-30 FUJIFILM Corporation Feature value selection method, feature value selection program, multiclass classification method, multiclass classification program, feature value selection device, multiclass classification device, and feature value set
US20230359781A1 (en) * 2022-05-04 2023-11-09 At&T Intellectual Property I, L.P. Feature selection method and system for regression analysis / model construction

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JP3534327B2 (ja) * 1995-02-06 2004-06-07 株式会社リコー 信号処理装置
US7505948B2 (en) * 2003-11-18 2009-03-17 Aureon Laboratories, Inc. Support vector regression for censored data
US7233931B2 (en) 2003-12-26 2007-06-19 Lee Shih-Jong J Feature regulation for hierarchical decision learning
US7685080B2 (en) * 2005-09-28 2010-03-23 Honda Motor Co., Ltd. Regularized least squares classification or regression with leave-one-out (LOO) error
US20100094784A1 (en) * 2008-10-13 2010-04-15 Microsoft Corporation Generalized kernel learning in support vector regression

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US20120143799A1 (en) 2012-06-07
JP2012123782A (ja) 2012-06-28

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