JP5649663B2 - ビット値の格納されているカウントを使用してデータの誤りを訂正するシステムおよび方法 - Google Patents
ビット値の格納されているカウントを使用してデータの誤りを訂正するシステムおよび方法 Download PDFInfo
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- JP5649663B2 JP5649663B2 JP2012551186A JP2012551186A JP5649663B2 JP 5649663 B2 JP5649663 B2 JP 5649663B2 JP 2012551186 A JP2012551186 A JP 2012551186A JP 2012551186 A JP2012551186 A JP 2012551186A JP 5649663 B2 JP5649663 B2 JP 5649663B2
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- 238000000034 method Methods 0.000 title claims description 40
- 238000012937 correction Methods 0.000 claims description 120
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- 230000008859 change Effects 0.000 description 5
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- 238000012804 iterative process Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
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- 238000004242 micellar liquid chromatography Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
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Images
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1072—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices in multilevel memories
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
- G06F11/0793—Remedial or corrective actions
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
- G06F11/1044—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices with specific ECC/EDC distribution
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
- G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Correction Of Errors (AREA)
- Read Only Memory (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/695,038 | 2010-01-27 | ||
US12/695,038 US8429468B2 (en) | 2010-01-27 | 2010-01-27 | System and method to correct data errors using a stored count of bit values |
PCT/US2011/020533 WO2011094051A1 (fr) | 2010-01-27 | 2011-01-07 | Système et procédé de correction d'erreurs de données à l'aide d'un compte stocké de valeurs de bit |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2013518345A JP2013518345A (ja) | 2013-05-20 |
JP5649663B2 true JP5649663B2 (ja) | 2015-01-07 |
Family
ID=43736047
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012551186A Expired - Fee Related JP5649663B2 (ja) | 2010-01-27 | 2011-01-07 | ビット値の格納されているカウントを使用してデータの誤りを訂正するシステムおよび方法 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8429468B2 (fr) |
EP (1) | EP2529305B1 (fr) |
JP (1) | JP5649663B2 (fr) |
KR (1) | KR101696389B1 (fr) |
CN (1) | CN102725738A (fr) |
TW (1) | TW201145296A (fr) |
WO (1) | WO2011094051A1 (fr) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
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US8645792B2 (en) * | 2008-12-16 | 2014-02-04 | Micron Technology, Inc. | Memory with guard value dependent error correction |
KR101739878B1 (ko) * | 2011-02-22 | 2017-05-26 | 삼성전자주식회사 | 컨트롤러, 이의 동작방법, 및 상기 컨트롤러를 포함한 메모리 시스템 |
US9032269B2 (en) | 2011-07-22 | 2015-05-12 | Sandisk Technologies Inc. | Systems and methods of storing data |
WO2013065085A1 (fr) * | 2011-11-01 | 2013-05-10 | Hitachi, Ltd. | Système de mémoire non volatile corrigeant une probabilité antérieure portant sur des codes contrôle de parité à basse densité |
US9391638B1 (en) * | 2011-11-10 | 2016-07-12 | Marvell Israel (M.I.S.L) Ltd. | Error indications in error correction code (ECC) protected memory systems |
US8775904B2 (en) | 2011-12-07 | 2014-07-08 | International Business Machines Corporation | Efficient storage of meta-bits within a system memory |
KR101941270B1 (ko) | 2012-01-03 | 2019-04-10 | 삼성전자주식회사 | 멀티-레벨 메모리 장치를 제어하는 메모리 제어기 및 그것의 에러 정정 방법 |
US20140325315A1 (en) * | 2012-01-31 | 2014-10-30 | Hewlett-Packard Development Company, L.P. | Memory module buffer data storage |
US9362003B2 (en) | 2012-03-09 | 2016-06-07 | Sandisk Technologies Inc. | System and method to decode data subject to a disturb condition |
KR101917192B1 (ko) | 2012-03-12 | 2018-11-12 | 삼성전자주식회사 | 불휘발성 메모리 장치 및 불휘발성 메모리 장치의 읽기 방법 |
US9064575B2 (en) | 2012-08-03 | 2015-06-23 | Micron Technology, Inc. | Determining whether a memory cell state is in a valley between adjacent data states |
RU2012134916A (ru) * | 2012-08-15 | 2014-02-20 | ЭлЭсАй Корпорейшн | Способ выбора подходящего кода ldcp |
KR102168096B1 (ko) * | 2013-03-15 | 2020-10-20 | 삼성전자주식회사 | 불휘발성 메모리 장치 및 그것의 데이터 쓰기 방법 |
US9218890B2 (en) * | 2013-06-03 | 2015-12-22 | Sandisk Technologies Inc. | Adaptive operation of three dimensional memory |
US20150046772A1 (en) * | 2013-08-06 | 2015-02-12 | Sandisk Technologies Inc. | Method and device for error correcting code (ecc) error handling |
KR102081588B1 (ko) | 2013-08-08 | 2020-02-26 | 삼성전자 주식회사 | Ecc 디코더의 동작 방법 및 그것을 포함하는 메모리 컨트롤러 |
US9270296B1 (en) * | 2013-11-13 | 2016-02-23 | Western Digital Technologies, Inc. | Method and system for soft decoding through single read |
US9305663B2 (en) * | 2013-12-20 | 2016-04-05 | Netapp, Inc. | Techniques for assessing pass/fail status of non-volatile memory |
US9570198B2 (en) * | 2014-05-16 | 2017-02-14 | SK Hynix Inc. | Read disturb detection |
US10089177B2 (en) | 2014-06-30 | 2018-10-02 | Sandisk Technologies Llc | Multi-stage decoder |
US9614547B2 (en) | 2014-06-30 | 2017-04-04 | Sandisk Technologies Llc | Multi-stage decoder |
KR102023121B1 (ko) * | 2014-10-31 | 2019-11-04 | 에스케이하이닉스 주식회사 | 에러를 보정하는 메모리 장치 및 그의 에러 보정 방법 |
US10147500B2 (en) * | 2015-05-22 | 2018-12-04 | SK Hynix Inc. | Hybrid read disturb count management |
US20160378591A1 (en) * | 2015-06-24 | 2016-12-29 | Intel Corporation | Adaptive error correction in memory devices |
US10303536B2 (en) * | 2015-10-28 | 2019-05-28 | Via Technologies, Inc. | Non-volatile memory device and control method thereof |
US9853661B2 (en) * | 2015-12-08 | 2017-12-26 | Apple Inc. | On-the-fly evaluation of the number of errors corrected in iterative ECC decoding |
KR102375060B1 (ko) * | 2016-10-18 | 2022-03-17 | 에스케이하이닉스 주식회사 | 데이터 저장 장치 및 그것의 동작 방법 |
US10528422B2 (en) * | 2017-11-13 | 2020-01-07 | Stmicroelectronics International N.V. | Redundant storage of error correction code (ECC) checkbits for validating proper operation of a static random access memory (SRAM) |
US11036578B2 (en) * | 2018-04-12 | 2021-06-15 | Samsung Electronics Co., Ltd. | Semiconductor memory devices and memory systems including the same |
JP7182373B2 (ja) * | 2018-04-24 | 2022-12-02 | ラピスセミコンダクタ株式会社 | 半導体集積回路、記憶装置及びエラー訂正方法 |
CN110444243A (zh) * | 2019-07-31 | 2019-11-12 | 至誉科技(武汉)有限公司 | 存储设备读错误纠错能力的测试方法、系统及存储介质 |
CN113380303B (zh) * | 2020-03-10 | 2024-06-11 | 华邦电子股份有限公司 | 内存存储装置及数据访问方法 |
US12095478B2 (en) * | 2020-06-22 | 2024-09-17 | SK Hynix Inc. | Memory and operation method of memory |
US11507454B2 (en) * | 2020-10-26 | 2022-11-22 | Oracle International Corporation | Identifying non-correctable errors using error pattern analysis |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6089749A (en) | 1997-07-08 | 2000-07-18 | International Business Machines Corporation | Byte synchronization system and method using an error correcting code |
US7320100B2 (en) * | 2003-05-20 | 2008-01-15 | Cray Inc. | Apparatus and method for memory with bit swapping on the fly and testing |
JP2005004288A (ja) * | 2003-06-10 | 2005-01-06 | Digital Electronics Corp | 誤り検出回路 |
JP2005011386A (ja) * | 2003-06-16 | 2005-01-13 | Renesas Technology Corp | 誤り訂正装置 |
US7900125B1 (en) * | 2004-05-24 | 2011-03-01 | Seagate Technology Llc | Majority detection in error recovery |
US7290185B2 (en) | 2005-04-28 | 2007-10-30 | International Business Machines Corporation | Methods and apparatus for reducing memory errors |
US7634706B1 (en) | 2005-11-22 | 2009-12-15 | Seagate Technology Llc | Majority-detected erasure enhanced error correction |
US7533328B2 (en) | 2006-07-04 | 2009-05-12 | Sandisk Il, Ltd. | Method of error correction in a multi-bit-per-cell flash memory |
KR100871700B1 (ko) | 2007-02-13 | 2008-12-08 | 삼성전자주식회사 | 불휘발성 메모리 장치에서 전하 손실에 기인한 오류 데이터정정 방법 |
WO2008121553A1 (fr) | 2007-03-29 | 2008-10-09 | Sandisk Corporation | Mémoire rémanente avec décodage de données utilisant des paramètres de fiabilité fondés sur des lectures multiples |
US7765426B2 (en) | 2007-06-07 | 2010-07-27 | Micron Technology, Inc. | Emerging bad block detection |
US20090177943A1 (en) | 2008-01-09 | 2009-07-09 | Broadcom Corporation | Error correction coding using soft information and interleaving |
US20090292971A1 (en) | 2008-05-21 | 2009-11-26 | Chun Fung Man | Data recovery techniques |
JP2012069180A (ja) * | 2010-09-21 | 2012-04-05 | Toshiba Corp | 半導体記憶装置 |
-
2010
- 2010-01-27 US US12/695,038 patent/US8429468B2/en active Active
-
2011
- 2011-01-07 WO PCT/US2011/020533 patent/WO2011094051A1/fr active Application Filing
- 2011-01-07 JP JP2012551186A patent/JP5649663B2/ja not_active Expired - Fee Related
- 2011-01-07 CN CN2011800070634A patent/CN102725738A/zh active Pending
- 2011-01-07 EP EP11700220.4A patent/EP2529305B1/fr not_active Not-in-force
- 2011-01-07 KR KR1020127021774A patent/KR101696389B1/ko active IP Right Grant
- 2011-01-14 TW TW100101537A patent/TW201145296A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
EP2529305A1 (fr) | 2012-12-05 |
KR101696389B1 (ko) | 2017-01-13 |
TW201145296A (en) | 2011-12-16 |
JP2013518345A (ja) | 2013-05-20 |
US20110185251A1 (en) | 2011-07-28 |
EP2529305B1 (fr) | 2013-11-27 |
WO2011094051A1 (fr) | 2011-08-04 |
KR20120114366A (ko) | 2012-10-16 |
US8429468B2 (en) | 2013-04-23 |
CN102725738A (zh) | 2012-10-10 |
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