JP5648687B2 - Orientation measuring apparatus and method - Google Patents

Description

  The present invention relates to an apparatus and method for measuring the orientation or dielectric anisotropy of a sheet-like substance such as paper, nonwoven fabric, and film using a plurality of microwave dielectric resonators.

  When a plurality of dielectric resonators are used in the method of measuring the orientation of the sheet-like substance, it is necessary to remove the influence of the solid difference between the dielectric resonators. As a means for that, a method for obtaining a correction coefficient reflecting a solid difference between dielectric resonators has been proposed (see Patent Documents 1 to 3). A series of procedures for calculating the correction coefficient of these proposals shows an effective means for removing the influence of the solid difference between dielectric resonators in terms of methodologies.

  Patent Document 1 shows a method for obtaining a correction coefficient using a substantially non-oriented standard sample having no anisotropy, and Patent Document 2 shows a method for obtaining a correction coefficient using a sample to be measured itself. Patent Document 3 shows a method for accurately obtaining a correction coefficient in an off-line state even when the measurement sample has wrinkles or creases or the sample is paper that transmits air. The correction for removing the influence of the solid difference between the dielectric resonators described in these patent documents is to remove the solid difference of the shift amount of the resonance frequency in the state with the sample with reference to the air so-called blank state. .

Japanese Patent No. 3882641 Japanese Patent No. 4124147 JP 2010-71835 A

  The present invention also relates to a correction method for removing the influence of the solid difference between the dielectric resonators. However, the present invention is further studied to cover the individual difference in sensitivity to the dielectric anisotropy of the sample of each dielectric resonator. It is something to try.

  That is, in the present invention, when a plurality of dielectric resonators are used in the method for measuring the orientation of the sheet-like substance, the resonance frequency shift in the state with the sample with respect to the blank state of each dielectric resonator. It is an object of the present invention to provide an orientation measuring apparatus and method capable of obtaining a correction coefficient for correcting a solid difference in sensitivity to a dielectric anisotropy of a sample of each dielectric resonator in addition to a solid difference in quantity. .

  The orientation measuring apparatus of the present invention includes a measuring head having a plurality of dielectric resonators (No. 1 to No. n) arranged at equal intervals on the circumference of one circle on a plane, and FIG. As shown in FIG. 4, a shift amount calculation unit (36), a variation correction value calculation unit (38), a shift correction coefficient calculation unit (40), a shift amount calculation unit after shift correction (41), and an anisotropic sensitivity correction coefficient calculation unit (42), a correction coefficient storage unit (43), a shift correction unit (44), and an orientation calculation unit (46).

  The shift amount calculation unit (36) calculates the blank resonance frequency of each dielectric resonator when the sample is not placed on the measurement head and the resonance frequency of each dielectric resonator when the sample is placed on the measurement head. The difference between the two resonance frequencies is calculated as the amount of shift for each capture and dielectric resonator.

  The variation correction value calculation unit (38) includes a correction coefficient measurement sample (hereinafter referred to as a correction sample) disposed in the measurement head, and the correction corresponding to the position of the dielectric resonator when the measurement head measures the actual sample. The correction sample or measurement head is equally spaced around the center of the circle so that each of the measurement areas (Pos.1 to Pos.n) on the sample is moved and positioned at all dielectric resonator positions. Using the shift amount at each rotation angle position when rotated at a rotation angle (0, 360 ° / n, ... 360 (n-1) ° / n) at all the rotation angle positions By dividing the average value of the shift amount by the average value of the shift amount at each rotation angle, a variation correction value for the shift amount for each rotation angle is obtained.

  The variation-corrected shift amount calculation unit (39) calculates the shift amount after variation correction by multiplying the variation correction value by the shift amount at the position of each rotation angle.

  The shift correction coefficient calculation unit (40) obtains a coefficient by dividing the average value of the shift amount after variation correction for each measurement region by the shift amount after variation correction for each dielectric resonator, and obtains the dielectric resonance of the coefficient. The shift correction coefficient (K1) for each dielectric resonator is obtained by calculating the average value for each resonator.

  The shift amount after shift correction calculation unit (41) calculates the shift amount after shift correction by multiplying the shift correction coefficient (K1) by the shift amount after variation correction.

  The anisotropic sensitivity correction coefficient calculation unit (42) calculates the average value of the shift amount after shift correction for each measurement region in the dielectric region located in each measurement region at the rotation angle for measuring the orientation of the actual sample out of the rotation angles. By dividing by the shift amount after shift correction of the body resonator, the anisotropy sensitivity correction coefficient (K2) for each dielectric resonator with respect to the dielectric anisotropy of the corrected sample is calculated. The anisotropy sensitivity correction coefficient (K2) corrects the sensitivity variation between the dielectric resonators with respect to the dielectric anisotropy of the sample.

  The correction coefficient storage unit (43) stores the shift correction coefficient (K1) and the anisotropic sensitivity correction coefficient (K2).

  The shift correction unit (44) stores the shift correction coefficient stored in the correction coefficient storage unit (42) in the shift amount for each dielectric resonator calculated by the shift amount calculation unit (36) when measuring the orientation of the actual sample. The shift amount is corrected by multiplying (K1) by the anisotropic sensitivity correction coefficient (K2).

  The orientation calculation unit (46) calculates the orientation of the actual sample based on the shift amount corrected by the shift correction unit (44).

  An orientation measuring method of the present invention is an orientation having a measuring head having a plurality of dielectric resonators (No. 1 to No. n) arranged at equal intervals on the circumference of one circle on a plane. This is a method for measuring the orientation of a sample having orientation by using the property measuring apparatus and comprising the following steps 1 to 11.

  (Step 1) A step of measuring the blank resonance frequency of each dielectric resonator in a state where the measurement object is not disposed on the measurement head.

  (Step 2) A correction sample is arranged on the measurement head, and the measurement region on the correction sample (Pos. 1 to Pos. N) corresponding to the position of the dielectric resonator when the measurement head measures the actual sample to be measured. ) Are moved to positions of all the dielectric resonators, and the correction sample or the measurement head is rotated at equal intervals around the center of the circle (0, 360 ° / n,... 360). rotating at (n-1) ° / n) and measuring the resonant frequency of each dielectric resonator at each rotational angle position.

  (Step 3) The shift amount of each dielectric resonator at each rotational angle is calculated from the difference between the blank resonant frequency of each dielectric resonator and the resonant frequency of each dielectric resonator at each rotational angle. Step to do.

  (Step 4) With respect to the shift amount of each dielectric resonator at each rotation angle position, the shift value for each rotation angle is obtained by dividing the average value at all the rotation angle positions by the average value at each rotation angle. Calculating a variation correction value of the.

  (Step 5) A step of calculating a shift amount after variation correction by multiplying the variation correction value by the shift amount at each rotation angle.

  (Step 6) For each measurement region, the average value of the shift amount after variation correction is calculated, and the coefficient is calculated by dividing the average value by the shift amount after variation correction for each dielectric resonator. A shift correction coefficient calculating step for obtaining a shift correction coefficient (K1) for each dielectric resonator on average for each resonator.

  (Step 7) A step of calculating a shift amount after shift correction by multiplying the shift correction coefficient (K1) by the shift amount after variation correction.

  (Step 8) An average value for each measurement region of the shift amount after shift correction is obtained, and the average value of the dielectric resonator located in each measurement region in the rotation angle for measuring the orientation of the actual sample in the rotation angle. An anisotropic sensitivity correction coefficient calculating step of calculating an anisotropic sensitivity correction coefficient (K2) for each dielectric resonator with respect to the dielectric anisotropy of the corrected sample by dividing by the shift amount after shift correction.

  (Step 9) storing the shift correction coefficient (K1) and the anisotropic sensitivity correction coefficient (K2) in the storage device.

  (Step 10) The measurement head and the actual sample are in the state of the rotation angle for measuring the orientation of the actual sample, the actual sample is measured by each dielectric resonator, the shift amount is calculated, and the calculated shift amount is A shift amount correction step of multiplying the stored shift correction coefficient (K1) and the anisotropic sensitivity correction coefficient (K2).

  (Step 11) A step of calculating the orientation of the actual sample based on the corrected shift amount.

  The orientation measuring device is preferably configured to measure an on-line sample running as a real sample.

  As the measurement head, either a rotatable measurement head supported so as to be rotatable in the plane around the center of the circle or a fixed measurement head fixed so as not to rotate can be used.

  An orientation measuring apparatus having a rotatable measuring head positions a dielectric resonator in a plurality of measurement regions (Pos. 1 to Pos. N) on the circumference, and all the dielectric resonators are Is further provided with a rotation mechanism that rotates the measurement head at equal intervals of rotation angles (0, 360 ° / n,... 360 (n−1) ° / n) so as to be positioned in the measurement region. The rotating mechanism rotates the measuring head when measuring the correction sample, and fixes the measuring head at the rotation angle for measuring the actual sample when measuring the actual sample.

  In an orientation measuring device having a rotatable measuring head, a traveling actual sample can be used as a correction sample.

  In an orientation measuring apparatus equipped with a fixed measuring head, when the actual sample travels, a correction sample prepared separately from the actual sample is rotated at equal intervals with respect to the measuring head (0, 360). Rotated at ° / n, ... 360 (n-1) ° / n). An example of such a correction sample is a sample piece obtained by cutting out a part of an actual sample.

  An example of a preferable fixed measurement head for enabling measurement under conditions close to the measurement conditions of an actual sample that travels a correction sample made of a sample piece is an air suction to a portion other than a portion where a dielectric resonator is disposed. It has a hole, and the sample can be adsorbed to the measuring head by the air suction force. Such a measurement head is used so that the sample piece is attracted to the measurement head by an air suction force when measuring the sample piece, and the air suction force is not applied when measuring the actual sample.

  When measuring a correction sample consisting of a sample piece with a measurement head having such an air suction hole, the pseudo blank resonance frequency when the non-oriented reference film is adsorbed to the measurement head and measured, and the correction sample are measured with the measurement head. The reference film is placed on the correction sample, and the difference between the correction frequency and the resonance frequency when the correction sample and the reference film are stacked and adsorbed on the measurement head is used as the shift amount when the correction sample is measured. To do.

  According to the present invention, in the case where a plurality of dielectric resonators are used in the method for measuring the orientation of the sheet-like substance, the resonance frequency in the state with the sample based on the blank state of each dielectric resonator is used. In addition to the individual difference in shift amount, a correction coefficient for correcting the individual difference in sensitivity to the dielectric anisotropy of the sample of each dielectric resonator can be obtained. In the measurement head of the orientation measurement device used to measure the orientation, each dielectric resonator is mounted on one metal measurement head using aluminum, brass, copper, etc., but there is a slight variation in metal processing accuracy. The slight variation in the mounting state of the plurality of dielectric resonators mounted in the hole provided in the measurement head while maintaining a slight clearance from the bottom and the side peripheral portion is caused by the detection unit using the dielectric resonator. May affect resonance. In other words, according to the present invention, the dielectric anisotropy is corrected by correcting the inherent individual difference of each detection unit using a dielectric resonator, including the effect of variations caused during processing of the measuring head on the resonance state. Even when measuring a so-called non-orientated sample having a small size, it is possible to accurately indicate the orientation of the measurement sample represented by the orientation angle, the orientation degree, and the like.

It is a block diagram which shows each part for the data processing in this invention. It is a top view which shows the circular measurement head holding five dielectric resonators. It is a block diagram which shows a signal processing system at the time of using five dielectric resonators. It is a figure which shows the orientation pattern obtained from the output of each dielectric resonator. It is a flowchart which shows the correction coefficient measurement operation | movement in one Example. It is a flowchart which shows the orientation measurement operation | movement in the Example. It is the first half of the chart which shows the correction coefficient measurement operation and orientation measurement operation in the example based on change of data. It is the latter half part of the figure which shows the correction coefficient measurement operation | movement and orientation measurement operation | movement in the Example based on the change of data. It is a schematic plan view showing a resonator number of a measurement head and a position (PosA-PosE) which is a measurement region of a sample. It is a graph which shows the shift amount after dispersion | variation correction | amendment of the resonance frequency which each dielectric resonator shows in five positions when only the dispersion | variation in the frequency shift amount of each angle is correct | amended. It is a graph which shows the shift amount after shift correction of the resonance frequency which each dielectric resonator shows in five positions, when the solid difference of the frequency shift amount from the blank resonance frequency which each dielectric resonator has is corrected. It is a graph which compares and shows the amount of shifts performed to the amount of shifts without correction, the amount of shifts after shift correction, and the anisotropic sensitivity correction. (A) is a top view which shows the measurement head which showed the position of five dielectric resonators, (b) is a figure which shows the orientation pattern obtained from the output of each dielectric resonator. FIG. 13 is a graph showing ideal resonance frequency shift amounts indicated by the dielectric resonators at five positions when the orientation pattern of FIG. It is a top view which shows an example of the measuring head with a suction hole. It is a disassembled perspective view which shows arrangement | positioning of the sample with respect to the measuring head of FIG. 14, and a reference | standard film. 6 is a graph showing the shift amount after correction of variation in resonance frequency indicated by each dielectric resonator at five positions when only variation in frequency shift amount at each angle is corrected, based on measured data. When the individual differences in the frequency shift amount from the blank resonance frequency of each dielectric resonator are corrected, the shift amount after shift correction of the resonance frequency indicated by each dielectric resonator at five positions is shown based on the measured data. It is a graph. It is a graph which shows the shift amount without correction | amendment, the shift amount after shift correction | amendment, and also the shift amount performed even to anisotropic sensitivity correction | amendment based on measured data. It is the graph which calculated | required the shift amount of the resonant frequency which each dielectric resonator shows in five positions by simulation about the case of orientation angle 15 degree | times.

  As a method of measuring orientation or dielectric anisotropy as a physical property of a sample, there is a method of using an evanescent wave that swells on the surface of a detection unit using a rectangular dielectric resonator by resonating with a microwave. . In this method, the change in the resonance frequency of the dielectric resonator when the detection unit is brought into contact with or close to the sample from one side is measured. When the detection unit contacts or approaches from one side of the sample, the resonance frequency shifts to the low frequency side according to the product of the value obtained by subtracting the dielectric constant 1 of air from the dielectric constant of the sample and the thickness. By measuring this shift amount, the fiber orientation or molecular orientation of a sheet-like material such as paper can be measured.

  Although the case where the number of dielectric resonators used is five will be described as an example, the number of dielectric resonators may be other numbers. As shown in FIG. 2, the measurement head 10 in this case includes five dielectric resonators 1 to 5 arranged on the circumference of one circle on a plane arranged on one surface side of the measurement object. It has. The dielectric resonators 1 to 5 are arranged at equal intervals so that the angle formed by the adjacent dielectric resonators and the center of the circle where the dielectric resonators 1 to 5 are arranged is 72 degrees. Has been.

  In this embodiment, the measuring head 10 is rotatable. The measurement head 10 is supported so as to be rotatable in a plane on which the dielectric resonators 1 to 5 are disposed, with the center of the circle where the dielectric resonators 1 to 5 are disposed as the center of rotation.

  The measuring head 10 includes a rotation mechanism 9. The rotating mechanism 9 positions the dielectric resonators 1 to 5 at positions Pos. 1 to Pos. 5 which are five measurement regions on the circumference where they are arranged, and also each dielectric resonator 1 to 1. The measuring head 10 is rotated with a rotation angle of 72 degrees at equal intervals so that 5 is positioned at all positions. The measurement region is a position on the correction sample or the actual sample corresponding to the position of the dielectric resonator in the measurement head when measuring the actual sample. The rotation mechanism 9 includes a stepping motor, for example, and the rotation angle is controlled by sending a drive pulse signal from a microcomputer 30 or a personal computer 32 described later.

  When such a plurality of dielectric resonators are used, signal processing can be performed by a signal processing system as shown in FIG. In this case as well, a case where five dielectric resonators are used will be described. The microwave signal output from the microwave sweep oscillator (sweeper) 20 is distributed to five dielectric resonators 22-1 to 22-5, and the transmission intensity of the dielectric resonators 22-1 to 22-5 is detected by the detection diode. It is converted into a voltage by 24-1 to 24-5. The signal converted into the voltage is amplified and A / D converted by the amplification and A / D conversion circuits 26-1 to 26-5 and sent to the peak detection circuits 28-1 to 28-5. Output signals from the peak detection circuits 28-1 to 28-5 are sent to the microcomputer 30.

  The microwave sweep oscillator 20 sweeps the frequency of the output microwave signal, and the peak detection circuits 28-1 to 28-5 detect the frequency of the peak position in the swept frequency range. Frequency sweeping by the microwave sweep oscillator 20 is repeated at a constant period, and the peak detection circuits 28-1 to 28-5 average the frequency detection values at the peak positions.

  Further, the microwave sweep oscillator 20 outputs a synchronization signal that becomes a high level only during the sweep of the output microwave signal, and the synchronization signal is sent to the peak detection circuits 28-1 to 28-5. In the microcomputer 30, the resonance frequency is obtained by measuring the time from when the synchronizing signal becomes high level until the transmission intensity reaches the maximum value.

  The microcomputer 30 implements the functions of the respective units shown in FIG.

  The difference between the blank resonance frequency when there is no sample and the resonance frequency when the sample is brought close to or in contact with the resonator is called a shift amount (Δf). When the shift amount is obtained for each of the five dielectric resonators 1 to 5 shown in FIG. 2 and plotted on the polar coordinates, an elliptic pattern can be drawn. Then, by performing ellipse approximation on the obtained data, an ellipse called an orientation pattern as shown in FIG. 4 is calculated, and the orientation of the sample is shown.

  Taking the on-line orientation measurement in which the sample travels as an example, in FIG. 4, the MD (Machine Direction) direction is the travel direction of the sample, and this direction is the reference direction. TD (Transverse Direction) is a direction orthogonal to the reference direction, and in the case of online measurement, it is the width direction of the sample. The major axis direction of the ellipse is the direction with the maximum dielectric constant, the angle φ formed between the reference direction and the direction with the maximum dielectric constant represents the orientation angle, and the difference between the major axis a and the minor axis b or the major axis a or What is divided by the short axis b represents the degree of anisotropy.

  The orientation calculation of the actual sample in the orientation calculation unit 46 and the orientation calculation of the actual sample in step 11 are shown in FIG. 4 using the shift amount corrected by the correction coefficient obtained by the present invention as the shift amount. This is performed based on the orientation pattern to be determined.

  Here, correction coefficient measurement will be described for an example in which the number of dielectric resonators used is five. Correction coefficient measurement is a correction coefficient calculation method including the following procedure in an orientation measurement method for obtaining the orientation of a sample to be measured.

  FIGS. 5 to 11 show an orientation having a measurement head having five dielectric resonators each having different frequency shift amount from the blank resonance frequency and sensitivity to anisotropy for a running paper whose MD direction is an orientation angle. It is an example which performed from the correction coefficient measurement to the actual sample measurement by the measuring device.

  First, correction coefficient measurement will be described. FIG. 5 shows the correction coefficient measurement operation, and FIG. 6 shows the orientation measurement operation of the actual sample after the correction coefficient is obtained. 7A and 7B show a correction coefficient measurement operation and an orientation measurement operation based on data changes. In this example, the traveling actual sample also serves as the correction sample.

  (Step S1) A blank resonance frequency is determined by measuring the resonance frequency of each dielectric resonator in a state where nothing is placed on a measurement head including five dielectric resonators arranged only on one side of the sample. Ask. In this blank measurement, the rotation angle of the measurement head may be anywhere, but in this example, it is set to the rotation angle for measuring the orientation of the actual sample. FIG. 8 shows the arrangement of the resonators in the measurement head at a rotation angle of 0 degrees and the measurement region (position) with respect to the sample. The measurement head at the rotation angle of 0 degrees represents the rotation angle at the time of orientation measurement. Set.

  (Step S2) The resonance frequency of each dielectric resonator is measured in a state in which the measurement head is in contact with the surface of the measurement target sample (actual sample) that is running.

  (Step S3) The measurement head is once rotated away from the measurement target sample surface, and after completion of the rotation, the measurement head is brought into contact with the measurement target sample surface again, or the measurement head is kept in contact with the measurement target sample surface. The measurement head is continuously or intermittently rotated to measure the resonance frequency of each dielectric resonator. In this embodiment, since the measuring head includes five resonators, the rotation angle is set to 5 levels from 0 degrees to 72 degrees.

  (Step S4) The shift amount at each rotation angle of each dielectric resonator is obtained from the difference between all the resonance frequencies of each dielectric resonator obtained up to Step S3 and the resonance frequency at the time of blank.

  (Step S5) The shift amount at each rotation angle obtained at step S4 is obtained by dividing the average value of all the dielectric resonators at each rotation angle by the average value of the resonators at each rotation angle. A variation correction value for correcting variation in the shift amount measurement value at each rotation angle is calculated, and the calculated variation correction value is multiplied by the shift amount at each rotation angle. This is a variation correction performed in order to avoid the influence of the fluctuation of the data due to the temporary change of the disturbance and the temporary change of the basis weight of the measurement sample during the measurement at each rotation angle in step S2. FIG. 9 shows a graph of the shift amount (Δf) after variation correction of the resonance frequency in each region, which is obtained when only this variation correction is performed.

  (Step S6) The average value of the shift amount after variation correction at each rotation angle of each dielectric resonator calculated by correcting the variation in step S5 is calculated for each measurement region, and the average value is calculated for each dielectric resonance. The shift amount of each dielectric resonator normalized for each measurement region is calculated by dividing by the shift amount after correcting the variation of the resonator. The shift amount of each normalized dielectric resonator is averaged for each dielectric resonator to obtain a correction coefficient K1 that corrects the solid difference in the frequency shift amount from the blank resonance frequency of each dielectric resonator. . The measurement region described here is a place where the correction sample and the actual sample are to be measured. As shown in the right diagram of FIG. 8, the fixed positions of the five resonators on the correction sample or the actual sample are respectively positioned. A, position B, position C, position D, and position E are defined. When the left diagram in FIG. 8 is a position at a measurement head rotation angle of 0 degrees with respect to the sample, No. 1 measured PosA, and so on. 2 is PosB, no. 3 is PosC, no. 4 is PosD, No. 4; 5 will measure PosE, respectively.

  Further, correction of sensitivity to the dielectric anisotropy of the sample will be described.

  (Step S7) The shift amount after variation correction in each measurement region of each dielectric resonator in which variation at each rotation angle is corrected is multiplied by the correction coefficient K1, and the obtained value is used for each dielectric resonance in each measurement region. The average value of the shift amount of the vessel is calculated. FIG. 10 shows a graph of the resonance frequency shift amount (Δf) in each measurement region after being multiplied by the correction coefficient K1 at this stage. Comparing FIG. 9 and FIG. 10, FIG. 10 corrects the variation in the frequency shift amount from the blank resonance frequency of each resonator, and the graphs of the dielectric resonators are concentrated near the average value graph. I understand that.

  (Step S8) The angle between the measurement head and the sample when measuring the orientation is selected from one of the levels of the relative angles during the correction coefficient measurement. This time, the angle of orientation measurement is 0 degree, that is, as shown in FIG. 1 measured PosA, and so on. 2 is PosB, no. 3 is PosC, no. 4 is PosD, No. 4; 5 is a state in which PosE is measured. Then, the average value of the shift amount of each resonator in each measurement region obtained in step S7 is similarly applied to each measurement region of the sample at the time of orientation measurement at the 0 degree rotation angle obtained in step S7. By dividing by the shift amount (PosA = No.1, PosB = No.2, PosC = No.3, PosD = No.4, PosE = No.5) of each corresponding dielectric resonator, A correction coefficient K2 for correcting variation in sensitivity of the dielectric resonator with respect to the dielectric anisotropy is calculated.

  The calculated correction coefficients K1 and K2 are stored in the storage unit and used when obtaining the orientation of the sample.

  Next, the process proceeds to the orientation measurement of the actual sample after the correction coefficient measurement.

  (Step S9) Under the rotation angle of 0 degrees determined in Step S8, an actual sample having a size covering the measurement surfaces of all dielectric resonators is placed on the measurement head, and the resonance frequency of each dielectric resonator is set. Measure. The actual sample is a running sample.

  (Step S10) The frequency shift amount of the actual sample is calculated from the difference between the resonance frequency of each dielectric resonator obtained in step S9 and the blank resonance frequency obtained in step S1. At this time, before performing step S9, blank measurement may be performed again in the state of only air with nothing on the measurement head again to obtain a blank resonance frequency, which may be used for calculation of the shift amount.

  (Step S11) The resonance frequency shift amount obtained in Step S10 is multiplied by the stored correction coefficient K1 and correction coefficient K2 to obtain a corrected shift amount, and the sample orientation is calculated based on the value. .

  Resonance in each region when the correction coefficient is not multiplied, only the correction coefficient K1 is multiplied, or when the correction coefficient K1 and the correction coefficient K2 are multiplied with respect to the shift amount obtained in step S9 and step S10. A graph of the frequency shift amount (Δf) is shown in FIG.

  Here, the shape of the graph of FIG. 11 will be described with reference to FIGS. In FIG. 12, the orientation pattern shown in (b) is obtained by measuring the paper oriented in the direction of the paper flow of the arrow as shown in (a) with the microwave dielectric resonator arranged as shown. It is shown that. In FIG. No. 1 dielectric resonator is Pos A, and so on. 2 is PosB, no. 3 is PosC, no. 4 is PosD, No. 4; 5 is a correspondence relationship for measuring PosE. FIG. 12 is an example of the shift amount of the resonance frequency indicated by each dielectric resonator at five positions when the contact state between the measurement head and the paper surface is uniform. When the orientation pattern as shown in FIG. 12B is obtained using five dielectric resonators, the shift amount (Δf) of the resonance frequency with respect to the positions A to E which are the fixed positions of the five heads. Theoretically takes the form of PosA <PosC = PosD <PosB = PosE as shown in FIG. Looking back at FIG. 11 based on this fact, the graph before correction and by multiplying the correction coefficient K1 is influenced by the sensitivity difference with respect to the anisotropy of the sample of each resonator, whereas the correction coefficient K1 It can be seen that the corrected graph multiplied by K2 is almost equivalent to the theoretically calculated relative relationship. In this way, by performing each step of the present invention and performing the correction coefficient measurement, an ideal measurement result as shown in FIG. 13 can be obtained.

  When using a measurement head that is fixed so as not to rotate as a measurement head, the traveling actual sample cannot be used as a correction sample. In that case, a sample piece obtained by cutting out a part of the actual sample is used as the correction sample.

  In the measurement of the resonance frequency by the correction sample for obtaining the correction coefficient, the correction sample is rotated with a rotation angle at equal intervals with respect to the measurement head, and the resonance frequency of each dielectric resonator is measured at each rotation angle position.

  For example, the following method can be used to rotate the correction sample with respect to the measurement head. For example, in a measurement head provided with five dielectric resonators, the dielectric resonators are arranged on the circumference of a circle on the measurement head surface, and adjacent dielectric resonators are separated from the center of the circle. They are arranged at equally spaced positions where the angle is 72 degrees. Therefore, a mark is also provided on the sample piece as the correction sample at a position on the circumference where the angle from the center is 72 degrees. Then, the correction sample is placed on the measurement head so that the mark of the correction sample is aligned with the position of the dielectric resonator of the measurement head, and the resonance frequency is measured. Next, the mark of the correction sample is the dielectric resonator of the measurement head. The resonance frequency is measured while sequentially rotating the correction sample by 72 degrees so that the resonance frequency is measured while the correction sample is rotated so as to move to the next position.

  In addition, when screw holes for attaching a lid to the measuring head, for example, are arranged at equally spaced positions where the angle from the center of the circle where the dielectric resonator is arranged is 72 degrees, The position of the screw hole or the like can be used as a guide when the correction sample is rotated similarly to the position of the dielectric resonator.

  Furthermore, when measuring a sample piece of a correction sample, particularly when performing correction coefficient measurement offline on a sample piece such as paper that allows air to pass through, a non-orientated film having no air permeability is used as a reference film. A measuring method is useful. The resonance frequency obtained by using the reference film is substituted for the blank value as a pseudo blank value, and the reference film is not rotated with respect to the measurement head during actual measurement, and only the correction sample is rotated relative to the measurement head. By doing so, the shift amount at each angle is calculated.

  At this time, it is necessary to bring the reference film and the correction sample into close contact with the measuring head, and a specific method thereof will be described. FIG. 14 is a plan view of the measuring head 10a capable of adsorbing the reference film and the correction sample as viewed from above. The measurement head 10a in this example does not rotate and is used while being fixed even when measuring a correction sample for obtaining a correction coefficient. A plurality of air suction holes 13 are provided in a portion other than the portion where the dielectric resonators 1 to 5 are disposed on the surface in contact with the sample in the measurement head 10a. The size and arrangement of the air suction holes 13 may be any as long as the sample and the reference film can be sufficiently adhered.

  FIG. 15 shows the positional relationship among the measuring head 10 a, the sample 11, and the reference film 12. The sample 11 and the reference film 12 are sucked by a plurality of air holes 13 on the surface of the measuring head 10a. The air hole 13 is connected to the suction pump 15 through the pipe 14 from the inside of the measuring head. By sucking air from the air holes 13 on the surface of the measuring head 10a, the sample 11 is adsorbed to the measuring head 10a. However, if the sample has wrinkles or folds, or the sample such as air-permeable paper is used. In this case, sufficient adsorption cannot be performed. However, by placing a non-oriented reference film 12 having no air permeability on it, air permeation does not occur and the sample 11 is adsorbed together with the reference film 12 and the sample 11 is in close contact with the measuring head. It becomes.

  When the measurement head is designed so that the surface of the measurement head in contact with the sample and the measurement surface of each dielectric resonator are in the same plane, each dielectric resonator is also in contact with the sample when the measurement head is in contact with the sample. To touch. Here, when the surface of the dielectric resonator facing the sample is slightly lowered from the surface of the measurement head in contact with the sample, a minute distance is always maintained between the measurement surface of the dielectric resonator and the sample. Needless to say, the present invention can be applied to such a case.

  The measurement of the actual sample can be applied to both on-line measurement for measuring a traveling sample and off-line measurement for measuring a sample made of a sample piece.

[Example]
Specific examples according to the present invention will be described below, but the present invention is not limited to these examples.

First, as shown in FIG. 2, the signal processing circuit shown in FIG. 3 is combined with the measuring head 10 in which the five dielectric resonators 1 to 5 are arranged at 72 degrees, and the paper after the paper making actually running is combined. The fiber head orientation was measured in real time. The foil effect is used as the contact means with the paper. For the sample of 62.5 g / m ² , the resonance frequency shift amount of each dielectric resonator is obtained every 72 degrees and then the resonance frequency shift for each position. Sorted and displayed quantities.

  FIG. 16 is a graph of the shift amount of the resonant frequency indicated by each dielectric resonator at five positions when only the variation of each rotation angle is corrected.

  FIG. 17 shows that when each resonance frequency shift amount is multiplied by a correction coefficient K1 and a solid difference of the frequency shift amount from the blank resonance frequency of each dielectric resonator is corrected, each dielectric resonator has five positions. It is a graph of the shift amount of the shown resonant frequency.

  FIG. 18 is a graph of the resonance frequency shift amount (Δf) in each region when the correction coefficient is not multiplied, when only the correction coefficient K1 is multiplied, and when the correction coefficient K1 and the correction coefficient K2 are multiplied. In other words, when there is no correction, when only the individual difference of the frequency shift amount from the blank resonance frequency of each measurement unit is corrected, the individual difference of the frequency shift amount from the blank resonance frequency of each measurement unit and the dielectric of the sample. It is the graph which compared the shift amount of the resonant frequency which each dielectric resonator shows about each when the difference in the sensitivity with respect to the anisotropy of a ratio is correct | amended.

As a result of measuring the obtained sample off-line using a molecular orientation meter (model: MOA-3001A) manufactured by Oji Scientific Instruments Co., Ltd. for the 62.5 g / m ² sample that is the above-mentioned measurement object, the orientation angle is about The value of 15 degrees and MOR (degree of molecular orientation) was about 1.17. As described above, when the orientation pattern as shown in FIG. 12B is obtained, the shift amount of the resonance frequency is theoretically as shown in FIG. 13 for each position. In other words, this is a result of simulating the shift amount of the resonance frequency with respect to each position when the orientation angle in FIG. 4 is 0 degree. Similarly, FIG. 19 shows a simulation result when the orientation angle is 15 degrees. FIG. 19 is a graph obtained by simulating the shift amount of the resonance frequency indicated by each dielectric resonator at five positions in the case where the orientation angle is 15 degrees.

  In the simulation result in the state where the orientation angle is 0 degree shown in FIG. 12, the numerical value of the shift amount of the resonance frequency is PosA <PosC = PosD <PosB = PosE. On the other hand, the result of FIG. 19 is a result of relatively increasing PosA, C, E and decreasing PosB, D with reference to FIG. Based on this, when FIG. 18 is viewed, when there is no correction and only the correction of the solid difference of the frequency shift amount from the blank resonance frequency of each measurement unit is performed, the sensitivity of the anisotropy of each resonator is solid. Due to the influence of the difference, etc. This is a result that deviates slightly from the graph shape that should originally be obtained, for example, Δf of 3 is lower than others. On the other hand, the corrected graph of FIG. Since Δf of 3 is increased, the graph shape is closer to the simulation result. From this, the usefulness of correcting both the solid difference of the frequency shift amount from the blank resonance frequency of each measurement unit and the solid difference of the sensitivity to the anisotropy of the dielectric constant of the sample was confirmed. In other words, it was confirmed that the measurement accuracy of the orientation angle and the orientation degree was improved in the actual measurement of the fiber orientation of the paper.

1 to 5 Dielectric Resonator 10, 10a Measuring Head 9 Rotating Mechanism 36 Shift Amount Calculation Unit 38 Variation Correction Value Calculation Unit 39 Variation Corrected Shift Amount Calculation Unit 40 Shift Correction Coefficient Calculation Unit 41 Shift Corrected Shift Amount Calculation Unit 42 Different Directional sensitivity correction coefficient calculation unit 43 Correction coefficient storage unit 44 Shift correction unit 46 Orientation calculation unit

Claims (10)

A measuring head having a plurality of dielectric resonators (No. 1 to No. n) arranged at equal intervals on the circumference of one circle on a plane;
Taking in the blank resonance frequency of each dielectric resonator in a state where no sample is arranged in the measurement head and the resonance frequency of each dielectric resonator in a state where a sample is arranged in the measurement head, dielectric resonance A shift amount calculation unit (36) for calculating a difference between both resonance frequencies as a shift amount for each device;
A correction coefficient measurement sample (hereinafter referred to as a correction sample) is disposed on the measurement head, and a measurement region on the correction sample corresponding to the position of the dielectric resonator when the measurement head measures an actual sample ( (Pos.1 to Pos.n), the correction sample or the measurement head is rotated at equal intervals around the center of the circle so that each of the dielectric resonators is moved to the positions of all the dielectric resonators. 0, 360 ° / n, ... 360 (n-1) ° / n), using the shift amount at each rotation angle position, and the shift amount at all rotation angle positions. A variation correction value calculation unit (38) for calculating a variation correction value for each rotation angle by dividing the average value of the shift amount by the average value of the shift amount at each rotation angle;
A variation-corrected shift amount calculation unit (39) that calculates the shift amount after variation correction by multiplying the variation correction value by the shift amount at the position of each rotation angle;
A coefficient is obtained by dividing an average value of the variation-corrected shift amount for each measurement region by the shift amount after the variation correction for each dielectric resonator, and an average value of the coefficient for each dielectric resonator A shift correction coefficient calculation unit (40) for calculating a shift correction coefficient (K1) for each dielectric resonator by calculating
A shift amount after shift correction calculating unit (41) for calculating the shift amount after shift correction by multiplying the shift amount after variation correction by the shift correction coefficient (K1);
The average value of the shift amount after shift correction for each measurement region is the shift-shift-after-shift correction of the dielectric resonator located in each measurement region at the rotation angle for measuring the orientation of an actual sample out of the rotation angles. An anisotropy sensitivity correction coefficient calculation unit (42) for calculating an anisotropy sensitivity correction coefficient (K2) for each dielectric resonator with respect to the dielectric anisotropy of the correction sample by dividing by an amount;
A correction coefficient storage unit (43) for storing the shift correction coefficient (K1) and the anisotropic sensitivity correction coefficient (K2);
The shift correction coefficient (K1) stored in the correction coefficient storage unit (42) and the shift amount for each dielectric resonator calculated by the shift amount calculation unit (36) when measuring the orientation of the actual sample, A shift correction unit (44) for correcting the shift amount by multiplying by the anisotropic sensitivity correction coefficient (K2);
An orientation calculation unit (46) for calculating the orientation of the actual sample based on the shift amount corrected by the shift correction unit (44);
An orientation measuring apparatus comprising:   The orientation measuring apparatus according to claim 1, wherein the orientation measuring apparatus measures an on-line sample that travels during measurement of an actual sample. The measurement head is a measurement head supported so as to be rotatable in the plane with the center of the circle as a rotation center;
The orientation measuring device positions the dielectric resonator in the plurality of measurement regions (Pos. 1 to Pos. N) on the circumference, and the dielectric resonators are arranged in all the measurement regions. A rotation mechanism for rotating the measurement head at equal intervals of rotation angles (0, 360 ° / n,... 360 (n-1) ° / n)
The orientation according to claim 1 or 2, wherein the rotating mechanism rotates the measuring head when measuring the correction sample, and fixes the measuring head at a rotation angle for measuring the actual sample when measuring the actual sample. Sex measuring device.   The measurement head is fixed so as not to rotate, and the correction sample has a rotation angle (0, 360 ° / n,... 360 (n-1) ° / n) at equal intervals with respect to the measurement head. The orientation measuring device according to claim 1 or 2, wherein the orientation measuring device is rotated. The orientation measuring device measures an on-line sample running as a real sample, and a sample piece consisting of a part of the real sample is used as the correction sample,
The measurement head has an air suction hole in a portion other than the portion where the dielectric resonator is disposed, and the sample can be adsorbed to the measurement head by an air suction force. 5. The orientation measuring apparatus according to claim 4, wherein when measuring a piece, the sample piece is adsorbed to the measuring head by an air suction force, and when measuring the actual sample, the air suction force is not applied. Using an orientation measuring device having a measuring head having a plurality of dielectric resonators (No. 1 to No. n) arranged at equal intervals on the circumference of one circle on a plane, the following steps An orientation measurement method for measuring the orientation of a sample having orientation.
(Step 1) measuring a blank resonance frequency of each dielectric resonator in a state where a measurement object is not disposed on the measurement head;
(Step 2) A correction sample is arranged on the measurement head, and a measurement region (Pos. 1) on the correction sample corresponding to the position of the dielectric resonator when the measurement head measures an actual sample to be measured. .About.Pos.n), the correction sample or the measurement head is rotated at equal intervals around the center of the circle so that each of the dielectric resonators is moved to the positions of all the dielectric resonators. Rotating at 360 / (n-1) ° / n), and measuring the resonance frequency of each dielectric resonator at each rotation angle position;
(Step 3) From the difference between the blank resonance frequency of each dielectric resonator and the resonance frequency of each dielectric resonator at each rotation angle, each dielectric resonator at each rotation angle position Calculating the shift amount of
(Step 4) With respect to the shift amount of each dielectric resonator at each rotation angle, the average value at all the rotation angles is divided by the average value at each rotation angle for each rotation angle. Calculating a variation correction value of
(Step 5) calculating a shift amount after variation correction by multiplying the shift correction value at each rotation angle by the variation correction value;
(Step 6) For each measurement region, calculate an average value of the shift amount after variation correction, calculate the coefficient by dividing the average value by the shift amount after variation correction for each dielectric resonator, A shift correction coefficient calculating step of obtaining a shift correction coefficient (K1) for each dielectric resonator by averaging the coefficients for each dielectric resonator;
(Step 7) calculating the shift amount after shift correction by multiplying the shift correction coefficient (K1) by the shift amount after variation correction;
(Step 8) An average value of the shift amount after shift correction for each measurement region is obtained, and the average value is located in each measurement region at the rotation angle for measuring the orientation of an actual sample out of the rotation angles. Anisotropic sensitivity for calculating an anisotropic sensitivity correction coefficient (K2) for each dielectric resonator with respect to the dielectric anisotropy of the corrected sample by dividing by the shift amount after shift correction of the body resonator Correction coefficient calculation step,
(Step 9) storing the shift correction coefficient (K1) and the anisotropic sensitivity correction coefficient (K2) in a storage device;
(Step 10) The shift amount is calculated by measuring the actual sample with each of the dielectric resonators with the measurement head and the actual sample being in the rotation angle for measuring the orientation of the actual sample, and the calculated shift amount. And a shift amount correction step of multiplying the stored shift correction coefficient (K1) and the anisotropic sensitivity correction coefficient (K2), and (Step 11) the orientation of the actual sample based on the corrected shift amount Calculating step. Using a measurement head supported rotatably in the plane with the center of the circle as the rotation center as the measurement head;
In step 2, the measurement heads are rotated at equal intervals (0, 360 ° / n,... 360 (n-1) ° / n) so that the dielectric resonators are positioned in all the measurement regions. And measure the resonance frequency of each dielectric resonator at the position of each rotation angle,
The orientation measuring method according to claim 6, wherein in step 10, the measurement head is fixed to a rotation angle for measuring the orientation of the actual sample and the actual sample is measured.   The orientation measuring method according to claim 7, wherein an on-line sample traveling as an actual sample is measured, and the actual sample is also used as a correction sample. Using a measurement head fixed so as not to rotate as the measurement head,
Using a sample piece as the correction sample,
In the step 2, the correction sample is rotated at equal rotation angles (0, 360 ° / n,... 360 (n-1) ° / n) with respect to the measurement head, and the correction sample is rotated at each rotation angle position. The orientation measuring method according to claim 6, wherein the resonance frequency of each dielectric resonator is measured. Measure online samples running as real samples,
A measurement head having an air suction hole in a portion other than the portion where the dielectric resonator is disposed is used as the measurement head, and when the correction sample is measured, the correction sample is applied to the measurement head by an air suction force. When adsorbing and measuring the actual sample, do not apply air suction force,
When measuring the correction sample, a pseudo blank resonance frequency when the non-oriented reference film is adsorbed to the measurement head and measured, and the correction sample is placed on the measurement head, and the reference film is placed on the correction sample. The orientation measurement method according to claim 9, wherein the shift amount in step 3 is obtained as a difference from a resonance frequency when the correction sample and the reference film are stacked and adsorbed on the measurement head and measured.