JP5510018B2 - Data inspection apparatus and program - Google Patents

Description

  The present invention relates to a data inspection apparatus and program for inspecting divided data of a plurality of elements obtained by dividing a simulation model to be analyzed into a mesh shape.

Conventionally, with a 3D or 2D continuum as an analysis target, structural analysis or acoustic analysis of the simulation model (analysis target model) of the analysis target is performed using a predetermined analysis method such as a finite element method or a boundary element method. Is going.
For example, in the finite element method, a simulation model to be analyzed generated using a CAD (Computer Aided Design) system or the like is divided into meshes and divided into a plurality of polygons or polyhedral finite elements. The physical relationship between elements is numerically analyzed (see, for example, Patent Document 1).

Japanese Patent Laid-Open No. 7-55656

  However, depending on the software that generates the analysis target shape and element division data, the analysis target model divided into meshes may have multiple items that should be generated as one node shared by multiple elements. There is a problem of being generated. In this case, it is difficult to improve the accuracy of the numerical analysis due to a calculation error in the numerical analysis, and there is a possibility that the numerical analysis itself cannot be executed.

  Accordingly, an object of the present invention is to provide a data inspection apparatus and program capable of appropriately inspecting errors in divided data of a plurality of elements.

In order to solve the above problems, the data inspection apparatus of the present invention is:
Analyzed the simulation model (hereinafter, referred to as "analyzed model") and element acquisition unit configured to acquire a plurality of elements of predetermined shape, which is divided into meshes, each of the plurality of elements obtained by this element acquisition unit A region setting unit configured to set a plurality of inspection regions of the nodes, and the region setting unit sets the plurality of inspection regions so as to overlap each other so that the plurality of nodes belong to at least two groups; Grouping means for dividing the plurality of groups, coordinate acquisition means for acquiring the coordinates of at least one node in each group, and the coordinates of the at least one node acquired by the coordinate acquisition means Therefore, in the group to which the node belongs, at least two nodes whose distance between the coordinates is equal to or less than a predetermined threshold are not analyzed. Specifying means for specifying a positive nodal, characterized by comprising a.

The program of the present invention is
The computer of the data inspection apparatus is acquired by an element acquisition unit that acquires a plurality of elements having a predetermined shape obtained by dividing a simulation model to be analyzed (hereinafter referred to as “analysis target model”) into a mesh shape. A plurality of region setting means for setting a plurality of inspection regions for each node of the plurality of elements, and the region setting means sets the plurality of inspection regions so as to overlap each other so that the plurality of nodes are at least two Grouping means for dividing the plurality of groups so as to belong to the group, coordinate acquisition means for acquiring the coordinates of at least one node in each group for the plurality of groups, and the at least one node acquired by the coordinate acquisition means Based on the coordinates of the node, the distance between the coordinates within the group to which the node belongs is less than a predetermined threshold. Both wherein the to function as a specific means for identifying as incorrect node two nodes in the analysis.

  According to the present invention, it is possible to appropriately inspect errors in divided data of a plurality of elements.

It is a block diagram which shows schematic structure of the data inspection apparatus of one Embodiment to which this invention is applied. 3 is a flowchart illustrating an example of an operation related to data inspection processing by the data inspection apparatus of FIG. 1. It is a figure which shows typically an example of the analysis object model which concerns on the data inspection process of FIG. It is a figure which shows typically an example of the state which divided | segmented the analysis object model of FIG. 3 into the some element. It is a figure which shows typically an example of the state which set the test | inspection area | region to the analysis object model of FIG. It is a figure for demonstrating an example of the test | inspection of the node using the test | inspection area | region of FIG.

Hereinafter, specific embodiments of the present invention will be described with reference to the drawings. However, the scope of the invention is not limited to the illustrated examples.
The data inspection apparatus 100 according to the present embodiment divides the nodes P of a plurality of elements E,... Of a predetermined shape obtained by dividing the analysis target model M into meshes into a plurality of groups so that each node P belongs to at least two groups. Divide. The data inspection apparatus 100 acquires the coordinates of at least one node P in each group for a plurality of groups, and coordinates within the group to which the node P belongs based on the coordinates of the at least one node P. .. Are identified as nodes P inappropriate for analysis.

FIG. 1 is a block diagram showing a schematic configuration of a data inspection apparatus 100 according to an embodiment to which the present invention is applied.
The data inspection apparatus 100 is configured by a computer such as a workstation, for example, and as shown in FIG. 1, a central control unit 1, a memory 2, a storage unit 3, an operation input unit 4, a data acquisition unit 5, , A data inspection unit 6, a display unit 7, a display control unit 8, and an external communication unit 9.

  The central control unit 1 controls each unit of the data inspection apparatus 100. Specifically, the central control unit 1 includes a CPU (Central Processing Unit; not shown), and performs various control operations according to various processing programs (not shown) for the data inspection apparatus 100.

  The memory 2 is composed of, for example, a DRAM (Dynamic Random Access Memory) or the like, and temporarily stores data processed by the central control unit 1, the data acquisition unit 5, the data inspection unit 6, and the like. The memory 2 temporarily stores data of a simulation model (analysis target model) M to be analyzed that is transmitted from the external device 200 to the data inspection apparatus 100 and received by the external communication unit 9.

  The storage unit 3 is composed of, for example, a nonvolatile memory (flash memory) or the like, and stores various programs and data (not shown) necessary for the operation of the central control unit 1.

  The operation input unit 4 includes, for example, a data input key for inputting numerical values, characters, and the like, a keyboard, a mouse, and the like configured by up / down / left / right movement keys and various function keys for performing data selection, feed operation, The operation unit (not shown) is provided, and a predetermined operation signal is output to the central control unit 1 in accordance with the operation of these operation units.

  The data acquisition unit 5 acquires divided data of a plurality of elements E,... Having a predetermined shape obtained by dividing a three-dimensional simulation model (analysis target model) M into a mesh shape.

First, the analysis target model M will be described.
The analysis target model M is a simulation model (analysis target model) M of the analysis target generated by the external device 200 constituting the CAD system as a target of analysis of a two-dimensional or three-dimensional continuum.
Here, the analysis target model M may be, for example, a solid structure filled with contents, a hollow structure, or a shape of the hollow space itself. May be. The shape of the analysis target model M is not particularly limited, and may be a relatively simple shape such as a cube, a sphere, or an ellipsoid, or a shape formed by combining these shapes. Can be mentioned. In this embodiment, for example, as shown in FIGS. 3 to 5, a three-dimensional shape formed in a bowl shape when viewed from the front, that is, a shape obtained by rotating the “L” shape by 180 ° so that the top and bottom are reversed. However, the present invention is not limited to this and can be arbitrarily changed as appropriate.

Further, the data acquisition unit 5 includes a data generation unit 5a that divides the analysis target model M into a mesh shape and generates divided data of a plurality of elements E,.
Specifically, the data generation unit 5 a first acquires a three-dimensional analysis target model M generated by the external device 200 from the memory 2. Then, the data generation unit 5a divides the acquired analysis target model M into a mesh shape by a finite element method and divides the model into a plurality of elements E each including a predetermined polygon or polyhedron. Generate split data. For example, the data generation unit 5a acquires a bowl-shaped analysis target model M (see FIG. 3 and the like) in a front view, and divides the analysis target model M into a mesh shape by a finite element method, thereby obtaining a substantially cubic shape. Divided into a plurality of elements E,... (See FIG. 4)).
And the data acquisition part 5 acquires the division | segmentation data of the several element E and ... produced | generated by the data generation part 5a.
Although the data generation unit 5a uses the finite element method for generating the divided data of the plurality of elements E,..., Other analysis methods applicable as a numerical analysis method for the analysis target model M, for example, A boundary element method or the like may be used. Further, the finite element method and the boundary element method are known techniques as analysis methods for the simulation model (analysis target model) M to be analyzed, and thus description thereof is omitted here.

The data acquisition unit 5 acquires the divided data of the element E of the entire analysis target model M, but the range of acquiring the divided data of the element E in the analysis target model M is not limited to this. For example, in the case of the analysis target model M generated by analyzing a continuum composed of a plurality of component parts, the data acquisition unit 5 includes an element E so that each component part or a boundary part between the component parts is included. The divided data may be acquired.
That is, depending on the shape of the component, the component does not necessarily have to be a data inspection target by the data inspection apparatus 100 of the present embodiment. For example, a component having a relatively simple shape is unlikely to cause an error in the division of the element E by the finite element method (that is, the setting of the node P), and thus may be excluded from the inspection target of the divided data of the element E. On the other hand, the boundary (seam) between component parts has a complicated shape compared to other parts, and an error is likely to occur in the division of the element E by the finite element method. Is preferred. Further, for example, a portion having a large unevenness of the analysis target model M, that is, a portion where an angle when viewed from a predetermined direction is larger (or smaller) than a predetermined angle, for example, inspection of the divided data of the element E It is good as a target.
The element E for each constituent article of the analysis target model M is a set having the same physical properties as attribute information.

Furthermore, the data acquisition unit 5 acquires the divided data of the element E by dividing the analysis target model M by the data generation unit 5a. However, the method of acquiring the divided data of the element E is not limited to this. For example, the divided data of the element E generated by a predetermined divided data generation device (not shown) outside the data inspection device 100 can be detachably attached to the external communication unit 9 or the data inspection device 100 main body. It may be obtained via (not shown) or the like.
In this manner, the data acquisition unit 5 constitutes an element acquisition unit that acquires a plurality of elements E,... Having a predetermined shape obtained by dividing the analysis target model M into a mesh shape.

  The data inspection unit 6 includes a grouping unit 6a, a coordinate acquisition unit 6b, an error data specification unit 6c, and a data correction unit 6d.

  The grouping unit 6a divides each of the nodes P of the plurality of elements E,... Of the analysis target model M acquired by the data acquisition unit 5 into a plurality of groups so that each node P belongs to at least two groups. Specifically, the grouping unit 6a includes a region setting unit 61a that sets a plurality of inspection regions A for each node P for the divided data of a plurality of elements E,.

The region setting unit 61a divides the plurality of nodes P,... Of the analysis target model M into a plurality of groups by setting the plurality of inspection regions A,. Specifically, the region setting unit 61a applies the inspection region A having a predetermined size and the same shape (for example, a cubic shape) to the divided data of the plurality of elements E,. A plurality are set so as to overlap each other by at least a half of a predetermined axial direction length of the inspection region A along (for example, the x-axis direction, the y-axis direction, and the z-axis direction).
Here, the dimensions of each inspection region A are defined in consideration of, for example, the dimension of the element E, the dimension (minimum coordinate value or maximum coordinate value) of the analysis target model M in the predetermined axis direction, inspection accuracy, and the like. That is, the length of the inspection region A in the predetermined axial direction (for example, the x-axis direction) is preferably set shorter than the length of the element E in the same direction. In other words, when the length in the predetermined axial direction of the inspection area A is set longer than the length in the same direction of the element E, the nodes P at both ends of one side of the element E are included in the inspection area A as inspection targets. This is because in this case, the amount of calculation in one inspection region A increases. On the other hand, if the size of each inspection region A is made too small compared to the size of the element E, the number of inspection regions A increases, and depending on the shape of the element E, there are many inspection regions A that do not have any nodes P at all. This is because the processing efficiency is lowered.
In addition, the dimensions of each inspection area A are set so that the number of inspection areas A is substantially constant, for example, based on the dimension in the predetermined axial direction of the analysis target model M, so that the analysis target model of any shape or size Even for M, the amount of calculation (calculation time) can be kept constant to some extent, and a reduction in processing efficiency can be prevented.

Specifically, the region setting unit 61a sets the shape of the inspection region A to a substantially cubic shape, and first sets one of the nodes P of the analysis target model M (for example, the node P having the smallest x-axis coordinate) as a reference. As shown in FIG. 5, one inspection region A is set so that the coordinates (x, y, z) of the node P overlap with the approximate center coordinates. Then, the region setting unit 61a uses the one inspection region A as a reference, along a x-axis direction, a y-axis direction, and a z-axis direction. A plurality of inspection areas A,... Are set so as to overlap each other by a half of the length of the direction and the z-axis direction. For example, the region setting unit 61a determines that the node P having the largest coordinates of the x axis, the y axis, and the z axis is based on the node P having the smallest coordinates of the x axis, the y axis, and the z axis. Are set in the x-axis, y-axis, and z-axis directions until at least two inspection areas A,.
For example, FIG. 5 shows a state in which a plurality of inspection areas A,... Are set in the x-axis and z-axis directions when the analysis target model M is viewed in the y-axis direction. In contrast, it is assumed that a plurality of inspection areas A,... Are set so as to overlap each other by 1/2 of the length of the inspection area A in the y-axis direction. In FIG. 5, for example, an inspection corresponding to one node P (for example, the node P in the upper left corner when viewed in the y-axis direction) serving as a reference for setting the inspection area A of the analysis target model M. With the area A0 as a reference (No. 0), the number of a plurality of inspection areas A,... Set along each of the x-axis, y-axis, and z-axis will be numbered in order from 1, but the reference inspection The order in which the area A0 and numbers are assigned is not limited to these, and can be arbitrarily changed as appropriate.
Thereby, each node P of the plurality of elements E,... Belongs to at least two inspection regions (groups) A, A. For example, one node P that is a reference for setting the inspection area A of the analysis target model M is the inspection area A0 of the reference No. 0 and the inspection area A0 that overlaps the inspection area A0 by 1/2 each in the x-axis direction. An inspection area A1 that overlaps with the inspection area A0 by 1/2 in the y-axis direction, an inspection area A2 that overlaps with the inspection area A0 by 1/2 in the z-axis direction, and an inspection area A0 and x Inspection area A3 that overlaps each other by 1/4 in the axial and z-axis directions, inspection area A0 that overlaps each other by 1/4 in the x-axis and y-axis directions, and inspection area A0 that corresponds to y-axis and z It belongs to each of the inspection areas (not shown) that overlap each other by 1/4 in the axial direction. Also, the other nodes P belong to at least two inspection areas A,... As described above, but detailed description thereof will be omitted.
In FIG. 5, a plurality of overlapping inspection areas A,... Are indicated by broken lines, but the above-described inspection areas A0 to A3 are schematically surrounded by a one-dot chain line. .

In addition, the region setting unit 61a is configured to set a plurality of inspection regions A,... Overlapping each other by a half of a length in a predetermined axial direction (for example, x axis, y axis, z axis, etc.). However, the degree of overlap is not limited to this, and a predetermined axial direction (for example, x-axis, y-axis, z-axis, etc.) is selected so that the plurality of inspection areas A,. What is necessary is just to set to 1/2 or more of length.
In addition, the area setting unit 61a sets the inspection area A along a predetermined axial direction (for example, the x axis, the y axis, and the z axis), but the setting direction of the inspection area A is limited to this. For example, it may be set along a direction (for example, a crossing direction) different from a predetermined axial direction.
Furthermore, although the setting of the inspection area A by the area setting unit 61a is performed based on one inspection area A, the present invention is not limited to this, and a plurality of inspection areas A,. good.
In this way, the grouping unit 6a constitutes grouping means for dividing the nodes P of the plurality of elements E,... Acquired by the data acquisition unit 5 into a plurality of groups so that each node P belongs to at least two groups. doing.

The coordinate acquisition unit 6b acquires the coordinates (x, y, z) of at least one node P from within each group of the analysis target model M divided by the grouping unit 6a.
That is, the coordinate acquisition unit 6b has at least the plurality of inspection regions A,... Set by the region setting unit 61a for the divided data of the plurality of elements E,. A coordinate (x, y, z) in a three-dimensional space composed of the x-axis, y-axis, and z-axis of one node P is acquired.
The coordinate acquisition unit 6b does not necessarily need to acquire all the inspection areas A as the acquisition targets of the coordinates (x, y, z) of the nodes P. For example, the shape and dimensions of the element E, the dimensions of the inspection area A, etc. In consideration of the above, the inspection area A where the node P is apparently absent may be excluded from the acquisition target of the coordinates of the node P.
Here, the coordinate acquisition unit 6b constitutes a coordinate acquisition unit that acquires the coordinates (x, y, z) of at least one node P in each group for a plurality of groups.

The error data identification unit 6c identifies the node P inappropriate for numerical analysis as error data based on the coordinates (x, y, z) of at least one node P in each group acquired by the coordinate acquisition unit 6b. To do.
That is, in the error data specifying unit 6c, the interval between the coordinates (x, y, z) is equal to or less than a predetermined threshold in the inspection area (group) A to which each node P acquired by the coordinate acquiring unit 6b belongs. Two nodes P and P are identified as nodes P inappropriate for numerical analysis. Specifically, the error data specifying unit 6c sets a predetermined interval between coordinates (x, y, z) with respect to other nodes P in the inspection area A for all the nodes P in each inspection area A. Calculate according to the formula.
For example, as shown in FIG. 5 and FIG. 6, a portion bent substantially at right angles of the analysis target model M actually includes a plurality of elements E,... (Element E at the upper left corner in FIG. What is to be generated as one node shared by the adjacent element E and the element E below it is set as two nodes P1 and P2. In this case, these two nodes P1 and P2 belong to the second and third inspection regions A in the x-axis direction and the second and third inspection regions A in the z-axis direction. Although not shown, it belongs to the 0th and 1st inspection areas A in the y-axis direction.
FIG. 6 shows the relationship between the two nodes P1 and P2 with respect to the inspection area A in the x-axis direction. These two nodes P1 and P2 are the second and third inspection areas A in the x-axis direction. Will belong to. 5 and 6 exemplify two adjacent nodes P1 and P2. However, this is an example, and the present invention is not limited to this, and three or more nodes P,. (Adjacent) may be arranged.
Then, the error data specifying unit 6c performs a predetermined calculation on the interval between the coordinates (x, y, z) of each node P and the other nodes P in each inspection region A to which these two nodes P1 and P2 belong. Calculate according to the formula.

Thereafter, the error data specifying unit 6c determines whether or not the interval between the coordinates (x, y, z) of two nodes (for example, the nodes P1, P2) calculated for each inspection region A is equal to or less than a predetermined threshold value. The two nodes P and P that are equal to or less than a predetermined threshold are identified as the nodes P that are inappropriate for numerical analysis. In addition, when there are a plurality of nodes P whose coordinate interval is equal to or less than a predetermined threshold with respect to one node P, the error data specifying unit 6c specifies all of them as nodes P inappropriate for numerical analysis. .
That is, since each node P is set by the grouping unit 6a to belong to at least two inspection regions (groups) A,..., The error data specifying unit 6c has coordinates (x, y, z) By determining whether or not the interval is less than or equal to a predetermined threshold value, it is possible to determine whether or not there is an adjacent node P for each node P by overlapping the inspection region A. That is, if the inspection area A does not overlap, there is a risk that each of the two adjacent nodes P, P may be divided into different inspection areas A, but the inspection area A is set to overlap by 1/2. Therefore, these two nodes P and P always coexist in one of the inspection areas A.
Note that the predetermined threshold is defined in consideration of the size of the inspection area A, inspection accuracy, and the like. That is, for example, by setting a predetermined threshold value larger than the size of the inspection area A, the calculation amount increases, but the error data specifying unit 6c is not suitable for numerical analysis with more nodes P. The node P can be specified, and the inspection accuracy can be improved. On the other hand, by setting the predetermined threshold value smaller, the number specified as the node P inappropriate for the numerical analysis is reduced, but the error data specifying unit 6c reduces the calculation amount to increase the processing speed. be able to.

  As described above, the error data specifying unit 6c is based on the coordinates of at least one node P acquired by the coordinate acquiring unit 6b, and at least two of the intervals between the coordinates within the group to which the node P belongs are a predetermined threshold. A specifying means for specifying the nodes P,... As the nodes P inappropriate for analysis is configured.

The data correcting unit 6d corrects at least two nodes P,... Specified as error data by the error data specifying unit 6c so as to be one node P having predetermined coordinates (x, y, z). Specifically, the data correction unit 6d acquires the coordinates (x, y, z) of at least two nodes P,... Specified as error data by the error data specification unit 6c. The intermediate coordinates are calculated as corrected coordinates (x, y, z), or any one of the coordinates is specified as corrected coordinates (x, y, z).
Here, the data correction unit 6d constitutes correction means for correcting at least two nodes P,... Specified by the error data specification unit 6c so as to be one node P having predetermined coordinates.

  The display unit 7 includes a display such as an LCD (Liquid Crystal Display) and a CRT (Cathode Ray Tube), and displays various information on the display screen under the control of the display control unit 8.

The display control unit 8 performs control to generate display data and display it on the display screen of the display unit 7.
Specifically, the display control unit 8 includes a video card (not shown) including, for example, a GPU (Graphics Processing Unit), a VRAM (Video Random Access Memory), and the like. Then, in accordance with the display instruction from the central control unit 1, the display control unit 8 generates display data for the analysis target model M and the image after the element division of the analysis target model M by drawing processing using a video card. 7 is output.

  Further, the display control unit 8 displays at least two nodes P,... Specified as error data by the error data specifying unit 6 c on the display screen of the display unit 7. For example, the display control unit 8 generates display data in a list format in which the nodes P specified by the error data specifying unit 6c are listed in a predetermined order, and is specified as error data based on the display data. The nodes P may be displayed as a list on the display screen of the display unit 7. Further, for example, the display control unit 8 displays the node P related to the error data in a display form that can be distinguished from other nodes P in the image after the element division of the analysis target model M displayed on the display screen. You may make it let it.

Note that the mode of notification of the node P related to the error data may be any mode as long as the error data can be grasped and recognized by human senses, in particular, visual, auditory, tactile, etc. For example, the fact that error data exists may be notified by sound (sound or the like) or vibration.
In this way, the display control unit 8 constitutes a notification control unit that notifies at least two nodes P,... Identified by the error data specification unit 6c from the notification unit (display unit 7).

The external communication unit 9 is connected to the external device 200 so as to be able to transmit and receive information via a predetermined communication line (for example, a local area network (LAN)). Specifically, the external communication unit 9, for example, omits a predetermined communication cable (for example, a LAN cable) attached to a terminal (for example, a LAN terminal) for connection with the external device 200 although not illustrated. Send and receive data via For example, the external communication unit 9 receives a three-dimensional analysis target simulation model (analysis target model) M transmitted from the external device 200. The analysis target model M received by the external communication unit 9 is transferred to the memory 2 and temporarily stored.
The external device 200 may be any configuration as long as it is a computer such as a workstation constituting the CAD system and can generate the analysis target model M, and detailed description thereof is omitted.

Next, a data inspection method by the data inspection apparatus 100 will be described with reference to FIGS.
FIG. 2 is a flowchart illustrating an example of an operation related to the data inspection process. 3 is a diagram schematically illustrating an example of the analysis target model M, and FIG. 4 is a diagram schematically illustrating an example of a state in which the analysis target model M is divided into a plurality of elements E,. FIG. 5 is a diagram schematically illustrating an example of a state in which the inspection region A is set in the analysis target model M. FIG. 6 is a diagram for explaining an example of the inspection of the node P using the inspection region A of FIG.
In the following description, the analysis target model M formed in a bowl shape when viewed in the y-axis direction is used as the analysis target model M. The analysis target model M is generated by the external device 200 and then temporarily stored in the memory 2 via the external communication unit 9.

As shown in FIG. 2, first, the data acquisition unit 5 includes a plurality of elements E in which a simulation model (analysis target model) M that is a three-dimensional analysis target having a bowl shape when viewed in the y-axis direction is divided into a mesh shape. ,... Are obtained (step S1).
Specifically, the data generation unit 5 a of the data acquisition unit 5 acquires a three-dimensional analysis target model M (see FIG. 3) temporarily stored in the memory 2. And then. The data generation unit 5a generates divided data (see FIG. 4) of the element E by dividing the analysis target model M into a mesh shape by the finite element method and dividing the model into a plurality of elements E having a predetermined shape. . And the data acquisition part 5 acquires the division | segmentation data of the element E produced | generated by the data generation part 5a.
The acquisition of the divided data of the element E by the data acquisition unit 5 may be started based on a predetermined operation of the operation input unit 4 by the user, or the analysis target model M transmitted from the external device 200 is stored in the memory 2. It may be automatically started when it is temporarily stored.

Next, the grouping unit 6a of the data inspection unit 6 sets a plurality of inspection regions A for each node P by the region setting unit 61a for the divided data of the plurality of elements E,. The plurality of nodes P,... Of the analysis target model M are divided into a plurality of groups (step S2).
Specifically, the area setting unit 61a applies, to the divided data of the plurality of elements E,... Of the analysis target model M, the inspection area A having a predetermined size and the same shape (for example, a cubic shape) in the x-axis direction, A plurality is set so as to overlap each other by a half of a predetermined axial length of the inspection area A along each of the y-axis direction and the z-axis direction. Accordingly, each node P of the plurality of elements E,... Belongs to at least two inspection regions A,.

  Next, the coordinate acquisition unit 6b of the data inspection unit 6 performs each inspection on the plurality of inspection regions A,... Set by the region setting unit 61a for the divided data of the plurality of elements E,. The coordinates (x, y, z) in the three-dimensional space composed of the x-axis, y-axis, and z-axis of at least one node P existing in the region A are acquired (step S3).

Subsequently, the error data specifying unit 6c of the data inspection unit 6 has a predetermined interval between the coordinates (x, y, z) in the inspection area (group) A to which each node P acquired by the coordinate acquisition unit 6b belongs. At least two nodes P,... That are equal to or less than the threshold are identified as nodes P inappropriate for numerical analysis (step S4).
Specifically, the error data specifying unit 6c sets a predetermined interval between coordinates (x, y, z) with respect to other nodes P in the inspection area A for all the nodes P in each inspection area A. Calculate according to the formula. Thereafter, the error data specifying unit 6c determines whether or not the interval between the coordinates (x, y, z) of at least two nodes P,... Calculated for each inspection region A is equal to or less than a predetermined threshold value. , Specify at least two nodes P,... (For example, nodes P1, P2, etc.) that are not more than a predetermined threshold as nodes P inappropriate for numerical analysis.

  Thereafter, the display control unit 8 displays at least two nodes P,... (For example, nodes P1, P2, etc.) specified as error data by the error data specifying unit 6c on the display screen of the display unit 7 (step S5). . For example, the display control unit 8 displays the node P specified by the error data specifying unit 6c in a list form on the display screen of the display unit 7, or the error data in the image after the element division of the analysis target model M The node P related to is displayed in a display mode that can be distinguished from other nodes P.

Subsequently, the data correction unit 6d of the data inspection unit 6 uses at least two nodes P,... Identified as error data by the error data identification unit 6c as one node P having predetermined coordinates (x, y, z). (Step S6). Specifically, the data correction unit 6d acquires the coordinates (x, y, z) of at least two nodes P,... Identified as error data, and corrects the intermediate coordinates of these coordinates ( x, y, z) or any one of the coordinates is specified as corrected coordinates (x, y, z).
Here, the correction of the coordinates (x, y, z) of the node P by the data correcting unit 6d may be started based on a predetermined operation of the operation input unit 4 by the user, or the error data specifying unit 6c may generate error data. As described above, it may be automatically started when at least two nodes P,.
Thereby, the data inspection process is terminated.

As described above, according to the data inspection apparatus 100 of the present embodiment, at least one of a plurality of groups divided so that the nodes P of the plurality of elements E,... Of the analysis target model M belong to at least two groups. The coordinates of the node P can be obtained, and in the group to which the node P belongs, at least two nodes P whose interval between the coordinates is equal to or less than a predetermined threshold can be specified as the nodes P inappropriate for the numerical analysis. .
That is, when a plurality of nodes that should be generated as one node P shared by a plurality of elements E in the analysis target model M are generated in duplicate, these adjacent nodes P, ... are calculated in numerical analysis. There is a risk of causing an error or the like. Therefore, in specifying a plurality of nodes P, which are close to each other in coordinates, a predetermined threshold for determining the interval between the nodes P is set, and at least two nodes P, which are equal to or less than the predetermined threshold. Is identified as a node P inappropriate for numerical analysis. At this time, since the nodes P of the plurality of elements E,... Of the analysis target model M are grouped so as to belong to at least two groups, whether or not there is a node P close to each node P is determined. The identification can be performed by overlapping a plurality of groups, and the inspection accuracy of the divided data of the plurality of elements E,.

  Specifically, by setting the plurality of inspection areas A so as to overlap each other, the plurality of nodes P,... Are divided into a plurality of groups, so whether or not there are adjacent nodes P for each node P. The identification can be performed in a plurality of inspection areas A, and the inspection accuracy of errors in the divided data of the plurality of elements E,... Can be improved. More specifically, the length of the plurality of inspection areas A having the same shape along the predetermined axial direction (for example, the x-axis direction, the y-axis direction, and the z-axis direction) in the predetermined axial direction of the inspection area A By setting to overlap each other by at least 1/2 of the above, even if a plurality of nodes that should be generated as one node shared by a plurality of elements E are generated in duplicate, these nodes must be It can belong to any inspection area A. That is, it is possible to prevent each of a plurality of overlapping nodes P,... Generated when the inspection area A does not overlap, from being divided into different inspection areas A, and to divide a plurality of elements E,. The accuracy of checking for data errors can be further improved.

  In addition, since the predetermined threshold for determining the interval between coordinates within the group to which the node P to be inspected belongs is defined based on the size of the inspection region A, the size of the inspection region A to be set Accordingly, the predetermined threshold value can be changed as appropriate, and the efficiency of checking errors in the divided data of the plurality of elements E,. That is, in order to improve the accuracy of the numerical analysis, for example, it is preferable to generate the divided data of the element E so that adjacent nodes P are arranged with a predetermined interval, but depending on the interval between the nodes P Even if the inspection area A is set, the predetermined threshold value for determination can be changed and set as appropriate, and the inspection of the divided data of the plurality of elements E,. be able to.

Further, since at least two nodes P,... Existing in one group (inspection area A) specified as error data are displayed on the display unit 7 and notified, the divided data of a plurality of elements E,. It is possible to properly grasp errors.
Further, by correcting at least two nodes P,... Existing in one group (inspection area A) specified as error data to be one node P having a predetermined coordinate, an error in element division can be obtained. The divided data of the modified elements E,... Can be acquired, and the subsequent numerical analysis can be performed efficiently.

The present invention is not limited to the above-described embodiment, and various improvements and design changes may be made without departing from the spirit of the present invention.
For example, in the above embodiment, the inspection area A to which each node P belongs is calculated from the minimum and maximum values of the coordinates in the predetermined axial direction of the analysis target model M and the dimensions in the predetermined axial direction of each inspection area. Thus, only the inspection region to which the node P belongs may be set as the inspection target. As a result, the inspection area in which no node P does not exist can be excluded from the inspection target, and the processing speed can be increased.

In the data inspection process, whether or not to display at least two nodes P,... Specified as error data in step S5 can be arbitrarily changed as appropriate. Similarly, error data in step S6 is displayed. Whether or not to correct the coordinates of at least two nodes P,... Specified as can be arbitrarily changed as appropriate.
That is, after the display of at least two nodes P,... As error data in step S5, the coordinates of the at least two nodes P,... Are corrected in step S6. For example, the error data may not be displayed by correcting the coordinates of at least two nodes P,. Further, it is possible to display only at least two nodes P,... Identified as error data and not correct the error data.

Furthermore, the configuration of the data inspection apparatus 100 is merely an example illustrated in the above embodiment, and is not limited thereto. For example, although a computer such as a workstation is illustrated as the data inspection apparatus 100, the present invention is not limited to this and may be configured by a general personal computer or the like.
In addition, the data inspection apparatus 100 may be provided with numerical analysis means for numerically analyzing the physical relationship between the plurality of elements E,... Of the analysis target model M, whereby the plurality of elements E,. After the inspection of the divided data, the numerical analysis can be immediately performed using the data inspection apparatus 100.

In addition, in the above embodiment, the data acquisition unit 5, the grouping unit 6a, the functions as the element acquisition unit, the grouping unit, the coordinate acquisition unit, and the specifying unit are controlled under the control of the central control unit 1. The configuration is realized by driving the coordinate acquisition unit 6b and the error data specifying unit 6c. However, the configuration is not limited to this, and is realized by a predetermined program executed by the CPU of the central control unit 1. It is good also as a structure.
That is, a program memory (not shown) that stores a program stores a program including an element acquisition processing routine, a grouping processing routine, a coordinate acquisition processing routine, and a specific processing routine. The CPU of the central control unit 1 acquires a plurality of elements E having a predetermined shape obtained by dividing the simulation model to be analyzed (hereinafter referred to as “analysis target model M”) into a mesh shape by the element acquisition processing routine. You may make it function as an element acquisition means to do. Further, the CPU of the central control unit 1 is divided into a plurality of groups so that the nodes P of the plurality of elements E,... Acquired by the element acquiring means belong to at least two groups by the grouping processing routine. You may make it function as a dividing means. Further, the CPU of the central control unit 1 may function as a coordinate acquisition unit that acquires the coordinates of at least one node P in each group for a plurality of groups by a coordinate acquisition processing routine. Further, the CPU of the central control unit 1 by the specific processing routine allows the interval between the coordinates within the group to which the node P belongs to be equal to or less than a predetermined threshold based on the coordinates of the at least one node P acquired by the coordinate acquisition unit. It is also possible to cause at least two nodes P,... To function as specifying means for specifying the nodes P inappropriate for analysis.

  Similarly, the area setting unit, the notification control unit, and the correction unit may be realized by executing a predetermined program or the like by the CPU of the central control unit 1.

  Furthermore, as a computer-readable medium storing a program for executing each of the above processes, a non-volatile memory such as a flash memory and a portable image recording unit such as a CD-ROM are applied in addition to a ROM and a hard disk. It is also possible. A carrier wave is also used as a medium for providing program data via a predetermined communication line.

DESCRIPTION OF SYMBOLS 100 Data inspection apparatus 1 Central control part 5 Data acquisition part 5a Data generation part 6 Data inspection part 6a Grouping part 61a Area setting part 6b Coordinate acquisition part 6c Error data specification part 6d Data correction part 7 Display part 8 Display control part

Claims (6)

Element acquisition means for acquiring a plurality of elements having a predetermined shape obtained by dividing a simulation model (hereinafter referred to as “analysis target model”) into a mesh shape;
By having a region setting unit that sets a plurality of inspection regions for each node of the plurality of elements acquired by the element acquisition unit , the region setting unit sets the plurality of inspection regions so as to overlap each other, Grouping means for dividing a plurality of nodes into a plurality of groups so as to belong to at least two groups;
For the plurality of groups, coordinate acquisition means for acquiring the coordinates of at least one node in each group;
Based on the coordinates of the at least one node acquired by the coordinate acquisition means, at least two nodes whose coordinates are not more than a predetermined threshold in the group to which the node belongs are specified as nodes inappropriate for analysis. Specific means,
A data inspection apparatus comprising: The region setting means further sets the plurality of inspection regions having the same shape so as to overlap each other by at least half of the length of the inspection region in the predetermined axial direction along a predetermined axial direction,
The coordinate acquisition means further acquires the coordinates of at least one node existing in each inspection region for the plurality of inspection regions,
The specifying unit further analyzes, based on the coordinates of the at least one node acquired by the coordinate acquiring unit, at least two nodes whose coordinate interval is equal to or less than a predetermined threshold within the inspection region where the node exists. The data inspection apparatus according to claim 1 , wherein the node is specified as an inappropriate node. The data inspection apparatus according to claim 2 , wherein the predetermined threshold is defined based on a dimension of the inspection area. Data checking apparatus according to any one of claim 1 to 3, further comprising a notification control means for notifying the at least two nodes identified from the notifying means by the specifying means. According to any one of claim 1 to 4, further comprising a correction means for correcting to the one node having predetermined coordinate the at least two nodes specified by the specifying means Data inspection device. Computer for data inspection equipment,
An element acquisition means for acquiring a plurality of elements having a predetermined shape obtained by dividing a simulation model to be analyzed (hereinafter referred to as an “analysis target model”) into a mesh;
By having a region setting unit that sets a plurality of inspection regions for each node of the plurality of elements acquired by the element acquisition unit , the region setting unit sets the plurality of inspection regions so as to overlap each other, Grouping means for dividing a plurality of nodes into a plurality of groups so as to belong to at least two groups;
Coordinate acquisition means for acquiring the coordinates of at least one node in each group for the plurality of groups,
Based on the coordinates of the at least one node acquired by the coordinate acquisition means, at least two nodes whose coordinates are not more than a predetermined threshold in the group to which the node belongs are specified as nodes inappropriate for analysis. Specific means,
A program characterized by functioning as

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