JP5198464B2 - 質量分析計 - Google Patents
質量分析計 Download PDFInfo
- Publication number
- JP5198464B2 JP5198464B2 JP2009539808A JP2009539808A JP5198464B2 JP 5198464 B2 JP5198464 B2 JP 5198464B2 JP 2009539808 A JP2009539808 A JP 2009539808A JP 2009539808 A JP2009539808 A JP 2009539808A JP 5198464 B2 JP5198464 B2 JP 5198464B2
- Authority
- JP
- Japan
- Prior art keywords
- time
- ion guide
- mass analyzer
- voltage
- ion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 150000002500 ions Chemical class 0.000 claims description 773
- 230000004323 axial length Effects 0.000 claims description 49
- 230000005684 electric field Effects 0.000 claims description 29
- 230000007423 decrease Effects 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 14
- 238000013467 fragmentation Methods 0.000 description 79
- 238000006062 fragmentation reaction Methods 0.000 description 79
- 238000006243 chemical reaction Methods 0.000 description 56
- 230000001133 acceleration Effects 0.000 description 28
- 230000001052 transient effect Effects 0.000 description 24
- 239000007789 gas Substances 0.000 description 17
- 230000005405 multipole Effects 0.000 description 16
- 238000005040 ion trap Methods 0.000 description 13
- 238000011144 upstream manufacturing Methods 0.000 description 13
- 238000010494 dissociation reaction Methods 0.000 description 12
- 230000005593 dissociations Effects 0.000 description 12
- 238000004088 simulation Methods 0.000 description 10
- 238000001360 collision-induced dissociation Methods 0.000 description 6
- 238000010265 fast atom bombardment Methods 0.000 description 6
- 238000004949 mass spectrometry Methods 0.000 description 6
- 238000003795 desorption Methods 0.000 description 5
- 238000000605 extraction Methods 0.000 description 5
- 238000004252 FT/ICR mass spectrometry Methods 0.000 description 4
- 238000000065 atmospheric pressure chemical ionisation Methods 0.000 description 4
- 238000000451 chemical ionisation Methods 0.000 description 4
- 238000000688 desorption electrospray ionisation Methods 0.000 description 4
- 238000000132 electrospray ionisation Methods 0.000 description 4
- 238000004992 fast atom bombardment mass spectroscopy Methods 0.000 description 4
- 239000012634 fragment Substances 0.000 description 4
- 238000001698 laser desorption ionisation Methods 0.000 description 4
- 230000005855 radiation Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 description 3
- 230000010355 oscillation Effects 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001211 electron capture detection Methods 0.000 description 2
- 238000001077 electron transfer detection Methods 0.000 description 2
- 238000009616 inductively coupled plasma Methods 0.000 description 2
- PXHVJJICTQNCMI-RNFDNDRNSA-N nickel-63 Chemical compound [63Ni] PXHVJJICTQNCMI-RNFDNDRNSA-N 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 238000004150 penning trap Methods 0.000 description 2
- 230000002285 radioactive effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 102000004190 Enzymes Human genes 0.000 description 1
- 108090000790 Enzymes Proteins 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000002051 biphasic effect Effects 0.000 description 1
- 230000004069 differentiation Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000006862 enzymatic digestion Effects 0.000 description 1
- 230000002255 enzymatic effect Effects 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000000153 supplemental effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
- H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
- H01J49/005—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by collision with gas, e.g. by introducing gas or by accelerating ions with an electric field
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/063—Multipole ion guides, e.g. quadrupoles, hexapoles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/062—Ion guides
- H01J49/065—Ion guides having stacked electrodes, e.g. ring stack, plate stack
- H01J49/066—Ion funnels
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0624535.1 | 2006-12-08 | ||
| GBGB0624535.1A GB0624535D0 (en) | 2006-12-08 | 2006-12-08 | Mass spectrometer |
| US88447607P | 2007-01-11 | 2007-01-11 | |
| US60/884,476 | 2007-01-11 | ||
| PCT/GB2007/004732 WO2008068515A2 (en) | 2006-12-08 | 2007-12-10 | Mass spectrometer |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010511985A JP2010511985A (ja) | 2010-04-15 |
| JP2010511985A5 JP2010511985A5 (enExample) | 2012-04-26 |
| JP5198464B2 true JP5198464B2 (ja) | 2013-05-15 |
Family
ID=39199091
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009539808A Active JP5198464B2 (ja) | 2006-12-08 | 2007-12-10 | 質量分析計 |
Country Status (5)
| Country | Link |
|---|---|
| US (2) | US8969799B2 (enExample) |
| EP (1) | EP2089895B1 (enExample) |
| JP (1) | JP5198464B2 (enExample) |
| CA (1) | CA2670871C (enExample) |
| WO (1) | WO2008068515A2 (enExample) |
Families Citing this family (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9673034B2 (en) | 2006-12-08 | 2017-06-06 | Micromass Uk Limited | Mass spectrometer |
| WO2008068515A2 (en) * | 2006-12-08 | 2008-06-12 | Micromass Uk Limited | Mass spectrometer |
| US7781728B2 (en) * | 2007-06-15 | 2010-08-24 | Thermo Finnigan Llc | Ion transport device and modes of operation thereof |
| GB0810125D0 (en) * | 2008-06-03 | 2008-07-09 | Thermo Fisher Scient Bremen | Collosion cell |
| US7915580B2 (en) * | 2008-10-15 | 2011-03-29 | Thermo Finnigan Llc | Electro-dynamic or electro-static lens coupled to a stacked ring ion guide |
| GB201000852D0 (en) | 2010-01-19 | 2010-03-03 | Micromass Ltd | Mass spectrometer |
| US8927940B2 (en) * | 2011-06-03 | 2015-01-06 | Bruker Daltonics, Inc. | Abridged multipole structure for the transport, selection and trapping of ions in a vacuum system |
| EP3090608B1 (en) * | 2014-01-02 | 2021-09-01 | DH Technologies Development PTE. Ltd. | Homogenization of the pulsed electric field created in a ring stack ion accelerator |
| US9972480B2 (en) * | 2015-01-30 | 2018-05-15 | Agilent Technologies, Inc. | Pulsed ion guides for mass spectrometers and related methods |
| US9330894B1 (en) * | 2015-02-03 | 2016-05-03 | Thermo Finnigan Llc | Ion transfer method and device |
| GB201517068D0 (en) * | 2015-09-28 | 2015-11-11 | Micromass Ltd | Ion guide |
| WO2017089045A1 (en) * | 2015-11-27 | 2017-06-01 | Shimadzu Corporation | Ion transfer apparatus |
| US10651025B1 (en) * | 2018-12-21 | 2020-05-12 | Thermo Finnigan Llc | Orthogonal-flow ion trap array |
| EP4078656B1 (en) * | 2019-12-17 | 2025-08-13 | Roche Diagnostics GmbH | Method and device for multiple transition monitoring |
| DE102021204046A1 (de) * | 2021-04-22 | 2022-10-27 | Carl Zeiss Smt Gmbh | Vorrichtung zur spektrometrischen Untersuchung eines Gases und Lithographieanlage |
| WO2023119062A1 (en) * | 2021-12-21 | 2023-06-29 | Dh Technologies Development Pte. Ltd. | Method and systems for analyzing ions using differential mobility spectrometry and an ion guide comprising additional auxiliary electrodes |
| KR102822876B1 (ko) * | 2023-05-22 | 2025-06-18 | 강원대학교산학협력단 | 고분해능 진공 자외선 질량분석 문턱 이온화 질량 분광계 |
| CN119275082B (zh) * | 2024-12-11 | 2025-03-14 | 成都艾立本科技有限公司 | 具有辅助电极的双螺旋离子漏斗 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3621242A (en) | 1969-12-31 | 1971-11-16 | Bendix Corp | Dynamic field time-of-flight mass spectrometer |
| US6762404B2 (en) * | 2001-06-25 | 2004-07-13 | Micromass Uk Limited | Mass spectrometer |
| US6794641B2 (en) * | 2002-05-30 | 2004-09-21 | Micromass Uk Limited | Mass spectrometer |
| US7196324B2 (en) * | 2002-07-16 | 2007-03-27 | Leco Corporation | Tandem time of flight mass spectrometer and method of use |
| DE602005027656D1 (de) * | 2004-01-09 | 2011-06-09 | Micromass Ltd | Ionenextraktionseinrichtungen und verfahren zur selektiven extraktion von ionen |
| JP4872088B2 (ja) * | 2004-05-05 | 2012-02-08 | ディーエイチ テクノロジーズ ディベロップメント ピーティーイー リミテッド | 質量分析計用イオンガイド |
| WO2006075182A2 (en) * | 2005-01-17 | 2006-07-20 | Micromass Uk Limited | Mass spectrometer |
| EP2038913B1 (en) | 2006-07-10 | 2015-07-08 | Micromass UK Limited | Mass spectrometer |
| GB0624535D0 (en) * | 2006-12-08 | 2007-01-17 | Micromass Ltd | Mass spectrometer |
| WO2008068515A2 (en) * | 2006-12-08 | 2008-06-12 | Micromass Uk Limited | Mass spectrometer |
| GB0624740D0 (en) * | 2006-12-12 | 2007-01-17 | Micromass Ltd | Mass spectrometer |
| CN101738429B (zh) * | 2008-11-26 | 2013-04-03 | 岛津分析技术研发(上海)有限公司 | 离子分离、富集与检测装置 |
| US8309915B2 (en) * | 2009-04-07 | 2012-11-13 | Wisconsin Alumni Research Foundation | Mass spectrometer using an accelerating traveling wave |
| GB2476844B (en) * | 2010-05-24 | 2011-12-07 | Fasmatech Science And Technology Llc | Improvements relating to the control of ions |
| CN107658203B (zh) * | 2011-05-05 | 2020-04-14 | 岛津研究实验室(欧洲)有限公司 | 操纵带电粒子的装置 |
-
2007
- 2007-12-10 WO PCT/GB2007/004732 patent/WO2008068515A2/en not_active Ceased
- 2007-12-10 CA CA2670871A patent/CA2670871C/en not_active Expired - Fee Related
- 2007-12-10 EP EP07848477.1A patent/EP2089895B1/en active Active
- 2007-12-10 JP JP2009539808A patent/JP5198464B2/ja active Active
-
2013
- 2013-11-14 US US14/080,301 patent/US8969799B2/en active Active
-
2015
- 2015-02-26 US US14/631,959 patent/US9263244B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| EP2089895B1 (en) | 2017-10-04 |
| JP2010511985A (ja) | 2010-04-15 |
| US8969799B2 (en) | 2015-03-03 |
| US20150170896A1 (en) | 2015-06-18 |
| CA2670871A1 (en) | 2008-06-12 |
| WO2008068515A2 (en) | 2008-06-12 |
| US9263244B2 (en) | 2016-02-16 |
| US20140158878A1 (en) | 2014-06-12 |
| WO2008068515A3 (en) | 2009-04-02 |
| CA2670871C (en) | 2016-02-02 |
| EP2089895A2 (en) | 2009-08-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5198464B2 (ja) | 質量分析計 | |
| US8598518B2 (en) | Mass spectrometer | |
| EP2033208B1 (en) | Mass spectrometer | |
| US9991108B2 (en) | Ion guide with orthogonal sampling | |
| CN101479828B (zh) | 质谱仪 | |
| EP1789989B1 (en) | Mass spectrometer | |
| JP5290960B2 (ja) | 質量分析計 | |
| JP2010511985A5 (enExample) | ||
| EP2526562B1 (en) | Mass to charge ratio selective ejection from ion guide having supplemental rf voltage applied thereto | |
| JP2008523554A (ja) | 質量分析計 | |
| US9673034B2 (en) | Mass spectrometer | |
| HK1145566B (zh) | 质谱仪 | |
| HK1145566A1 (en) | Mass spectrometer | |
| HK1132839B (en) | Mass to charge ratio selective barrier |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20101118 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120309 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20120719 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120724 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20121023 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20121030 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20121116 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20130108 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130206 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20160215 Year of fee payment: 3 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5198464 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |