JP5164920B2 - Test data generation method, apparatus and program - Google Patents

Description

  The present invention relates to a test data generation method, apparatus, and program, and in particular, test data used in a test for confirming whether or not a system has been constructed in accordance with a design intent described in a design model. The present invention relates to a test data generation method, apparatus, and program for automatically generating a design model rather than using a design model. More specifically, the present invention relates to a test data generation method, apparatus, and program for obtaining a highly reliable test result.

  In the test in the program development process, whether or not the system is constructed as designed is confirmed, and test data is required at that time. If test data can be prepared automatically instead of manpower, development costs can be improved. In addition, if the test can be carried out effectively with a small amount of test data, the test cost can be further reduced.

  It is not always necessary to have one test data for testing the execution path for each execution path. Careful confirmation of whether or not the corresponding execution path has been correctly constructed using test data of various variations is important for improving the reliability of the test results.

  As test data automatic generation technology, there are, for example, a method of decomposing a data type having a hierarchical structure into a basic type and giving a predetermined value to the basic type, and a technology of generating a value to be assigned to a single variable (for example, Patent Document 1, Non-Patent Document 1).

JP-A-9-231103

Jon Edvardsson. "A Survey on Automatic Test Data Generation". In Proceedings of the 2nd Conference on Computer Science and Engineering, Pages 21-28, 1999. http://citeseerx.ist.psu.edu/viewdoc/summary?doi= 10.1.1.20.963

  However, the above test data automatic generation technique has the following problems.

  Because we focus only on the generation of test data that passes the execution path correctly, even if there is a problem that an unexpected abnormal input to the execution path is mistakenly processed (as it is without being played) Does not appear in test results.

  In particular, in the case of data types with a hierarchical structure such as object types, there are many possible abnormal input variations, so it is unrealistic to manually identify any abnormal input, but existing technologies automate this. Is not mentioned. For example, if what is desired to be confirmed in the test is “Is the designed execution path A correctly constructed as the final product (program) (as designed)?”, An input that passes through the execution path A is input. If one or more programs are given and the program is executed, the test results may not be reliable, as it may happen to work correctly by chance, or the “strange input” that should not pass through the execution path A may not actually pass through. It is enough.

  The present invention has been made in view of the above points, and provides a test data generation method, apparatus, and program for generating various test data including abnormal input that is not permitted and improving the reliability of test results. The purpose is to provide.

  FIG. 1 is a principle configuration diagram of the present invention.

The present invention (Claim 1) is a test data generation device for generating test data for confirming whether or not the design information of a system is constructed in accordance with the design intention of a design model described in a formal language. And
A design model reading means 1 for reading a design model described only by a UML class diagram and an activity diagram from a user terminal;
Design model analysis means 2 for extracting an activity diagram as a test object from the read design model;
Execution path extraction means 3 for extracting an execution path from the test target;
Test data specification storage means 12 storing test data specifications;
By setting the input parameter of the activity having each execution path extracted from the execution path extracting means 3 as a variable (“factor” in the experimental design method), and scanning the end node from the start point node of the execution path to be satisfied by the variable. A test data specification generation unit 4 for updating the test data specification stored in the test data specification storage unit 12 based on the extracted constraint condition;
A test data specification is read from the test data specification storage unit 12, and according to the value of the test data specification, a normal level that satisfies the test data specification as a value of a factor (a “level” in the experimental design method), Level generation means 5 for generating an abnormal level that does not satisfy the test data specification, and storing it in the execution path / level storage means 11 in correspondence with the execution path and the factor;
A factor, a level, and an execution path are acquired from the execution path / level storage unit 11, a combination including only one abnormal level is generated as an abnormal input, and a combination including no abnormal level is generated as a normal input. , obtains an expected value according to whether or not include post-conditions during the execution path, generates test data assigned with the expected value in the normal input or the abnormal input test stored in the test data storage means 13 data Generating means 6;
Output means for reading out test data from the test data storage means 13 and outputting it to the user terminal.

  Further, according to the present invention (Claim 2), the level generation means 5 uses a predetermined level generation rule according to any of the Boolean type, Enum type, Integer type, String type, and Object type of the test data specification. On the basis of the above, a means for generating a condition that satisfies the rule as a normal level and a condition that does not satisfy the rule as an abnormal level is included.

  FIG. 2 is a diagram for explaining the principle of the present invention.

The present invention (Claim 3) is a test data generation method for generating test data for confirming whether or not the system design information is constructed in accordance with the design intent of the design model described in a formal language. And
A design model reading step (step 1) for reading a design model described only by a UML class diagram and an activity diagram from a user terminal;
A design model analysis step (step 2) for extracting an activity diagram as a test target from the read design model;
An execution path extraction step (step 3) for extracting an execution path from the test target;
Extracted by scanning the end point node from the start point node of the execution path that should be satisfied by the input parameter of the activity having each execution path extracted in the execution path extraction step as a variable ("factor" in the experimental design method) A test data specification generation step (step 4) for updating the test data specification stored in the test data specification storage means based on the constraint condition
A test data specification is read from the test data specification storage means, and according to the value of the test data specification, a normal level that satisfies the test data specification as a value of a factor (a “level” in the experimental design method), and the test A level generation step (step 5) for generating an abnormal level that does not satisfy the data specification and storing it in the execution path / level storage means in correspondence with the execution path and the factor;
A factor, a level, and an execution path are acquired from the execution path / level storage means, a combination including only one abnormal level is generated as an abnormal input, and a combination including no abnormal level is generated as a normal input ( step 6), determine the expected values according to whether or not include post-conditions during the execution path, generates test data assigned with the expected value in the normal input or the abnormal input (step 7), the test data storage A test data generation step to be stored in the means;
An output step (step 8) of reading the test data from the test data storage means and outputting it to the user terminal is performed.

Further, according to the present invention (Claim 4), in the level generation step (Step 5),
According to the test data specification Boolean type, Enum type, Integer type, String type, Object type, based on a predetermined level generation rule, those that satisfy the rule are set to normal levels, and those that do not satisfy Generate as an abnormal level.

  The present invention (Claim 5) is a test data generation program for causing a computer to function as each means constituting the test data generation apparatus according to Claim 1 or 2.

  As described above, according to the present invention, according to the data specification type (Boolean type, Enum type, Integer type, String type, Object type), those satisfying a predetermined level generation rule are regarded as normal levels and those not satisfied Is generated as an abnormal level, and test data with a combination of only one abnormal level (a combination of factors, levels, and execution paths) as “abnormal input” and a combination that does not include any abnormal level as “normal input” By generating, it is possible to increase the reliability of the test result with few errors in the judgment by the test as to whether or not the program is created according to the design model (UML model or the like).

It is a principle block diagram of this invention. It is a figure for demonstrating the principle of this invention. It is a block diagram of the test data generation device in one embodiment of the present invention. It is an image of the UML design model used by this invention. It is a format of the test data specification in one embodiment of the present invention. It is an input-output image of the test data generation device in one embodiment of the present invention. It is a flowchart of the test data generation process outline | summary in one embodiment of this invention. It is an example of the execution path | route extracted by the execution path | route extraction part in one embodiment of this invention. It is a flowchart of the test data specification production | generation part in one embodiment of this invention. It is a figure for demonstrating the execution path | route in one embodiment of this invention. It is a flowchart of the level production | generation in one embodiment of this invention. It is a flowchart of the level production | generation from the Boolean type | mold test data specification in one embodiment of this invention. It is a flowchart of the level production | generation from the Enum type | mold test data specification in one embodiment of this invention. It is a flowchart of the level production | generation from the integer type test data specification in one embodiment of this invention. It is a flowchart of the level production | generation from the String type test data specification in one embodiment of this invention. It is a flowchart of detailed operation | movement of step 1642 in one embodiment of this invention. It is a flowchart of detailed operation | movement of step 1643 in one embodiment of this invention. It is a flowchart of the level production | generation from Object type test data specification in one embodiment of this invention. It is a flowchart of detailed operation | movement of step 1657 in one embodiment of this invention. It is an example of the level setting in one embodiment of this invention. It is a flowchart of the process of the test data generation part in one embodiment of this invention. It is a figure which shows the production | generation method of the normal input and abnormal input in one embodiment of this invention. It is a flowchart of normal input generation in one embodiment of the present invention. It is a flowchart in the case of implement | achieving normal input production | generation in one embodiment of this invention with a program. It is a flowchart of abnormal input generation in one embodiment of the present invention. It is a flowchart in the case of implement | achieving the abnormal input production | generation in one embodiment of this invention with a program. It is a flowchart of "the provision of the expected value to an input" of the test data generation part in one embodiment of this invention. It is an example of the produced | generated input in one embodiment of this invention. It is a figure which shows the comparison of this invention and a prior art.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

  First, terms used in the following embodiments will be described.

  A “design model” is a description of system design information strictly and formally in some formal description language rather than a vague natural language.

  The “constraint condition” refers to a condition relating to a value that can be taken by a certain factor (here, a), such as “a> 3”, included in the execution path extracted from the design model. In the example of “a> 3”, the constraint condition is composed of a factor name (a), an operator (>), and an operand (3), and “invariant condition”, “precondition” depending on where the constraint condition is attached. ”And“ branching conditions ”. For the operator of the constraint condition, a commonly used notation such as an inequality sign or a character string comparison is used.

  The “test data specification” is a collection of properties to be satisfied by factors (variables) for passing through a specific execution path in the design model, and indicates “specification” that the test data should satisfy.

  “Updating the test data specification” means overwriting the test data specification from the initial value immediately after generation according to the processing of the constraint condition in the execution path.

  The “normal level” is an input value allowed for the execution path.

  The “abnormal level” is an input value that is not allowed for the execution path.

  “Normal input” is an input composed only of a factor and a normal level.

  An “abnormal input” is an input including a factor and at least one abnormal level.

  FIG. 3 shows a configuration of the test data generation apparatus according to the embodiment of the present invention.

  The test data generation device 10 shown in FIG. 1 includes a design model reading unit 1, a design model analysis unit 2, an execution path extraction unit 3, a test data specification generation unit 4, a level generation unit 5, a test data generation unit 6, and an output unit 7. , An execution path / level storage unit 11, a test data specification storage unit 12, and a test data storage unit 13.

  Among these, the design model reading unit 1, the design model analysis unit 2, the execution path extraction unit 3, the test data specification generation unit 4, the level generation unit 5, the test data generation unit 6, and the output unit 7 are functions on the CPU. The execution path / level storage unit 11, the test data specification storage unit 12, and the test data storage unit 13 are storage media such as a hard disk device.

  The user terminal 20 includes a modeling tool 21 and a viewer 22, and exports a design model from the modeling tool 21 to the design model reading unit 1 of the test data generation device. The viewer 22 acquires test data from the test data generation device 10.

  The design model reading unit 1 reads the XML model UML model (class diagram, activity diagram) as shown in FIG. 4 exported from the modeling tool 21 of the user terminal 20.

  The design model analysis unit 2 analyzes the read UML model and extracts activities as test targets.

  The execution path extraction unit 3 extracts an execution path (Path) from the test target, and outputs the extracted execution path to the test data specification generation unit 4 and the execution path / level storage unit 11.

  The test data specification generation unit 4 collects the properties to be satisfied by variables (“factors” in the experimental design method) to pass a specific execution path from all the execution paths extracted by the execution path extraction unit 3, It is stored in the data specification storage unit 12. As shown in FIG. 5, the test data specification differs for each data type (Integer type, Enum type, Object type, Boolean type, String type Collection type) and has a domain that defines factors. As the domain is updated (overwritten), the range is narrowed. For example, the test data specification for a String type factor includes values such as a lower limit, an upper limit, and a substring. The factor "name: String" has a length of 0 to 30, Test data specifications limit the possible values of a factor (here "name"), such as including the column "M".

  The Integer type test data specification includes a lower limit L and an upper limit U.

  The Enum type test data specification has an allowable element S.

  The Object type test data specification consists of null n and specification A for each attribute.

  The Boolean type test data specification has a value V.

  The String type test data specification consists of a length lower limit L, a length upper limit U, a partial character string C, and an equal character string E.

  The collection type test data specification includes the number of elements N, the order of arrangement O, the unique U, and the specification E of each attribute.

  The level generation unit 5 reads test data specifications from the test data specification storage unit 12, and based on preset level generation rules, normal values and abnormal values are taken as factors ("level" in the experimental design method). A level is generated and stored in the execution path / level storage unit 11 in association with the factor and the execution path (Path Name). The level generation rule may be stored in a memory (not shown) in the level generation unit 5 or may be stored in a storage unit outside the level generation unit 5. In the present embodiment, description will be made assuming that the data is stored in a memory (not shown) inside the level generation unit 5. Details of the level generation rule will be described later with reference to FIGS.

  The test data generation unit 6 acquires the execution path and level (normal level or abnormal level) from the execution path / level storage unit 11 and generates test data including a pair of an input (a combination of a factor and a level) and an expected value. The data is stored in the test data storage unit 13 in the format as shown in FIG. As shown in FIG. 6B, the test data includes items of an execution path name, test data ID, level (value), factor (variable), expected value, normal input or abnormal input distinction, and test result.

  The output unit 7 reads the test data generated by the test data generation unit 6 from the test data storage unit 13 and outputs it to the user terminal 20. Here, the output is in CSV format.

  The operation in the above configuration will be described below.

  FIG. 7 is a flowchart of the operation of the test data generation apparatus in one embodiment of the present invention.

  Step 100) The design model reading unit 1 reads an XML (Unified Modeling Language) model in XML format exported from the user terminal 20 as shown in FIG. 6A and passes it to the design model analysis unit 120.

  Step 110) The design model analysis unit 2 decomposes the UML design model acquired from the design model reading unit 1, extracts activities as test targets, and passes them to the execution path extraction unit 130.

  Step 120) As shown in FIG. 8, the execution path extraction unit 3 scans from the start node to the end node of each acquired test target (activity) to extract the execution path, and extracts all execution path information from the execution path / The data is passed to the level storage unit 11 and the test data specification generation unit 4. As shown in FIG. 10, the execution path information includes processing (constraint conditions) of each node, branch conditions, post-conditions, and invariant conditions.

  Step 130) The test data specification generation unit 4 generates a test data specification in a format as shown in FIG. 5 based on each execution path information, and stores it in the test data specification storage unit 12.

  Below, operation | movement of the test data specification production | generation part 4 is demonstrated. FIG. 9 is a flowchart of the test data specification generation unit in one embodiment of the present invention. In the following, it is assumed that the test data specification storage unit 12 is initialized by default with the corresponding test data specification based on the type of factor.

    Step 131) The test data specification generation unit 4 acquires execution path information from the execution path extraction unit 3 and stores it in a memory (not shown).

    Step 132) Obtain an execution path from a memory (not shown), scan from the start node to the end node of the execution path as shown in FIG. 10, and include the constraint condition (in the example of FIG. [p.name.length> 0] and [p.age.> = 20] are extracted.

    Step 133 One test data specification is read from the test data specification storage unit 12. When all the test data specifications have been read, the process ends.

    Step 134) The factor name of the read test data specification is compared with the factor included in the constraint condition. If they match, the process proceeds to Step 135, and if they do not match, the process returns to Step 133.

    Step 135) If the factor names match, the test data specification in the test data specification storage unit 12 is updated with the contents of the constraint condition.

  Step 140) The level generation unit 5 reads the test data specification from the test data specification storage unit 12, generates a value taken by the factor ("level" in the experimental design method), and stores it in the execution path / level storage unit 11 . The level is generated according to the following level generation rule that varies depending on the type of the test data specification.

  In the case of the “Boolean type” test data specification, the value v of the Boolean type test data specification shown in FIG. 5 is acquired, the value to v is set to a normal level, v is negated, and the value is not null or Boolean type. Is generated as an abnormal level. Details will be described with reference to FIG.

  In the case of the “Enum type” test data specification, each element s of the “allowable element S” of the Enum type test data specification shown in FIG. 5 is set to a normal level, the element s ′ not belonging to S, null, Enum A non-type value is regarded as an abnormal level. Details will be described with reference to FIG.

  In the case of the “Integer type” test data specification, the lower limit L and the upper limit U of the Integer type test data specification shown in FIG. X ≦ U) is a normal level, L-1, U + 1, positive and negative values that overflow, null, and non-integer values are abnormal levels. Details will be described with reference to FIG.

  Further, in the case of the “String type” test data specification, the lower limit L, the length condition U, the partial character string C, and the equal character string E of the String type test data specification shown in FIG. A normal level and an abnormal level are generated according to a rule described later in FIG.

  In the case of the “Object type” test data specification, an object that includes an abnormality somewhere when the hierarchical structure of the object is expanded is set to an abnormal level. Details will be described with reference to FIGS.

  The level obtained as described above is stored in the execution path / level storage unit 11 together with the factor.

  The detailed operation of the level generation unit 5 will be described later with reference to FIG.

  Step 150) The test data generation unit 6 obtains a set of levels and factors (input) from the execution path / level storage unit 11, and generates test data consisting of pairs of inputs and expected values, as shown in FIG. Is stored in the test data storage unit 13 in the format shown in FIG. The “input” is a combination of a factor and a level acquired from the execution path / level storage unit 11. As an “input”, a combination of all normal levels for one factor is “normal input”, and a combination of a normal level and one abnormal level is “abnormal input” for one factor. As shown in FIG. 11A, a combination of normal levels is a normal input, and as shown in FIG. 11B, a combination including a normal level and one abnormal level is an abnormal input.

  A method for generating the input will be described in detail with reference to FIG.

  Step 160) The output unit 7 reads the test data (CSV file) generated by the test data generation unit 6 from the test data storage unit 13 and outputs it to the external file (viewer 220 of the user terminal).

<Level generator 5>
Here, the operation of the level generation unit 5 in step 140 will be described in detail.

  FIG. 11 is a flowchart of level generation according to an embodiment of the present invention.

  Step 1600) The test data specification is acquired from the test data specification storage unit 8, and it is determined whether the type of the test data is Boolean type, Enum type, Integer type, String type, or Object type. If the type is Boolean, the process proceeds to step 1610. If the type is Enum, the process proceeds to step 1620. If the type is Integer, the process proceeds to step 1630. If the type is String, the process proceeds to step 1640. Move to 1650.

  Step 1610) If the test data specification is Boolean type, a level is generated by the processing of FIG. 12, and stored in correspondence with the execution path factor of the execution path / level storage unit 11. FIG. 12 is a flowchart of level generation from the Boolean type test data specification according to the embodiment of the present invention.

    Step 1611) The “value v” of the Boolean test data specification is acquired, and it is determined whether the “value v” is an initial value.

    Step 1612) If the value is an initial value, the true and false fields of the level of the execution path / level storage unit 11 are set to the normal level (true), and the process proceeds to Step 1615.

    Step 1613) If it is not the initial value, the value v is stored in the execution path / level storage unit 11 as a normal level (true).

    Step 1614) The negation of the value v is stored in the execution path / level storage unit 11 as an abnormal level (false).

    Step 1615) A value that is not null or Boolean type is stored in the execution path / level storage unit 11 as an abnormal level (false).

  Step 1620) If the test data specification is Enum type, a level from the Enum type test data specification is generated by the processing of FIG. 13 and stored in a memory (not shown). FIG. 13 is a flowchart of the level generation from the Enum type test data specification according to the embodiment of the present invention.

    Step 1621) A set S of elements s allowed in the Enum type test data specification is acquired.

    Step 1622) Each element s in the set S of allowed elements s is stored in the execution path / level storage unit 11 as a normal level (true).

    Step 1623) Each element s ′ which does not belong to the set of allowed elements s among all the choices of factors is stored in the execution path / level storage unit 11 as an abnormal level (false).

    Step 1624) A value that is not null or Enum type is stored in the execution path / level storage unit 11 as an abnormal level (false).

  Step 1630) When the test data specification is Integer type, the level from the Integer type test data specification is generated by the processing of FIG. 14, and stored in correspondence with the execution path factor of the execution path / level storage unit 11. . FIG. 14 is a flowchart of level generation from the Integer type test data specification according to the embodiment of the present invention.

    Step 1631) The “lower limit L” and “upper limit U” of the Integer type test data specification are acquired.

    Step 1632) L, L + 1, U-1, U are stored in the execution path / level storage unit 11 as normal levels (true).

    Step 1633) The random value x (L ≦ x ≦ U) is stored in the execution path / level storage unit 11 as a normal level (true).

    Step 1634) L-1, U + 1 are stored in the execution path / level storage unit 11 as an abnormal level (false).

    Step 1635) A value that is positive and negative and overflows is stored in the execution path / level storage unit 11 as an abnormal level (false).

    Step 1636) A value that is not null or Integer type is stored in the execution path / level storage unit 11 as an abnormal level (false).

  Step 1640) If the test data specification is of the String type, the level from the String type test data specification is generated by the process of FIG. 15 and corresponds to the execution path factor of the execution path / level storage section 11 of the level generation section 5 Let me store. FIG. 15 is a flowchart of level generation from a String type test data specification according to an embodiment of the present invention.

    Step 1641) The “length lower limit L”, “length upper limit U”, “partial character string C”, and “equal character string E” of the String type test data specification are acquired.

    Step 1642) A normal level is generated based on the above-mentioned “length lower limit L”, “length upper limit U”, “partial character string C”, and “equal character string E”, and stored in the execution path / level storage unit 11. To do. Hereinafter, detailed processing will be described with reference to FIG. It is a flowchart of the detailed process of step 1642 in one embodiment of this invention.

      Step 2200) If “equal character string E” has already been set, E is stored in the execution path / level storage unit 11 as a normal level (true), and the processing of level generation unit 5 ends.

      Step 2210) If “equivalent character string E” is not set and “partial character string C” is already set, a random character string including C of length L is set as a normal level (true), and the execution path / level storage Stored in the unit 11.

      Step 2220) A random character string including the partial character string C of length L + 1 is stored in the execution path / level storage unit 11 as a normal level (true).

      Step 2230) The random character string including the partial character string C of length U-1 is stored in the execution path / level storage unit 11 as a normal level (true).

      Step 2240) A random character string including the partial character string C of length U is stored in the execution path / level storage unit 11 as a normal level (true), and the processing of the level generation unit 5 is terminated.

      Step 2250) If “equal character string E” has been set and “partial character string C” has already been set, a random character string of length L is set as a normal level (true) in the execution path / level storage unit 11. Store.

      Step 2260) A random character string of length L + 1 is stored in the execution path / level storage unit 11 as a normal level (true).

      Step 2270) The random character string of length U-1 is stored in the execution path / level storage unit 11 as a normal level (true).

      Step 2280) A random character string of length U is stored in the execution path / level storage unit 11 as a normal level (true), and the processing of the level generation unit 5 is terminated.

    Step 1643) Generates an abnormal level (false) based on the above-mentioned “length lower limit L”, “length upper limit U”, “partial character string C”, and “equal character string E”, and corresponds to the factor of the execution path And stored in the execution path / level storage unit 11. Hereinafter, detailed processing will be described with reference to FIG. FIG. 17 is a detailed operational flowchart of step 1643 in the embodiment of the invention.

      Step 2300) “Equal character string E” has been set, and a character string that is not partial character string C of length L is stored as an abnormal level (false) in execution path / level storage unit 11.

      Step 2305) A character string that is not equal to the character string E having the length U + 1 is stored in the execution path / level storage unit 11 as an abnormal level (false).

      Step 2310) A character string that is not equal to the character string E having the length L-1 is stored as an abnormal level in the execution path / level storage unit 11, and the process proceeds to Step 2360.

      Step 2320) When “equal character string E” is not set and “partial character string C” is already set, a character string not including partial character string C of length L is executed as an abnormal level (false). Stored in the route / level storage unit 11.

      Step 2325) A character string not including the partial character string C of length U is stored in the execution path / level storage unit 11 as an abnormal level (false).

      Step 2330) A character string not including the partial character string C of length L-1 is stored in the execution path / level storage unit 11 as an abnormal level (false).

      Step 2335) A character string not including the partial character string C of length U + 1 is stored in the execution path / level storage unit 11 as an abnormal level (false).

      Step 2350) The character string including the partial character string C of length L-1 is stored in the execution path / level storage unit 11 as an abnormal level (false).

      Step 2345) The character string including the partial character string C of length U + 1 is stored in the execution path / level storage unit 11 as an abnormal level (false), and the process proceeds to Step 2360.

      Step 2350) When the equal character string E is not set and the partial character string C is not set, a random character string of length L-1 is stored in the execution path / level storage unit 11 as an abnormal level (false). .

      Step 2355) The random character string of length L + 1 is stored as an abnormal level (false) in the execution path / level storage unit 11, and the process proceeds to Step 2360.

  Step 1650) When the test data specification is of the Object type, a level is generated from the Object type test data specification by the processing of FIG. 18, and stored in the execution path / level storage unit 11 in correspondence with the factor of the execution path.

  FIG. 18 is a flowchart of level generation from the Object type test data specification according to the embodiment of the present invention.

    Step 1651) “null or n” of Object type test data specification and “attribute specification A” are acquired.

    Step 1652) If “null or n” is not set and “attribute specification A” is empty, an arbitrary Object is stored in a memory (not shown) as a normal level (true), and the process is performed. finish.

    Step 1653) When “null or n” is “true”, “null” is stored in the execution path / level storage unit 11 as a normal level (true).

    Step 1654) Arbitrary Object (non-null) is stored in the execution path / level storage unit 11 as an abnormal level (false), and the process ends.

    Step 1655) When “null or n” is “false” and “attribute specification A” is empty, an arbitrary object (non-null) is set as a normal level (true) and the execution path / level storage unit 11 To store.

    Step 1656) “null” is stored in the execution path / level storage unit 11 as an abnormal level (false), and the process ends.

    Step 1657) If “null or n” is “false” and “attribute specification A” is not empty, the level based on the test data specification included in the attribute specification A is executed corresponding to the factor of the execution path. The route / level storage unit 11 stores the information, and the process ends. Details of this processing will be described with reference to FIG. FIG. 19 is a detailed flowchart of step 1657 according to the embodiment of the present invention.

      Step 2400) “Attribute specification A” is acquired from the Object type test data specification.

      Step 2410) For each test data specification included in the acquired attribute specification A, a level is generated by the method shown in FIG. 11 and stored in the execution path / level storage unit 11.

      Step 2420) The combination generation unit 6 generates a combination. Detailed processing will be described in detail with reference to FIG.

      Step 2430) One combination generated by the combination generation unit 6 is stored in the execution path / level storage unit 11 as one level.

  As described above, the level of each factor related to the specific execution path is determined, and the contents shown in FIG. 20 are stored in the execution path / level storage unit 11.

<Test data generator>
Next, the combination generation process of the data generation unit 6 in step 150 will be described.

  FIG. 21 is a diagram showing a normal input and abnormal input generation method according to an embodiment of the present invention.

  FIG. 22 is a flowchart of the process of the test data generation unit in one embodiment of the present invention.

    Step 1200) The combination generation unit 6 acquires all levels of all factors obtained by the level generation unit 5 from the execution path / level storage unit 11. Note that an execution path is associated with the level acquired here.

  Step 1210) The normal input is generated by the method shown in FIG. FIG. 22 is a flowchart of normal input generation according to an embodiment of the present invention.

    Step 1211) The normal level number M of the factor A having the most normal level is specified from all the factors read from the execution path / level storage unit 11.

    Step 1212) M empty normal input records are generated in the test data storage unit 13.

    Step 1213) The normal level of factor A is filled in the normal input records in order (FIG. 21A).

    Step 1214) Next, for each factor other than the factor A, the normal level of the factor is repeatedly filled in the normal input of the record (FIG. 21A).

  An example for realizing the operation of FIG. 23 with a program is shown in FIG.

  Step 1220) Abnormal input is generated by the method shown in FIG. FIG. 25 is a flowchart of abnormal input generation according to an embodiment of the present invention.

    Step 1221) The total number N of abnormal levels of each factor is specified from all the factors read from the execution path / level storage unit 11.

    Step 1222) Generate N empty abnormal input records on the test data storage unit 13.

    Step 1223) The generated normal input is repeatedly overwritten with the abnormal input.

    Step 1224) For each abnormal level, the abnormal level is overwritten on the corresponding part of the abnormal input based on the factor (FIG. 21B).

  FIG. 26 shows an example for realizing the operation of FIG. 25 by a program.

  Step 1230) An expected value of input is given to the normal input generated in Step 1210 and the abnormal input generated in Step 1220 by the method shown in FIG. FIG. 27 is a flowchart of an “applying an expected value to input” process of the test data generation unit according to an embodiment of the present invention.

    Step 1231) An input (factor + level) and an execution path corresponding to the input are acquired from the execution path / level storage unit 12.

    Step 1232) Acquire all postconditions in the execution path. As shown in FIG. 10, the post-condition can be acquired by checking the nodes in order from the start node to the end node of the execution path.

    Step 1233) If the input (factor + level) is a normal input, go to Step 1234; otherwise, go to Step 1235.

    Step 1234) If the post-conditions can be acquired in step 1232, the process proceeds to step 1237. If the post-conditions cannot be acquired, the process proceeds to step 1236.

    Step 1235) The expected value is set to “undefined” and given to the input (factor + level).

    Step 1236) The expected value is set as “undefined” and given to the input (factor + level).

    Step 1237) The expected value is assigned to the input (factor + level) as a “post-condition set”.

In the example shown in FIG. 6, [status = APPROVED, orderld = arbitrary character string (999 characters)]
Is one input and [changedOrder has been added] is the expected value.

  By the above processing, as shown in FIG. 28, when there is an execution path A as shown in FIG. 28A, the execution path A as shown by “3” and “4” in FIG. No abnormal input is generated. In the example of “3”, since “p = name = null age = 20” is an abnormal level, the execution path A does not pass. In the example of “4”, “flag = null” is set, which is an abnormal level, so the execution path A does not pass.

  Conventionally, as shown in FIG. 29, the program is executed by giving one or more inputs that pass through the execution path A in the input space. However, in the present invention, the execution path A allows in the input space. By providing a plurality of inputs other than the inputs, the accuracy of determining whether or not the designed execution path A is correctly constructed as a program is improved in the test.

  The operation of the constituent elements of the test data generation apparatus shown in FIG. 3 can be constructed as a program, installed on a computer used as the test data generation apparatus, executed, or distributed via a network. It is.

  Further, the constructed program can be stored in a portable storage medium such as a hard disk, a flexible disk, or a CD-ROM, and can be installed or distributed in a computer.

  The present invention is not limited to the above-described embodiment, and various modifications and applications can be made within the scope of the claims.

1 design model reading means, design model reading section 2 design model analyzing means, design model analyzing section 3 execution path extracting means, execution path extracting section 4 test data specification generating means, test data specification generating section 5 level generating means, level generating section 6 Test Data Generation Unit, Test Data Generation Unit 7 Output Unit, Output Unit 10 Test Data Generation Device 11 Execution Path / Level Storage Unit, Execution Path / Level Storage Unit 12 Test Data Specification Storage Unit, Test Data Specification Storage Unit 13 Test Data Storage means, test data storage unit 20 User terminal 21 Modeling tool 22 Viewer

Claims (5)

A test data generation device for generating test data for confirming whether or not the system design information is constructed according to the design intention of a design model described in a formal language,
A design model reading means for reading a design model described only by a UML class diagram and an activity diagram from a user terminal;
Design model analysis means for extracting an activity diagram as a test target from the read design model;
Execution path extraction means for extracting an execution path from the test target;
Test data specification storage means storing test data specifications;
By setting the input parameter of the activity having each execution path extracted from the execution path extraction means as a variable (“factor” in the experimental design method), and scanning the end node from the start point node of the execution path to be satisfied by the variable Test data specification generation means for updating the test data specification stored in the test data specification storage means based on the extracted constraint conditions;
The test data specification is read from the test data specification storage means, and according to the value of the test data specification, as a value taken by the factor (a “level” in the design of experiments), a normal level that satisfies the test data specification Level generation means for generating an abnormal level that does not satisfy the test data specification, and storing the combination of the factor and the level in the execution path / level storage means in correspondence with the execution path;
A combination of the factor, the level, and the execution path is acquired from the execution path / level storage means, and a combination including at least one abnormal level is generated as an abnormal input, and no abnormal level is included. generates a combination as a normal input, it obtains an expected value according to whether or not include post-conditions during the execution path, generates test data assigned with the expected value in the normal input or the abnormal input, the test data storage Means for generating test data stored in the means;
An output means for reading the test data from the test data storage means and outputting it to the user terminal;
A test data generation apparatus comprising: The level generation means includes
Based on a predetermined level generation rule according to any of the Boolean type, Enum type, Integer type, String type, and Object type of the test data specification, those that satisfy the rule are regarded as normal levels, and those that do not satisfy The test data generation apparatus according to claim 1, further comprising means for generating an abnormal level. A test data generation method for generating test data for confirming whether or not the design information of a system is constructed according to the design intention of a design model described in a formal language,
A design model reading step for reading a design model described only by a UML class diagram and an activity diagram from a user terminal;
A design model analysis step of extracting an activity diagram from the read design model as a test target;
An execution path extraction step for extracting an execution path from the test target;
By setting the input parameter of the activity having each execution path extracted in the execution path extraction step as a variable (“factor” in the experimental design method), and scanning the end node from the start point node of the execution path to be satisfied by the variable A test data specification generation step for updating the test data specification stored in the test data specification storage means based on the extracted constraint condition;
The test data specification is read from the test data specification storage means, and according to the value of the test data specification, as a value taken by the factor (a “level” in the design of experiments), a normal level that satisfies the test data specification A level generation step of generating an abnormal level that does not satisfy the test data specification, and storing the combination of the factor and the level in an execution path / level storage means corresponding to the execution path;
A combination of the factor, the level, and the execution path is acquired from the execution path / level storage means, and a combination including at least one abnormal level is generated as an abnormal input, and no abnormal level is included. generates a combination as a normal input, it obtains an expected value according to whether or not include post-conditions during the execution path, generates test data assigned with the expected value in the normal input or the abnormal input, the test data storage A test data generation step to be stored in the means;
An output step of reading the test data from the test data storage means and outputting it to the user terminal;
The test data generation method characterized by performing. The level generation step includes:
Based on a predetermined level generation rule according to any of the Boolean type, Enum type, Integer type, String type, and Object type of the test data specification, those that satisfy the rule are regarded as normal levels, and those that do not satisfy 4. The test data generation method according to claim 3, wherein the test data is generated as an abnormal level.   A test data generation program for causing a computer to function as each means constituting the test data generation device according to claim 1 or 2.

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