JP5042686B2 - Plasma processing equipment - Google Patents

Description

  The present invention stores an object to be processed such as a semiconductor wafer in a processing chamber, and introduces a processing gas whose flow rate is controlled by a gas flow controller into the processing chamber while the processing chamber is decompressed. The present invention relates to a plasma processing apparatus for performing an etching process or the like on the workpiece.

  A processing object which is a product such as a semiconductor wafer is stored in the processing chamber, and the processing chamber whose pressure is controlled by a gas flow controller is introduced into the processing chamber while the processing chamber is decompressed. In a plasma processing apparatus that performs processing such as etching on an object, its processing performance depends on the temperature and pressure of the processing chamber, the flow rate of the processing gas, and the like.

  Therefore, in order to make the processing performance uniform, the temperature and pressure of the processing chamber and the flow rate of the processing gas are controlled with high accuracy and kept uniform. In particular, as for the processing gas flow rate, a mixed gas obtained by mixing a plurality of gases at a predetermined gas flow rate ratio is controlled to a highly accurate gas flow rate and introduced into the processing chamber. Is used to control the flow rate with high accuracy. This gas flow rate controller has a sensor for measuring the gas flow rate and a flow rate control valve for controlling the gas flow rate to a set flow rate.

  The performance of the sensor and the gas flow control valve may change gradually with long-term use. In order to supply a stable gas flow over a long period of time, the performance of the sensor or the gas flow control valve is periodically controlled by a gas flow controller. It is necessary to check the correct gas flow rate by measuring the gas flow rate. Here, if the measured gas flow rate deviates more than the allowable error amount with respect to the set flow rate, it is necessary to replace or calibrate the gas flow rate controller.

  For example, in Patent Document 1, in order to diagnose the flow rate of the flow rate control device, for example, a process dedicated to flow rate diagnosis is provided when processing of the object to be processed is interrupted, for example, at the time of lot switching or device startup. Since the diagnosis must be performed and the throughput is reduced accordingly, the process gas is supplied into the chamber at a predetermined flow rate, and when the wafer W is processed in the chamber, the process gas is processed every time the wafer W is processed with the process gas. A method for diagnosing the flow rate of a fluid is disclosed.

  As a method for measuring the gas flow rate, a vessel having a known volume, such as the plasma processing chamber or the flow rate verification vessel, is sealed in a vacuum state and the flow rate is controlled by a gas flow rate controller. There is a method in which the gas flow rate is measured from the rate of pressure increase by measuring the pressure in the processing chamber while introducing the gas. Alternatively, there is a method of measuring by installing a flow rate measuring device on the gas flow path.

In this way, measure whether the gas flow rate controlled by the gas flow controller is correctly output according to the set flow rate, and replace or calibrate the gas flow controller when there is a defect. Called controller verification.
JP 2002-296096 A

  In the prior art method, the gas flow controller cannot be tested at the same time during product processing, and the product processing must be interrupted during the gas flow controller verification. Don't be. Therefore, the apparatus operating time is reduced by performing the verification of the gas flow controller. Some of the gas flow controllers are provided with 10 to 20 such gas flow controllers, and the number of gas flow controllers to be mounted on the plasma processing apparatus in order to cope with the diversified processing contents in recent years. Is increasing. As the number of gas flow controllers increases as described above, the time required for the verification of the gas flow controllers becomes longer, and the influence on the apparatus operating time becomes larger.

  In order to increase the operation time of the plasma processing apparatus, it is an object to shorten the time required for the verification of the gas flow rate controller. The object of the present invention is to reduce the apparatus operation time by performing the verification of the gas flow rate controller. It is to propose a plasma processing apparatus that minimizes the plasma processing apparatus.

The plasma processing apparatus of the present invention, a processing chamber disposed in a vacuum vessel, a vacuum exhaust device for vacuum to a predetermined pressure is disposed in communication with evacuated internal this process chamber into the processing chamber, this A low vacuum evacuation device that is arranged in communication with an exhaust path downstream of the high vacuum evacuation device and exhausts the gas from the high vacuum evacuation device, and a gas that adjusts the flow rate of the processing gas supplied into the processing chamber A plasma processing apparatus for processing a sample disposed in the processing chamber using plasma formed from the processing gas in the processing chamber, and connected to the gas flow rate controller. A gas flow rate measuring device that is disposed outside the processing chamber and verifies a gas flow rate from the gas flow rate controller, and a verification gas flow path in which the gas flow rate measuring device is disposed, and the exhaust path includes the gas flow rate measuring device. For testing Scan channel downstream end is connected to, due to the gas flow measuring device in the closed state of the exhaust from the high vacuum evacuation device by said processing the high vacuum evacuation device exhausted through the exhaust path of the chamber The test is performed intermittently with each other.

  According to the present invention, in the plasma processing apparatus, it is possible to minimize the decrease in the apparatus operating time due to the execution of the gas flow controller verification.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings.

1 to 6 are diagrams for explaining a first embodiment of the present invention.
FIG. 1 is a diagram showing an outline of the overall configuration of a plasma processing apparatus according to a first embodiment of the present invention. FIG. 1A is a cross-sectional view showing a schematic configuration of the plasma processing apparatus as viewed from above. FIG. 1B is a perspective view of the plasma processing apparatus.

  A plasma processing apparatus 100 according to the present embodiment shown in FIG. 1 is roughly provided with an atmosphere side block 101 and a vacuum side block 102. The atmosphere-side block 101 is a part for carrying, storing and positioning the wafer under atmospheric pressure, and the vacuum-side block 102 carries a substrate-like sample such as a wafer under a pressure reduced from the atmospheric pressure. The processing unit is a block that performs processing in the processing unit, and the pressure is increased and decreased between the atmospheric pressure and the vacuum pressure between the transporting and processing part and the atmosphere side block 101 with the sample inside. It has a part to let you.

  The atmosphere-side block 101 has a substantially rectangular parallelepiped housing 106 having an atmosphere-side transfer robot 109 inside, and is attached to the front side (right side in the figure) of the housing 106, and is a sample for processing or cleaning. Is provided with a plurality of cassette stands 107 on which cassettes are stored.

  The vacuum block 102 has a processing chamber in which the inside is decompressed and the sample is transported and processed around the side wall surface of the vacuum transport container 104 having a substantially polygonal shape (pentagonal shape in this embodiment). And four processing units 103 having vacuum containers, and two lock chambers 105 disposed between the vacuum transfer container 104 and the atmosphere side block 101 for exchanging samples between the atmosphere side and the vacuum side. . The vacuum block 102 is a processing unit that can be maintained at a high vacuum level by reducing the pressure.

  A vacuum transfer robot 108 that transfers a sample between the lock chamber 105 and the processing chamber in the processing unit 103 under vacuum is disposed in the center of the transfer chamber in the vacuum transfer container 104. A sample is placed on the arm of the vacuum transfer robot 108, and is carried in and out between the sample stage disposed in the processing chamber of each processing unit 103 and the sample stage in one of the lock chambers 105. . Between these processing units 103, the lock chamber 105, and the transfer chamber in the vacuum transfer container 104, a communication path is opened and closed by a valve that can be hermetically closed and opened.

  A control device that adjusts the operation of the vacuum processing apparatus 100 (not shown) determines a sample such as a plurality of semiconductor wafers stored in a cassette placed on any of the cassette tables 107, or the vacuum processing apparatus 100 In response to a command from a control device or the like of the production line to be installed, the processing is started. Upon receiving the command from the control device, the atmosphere-side transfer robot 109 takes out a specific sample in the cassette from the cassette and transfers it to one of the two lock chambers.

  In the lock chamber 105, the valve is closed and sealed in a state where the transferred sample is stored, and the pressure is reduced to a predetermined pressure. Thereafter, the valve facing the transfer chamber in the vacuum transfer container 104 is opened, the lock chamber 105 communicates with the transfer chamber, and the arm of the vacuum transfer robot 108 extends into the lock chamber 105, so Remove the sample. When the sample placed on the arm on the vacuum transfer robot 108 is taken out from the cassette, it is carried into a processing chamber that is evacuated in one of the predetermined processing units 103.

  After the sample is transferred to the processing chamber in any of the processing units 103, a valve that opens and shields between the processing chamber and the transfer chamber is closed to seal the processing chamber. Thereafter, a processing gas is introduced into the processing chamber, plasma is formed in the processing chamber, and the sample is processed.

  When it is detected that the processing of the sample has been completed, the valve is opened, and the vacuum transfer robot 108 carries out the sample toward the lock chamber 105, contrary to the case where the sample is carried into the processing chamber. When the sample is transported to any one of the lock chambers 105, the valve for opening and closing the passage connecting the lock chamber 105 and the transport chamber is closed and the inside is sealed, and the pressure in the lock chamber 105 is reduced to atmospheric pressure. Raised.

  Thereafter, the valve inside the housing 106 is opened, the lock chamber 105 communicates with the atmospheric transfer chamber in the housing 106, and the sample is transferred from the lock chamber 105 to the original cassette by the atmospheric transfer robot 109. Is returned to its original position in the cassette.

  FIG. 2 is a longitudinal sectional view showing an outline of the configuration of the processing unit 103 of the embodiment shown in FIG.

  In this figure, the processing unit 103 is configured to include a vacuum vessel, a radio wave source arranged above the vacuum vessel, and an exhaust device arranged below the vacuum vessel. The vacuum container includes a lid 201, a gas introduction ring 202, a gas diffusion plate 204, and a wall member 203 arranged at the top. The processing container forms a buffer chamber 217 and a plasma processing chamber 218 with the gas diffusion plate 204 as a boundary. Each of these components is hermetically connected by a sealing means such as an O-ring (not shown) so that the inner space and the outer space can be maintained at a high pressure difference.

  A sample stage 205 is installed inside the plasma processing chamber 218, and the sample W is loaded on the sample stage 205 and subjected to plasma processing.

  The plasma processing chamber 218 is evacuated by a high vacuum evacuation pump 206, which is an evacuation device connected to the lower portion of the wall member 203, and is maintained at a high degree of vacuum.

  The high vacuum exhaust pump 206 is inoperable when the back pressure (downstream pressure) is at atmospheric pressure, and cannot be used unless the back pressure is maintained below a specified pressure. Therefore, a low vacuum exhaust pump 215 is installed on the back pressure side of the high vacuum exhaust pump 206 so that the back pressure of the high vacuum exhaust pump 206 is less than a specified pressure. Operating while exhausting. The low vacuum exhaust pump 215 can operate even when the back pressure is atmospheric, and has sufficient exhaust performance to maintain the back pressure of the high vacuum exhaust pump 206 below a specified pressure. .

  After the plasma processing chamber 218 is evacuated to a high degree of vacuum by the high vacuum exhaust pump 206, the valve 211 is opened to introduce the processing gas whose flow rate is controlled by the gas flow rate controller 210 a or 210 b into the buffer chamber 217. The processing gas introduced into the buffer chamber 217 is introduced into the plasma processing chamber 218 by the gas diffusion plate 204 so as to have a uniform concentration distribution with respect to the sample W loading position.

  The processing gas introduced into the plasma processing chamber 218 is turned into plasma by high frequency electromagnetic waves excited by the high frequency power source 213 and the solenoid coil 209. A high frequency bias voltage is applied to the sample stage 205 by a high frequency bias power source 214, and the plasma ions are attracted to and collided with the sample W by electrostatic force, thereby chemically and physically subjecting the sample W to plasma processing.

  In this embodiment, two gas flow controllers 210a and 210b are mounted. The number of gas flow controllers mounted varies depending on the processing contents and specifications of the plasma processing apparatus, and 10 to 20 gas flow controllers are mounted in an example with a large number of mounted gas flow controllers.

  The gas flow rate controllers 210a and 210b have a function of outputting a flow rate with high accuracy with respect to the set flow rate. May occur, and the flow rate output may deviate beyond the reference value with respect to the set flow rate. Therefore, the gas flow controller is periodically verified.

  The verification of the gas flow rate controller shown in this embodiment is performed using the gas flow rate measuring device 219 with the valve 211 closed and the valve 212 opened. The gas flow rate measuring device 219 measures the gas controlled to the set flow rate by the target gas flow rate controller. If the result measured by the gas flow rate measuring device 219 with respect to the set flow rate deviates more than the allowable error amount, the gas flow rate controller is replaced or calibrated.

  By the way, in the plasma processing apparatus, reaction products may adhere to and accumulate on the wall member 203 and the gas diffusion plate 204 while the plasma processing is repeated. Such deposits may change the properties of the plasma and change the plasma processing performance, or the deposits may fall off somehow and fall on the sample, causing a decrease in yield. Therefore, the plasma processing apparatus periodically puts the inside of the processing chamber into an atmospheric pressure state, and cleans the internal components with alcohol or pure water, or replaces them with new components. Such a maintenance operation is called wet cleaning.

  The wet cleaning is performed while the high vacuum exhaust pump is operating. That is, in the state where the plasma processing chamber 218 is made high vacuum by the high vacuum exhaust pump 206, the valves (valve 220 and valve 208) before and after the high vacuum exhaust pump are closed to close the inside of the high vacuum exhaust pump. In a state where the pressure is kept at a high vacuum, the inside of the plasma processing chamber 218 is pressurized to an atmospheric pressure state, and wet cleaning is performed. This is because it takes a long time to shut down and start up the high vacuum exhaust pump, so that it takes less time to shut down and start up the high vacuum exhaust pump and shortens the non-operation time of the equipment. is there.

  Conventionally, the verification of the gas flow controller has been performed at the same time as the wet cleaning. After the plasma treatment of the product, the inside of the processing chamber is pressurized to atmospheric pressure to perform wet cleaning, and the inside of the processing chamber is evacuated to a high vacuum. After high vacuum evacuation of the inside of the processing chamber was completed, the gas flow controller was verified, and after the gas flow controller was verified, the plasma treatment of the product was started again.

  In the plasma processing apparatus shown in the embodiment of the present invention, the wet cleaning and the processing preparation in the processing chamber by evacuation of the plasma processing chamber after the wet cleaning and the verification of the gas flow rate controller are performed in parallel and in parallel. It is possible.

  A method for verifying the gas flow rate controller at the same time during wet cleaning will be described with reference to FIG. During the wet cleaning, the valve 211, the valve 220, and the valve 208 are closed. Therefore, the plasma processing apparatus is divided into a wet cleaning region 301, a high vacuum exhaust pump region 302, and a gas flow rate controller verification region 303.

  The wet cleaning area 301 is in an atmospheric pressure state during wet cleaning, and the lid 201 and the gas diffusion plate 204 can be removed to clean or replace the components inside.

  In the high vacuum exhaust pump region 302, the upstream side of the high vacuum exhaust pump 206 is maintained in a high vacuum state, and the downstream side is maintained at a pressure lower than an allowable pressure at which the high vacuum exhaust pump can operate. The vacuum exhaust pump 206 is in an operating state.

  In order to improve the gas flow rate measurement accuracy, the gas exhaust pipe used in the verification of the gas flow rate controller exhausts the gas remaining in the gas exhaust line before performing the verification of the gas flow rate controller. It is necessary to align the pipe internal conditions at the time of verification. In this embodiment, the verification region 303 of the gas flow rate controller is evacuated by the low vacuum exhaust pump 215 and is in a low vacuum state, and the gas flow rate controller can be verified.

  When performing the verification of the gas flow rate controller, the gas controlled to the set flow rate by the target gas flow rate controller (for example, the gas flow rate controller 210a) is allowed to flow with the valve 212 opened, and the flow rate is measured. Measure with the instrument 219. If the measurement result of the gas flow rate measuring device 219 deviates more than the allowable error amount compared to the set flow rate, the gas flow rate controller is replaced or calibrated.

  During the verification of the gas flow controller, since the gas of the set flow rate continues to flow, the pressure inside the gas pipe in the verification region 303 of the gas flow controller is lower than when the verification of the gas flow controller is not performed. It is rising. In particular, the pressure increase increases as the set flow rate is set to a larger flow rate. Therefore, if the gas flow rate controller is verified with the valve 208 open, the back pressure of the high vacuum exhaust pump may rise above the allowable pressure. Therefore, as described above, the valve 208 needs to be closed during the verification of the gas flow controller.

  When the wet cleaning is completed, as shown in FIG. 4A, the lid 201 and the gas diffusion plate 204 are attached, and the plasma processing chamber is started to be evacuated. The plasma processing chamber is evacuated by the high vacuum exhaust pump 206 with the valves 220 and 208 opened. The back pressure of the high vacuum exhaust pump 206 is evacuated by the low vacuum exhaust pump 215 and maintained at a pressure lower than the allowable pressure. The pressure in the plasma processing chamber gradually decreases with the exhaust time, and eventually reaches a substantially steady pressure. When the determination criteria necessary for starting the plasma processing are satisfied, the exhaust is terminated and the sample processing is started again.

  As a criterion for ending the exhaust of the plasma processing chamber and starting the processing of the sample, for example, the leak rate is measured and the leak rate measurement value is equal to or less than the reference value. The leak rate means that when the plasma processing chamber is sealed, the gas flow rate flowing from the outside to the inside of the processing chamber and the gas molecules adsorbed on the processing chamber wall member are separated and released to the plasma processing chamber. Represents the sum of gas flow rates. When measuring the leak rate, the valve 211 and the valve 220 are closed, and the pressure rise in the plasma processing chamber 218 is measured. Since the volume of the plasma processing chamber is known, the leak rate is measured.

  The time taken from the start of exhausting the plasma processing chamber after the completion of the wet cleaning until the leak rate becomes a reference value or less is the volume of the processing chamber, the surface area of the components constituting the processing chamber, and the like. Although it varies greatly depending on the material, the time of performing wet cleaning, etc., an exhaust time of about 3 to 12 hours is usually required.

  In this embodiment, the gas flow controller can be verified at the same time as the plasma processing chamber is exhausted.

  The verification of the gas flow controller is performed after the inside of the plasma processing chamber is exhausted and the leak rate becomes a reference value or less. In the present embodiment, the reference value for starting the verification of the gas flow rate controller is a leak rate of 1.0 Pa · L / s or less, and the reference leak rate is set so that the exhaust of the plasma processing chamber is terminated and the plasma processing can be started. It is 0.1 Pa · L / s or less. When the plasma processing chamber is evacuated and the processing chamber leak rate becomes 1.0 Pa · L / s or less, the valve 208 is closed and the valve 212 is closed, and the gas flow rate measuring device 219 is used to Perform the test. During this time, the valve 220 is opened and the valve 208 is closed. Therefore, the plasma processing chamber is exhausted by the high vacuum exhaust pump 206. However, since the valve 208 is closed and the gas exhausted from the processing chamber is stored in the tank 207, the pressure in the tank 207 increases with the exhaust time. In this embodiment, the capacity of the tank is 1.0L.

  In this embodiment, the tank 207 is installed in the volume between the high vacuum exhaust pump 206 and the valve 208. This tank is a large-diameter portion in which the inner diameter of the pipe line connecting the high vacuum exhaust pump 206 and the valve 208 is increased at a part of the tank, and can stay inside the exhaust port. As other shapes, for example, the high vacuum exhaust pump 206 and the valve 208 are connected by an exhaust pipe, and the pipe diameter and length are set so that the volume of the exhaust pipe is 1.0 L. The volume can have the same function as the tank. Conventionally, it has been considered that the pipe length from the high vacuum exhaust pump 206 is preferably shorter in consideration of the exhaust efficiency. In the present embodiment, a space having a volume to be retained and to have a high pressure is provided by a shape such as a pipe length and an inner diameter, and an arrangement of a detour.

  In this embodiment, the high vacuum exhaust pump 206 is a high vacuum exhaust pump having an operable back pressure of 200 Pa or less. The low vacuum exhaust pump 215 is a pump having an exhaust capability capable of exhausting to a pressure of at least about 10 Pa. In this embodiment, the high vacuum exhaust pump is operated so that the back pressure is 100 Pa or less.

  Assuming that the gas flow rate with a leak rate of 1.0 Pa · L / s, which is a reference value for starting the verification of the gas flow rate controller, is exhausted by the high vacuum exhaust pump 206 and all flows into the tank, The rate of pressure increase is 1.0 Pa / second, and the time required for the tank pressure to increase by 90 Pa is 90 seconds.

  That is, when the processing chamber 218 is evacuated with the valve 220 opened and the valve 208 closed, the tank 207 is 90 seconds later when the leak rate of the processing chamber 218 is 1.0 Pa · L / s. (The back pressure of the high vacuum exhaust pump) reaches 100 Pa, which is the use limit pressure.

  Therefore, when the leak rate of the processing chamber 218 is 1.0 Pa · L / s, the valve 208 is opened at least once every 90 seconds to exhaust the pressure of the tank 207 to about 10 Pa. The tank pressure can be maintained at 100 Pa or less even when the valve 208 is closed and the valve 208 is closed.

  Therefore, the gas flow rate controller is verified using the low vacuum side exhaust pump 215 while the valve 208 is closed. In the verification of the gas flow rate controller, the gas flow rate is measured at a plurality of set flow rates for each of a plurality of types of gas flow rate controllers. In the present embodiment, each gas flow rate controller measures the gas flow rate at five set flow rates. Since the plasma processing apparatus shown in the present embodiment is equipped with two gas flow rate controllers, the total number of gas flow rate measurements is 10.

  The flow rate measurement time of the gas flow rate measuring device 219 mounted in this embodiment is 60 seconds or less. While the valve 220 is opened and the valve 208 is closed, the plasma processing chamber 218 is evacuated by the high vacuum exhaust pump 206, and at the same time, the gas flow rate control is performed using the gas flow rate measuring device 219 and the low vacuum exhaust pump 215. Perform vessel verification. The time taken to measure the gas flow rate with the gas flow rate measuring device is 60 seconds or less, and the tank can be maintained at 100 Pa or less with the valve 208 closed when the plasma processing chamber leak rate is 1.0 Pa · L / s. Since the time is 90 seconds, the valve 208 is opened and the tank pressure is evacuated to about 10 Pa every time one flow measurement is completed, thereby evacuating the plasma processing chamber and verifying the gas flow controller. Can be implemented at the same time.

  In this embodiment, the leak rate, the tank capacity, etc. are set as described above. However, the optimum values may be set and used depending on the specifications of the plasma processing apparatus, the specifications of the flow rate measuring instrument, the operation method, etc. .

  However, if the tank pressure reaches a pressure of 200 Pa or higher due to an unexpected situation, the back pressure of the high vacuum exhaust pump may exceed the allowable pressure, and the high vacuum exhaust pump may be damaged. Therefore, a pressure gauge for measuring the pressure inside the tank 207 and the downstream side of the valve 208 is attached, and when the pressure gauge measurement value becomes 120 Pa, the verification of the gas flow controller is stopped and the gas flow controller Is set to zero and valve 219 is closed. After confirming that the pressure on the downstream side of the valve 208 is 100 Pa or less, the valve 208 is opened to exhaust the pressure inside the tank.

It is a figure showing the outline of the whole structure of the plasma processing apparatus which concerns on the 1st Example of this invention. It is a longitudinal cross-sectional view which shows the outline of a structure of the process unit of the Example shown in FIG. It is a longitudinal cross-sectional view which shows the outline of the state of the plasma processing apparatus when wet-cleaning the plasma processing container. It is a sequence diagram which shows the outline of the working method when carrying out the verification of the gas flow rate controller at the same time when wet cleaning the plasma processing container. It is a sequence diagram which shows the operation | work method at the time of carrying out the test | inspection of a gas flow rate controller simultaneously, when evacuating a plasma processing container. It is a timing chart figure which shows the working method when carrying out the verification of a gas flow rate controller simultaneously when evacuating a plasma processing container.

Explanation of symbols

DESCRIPTION OF SYMBOLS 101 Atmosphere side block 102 Vacuum side block 103 Processing chamber 104 Vacuum transfer container 105 Lock chamber 106 Case 107 Cassette 108 Vacuum transfer robot 109 Atmosphere transfer robot 201 Lid 202 Gas introduction ring 203 Wall member 204 Gas diffusion plate 205 Sample stand 206 High vacuum Exhaust pump 207 tank 208 valve 209 coil 210 gas flow rate controller 211 valve 212 valve 213 high frequency power source 214 high frequency bias power source 215 low vacuum exhaust pump 216 controller 217 buffer chamber 218 plasma processing chamber 219 gas flow rate measuring device 220 valve 221 heater 222 Pressure gauge 223 Pressure gauge 301 Wet cleaning area 302 High vacuum exhaust pump area 303 Gas flow controller verification area

Claims (6)

A processing chamber disposed in the vacuum chamber; a vacuum exhaust device disposed in communication with the processing chamber for exhausting the inside of the processing chamber to reduce the pressure to a predetermined pressure; and on the downstream side of the high vacuum exhaust device. A low-vacuum exhaust device that is arranged in communication with an exhaust path and exhausts gas from the high-vacuum exhaust device , and a gas flow rate controller that adjusts the flow rate of the processing gas supplied into the processing chamber, A plasma processing apparatus for processing a sample disposed in the processing chamber using plasma formed from the processing gas in the processing chamber,
A gas flow rate measuring device connected to the gas flow rate controller and arranged outside the processing chamber for verifying a gas flow rate from the gas flow rate controller, and a verification gas flow path in which the gas flow rate measurement device is placed; has a downstream end portion of the gas flow path for the test in the exhaust path is connected, the exhaust from the high vacuum evacuation device through the exhaust and the exhaust path in the processing chamber by the high vacuum evacuation system intermittently to perform the mutually test and by gas flow measuring device in the closed state plasma processing apparatus according to claim. 2. The plasma processing apparatus according to claim 1, wherein exhaust gas in the processing chamber from the high vacuum exhaust device and gas in the gas path for verification are supplied as gas to be supplied to the low vacuum exhaust device through the exhaust path. the plasma processing apparatus characterized by comprising a switching hands stage switching between the flowing. The plasma processing apparatus according to 請 Motomeko 2, and the switching means disposed on the exhaust path, wherein disposed on the exhaust passage gas for the test between the switching means and the high vacuum evacuation system And a space for retaining the gas exhausted from the high vacuum exhaust device in the exhaust path, which is closed during the verification by the gas flow rate measuring device during the flow of the gas in the flow path. A plasma processing apparatus. 4. The plasma processing apparatus according to claim 3, wherein a diameter of the exhaust path is increased in the space portion . 5. The plasma processing apparatus according to claim 4, wherein the space portion is configured by bending a plurality of pipe lines constituting the exhaust path. 6. The plasma processing apparatus according to claim 2 , wherein the high vacuum evacuation device is connected to a lower portion of the vacuum vessel, the floor surface on which the plasma processing device is installed, and the vacuum vessel. The plasma processing apparatus is disposed above a table that supports the vacuum vessel on the floor surface, and the switching means is disposed on the table .

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