JP5038963B2 - Spectroscopic optical system and spectrometer - Google Patents

Description

  The present invention relates to a spectroscopic optical system and a spectroscopic measurement apparatus, and more particularly to a technique effective when applied to a spectroscopic optical system and a spectroscopic measurement apparatus that perform broadband color correction by a Schupmann optical system arrangement using a refractive / diffractive lens. is there.

  In the defect detection of the sample surface structure, a difference in spectral reflectance is large, and spectroscopic measurement using a broadband wavelength in a DUV-UV (200 nm to 400 nm) region where the difference in structure is easy to grasp has become necessary. At this time, the lens system needs to be corrected for chromatic aberration when using a broadband wavelength and a plurality of wavelengths. For correcting chromatic aberration, there is a method using a reflective optical system or a refractive optical system.

In the reflection type optical system, a spectroscopic optical system for the ultraviolet region including a Schwarzschild type color correction lens system is described in Japanese Patent Laid-Open No. 2005-127830 (Patent Document 1). In the refraction type and the refraction / reflection type optical system, the number of lenses of the projection exposure lens is minimized, and the wavelengths of 157 nm and 193 nm for the purpose of high numerical aperture and wide field of view are configured in the target Schupmann optical system. An optical system is described in Japanese Patent Laid-Open No. 2001-221950 (Patent Document 2). In addition, in the refraction / diffractive optical system, a color correction lens system having a wavelength of 550 nm to 650 nm and a method for correcting the longitudinal chromatic aberration for the purpose of application to a broadband transmission alignment system for a stepper are disclosed in US Pat. No. 5,249,953. No. (Patent Document 3).
JP 2005-127830 A JP 2001-221950 A US Pat. No. 5,324,953

  The reflection type optical system described in Patent Document 1 that is of Schwarzschild type can perform broadband color correction. However, when spectroscopic measurement is performed with the optical system, it is necessary to configure the optical system so that it is in one direction with respect to the repetitive pattern on the sample with an opening. The reason for this is to prevent the spectral waveform from being greatly changed due to the difference in the incident angle with respect to the direction of the repetitive pattern and being unable to correspond to the spectral waveform held in the library which is a database of simulation spectral waveforms. .

  In the reflective optical system described in Patent Document 1, illumination on the sample surface is obliquely incident. The oblique illumination is not a problem when the sample surface is stationary, but becomes a problem when the entire sample surface is continuously scanned by moving the sample surface. FIG. 10 is a diagram illustrating a situation in which positional displacement occurs due to vertical vibration of the sample surface in the case of oblique incidence illumination. In FIG. 10, in the case of the oblique incidence illumination 1010, there is a problem that the sample surface oscillates up and down due to continuous scanning (samples 101 and 101 ′), and the scanning target position shifts (scanning target positions 1011 and 1012). .

  The refraction type and refraction / reflection type optical system described in Patent Document 2 including a Schupmann optical system having a wavelength of 157 nm and 193 nm for projection exposure includes an object-side imaging lens and its imaging surface. By installing a reflection-type field lens, vertical epi-illumination is possible. FIG. 11 is a diagram illustrating a situation in which the positional deviation due to vertical vibration of the sample surface is reduced in the case of vertical epi-illumination. In FIG. 11, in the case of vertical epi-illumination 1110, even if the sample surface oscillates up and down due to continuous scanning (samples 101 and 101 '), the displacement of the scanning target position becomes small (scanning target positions 1111 and 1112). However, the refractive and refractive / reflective optical systems described in Patent Document 2 are optical systems that support single wavelengths of 157 nm and 193 nm, and have a problem that they do not support broadband color correction.

  The refractive / diffractive optical system for a stepper wavelength 550 nm to 650 nm described in Patent Document 3 has an object-side imaging lens, a field lens on its imaging surface, and a relay lens behind it In addition, by providing the relay lens system with a diffractive lens, vertical epi-illumination and broadband color correction are possible. However, the refractive / diffractive optical system described in Patent Document 3 has a problem that it does not support broadband color correction in the DUV-UV (200 nm to 400 nm) region. In particular, in the broadband color correction in the DUV-UV region, usable glass materials are limited to synthetic quartz and fluorite. Therefore, it is difficult to configure the optical system to perform broadband color correction in the DUV-UV region. is there.

  Therefore, an object of the present invention is to enable the vertical epi-illumination 1110 shown in FIG. 11 by the spectroscopic optical system arranged in the Schupmann optical system using a refractive / diffractive lens, and to perform broadband color correction in the DUV-UV region. It is an object of the present invention to provide a spectroscopic optical system and a spectroscopic measurement apparatus that can perform the above. The above and other objects and novel features of the present invention will be apparent from the description of this specification and the accompanying drawings.

  Of the inventions disclosed in this application, the outline of typical ones will be briefly described as follows.

  A spectroscopic optical system according to a typical embodiment of the present invention is composed of a refractive / diffractive optical system so that vertical epi-illumination is possible, and is disposed on an imaging lens system and an imaging surface of the imaging lens system. Spectral optics with a field lens system and a Schupmann optical system with a relay lens system that forms an image of the field lens system on a spectroscope, and a diffractive lens in either the relay lens system or the imaging lens system In this system, the field lens system is composed of two or more lenses, and the lens is arranged at a predetermined distance from one of them.

  Among the inventions disclosed in the present application, effects obtained by typical ones will be briefly described as follows.

  According to a typical embodiment of the present invention, an imaging lens system, a field lens system disposed on an imaging surface of the imaging lens system, and a relay lens system that forms an image of the field lens system on a spectroscope By arranging with the Schupmann optical system, the lateral chromatic aberration can be corrected. In addition, either one of the relay lens system and the imaging lens system is provided with a diffractive lens, and the field lens system is composed of two or more lenses, and the lens is arranged at a predetermined distance from one of them. This makes it possible to correct longitudinal chromatic aberration. As a result, broadband color correction in the DUV-UV (200 nm to 400 nm) region is possible.

  In addition, according to the representative embodiment of the present invention, vertical epi-illumination is possible, and positional deviation due to defocusing, which is a problem in oblique incidence illumination of the conventional reflective optical system, is reduced. These enable high-precision spectroscopic measurement (structure and film thickness measurement, etc.).

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Note that components having the same function are denoted by the same reference symbols throughout the drawings for describing the embodiment, and the repetitive description thereof will be omitted.

  First, a spectroscopic optical system according to an embodiment of the present invention will be described with reference to FIGS. FIG. 1 is a diagram showing a configuration example of a spectroscopic optical system according to an embodiment of the present invention. The spectroscopic optical system includes an illumination optical system and a detection optical system.

  The illumination optical system includes a light source 110 that irradiates illumination light, a field stop 111, and a folding member 120. Further, the relay lens system 140 has a diffractive lens 130 and forms an image on the field stop 111. The image forming surface of the relay lens system 140 is composed of two or more refractive lenses, and a lens is set at a predetermined position in one of them. And a field lens system 150 that images the field lens system 150 on the sample 101. With this configuration, the illumination light emitted from the light source 110 is vertically reflected on the sample 101 on the stage via the relay lens system 140, the field lens system 150, and the imaging lens system 160.

  Similarly, the detection optical system includes an imaging lens system 160 in which specularly reflected light from the sample 101 on the stage forms an image of the sample 101, and two or more refractive lenses on the imaging surface of the imaging lens system 160. A field lens system 150 in which lenses are arranged at a predetermined distance apart from each other, and a relay lens system 140 having a diffractive lens 130 and imaging the field lens system 150 on a spectroscope 170; Have With this configuration, specularly reflected light from the sample 101 is received by the spectroscope 170 via the imaging lens system 160, the field lens system 150, and the relay lens system 140. Note that the sample surface of the sample 101 and the incident surface of the spectroscope 170 have a conjugate relationship.

  FIG. 2A is a perspective view schematically showing a patterned medium used as the sample 101. The patterned medium 200 is a recording medium in which magnetic particles are artificially regularly arranged on a disk. For example, the patterned medium 200 is a magnetic storage medium used in a hard disk device or the like. On the surface of the patterned medium 200, for example, there are a data unit 210 for writing user data and a servo unit 220 for tracking control and data access control including burst signals, addresses, preambles, and the like. In FIG. 2A, the arrangement of the data part 210 and the servo part 220 on the disk surface is schematically shown by lines.

  FIG. 2B is an enlarged plan view showing an example of the pattern of the data part 210 and the servo part 220 in the patterned medium 200 of FIG. In the servo unit 221 of FIG. 2B, the magnetic thin film pattern on the convex portion of the substrate subjected to the uneven processing corresponds to the servo pattern of the patterned medium 200. The servo unit 221 includes a burst signal 222 for performing tracking control. On the other hand, in the data portion 211, a magnetic thin film forming a continuous track in the circumferential direction is formed in a state separated by a concave portion. This type of patterned media 200 is called a discrete track media.

  Similarly, FIG. 2C is an enlarged plan view showing an example of the pattern of the data part 210 and the servo part 220 in the patterned medium 200 of FIG. In the data portion 212 of FIG. 2C, the magnetic thin film forming the data bit is formed in a state separated by the concave portion. This type of patterned media 200 is called bit patterned media.

  When illuminating the data part 210 with illumination light and detecting the spectral waveform to inspect the sample surface, if an illumination light spot is applied to the servo part 220, an accurate spectral waveform cannot be detected. In particular, in the case of oblique incidence illumination as shown in FIG. 10, when the entire surface of the data portion 210 of the patterned medium 200 is continuously scanned, the sample surface of the sample 101 oscillates up and down, and as a result, the scan target position 1011. Therefore, the possibility that the servo unit 220 is applied is increased.

  Hereinafter, a hard disk inspection apparatus which is an example of a spectroscopic measurement apparatus using the spectroscopic optical system of the present embodiment will be described. FIG. 3 is a diagram showing a configuration example of a hard disk inspection apparatus using the spectroscopic optical system of the present embodiment.

  The hard disk inspection apparatus includes a spectroscopic optical system 300 that irradiates a sample 101 with illumination light and spectrally detects specularly reflected light from the sample 101, and the sample 101 to be inspected, and performs spectroscopic analysis at an arbitrary position on the sample 101. A stage unit 310 that can move the position of the sample 101 relative to the spectroscopic optical system 300, a control unit 320 that controls the operation of the spectroscope 170 and the stage unit 310, and the spectroscope 170 so that detection is possible. And a data processing unit 330 that detects the shape or shape abnormality of the pattern formed on the sample 101 on the basis of the spectral waveform data detected in step (1).

  The spectroscopic optical system 300 has the same configuration as the spectroscopic optical system shown in FIG. At this time, if the position of the entrance of the spectroscope 170 is set as the image formation position, the size of the region to be spectrally detected in the sample 101 can be controlled by the size of the entrance. For example, when the size of the entrance is φ200 μm and the magnification on the image plane is 20 times, the size of the spectral detection region is φ10 μm on the inspection target disk (sample 101).

  As described above, when a wavelength near 200 nm is to be used, the applicable optical elements are limited. As the light source 110, a xenon lamp, a deuterium lamp, or the like that emits light having a wavelength of about 200 nm or more can be used. However, depending on the sample 101, sufficient performance may be exhibited even at a wavelength of about 400 nm or more. In that case, a light source 110 that emits infrared light from visible light such as a halogen lamp may be used.

  Next, the principle of chromatic aberration correction of the spectroscopic optical system 300 will be described with reference to FIGS. First, the principle of the Schupmann optical system for correcting lateral chromatic aberration will be described with reference to FIG. The Schupmann optical system for correcting lateral chromatic aberration is described in, for example, Abe Offner, "Field Lenses and Secondary Axial Aberration", Applied Optics, vol.8, No.8, pp.1735-1736, Aug.1969. . In the Schupmann optical system, as shown in FIG. 4, an object 401 forms an imaging lens 460 that forms an image of the sample 101 (object 401), a field lens 450 disposed on the imaging surface of the imaging lens 460, and a field lens. The image is formed on the image surface 402 via the relay lens 440 that forms an image 450 on the image surface 402.

  As shown in FIG. 4A, the principal ray 403 passes through the center of the imaging lens 460, the edge of the field lens 450, and the center of the relay lens 440, and forms an image on the image plane 402. Also, as shown in FIG. 4B, the peripheral ray 404 passes through the edge of the imaging lens 460, the center of the field lens 450, and the edge of the relay lens 440. Therefore, the lateral chromatic aberration correction can be expressed by the following equation.

_{Here, v 1, v 2, v} 3, φ 1, φ 2, φ 3, h p, 1, h p, 2, h p, 3, h m, 1, h m, 2, h m, 3 Are the Abbe number, refractive power, image height of principal ray 403, and image height of peripheral ray 404, respectively, of imaging lens 460, field lens 450, and relay lens 440.

The image heights of the principal rays 403 of the imaging lens 460, the field lens 450, and the relay lens 440 are h _{p, 1} = 0, h _{p, 2} ≠ 0, h _{p, 3} = 0, respectively. Further, as shown in FIG. 4B, the image heights of the peripheral ray 404 of the imaging lens 460, the field lens 450, and the relay lens 440 are hm _{, 1} ≠ 0, hm _{, 2} = 0, hm _{, 3} ≠ 0. As described above, Equation (1) is satisfied unconditionally, and thus the lateral chromatic aberration is automatically corrected in the Schupmann optical system.

  On the other hand, correction of longitudinal chromatic aberration is expressed by the following equation.

Here, the image heights of the peripheral ray 404 of the imaging lens 460, the field lens 450, and the relay lens 440 are hm _{, 1} ≠ 0, hm _{, 2} = 0, hm _{, 3} ≠ 0, respectively. The two formulas are as follows.

Here, the image heights hm _{, 1} , hm _{, 3} of the peripheral rays 404 of the imaging lens 460 and the relay lens 440 are the distance B between the imaging lens 460 and the field lens 450, and the field lens 450 and the relay lens 440. Therefore, the following equation is established.

Further, the refractive powers φ ₁ and φ ₃ of the imaging lens 460 and the relay lens 440 are expressed by a refractive index n (λ) and a radius of curvature r as in the following equations.

Furthermore, the Abbe numbers v ₁ and v ₃ of the imaging lens 460 and the relay lens 440 are expressed by the following formula from the formula 5.

  By substituting Equation 4 and Equation 6 into Equation 3, the following equation can be obtained for correction of longitudinal chromatic aberration.

  When the Schupmann optical system is used, Equation 1 is automatically established as described above, and lateral chromatic aberration is automatically corrected. Therefore, an optical system that satisfies Equation 7 for correcting longitudinal chromatic aberration will be examined.

Here, the refractive power depends on the refractive index of the lens. FIG. 5 is a diagram showing an example of the refractive power characteristic of the lens with respect to the wavelength. In order for Formula 7 to hold, as shown in FIG. 5, the imaging lens 460 has a theoretical curve 501 with a larger refractive power φ ₁ (λ) as the wavelength is shorter, while the relay lens 440 is as the longer wavelength. It is necessary to have a theoretical curve 502 with a large refractive power φ ₃ (λ). Alternatively, it is necessary that the relay lens 440 has a theoretical curve 501 of larger refractive power φ ₁ (λ) as the shorter wavelength, while the imaging lens 460 has a theoretical curve 502 of larger refractive power φ ₃ (λ) as the longer wavelength. There is.

  Therefore, it is necessary to examine a lens having a refractive power characteristic opposite to the wavelength. FIG. 6 is a diagram showing refractive power characteristics with respect to wavelengths of the refractive lens 610 and the diffractive lens 620. In the case of the refractive lens 610 shown in FIG. 6A, the focal length of the short wavelength 611 is short and the focal length of the long wavelength 612 is long. On the other hand, in the case of the diffractive lens 620 shown in FIG. 6B, the focal length of the short wavelength 621 is long and the focal length of the long wavelength 622 is short. That is, the refractive lens 610 and the diffractive lens 620 have opposite refractive power characteristics with respect to the wavelength.

  Therefore, Formula 7 can be established by a hybrid lens in which the refractive lens 610 and the diffractive lens 620 are combined. In the spectroscopic optical system 300 of the present embodiment, a refractive lens is used for the imaging lens system 160, and a diffractive lens 130 is used for the relay lens system 140 in addition to the refractive lens, thereby forming a hybrid lens configuration. . As described above, since the diffractive lens 130 only needs to be included in one of the relay lens system 140 and the imaging lens system 160, a refractive lens is used for the relay lens system 140, and the imaging lens is used. The system 160 may have a diffractive lens 130.

  However, even if the above hybrid lens is used, it is difficult to actually establish Equation 7 completely, and even though the longitudinal chromatic aberration on the left side of Equation 3 can be brought close to 0, it should be completely zero. Is difficult. Therefore, in the spectroscopic optical system 300 of the present embodiment, as shown in FIGS. 1 and 3, the lens of the field lens system 150 is composed of two or more lenses, and the lens is placed at a predetermined distance at one of the lenses. Place them apart.

  FIG. 7 shows a lens interval (horizontal axis) when two lenses of the field lens system 150 are arranged at an interval, and a color shift (vertical) of a wavelength in the DUV-UV (200 nm to 400 nm) region on the illumination field of view. It is the figure which showed what computed the relationship with an axis | shaft. Since the color shift is evaluated with respect to the rotation direction (θ) of the patterned medium 200, the axis parallel to the rotation direction is taken as the X axis, and the detected visual field shift in the X axis direction is used as an index. Here, the overall color shift can be obtained from the following equation.

Here, Δx is the color shift (%) of each wavelength, Max. (X _λ ) is the maximum width of color shifts at each wavelength λ, and Min. (X _λ ) is the minimum width of color shifts of each wavelength λ, and Ave. (X _λ ) represents the average width of color shifts at each wavelength λ. At this time, the color shift of the wavelength is divided by 2 in order to evaluate on one side.

  As shown in FIG. 7, it can be seen that when the lens interval of the field lens system 150 is between 10 mm and 30 mm, particularly between 20 mm and 25 mm, the color shift of the wavelength in the DUV-UV region becomes small. Thus, the lens of the field lens system 150 is composed of two or more lenses, and at one of the lenses, the lenses are arranged at an interval that minimizes the color shift of the wavelength in the DUV-UV region on the illumination field. This makes it possible to correct longitudinal chromatic aberration in the DUV-UV region.

  As described above, in the spectroscopic optical system 300 of the present embodiment, the relay lens system 140 includes the diffractive lens 130 as shown in FIGS. Therefore, a general diffractive lens design method will be described below. FIG. 8 is a diagram illustrating an example of the structure of a diffractive lens. In FIG. 8, in the diffractive lenses 810 and 820, the continuous paraboloid of the spherical surface 811 shown in FIG. 8A or the aspherical surface 821 shown in FIG. By subtracting (a multiple of 2π), a undulating shape having a discontinuous phase distribution is formed.

The details will be described below by taking the diffractive lens 810 of FIG. 8A as an example. Maximum optical path difference of each ring-shaped zone of the diffractive lens 810 shown in FIG. 8 (a) is 1 wavelength, m-th ring zone radius r _m is expressed by the following equation.

Here, λ ₀ represents the design wavelength, and f represents the focal length. At this time, the thickness d of the diffractive lens 810 is expressed by the following equation.

Here, λ ₀ is the design wavelength, and n is the refractive index of the diffractive lens. The shape of the diffractive lens 810 can be designed by giving parameters of the design wavelength λ ₀ , the focal length f, and the refractive index n according to the equations (9) and (10).

  Finally, the stage unit 310, the control unit 320, and the data processing unit 330 in the hard disk inspection device of the present embodiment will be described. In FIG. 3, a stage unit 310 includes an X stage 311 that moves in a direction parallel to the sample surface of the sample 101, a Z stage 312 that moves in a direction perpendicular to the sample surface of the sample 101, and a disk (patterned media) of the sample 101. 200) is rotated by a θ stage 313. The Z stage 312 is for moving the sample 101 to the focus position of the spectroscopic optical system 300, and the X stage 311 and the θ stage 313 move the spectroscopic optical system 300 to an arbitrary position on the sample surface of the sample 101. Is for.

  As a method of moving the spectroscopic optical system 300 to an arbitrary position on the sample surface of the sample 101, a method using an XY stage is also conceivable. However, the sample 101 is a disk, and the pattern on the sample surface is formed concentrically or concentrically. Therefore, the Xθ stage is more suitable. Furthermore, when the purpose is to inspect the entire surface of the disk at high speed, the Xθ stage is more suitable than the XY stage because the operation is simpler. Therefore, the hard disk inspection apparatus according to the present embodiment adopts the Xθ stage configuration of the X stage 311 and the θ stage 313.

  FIG. 9 is a diagram illustrating an outline of processing in the data processing unit 330. The data processing unit 330 roughly executes the following two processes. One is calculation of spectral reflectance, and the other is pattern shape / defect detection processing. As described above, in the hard disk inspection device of the present embodiment, the pattern shape / defect of the sample 101 is detected based on the spectral reflectance on the surface of the sample 101.

  The spectral optical system 300 can detect the spectral intensity distribution on the surface of the sample 101. Therefore, an optical simulation is performed on the sample 101 having different pattern shapes 910 in advance, and the calculated wavelength dependence graph 920 of the spectral reflectance is stored in the database 940. Next, illumination light from the light source 110 is irradiated through the spectroscopic optical system 300 onto the sample surface of the sample 101 on which the pattern is repeatedly formed, and specular reflection light from the sample surface is received by the spectroscope 170.

  The data processing unit 330 obtains a wavelength dependence graph 930 of the spectral reflectance based on the spectral intensity distribution detected by the spectroscope 170. Finally, from the wavelength dependence graph 920 of the spectral reflectance calculated by optical simulation stored in the database 940, an approximation to the wavelength dependence graph 930 of the spectral reflectance obtained by measurement, By selecting the spectral reflectance waveform comparison 950, the shape of the sample surface of the sample 101 can be specified.

  As described above, according to the spectroscopic optical system 300 of the present embodiment, the imaging lens system 160 composed of a refractive lens, the field lens system 150 arranged on the imaging surface of the imaging lens system 160, By arranging the field lens system 150 as the Schupmann optical system of the relay lens system 140 that forms an image on the spectroscope 170, it is possible to correct lateral chromatic aberration. In addition, the relay lens system 140 includes a diffractive lens 130, and the field lens system 150 is composed of two or more lenses, and the lens is arranged at a predetermined distance from one of them, thereby correcting longitudinal chromatic aberration. This makes it possible to perform broadband color correction of wavelengths in the DUV-UV region.

  In addition, the vertical epi-illumination reduces the positional shift due to defocus, which is a problem in the oblique incidence illumination of the reflective optical system. Further, the broadband color correction makes the illumination position for each wavelength coincide and enables high-precision spectroscopic measurement (structure, film thickness measurement, etc.).

  As mentioned above, the invention made by the present inventor has been specifically described based on the embodiment. However, the present invention is not limited to the embodiment, and various modifications can be made without departing from the scope of the invention. Needless to say.

  For example, the spectroscopic optical system 300 and the spectroscopic measurement apparatus according to the present embodiment are configured to detect the pattern shape / defect on the surface of the patterned medium 200 by spectroscopic measurement. Not limited to the sample 101 having a structure or pattern on the surface, the structure can be detected by spectral reflectance matching in the data processing unit 330. Further, the present invention can be used not only for the structure of the surface of the sample 101 but also for measuring the thickness of a thin film by spectroscopic measurement.

  The spectroscopic optical system and spectroscopic measurement apparatus according to the present invention can be used in a spectroscopic optical system and a spectroscopic measurement apparatus that perform broadband color correction using a Schupmann optical system arrangement using a refractive / diffractive lens.

It is the figure which showed the structural example of the spectroscopic optical system which is one embodiment of this invention. (A) is the perspective view which showed typically the patterned media used as a sample in one embodiment of this invention, (b), (c) is the pattern of the data part and servo part in patterned media It is the top view which expanded and showed the example. It is the figure which showed the structural example of the hard disk test | inspection apparatus using the spectroscopic optical system which is one embodiment of this invention. It is a figure explaining the principle of the Schupmann optical system which corrects lateral chromatic aberration. It is the figure which showed the example of the refractive power characteristic of the lens with respect to a wavelength. It is the figure which showed the refractive power characteristic with respect to the wavelength of a refraction type lens and a diffraction type lens. What calculated the relationship between the lens space | interval when arrange | positioning two lenses of the field lens system in one embodiment of this invention at intervals, and the color shift of the wavelength of 200 nm-400 nm area | region on an illumination visual field. FIG. It is a figure which shows the example of the structure of a diffraction type lens. It is the figure explaining the outline | summary of the process in the data processing part in one embodiment of this invention. It is a figure which shows the condition where position shift generate | occur | produces by the vertical vibration of a sample surface in the case of oblique incidence illumination. It is a figure which shows the condition where the position shift by the vertical vibration of a sample surface is reduced in the case of vertical epi-illumination.

Explanation of symbols

DESCRIPTION OF SYMBOLS 101, 101 '... Sample, 110 ... Light source, 111 ... Field stop, 120 ... Folding member, 130 ... Diffractive lens, 140 ... Relay lens system, 150 ... Field lens system, 160 ... Imaging lens system, 170 ... Spectroscope ,
200 ... Patterned media, 210-212 ... Data part, 220-221 ... Servo part, 222 ... Burst signal,
300 ... Spectral optical system, 310 ... Stage unit, 311 ... X stage, 312 ... Z stage, 313 ... θ stage, 320 ... Control unit, 330 ... Data processing unit,
401 ... Object, 402 ... Image plane, 403 ... Main ray, 404 ... Edge ray, 440 ... Relay lens, 450 ... Field lens, 460 ... Imaging lens,
501 to 502: theoretical curve of refractive power,
610: refractive lens, 611: short wavelength, 612: long wavelength, 620: diffractive lens, 621: short wavelength, 622: long wavelength,
810 ... Diffraction type lens, 811 ... Spherical surface, 820 ... Diffraction type lens, 821 ... Aspherical surface,
910 ... Pattern shape, 920, 930 ... Wavelength dependence graph of spectral reflectance, 940 ... Database, 950 ... Waveform comparison of spectral reflectance,
1010 ... Oblique incident illumination, 1011 to 1012 ... Scan target position,
1110: Vertical epi-illumination, 1111-1112: Scanning target position.

Claims (8)

A light source, a field stop, a relay lens system that forms an image on the field stop, a field lens system that is disposed on an image forming surface of the relay lens system, and an imaging lens that forms an image on the field lens system on a sample A system and a spectroscope for spectroscopically analyzing specularly reflected light from the sample,
The relay lens system, the field lens system, and the imaging lens system are arranged in a Schupmann optical system using a refractive lens and / or a diffractive lens, and one of the relay lens system and the imaging lens system A spectroscopic optical system having a diffractive lens,
The field lens system is composed of two or more lenses, and at one of the lenses, the lenses are arranged at a distance that minimizes the color shift in the wavelength region of the light source. Optical system. The spectroscopic optical system according to claim 1,
The spectroscopic optical system, wherein the field lens system and the imaging lens system are configured by a refractive lens, and the relay lens system is configured by a refractive lens and a diffractive lens. The spectroscopic optical system according to claim 1,
The spectroscopic optical system, wherein the light source emits light in a 200 nm to 400 nm region. In the spectroscopic optical system according to claim 3,
The spectral optical system characterized in that the distance that minimizes the color shift in the wavelength region of the light source is 10 mm to 30 mm. The spectroscopic optical system according to claim 1;
A stage portion on which a sample is mounted and the position of the sample can be moved relative to the spectroscopic optical system;
A control unit for controlling the operation of the spectroscope and the stage unit in the spectroscopic optical system;
A spectroscopic measurement apparatus comprising: a data processing unit that detects a shape or shape abnormality of a pattern formed on the sample based on a spectral intensity distribution detected by the spectroscope. The spectrometer according to claim 5, wherein
The spectroscopic measurement apparatus, wherein the stage unit moves the sample so that the entire surface of the sample is continuously scanned by the spectroscopic optical system. The spectrometer according to claim 5, wherein
The spectroscopic measurement apparatus, wherein the sample is a patterned medium. The spectrometer according to claim 5, wherein
The data processing unit has a database for storing a graph of wavelength dependence of spectral reflectance calculated in advance for different pattern shapes in the sample,
Based on the spectral intensity distribution detected in the spectroscope, obtain a graph of the wavelength dependence of the spectral reflectance measured for the sample,
By selecting, from the spectral dependence graph stored in the database, the one that approximates the spectral dependence graph measured for the sample by comparing the spectral reflectance waveforms. A spectroscopic measurement device that identifies a pattern shape formed on the sample.

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