JP4954950B2 - Repair method for electronic parts using solder - Google Patents

Repair method for electronic parts using solder Download PDF

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JP4954950B2
JP4954950B2 JP2008178915A JP2008178915A JP4954950B2 JP 4954950 B2 JP4954950 B2 JP 4954950B2 JP 2008178915 A JP2008178915 A JP 2008178915A JP 2008178915 A JP2008178915 A JP 2008178915A JP 4954950 B2 JP4954950 B2 JP 4954950B2
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solder
melting
hole
lead
electronic component
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JP2010021249A (en
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敏男 佐伯
仁之 常深
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Toyo Machinery and Metal Co Ltd
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Description

本発明は、欠陥等のある電子部品を回路基板から取り外した際、代替えの電子部品を容易に搭載することが可能な半田による電子部品のリペア工法に関する。   The present invention relates to a method of repairing an electronic component using solder that can easily mount an alternative electronic component when a defective electronic component is removed from a circuit board.

工作機や電子機器等には、通常、電子部品の実装された回路基板が備えられている。こうした回路基板には、回路を構成する各種電子部品が半田により接続されているが、回路基板に対する電子部品の半田接続に欠陥があった場合や、回路基板に実装した電子部品が故障している場合には、回路基板に実装されている電子部品を交換するためにリペア作業が必要となる。   Machine tools, electronic devices, and the like are usually provided with a circuit board on which electronic components are mounted. Various electronic components that make up the circuit are connected to such a circuit board by soldering. However, if the electronic component has a defective solder connection to the circuit board, or the electronic component mounted on the circuit board has failed. In some cases, a repair work is required to replace the electronic component mounted on the circuit board.

ところで、従来から用いられている半田は、鉛を含有するものがほとんどであり、例えば、鉛を含みSnとPbが主成分であるSn−Pb系の合金たる半田は、その性質として、融点が比較的低く加工性に優れ、さらには、ぬれ性、耐熱疲労性もよく、コストも安価であることから、古くから多用されてきた。しかし、近年においては、Sn−Pb系などの鉛の添着された回路基板が土壌に廃棄されることが原因となり、酸性雨などによって回路基板から鉛が土壌へと溶け出し、河川などに流れだすことで環境汚染が広がり、ひいては、飲料水にも混入するなどして人体に害を及ぼす虞があり好適ではない。また、地球環境の保護への関心も高まってきており、諸外国(EUのおけるRoHS規制)や日本国内においても、半田に鉛を用いない鉛フリー化の法律規制が整備されてきている。   By the way, most of the solders conventionally used contain lead. For example, a Sn-Pb alloy containing lead and containing Sn and Pb as main components has a melting point as a property thereof. It has been widely used since ancient times because it is relatively low and excellent in workability, and also has good wettability and heat fatigue resistance and is inexpensive. In recent years, however, lead-added circuit boards such as Sn—Pb are discarded in the soil, and lead is dissolved from the circuit boards into the soil by acid rain and flows into rivers. As a result, environmental pollution spreads and, in turn, it may be mixed with drinking water and harm the human body. In addition, interest in protection of the global environment has been increasing, and in other countries (RoHS regulations in the EU) and in Japan, laws and regulations for lead-free soldering that does not use lead for solder have been established.

図5の(a)〜(h)は、近年採用されている欠陥のあった電子部品を交換する際のリペア工程を示す説明図であり、同図に基づき説明すると、100は回路基板、101は回路基板に形成したスルーホール、102はスルーホールの周囲に設けた銅箔のランド、103はSn−Ag−Cu系の鉛フリー半田(無鉛半田)により半田接続された電子部品のリード(足)、104はSn−Ag−Cu系の溶融半田が投入されている半田槽、105は溶融された半田を取り除くための半田吸取り機であり、電子部品のリード(足)103は、スルーホール101に挿通され、Sn−Ag−Cu系の鉛フリー半田によりランド102に接続されている。そして、前述した欠陥等に伴い電子部品を交換する際においては、溶融したSn−Ag−Cu系の溶融半田が入れてある半田槽104にリード103の下端側を浸漬し(a)、その浸漬を維持することにより半田槽104の熱がスルーホール101内の固定半田に伝達されると、リード103を固定している固定半田は溶融されていき(b)、固定半田の溶融が完了した時に回路基板100から電子部品を取り外すために上方に持ち上げると(c)、スルーホール内のリード103を取り外した部位にも溶融半田が満たされ(d)、半田槽104から回路基板100を分離すると、スルーホール内に介在する溶融半田が冷却され凝固した際は(e)、凝固化した半田を加熱溶融した状態で半田吸取り機105にてスルーホール101内の溶融半田を吸引し(f)、このスルーホール101内における溶融半田を全て除去する(g)。こうした近年のリペア工程においては、半田としてSn−Ag−Cu系の半田を用いており、従来多く用いられていたSn−Pb系の半田の融点が183℃であるのに対し、Sn−Ag−Cu系の半田は、217〜219℃と高融点であることから、高温の熱がスルーホール101の周面に有するランド102に伝達すると、ランドが剥離する等、の回路基板100及びそのランド102に品質劣化が生じてしまう(g)。また、こうした品質の劣化した回路基板102などに対し、入れ替え用の電子部品のリードを半田付けするとなると、熱衝撃がランド102等に加わることになり、益々品質が悪いものとなってしまう(h)。   FIGS. 5A to 5H are explanatory views showing a repair process when replacing a defective electronic component that has been adopted in recent years. Based on this figure, 100 is a circuit board, 101 Is a through hole formed in the circuit board, 102 is a land of copper foil provided around the through hole, and 103 is a lead (foot) of an electronic component soldered by Sn-Ag-Cu lead-free solder (lead-free solder) ), 104 is a solder bath in which Sn—Ag—Cu-based molten solder is introduced, 105 is a solder sucker for removing the melted solder, and a lead (foot) 103 of the electronic component is a through hole 101. And is connected to the land 102 by Sn-Ag-Cu-based lead-free solder. Then, when replacing an electronic component due to the above-described defects or the like, the lower end side of the lead 103 is immersed in a solder bath 104 in which molten Sn—Ag—Cu-based molten solder is placed (a), and the immersion is performed. When the heat of the solder bath 104 is transmitted to the fixed solder in the through hole 101 by maintaining the above, the fixed solder fixing the lead 103 is melted (b), and when the melting of the fixed solder is completed When the electronic component is lifted upward in order to remove the electronic component from the circuit board 100 (c), the molten solder is also filled in the part where the lead 103 in the through hole is removed (d), and when the circuit board 100 is separated from the solder bath 104, When the molten solder present in the through hole is cooled and solidified (e), the solder in the through hole 101 is melted by the solder sucker 105 while the solidified solder is heated and melted. Field with suction (f), to remove any molten solder in the through hole 101 (g). In these recent repair processes, Sn—Ag—Cu solder is used as the solder, and the Sn—Pb solder that has been widely used has a melting point of 183 ° C., whereas Sn—Ag— Since the Cu-based solder has a high melting point of 217 to 219 ° C., when the high-temperature heat is transmitted to the land 102 provided on the peripheral surface of the through hole 101, the circuit board 100 and the land 102 are separated. Quality degradation will occur (g). Further, when the lead of the electronic component for replacement is soldered to the circuit board 102 or the like having such a deteriorated quality, a thermal shock is applied to the land 102 or the like, and the quality becomes worse (h). ).

上述したリペア工程の技術に関連するものとして、特許文献1には、プリント基板に実装した電子部品や、プリント基板と電子部品との半田接続部に欠陥等がある場合において、欠陥を有する電子部品を新たな電子部品に交換するに際し、半田接続部をランドから容易に剥離できるようにする技術が提案されており、また、特許文献2には、半導体装置を基板から分離する際、その半田接続部に半田残渣が生じないようにするため、半導体装置と基板とを接続している半田接続部にホットエアーを噴射することで、溶融された半田を取り除く半導体装置のリペア方法が提案されている。   As related to the above-described repair process technology, Patent Document 1 discloses an electronic component having a defect in a case where there is a defect or the like in an electronic component mounted on a printed circuit board or a solder connection portion between the printed circuit board and the electronic component. When replacing the semiconductor device with a new electronic component, there has been proposed a technique for easily separating the solder connection portion from the land, and Patent Document 2 discloses the solder connection when separating the semiconductor device from the substrate. In order to prevent a solder residue from being generated in a portion, a semiconductor device repair method for removing molten solder by injecting hot air into a solder connection portion connecting a semiconductor device and a substrate has been proposed. .

特開2006−179556号公報JP 2006-179556 A 特開2002−353610号公報JP 2002-353610 A

前述したリペア作業を行う際には、回路基板に半田付けされている不具体のある電子部品を取り外すため、半田接続部を加熱溶融して取り外すことになるが、電子部品を取り外した回路基板においては、電子部品を接続していた半田が回路基板に半田残渣として残ってしまうことから、故障した電子部品を新たに取り付けるに際し、半田残渣が邪魔となり電子部品を所定位置に取り付けることに困難をきたすことがあることから、回路基板のスルーホール内に残渣した半田をきれいに除去する作業が必要となる。   When performing the above-mentioned repair work, in order to remove an unspecified electronic component that is soldered to the circuit board, the solder connection part is heated and melted, but in the circuit board from which the electronic component has been removed, The solder that has connected the electronic component remains as a solder residue on the circuit board. Therefore, when newly attaching a failed electronic component, the solder residue becomes an obstacle and makes it difficult to install the electronic component in place. Therefore, it is necessary to cleanly remove the solder remaining in the through holes of the circuit board.

また、従来のように半田としてSn−Pb系の有鉛半田を用いてリペア作業を行っていた場合には、半田の融点は低かったことから、回路基板に取り付けられた電子部品の取り外しや取り付けを行う際、半田接続部の近傍に配置されている電子部品や回路基板等への熱影響を、多少なりとも抑えることは可能ではあったが、図5に基づき説明したリペア工法のように、鉛フリー半田として汎用性のあるSn−Ag−Cu系の半田を用いてリペア工法を行う際には、Sn−Pb系の有鉛半田よりも融点が高いので、電子部品の取り外しから取り付けまでを行うリペア作業に困難をきたし、さらに融点が高いので回路基板への熱印加量や熱衝撃等の熱影響が大きく、回路基板に破損や熱劣化の虞があり、また、前述した特許文献2等のように、半導体装置などの電子部品と基板とを接続している半田接続部にエアーを噴射し溶融された半田を除去する場合には、除去する半田の融点と同程度若しくはそれよりも温度が高めなホットエアーを噴射しなければならないことから、ホットエアーからの熱印加量が大きく、このホットエアーの熱で回路基板や周辺の電子部品が破損する懸念もある。   Further, when repair work is performed using Sn-Pb leaded solder as the solder as in the past, the melting point of the solder was low, so that the electronic components attached to the circuit board were removed or attached. Although it was possible to suppress the thermal effect on the electronic components and circuit boards arranged in the vicinity of the solder connection part to some extent, like the repair method explained based on FIG. When performing a repair method using a general-purpose Sn-Ag-Cu solder as a lead-free solder, the melting point is higher than that of Sn-Pb leaded solder. The repair work to be performed is difficult, and since the melting point is high, the heat effect such as the amount of heat applied to the circuit board and the thermal shock is large, and there is a risk of the circuit board being damaged or thermally deteriorated. Like, half When removing the molten solder by spraying air onto the solder connection part that connects the electronic device such as a body device and the board, the hot temperature is about the same as or higher than the melting point of the solder to be removed. Since air must be injected, the amount of heat applied from the hot air is large, and there is a concern that the circuit board and surrounding electronic components may be damaged by the heat of the hot air.

本発明は、上記課題に鑑みてなされたものであり、回路基板に実装された欠陥等のある電子部品を取り外して入れ替える際、回路基板等への熱影響を可及的に防止することができると共に、代替えの電子部品への交換作業を容易に行うことができる半田による電子部品のリペア工法を提供することを目的とする。   The present invention has been made in view of the above problems, and when removing and replacing an electronic component having a defect or the like mounted on a circuit board, it is possible to prevent the thermal influence on the circuit board or the like as much as possible. At the same time, it is an object of the present invention to provide a method for repairing an electronic component using solder that can easily be replaced with an alternative electronic component.

請求項1に係る半田による電子部品のリペア工法は、回路基板に形成したスルーホール内に電子部品のリードを挿通し、該挿通したリードを前記スルーホールに設けたランドに対し固定半田を介して接続して取付けた後、故障・欠陥等に伴い前記電子部品を交換するに際して、前記故障・欠陥等の電子部品を交換するために前記ランドに前記固定半田により接続した当該故障・欠陥等の電子部品を、前記固定半田を溶融した状態で取り外し入れ替えを行う電子部品のリペア工法であって、前記故障・欠陥等の電子部品のリードと該リードを前記ランドに接続している前記固定半田とを、該固定半田より低融点の半田が溶融された低融点半田槽に浸漬し、前記ランドに前記リードを半田接続してい前記固定半田を加熱溶融する浸漬加熱溶融工程と、該浸漬加熱溶融工程で前記低融点半田槽の熱により前記固定半田を溶融した後に、前記ランドに半田接続された前記リードを取り外す取り外し工程と、該取り外し工程の後、再度前記低融点半田槽に前記スルーホール内の半田を浸漬させ、前記リードを前記ランドに接続していた残渣半田を溶融する再浸漬加熱溶融工程と、該再浸漬加熱溶融工程を行うことで前記低融点半田槽の溶融された半田を前記スルーホール内に供給し、該供給に伴い前記スルーホール内に有している半田を低融点化する工程と、該低融点化する工程において低融点化された半田を溶融し、該溶融した半田を前記スルーホール内から吸い出す半田吸い取り工程と、該半田吸い取り工程で溶融半田の吸い出されたスルーホール内に入れ替え用の電子部品のリードを挿通し、該リードを前記ランドに固定半田により接続する部品交換工程と、を備える。 According to a first aspect of the present invention, there is provided a method of repairing an electronic component using solder, wherein a lead of an electronic component is inserted into a through hole formed in a circuit board, and the inserted lead is passed through a fixed solder to a land provided in the through hole. after mounting and connecting, when replacing the electronic component with the failure, defect or the like, the to exchange electronic components such as fault-defective, the malfunction, defects, etc. which are connected by the fixed solder to the land electronic components, a repair method of an electronic component for performing interchanging removed while melting the fixing solder, the fixed connecting the electronic component leads and those the lead, such as the failure or defect in the land a solder, those the fixed solder from low melting point solder is immersed in a low melting point solder bath melted, immersion pressure for heating and melting the lead solder connection to the fixed solder was Tei on the land A melting step, the in the immersion heating and melting step after melting the solder the fixing by the heat of the low melting point solder bath, and removal step of removing the solder connection to said leads to said lands, after the removal step, again wherein by immersing the solder in the through hole in the low melting point solder bath, performing a re-immersed heating and melting step, a該再immersion heating melting step of melting the pre-cut over de residue solder that was connected to the land Supplying the melted solder in the low melting point solder tank into the through hole, lowering the melting point of the solder in the through hole with the supply, and lowering the melting point in melting the solder that is lower the melting point, a desoldering step suck solder to the molten from within the through hole, in the through holes sucked out of the molten solder in solder wicking process, electrodeposition for replacement Inserting the component leads, and a component replacement step of connecting by fixing soldering the leads to the lands.

請求項1に係る発明によれば、回路基板に半田を介して実装された電子部品を交換する際、リードとランドとを接続している固定半田を、これよりも低融点で溶融する低融点半田槽に浸漬し溶融することによって電子部品のリードをランドから取り外し、リードとランドとを接続していた固定半田よりも低融点な低融点半田槽に有する半田を、スルーホールに供給するので、スルーホール内に有する半田の融点を低融点化することができ、スルーホール内の半田を低融点で溶融した状態でスルーホール内から吸い出して除去することができることから、半田の吸い取り作業を容易且つ安全に行うことができる。さらに、半田を除去するための半田の吸い取り作業において、吸い取りを行なう半田が低融点なため、その半田が溶融するまでの加熱時間を短縮できその作業をも短時間で効率良く行うことができ、しかも、回路基板やこの回路基板に実装されている各種電子部品への熱の伝達を可及的に低く抑えることができるから、回路基板及び回路基板に実装された各種電子部品の高温化に伴う故障や品質劣化を抑えることができる。 According to the first aspect of the present invention, when the electronic component mounted on the circuit board via the solder is replaced, the fixed solder that connects the lead and the land is melted at a lower melting point. Since the lead of the electronic component is removed from the land by being immersed in the solder bath and melted, and the solder having the low melting point solder bath having a lower melting point than the fixed solder that has connected the lead and the land is supplied to the through hole, The melting point of the solder in the through hole can be lowered, and the solder in the through hole can be sucked out and removed from the through hole in a melted state with a low melting point. It can be done safely. Furthermore, in the solder sucking work for removing the solder, the solder to be sucked has a low melting point, so the heating time until the solder melts can be shortened and the work can be performed efficiently in a short time, Moreover, since heat transfer to the circuit board and various electronic components mounted on the circuit board can be suppressed as low as possible, the temperature of the circuit board and various electronic components mounted on the circuit board increases. Failure and quality degradation can be suppressed.

請求項2に係る半田による電子部品のリペア工法は、回路基板に形成したスルーホール内に電子部品のリードを挿通し、該挿通したリードを前記スルーホールに設けたランドに対しSn−Ag−Cu系固定半田を介して接続して取付けた後、故障・欠陥等に伴い前記電子部品を交換するに際して、前記故障・欠陥等の電子部品を交換するために前記ランドに前記Sn−Ag−Cu系固定半田により接続した当該故障・欠陥等の電子部品を、前記Sn−Ag−Cu系固定半田を溶融した状態で取り外し入れ替えを行う電子部品のリペア工法であって、前記故障・欠陥等の電子部品のリードと該リードを前記ランドに接続している前記Sn−Ag−Cu系固定半田とを、該Sn−Ag−Cu系固定半田より低融点のSn−Bi系半田が溶融している低融点半田槽に浸漬し、前記ランドに前記リードを半田接続してい前記Sn−Ag−Cu系固定半田を加熱溶融する浸漬加熱溶融工程と、該浸漬加熱溶融工程で前記低融点半田槽の熱により前記Sn−Ag−Cu系固定半田を溶融した後に、前記ランドに半田接続された前記リードを取り外す取り外し工程と、該取り外し工程の後、再度前記低融点半田槽に前記スルーホール内の半田を浸漬させ、前記リードを前記ランドに接続していた残渣半田を溶融する再浸漬加熱溶融工程と、該再浸漬加熱溶融工程を行うことで前記低融点半田槽の溶融されたSn−Bi系半田を前記スルーホール内に供給し、該供給に伴い前記スルーホール内に有している半田を低融点化する工程と、該低融点化する工程において低融点化された前記Sn−Bi系半田を溶融し、該溶融した半田を前記スルーホール内から吸い出す半田吸い取り工程と、該半田吸い取り工程で溶融半田の吸い出されたスルーホール内に入れ替え用の電子部品のリードを挿通し、該リードを前記ランドにSn−Ag−Cu系固定半田により接続する部品交換工程と、を備える。 According to a second aspect of the present invention, there is provided a method for repairing an electronic component using solder, wherein a lead of an electronic component is inserted into a through hole formed in a circuit board, and the inserted lead is Sn-Ag-Cu with respect to a land provided in the through hole. after attachment connected via a system fixed solder, when replacing the electronic component with the failure, defect or the like, to replace an electronic component such as the failure or defect, the said lands Sn-Ag-Cu electronic components such as the failure or defects connected by system fixed soldering, the a Sn-Ag-Cu-based fixed repair method of an electronic component for performing interchanging removed while melting the solder, such as the failure or defect electronic component leads and the person the lead the land the connected the Sn-Ag-Cu-based fixing solder Prefecture, those wherein the Sn-Ag-Cu-based than the fixed solder having a low melting point Sn-Bi based solder is dissolved To and immersed in a low-melting solder bath, an immersion heating and melting step of heating and melting the lead solder connection to the Sn-Ag-Cu-based fixing solder was Tei on the land, the low melting point with said immersion heating and melting process wherein after melting the Sn-Ag-Cu-based fixing solder by the heat of the solder bath, and removal step of removing the solder connection to said leads to said lands, after the removal process, in the low-melting-point solder bath again by immersing the solder in the through holes, before and re-immersion heating and melting step of the cut over de to melt the solder residue that was connected to the land, the low melting point solder bath by performing該再immersion heating melting step the molten Sn-Bi-based solder of the inner is supplied into the through hole, a step of lowering the melting point solder having in the through hole with the該供supply, low melting point in the step of low melting point Before Melting the Sn-Bi based solder, a desoldering step suck solder to the molten from within the through hole, in the through holes sucked out of the molten solder in solder blotting process, the leads of electronic components for interchange inserting and comprises a component replacement step of the lead to reset connection by the Sn-Ag-Cu-based fixing solder to the land, the.

請求項2に係る発明によれば、回路基板にSn−Ag−Cu系固定半田を介して実装された電子部品を交換する際、リードとランドとを接続しているSn−Ag−Cu系の固定半田を、これよりも低融点で溶融するSn−Bi系半田の低融点半田槽に浸漬し溶融することによって電子部品のリードをランドから取り外し、リードとランドとを接続していたSn−Ag−Cu系固定半田よりも低融点な低融点半田槽に有するSn−Bi系半田をスルーホールに供給するので、スルーホール内に有するSn−Ag−Cu系の半田の濃度は希釈化され、スルーホール内に有する半田の融点を低下させることができる。よって、スルーホール内の半田を低融点で溶融した状態でスルーホール内から吸い出して除去することができることから、半田の吸い取り作業を容易且つ安全に行うことができる。さらに、Sn−Bi系半田を除去するための半田の吸い取り作業において、吸い取りを行なう半田が低融点なため、その半田が溶融するまでの加熱時間を短縮できその作業をも短時間で効率良く行うことができ、しかも、回路基板やこの回路基板に実装されている各種電子部品への熱の伝達を可及的に低く抑えることができるから、回路基板及び回路基板に実装された各種電子部品の高温化に伴う故障や品質劣化を抑えることができる。また、Sn−Bi系半田を除去する際、スルーホール内から半田を吸い出しながら取り除くので、吸い取り作業中にSn−Bi系半田が飛散することなく除去することが可能であり、また、回路基板に電子部品を接続する際や電子部品をリペアする際に用いられる半田に、有鉛半田ではなくSn−Ag−Cu系半田やSn−Bi系半田の鉛フリー半田を用いているので、鉛をフリー化することができる。 According to the second aspect of the present invention, when the electronic component mounted on the circuit board via the Sn-Ag-Cu-based fixed solder is replaced, the Sn-Ag-Cu-based connecting the lead and the land is used. The lead of the electronic component was removed from the land by immersing the fixed solder in a low melting point solder bath of Sn-Bi solder that melts at a lower melting point than this, and the Sn and Ag were connected to the land. Since Sn-Bi solder having a lower melting point than the Cu-based fixed solder is supplied to the through hole, the concentration of the Sn-Ag-Cu solder in the through hole is diluted. The melting point of the solder in the hole can be lowered. Therefore, since the solder in the through hole can be sucked out and removed from the through hole in a melted state with a low melting point, the solder sucking operation can be easily and safely performed. Further, in the solder sucking work for removing the Sn-Bi solder, the solder to be sucked has a low melting point, so that the heating time until the solder melts can be shortened and the work can be efficiently performed in a short time. In addition, since heat transfer to the circuit board and various electronic components mounted on the circuit board can be suppressed as low as possible, the circuit board and various electronic components mounted on the circuit board Failures and quality degradation due to high temperatures can be suppressed. Further, when removing the Sn-Bi solder, it is removed while sucking out the solder from the through hole, so that it is possible to remove the Sn-Bi solder without scattering during the sucking operation, and to the circuit board. Since lead-free solder such as Sn-Ag-Cu solder or Sn-Bi solder is used instead of leaded solder, the lead-free solder is used for connecting electronic parts and repairing electronic parts. Can be

請求項3に係る半田による電子部品のリペア工法は、請求項1又は2において、前記取り外し工程と前記再浸漬加熱溶融工程との間において、前記取り外し工程で前記リードを取り外した際に前記スルーホール内に残存する残渣半田の少なくとも上部に前記低融点半田槽で用いた半田と同じ材料の半田材を塗布する塗布工程を行う。 According to a third aspect of the present invention, there is provided a method for repairing an electronic component using solder according to the first or second aspect, wherein the lead is removed when the lead is removed in the removal step between the removal step and the re-immersion heating and melting step. A coating process is performed in which a solder material of the same material as the solder used in the low-melting-point solder bath is applied to at least the upper part of the residual solder remaining inside.

請求項3に係る発明によれば、取り外し工程の後に、塗布工程として低融点半田槽で用いた半田と同じ材料のSn−Bi系等の半田材を残渣半田に塗布するので、スルーホール内の半田を、リードとランドとを接続していたSn−Ag−Cu系等の固定半田よりも低融点の半田に入れ替えるに際し、低融点半田槽に有するSn−Bi系等の半田に加え、上部に塗布されている半田材もスルーホール内に供給されることから、Sn−Ag−Cu系等の半田からSn−Bi系等の半田への入れ替えを速やかに行うことができる。 According to the third aspect of the present invention, after the removing step, the solder material of the same material as the solder used in the low melting point solder bath is applied to the residual solder as the applying step. When replacing the solder with a solder having a lower melting point than that of a fixed solder such as Sn-Ag-Cu that connected the lead and the land, in addition to the solder such as Sn-Bi that is in the low melting solder bath, Since the applied solder material is also supplied into the through hole, it is possible to quickly replace the Sn—Ag—Cu based solder with the Sn—Bi based solder.

請求項4に係る半田による電子部品のリペア工法は、請求項1〜3の何れか1項において、前記溶融した半田を前記スルーホール内から吸い出す半田吸い取り工程に代えて、前記溶融した半田をエアーブローにより吹き飛ばして除去するエアー噴出工程を備える。   According to a fourth aspect of the present invention, there is provided a method for repairing an electronic component using solder according to any one of the first to third aspects, wherein the melted solder is air-filled in place of the solder sucking step of sucking the melted solder out of the through hole. It has an air blowing process that blows away by blowing.

請求項4に係る発明によれば、溶融した半田を吹き飛ばすためのエアーブロー工程において、吹き飛ばしを行う対象の半田がSn−Bi系半田で低融点なものであることから、それに対応してエアーブロー温度の低温化が可能なことから、エアーブローによる回路基板及びこの回路基板に実装されている各種電子部品への高温化に伴う故障や品質劣化を抑えることができる。   According to the invention of claim 4, since the solder to be blown is Sn-Bi solder having a low melting point in the air blowing step for blowing off the melted solder, the air blowing is correspondingly performed. Since the temperature can be lowered, it is possible to suppress a failure and quality deterioration caused by the high temperature of the circuit board by air blow and various electronic components mounted on the circuit board.

本発明によれば、電子部品を取り外した際、スルーホール内に残渣する半田を、この半田よりも低融点で除去し易い低融点の半田に入れ替えることで、半田の吸い取り作業性を向上することができる。また、半田が低融点なため回路基板及びこの回路基板に実装されている各種電子部品への高温化に伴う故障や品質劣化を抑えることができ、回路基板や各種電子部品を破棄する必要も無くなる。さらに、回路基板に電子部品を接続する際や電子部品をリペアする際に用いられる半田に、有鉛半田ではなくSn−Ag−Cu系半田やSn−Bi系半田の鉛フリー半田を用い、鉛のフリー化によって鉛が溶出し人体や自然環境へ悪影響を与えてしまうことを防止することができる。   According to the present invention, when the electronic component is removed, the solder remaining in the through hole is replaced with a low melting point solder having a lower melting point and easier to remove than the solder, thereby improving the solder sucking workability. Can do. In addition, since the solder has a low melting point, it is possible to suppress failure and quality deterioration due to high temperatures of the circuit board and various electronic components mounted on the circuit board, and there is no need to discard the circuit board and various electronic components. . Furthermore, lead-free solder such as Sn-Ag-Cu solder or Sn-Bi solder is used instead of leaded solder as the solder used when connecting the electronic component to the circuit board or repairing the electronic component. It is possible to prevent lead from leaching out and causing adverse effects on the human body and the natural environment.

本発明を実施するための最良の形態としての実施例を以下に説明する。もちろん、本発明は、その発明の趣旨に反しない範囲で、実施例において説明した以外の構成のものに対しても容易に適用可能なことは説明を要するまでもない。   An embodiment as the best mode for carrying out the present invention will be described below. Needless to say, the present invention can be easily applied to configurations other than those described in the embodiments without departing from the spirit of the invention.

図1は実施例1における電子部品が実装された回路基板を示す斜視図である。回路基板1は、民生機器や産業機器などの装置に具備される合成樹脂製のものであり、回路基板1の上部には、図1に示すように複数の電子部品2が実装されており、これらは回路パターン3等を介して接続されている。   FIG. 1 is a perspective view illustrating a circuit board on which electronic components according to the first embodiment are mounted. The circuit board 1 is made of a synthetic resin provided in devices such as consumer equipment and industrial equipment, and a plurality of electronic components 2 are mounted on the upper part of the circuit board 1 as shown in FIG. These are connected via a circuit pattern 3 or the like.

図2は電子部品が回路基板に実装された状態を示す断面図である。水平に配置された回路基板1には、この回路基板1に対して垂直方向にスルーホール4が穿設されており、その周縁には、半田付け用の銅箔からなるランド5が設けられ、電子部品2の下部に一体に構成されたリード(足)6が、スルーホール4に挿通された状態で融点が217〜219℃程のSn−Ag−Cu系固定半田を用いてランド5に接続されている。なお、本実施例では、鉛フリー半田としてSn−Ag−Cu系固定半田を採用しているが、これに代えて、融点を227℃にすることが可能なSn−Cu系固定半田や、融点を221℃にすることが可能なSn−Ag系固定半田を用いてもよく、また、図2で符号2として示した電子部品はコネクタであるが、電子部品としては、コンデンサ、抵抗、トランス等の受動部品、IC、トランジスタ、LSI、ダイオード等の能動部品、スイッチ、コネクタ等の配線部品(補助部品)等であっても良いことは言うまでもない。 FIG. 2 is a cross-sectional view showing a state in which the electronic component is mounted on the circuit board. The circuit board 1 arranged horizontally has a through hole 4 formed in a direction perpendicular to the circuit board 1, and a land 5 made of a copper foil for soldering is provided on the periphery thereof. A lead (foot) 6 integrally formed in the lower part of the electronic component 2 is connected to the land 5 using Sn—Ag—Cu based fixed solder having a melting point of about 217 to 219 ° C. while being inserted into the through hole 4. Has been. In this embodiment, Sn-Ag-Cu-based fixed solder is used as the lead-free solder. Instead, Sn-Cu-based fixed solder capable of setting the melting point to 227 ° C, Sn-Ag fixed solder capable of setting the temperature to 221 ° C. may be used, and the electronic component indicated by reference numeral 2 in FIG. 2 is a connector, but as the electronic component, a capacitor, a resistor, a transformer, etc. Needless to say, it may be a passive component, an active component such as an IC, a transistor, an LSI, or a diode, or a wiring component (auxiliary component) such as a switch or a connector.

次に、回路基板に実装された電子部品を入れ替える際のリペア工法を、図3等を参照しながら以下に説明する。先ず、電子部品2のリード(足)6が、スルーホール4に挿通され、Sn−Ag−Cu系固定半田によりランド5に接続されている状態(図2の状態)において、故障・欠陥等に伴い電子部品2を交換するに際し、浸漬加熱溶融工程として、217℃程度で溶融されたSn−Bi系の溶融半田(融点は139℃)が投入された低融点半田槽7に電子部品2のリード6の下端側を浸漬する(a)。そして、その浸漬を維持することにより低融点半田槽7の熱がSn−Ag−Cu系固定半田に伝達されていくと、リード6を固定しているSn−Ag−Cu系固定半田は下方から上方に向かって溶融されていき(b)、低融点半田槽7のSn−Bi系の溶融半田は、スルーホール内でリード6を固定していたSn−Ag−Cu系の溶融半田と融合されていく。 Next, a repair method for replacing electronic components mounted on a circuit board will be described below with reference to FIG. First, in a state where the lead (foot) 6 of the electronic component 2 is inserted into the through hole 4 and connected to the land 5 by the Sn—Ag—Cu-based fixed solder (state of FIG. 2) As a result, when the electronic component 2 is replaced, the lead of the electronic component 2 is inserted into the low melting point solder tank 7 into which Sn-Bi-based molten solder (melting point is 139 ° C.) melted at about 217 ° C. is introduced as an immersion heating melting process. 6 is immersed (a). And if the heat | fever of the low melting-point solder tank 7 is transmitted to Sn-Ag-Cu type | system | group fixed solder by maintaining the immersion, Sn-Ag-Cu type | system | group fixed solder which fixes the lead 6 will be seen from the downward direction. (B) The Sn—Bi based molten solder in the low melting point soldering bath 7 is fused with the Sn—Ag—Cu based molten solder that has fixed the lead 6 in the through hole. To go.

次に、融合された半田が低融点半田槽7からの熱の伝達により全て溶融された状態において、取り外し工程として、回路基板1から電子部品2を取り外すために上昇させ分離していくと(c)、スルーホール4内のリード6を取り外した部位にも融合された半田が満たされる。 Next, in a state where all the fused solder is melted by the transfer of heat from the low-melting-point solder tank 7, as an detaching process, the electronic component 2 is lifted and separated to be detached from the circuit board 1 (c ), The portion where the lead 6 in the through hole 4 is removed is filled with the fused solder.

次に、回路基板1からリード6を分離した状態において、塗布工程として、スルーホール4内で凝固化されたSn−Ag−Cu系半田とSn−Bi系半田からなる合金(残渣半田)の上下に、半田材たるSn−Bi系の半田ペースト8を塗布する(d)。   Next, in the state where the leads 6 are separated from the circuit board 1, as an application process, the upper and lower sides of an alloy (residual solder) made of Sn—Ag—Cu solder and Sn—Bi solder solidified in the through holes 4 are applied. Then, an Sn-Bi solder paste 8 as a solder material is applied (d).

次に、再浸漬加熱溶融工程として、スルーホール4内に有する融合された合金としての固定半田の下部を再度低融点半田槽7に浸漬し217℃程度で加熱溶融し、次に、スルーホール4内を低融点化する工程として、低融点半田槽7の熱をスルーホール4内の溶融半田(合金)及び半田ペースト8に伝達させると共に、半田ペースト8を139℃(139℃以上)ほどの低融点で溶融させ、スルーホール4内に対し溶融された半田ペースト8及び低融点半田槽7に有する溶融半田を供給し、この供給に伴ってスルーホール4内のSn−Ag−Cu系半田の濃度を希釈させ、スルーホール4内をほぼ完全なSn−Bi系半田(合金)に入れ替えられ(e)、スルーホール4内に有する半田(合金)は低融点で溶融することが可能なものとなる(f)。 Next, as a re-immersion heating and melting step, the lower part of the fixed solder as the fused alloy in the through hole 4 is again immersed in the low melting point solder bath 7 and heated and melted at about 217 ° C. Next, the through hole 4 As a process of lowering the melting point inside, the heat of the low melting point solder tank 7 is transferred to the molten solder (alloy) and the solder paste 8 in the through hole 4, and the solder paste 8 is lowered to about 139 ° C. (139 ° C. or more). The melted solder paste 8 melted at the melting point and the melted solder contained in the low melting point solder tank 7 are supplied to the inside of the through hole 4, and the concentration of Sn—Ag—Cu solder in the through hole 4 is supplied with this supply. Is diluted, and the inside of the through hole 4 is replaced with almost complete Sn—Bi solder (alloy) (e), and the solder (alloy) in the through hole 4 can be melted at a low melting point. ( ).

続いて、半田吸い取り工程として、加熱溶融したスルーホール4内のSn−Bi系半田を融点温度以上まで加熱溶融し、半田吸取り機9にてスルーホール4内から加熱溶融したSn−Bi系の溶融半田を吸い出す(g)。なお、この半田吸い取り工程を行う際には、スルーホール4内は、ほぼSn−Bi系の合金で満たされており、本実施例のSn−Bi系の合金の融点は139℃と低温であることから、前記Sn−Bi系の合金たる半田を溶融するための加熱には時間を多く要さず、スルーホール4内における溶融されたSn−Bi系半田(合金)を簡単に除去することができ(h)、さらには、回路基板1及び回路基板1に実装している各種電子部品の熱的な品質劣化や故障を回避することができる。そして、スルーホール4内の半田をきれいに除去(全て除去若しくほぼ全て除去)した後には、部品交換工程として、Sn−Ag−Cu系等の鉛フリー半田を用いて回路基板1のランド5に電子部品2のリード6を取り付けることが可能であり、取り付け後においても回路基板1及び回路基板1に実装している各種電子部品の熱的な品質劣化を抑制することができる。(i)。   Subsequently, in the solder sucking process, the Sn-Bi solder in the through-hole 4 that has been heated and melted is heated and melted to the melting point or higher, and the Sn-Bi melt that has been heated and melted from the through-hole 4 by the solder sucker 9. The solder is sucked out (g). When this solder sucking step is performed, the inside of the through hole 4 is almost filled with an Sn—Bi alloy, and the melting point of the Sn—Bi alloy of this embodiment is as low as 139 ° C. Therefore, the heating for melting the Sn-Bi alloy solder does not require much time, and the melted Sn-Bi solder (alloy) in the through hole 4 can be easily removed. (H) Furthermore, thermal quality deterioration and failure of the circuit board 1 and various electronic components mounted on the circuit board 1 can be avoided. After the solder in the through-hole 4 is removed cleanly (all or almost completely removed), as a component replacement process, the lead-free solder such as Sn-Ag-Cu is used for the land 5 of the circuit board 1. The lead 6 of the electronic component 2 can be attached, and thermal quality deterioration of the circuit board 1 and various electronic components mounted on the circuit board 1 can be suppressed even after the attachment. (I).

以上のように本発明におけるリペア工法によれば、回路基板1に形成したスルーホール4内に電子部品2のリード6を挿通し、挿通したリード6をスルーホール4に設けたランド5に対しSn−Ag−Cu系固定半田を介して接続して取付けた後、故障・欠陥等に伴い前記電子部品を交換するに際して、故障・欠陥等の電子部品2を交換するためにランド5にSn−Ag−Cu系固定半田により接続した当該故障・欠陥等の電子部品2を、Sn−Ag−Cu系固定半田を溶融した状態で取り外し入れ替えを行う電子部品のリペア工法であって、故障・欠陥等の電子部品のリード6とこのリード6をランド5に接続しているSn−Ag−Cu系固定半田とを、このSn−Ag−Cu系固定半田より低融点で溶融するSn−Bi系半田が溶融している低融点半田槽7に浸漬し、ランド5にリード6を半田接続していたSn−Ag−Cu系固定半田を加熱溶融する浸漬加熱溶融工程と、該浸漬加熱溶融工程で低融点半田槽の熱によりSn−Ag−Cu系固定半田を溶融した後に、ランド5に半田接続されたリード6を取り外す取り外し工程と、取り外し工程でリード6を取り外した際にスルーホール4に残存するSn−Ag−Cu系固定半田とSn−Bi系半田が融合した残渣半田(合金)の上下に低融点半田槽7で用いた半田と同じ合金組成のSn−Bi系の半田材たる半田ペースト8を塗布する塗布工程と、塗布工程の後、再度低融点半田槽7にスルーホール4内の半田を浸漬させ、リード6をランド5に接続していた残渣半田等を溶融する再浸漬加熱溶融工程と、再浸漬加熱溶融工程を行うことで溶融されたSn−Bi系半田ペースト8及び低融点半田槽7に有するSn−Bi系半田を鉛直方向に配置されたスルーホール4内に供給し、この供給に伴いスルーホール4内に有しているSn−Ag−Cu系半田の濃度を希釈させ、スルーホール4内の半田をSn−Bi系半田になるよう入れ替える低融点化する工程と、低融点化する工程等において低融点化されたスルーホール4内の半田(Sn−Bi系半田又は、Sn−Bi系半田にSn−Ag−Cu系半田が融合された半田)を溶融し、この溶融したSn−Bi系半田等をスルーホール4内から吸い出す半田吸い取り工程と、半田吸い取り工程でSn−Bi系の溶融半田が吸い出されたスルーホール4内に、入れ替え用の電子部品のリードを挿通し、このリードをランド5にSn−Ag−Cu系固定半田により半田接続する部品交換工程とを備え、これらの工程を行うことにより、回路基板1にSn−Ag−Cu系固定半田を介して実装された電子部品2を交換する際、リード6とランド5とを接続しているSn−Ag−Cu系の固定半田を、これよりも低融点で溶融するSn−Bi系半田の低融点半田槽7に浸漬し溶融することによって電子部品2のリード6をランド5から取り外し、リード6とランド5とを接続していたSn−Ag−Cu系固定半田よりも低融点な低融点半田槽に有するSn−Bi系半田をスルーホール4内に供給することができる。よって、スルーホール4内に有していたSn−Ag−Cu系の半田の濃度を希釈化することができ、スルーホール4内に有する半田の融点を低下させることができるので、スルーホール4内の半田を低融点で溶融した状態でスルーホール4内から吸い出して除去できることから、取り除きを必要とする半田の吸い取り作業性を高温の状態で行わずに済み、半田の吸い取り作業を容易且つ安全に行うことができる。 As described above, according to the repair method of the present invention, the lead 6 of the electronic component 2 is inserted into the through hole 4 formed in the circuit board 1, and the inserted lead 6 is Sn to the land 5 provided in the through hole 4. after mounting connected -ag-Cu-based fixed via a solder, when replacing the electronic component with the failure, defect or the like, to exchange electronic component 2 such as the failure or defect, the lands 5 Sn- the electronic component 2 of the such failure or defects connected by Ag-Cu-based fixing solder, a repair method of an electronic component for performing interchanging removed while melting the Sn-Ag-Cu-based fixed solder, malfunction, defective An Sn-Bi solder that melts a lead 6 of an electronic component such as the Sn-Ag-Cu solder that connects the lead 6 to the land 5 at a lower melting point than the Sn-Ag-Cu solder. Melt And are immersed in the low melting point solder bath 7, a dip heating and melting step of heating and melting the lead 6 solder connection to the Sn-Ag-Cu-based fixed solder was Tei the land 5, a low-melting solder bath in the dip heating and melting process after melting the Sn-Ag-Cu-based fixed solder by heat, and removal step of removing the lead 6 is soldered to the lands 5, remains in the through-holes 4 when removing the lead 6 in dismounting step Sn- The solder paste 8 which is the Sn-Bi solder material having the same alloy composition as the solder used in the low melting point solder bath 7 is applied on the upper and lower sides of the residual solder (alloy) in which the Ag-Cu fixed solder and the Sn-Bi solder are fused. a coating step of, after the coating step, re-immersed heating and melting step of melting again the low melting point solder bath 7 is immersed solder through-hole 4, the remaining渣半field or the like are connected to rie de 6 the land 5 And re-immersion heating solution The Sn-Bi based solder is supplied in the vertical direction is disposed through holes 4 having the Sn-Bi based solder paste 8 and the low melting point solder bath 7 which is melted by performing the process, through-hole 4 with this feed was diluted Sn-Ag-Cu based solder concentrations have within, the steps of lowering the melting point interchanged so that the Sn-Bi based solder the solder in the through holes 4, low in the process such that low melting point Melting the solder in the through-hole 4 having a melting point (Sn—Bi solder or Sn-Bi solder fused with Sn—Ag—Cu solder), and the melted Sn—Bi solder, etc. The solder sucking process for sucking out the solder from the through hole 4 and the lead of the replacement electronic component are inserted into the through hole 4 in which the Sn-Bi-based molten solder is sucked in the solder sucking process. And a component replacement step of solder connection by Sn-Ag-Cu-based fixing solder de 5, by performing these steps, the electronic components mounted through the Sn-Ag-Cu-based fixing solder to the circuit board 1 When exchanging 2, the Sn—Ag—Cu based fixed solder connecting the lead 6 and the land 5 is immersed in a low melting point solder bath 7 of Sn—Bi based solder which melts at a lower melting point than this. The lead 6 of the electronic component 2 is removed from the land 5 by melting, and the Sn—Bi system having a low melting point solder bath having a lower melting point than the Sn—Ag—Cu based fixed solder that has connected the lead 6 and the land 5. Solder can be supplied into the through hole 4 . Therefore , it is possible to dilute the concentration of the Sn—Ag—Cu-based solder that has been in the through hole 4 and to lower the melting point of the solder in the through hole 4. Solder can be sucked out and removed from the through hole 4 in a melted state with a low melting point, so that it is not necessary to perform solder sucking work that needs to be removed at a high temperature, and the solder sucking work can be easily and safely performed. It can be carried out.

さらに、Sn−Bi系半田を除去するための半田の吸い取り作業において半田が低融点なため、半田が溶融するまでの加熱時間を短縮できその作業を短時間で効率良く行うことができ、回路基板1やこの回路基板1に実装されている各種電子部品への熱伝達を可及的に低く抑えることができるから、回路基板1及び回路基板1に実装された各種電子部品の高温化に伴う故障や品質劣化を抑えることができる。また、Sn−Bi系半田を除去する際、スルーホール4内から半田を吸い出しながら取り除くので、吸い取り作業中にSn−Bi系半田が飛散することなく除去することが可能である。   Further, since the solder has a low melting point in the solder sucking operation for removing the Sn-Bi solder, the heating time until the solder is melted can be shortened, and the operation can be efficiently performed in a short time. 1 and various electronic components mounted on the circuit board 1 can be suppressed as low as possible, so that the failure due to the high temperature of the circuit board 1 and various electronic components mounted on the circuit board 1 And quality degradation can be suppressed. Further, when removing the Sn-Bi solder, it is removed while sucking out the solder from the through hole 4, so that it is possible to remove the Sn-Bi solder without scattering during the sucking operation.

さらに、回路基板1に電子部品2を接続する際や電子部品2をリペアする際に用いられる半田に、有鉛半田ではなくSn−Ag−Cu系半田やSn−Bi系半田等の鉛フリー半田を用いているから、鉛のフリー化により自然環境へ悪影響を及ぼすことを抑止することが可能となる。   Furthermore, lead-free solder such as Sn-Ag-Cu solder or Sn-Bi solder, not leaded solder, is used as the solder used when the electronic component 2 is connected to the circuit board 1 or when the electronic component 2 is repaired. Because of the use of lead, it is possible to prevent adverse effects on the natural environment by making lead free.

以上、本発明の一例を詳述したが、本発明は前記実施例に限定されるものではなく、本発明の要旨の範囲内で種々の変形実施が可能である。例えば、本実施例においては、Sn−Ag−Cu系固定半田は、Snは96.5重量%,Agは3.0重量%,Cuは0.5重量%であり、また、Sn−Bi系半田及びSn−Bi系半田ペースト8は、Snは42重量%,Biは58重量%であるが、本発明の要旨の範囲でその重量%比を適宜選定してもよい。また、前記Sn−Ag−Cu系固定田より低融点であれば、前記Sn−Bi系半田やSn−Bi系半田ペーストに代えて、融点を約120℃にすることが可能なSn−In系半田、或いは、融点を約60℃にすることが可能なSn−Bi−In系半田等を適宜選定してもよい。また、半田を除去するに際し、溶融半田を吸い取る半田吸取り機9の代わりに、エアーブローにより溶融半田を吹き飛ばすエアー噴出装置を採用してよい。なお、その際には、溶融半田をエアーブローにより吹き飛ばして除去するため、エアー噴出工程を行う際は、溶融した半田を吹き飛ばすためのエアーブロー工程において、吹き飛ばしを行う対象の半田がSn−Bi系半田で低融点なものであることから、それに対応してエアーブロー温度は低温化が可能になり、エアーブローによる回路基板及びこの回路基板に実装されている各種電子部品への高温化に伴う故障や品質劣化を抑えることができる。 Although an example of the present invention has been described in detail above, the present invention is not limited to the above-described embodiment, and various modifications can be made within the scope of the gist of the present invention. For example, in this embodiment, Sn—Ag—Cu based fixed solder has Sn of 96.5 wt%, Ag of 3.0 wt%, Cu of 0.5 wt%, and Sn—Bi based In the solder and Sn—Bi solder paste 8, Sn is 42% by weight and Bi is 58% by weight, but the weight% ratio may be appropriately selected within the scope of the present invention. In addition, if the Sn-Ag-Cu-based fixing Handa by Ri low melting point in place of the Sn-Bi based solder or Sn-Bi based solder paste, which can be a melting point of about 120 ° C. Sn- In-based solder or Sn-Bi-In-based solder capable of setting the melting point to about 60 ° C. may be appropriately selected. Moreover, when removing solder, you may employ | adopt the air blowing apparatus which blows off molten solder by air blow instead of the solder sucker 9 which sucks molten solder. In this case, since the molten solder is blown off by air blow, the solder to be blown off is Sn-Bi based in the air blow process for blowing off the melted solder. Since the solder has a low melting point, the air blow temperature can be lowered correspondingly, and the failure due to the high temperature of the circuit board and various electronic components mounted on this circuit board by air blow And quality degradation can be suppressed.

図4は実施例2における回路基板に実装された電子部品を入れ替える際のリペア工法を示す説明図であり、実施例2の(b)〜(j)工程は、前述した実施例1の(a)〜(i)の工程と同じであるので、それらの説明は省略し、実施例2の(a)の工程のみを以下に説明する。実施例2のおける(a)においては、図4に示すように、電子部品2のリード(足)6が、スルーホール4に挿通され、Sn−Ag−Cu系固定半田によりランド5に接続されている状態において、故障・欠陥等に伴い電子部品2を交換するに際し、浸漬加熱溶融工程の前に、Sn−Bi系の半田ペースト8を、スルーホール4内で凝固化されたSn−Ag−Cu系固定半田の下部に塗布する。これにより、スルーホール4内のSn−Ag−Cu系の半田をより早く希釈化でき低融点化することが可能なため、スルーホール4内から電子部品2のリード6を取り外す時間を短縮できる。 FIG. 4 is an explanatory view showing a repair method when replacing an electronic component mounted on a circuit board in the second embodiment. The steps (b) to (j) in the second embodiment are the same as those in the first embodiment (a). ) To (i), the description thereof will be omitted, and only the process (a) of Example 2 will be described below. In (a) of the second embodiment, as shown in FIG. 4, the lead (leg) 6 of the electronic component 2 is inserted into the through hole 4 and connected to the land 5 by Sn—Ag—Cu based fixed solder. In the state where the electronic component 2 is replaced due to a failure / defect, etc., Sn-Bi solder paste 8 is solidified in the through-hole 4 before the immersion heating / melting step. Apply to the bottom of the Cu-based fixed solder. As a result, the Sn—Ag—Cu solder in the through hole 4 can be diluted more quickly and the melting point can be lowered, so that the time for removing the lead 6 of the electronic component 2 from the through hole 4 can be shortened.

実施例1における電子部品が実装された回路基板を示す斜視図である。It is a perspective view which shows the circuit board with which the electronic component in Example 1 was mounted. 同上、電子部品が回路基板に実装された状態を示す断面図である。It is sectional drawing which shows the state by which the electronic component was mounted in the circuit board same as the above. 同上、回路基板に実装された電子部品を入れ替える際のリペア工法の工程順を示す説明図である。It is explanatory drawing which shows the process order of the repair construction method at the time of replacing the electronic component mounted in the circuit board same as the above. 実施例2における回路基板に実装された電子部品を入れ替える際のリペア工法の工程順を示す説明図である。It is explanatory drawing which shows the process order of the repair construction method at the time of replacing the electronic component mounted in the circuit board in Example 2. FIG. 従来における回路基板に実装された電子部品を入れ替える際のリペア工法の工程順を示す説明図である。It is explanatory drawing which shows the process order of the repair construction method at the time of replacing the electronic component mounted in the conventional circuit board.

符号の説明Explanation of symbols

1 回路基板
2 電子部品
4 スルーホール
5 ランド
6 リード
低融点半田槽
8 半田材(半田ペースト)
DESCRIPTION OF SYMBOLS 1 Circuit board 2 Electronic component 4 Through hole 5 Land 6 Lead 7 Low melting point solder tank 8 Solder material (solder paste)

Claims (4)

回路基板に形成したスルーホール内に電子部品のリードを挿通し、該挿通したリードを前記スルーホールに設けたランドに対し固定半田を介して接続して取付けた後、故障・欠陥等に伴い前記電子部品を交換するに際して、
前記故障・欠陥等の電子部品を交換するために前記ランドに前記固定半田により接続した当該故障・欠陥等の電子部品を、前記固定半田を溶融した状態で取り外し入れ替えを行う電子部品のリペア工法であって、
前記故障・欠陥等の電子部品のリードと該リードを前記ランドに接続している前記固定半田とを、該固定半田より低融点の半田が溶融された低融点半田槽に浸漬し、前記ランドに前記リードを半田接続してい前記固定半田を加熱溶融する浸漬加熱溶融工程と、
該浸漬加熱溶融工程で前記低融点半田槽の熱により前記固定半田を溶融した後に、前記ランドに半田接続された前記リードを取り外す取り外し工程と、
該取り外し工程の後、再度前記低融点半田槽に前記スルーホール内の半田を浸漬させ、前記リードを前記ランドに接続していた残渣半田を溶融する再浸漬加熱溶融工程と、
該再浸漬加熱溶融工程を行うことで前記低融点半田槽の溶融された半田を前記スルーホール内に供給し、該供給に伴い前記スルーホール内に有している半田を低融点化する工程と、
該低融点化する工程において低融点化された半田を溶融し、該溶融した半田を前記スルーホール内から吸い出す半田吸い取り工程と、
該半田吸い取り工程で溶融半田の吸い出されたスルーホール内に入れ替え用の電子部品のリードを挿通し、該リードを前記ランドに固定半田により接続する部品交換工程と、
を備えたことを特徴とする半田による電子部品のリペア工法。
The lead of the electronic component is inserted into the through hole formed in the circuit board, and the inserted lead is connected to the land provided in the through hole via the fixed solder, and then attached to the land due to a failure or a defect. When replacing electronic components,
To replace an electronic component such as the failure or defect, repair of electronic components the electronic components of the fault-defects etc. connected by the fixed solder to the land, performs interchanging removed while melting the fixed solder Construction method,
The fault-defects the fixed solder Metropolitan the electronic component leads and those the lead connected to the land of immersed in low melting point solder bath solder is melted low melting point than those of the fixed solder, wherein an immersion heating and melting step of heating and melting the fixing solder the lead to the land was solder connection to Tei,
After the fixed solder is melted by the heat of the low-melting-point solder bath in the immersion heating and melting step, a removal step of removing the leads soldered to the lands,
After the removal step, and re-immersion heating and melting step of melting the by immersing the solder in the through hole in the low-melting-point solder bath again, the residue solder pre cut over de was connected to the land,
Supplying the melted solder in the low-melting-point solder bath into the through-hole by performing the re-immersion heating and melting step, and lowering the melting point of the solder in the through-hole with the supply When,
Melting the solder having a low melting point in the step of lowering the melting point, and sucking out the melted solder from the through hole;
In the through hole where the molten solder is sucked out in the solder sucking process, a lead of a replacement electronic component is inserted, and the lead is connected to the land by a fixed solder , and a component replacing process,
An electronic component repair method using solder, characterized by comprising:
回路基板に形成したスルーホール内に電子部品のリードを挿通し、該挿通したリードを前記スルーホールに設けたランドに対しSn−Ag−Cu系固定半田を介して接続して取付けた後、故障・欠陥等に伴い前記電子部品を交換するに際して、
前記故障・欠陥等の電子部品を交換するために前記ランドに前記Sn−Ag−Cu系固定半田により接続した当該故障・欠陥等の電子部品を、前記Sn−Ag−Cu系固定半田を溶融した状態で取り外し入れ替えを行う電子部品のリペア工法であって、
前記故障・欠陥等の電子部品のリードと該リードを前記ランドに接続している前記Sn−Ag−Cu系固定半田とを、該Sn−Ag−Cu系固定半田より低融点のSn−Bi系半田が溶融している低融点半田槽に浸漬し、前記ランドに前記リードを半田接続してい前記Sn−Ag−Cu系固定半田を加熱溶融する浸漬加熱溶融工程と、
該浸漬加熱溶融工程で前記低融点半田槽の熱により前記Sn−Ag−Cu系固定半田を溶融した後に、前記ランドに半田接続された前記リードを取り外す取り外し工程と、
該取り外し工程の後、再度前記低融点半田槽に前記スルーホール内の半田を浸漬させ、前記リードを前記ランドに接続していた残渣半田を溶融する再浸漬加熱溶融工程と、
該再浸漬加熱溶融工程を行うことで前記低融点半田槽の溶融されたSn−Bi系半田を前記スルーホール内に供給し、該供給に伴い前記スルーホール内に有している半田を低融点化する工程と、
該低融点化する工程において低融点化された前記Sn−Bi系半田を溶融し、該溶融した半田を前記スルーホール内から吸い出す半田吸い取り工程と、
該半田吸い取り工程で溶融半田の吸い出されたスルーホール内に入れ替え用の電子部品のリードを挿通し、該リードを前記ランドにSn−Ag−Cu系固定半田により接続する部品交換工程と、
を備えたことを特徴とする半田による電子部品のリペア工法。
Inserting the leads of the electronic component in a through hole formed in the circuit board, after the lead through said insertion mounted connected via the Sn-Ag-Cu-based fixing solder to lands provided in the through hole, failure・ When replacing the electronic parts due to defects, etc.
Melt to exchange electronic components such as the failure or defect, the electronic components of the fault-defects etc. connected by the Sn-Ag-Cu-based fixing solder to the land, the Sn-Ag-Cu-based fixing solder It is a repair method for electronic parts that is removed and replaced in the
The fault-defects the Sn-Ag-Cu-based fixing solder Metropolitan the electronic component leads and those the lead connected to the land of those the Sn-Ag-Cu-based fixed solder than the low-melting Sn- Bi based solder is immersed in a low-melting solder bath being melted, the immersion heating and melting step of heating and melting the lead to the land was solder connected Tei the Sn-Ag-Cu-based fixed solder,
A step of removing the lead soldered to the land after melting the Sn-Ag-Cu-based fixed solder by the heat of the low melting point solder bath in the immersion heating and melting step;
After the removal step, and re-immersion heating and melting step of melting the by immersing the solder in the through hole in the low-melting-point solder bath again, the residue solder pre cut over de was connected to the land,
By performing the re-immersion heating and melting step , the melted Sn-Bi solder in the low-melting-point solder bath is supplied into the through-hole, and the solder contained in the through-hole is reduced with the supply. A step of melting,
Melting the Sn-Bi solder having a low melting point in the step of lowering the melting point, and sucking out the melted solder from the through hole;
The solder wicking of solder aspirated through hole melted in step, replacing parts inserted through the lead of the electronic component for interchange, to reset connection by the Sn-Ag-Cu-based fixing solder to the land of the lead Process,
An electronic component repair method using solder, characterized by comprising:
前記取り外し工程と前記再浸漬加熱溶融工程との間において、前記取り外し工程で前記リードを取り外した際に前記スルーホール内に残存する残渣半田の少なくとも上部に前記低融点半田槽で用いた半田と同じ材料の半田材を塗布する塗布工程を行うことを特徴とする請求項1又は2記載の半田による電子部品のリペア工法。 Same as the solder used in the low-melting-point solder bath at least above the residual solder remaining in the through hole when the lead is removed in the removal step between the removal step and the re-immersion heating and melting step. repair method of the electronic component by soldering as claimed in claim 1 or 2, characterized in that the coating step of coating the solder material of the material. 前記溶融した半田を前記スルーホール内から吸い出す半田吸い取り工程に代えて、前記溶融した半田をエアーブローにより吹き飛ばして除去するエアー噴出工程を備えたことを特徴とする請求項1〜3の何れか1項に記載の半田による電子部品のリペア工法。   4. The method according to claim 1, further comprising: an air blowing step of removing the molten solder by blowing off with an air blow instead of a solder sucking step of sucking out the molten solder from the through hole. Repair method of electronic parts by soldering as described in the item.
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