JP4848657B2 - MS / MS mass spectrometer - Google Patents

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JP4848657B2
JP4848657B2 JP2005092238A JP2005092238A JP4848657B2 JP 4848657 B2 JP4848657 B2 JP 4848657B2 JP 2005092238 A JP2005092238 A JP 2005092238A JP 2005092238 A JP2005092238 A JP 2005092238A JP 4848657 B2 JP4848657 B2 JP 4848657B2
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靖文 田中
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Description

本発明はMS/MS型質量分析装置に関する。   The present invention relates to an MS / MS mass spectrometer.

従来より、質量分析器として四重極質量フィルタを用いたMS/MS型質量分析装置が知られている。図2はこうした装置の概略構成図である。この質量分析装置では、第1段四重極2、第2段四重極3、第3段四重極5という3段の四重極が設けられ、第2段四重極3を覆うように衝突室4が形成されている。イオン源1から発した各種イオンはまず第1段四重極2に導入され、特定質量(厳密には質量電荷比m/z)を有する目的イオンのみが選択されて第1段四重極2を通過する。通過した目的イオンは親イオンとして第2段四重極3内に導入されるが、衝突室4内にはAr、N2等の衝突ガスが導入されており、イオンはこの衝突室4内で衝突ガス分子と衝突し、いくつかの娘イオンに開裂する。開裂により生成された娘イオンは第3段四重極5に導入され、ここで特定質量を有する娘イオンのみが選択されて通過し、検出器6に到達して検出される。
Conventionally, an MS / MS type mass spectrometer using a quadrupole mass filter as a mass analyzer is known. FIG. 2 is a schematic configuration diagram of such an apparatus. In this mass spectrometer, three stages of quadrupoles, ie, a first stage quadrupole 2, a second stage quadrupole 3, and a third stage quadrupole 5, are provided so as to cover the second stage quadrupole 3. The collision chamber 4 is formed in the front. Various ions emitted from the ion source 1 is first introduced into the first-stage quadrupole 2, specific Weight first stage quadrupole purposes only ions are selected to have a (strictly mass-to-charge ratio m / z) 2 is passed. Passed target ions are introduced as parent ions into the second stage quadrupole 3, but collision gas such as Ar, N 2 or the like is introduced into the collision chamber 4, and the ions are introduced into the collision chamber 4. Collides with collision gas molecules and cleaves into several daughter ions. Daughter ions produced by the dissociation is introduced into the third-stage quadrupole 5, wherein only daughter ions having a specific Mass passes is selected, is detected to reach the detector 6.

四重極2、3、5は例えばイオン光軸の周りを取り囲むように回転対称的に配置された4本の略円柱形状のロッド電極である。通常、この四重極2、3、5には、イオン光軸を挟んで対向する2本の電極を1組として、1組の電極には直流電圧Uに高周波電圧V・cosωtを重畳した電圧を印加し、他の1組の電極には直流電圧Uに先の高周波電圧とは逆位相である−V・cosωtを重畳した電圧を印加する。そして、四重極2、3、5を通過させるイオンの質量に応じて電圧UとVとが適宜に定められる。
The quadrupoles 2, 3, and 5 are, for example, four substantially cylindrical rod electrodes that are rotationally symmetrically arranged so as to surround the ion optical axis. Usually, the quadrupoles 2, 3 and 5 have two electrodes facing each other across the ion optical axis, and one set of electrodes is a voltage obtained by superposing a high-frequency voltage V · cos ωt on a DC voltage U. And a voltage obtained by superimposing −V · cos ωt having a phase opposite to that of the previous high-frequency voltage on the DC voltage U is applied to the other set of electrodes. Then, it is suitably determined and the voltage U and V in accordance with the mass of ions which pass through the quadrupole 2,3,5.

上記構成において四重極2、3、5へ電圧を印加する電圧源をそれぞれ独立に設けた場合、たとえ高周波電圧の周波数を同一とした場合でもその位相の関係は電源投入の度毎に異なるものとなる。また、周波数が僅かでも相違すれば、時間が経過するとともに位相関係はずれてくる。隣接する四重極、即ち第1段四重極2と第2段四重極3との間、或いは第2段四重極3と第3段四重極5との間で、高周波電圧の位相関係が適切でない場合、前段の四重極から出たイオンの一部が次段の四重極による収束範囲内に突入せず、イオンの透過効率が低下してしまうおそれがある。   In the above configuration, when voltage sources for applying voltages to the quadrupoles 2, 3 and 5 are provided independently, even if the frequency of the high-frequency voltage is the same, the phase relationship differs each time the power is turned on. It becomes. Further, if the frequency is slightly different, the phase relationship is shifted with time. Between the adjacent quadrupoles, that is, between the first stage quadrupole 2 and the second stage quadrupole 3, or between the second stage quadrupole 3 and the third stage quadrupole 5, If the phase relationship is not appropriate, some of the ions emitted from the previous quadrupole do not enter the convergence range of the next quadrupole, which may reduce the ion transmission efficiency.

従来、例えば特許文献1に記載のMS/MS型質量分析装置では、上記のような隣接四重極間での高周波電圧の周波数や位相の乱れを回避するため、各段の四重極に印加される電圧の高周波成分を同一周波数で且つ同一位相に設定するようにしている。それにより、隣接四重極間での電場の乱れがなくなりイオンがスムーズに通過するとされている。   Conventionally, for example, in the MS / MS mass spectrometer described in Patent Document 1, in order to avoid the disturbance of the frequency and phase of the high-frequency voltage between the adjacent quadrupoles as described above, it is applied to the quadrupole of each stage. The high frequency components of the voltage to be applied are set to the same frequency and the same phase. Thereby, the disturbance of the electric field between adjacent quadrupoles is eliminated and ions pass smoothly.

しかしながら、上記のような条件の下では隣接四重極間でイオンはスムーズに通過するものの、前段の四重極から出たイオンを次段の四重極へ引き込むような力も作用しないため、必ずしもイオンの通過効率が最良になるとは限らない。   However, although the ions pass smoothly between adjacent quadrupoles under the above conditions, the force that draws ions from the previous quadrupole into the next quadrupole does not necessarily work. The ion passage efficiency is not always the best.

特開平7−240171号公報JP-A-7-240171

本発明はこのような課題を解決するために成されたものであり、その目的とするところは、隣接四重極間でのイオンの通過効率を従来よりもさらに高めて、分析感度や分析精度を向上させることができるMS/MS型質量分析装置を提供することにある。   The present invention has been made to solve such problems, and the object of the present invention is to further improve the passage efficiency of ions between adjacent quadrupoles as compared with the conventional method, so that the analysis sensitivity and analysis accuracy are improved. An object of the present invention is to provide an MS / MS mass spectrometer capable of improving the efficiency.

上記課題を解決するために成された本発明は、イオン源から送られてくる各種のイオンから特定質量の目的イオンを選択して通過させる第1段多重極と、選択された前記目的イオンを開裂させる第2段多重極と、その開裂により生じた生成イオンの中の特定質量の目的生成イオンを選択して通過させる第3段多重極と、選択された前記目的生成イオンを検出する検出器と、を具備するMS/MS型質量分析装置において、
a)前記第1段多重極に直流電圧と高周波電圧を重畳した電圧を印加するための第1電圧印加手段と、
b)前記第2段多重極に直流電圧と前記高周波電圧と同一周波数である高周波電圧を重畳した電圧を印加するための第2電圧印加手段と、
c)前記第3段多重極に直流電圧と前記高周波電圧と同一周波数である高周波電圧を重畳した電圧を印加するための第3電圧印加手段と、
d)前記第1乃至第3電圧印加手段により第1段乃至第3段多重極に印加される電圧のうち同一周波数である高周波電圧についてその位相を、通過させるイオンの質量に応じてそれぞれ独立に設定するための手段であって、イオンの質量とそのイオンが各多重極に入射する際の各多重極の好適な位相との関係を表す情報を保持させる記憶部を含み、標準試料に対する予備測定を行って求めた前記情報を前記記憶部に保持しておき、分析実行時には前記記憶部に保持されている情報に基づいて各多重極の位相を調整する位相設定手段と、
を備えることを特徴としている。
The present invention was made in order to solve the above problems includes a first stage multipole passing select the desired ions for a specific Weight of various ions sent from the ion source, the target ions selected The second stage multipole that cleaves the target, the third stage multipole that selectively passes the target product ion of a specific mass among the product ions generated by the cleavage, and the detection that detects the selected target product ion An MS / MS mass spectrometer comprising:
a) first voltage applying means for applying a voltage in which a DC voltage and a high-frequency voltage are superimposed on the first stage multipole;
b) second voltage applying means for applying a voltage in which a DC voltage and a high-frequency voltage having the same frequency as the high-frequency voltage are superimposed on the second stage multipole;
c) third voltage applying means for applying a voltage in which a DC voltage and a high frequency voltage having the same frequency as the high frequency voltage are superimposed on the third stage multipole;
d) The phase of the high-frequency voltage having the same frequency among the voltages applied to the first to third multipoles by the first to third voltage applying means is independently determined according to the mass of ions to be passed. A means for setting, including a storage unit that holds information representing the relationship between the mass of an ion and a suitable phase of each multipole when the ion is incident on each multipole, and a preliminary measurement for a standard sample Holding the information obtained by performing in the storage unit, phase adjustment means for adjusting the phase of each multipole based on the information held in the storage unit at the time of analysis,
It is characterized by having.

本発明に係るMS/MS型質量分析装置では、第1段乃至第3段多重極は四重極、六重極、八重極、というように4以上の偶数の電極を有する構成とすることができる。本発明に係るMS/MS型質量分析装置では、質量が既知である成分を含む複数の標準試料について各段の四重極に印加する高周波電圧の位相を変化させながら分析を行うことにより、各質量に対して、イオンの通過効率が最適又はそれに近い状態となるような高周波電圧の位相を予め調べておく。こうした質量と位相との関係を例えばテーブル化して或いは数式化して記憶部に保持しておき、位相設定手段は、分析実行時に質量が指定されると上記記憶部に保持された情報に基づいて各四重極における最適な位相を求めて各四重極の位相を調整する。
In the MS / MS mass spectrometer according to the present invention, the first to third stage multipoles are configured to have four or more even-numbered electrodes such as quadrupoles, hexapoles, and octupoles. it can. In the MS / MS type mass spectrometer according to the present invention, each of a plurality of standard samples containing a component having a known mass is analyzed while changing the phase of the high-frequency voltage applied to the quadrupole of each stage. for the mass, prepared to give the phase of the high-frequency voltage such as transmission efficiency of ions is optimum or near an. Such mass and may be held in the storage unit a relationship for example by a table or by equation of the phase, the phase setting means, based on the mass at the time of analysis run is designated held in the storage unit information seeking optimal phase in each quadrupole Te adjust the phase of each quadrupole.

本発明に係るMS/MS型質量分析装置によれば、分析対象質量範囲内の任意の質量を有するイオンを分析する際に、各四重極に印加される高周波電圧により生じる高周波電場、特に隣接する四重極間の空間に存在する高周波電場が、そのイオンを通過させるのに最適又はそれに近い状態となる。したがって、質量に関係なく目的イオンの通過効率が向上するので、その結果、検出器におけるイオンの検出効率も向上する。そのため、質量分析の精度及び感度が向上するとともに、再現性が改善される。
According to the MS / MS mass spectrometer according to the present invention, when analyzing the ions with any mass in analyte mass range, high-frequency electric field caused by the high frequency voltage applied to each quadrupole, especially A high-frequency electric field existing in the space between adjacent quadrupoles is optimal or close to passing the ions. Therefore, since the improved transmission efficiency of target ions regardless mass, as a result, also improved detection efficiency of ions in the detector. Therefore, accuracy and sensitivity of mass spectrometry are improved and reproducibility is improved.

本発明の一実施例によるMS/MS型四重極質量分析装置を図面を参照して説明する。図1は本実施例によるMS/MS型四重極質量分析装置の要部の構成図である。   An MS / MS type quadrupole mass spectrometer according to an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a configuration diagram of a main part of an MS / MS type quadrupole mass spectrometer according to this embodiment.

この装置は、試料液を噴霧するノズル10と、サンプリングコーン11と、第1イオンレンズ12と、オクタポール型の第2イオンレンズ13と、第1プリロッド四重極15、及び第1メイン四重極16から成る第1段四重極14と、衝突室17内に配置された第2段四重極18と、第3プリロッド四重極21、及び第3メイン四重極22から成る第3段四重極20と、検出器23と、第1イオンレンズ12、第2イオンレンズ13、第1段四重極14、第2段四重極18、及び第3段四重極20にそれぞれ直流電圧と高周波電圧とを重畳した電圧を印加する第1乃至第5電圧源30、33、36、39、42と、第1乃至第5電圧源30、33、36、39、42に対し高周波電圧の位相をそれぞれ独立に設定するための位相設定部32、35、38、41、44と、 第1乃至第5電圧源30、33、36、39、42よりそれぞれ印加される高周波電圧の位相をモニタする位相モニタ部31、34、37、40、43と、第1乃至第5電圧源30、33、36、39、42やサンプリングコーン11などに直流電圧を供給する直流電圧源45と、上記各部の動作を制御する制御部46と、を備える。   This apparatus includes a nozzle 10 for spraying a sample liquid, a sampling cone 11, a first ion lens 12, an octopole-type second ion lens 13, a first prerod quadrupole 15, and a first main quadrupole. A third stage consisting of a first stage quadrupole 14 comprising poles 16, a second stage quadrupole 18 disposed in the collision chamber 17, a third prerod quadrupole 21, and a third main quadrupole 22. A stage quadrupole 20, a detector 23, a first ion lens 12, a second ion lens 13, a first stage quadrupole 14, a second stage quadrupole 18, and a third stage quadrupole 20, respectively. The first to fifth voltage sources 30, 33, 36, 39, and 42 that apply a voltage obtained by superimposing the DC voltage and the high-frequency voltage, and the first to fifth voltage sources 30, 33, 36, 39, and 42 have a high frequency. A phase setting unit 32 for independently setting the phase of the voltage; 5, 38, 41, 44, and phase monitor units 31, 34, 37, 40, 43 for monitoring the phases of the high-frequency voltages applied from the first to fifth voltage sources 30, 33, 36, 39, 42, respectively. The first to fifth voltage sources 30, 33, 36, 39, 42, the DC voltage source 45 that supplies a DC voltage to the sampling cone 11, and the like, and the control unit 46 that controls the operation of each of the above units.

なお、ここでは図示しないが、ノズル10から検出器23までのイオンが通過する経路は複数に区画された真空室内に配設され、検出器23に近いほど真空度は高く設定されている。   Although not shown here, a path through which ions from the nozzle 10 to the detector 23 pass is arranged in a plurality of vacuum chambers, and the closer to the detector 23, the higher the degree of vacuum is set.

この質量分析装置の基本的な動作を概略的に説明する。この装置の前段には液体クロマトグラフが設けられ、液体クロマトグラフのカラムで分離された試料液がノズル10に導入される。ノズル10から片寄った電荷を付与されつつ略大気圧雰囲気中に噴霧された試料液の液滴から溶媒が気化する過程で試料に含まれる各種成分はイオン化され、サンプリングコーン11を通過して後段へと送られる。このイオンは、第1イオンレンズ12及び第2イオンレンズ13を通過する際に収束され、場合によっては加速されて、第1段四重極14に導入される。第1段四重極14には様々な質量を有するイオンが導入されるが、特定の質量を有する目的イオンのみが第1段四重極14を選択的に通過して次段の衝突室17に送られ、それ以外のイオンは途中で発散してしまう。
The basic operation of this mass spectrometer will be schematically described. A liquid chromatograph is provided in the front stage of this apparatus, and the sample liquid separated by the column of the liquid chromatograph is introduced into the nozzle 10. Various components contained in the sample are ionized in the process of vaporizing the solvent from the droplets of the sample liquid sprayed in a substantially atmospheric pressure atmosphere while being given a charge that is offset from the nozzle 10, passes through the sampling cone 11, and goes to the subsequent stage. Sent. The ions are converged when passing through the first ion lens 12 and the second ion lens 13 and are accelerated in some cases and introduced into the first stage quadrupole 14. Although ions are introduced with different mass in the first-stage quadrupole 14, the next stage of the collision purposes only ions selectively pass through the first-stage quadrupole 14 having a specific mass It is sent to the chamber 17 and other ions are diffused along the way.

衝突室17内にはガス供給管19よりアルゴンガス等の所定の衝突ガスが導入されており、上記目的イオンは第2段四重極18により形成される電場内を通過する際に衝突ガス分子に衝突すると開裂する。即ち、上記目的イオンが親イオンとなって娘イオンを生成する。開裂の態様は様々であるため、このとき発生する娘イオンの質量も様々である。これら各種の娘イオンは衝突室17から出て第3段四重極20に導入され、特定の質量を有する娘イオンのみが第3段四重極20を選択的に通過して検出器23に送られ、それ以外のイオンは途中で発散してしまう。こうして検出器23には特定の質量を有する娘イオンのみが到達しその数に応じたイオン電流が流れ、検出信号として出力される。
A predetermined collision gas such as argon gas is introduced into the collision chamber 17 from the gas supply pipe 19, and the target ions collide gas molecules when passing through the electric field formed by the second stage quadrupole 18. When it collides with, it cleaves. In other words, the target ions become parent ions to generate daughter ions. Because aspects of cleavage will vary, mass of daughter ions generated this time is also different. These various the daughter ions are introduced into the third-stage quadrupole 20 exits from the collision chamber 17, only daughter ions having a specific mass can be selectively passed through the third-stage quadrupole 20 detector 23 The other ions are emitted along the way. Thus the ion current only daughter ions corresponding to the number reached with certain mass flow to the detector 23, is output as a detection signal.

次に、本実施例のMS/MS型質量分析装置に特徴的な動作について説明する。この質量分析装置では、未知試料の測定に先立ち、制御部46において位相値テーブルを作成するために複数の相異なる質量を有する成分を含有する標準試料を用いて予備測定が実行される。
Next, operations characteristic of the MS / MS mass spectrometer of the present embodiment will be described. In this mass spectrometer, prior to the measurement of an unknown sample, the preliminary measurement is performed by using a standard sample containing a component having a plurality of different mass in order to create a phase value table in the control unit 46.

予備測定では、第1乃至第5電圧源30、33、36、39、42でそれぞれ直流電圧に重畳させる高周波電圧の周波数を規定の値に設定し、位相を互いに徐々に変化させながら検出信号のピーク値をモニタし、ピーク値が最大となるような位相を見い出す。ここで位相とは、その高周波電圧の周波数Frの信号に対し、或る時点Trにおける位相のずれ量として定義する。そして、通過するイオンの質量を変化させたものについて、各電圧源30、33、36、39、42における最適位相値を順次求め、これを例えばテーブル化して位相値テーブル47に格納しておく。なお、求めた位相値をテーブル化するのではなく例えば数式化する等、他の形態で以て制御部46の内部に記憶させておいてもよい。また、上記のような最適位相値の算出動作は、例えば各部に印加される電圧値の調整や質量校正などのオートチューニングと同時に行うことができる。 In the preliminary measurement, the first to fifth voltage sources 30, 33, 36, 39, and 42 set the frequency of the high frequency voltage to be superimposed on the DC voltage to a specified value, and gradually change the phase of each of the detection signals. Monitor the peak value and find the phase that maximizes the peak value. Here, the phase is defined as a phase shift amount at a certain time Tr with respect to a signal of the frequency Fr of the high frequency voltage . Then, the optimum phase values in the voltage sources 30, 33, 36, 39, 42 are sequentially obtained for those in which the mass of ions passing therethrough is changed, and this is converted into a table and stored in the phase value table 47. Note that the obtained phase value may be stored in the control unit 46 in another form, for example, by formulating it instead of being tabulated. Moreover, the calculation operation of the optimum phase value as described above can be performed simultaneously with auto-tuning such as adjustment of a voltage value applied to each part and mass calibration.

目的試料の分析を行う際に、制御部46には親イオンの質量と娘イオンの質量とが設定される。分析が開始されると、制御部46はその質量などに応じて第1乃至第5電圧源30、33、36、39、42に対し電圧値などを設定するとともに、位相値テーブル47から上記のような質量に対応した位相値を読み出し、位相設定部32、35、38、41、44を介して高周波電圧の位相を設定する。位相値テーブル47内に対応する質量のデータがない場合には、近接する質量に対応するデータに基づいて内挿処理等により近似的に位相値を求めればよい。
When analyzing a target sample, and a mass of mass and daughter ions of the parent ions is set to the control unit 46. When the analysis is started, and sets and voltage value to the control unit 46 first to fifth voltage source 30,33,36,39,42 if etc. As a mass, from the phase value table 47 reading the phase value corresponding to the mass, as described above, setting the phase of the high frequency voltage through the phase setting section 32,35,38,41,44. If no mass data corresponding to the phase value table 47 is approximately may be calculated phase value by such interpolation processing based on the data corresponding to the mass to be close.

所定の質量範囲で質量走査を行う場合には、位相値テーブル47から各質量に対応した位相値を順次読み出して、それぞれの高周波電圧の位相が時間経過に伴って順次変化するように位相設定部32、35、38、41、44を介して高周波電圧の位相を設定すればよい。
When performing mass scan in a predetermined mass range sequentially reads the phase value corresponding to each mass from the phase value table 47, the phase setting so that the phase of each high frequency voltage sequentially changes over time What is necessary is just to set the phase of a high frequency voltage via the part 32, 35, 38, 41, 44.

上記のように第1イオンレンズ12、第2イオンレンズ13、第1段四重極14、第2段四重極18、及び第3段四重極20に印加される電圧のうちの高周波成分の位相が設定されると、目的とする質量を持つ親イオンは高い効率で以て第1イオンレンズ12と第2イオンレンズ13との間の空間、第2イオンレンズ13と第1段四重極14との間の空間、及び第1段四重極14と第2段四重極18との間の空間を通過して、衝突室17内の第2段四重極18の内部空間に導入される。そして、ここで衝突ガス分子と衝突して開裂し、各種の娘イオンを生成する。生成された娘イオンの中で目的とする質量を持つ娘イオンは高い効率で以て、第2段四重極18と第3段四重極20との間の空間を通過して第3段四重極20に導入され、ここで目的とする質量を持つ娘イオンのみが選択されて通過し検出器23に到達する。これにより、検出器23には目的とする親イオンの開裂によって生成された目的とする娘イオンが高い効率で以て到達し、高い感度の分析を行うことができる。 As described above, the high-frequency component of the voltage applied to the first ion lens 12, the second ion lens 13, the first stage quadrupole 14, the second stage quadrupole 18, and the third stage quadrupole 20. of the phase is set, the parent ion space between the following Te first ion lens 12 with high efficiency and the second ion lens 13, a second ion lens 13 first stage four with mass of interest The internal space of the second stage quadrupole 18 in the collision chamber 17 passing through the space between the quadrupole 14 and the space between the first stage quadrupole 14 and the second stage quadrupole 18. To be introduced. And it collides with a collision gas molecule | numerator here, and it cleaves, and produces | generates various daughter ions. Daughter ions having a mass of interest in the generated daughter ions Te than at high efficiency, the third through the second-stage quadrupole 18 the space between the third-stage quadrupole 20 is introduced into stage quadrupole 20, wherein only daughter ions having a mass of interest is selected and passed through to reach the detector 23. Thereby, the target daughter ion produced | generated by the cleavage of the target parent ion arrives at the detector 23 with high efficiency, and a highly sensitive analysis can be performed.

なお、上記実施例はLC/MSに本願発明を適用したものであるが、GC/MS等、MS/MS型質量分析装置であればその適用範囲は上記記載に限るものではない。また。上記実施例は一例であって、本発明の趣旨の範囲で適宜変更や修正を行っても本願発明に包含されることは明らかである。   In addition, although the said Example applies this invention to LC / MS, if it is MS / MS type | mold mass spectrometers, such as GC / MS, the application range will not be restricted to the said description. Also. The above embodiment is merely an example, and it is obvious that the present invention is included even if appropriate changes and modifications are made within the scope of the present invention.

本発明の一実施例によるMS/MS型質量分析装置の要部の構成図。The block diagram of the principal part of the MS / MS type | mold mass spectrometer by one Example of this invention. 従来のMS/MS型質量分析装置の概略構成図。The schematic block diagram of the conventional MS / MS type | mold mass spectrometer.

符号の説明Explanation of symbols

10…ノズル
11…サンプリングコーン
12…第1イオンレンズ
13…第2イオンレンズ
14…第1段四重極
15…第1プリロッド四重極
16…第1メイン四重極
17…衝突室
18…第2段四重極
19…ガス供給管
20…第3段四重極
21…第3プリロッド四重極
22…第3メイン四重極
23…検出器
30、33、36、39、42…電圧源
31、34、37、40、43…位相モニタ部
32、35、38、41、44…位相設定部
45…直流電圧源
46…制御部
47…位相値テーブル
DESCRIPTION OF SYMBOLS 10 ... Nozzle 11 ... Sampling cone 12 ... 1st ion lens 13 ... 2nd ion lens 14 ... 1st stage quadrupole 15 ... 1st prerod quadrupole 16 ... 1st main quadrupole 17 ... Collision chamber 18 ... 1st Second stage quadrupole 19 ... Gas supply pipe 20 ... Third stage quadrupole 21 ... Third prerod quadrupole 22 ... Third main quadrupole 23 ... Detectors 30, 33, 36, 39, 42 ... Voltage source 31, 34, 37, 40, 43 ... phase monitor units 32, 35, 38, 41, 44 ... phase setting unit 45 ... DC voltage source 46 ... control unit 47 ... phase value table

Claims (1)

イオン源から送られてくる各種のイオンから特定質量の目的イオンを選択して通過させる第1段多重極と、選択された前記目的イオンを開裂させる第2段多重極と、その開裂により生じた生成イオンの中の特定質量の目的生成イオンを選択して通過させる第3段多重極と、選択された前記目的生成イオンを検出する検出器と、を具備するMS/MS型質量分析装置において、
a)前記第1段多重極に直流電圧と高周波電圧を重畳した電圧を印加するための第1電圧印加手段と、
b)前記第2段多重極に直流電圧と前記高周波電圧と同一周波数である高周波電圧を重畳した電圧を印加するための第2電圧印加手段と、
c)前記第3段多重極に直流電圧と前記高周波電圧と同一周波数である高周波電圧を重畳した電圧を印加するための第3電圧印加手段と、
d)前記第1乃至第3電圧印加手段により第1段乃至第3段多重極に印加される電圧のうち同一周波数である高周波電圧についてその位相を、通過させるイオンの質量に応じてそれぞれ独立に設定するための手段であって、イオンの質量とそのイオンが各多重極に入射する際の各多重極の好適な位相との関係を表す情報を保持させる記憶部を含み、標準試料に対する予備測定を行って求めた前記情報を前記記憶部に保持しておき、分析実行時には前記記憶部に保持されている情報に基づいて各多重極の位相を調整する位相設定手段と、
を備えることを特徴とするMS/MS型質量分析装置。
A first-stage multipole that selectively passes a target ion of a specific mass from various ions sent from an ion source, a second-stage multipole that cleaves the selected target ion, and the cleavage is generated. An MS / MS mass spectrometer comprising: a third stage multipole that selectively passes a target product ion having a specific mass in the product ions; and a detector that detects the selected target product ion.
a) first voltage applying means for applying a voltage in which a DC voltage and a high-frequency voltage are superimposed on the first stage multipole;
b) second voltage applying means for applying a voltage in which a DC voltage and a high-frequency voltage having the same frequency as the high-frequency voltage are superimposed on the second stage multipole;
c) third voltage applying means for applying a voltage in which a DC voltage and a high frequency voltage having the same frequency as the high frequency voltage are superimposed on the third stage multipole;
d) The phase of the high-frequency voltage having the same frequency among the voltages applied to the first to third multipoles by the first to third voltage applying means is independently determined according to the mass of ions to be passed. A means for setting, including a storage unit that holds information representing the relationship between the mass of an ion and a suitable phase of each multipole when the ion is incident on each multipole, and a preliminary measurement for a standard sample Holding the information obtained by performing in the storage unit, phase adjustment means for adjusting the phase of each multipole based on the information held in the storage unit at the time of analysis,
An MS / MS mass spectrometer characterized by comprising:
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