JP4712730B2 - Pinhole test method and wire pulling device - Google Patents

Pinhole test method and wire pulling device Download PDF

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JP4712730B2
JP4712730B2 JP2007004952A JP2007004952A JP4712730B2 JP 4712730 B2 JP4712730 B2 JP 4712730B2 JP 2007004952 A JP2007004952 A JP 2007004952A JP 2007004952 A JP2007004952 A JP 2007004952A JP 4712730 B2 JP4712730 B2 JP 4712730B2
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conducting wire
pinhole
test method
wire
test
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JP2008170345A (en
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助則 天野
弥二 田邊
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THE FURUKAW ELECTRIC CO., LTD.
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Description

本発明は、絶縁被膜を備えた導線において絶縁被覆中のピンホールを検出するためのピンホール試験方法と、そのピンホール試験方法を実施するために用いられる導線引張装置とに関する。   The present invention relates to a pinhole test method for detecting a pinhole in an insulation coating in a conductive wire provided with an insulation coating, and a lead wire tensioning device used for carrying out the pinhole test method.

導線の絶縁被覆に穴や傷等の損傷(ピンホール)が生じると、漏電等のおそれがあるため、絶縁被覆の損傷を事前に検出する必要がある。このピンホール試験方法としては、エタノールにフェノールフタレイン3%を混入したフェノールフタレイン溶液を、0.2%濃度の食塩水に5〜10滴下した試験液を用意し、この試験液中に、規定の温度で加熱処理した試験対象となる導線を、曲げたり伸ばしたりしないで浸漬し、導線を−極、試験液を+極にして直流電圧を加える方法がよく知られている(JIS規格C3003 エナメル銅線及びエナメルアルミニウム線試験方法)。これにより、絶縁被覆にピンホールがあると、試験液中に赤紫色の筋(小さな気泡の集まり)が生じるため、ピンホールの存在を確認することができる。
一方、他の試験方法として、特許文献1には、電機子の鉄心等に導線を巻いてコイルを形成する際に、電源を備えた検電器に接続されるガイドで導線をガイドさせて、絶縁被覆が損傷して導電がガイドと導通した際に、電源、導線、ガイド、検電器からなる閉ループの形成により警報回路が作動するようにした被膜検査装置の発明が記載されている。また、特許文献2には、モータ電気巻線のコイルエンド部絶縁被膜をインピーダンス測定によって診断する絶縁診断装置の発明が記載されている。何れも導線に電圧を加えて絶縁被覆の外部に漏れる電流を検出する方法である。
If damage (pinhole) such as a hole or a flaw occurs in the insulation coating of the conducting wire, there is a risk of leakage or the like, so it is necessary to detect the insulation coating damage in advance. As this pinhole test method, a test solution prepared by adding 5 to 10 drops of a phenolphthalein solution in which 3% of phenolphthalein is mixed in ethanol to 0.2% strength saline is prepared. It is well known to apply a DC voltage by immersing a conductor to be tested that has been heat-treated at a specified temperature without bending or stretching, and applying a DC voltage with the conductor as the negative electrode and the test solution as the positive electrode (JIS C3003). Enamel copper wire and enamel aluminum wire test method). Thus, if there is a pinhole in the insulation coating, reddish purple streaks (collection of small bubbles) are generated in the test solution, so that the presence of the pinhole can be confirmed.
On the other hand, as another test method, in Patent Document 1, when forming a coil by winding a conductive wire around an iron core or the like of an armature, the conductive wire is guided by a guide connected to a voltage detector equipped with a power source, and insulated. An invention of a coating inspection apparatus is described in which an alarm circuit is activated by forming a closed loop comprising a power source, a conductor, a guide, and a voltage detector when the coating is damaged and conduction is conducted with the guide. Patent Document 2 describes an invention of an insulation diagnostic device that diagnoses a coil end insulating film of a motor electrical winding by impedance measurement. In either case, a current is leaked to the outside of the insulation coating by applying a voltage to the conducting wire.

特開平6−313786号公報JP-A-6-313786 特開平9−163685号公報Japanese Patent Laid-Open No. 9-163685

しかし、上記従来の試験方法では、何れも絶縁被膜に余計な力を加えずに、又は絶縁被覆が全く伸張していない状態で行われるため、絶縁被覆に潜在しているピンホール、すなわち傷や被膜厚みの偏り等がある箇所で将来的にピンホールが発生するおそれが高い箇所(以下この箇所を「潜在部」という。)の検出には至らない。従って、試験で合格した導線を曲げたりコイル等を形成したりした際に、潜在部でピンホールが発生することがあった。   However, in any of the above conventional test methods, since no excessive force is applied to the insulating coating or the insulating coating is not stretched at all, pinholes hidden in the insulating coating, that is, scratches and It does not lead to detection of a place where there is a high possibility that a pinhole will occur in the future in a place where the coating thickness is uneven (hereinafter, this place is referred to as “latent part”). Therefore, when a conducting wire that has passed the test is bent or a coil or the like is formed, a pinhole may occur in the latent portion.

そこで、本発明は、通常のピンホールは勿論、潜在部でのピンホールも顕在化させて検出でき、信頼性に優れたピンホール試験方法と、その試験方法を実施するのに好適な導線引張装置とを提供することを目的としたものである。   Therefore, the present invention makes it possible to detect not only normal pinholes but also pinholes in latent portions, and has excellent pinhole test methods with excellent reliability, and wire tension suitable for carrying out the test methods. It is intended to provide a device.

上記目的を達成するために、請求項1に記載の発明は、絶縁被覆を備えた導線に電圧を加え、絶縁被覆中のピンホールを通して絶縁被覆の外部に漏れる電流を検出するピンホール試験方法であって、予め導線を長さ方向に引張して所定の割合で伸張させた後、電圧を加えて絶縁被膜の外部に漏れる電流を検出するようにしたことを特徴とするものである。
請求項2に記載の発明は、請求項1の目的に加えて、ピンホール試験を適正に行うために、伸張させた導線を、フェノールフタレイン溶液を滴下した食塩水からなる試験液に浸漬させ、導線と試験液との間に電圧を加えることで試験液に漏れる電流を検出するようにしたものである。
請求項3に記載の発明は、請求項1又は2の目的に加えて、潜在部でのピンホールを効果的に顕在化させるために、導線を伸張させる割合を3%としたものである。
In order to achieve the above object, the invention described in claim 1 is a pinhole test method in which a voltage is applied to a conductive wire having an insulation coating, and a current leaking outside the insulation coating through a pinhole in the insulation coating is detected. Then, the conductor is previously pulled in the length direction and stretched at a predetermined ratio, and then a voltage is applied to detect a current leaking outside the insulating coating.
In addition to the object of claim 1, the invention described in claim 2 immerses the stretched wire in a test solution made of a saline solution in which a phenolphthalein solution is dropped in order to properly perform the pinhole test. The current leaking into the test solution is detected by applying a voltage between the conductor and the test solution.
In addition to the object of the first or second aspect, the third aspect of the present invention is such that the ratio of extending the conductive wire is 3% in order to effectively reveal the pinhole in the latent portion.

上記目的を達成するために、請求項4に記載の発明は、請求項1乃至3の何れかに記載のピンホール試験方法に用いる導線引張装置であって、導線の一端を固定可能な固定部と、その固定部に固定された導線を巻回可能なドラムと、導線の他端が固定可能で、導線を長さ方向に引張して所定の割合で伸張可能な引張操作部とを備えたことを特徴とするものである。
請求項5に記載の発明は、請求項4の目的に加えて、導線の引張操作を容易に行うために、引張操作部は、少なくとも一部に円形部を備え、その円形部の周面に導線の他端を固定可能で、所定角度の回転により導線を円形部の周面に沿って長さ方向に引張可能な回転部材と、その回転部材を回転操作可能な操作レバーとからなる構成としたものである。
In order to achieve the above object, the invention described in claim 4 is a wire pulling device used in the pinhole test method according to any one of claims 1 to 3, wherein the fixing portion can fix one end of the wire. And a drum capable of winding a conducting wire fixed to the fixing portion, and a tension operation unit capable of fixing the other end of the conducting wire and pulling the conducting wire in the length direction and extending at a predetermined ratio. It is characterized by this.
According to a fifth aspect of the present invention, in addition to the object of the fourth aspect, in order to easily perform the pulling operation of the conducting wire, the pulling operation portion includes a circular portion at least partially, A structure comprising a rotating member capable of fixing the other end of the conducting wire and capable of pulling the conducting wire in the length direction along the circumferential surface of the circular portion by rotating at a predetermined angle, and an operation lever capable of rotating the rotating member. It is a thing.

請求項1に記載の発明によれば、通常のピンホールは勿論、潜在部でのピンホールも顕在化させて検出できるため、ピンホール試験の信頼性が向上する。
請求項2に記載の発明によれば、請求項1の効果に加えて、ピンホール試験を適正に行うことができる。
請求項3に記載の発明によれば、請求項1又は2の効果に加えて、絶縁被覆に最もストレスを与えて潜在部でのピンホールを効果的に顕在化させることができる。
請求項4に記載の発明によれば、長い導線でもスペースを取らずにコンパクトにセットでき、正確に所定の割合で伸張させることができる。また、ドラムに巻回させることで巻き癖がつくため、引張後の導線を試験液にそのまま浸漬等させることができ、ピンホール試験に係る手間の軽減にも繋がる。
請求項5に記載の発明によれば、請求項4の効果に加えて、導線の引張を簡単な操作で行うことができる。
According to the first aspect of the present invention, not only normal pinholes but also pinholes in latent portions can be detected and detected, so that the reliability of the pinhole test is improved.
According to the second aspect of the invention, in addition to the effect of the first aspect, the pinhole test can be properly performed.
According to the third aspect of the present invention, in addition to the effect of the first or second aspect, the pinhole in the latent portion can be effectively manifested by applying the stress most to the insulating coating.
According to the fourth aspect of the present invention, even a long conductive wire can be set compactly without taking up space, and can be accurately stretched at a predetermined ratio. Moreover, since a winding wrinkle is produced by winding on a drum, it is possible to immerse the lead wire after tension in the test solution as it is, leading to a reduction in labor related to the pinhole test.
According to invention of Claim 5, in addition to the effect of Claim 4, pulling of conducting wire can be performed by simple operation.

以下、本発明の実施の形態を図面に基づいて説明する。
図1は、本発明のピンホール試験方法に用いる導線引張装置(以下単に「引張装置」という。)の一例を示す説明図で、引張装置1は、試験台2上に、固定部3と、一対のドラム4a,4bと、引張操作部5とを設けてなる。ここではJIS規格と同じ5m長さの導線6が試験対象となっている。
まず固定部3は、試験台2上に立設され、ドラム4a,4bに上から接する水平な接線と同じ高さで導線6の一端6aが固定される棒体で、ドラム4a,4bは、互いに同径の円形軸状を呈し、試験台2上に立設された支持棒7によって、軸心が互いに平行となる姿勢で前後方向(図1(A)の右側を前方とする)へ所定間隔をおいて試験台2と非接触で支持されている。また、ドラム4a,4bの周面には、図1(B)に示すように、軸方向へ等間隔でフランジ8,8・・が周設されて、各フランジ8,8間に、導線6を巻回する際のガイド溝9,9・・を形成している。
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is an explanatory view showing an example of a wire tension device (hereinafter simply referred to as “tensile device”) used in the pinhole test method of the present invention. A pair of drums 4a and 4b and a pulling operation unit 5 are provided. Here, the conductor 6 having a length of 5 m, which is the same as the JIS standard, is the subject of the test.
First, the fixing portion 3 is a rod body that is erected on the test table 2 and is fixed to one end 6a of the conducting wire 6 at the same height as a horizontal tangent that is in contact with the drums 4a and 4b from above. The drums 4a and 4b are Predetermined in the front-rear direction (with the right side in FIG. 1 (A) as the front) in a posture in which the shaft centers are parallel to each other by the support rods 7 that have circular shafts having the same diameter and are erected on the test bench 2. It is supported in a non-contact manner with the test table 2 at intervals. Further, as shown in FIG. 1 (B), flanges 8, 8,... Are provided circumferentially at equal intervals in the axial direction on the peripheral surfaces of the drums 4a, 4b. Guide grooves 9, 9.

そして、引張操作部5は、固定部3の後方でドラム4a,4bの軸心と平行な軸を中心として試験台2に回転可能に軸着され、半円状の円形部の端部に導線6の他端6bを固定可能な回転部材10と、その回転部材10の回転中心側の平面に固定された操作レバー11とを有する。回転部材10は、試験台2側との図示しないストッパ同士の係合により、操作レバー11が鉛直方向に向く図1(A)の実線位置と、同図で左回転方向へ90°回転した二点鎖線の位置との間で回転可能となっている。但し、回転部材10における円形部の中心には、錘12が結合されて回転部材10の前方側から下方へ垂下していることから、回転部材10は、錘12により、常態では操作レバー11が鉛直方向となる実線位置に付勢される。
ここで、回転部材10は、円周面の周方向長さの半分が導線6の長さ(5m)の3%(15cm)となる径で形成されている。
The tension operation unit 5 is pivotally mounted on the test table 2 around the axis parallel to the axis of the drums 4a and 4b behind the fixed unit 3 and is connected to the end of the semicircular circular portion. 6 has a rotating member 10 capable of fixing the other end 6b of the motor 6, and an operation lever 11 fixed to a plane on the rotation center side of the rotating member 10. The rotating member 10 is rotated by 90 ° in the left rotation direction in FIG. 1 (A) where the operation lever 11 faces in the vertical direction by engagement of stoppers (not shown) with the test table 2 side. It can rotate between the position of the dotted line. However, since the weight 12 is coupled to the center of the circular portion of the rotating member 10 and hangs downward from the front side of the rotating member 10, the rotating member 10 is normally moved by the weight 12, and the operation lever 11 is in a normal state. It is urged to the position of the solid line in the vertical direction.
Here, the rotating member 10 is formed with a diameter in which half of the circumferential length of the circumferential surface is 3% (15 cm) of the length (5 m) of the conducting wire 6.

以上の如く構成された引張装置1を用いてピンホール試験を行う方法について説明する。まず、導線6の一端6aを固定部3に固定し、そのままドラム4a,4b上で前方へ水平に引き回した後、導線6を前方側のドラム4bの周面に巻いて後方へ折り返し、ドラム4b,4aの下面を通して後方側のドラム4aの周面に巻いて前方へ折り返す。この両ドラム4a,4b間での導線6の巻回を各ガイド溝9ごとに複数回繰り返した後、最後にドラム4bから後方へ折り返した導線6の他端6bを回転部材10の上端に固定する。よって、導線6を伸張や弛みがない状態でドラム4a,4bを介して固定部3と回転部材10との間に張設することができる。導線6のエナメル皮膜は、多少の擦れではダメージを受けることがないため、このようにドラム4a,4bに巻回してもピンホールが生じるおそれはない。   A method of performing a pinhole test using the tension device 1 configured as described above will be described. First, one end 6a of the conducting wire 6 is fixed to the fixing portion 3, and after being drawn horizontally on the drums 4a and 4b as it is, the conducting wire 6 is wound around the peripheral surface of the front drum 4b and folded back to form the drum 4b. , 4a is wound around the peripheral surface of the drum 4a on the rear side, and folded forward. After the winding of the conducting wire 6 between the drums 4a and 4b is repeated a plurality of times for each guide groove 9, the other end 6b of the conducting wire 6 finally turned back from the drum 4b is fixed to the upper end of the rotating member 10. To do. Therefore, the conducting wire 6 can be stretched between the fixed portion 3 and the rotating member 10 via the drums 4a and 4b in a state where there is no extension or slack. Since the enamel film of the conductive wire 6 is not damaged by a slight rubbing, there is no possibility that a pinhole is generated even if it is wound around the drums 4a and 4b.

次に、引張操作部5において、操作レバー11によって回転部材10を図1の左回転方向へ90°回転させる。すると、図1(A)の二点鎖線に示すように、導線6が回転部材10の半周分(15cm)だけ長さ方向へ引っ張られて全体的に伸張することになる。この3%の伸張が、絶縁被覆であるエナメルに最もストレス(分子結合間の歪みが最大になる領域)を与えるもので、この導線6の伸張により、絶縁被覆の傷や被膜の薄い部分等の潜在部でピンホールが発生する。   Next, in the pulling operation unit 5, the rotating member 10 is rotated 90 degrees in the left rotation direction in FIG. Then, as shown by a two-dot chain line in FIG. 1A, the conducting wire 6 is pulled in the length direction by a half circumference (15 cm) of the rotating member 10 and is extended as a whole. This stretch of 3% gives the most stress to the enamel that is the insulation coating (the region where the strain between the molecular bonds is maximized). A pinhole occurs in the latent part.

その後、引張操作部5で操作レバー11を元の鉛直位置に戻して回転部材10を図1の位置に復帰させ、導線6の伸張を解除して導線6を固定部3及び回転部材10から取り外す。後は先述したJIS規格C3003の試験方法に則り、導線6を加熱処理した後、フェノールフタレイン溶液を食塩水に滴下した試験液中に浸し、導線6を−極、試験液を+極にして直流電圧を加え、絶縁被膜の外部に漏れる電流を検出する方法でピンホールを検出すればよい。これにより、元々絶縁被膜に存在していたピンホールは勿論、引張装置1での伸張によって潜在部に生じたピンホールも検出可能となる。なお、ピンホール試験結果の評価については、ピンホール発生個数(赤紫色の筋の発生個数)で判断されるが、品種やサイズ等によって「0個」や「3個以下」等要求されるレベルは異なる。   Thereafter, the operation lever 11 is returned to the original vertical position by the pulling operation unit 5 to return the rotating member 10 to the position of FIG. 1, the extension of the conducting wire 6 is released, and the conducting wire 6 is detached from the fixing unit 3 and the rotating member 10. . Thereafter, in accordance with the test method of JIS standard C3003 described above, the conductor 6 is heat-treated, and then immersed in a test solution in which a phenolphthalein solution is dropped into a saline solution. What is necessary is just to detect a pinhole by the method of applying the direct-current voltage and detecting the electric current which leaks outside the insulating film. This makes it possible to detect not only pinholes originally present in the insulating coating, but also pinholes generated in the latent portion due to stretching by the tensioning device 1. The evaluation of the pinhole test results is judged by the number of pinholes generated (number of reddish purple stripes), but the required level such as “0” or “3 or less” depending on the product type or size. Is different.

このように、上記形態のピンホール試験方法によれば、予め導線6を長さ方向に引張して所定の割合で伸張させた後、電圧を加えて絶縁被膜の外部に漏れる電流を検出するようにしたことで、通常のピンホールは勿論、潜在部でのピンホールも顕在化させて検出できるため、ピンホール試験の信頼性が向上する。
特に、伸張させた導線6を、フェノールフタレイン溶液を滴下した食塩水からなる試験液に浸漬させ、導線6と試験液との間に電圧を加えることで試験液に漏れる電流を検出することで、ピンホール試験を適正に行うことができる。
また、導線6を伸張させる割合を3%としたことで、絶縁被覆に最もストレスを与えて潜在部でのピンホールを効果的に顕在化させることができる。
As described above, according to the pinhole test method of the above embodiment, the conductor 6 is previously pulled in the length direction and stretched at a predetermined ratio, and then a voltage is applied to detect a current leaking outside the insulating coating. As a result, not only normal pinholes but also pinholes in latent portions can be detected and detected, so that the reliability of the pinhole test is improved.
In particular, by immersing the stretched lead wire 6 in a test solution made of a saline solution in which a phenolphthalein solution is dropped and applying a voltage between the lead wire 6 and the test solution, a current leaking into the test solution is detected. The pinhole test can be properly performed.
Further, by setting the ratio of extending the conducting wire 6 to 3%, the most stress is applied to the insulating coating, and pinholes in the latent portion can be effectively revealed.

そして、上記ピンホール試験方法に、導線6の一端6aを固定可能な固定部3と、その固定部3に固定された導線6を巻回可能なドラム4a,4bと、導線6の他端6bが固定可能で、導線6を長さ方向に引張して所定の割合で伸張可能な引張操作部5とを備えた引張装置1を用いたことで、長い導線6でもスペースを取らずにコンパクトにセットでき、正確に3%伸張させることができる。また、ドラム4a,4bに巻回させることで巻き癖がつくため、引張後の導線を試験液にそのまま浸漬させることができ、ピンホール試験に係る手間の軽減にも繋がる。
特にここでは、引張操作部5を、円形部の端部に導線6の他端6bを固定可能で、90°回転により導線6を円形部の周面に沿って長さ方向に引張可能な回転部材10と、その回転部材10を回転操作可能な操作レバー11とから構成したことで、導線6の引張を簡単な操作で行うことができる。
And in the said pinhole test method, the fixing | fixed part 3 which can fix the one end 6a of the conducting wire 6, the drum 4a, 4b which can wind the conducting wire 6 fixed to the fixing | fixed part 3, and the other end 6b of the conducting wire 6 Can be fixed, and by using the tension device 1 provided with the tension operation unit 5 that can stretch the lead wire 6 in the length direction and extend at a predetermined rate, the long lead wire 6 can be compact without taking up space. It can be set and stretched exactly 3%. Moreover, since the curl is formed by winding it around the drums 4a and 4b, the lead wire after the tension can be immersed in the test solution as it is, which leads to a reduction in labor related to the pinhole test.
In particular, here, the pulling operation portion 5 can be fixed to the end of the circular portion with the other end 6b of the conducting wire 6 and rotated by 90 ° to pull the conducting wire 6 along the circumferential surface of the circular portion in the length direction. By constituting the member 10 and the operation lever 11 capable of rotating the rotating member 10, the conductor 6 can be pulled with a simple operation.

なお、上記形態では、導線の伸張を3%としているが、この割合に限定するものではなく、エナメルの種類等によっては5%等の他の割合を採用してもよい。また、導線の長さも適宜変更可能である。
よって、引張操作部の回転部材の回転角度も伸張の割合に合わせて変更すればよいし、その径も任意に変更可能である。また、回転部材は半円状に限らず円盤状でも差し支えなく、回転付勢も、錘に代えてトーションスプリング等の他の付勢手段を用いたり、付勢手段を省略したりしてもよい。さらに、引張操作部は固定部と同じ側に配置する必要はなく、ドラムを挟んで固定部と反対側に配置することもできる。
In the above embodiment, the extension of the conducting wire is 3%. However, the ratio is not limited to this ratio, and another ratio such as 5% may be adopted depending on the type of enamel. Moreover, the length of a conducting wire can also be changed suitably.
Therefore, the rotation angle of the rotating member of the pulling operation unit may be changed in accordance with the expansion ratio, and the diameter can be arbitrarily changed. Further, the rotating member is not limited to a semicircular shape and may be a disk shape, and the rotation urging may use another urging means such as a torsion spring instead of the weight, or the urging means may be omitted. . Furthermore, it is not necessary to arrange the tension operation section on the same side as the fixed section, and it can be disposed on the opposite side of the fixed section with the drum interposed therebetween.

一方、ドラムの径も導線の長さに応じて適宜変更可能で、勿論2つに限らず、円形や長円形の1つのドラムのみ用いて導線を巻回させることもできる。また、2つの場合は巻回部分のみ有する半円形としても差し支えない。さらに、円形のドラムは導線への影響を最小限とするために回転可能に支持することも考えられる。
そして、導線を伸張や弛みなく正確に張設するために、固定部とドラムと引張操作部との少なくとも何れか一つを、支持台と長孔とでネジ止めしたり、ネジ送り機構を採用したりすることで、試験台の前後方向で固定位置を調整可能としてもよい。
On the other hand, the diameter of the drum can be appropriately changed according to the length of the conducting wire. Of course, the diameter is not limited to two, and the conducting wire can be wound using only one circular or oval drum. In the case of two, it may be a semicircular shape having only a winding portion. Further, it is conceivable that the circular drum is rotatably supported in order to minimize the influence on the conductor.
And, in order to stretch the wire accurately without stretching or slack, at least one of the fixed part, drum, and tension operation part is screwed with a support base and a long hole, or a screw feed mechanism is adopted. The fixing position may be adjustable in the front-rear direction of the test table.

その他、ピンホール試験方法としては、上記形態のようなフェノールフタレイン溶液を滴下した食塩水からなる試験液に浸漬する形態に限らず、先の背景技術で提示したような他の診断、検査装置を用いることも可能である。
In addition, the pinhole test method is not limited to the form in which the phenolphthalein solution is dropped in the test solution composed of the saline solution as in the above-described form, but other diagnosis and inspection devices as presented in the background art above. It is also possible to use.

導線引張装置の説明図で、(A)が側面を、(B)が正面を夫々示す。It is explanatory drawing of a conducting wire tension | pulling apparatus, (A) shows a side surface, (B) shows a front, respectively.

符号の説明Explanation of symbols

1・・導線引張装置、2・・試験台、3・・固定部、4a,4b・・ドラム、5・・引張操作部、6・・導線、9・・ガイド溝、10・・固定部材、11・・操作レバー。   1 .... Conductor pulling device 2 .... Test stand 3 .... Fixing part 4a, 4b ... Drum 5 .... Tensioning operation part 6 .... Conducting wire 9, ... Guide groove 10 .... Fixing member 11. ・ Operating lever.

Claims (5)

絶縁被覆を備えた導線に電圧を加え、前記絶縁被覆中のピンホールを通して前記絶縁被覆の外部に漏れる電流を検出するピンホール試験方法であって、
予め前記導線を長さ方向に引張して所定の割合で伸張させた後、電圧を加えて前記絶縁被膜の外部に漏れる電流を検出するようにしたことを特徴とするピンホール試験方法。
A pinhole test method for detecting a current leaking to the outside of the insulation coating through a pinhole in the insulation coating by applying a voltage to a conductor provided with the insulation coating,
A pinhole test method characterized by detecting a current leaking to the outside of the insulating coating by applying a voltage after previously pulling the conducting wire in the length direction and extending it at a predetermined rate.
伸張させた導線を、フェノールフタレイン溶液を滴下した食塩水からなる試験液に浸漬させ、前記導線と試験液との間に電圧を加えることで前記試験液に漏れる電流を検出することを特徴とする請求項1に記載のピンホール試験方法。   The stretched lead wire is immersed in a test solution made of a saline solution in which a phenolphthalein solution is dropped, and a voltage is applied between the lead wire and the test solution to detect a current leaking to the test solution. The pinhole test method according to claim 1. 導線を伸張させる割合を3%としたことを特徴とする請求項1又は2に記載のピンホール試験方法。   The pinhole test method according to claim 1 or 2, wherein a ratio of extending the conducting wire is 3%. 請求項1乃至3の何れかに記載のピンホール試験方法に用いる導線引張装置であって、導線の一端を固定可能な固定部と、その固定部に固定された前記導線を巻回可能なドラムと、前記導線の他端が固定可能で、前記導線を長さ方向に引張して所定の割合で伸張可能な引張操作部とを備えたことを特徴とする導線引張装置。   It is a conducting wire tension | pulling apparatus used for the pinhole test method in any one of Claim 1 thru | or 3, Comprising: The fixing | fixed part which can fix the end of conducting wire, and the drum which can wind the said conducting wire fixed to the fixing | fixed part And a tension operation unit that can fix the other end of the conducting wire and can pull the conducting wire in the length direction and extend it at a predetermined ratio. 引張操作部は、少なくとも一部に円形部を備え、その円形部の周面に導線の他端を固定可能で、所定角度の回転により前記導線を前記円形部の周面に沿って長さ方向に引張可能な回転部材と、その回転部材を回転操作可能な操作レバーとからなることを特徴とする請求項4に記載の導線引張装置。   The pulling operation part includes a circular part at least in part, and can fix the other end of the conducting wire to the circumferential surface of the circular part, and the longitudinal direction of the conducting wire along the circumferential surface of the circular part by rotation at a predetermined angle. The lead wire tensioning device according to claim 4, comprising: a rotary member that can be pulled in a straight line; and an operation lever that can rotate the rotary member.
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