JP4695072B2 - 改良された光学対称性を有する広い視野の凝視赤外線センサ用の光学系 - Google Patents
改良された光学対称性を有する広い視野の凝視赤外線センサ用の光学系 Download PDFInfo
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- 230000003287 optical effect Effects 0.000 title claims description 80
- 238000003384 imaging method Methods 0.000 claims description 30
- 239000011248 coating agent Substances 0.000 claims description 17
- 238000000576 coating method Methods 0.000 claims description 17
- 239000002131 composite material Substances 0.000 claims description 11
- 239000000463 material Substances 0.000 claims description 7
- 238000003331 infrared imaging Methods 0.000 claims 14
- 238000013461 design Methods 0.000 description 34
- 230000008901 benefit Effects 0.000 description 12
- 238000004519 manufacturing process Methods 0.000 description 11
- 238000000034 method Methods 0.000 description 10
- 230000005855 radiation Effects 0.000 description 9
- 238000002310 reflectometry Methods 0.000 description 7
- 230000003595 spectral effect Effects 0.000 description 7
- 229910052751 metal Inorganic materials 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 230000035945 sensitivity Effects 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 4
- 230000004907 flux Effects 0.000 description 4
- 238000005286 illumination Methods 0.000 description 4
- 210000001747 pupil Anatomy 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 230000004075 alteration Effects 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 229910003460 diamond Inorganic materials 0.000 description 3
- 239000010432 diamond Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 238000002835 absorbance Methods 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910052732 germanium Inorganic materials 0.000 description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 238000010793 Steam injection (oil industry) Methods 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000006978 adaptation Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000003667 anti-reflective effect Effects 0.000 description 1
- 238000009833 condensation Methods 0.000 description 1
- 230000005494 condensation Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000001429 visible spectrum Methods 0.000 description 1
- 238000010792 warming Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/061—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling the temperature of the apparatus or parts thereof, e.g. using cooling means or thermostats
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0801—Means for wavelength selection or discrimination
- G01J5/0802—Optical filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0803—Arrangements for time-dependent attenuation of radiation signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0806—Focusing or collimating elements, e.g. lenses or concave mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0808—Convex mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0814—Particular reflectors, e.g. faceted or dichroic mirrors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0815—Light concentrators, collectors or condensers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0875—Windows; Arrangements for fastening thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/08—Optical arrangements
- G01J5/0879—Optical elements not provided otherwise, e.g. optical manifolds, holograms, cubic beamsplitters, non-dispersive prisms or particular coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/16—Optical objectives specially designed for the purposes specified below for use in conjunction with image converters or intensifiers, or for use with projectors, e.g. objectives for projection TV
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0018—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 with means for preventing ghost images
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
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- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
- Lenses (AREA)
Description
本発明を詳細に説明する前に、光学絞り、とくに、IR画像化システムの光学絞りを一般的に簡単に説明する。この説明から、読者は本発明により与えられる利点をさらによく認識するであろう。
パラメータ 改良された設計 従来技術の設計
素子の軸位置 ±0.0020”乃至±0.0030” ±0.0005”
素子のセンタリング ±0.0005”乃至±0.0010” ±0.0003”
Claims (9)
- 情景からの赤外線(IR)を通過させる入口開口を有する赤外線画像化システムにおいて、
画像平面に配置された冷却された赤外線検出器を格納するコールドシールドと、デュワーウインドウとを備えており、前記赤外線画像化システムの光軸が前記デュワーウインドウおよび前記画像平面を通過するデュワーと、
前記入口開口と前記デュワーウインドウとの間において前記光軸に沿って配置された複数の冷却されないレンズ素子と、
前記デュワーウインドウと前記入口開口との間において光軸を囲んでその周囲に配置された複数の環状の反射器セグメントとを備えており、前記複数の環状の反射器セグメントはそれぞれ前記デュワーウインドウのほうを向いた反射表面を有しており、前記デュワーウインドウから最も遠い最も外側の環状の反射器セグメントの中央部の開口が前記赤外線画像化システムの実効的に冷却された開口絞りを規定しており、
前記実効的に冷却された開口絞りは前記デュワーの外側に配置され、
前記実効的に冷却された開口絞りと、この実効的に冷却された開口絞りよりも前記デュワーウインドウに近い位置に配置された前記複数の環状の反射器セグメントの別の1つとの間に前記レンズ素子の少なくとも1つが配置され、
さらに、前記複数の冷却されないレンズ素子の別の少なくとも1つが前記入口開口と前記実効的に冷却された開口絞りとの間に配置されている赤外線画像化システム。 - 前記赤外線画像化システムは、30度より大きい視野を有している請求項1記載の赤外線画像化システム。
- 前記赤外線画像化システムは、100度より大きい視野を有している請求項1記載の赤外線画像化システム。
- 前記反射器セグメントはそれぞれ、前記赤外線検出器上の各地点を1つの冷却された表面上に画像化するように成形された反射表面を有している請求項1記載の赤外線画像化システム。
- 前記冷却された表面は前記コールドシールドの外面を含んでおり、前記外面は前記デュワーウインドウのほうを向いている請求項4記載の赤外線画像化システム。
- 前記表面の形状は、ほぼ環状の表面形状を規定している請求項4記載の赤外線画像化システム。
- 前記複数の反射器セグメントは、前記コールドシールドを通過する実質的に全ての非画像化光線を捕捉し、デュワーウインドウに最も近い最も内側の反射器セグメントを通る穴と前記コールドシールドを通る穴とは画増化光線がぼかされることを避ける大きさにされている請求項1記載の赤外線画像化システム。
- 前記少なくとも1つのレンズ素子および反射器セグメントは、1つの複合光学表面を有する単一のモノリシック体で構成されている請求項1記載の赤外線画像化システム。
- 前記モノリシック体は屈折レンズ素子を製造するために選択された材料から構成されており、前記複合光学表面は前記レンズ素子を規定する中央に配置された凸状部分を含んでおり、前記レンズ素子は前記反射器セグメントを規定する反射コーティングを有するほぼ環状の表面領域によって取囲まれている請求項8記載の赤外線画像化システム。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/423,504 | 2003-04-25 | ||
US10/423,504 US7002154B2 (en) | 2003-04-25 | 2003-04-25 | Optical system for a wide field of view staring infrared sensor having improved optical symmetry |
PCT/US2004/012574 WO2004097354A1 (en) | 2003-04-25 | 2004-04-23 | Optical system for a wide field of view staring infrared sensor having improved optical symmetry |
Publications (3)
Publication Number | Publication Date |
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JP2006524823A JP2006524823A (ja) | 2006-11-02 |
JP2006524823A5 JP2006524823A5 (ja) | 2006-12-28 |
JP4695072B2 true JP4695072B2 (ja) | 2011-06-08 |
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Application Number | Title | Priority Date | Filing Date |
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JP2006513259A Expired - Fee Related JP4695072B2 (ja) | 2003-04-25 | 2004-04-23 | 改良された光学対称性を有する広い視野の凝視赤外線センサ用の光学系 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7002154B2 (ja) |
EP (1) | EP1618358B1 (ja) |
JP (1) | JP4695072B2 (ja) |
KR (1) | KR100697170B1 (ja) |
CA (1) | CA2512826C (ja) |
DE (1) | DE602004026171D1 (ja) |
IL (1) | IL168659A (ja) |
WO (1) | WO2004097354A1 (ja) |
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2004
- 2004-04-23 CA CA002512826A patent/CA2512826C/en not_active Expired - Fee Related
- 2004-04-23 KR KR1020057020141A patent/KR100697170B1/ko not_active IP Right Cessation
- 2004-04-23 JP JP2006513259A patent/JP4695072B2/ja not_active Expired - Fee Related
- 2004-04-23 EP EP04760347A patent/EP1618358B1/en not_active Expired - Lifetime
- 2004-04-23 DE DE602004026171T patent/DE602004026171D1/de not_active Expired - Lifetime
- 2004-04-23 WO PCT/US2004/012574 patent/WO2004097354A1/en active Application Filing
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JPH10246668A (ja) * | 1997-03-03 | 1998-09-14 | Mitsubishi Electric Corp | 赤外線撮像装置 |
Also Published As
Publication number | Publication date |
---|---|
US7002154B2 (en) | 2006-02-21 |
KR100697170B1 (ko) | 2007-03-21 |
IL168659A (en) | 2010-04-29 |
US20040211907A1 (en) | 2004-10-28 |
WO2004097354A1 (en) | 2004-11-11 |
CA2512826A1 (en) | 2004-11-11 |
CA2512826C (en) | 2009-10-06 |
JP2006524823A (ja) | 2006-11-02 |
EP1618358A1 (en) | 2006-01-25 |
DE602004026171D1 (de) | 2010-05-06 |
KR20060004955A (ko) | 2006-01-16 |
EP1618358B1 (en) | 2010-03-24 |
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