JP4558811B2 - Drop test method and drop test apparatus - Google Patents

Description

  The present invention relates to a method and an apparatus for performing a drop test of a device and a drop test of a component such as a battery unit while being mounted on the device.

  Electronic devices such as personal computers and mobile phones are normally subjected to impact resistance verification and analysis by performing a drop test. With respect to the parts mounted on the electronic device, the drop test is performed in the actual use state, that is, the state mounted on the electronic device, rather than performing a drop test alone. For example, in a drop test of a personal computer, it is common to drop a battery unit or the like onto a barrier such as a floor surface from a predetermined height position.

  If the drop posture is different each time a drop test is performed, impact resistance verification and analysis may be affected. In other words, when the electronic device collides with the barrier from the housing and when it collides with the barrier from the battery unit, the impact force applied to each part will also be different, and even when dropped from the same height position Therefore, a large difference occurs in the degree of damage of parts to be verified. For this reason, when more accurate verification and analysis are required, the posture change is limited by the fixing member so that the electronic device has the same drop posture, and the drop test is performed from this state. (For example, refer to Patent Document 1).

JP 2005-30938 A

  As described above, if the drop test is performed in a state in which the posture change is limited, it is possible to always collide with the barrier from the same portion, so that it is possible to eliminate the influence due to the difference in the collision portion. However, when the change in posture is restricted, the movement of the electronic device after colliding with the barrier is also restricted. As a result, the impact resistance verification and analysis by the drop test may be different from the case where the electronic device is actually dropped.

  Moreover, when the electronic device or the battery unit that performs the drop test is relatively heavy, it is necessary to apply a member having sufficient strength as a fixing member. Therefore, it is difficult to ignore the mass of the fixing member, which may have a great influence on the result of the drop test.

  In view of the above circumstances, the object of the present invention is to provide a drop test method and apparatus capable of performing highly accurate verification and analysis on the impact resistance of a test target component regardless of the weight of the device or the test target component. It is to provide.

  In order to achieve the above object, the present invention is a method for performing a drop test on a device, wherein the device is rotatably supported around an axis passing through the center of gravity of the device, and the device is in an arbitrary posture. The dropping weight having the same mass as the device is dropped toward the device from a predetermined height position.

  Further, the present invention is a method for performing a drop test on a test target component mounted on the device, and the device can be rotated about an axis passing through the center of gravity of the device mounted with the test target component. The falling weight having the same mass as the device on which the test target component is mounted in a state where the device is stopped in an arbitrary posture is directed from the predetermined height position toward the test target component of the device. It is made to drop.

  Further, the present invention is a method for performing a drop test on a test target component mounted on a device, wherein the jig is centered on an axis passing through the center of gravity of the jig mounted with the test target component. A dropping weight having the same mass as that of the device on which the test target component is mounted in a state where the jig is rotatably supported and the jig is stopped in an arbitrary posture is tested from the predetermined height position. It is characterized by being dropped onto a part.

  According to a preferred aspect of the present invention, it is desirable that the jig has the same moment of inertia about the axis passing through the center of gravity when the test target component is mounted as in the device mounted with the test target component.

  Further, the present invention is a device for performing a drop test on a device, and has a mass that is the same as that of the device, and a supporting means for rotatably supporting the device around an axis passing through the center of gravity of the device. And a falling weight disposed so as to be slidable in the vertical direction, and is disposed in a state where the device is stopped in an arbitrary posture in a sliding region of the dropping weight, and The dropping weight is dropped toward the device.

  Further, the present invention is a device for performing a drop test on a test target component mounted on the device, and the device can be rotated about an axis passing through the center of gravity of the device mounted with the test target component. And a dropping weight that has the same mass as the device on which the test target component is mounted and is slidably disposed along the vertical direction. The apparatus supported by the supporting means is arranged in a state of being stopped in an arbitrary posture, and the dropping weight is dropped from a predetermined height position toward the test target part of the apparatus.

  Further, the present invention is an apparatus for performing a drop test on a test target component mounted on a device, and the center of gravity of the jig on which the test target component is mounted and the jig on which the test target component is mounted. A supporting means for rotatably supporting the jig around the passing axis, and a falling weight having the same mass as that of the device on which the test target component is mounted and slidable along the vertical direction The jig supported by the support means is arranged in a state where it is stopped in an arbitrary posture on the slide area of the dropping weight, and is directed from the predetermined height position toward the test target part of the jig. The dropping weight is dropped.

  According to a preferred aspect of the present invention, it is desirable that the jig has the same moment of inertia about the axis passing through the center of gravity when the test target component is mounted as in the device mounted with the test target component.

  According to the present invention, the device or the jig is rotatably supported around the axis passing through the center of gravity of the device, the device to which the test target component is mounted, or the jig to which the test target is mounted. Alternatively, the dropping weight is dropped with respect to the test target component. Therefore, the device or jig after colliding with the dropping weight can perform the same movement as when it actually falls. In addition, even if a device or jig to be tested is a relatively heavy object and has sufficient strength as a supporting means for rotatably supporting it, the mass of the device or jig will be reduced. It will not be added to tools or affect the movement of equipment or jigs. This makes it possible to perform highly accurate verification and analysis on impact resistance regardless of the weight of the device.

  Exemplary embodiments of a drop test method and a drop test apparatus according to the present invention will be explained below in detail with reference to the accompanying drawings.

  1 to 4 show a drop test apparatus according to an embodiment of the present invention. As shown in FIGS. 5A to 5C, the drop test apparatus exemplified here is a main body of a notebook personal computer (corresponding to the claimed device, hereinafter referred to as “notebook personal computer PC”). This is for performing a drop test on the battery unit (part to be tested) B mounted on the housing M. The battery unit B to be tested is of a cassette type that is detachably attached to the battery attachment part MB provided in the main body casing M of the notebook personal computer PC. In particular, in the present embodiment, it is referred to as a large-capacity battery unit. As shown in FIG. 5A, when the battery is mounted on the battery mounting part MB of the main body casing M, one side edge thereof is the main body casing M. The battery unit B protruding from the test object is the test target.

  As shown in FIGS. 1 to 4, the drop test apparatus includes a pair of pedestal members 20 on the upper surface of the reference table 10. Each of the leg column members 20 has a rectangular column shape with a rectangular cross section, and is erected vertically upward from the upper surface of the reference table 10 in a state in which a slide region 10a is secured between them. As shown in FIGS. 2 and 3, the slide area 10 a is a belt-like space set at the center of the upper surface of the reference table 10. The pair of pedestal members 20 are disposed at portions facing each other across the slide region 10a.

  As shown in FIGS. 1 to 4, a guide shaft 21 and a stopper bolt 22 are erected on each pedestal member 20 upward from each upper end surface. The guide shaft 21 is a columnar member having the same outer diameter over the entire length, and is arranged along the vertical direction from each leg pillar member 20. These guide shafts 21 are attached to the upper end of the frame 30 via a connecting bracket 23 that connects the upper ends of each other. The frame 30 is a rectangular parallelepiped frame configured on the upper part of the reference table 10 by appropriately combining a plurality of steel materials.

  A pair of guide shafts 21 is provided with a slide plate (falling weight) 40 between them. The slide plate 40 includes cylindrical bodies 41 at both ends, and can slide along the extending direction of the guide shaft 21 by inserting the guide shafts 21 into the cylindrical bodies 41 respectively. . Although not clearly shown in the drawing, the cylindrical body 41 of the slide plate 40 is provided with a ball-type slide bearing for reducing sliding resistance with the guide shaft 21 on the inner peripheral surface thereof.

  An adjustment weight (falling weight) 45 is attached to a portion of the slide plate 40 located between the cylindrical bodies 41. The adjustment weight 45 is for adjusting the mass of the slide plate 40 so as to be the same as that of the notebook personal computer PC in which the battery unit B is mounted on the main body housing M.

  The stopper bolt 22 defines the lower limit position of the slide plate 40 by contacting the lower surface of the slide plate 40. An elastic member 46 for reducing the impact force when the slide plate 40 collides is attached to a portion of the slide plate 40 that contacts the stopper bolt 22.

  Further, the drop test apparatus includes two pairs of guide brackets 50 and a support block unit (support means) 60 on the upper surface of the reference table 10. The guide bracket 50 has an L shape in which a mounting portion 51 having a flat plate shape and a slide guide portion 52 bent at a right angle from one end of the mounting portion 51 are integrally formed. The pair of guide brackets 50 are arranged with the slide guide portions 52 facing each other across the above-described slide region 10 a, and are fixed to the upper surface of the reference table 10 via the individual attachment portions 51. The slide guide portions 52 of the individual guide brackets 50 are arranged so that the guide surfaces 52a facing each other coincide with the edge of the slide region 10a.

  The support block unit 60 includes a pair of support plates 61. The support plates 61 are rectangular flat plates having the same size, and are connected to each other with a gap larger than the thickness dimension of the battery unit B being secured therebetween. The support plates 61 connected to each other have a thickness that is the same as that of the slide region 10a of the reference table 10, and are formed on the guide surfaces 52a of the slide guide portions 52 that are opposed to each other in the pair of guide brackets 50. It is possible to slide the upper surface of the reference table 10 in a slid state.

  The support block unit 60 is provided with shaft mounting holes 61a at portions of the support plate 61 facing each other. The shaft mounting hole 61a is formed through a portion located above each support plate 61 and extends along the horizontal direction.

  On the other hand, the drop test apparatus includes a jig 70. As shown in FIG. 6A, the jig 70 includes a jig body 71 and a ballast 72. The jig main body 71 is a block-like member having a thickness dimension similar to that of the main body casing M of the notebook personal computer PC, and has a mounting portion 71a on one side edge thereof. The mounting portion 71a is a recess in which the battery unit B can be mounted in the same state as the main body housing M of the notebook personal computer PC. The mounting portion 71a of the jig main body 71 is configured to have the same dimensions as the battery mounting portion MB provided in the main body housing M of the notebook personal computer PC, and one side edge portion of the battery unit B when the battery unit B is mounted. The protruding position and the protruding amount from the jig 70 are the same as when the main body casing M of the notebook personal computer PC is mounted.

  The ballast 72 is a weight for matching the mass of the jig 70 when the battery unit B is mounted on the mounting portion 71a of the jig body 71 with the mass of the actual notebook personal computer PC on which the battery unit B is mounted. is there. In the present embodiment, particularly, as shown in FIG. 6B, the ballast 72 is attached to the jig main body 71 via the adjustment bracket 73, and when the adjustment bracket 73 is adjusted, the jig main body It is comprised so that the attachment position of the ballast 72 with respect to 71 can be changed.

  The jig body 71 of the jig 70 is provided with a shaft insertion hole 71b. The shaft insertion hole 71 b is a through hole provided in a portion serving as the center of gravity of the jig 70 when the battery unit B is mounted on the mounting portion 71 a, and the shaft insertion hole 61 a formed in the support plate 61 of the support block unit 60. They are formed with the same inner diameter. The shaft insertion hole 71b has a relative position between the axis of the battery and the battery unit B mounted on the jig main body 71, so that the center of gravity of the notebook personal computer PC and the battery unit B when the battery unit B is mounted on the main body housing M. It is comprised so that it may correspond with the relative position of. Furthermore, the shaft insertion hole 71b is a shaft through which the moment of inertia around the axis of the jig 70 with the battery unit B mounted passes through the center of gravity of the notebook personal computer PC with the battery unit B mounted on the main body housing M. It is configured to match the moment of inertia around the center.

  When performing the drop test of the battery unit B mounted on the notebook personal computer PC by applying the drop test apparatus configured as described above, first, as shown in FIG. 2, the battery is mounted on the mounting portion 71a of the jig body 71. The unit B is mounted, and the jig 70 mounted with the battery unit B is supported on the support block unit 60. When the jig 70 is supported on the support block unit 60, as shown in FIG. 3, the shaft member (support means) 80 inserted from the shaft mounting hole 61 a of one support plate 61 is inserted into the shaft insertion hole of the jig 70. What is necessary is just to insert the edge part of the shaft member 80 which penetrated 71b and penetrated the shaft insertion hole 71b of the jig | tool 70 in the shaft mounting hole 61a of the other support plate 61. FIG. The shaft member 80 applied in this case has a dimension such that the outer diameter of the shaft member 80 is slidably inserted into the shaft insertion hole 71 b of the jig main body 71.

  In the state where the shaft member 80 is inserted as described above, the jig 70 is rotatably supported together with the battery unit B around the shaft center of the shaft member 80, and external force is applied to the jig 70 or the battery unit B. When added, the shaft member 80 can freely rotate about the axis.

  Next, the support block unit 60 that supports the jig 70 is placed on the upper surface of the reference table 10, and the slide region 10a is appropriately slid in a state of being in sliding contact with the two pairs of guide brackets 50, as shown in FIG. As described above, the support block unit 60 is disposed at a position between the pair of leg pillar members 20.

  Next, by appropriately rotating around the axis of the shaft member 80, for example, as shown in FIG. 4, the battery unit B held by the jig 70 protrudes from the upper surface of the support plate 61 and collides when dropped. Place the site on top. In the illustrated example, the battery unit B is arranged so that the corners are at the top. Further, the support block unit 60 is appropriately slid on the upper surface of the reference table 10 to adjust the protruding corner portion of the battery unit B to a position where it abuts on the lower surface of the slide plate 40.

  Finally, after raising the slide plate 40 along the guide shaft 21, the posture of the jig 70 is stopped in the state described above, and the slide plate 40 is dropped from a preset height position H to What is necessary is just to make it collide with a corner | angular part. The jig 70 after the slide plate 40 abuts rotates around the axis of the shaft member 80 together with the battery unit B, as shown on the left side in FIG.

  Here, the slide plate 40 that collides with the battery unit B is adjusted so as to have the same mass as the notebook personal computer PC in which the battery unit B is mounted on the main body housing M by the adjustment weight 45 as described above. is there. Therefore, the impact force applied to the battery unit B by the collision of the slide plate 40 is the same as when the notebook personal computer PC with the battery unit B mounted is dropped from the same height position H.

  Moreover, the jig 70 equipped with the battery unit B has a moment of inertia around the axis of the shaft member 80, in other words, a moment of inertia around the axis passing through the center of gravity of the notebook personal computer PC equipped with the battery unit B. This coincides with the moment of inertia around the axis passing through the center of gravity. Accordingly, as shown in the figure on the right side in FIG. 7, the behavior of the notebook personal computer PC after the notebook personal computer PC actually mounted with the battery unit B is dropped and the corners of the battery unit B collide with the floor F is shown. The behavior exhibited by the jig 70 after the above-described drop test apparatus is applied and the slide plate 40 is dropped and collided matches. Specifically, both the notebook personal computer PC and the jig 70 rotate freely in the direction of the arrow A without any restriction due to the moment about the axis center passing through the center of gravity. As a result, if the drop test apparatus is applied, the slide plate 40 is caused to drop and collide with the battery unit B mounted on the jig 70, but the notebook personal computer PC actually mounted with the battery unit B is placed on the floor surface. The impact force applied to the battery unit B when dropped to F can be faithfully reproduced.

  Further, in the drop test apparatus described above, the slide plate 40 moving along the pair of guide shafts 21 is dropped, and the jig 70 equipped with the battery unit B is supported by the support block unit 60 via the shaft member 80. Stops in the posture supported by. Accordingly, the slide plate 40 can always collide with the battery unit B in the same posture without limiting the posture change of the jig or adding unnecessary mass as in the conventional drop test device.

  Further, even when the battery unit B and the notebook personal computer PC (the jig 70) to which the battery unit B is mounted are relatively heavy, it is sufficient to apply a highly rigid shaft member 80 and support plate 61. There is no effect on the rotation of the unit B or the notebook personal computer PC (the jig 70) on which the unit B is mounted.

  As a result, according to the drop test apparatus, it is possible to perform highly accurate verification and analysis on the impact resistance of the battery unit B regardless of the weight of the battery unit B or the notebook personal computer PC (the jig 70). It becomes possible.

  In the above-described embodiment, the drop test of the battery unit B to be attached to the notebook personal computer PC is exemplified. However, the battery unit B is not necessarily limited to the battery unit B of the notebook personal computer PC. It is possible to perform a drop test using other parts as test target parts. Further, in the above-described embodiment when the test of the battery unit B is performed, an example in which a part protrudes when the battery unit B is mounted on the main body housing M is illustrated, but this is not necessarily limited thereto.

  Further, in the above-described embodiment, the test target component is mounted on the jig 70 and is rotatably supported to perform the drop test. However, the jig 70 is not necessarily applied. That is, even if the test object part is mounted on an actual device and the slide plate 40 is dropped and collided in a state where the test target part is rotatably supported by the support block unit 60, the same effect can be obtained.

It is a perspective view which shows notionally the drop test apparatus which is embodiment of this invention. It is a disassembled perspective view of the drop test apparatus shown in FIG. FIG. 2 is a partial cross-sectional side view of the drop test device shown in FIG. 1. It is a front view of the drop test apparatus shown in FIG. It is the perspective view which looked at the apparatus which performs a drop test from the back side. It is a disassembled perspective view which shows the state which removed the test object component from the apparatus shown to FIGS. FIG. 6 is a bottom view of FIG. It is a conceptual diagram of the jig | tool applied with the drop test apparatus shown in FIG. It is a conceptual diagram which shows the state which attached the test object component to the jig | tool shown to FIGS. It is a conceptual diagram for comparing the behavior when the drop test apparatus shown in FIG. 1 is implemented with the behavior when the device is actually dropped.

Explanation of symbols

10 reference table 20 pedestal member 21 guide shaft 40 slide plate 45 adjustment weight 60 support block unit (support means)
61 Bearing plate 70 Jig 80 Shaft member (supporting means)
B Battery unit (parts to be tested)
PC notebook computer (equipment)

Claims (8)

A method for performing a drop test on equipment,
The device is supported rotatably about the axis passing through the center of gravity of the device,
A drop test method, wherein a drop weight having the same mass as the device is dropped toward the device from a predetermined height while the device is stopped in an arbitrary posture. A method of performing a drop test on a test target component mounted on a device,
The device is rotatably supported around an axis that passes through the center of gravity of the device on which the test target part is mounted.
Dropping a falling weight having the same mass as a device on which the test target component is mounted in a state where the device is stopped in an arbitrary posture from a predetermined height position toward the test target component of the device. Characteristic drop test method. A method of performing a drop test on a test target component mounted on a device,
The jig is rotatably supported around an axis passing through the center of gravity of the jig on which the test target part is mounted,
Dropping a falling weight having the same mass as a device on which the test target component is mounted in a state where the jig is stopped in an arbitrary posture from a predetermined height position onto the test target component of the jig. Characteristic drop test method.   The drop test method according to claim 3, wherein the jig has the same moment of inertia about the axis passing through the center of gravity when the test target component is mounted as in the device mounted with the test target component. An apparatus for performing a drop test on equipment,
A support means for rotatably supporting the device about an axis passing through the center of gravity of the device;
A falling weight having the same mass as the device and slidable along the vertical direction, and the device is disposed in a sliding area of the dropping weight in a state of being stopped in an arbitrary posture. A drop test apparatus for dropping the drop weight from a predetermined height toward the device. A device that performs a drop test on a test target component mounted on a device,
A supporting means for rotatably supporting the device around an axis passing through the center of gravity of the device on which the test target part is mounted;
A falling weight having the same mass as that of the equipment on which the test target component is mounted, and slidably arranged along the vertical direction, and supported by the supporting means on the sliding area of the dropping weight Is placed in a state of being stopped in an arbitrary posture, and the drop weight is dropped from a predetermined height position toward the test target part of the device. A device that performs a drop test on a test target component mounted on a device,
A jig equipped with the test target part,
A support means for rotatably supporting the jig around the axis passing through the center of gravity of the jig on which the test object part is mounted;
A drop weight having the same mass as that of the device on which the test target component is mounted and slidably disposed along the vertical direction, and a support that is supported by the support means on the slide area of the drop weight. A drop test apparatus, wherein a tool is arranged in a state of being stopped in an arbitrary posture, and the dropping weight is dropped from a predetermined height position toward a test target part of the jig.   The drop test apparatus according to claim 7, wherein the jig has the same moment of inertia about the axis passing through the center of gravity when the test target component is mounted as in the device mounted with the test target component.

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