JP4553437B2 - 画像検査システム及び制御方法 - Google Patents

画像検査システム及び制御方法 Download PDF

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Publication number
JP4553437B2
JP4553437B2 JP2000026420A JP2000026420A JP4553437B2 JP 4553437 B2 JP4553437 B2 JP 4553437B2 JP 2000026420 A JP2000026420 A JP 2000026420A JP 2000026420 A JP2000026420 A JP 2000026420A JP 4553437 B2 JP4553437 B2 JP 4553437B2
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JP
Japan
Prior art keywords
image
virtual
inspection
image inspection
control
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Expired - Fee Related
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JP2000026420A
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English (en)
Japanese (ja)
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JP2000235596A (ja
Inventor
エム ワッサーマン リチャード
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Mitutoyo Corp
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Mitutoyo Corp
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T15/00—3D [Three Dimensional] image rendering

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Graphics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Software Systems (AREA)
  • Processing Or Creating Images (AREA)
  • Image Processing (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
JP2000026420A 1999-02-03 2000-02-03 画像検査システム及び制御方法 Expired - Fee Related JP4553437B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/243,689 US7092860B1 (en) 1999-02-03 1999-02-03 Hardware simulation systems and methods for vision inspection systems
US09/243.689 1999-02-03

Publications (2)

Publication Number Publication Date
JP2000235596A JP2000235596A (ja) 2000-08-29
JP4553437B2 true JP4553437B2 (ja) 2010-09-29

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JP2000026420A Expired - Fee Related JP4553437B2 (ja) 1999-02-03 2000-02-03 画像検査システム及び制御方法

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US (1) US7092860B1 (de)
EP (1) EP1026637A3 (de)
JP (1) JP4553437B2 (de)

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US20020065637A1 (en) * 2000-11-30 2002-05-30 Thompson John S. Method and apparatus for simulating the measurement of a part without using a physical measurement system
US7961201B1 (en) 2000-12-21 2011-06-14 Cognex Corporation Method and apparatus for producing graphical machine vision content for distribution via a network
US7962898B1 (en) * 2000-12-29 2011-06-14 Cognex Corporation Optimized distribution of machine vision processing
DK1636104T3 (da) * 2002-12-10 2010-10-11 Chep Technology Pty Ltd Automatiseret palleinspektion og -reparation
JP2004299010A (ja) * 2003-03-31 2004-10-28 Fanuc Ltd ロボットのたわみ補正装置及びたわみ補正方法
JP3732494B2 (ja) * 2003-10-31 2006-01-05 ファナック株式会社 シミュレーション装置
US7725206B2 (en) * 2003-11-12 2010-05-25 The Boeing Company System and method for manufacturing and after-market support using as-built data
JP4238256B2 (ja) * 2006-06-06 2009-03-18 ファナック株式会社 ロボットシミュレーション装置
JP2008021092A (ja) 2006-07-12 2008-01-31 Fanuc Ltd ロボットシステムのシミュレーション装置
US20080320408A1 (en) * 2007-06-21 2008-12-25 Dziezanowski Joseph J Devices, Systems, and Methods Regarding Machine Vision User Interfaces
JP4302160B2 (ja) * 2007-09-12 2009-07-22 ファナック株式会社 ロボットによるパレタイジング作業のためのロボットプログラミング装置
JP4347386B2 (ja) * 2008-01-23 2009-10-21 ファナック株式会社 加工用ロボットプラグラムの作成装置
US8239177B2 (en) * 2008-08-01 2012-08-07 National Instruments Corporation Simulation of a motion system including a mechanical modeler with interpolation
DE102009034244A1 (de) * 2009-07-22 2011-01-27 Kuka Roboter Gmbh Verfahren und Vorrichtung zur Vermessung eines Bauteils
US8542297B2 (en) 2011-08-05 2013-09-24 Quality Vision International, Inc. Method for automatically adjusting the levels of illumination sources in an optical measurement machine
DE102013209770B4 (de) * 2013-05-27 2015-02-05 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Bestimmung von einstellbaren Parametern mehrerer Koordinatenmessgeräte sowie Verfahren und Vorrichtung zur Erzeugung mindestens eines virtuellen Abbilds eines Messobjekts
CN106415198B (zh) * 2014-01-20 2019-12-10 卡尔蔡司工业测量技术有限公司 图像记录方法和执行该方法的坐标测量机
US10796426B2 (en) * 2018-11-15 2020-10-06 The Gillette Company Llc Optimizing a computer vision inspection station
US20240029407A1 (en) * 2022-07-22 2024-01-25 General Electric Company Machine learning model training corpus apparatus and method

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Also Published As

Publication number Publication date
EP1026637A3 (de) 2001-08-29
EP1026637A2 (de) 2000-08-09
JP2000235596A (ja) 2000-08-29
US7092860B1 (en) 2006-08-15

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