JP4517366B2 - Sampling instrument - Google Patents

Sampling instrument Download PDF

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JP4517366B2
JP4517366B2 JP2005308725A JP2005308725A JP4517366B2 JP 4517366 B2 JP4517366 B2 JP 4517366B2 JP 2005308725 A JP2005308725 A JP 2005308725A JP 2005308725 A JP2005308725 A JP 2005308725A JP 4517366 B2 JP4517366 B2 JP 4517366B2
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sample
infrared
spectroscopic analysis
infrared spectroscopic
analysis
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JP2007114159A (en
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忠志 諸石
玲一 青柳
恵子 望月
康記 小林
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Victor Company of Japan Ltd
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Victor Company of Japan Ltd
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Description

本発明は、赤外線分光分析する際、分析に適した試料厚さにする試料採取器具に関する。 The present invention, when the infrared spectroscopic analysis, to specimen collecting tool to sample thickness suitable for analysis.

従来の赤外線分光分析用試料採取器具は、特許文献１に記載されている 。
この赤外線分光分析用試料採取器具は、保持部の先端に刃状部と被照射部を有し、保持部の後端には柄を有している。保持部の底部と柄の底部とは段差がなく、面一である。更に、被照射部の上方を覆い、かつ着脱自在のキャップを有している。 A conventional sampling instrument for infrared spectroscopic analysis is described in Patent Document 1.
This infrared spectroscopic sample collection instrument has a blade-like portion and an irradiated portion at the front end of the holding portion, and has a handle at the rear end of the holding portion. The bottom part of the holding part and the bottom part of the handle have no step and are flush with each other. Furthermore, it has an detachable cap that covers the irradiated portion.

そして、柄を持ち、刃状部を試料台上に載置された試料に接触させ、柄を押して試料を試料台から剥ぎ取って被照射部に収納した後、キャップにより被照射部を覆う。この試料が収納された被照射部に赤外線を照射して試料固有の吸収スペクトルを観測することにより分光分析を行う。
実開平６−５８３５３号公報 The handle is held, the blade-like portion is brought into contact with the sample placed on the sample table, the sample is pushed off by peeling the sample from the sample table and stored in the irradiated portion, and then the irradiated portion is covered with a cap. Spectral analysis is performed by irradiating an irradiated portion containing the sample with infrared rays and observing an absorption spectrum unique to the sample.
Japanese Utility Model Publication No. 6-58353

しかしながら、試料台上に載置された試料を刃状部で剥ぎ取って被照射部に収納するだけであるので、赤外線分光分析に適した試料厚さを得ることができなかった。赤外線分光分析に適した試料の厚さは、１〜２μｍにする必要がある。このため、被照射部に試料を収納した後、試料厚さを上記した値にするために再度調整する必要があった。   However, since the sample placed on the sample stage is simply peeled off by the blade-like portion and stored in the irradiated portion, a sample thickness suitable for infrared spectroscopic analysis cannot be obtained. The thickness of the sample suitable for infrared spectroscopic analysis needs to be 1 to 2 μm. For this reason, after storing a sample in an irradiated part, it was necessary to adjust again in order to make sample thickness into the above-mentioned value.

そこで、本発明は、前述の課題に鑑みて提案されるものであって、１回の試料採取により、赤外分光分析に適した厚さの試料が得られる試料採取器具を提供することを目的とする。 The present invention, which is proposed in view of the problems described above by one sampling, to provide a specimen sampling device thick samples suitable for infrared spectroscopic analysis are obtained Objective.

本発明は、赤外線を試料に照射して前記試料の固有スペクトルを測定する赤外線分光分析に用いられる試料採取器具において、円錐状の先端部を有し、前記先端部の周方向に沿って前記試料を収納する凹部が複数設けられていることを特徴とする試料採取器具を提供する。 The present invention, in the specimen collecting device for use in infrared spectroscopic analysis to measure the intrinsic spectrum of the sample by irradiating infrared rays onto the sample has a conical tip, along the circumferential direction of the tip providing specimen collecting tool, wherein a recess for accommodating the sample is provided with a plurality.

本発明によれば、先端部に試料を収納するための赤外線が透過する深さ１〜２μｍの凹部を有するので、１回の試料採取により、赤外分光分析に適した厚さの試料を得ることができる。   According to the present invention, since there is a concave portion having a depth of 1 to 2 μm through which infrared rays for accommodating a sample are stored at the tip portion, a sample having a thickness suitable for infrared spectroscopic analysis is obtained by sampling once. be able to.

以下、本発明に係る赤外線分光分析用試料採取器具の実施の形態について、図１を参照して詳細に説明する。
図１は、本発明の実施の形態に係る赤外線分光分析用試料採取器具を示し、（Ａ）は先端部を示す側面図であり、（Ｂ）は凹部を示す断面図である。図２は、赤外線分光分析用試料採取器具を試料測定台上に載置した状態を示す斜視図である。 Hereinafter, an embodiment of a sample collecting instrument for infrared spectroscopic analysis according to the present invention will be described in detail with reference to FIG.
FIG. 1 shows a sample collecting instrument for infrared spectroscopic analysis according to an embodiment of the present invention, (A) is a side view showing a tip portion, and (B) is a sectional view showing a recess. FIG. 2 is a perspective view showing a state in which the sample collection instrument for infrared spectroscopic analysis is placed on the sample measurement table.

図１（Ａ）に示すように、赤外線分光分析用試料採取器具１は、直径０．５〜２ｍｍの丸い棒状であり、かつこの棒の先端部２近傍が細く尖がった形状を有している。図１（Ｂ）に示すように、先端部２には、φ１０〜１００μｍで深さ１〜２μｍの凹部３が複数個形成されている。凹部３には試料４が収納される。先端部２とは最先端から５ｍｍ程度までをいう。
この赤外線分光分析用試料採取器具１の材質としては、ステンレス、金、Ａｌ等の赤外吸収がないものが好適である。これらの材料を他の材料からなる採取器具にコーティングしても良い。 As shown in FIG. 1 (A), the infrared spectroscopic sample collection instrument 1 has a round bar shape with a diameter of 0.5 to 2 mm, and has a shape in which the vicinity of the tip 2 of the bar is thin and sharp. ing. As shown in FIG. 1 (B), a plurality of recesses 3 having a diameter of 10 to 100 μm and a depth of 1 to 2 μm are formed at the tip 2. A sample 4 is stored in the recess 3. The tip 2 is from the most advanced to about 5 mm.
As the material for the sample collection instrument 1 for infrared spectroscopic analysis, materials having no infrared absorption such as stainless steel, gold, and Al are suitable. These materials may be coated on a sampling device made of other materials.

そして、赤外線分光分析用試料採取器具１の表面は、顕微測定用フーリエ変換赤外分光光度計による測定ができる波長２．５〜１６ｎｍの赤外光が反射できる程度の鏡面処理が行われている。
赤外線分析分析は、以下のようにして行うことができる。
図２に示すように、試料４を赤外線分光分析用試料採取器具１の凹部３の表面と面一になるように収納した後、先端部２を試料測定台５から突き出るようにして、試料測定台５の傾斜部５Ａに赤外線分光分析用試料採取器具１を固定する。次に、試料４に赤外線を照射し、試料４を通過し、凹部３の底部で反射して得られた赤外反射光を分光分析機器で測定及び解析を行う。 And the surface of the sample collection instrument 1 for infrared spectroscopic analysis is subjected to a mirror finish that can reflect infrared light having a wavelength of 2.5 to 16 nm that can be measured by a Fourier transform infrared spectrophotometer for microscopic measurement. .
Infrared analysis can be performed as follows.
As shown in FIG. 2, after storing the sample 4 so as to be flush with the surface of the concave portion 3 of the sampling device 1 for infrared spectroscopic analysis, the tip portion 2 protrudes from the sample measuring table 5 to measure the sample. The infrared spectroscopic sample collection instrument 1 is fixed to the inclined portion 5A of the table 5. Next, the sample 4 is irradiated with infrared rays, passed through the sample 4, and the infrared reflected light obtained by being reflected at the bottom of the recess 3 is measured and analyzed with a spectroscopic analyzer.

このようにすることにより、赤外線分光分析用試料採取器具１は赤外線分光分析に適した試料厚さの凹部３を有するので、１回の試料採取により、赤外分光分析に適した厚さの試料を得ることができる。   By doing in this way, since the sampling instrument 1 for infrared spectroscopic analysis has the recessed part 3 of the sample thickness suitable for infrared spectroscopic analysis, the sample of thickness suitable for infrared spectroscopic analysis is obtained by one sampling. Can be obtained.

本発明の実施の形態に係る赤外線分光分析用試料採取器具を示す斜視図である。It is a perspective view which shows the sampling instrument for infrared spectroscopy analysis which concerns on embodiment of this invention. 赤外線分光分析用試料採取器具を試料測定台上に載置した状態を示す斜視図である。It is a perspective view which shows the state which mounted the sample collection instrument for infrared spectroscopy analysis on the sample measurement stand.

符号の説明Explanation of symbols

１…赤外線分光分析用試料採取器具、２…先端部、３…凹部、４…試料、５…試料測定台

DESCRIPTION OF SYMBOLS 1 ... Sample collection instrument for infrared spectroscopic analysis, 2 ... Tip part, 3 ... Recessed part, 4 ... Sample, 5 ... Sample measuring stand

Claims (1)

赤外線を試料に照射して前記試料の固有スペクトルを測定する赤外線分光分析に用いられる試料採取器具において、
円錐状の先端部を有し、
前記先端部の周方向に沿って前記試料を収納する凹部が複数設けられていることを特徴とする試料採取器具。 In specimen collecting device for use in infrared spectroscopic analysis to measure the intrinsic spectrum of the sample by irradiating infrared rays onto the sample,
Having a conical tip,
Specimen collecting device, wherein a recess for accommodating the sample along the circumferential direction of the distal end portion is provided with a plurality.
JP2005308725A 2005-10-24 2005-10-24 Sampling instrument Active JP4517366B2 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111185854A (en) * 2020-01-20 2020-05-22 武汉科技大学 Spark spectrum analysis surface water jet cutting method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01196539A (en) * 1988-02-01 1989-08-08 Fuji Photo Film Co Ltd Plate for measuring infrared diffusive reflection spectrum
JPH1144616A (en) * 1997-07-25 1999-02-16 Sony Corp Sampling method, optical analysis method thereof and sampling tool used to these methods
JP2000338013A (en) * 1999-05-25 2000-12-08 Shimadzu Corp Sampler for measuring diffused reflected light

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01196539A (en) * 1988-02-01 1989-08-08 Fuji Photo Film Co Ltd Plate for measuring infrared diffusive reflection spectrum
JPH1144616A (en) * 1997-07-25 1999-02-16 Sony Corp Sampling method, optical analysis method thereof and sampling tool used to these methods
JP2000338013A (en) * 1999-05-25 2000-12-08 Shimadzu Corp Sampler for measuring diffused reflected light

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111185854A (en) * 2020-01-20 2020-05-22 武汉科技大学 Spark spectrum analysis surface water jet cutting method

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