JP4361344B2 - Seal structure for substrate processing apparatus and substrate processing apparatus - Google Patents

Seal structure for substrate processing apparatus and substrate processing apparatus Download PDF

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JP4361344B2
JP4361344B2 JP2003354648A JP2003354648A JP4361344B2 JP 4361344 B2 JP4361344 B2 JP 4361344B2 JP 2003354648 A JP2003354648 A JP 2003354648A JP 2003354648 A JP2003354648 A JP 2003354648A JP 4361344 B2 JP4361344 B2 JP 4361344B2
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substrate
seal
frame
wall surface
fitting groove
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JP2005118643A (en
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靖司 八木
裕明 小林
勝美 渡辺
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Nichias Corp
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Description

本発明は、処理される基板に、下端部に弾性材料からなるシール部材を有する枠体を載置し、基板の表面と枠体の内壁面とで形成される空間に処理液を供給して基板の処理を行う基板処理装置の枠体と基板との間のシール構造に関する。   According to the present invention, a frame having a sealing member made of an elastic material is placed on a substrate to be processed, and a processing liquid is supplied to a space formed by the surface of the substrate and the inner wall surface of the frame. The present invention relates to a seal structure between a frame body and a substrate of a substrate processing apparatus for processing a substrate.

近年、半導体素子やFPD(Flat panel display)の製造工程においては、配線の微細化達成及び収率の向上を行うために様々な創意工夫がなされている。例えば、CMP(Chemical Mechanical Polishing)、各種洗浄、コータ&ディベロッパー、エッチング、電解メッキ等を行うウエットプロセスにおいては、上記目的を達成するために、半導体ウエハやFPD用ガラス基板等の基板と各種薬液との接液方法や薬液の供給方法、また基板の動き等、様々な制御が工夫されており、各装置メーカーのノウハウとなっている。   2. Description of the Related Art In recent years, in the manufacturing process of semiconductor elements and FPDs (Flat panel displays), various ingenuity has been made to achieve miniaturization of wiring and improve yield. For example, in a wet process such as CMP (Chemical Mechanical Polishing), various types of cleaning, coater & developer, etching, electrolytic plating, etc., a substrate such as a semiconductor wafer or a glass substrate for FPD and various chemical solutions Various controls have been devised, such as the liquid contact method, chemical supply method, and substrate movement, and this has become the know-how of each device manufacturer.

また、ウエットプロセスでは、図5に断面図にて模式的に示すように、下端面10bに弾性材料からなるOリング5を備える円筒状(半導体ウエハ)または矩形(FPD用ガラス)の枠体10を基板4の上に載置し、枠体10を基板方向に押圧してOリング5を基板4の周縁に密着させて基板4の表面と枠体10の内壁面10aとで空間を形成し、この空間に薬液Lを注入して基板4の表面を処理することが行われている(例えば、特許文献1〜4参照)。   In the wet process, as schematically shown in a sectional view in FIG. 5, a cylindrical (semiconductor wafer) or rectangular (FPD glass) frame 10 having an O-ring 5 made of an elastic material on the lower end surface 10b. Is placed on the substrate 4, the frame body 10 is pressed toward the substrate, and the O-ring 5 is brought into close contact with the peripheral edge of the substrate 4 to form a space between the surface of the substrate 4 and the inner wall surface 10 a of the frame body 10. The surface of the substrate 4 is treated by injecting a chemical solution L into this space (see, for example, Patent Documents 1 to 4).

特開平6−116796号公報JP-A-6-117996 特開平7−99342号公報JP-A-7-99342 特開平11−24615号公報Japanese Patent Laid-Open No. 11-24615 特開2003−55797号公報JP 2003-55797 A

特許文献1に記載された基板4とOリング5によるシール構造では、Oリング5が枠体10の下端面10bに設けられたあり溝6に嵌入されているため、図5に示されるように、基板4とOリング5並びに枠体10の内壁側10aの下端面10で微小隙間Cが形成され、この微小隙間Cに薬液Lが浸入する。ウエットプロセスでは、薬液Lの種類を変えて複数回処理することが多く、その場合、図示される基板4とOリング5によるシール構造を維持したまま、処理済みの薬液Lを排除し、基板4及び枠体10の内壁面10aを洗浄した後、新たな薬液Lを注入することが行われる。そのため、微小隙間Cに前段の処理で使用した薬液Lが残留していると、新たな処理で使用する薬液Lに混入して悪影響を及ぼすおそれがある。   In the seal structure including the substrate 4 and the O-ring 5 described in Patent Document 1, since the O-ring 5 is fitted into the dovetail groove 6 provided on the lower end surface 10b of the frame body 10, as shown in FIG. A minute gap C is formed between the substrate 4, the O-ring 5, and the lower end surface 10 on the inner wall side 10 a of the frame 10, and the chemical solution L enters the minute gap C. In the wet process, the type of the chemical solution L is often changed and processed multiple times. In that case, the processed chemical solution L is removed while maintaining the sealing structure formed by the substrate 4 and the O-ring 5 shown in the figure. And after washing | cleaning the inner wall face 10a of the frame 10, inject | pouring new chemical | medical solution L is performed. Therefore, if the chemical liquid L used in the previous process remains in the minute gap C, the chemical liquid L used in the new process may be mixed and adversely affected.

微小隙間Cに残留する薬液Lを遠心力で除去したり、拭き取ること等も考えられるが、微小隙間Cに浸入した薬液Lは表面張力により排出され難く、完全に除去することは困難である。また、場合によっては、薬液Lが枠体10のあり溝6の内部にも浸入していることがあり、残留液の排除がより一層困難になっている。   The chemical liquid L remaining in the minute gap C may be removed or wiped off by centrifugal force, but the chemical liquid L that has entered the minute gap C is difficult to be discharged due to surface tension and is difficult to remove completely. Moreover, depending on the case, the chemical | medical solution L may have penetrate | invaded also into the inside of the dovetail groove 6 of the frame 10, and removal of a residual liquid is made still more difficult.

本発明は上記事情に鑑みてなされたもので、薬液残留が起こり難いシール構造並びに薬液による処理を安定して行い得る基板処理装置を提供することを目的とする。   The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a sealing structure that hardly causes chemical liquid residue and a substrate processing apparatus that can stably perform processing using the chemical liquid.

上記目的を達成するため、本発明は、以下の基板処理装置用シール構造及び基板処理装置を提供する。
(1)処理される基板に、下端部に弾性材料からなるシール部材を有する枠体を載置し、基板の表面と枠体の内壁面とで形成される空間に処理液を供給して基板の処理を行う基板処理装置の枠体と基板との間のシール構造であって、
枠体は、基板と対向する下端面から所定高さの位置に、内壁面の全周にわたり所定幅で開口する嵌合溝が形成され、かつ嵌合溝の下端面側の内壁面がシール部材のシール部の厚さ分だけ後退して断面略L字状を呈するシール部材収納用の空所が形成されており、
シール部材は、内壁面を形成する所定厚のシール部と、シール部の上端部から垂直に外方に屈曲して枠体の嵌合溝に嵌入される嵌合部とを有する断面略逆L字状を呈し、かつ嵌合部は枠体の嵌合溝に挿入可能な厚さに形成された基部と、基部の上面に線状に周回して設けられ基部と枠体の嵌合溝との隙間を塞ぐ高さの突部とで形成されており、
シール部材の嵌合部を枠体の嵌合溝に嵌入して、枠体の内壁面とシール部材のシール面とで基板まで同一内径で連続する内壁面を形成することを特徴とする基板処理装置用シール構造。
(2)枠体の嵌合溝の開口幅が、シール部材の基部の厚さと突部の高さとの合計の80〜98%であり、かつ内壁面の後退端面からの奥行がシール部材のシール部の厚さの120〜300%であることを特徴とする上記(1)記載の基板処理装置用シール構造。
(3)シール部材が、ビニリデンフロライド/ヘキサフロロプロピレン系共重合体、ビニリデンフロライド/ヘキサフロロプロピレン/テトラフロロエチレン系共重合体またはテトラフロロエチレン/プロピレン/ビニリデンフロライド系共重合体をゴム成分とするゴム組成物からなることを特徴とする上記(1)または(2)記載の基板処理装置用シール構造。
(4)処理される基板に、下端部に弾性材料からなるシール部材を有する枠体を載置し、基板の表面と枠体の内壁面とで形成される空間に処理液を供給して基板の処理を行う基板処理装置であって、
基板と枠体との間が上記(1)〜(3)の何れか1項に記載のシール構造にてシールされていることを特徴とする基板処理装置
In order to achieve the above object, the present invention provides the following sealing structure for a substrate processing apparatus and substrate processing apparatus.
(1) A substrate having a sealing member made of an elastic material at the lower end is placed on a substrate to be processed, and a processing liquid is supplied to a space formed by the surface of the substrate and the inner wall surface of the frame. A seal structure between a frame body and a substrate of a substrate processing apparatus that performs the process of
The frame is formed with a fitting groove that opens at a predetermined width over the entire circumference of the inner wall surface at a predetermined height from the lower surface facing the substrate, and the inner wall surface on the lower surface side of the fitting groove is a sealing member A space for storing the seal member that is retreated by the thickness of the seal portion and has a substantially L-shaped cross section is formed,
The seal member includes a seal portion having a predetermined thickness that forms an inner wall surface, and a fitting portion that is bent outwardly perpendicularly from the upper end portion of the seal portion and is fitted into the fitting groove of the frame body. A base portion formed in a thickness that can be inserted into the fitting groove of the frame body, and a base portion and a fitting groove between the base body and the base portion provided in a linear manner on the upper surface of the base portion. It is formed with a protrusion with a height that closes the gap between
The substrate processing is characterized in that the fitting portion of the seal member is inserted into the fitting groove of the frame body, and the inner wall surface continuous with the same inner diameter to the substrate is formed by the inner wall surface of the frame body and the seal surface of the seal member. Seal structure for equipment.
(2) The opening width of the fitting groove of the frame is 80 to 98% of the total thickness of the base portion of the seal member and the height of the protrusion, and the depth from the receding end surface of the inner wall surface is the seal of the seal member The sealing structure for a substrate processing apparatus according to (1) , wherein the thickness is 120 to 300% of the thickness of the portion .
(3) The sealing member is a rubber made of vinylidene fluoride / hexafluoropropylene copolymer, vinylidene fluoride / hexafluoropropylene / tetrafluoroethylene copolymer, or tetrafluoroethylene / propylene / vinylidene fluoride copolymer. The sealing structure for a substrate processing apparatus according to the above (1) or (2), comprising a rubber composition as a component .
(4) A substrate having a sealing member made of an elastic material at the lower end is placed on the substrate to be processed, and the processing liquid is supplied to the space formed by the surface of the substrate and the inner wall surface of the frame. A substrate processing apparatus for performing
A substrate processing apparatus characterized in that a gap between the substrate and the frame is sealed by the seal structure described in any one of (1) to (3) above .

本発明の基板処理装置用シール構造によれば、枠体4の内壁面10aとシール部材3の内壁面3aとの間に段差が無く、実質的に一つの内壁面を形成するため、従来のように枠体10の下端面10bとシール部材3と基板4との間に微小隙間Cが形成されることがなく、使用した薬液Lを完全に除去でき、新たな薬液Lによる処理を安定して行うことができる。その結果として、高品質の基板を歩留まりよく生産することができる。   According to the sealing structure for a substrate processing apparatus of the present invention, since there is no step between the inner wall surface 10a of the frame 4 and the inner wall surface 3a of the sealing member 3, a single inner wall surface is formed. Thus, the minute gap C is not formed between the lower end surface 10b of the frame 10, the seal member 3 and the substrate 4, and the used chemical solution L can be completely removed, and the treatment with the new chemical solution L is stabilized. Can be done. As a result, a high-quality substrate can be produced with a high yield.

以下、本発明に関して図面を参照して詳細に説明する。   Hereinafter, the present invention will be described in detail with reference to the drawings.

図1は本発明の基板処理装置用シール構造の一実施形態を構成するシール部材Aを示す断面図、図2は枠体10を示す断面図、図3はシール部材Aを枠体10に嵌合しシール構造を構築した状態を示す断面図である。   FIG. 1 is a cross-sectional view showing a seal member A constituting one embodiment of a seal structure for a substrate processing apparatus of the present invention, FIG. 2 is a cross-sectional view showing a frame 10, and FIG. It is sectional drawing which shows the state which constructed | assembled the sealing structure.

図1に示すように、シール部材Aは、基板4の平面形状に合わせて円形(半導体ウエハ)あるいは矩形(FPDガラス)等の枠状に形成されるシール部3と、シール部3の外方に屈曲する嵌合部2とからなる略逆L字状の断面形状を有する。シール部3の内壁面3aの内径は、枠体10の内壁面10aの内径と同一に規定されている。また、シール部3は、図3に示すように、枠体10に装着された際に、下端部3bが枠体10の下端面10bから突出するように、その垂下長が規定されている。   As shown in FIG. 1, the seal member A includes a seal portion 3 formed in a frame shape such as a circle (semiconductor wafer) or a rectangle (FPD glass) according to the planar shape of the substrate 4, and an outer side of the seal portion 3. It has a substantially inverted L-shaped cross-sectional shape consisting of a fitting portion 2 that bends in a straight line. The inner diameter of the inner wall surface 3 a of the seal portion 3 is defined to be the same as the inner diameter of the inner wall surface 10 a of the frame body 10. Further, as shown in FIG. 3, the hanging length of the seal portion 3 is defined so that the lower end portion 3 b protrudes from the lower end surface 10 b of the frame body 10 when attached to the frame body 10.

嵌合部2は、枠体10の嵌合溝Bに挿入される基部2aと、基部2aの上面に線状に周回して形成される突部1とから構成されている。突部1の突出量(高さ)は、基部2aの厚さとの合計(t1)で、枠体10の嵌合溝Bの開口幅(t2)よりも大きくなるように規定されている。突部1の数は制限されるものではないが、図示のように並行に複数設けることにより、枠体10の嵌合溝Bに嵌入したときに荷重をバランス良く分散して密封性を高めることができるようになる。また、突部1を単独とすることもできるが、その場合は図示されるようにシール部3の直上に形成することにより、荷重を効率よく受けて密封性を高めることができるようになり好ましい。同様の理由から、突部1を複数形成する場合もその中の一つをシール部3の直上に形成することが好ましい。更に、突部1の断面形状は、図示される略矩形の他、半円や三角形、波形等でも構わない。   The fitting part 2 is comprised from the base 2a inserted in the fitting groove B of the frame 10, and the protrusion 1 formed in the upper surface of the base 2a around the line. The protrusion amount (height) of the protrusion 1 is defined to be larger than the opening width (t2) of the fitting groove B of the frame body 10 in total (t1) with the thickness of the base portion 2a. The number of the protrusions 1 is not limited, but by providing a plurality of protrusions 1 in parallel as shown in the drawing, when being inserted into the fitting grooves B of the frame body 10, the load is distributed in a well-balanced manner to improve the sealing performance. Will be able to. Moreover, although the protrusion 1 can also be made independent, in that case, by forming directly on the seal part 3 as shown in the figure, it is possible to efficiently receive a load and improve the sealing performance, which is preferable. . For the same reason, when a plurality of protrusions 1 are formed, one of them is preferably formed immediately above the seal portion 3. Furthermore, the cross-sectional shape of the protrusion 1 may be a semicircle, a triangle, a waveform, or the like in addition to the substantially rectangular shape illustrated.

一方、枠体10は、基板4の平面形状に合わせて円形(半導体ウエハ)あるいは矩形(FPDガラス)等の枠状に形成されている。また、図2に示すように、基板と対向する下端面10bから所定高さの位置に、内壁面10aの全周にわたりシール部材Aの嵌合部2が嵌入される嵌合溝Bが形成され、更に嵌合溝10Bの下端面10e側において、内壁面10aがシール部材Aのシール部3の厚さ(w)分だけ後退して後退端面10dが形成されており、全体として断面略L字状を呈する空所が形成されている。   On the other hand, the frame 10 is formed in a frame shape such as a circle (semiconductor wafer) or a rectangle (FPD glass) according to the planar shape of the substrate 4. Further, as shown in FIG. 2, a fitting groove B into which the fitting portion 2 of the seal member A is fitted over the entire circumference of the inner wall surface 10a is formed at a predetermined height from the lower end surface 10b facing the substrate. Further, on the lower end surface 10e side of the fitting groove 10B, the inner wall surface 10a retreats by the thickness (w) of the seal portion 3 of the seal member A to form a receding end surface 10d. A vacant space is formed.

従って、シール部材Aの嵌合部2を枠体10の嵌合溝Bに嵌入させて枠体1の空所にシール部材A全体を収容することにより、図3に示すように、枠体10の内壁面10aとシール部材Aの内壁面3aとが、基板4まで段差無く連続する面を形成する。そして、枠体10を基板4に載置して押圧すると、シール部材Aのシール部3の下端部3bと基板4との間でシール構造が形成されるが、その際、従来のような(図5参照)基板4とシール部3と枠体10の下端面10bとで形成される微小隙間Cも無く、薬液Lが残留することも無い。   Therefore, by fitting the fitting portion 2 of the seal member A into the fitting groove B of the frame body 10 and accommodating the entire seal member A in the space of the frame body 1, as shown in FIG. The inner wall surface 10a and the inner wall surface 3a of the seal member A form a surface that continues to the substrate 4 without any step. When the frame body 10 is placed on the substrate 4 and pressed, a seal structure is formed between the lower end 3b of the seal portion 3 of the seal member A and the substrate 4. 5) There is no minute gap C formed by the substrate 4, the seal portion 3, and the lower end surface 10b of the frame body 10, and the chemical liquid L does not remain.

また、シール部材Aの嵌合部2の突部1が、枠体10の嵌合溝Bの上壁面10cを押圧してシール部材Aと枠体10の嵌合溝Bとの隙間を塞ぎ、シール部材Aの内壁面3aと枠体10の内壁面10aとの継ぎ目に薬液Lが浸入し、残留するのを防止する。このようなシール部材Aの内壁面3aと枠体10の内壁面10aとの継ぎ目におけるシール性をより高めるために、枠体10の嵌合部Bの開口幅(t2)をシール部材Aの嵌合部2の基部2aの厚さと突部1の高さとの合計長(t1)の80〜98%、特に90〜95%とし、枠体10の嵌合部Bの奥行、即ち後退端面10dから嵌合部Bの端面10fまでの距離(d)をシール部材Aのシール部3の厚さ(w)の120〜300%、特に150〜250%とすることが好ましい。枠体10の嵌合溝Bの開口幅(t2)がシール部材Aの嵌合部2の合計長(t1)の98%を超える場合は嵌合溝Bの内部に薬液Lが浸入しやすくなり、80%未満ではシール部材Aの嵌合部2が径方向(紙面左右方向)に伸びてシールラインにうねりが生じ、充分なシール性を得ることが出来ない。また、枠体10の嵌合溝Bの奥行(d)がシール部材Aのシール部3の厚み(w)の300%を超えた場合は装着性が悪くなり、簡易な構造を提供するという効果が得られず、120%未満ではシール部3が荷重により変形し、シール部材Aの嵌合部2が枠体10の嵌合溝Bから押し出される可能性が高く信頼性の点で好ましくない。   Further, the protrusion 1 of the fitting portion 2 of the seal member A presses the upper wall surface 10c of the fitting groove B of the frame body 10 to close the gap between the sealing member A and the fitting groove B of the frame body 10, The chemical solution L is prevented from entering and remaining at the joint between the inner wall surface 3a of the seal member A and the inner wall surface 10a of the frame 10. In order to further improve the sealing performance at the joint between the inner wall surface 3a of the seal member A and the inner wall surface 10a of the frame body 10, the opening width (t2) of the fitting portion B of the frame body 10 is set to the fit of the seal member A. 80 to 98%, particularly 90 to 95% of the total length (t1) of the thickness of the base portion 2a of the joint portion 2 and the height of the protruding portion 1, and from the depth of the fitting portion B of the frame body 10, that is, from the receding end surface 10d. The distance (d) to the end face 10f of the fitting part B is preferably 120 to 300%, particularly 150 to 250% of the thickness (w) of the seal part 3 of the seal member A. When the opening width (t2) of the fitting groove B of the frame body 10 exceeds 98% of the total length (t1) of the fitting portion 2 of the seal member A, the chemical liquid L easily enters the fitting groove B. If it is less than 80%, the fitting portion 2 of the seal member A extends in the radial direction (left and right direction on the paper surface) and the seal line is swelled, so that sufficient sealability cannot be obtained. Further, when the depth (d) of the fitting groove B of the frame body 10 exceeds 300% of the thickness (w) of the seal portion 3 of the seal member A, the mountability is deteriorated, and an effect of providing a simple structure is provided. If the ratio is less than 120%, the seal portion 3 is deformed by a load, and the fitting portion 2 of the seal member A is likely to be pushed out from the fitting groove B of the frame body 10, which is not preferable in terms of reliability.

シール部材A及び枠体10の形成材料には制限がなく、使用する薬液Lの種類に応じて適宜選択できる。具体的には、シール部材Aの形成材料としては、ふっ素系エラストマー、エチレンプロピレンゴム、ニトリルゴム、ブチルゴム、クロロプレンゴム、シリコーンゴム等を適宜選択して使用することができる。しかし、基板4である半導体ウエハやFPDガラス基板を処理する薬液Lは強酸性や強塩基性である場合が多いため、シール部材Aは耐酸性及び耐アルカリ性に優れることが好ましく、ふっ素系エラトマーを含むゴム組成物とすることが好ましい。ふっ素系エラストマーとしては、従来公知のものを広く用いることができるが、例えばビニリデンフロライド/ヘキサフロロプロピレン系共重合体(例えば、デュポン製バイトンA、ダイキン工業製ダイエル、ダイニオン製フローレル、アウジモント製テクノフロン等を市場から入手可能)、ビニリデンフロライド/ヘキサフロロプロピレン/テトラフロロエチレン系共重合体(例えば、デュポン製バイトンB、ダイキン工業製ダイエル、ダイニオン製フローレル、アウジモント製テクノフロン等を市場から入手可能)、テトラフロロエチレン/プロピレン/ビニリデンフロライド系共重合体(例えば、旭硝子製アフラス等を市場から入手可能)等を好適に使用できる。中でも、ビニリデンフロライド/ヘキサフロロプロピレン系共重合体またはビニリデンフロライド/ヘキサフロロプロピレン/テトラフロロエチレン系共重合体が特に好ましい。   There is no restriction | limiting in the forming material of the sealing member A and the frame 10, According to the kind of chemical | medical solution L to be used, it can select suitably. Specifically, as the material for forming the seal member A, fluorine-based elastomer, ethylene propylene rubber, nitrile rubber, butyl rubber, chloroprene rubber, silicone rubber, or the like can be appropriately selected and used. However, since the chemical solution L for treating the semiconductor wafer or the FPD glass substrate as the substrate 4 is often strongly acidic or strongly basic, the sealing member A is preferably excellent in acid resistance and alkali resistance. It is preferable to make it the rubber composition containing. Conventionally known fluorine-based elastomers can be widely used. For example, vinylidene fluoride / hexafluoropropylene-based copolymers (for example, DuPont Viton A, Daikin Industries Daiel, Dainion Florel, and Augmont Techno) Fluorocarbons etc. are available from the market), vinylidene fluoride / hexafluoropropylene / tetrafluoroethylene copolymers (eg DuPont Viton B, Daikin Industries Daiel, Dainion Florel, Augmont technofuron, etc.) Possible), tetrafluoroethylene / propylene / vinylidene fluoride copolymer (for example, Asahi Glass Aflas is available from the market) and the like can be suitably used. Among these, vinylidene fluoride / hexafluoropropylene copolymer or vinylidene fluoride / hexafluoropropylene / tetrafluoroethylene copolymer is particularly preferable.

上記各ゴム材料には、補強や特性向上のために各種添加剤を配合することができる。中でも、充填剤や補強用繊維を配合することが好ましい。充填剤としては、カーボンブラック、硫酸バリウム、酸化チタン、酸化アルミニウム、炭酸カルシウム、ケイ酸カルシウム、ケイ酸マグネシウム、ケイ酸アルミニウム等の無機充填剤、ポリテトラフロロエチレン樹脂、ポリエチレン樹脂、ポリプロピレン樹脂、フェノール樹脂、ポリイミド樹脂、メラミン樹脂、シリコーン樹脂等の有機系充填剤が挙げられるが、これらに限定されない。また、複数の充填剤を併用することも可能である。   Various additives can be blended with each of the above rubber materials in order to reinforce and improve properties. Especially, it is preferable to mix | blend a filler and a reinforcing fiber. As fillers, inorganic fillers such as carbon black, barium sulfate, titanium oxide, aluminum oxide, calcium carbonate, calcium silicate, magnesium silicate, aluminum silicate, polytetrafluoroethylene resin, polyethylene resin, polypropylene resin, phenol Organic fillers such as resins, polyimide resins, melamine resins, and silicone resins can be mentioned, but are not limited thereto. It is also possible to use a plurality of fillers in combination.

補強用繊維としては、ガラス繊維、アルミナ繊維、ロックウール等の無機繊維、綿、羊毛、絹、麻、ナイロン繊維、アラミド繊維、ビニロン繊維、ポリエステル繊維、レーヨン繊維、アセテート繊維、フェノール−ホルムアルデヒド繊維、ポリフェニレンサルファイド繊維、アクリル繊維、ポリ塩化ビニル繊維、ポリ塩化ビニリデン繊維、ポリウレタン繊維、ポリテトラフロロエチレン繊維等の有機繊維が挙げられるが、これらに限定されない。また、複数の繊維を併用することも可能である。   As reinforcing fibers, glass fibers, alumina fibers, rock wool and other inorganic fibers, cotton, wool, silk, hemp, nylon fibers, aramid fibers, vinylon fibers, polyester fibers, rayon fibers, acetate fibers, phenol-formaldehyde fibers, Examples include, but are not limited to, organic fibers such as polyphenylene sulfide fibers, acrylic fibers, polyvinyl chloride fibers, polyvinylidene chloride fibers, polyurethane fibers, and polytetrafluoroethylene fibers. It is also possible to use a plurality of fibers in combination.

その他にも、ふっ素系エラストマー用の架橋系添加剤を配合することができる。   In addition, a crosslinking additive for a fluorine-based elastomer can be blended.

シール部材Aとするには、例えば二軸ロール、ニーダー、バンバリーミキサー等の混練機でふっ素系エラストマーを素練りし、そこに充填剤や補強用繊維を混練下で添加し、最後に架橋系添加剤を添加してふっ素ゴム組成物を調製し、必要に応じて熟成させた後、通常の加熱成形法により上記の形状に成形する。加熱成形法は、ふっ素ゴム組成物を所定形状の金型に充填して加熱プレスし、その後150℃〜300℃、好ましくは200℃〜250℃の熱気流中で二次架橋を行う。   For the sealing member A, for example, a fluorine-based elastomer is kneaded with a kneader such as a biaxial roll, kneader, Banbury mixer, etc., and a filler or reinforcing fiber is added thereto under kneading, and finally a crosslinking system is added. A fluororubber composition is prepared by adding an agent, and after aging as necessary, it is molded into the above-mentioned shape by an ordinary heat molding method. In the thermoforming method, a fluoro rubber composition is filled into a mold having a predetermined shape and heated and pressed, and then secondary crosslinking is performed in a hot air flow at 150 ° C. to 300 ° C., preferably 200 ° C. to 250 ° C.

また、枠体10も耐酸性や耐アルカリ性に優れることが好ましく、ふっ素系樹脂やセラミックスで作製することができる。   Moreover, it is preferable that the frame 10 is also excellent in acid resistance and alkali resistance, and can be produced with fluorine resin or ceramics.

以下、本発明を実施例によりさらに詳しく説明するが、本発明は以下の実施例に何ら限定されるものではない。   EXAMPLES Hereinafter, although an Example demonstrates this invention further in detail, this invention is not limited to a following example at all.

(実施例1)
下記に示す各材料を慣用の方法に従ってロール練りし、一晩熟成してふっ素ゴム組成物を得た。そして、表面が鏡面の金型を用いて熱プレスで170℃、10分間加圧保持して架橋させ、更にギアーオープンで230℃、24時間の二次架橋を施し、図1に示す断面形状で、内径100mmの円環状のシール部材Aを作製した。
・ふっ素ゴム(デュポン製バイトンA)・・100重量部
・カーボンブラック ・・・・ 30重量部
・酸化マグネシウム ・・・・ 5重量部
・水酸化カルシウム ・・・・ 3重量部
・架橋促進剤(ホスホニウム系) ・・・・ 4重量部
・架橋剤(ポリオール系) ・・・・ 1.5重量部
(Example 1)
Each material shown below was kneaded according to a conventional method and aged overnight to obtain a fluoro rubber composition. Then, using a mold having a mirror surface, heat press and hold at 170 ° C. for 10 minutes to crosslink, further gear open at 230 ° C. for 24 hours, and the cross-sectional shape shown in FIG. An annular seal member A having an inner diameter of 100 mm was produced.
Fluoro rubber (DuPont Viton A) 100 parts by weight Carbon black 30 parts by weight Magnesium oxide 5 parts by weight Calcium hydroxide 3 parts by weight Crosslinking accelerator ( Phosphonium-based) ... 4 parts by weight Crosslinking agent (polyol-based) 1.5 parts by weight

そして、得られたシール部材Aを、図2に示す断面形状で、内径100mmの円環状のPTFE樹脂製枠体10に装着した。尚、枠体10の嵌合溝Bの開口幅(t2)をシール部材Aの篏合部2の合計長(t1)の90%とし、枠体10の嵌合溝Bの奥行(d)をシール部材Aのシール部3の厚み(w)の200%とした。   Then, the obtained seal member A was attached to an annular PTFE resin frame 10 having an inner diameter of 100 mm and a cross-sectional shape shown in FIG. The opening width (t2) of the fitting groove B of the frame 10 is 90% of the total length (t1) of the mating portion 2 of the seal member A, and the depth (d) of the fitting groove B of the frame 10 is set. The thickness (w) of the seal portion 3 of the seal member A was set to 200%.

(比較例1)
上記のふっ素ゴム組成物を用いて、直径2.62mm、内径101mmのOリングを成型加工し、図5に示すあり溝6を有する内径100mmのPTFE樹脂製枠体10に装着した。
(Comparative Example 1)
An O-ring having a diameter of 2.62 mm and an inner diameter of 101 mm was molded using the above fluororubber composition, and was mounted on a PTFE resin frame 10 having an inner diameter of 100 mm and having a dovetail groove 6 shown in FIG.

(シール性能評価)
図4に示すように、実施例1で作製したシール部材付き枠体または比較例1で作製したOリング付き枠体7を半導体ウエハ8に載置し、線圧2N/mmの荷重で固定した。その後、簡易的な評価方法として、枠体と半導体ウエハ8とで形成される空間に薬液としてふっ化水素を1リットル投入し、1分後、枠体と半導体ウエハ8とで形成される槽を傾けて排出した。その後、同空間に洗浄液として導電率0.055μS/cmの超純水を1リットル投入し、その時の洗浄液の導電率を測定した。そして、洗浄液の導電率が0.5μS/cm以下になるまで洗浄を繰り返し、薬液残留の程度を確認した。その結果、実施例1で作製したシール部材付き枠体では洗浄10回で洗浄液の導電率が0.5μS/cm以下になるのに対して、比較例1で作製したOリング付き枠体では20回洗浄後も目標の導電率を得ることができなかった。
(Seal performance evaluation)
As shown in FIG. 4, the frame with a seal member produced in Example 1 or the frame 7 with an O-ring produced in Comparative Example 1 was placed on a semiconductor wafer 8 and fixed with a load of a linear pressure of 2 N / mm. . Thereafter, as a simple evaluation method, 1 liter of hydrogen fluoride is added as a chemical solution to the space formed by the frame and the semiconductor wafer 8, and after 1 minute, a tank formed by the frame and the semiconductor wafer 8 is formed. Tilt and discharged. Thereafter, 1 liter of ultrapure water having a conductivity of 0.055 μS / cm was added as a cleaning liquid in the same space, and the conductivity of the cleaning liquid at that time was measured. And washing | cleaning was repeated until the electrical conductivity of the washing | cleaning liquid became 0.5 microsiemens / cm or less, and the grade of the chemical | medical solution residue was confirmed. As a result, in the frame with a seal member produced in Example 1, the conductivity of the cleaning liquid becomes 0.5 μS / cm or less after 10 washings, whereas in the frame with an O-ring produced in Comparative Example 1, 20 is obtained. Even after the second washing, the target conductivity could not be obtained.

本発明の基板処理装置用シール構造の一実施形態を構成するシール部材を示す断面図である。It is sectional drawing which shows the sealing member which comprises one Embodiment of the sealing structure for substrate processing apparatuses of this invention. 本発明の基板処理装置用シール構造の一実施形態を構成する枠体を示す断面図である。It is sectional drawing which shows the frame which comprises one Embodiment of the sealing structure for substrate processing apparatuses of this invention. 本発明の基板処理装置用シール構造の一実施形態を模式的に示す断面図である。It is sectional drawing which shows typically one Embodiment of the sealing structure for substrate processing apparatuses of this invention. 実施例におけるシール性能評価の評価方法を説明するための側面図である。It is a side view for demonstrating the evaluation method of seal performance evaluation in an Example. 従来のOリングを用いた基板処理装置用シール構造の一例を模式的に示す断面図である。It is sectional drawing which shows typically an example of the sealing structure for substrate processing apparatuses using the conventional O-ring.

符号の説明Explanation of symbols

A シール部材
1 突起部
2 篏合部
3 シール部
w シール部の厚み
B 嵌合溝
t1 嵌合溝の開口幅
d 嵌合溝の奥行
4 基板
5 Oリング
6 あり溝
C 隙間
10 枠体
L 薬液
A Seal member 1 Protruding portion 2 Joint portion 3 Seal portion w Seal portion thickness B Fitting groove t1 Fitting groove opening width d Fitting groove depth 4 Substrate 5 O-ring 6 Dovetail groove C Clearance 10 Frame body L Liquid chemical

Claims (4)

処理される基板に、下端部に弾性材料からなるシール部材を有する枠体を載置し、基板の表面と枠体の内壁面とで形成される空間に処理液を供給して基板の処理を行う基板処理装置の枠体と基板との間のシール構造であって、
枠体は、基板と対向する下端面から所定高さの位置に、内壁面の全周にわたり所定幅で開口する嵌合溝が形成され、かつ嵌合溝の下端面側の内壁面がシール部材のシール部の厚さ分だけ後退して断面略L字状を呈するシール部材収納用の空所が形成されており、
シール部材は、内壁面を形成する所定厚のシール部と、シール部の上端部から垂直に外方に屈曲して枠体の嵌合溝に嵌入される嵌合部とを有する断面略逆L字状を呈し、かつ嵌合部は枠体の嵌合溝に挿入可能な厚さに形成された基部と、基部の上面に線状に周回して設けられ基部と枠体の嵌合溝との隙間を塞ぐ高さの突部とで形成されており、
シール部材の嵌合部を枠体の嵌合溝に嵌入して、枠体の内壁面とシール部材のシール面とで基板まで同一内径で連続する内壁面を形成することを特徴とする基板処理装置用シール構造。
A substrate having a sealing member made of an elastic material at the lower end is placed on the substrate to be processed, and a processing liquid is supplied to a space formed by the surface of the substrate and the inner wall surface of the frame to process the substrate. A sealing structure between a frame of a substrate processing apparatus to be performed and a substrate,
The frame is formed with a fitting groove that opens at a predetermined width over the entire circumference of the inner wall surface at a predetermined height from the lower surface facing the substrate, and the inner wall surface on the lower surface side of the fitting groove is a sealing member A space for storing the seal member that is retreated by the thickness of the seal portion and has a substantially L-shaped cross section is formed,
The seal member includes a seal portion having a predetermined thickness that forms an inner wall surface, and a fitting portion that is bent outwardly perpendicularly from the upper end portion of the seal portion and is fitted into the fitting groove of the frame body. A base portion formed in a thickness that can be inserted into the fitting groove of the frame body, and a base portion and a fitting groove between the base body and the base portion provided in a linear manner on the upper surface of the base portion. It is formed with a protrusion with a height that closes the gap between
The substrate processing is characterized in that the fitting portion of the seal member is inserted into the fitting groove of the frame body, and the inner wall surface continuous with the same inner diameter to the substrate is formed by the inner wall surface of the frame body and the seal surface of the seal member. Seal structure for equipment.
枠体の嵌合溝の開口幅が、シール部材の基部の厚さと突部の高さとの合計の80〜98%であり、かつ内壁面の後退端面からの奥行がシール部材のシール部の厚さの120〜300%であることを特徴とする請求項1記載の基板処理装置用シール構造。 The opening width of the fitting groove of the frame is 80 to 98% of the total thickness of the base portion of the seal member and the height of the protrusion, and the depth from the receding end surface of the inner wall surface is the thickness of the seal portion of the seal member 2. The sealing structure for a substrate processing apparatus according to claim 1, wherein the sealing structure is 120 to 300% of the thickness . シール部材が、ビニリデンフロライド/ヘキサフロロプロピレン系共重合体、ビニリデンフロライド/ヘキサフロロプロピレン/テトラフロロエチレン系共重合体またはテトラフロロエチレン/プロピレン/ビニリデンフロライド系共重合体をゴム成分とするゴム組成物からなることを特徴とする請求項1または2記載の基板処理装置用シール構造。 The seal member is a vinylidene fluoride / hexafluoropropylene copolymer, a vinylidene fluoride / hexafluoropropylene / tetrafluoroethylene copolymer, or a tetrafluoroethylene / propylene / vinylidene fluoride copolymer. The seal structure for a substrate processing apparatus according to claim 1 or 2, comprising a rubber composition . 処理される基板に、下端部に弾性材料からなるシール部材を有する枠体を載置し、基板の表面と枠体の内壁面とで形成される空間に処理液を供給して基板の処理を行う基板処理装置であって、
基板と枠体との間が請求項1〜3の何れか1項に記載のシール構造にてシールされていることを特徴とする基板処理装置
A substrate having a sealing member made of an elastic material at the lower end is placed on the substrate to be processed, and a processing liquid is supplied to a space formed by the surface of the substrate and the inner wall surface of the frame to process the substrate. A substrate processing apparatus to perform,
A substrate processing apparatus , wherein a gap between the substrate and the frame is sealed by the seal structure according to any one of claims 1 to 3 .
JP2003354648A 2003-10-15 2003-10-15 Seal structure for substrate processing apparatus and substrate processing apparatus Expired - Fee Related JP4361344B2 (en)

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US6460859B1 (en) * 2000-04-12 2002-10-08 Parker-Hannifin Corporation Resilient elastomer and metal retainer gasket for sealing between curved surfaces
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