JP4352062B2 - 測定用バイアスティー - Google Patents
測定用バイアスティー Download PDFInfo
- Publication number
- JP4352062B2 JP4352062B2 JP2006141250A JP2006141250A JP4352062B2 JP 4352062 B2 JP4352062 B2 JP 4352062B2 JP 2006141250 A JP2006141250 A JP 2006141250A JP 2006141250 A JP2006141250 A JP 2006141250A JP 4352062 B2 JP4352062 B2 JP 4352062B2
- Authority
- JP
- Japan
- Prior art keywords
- bias tee
- high frequency
- port
- measurement
- guard
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/04—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant in circuits having distributed constants, e.g. having very long conductors or involving high frequencies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Description
102、202 ガード入力端子
104、204 高周波ポート
116、216、118、218 インダクタ
120、220 キャパシタ
121、221 直流ポート
122、222、124、224 インダクタ
126、226 直流機器
128、228 出力(測定)ポート
130、230,132、232 インダクタ
134、234 試験中装置
136、236 キャパシタ
140 ガード出力端子
Claims (6)
- ガード出力端子を有する測定器を試験中の装置(DUT)に接続するバイアスティーであって、直流(DC)ポートと高周波(HF)ポートと測定ポートとから成り、前記高周波ポートは、前記ガード出力端子で保護されることができ、また前記高周波ポートは、インピーダンスネットワークを介して前記ガード出力端子に接続されているバイアスティー。
- 請求項1に記載のバイアスティーであって、前記インピーダンスネットワークは、RCネットワークを含むバイアスティー。
- 請求項1に記載のバイアスティーであって、前記インピーダンスネットワークは、LCネットワークを含むバイアスティー。
- 請求項1に記載のバイアスティーであって、前記バイアスティーは、導電性囲いを有し、前記高周波ポートは、直流接地ブロックを含み、前記囲いは、前記バイアスティーの動作中、前記ガード出力端子に接続されているバイアスティー。
- 請求項1に記載のバイアスティーであって、前記高周波ポートは、無線周波入力信号に適合しているバイアスティー。
- 請求項1に記載のバイアスティーであって、前記高周波ポートは、パルス化された入力信号に適合しているバイアスティー。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/177,566 US7342401B2 (en) | 2005-07-08 | 2005-07-08 | Measurement bias tee |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007017429A JP2007017429A (ja) | 2007-01-25 |
JP4352062B2 true JP4352062B2 (ja) | 2009-10-28 |
Family
ID=37617734
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006141250A Expired - Fee Related JP4352062B2 (ja) | 2005-07-08 | 2006-05-22 | 測定用バイアスティー |
Country Status (2)
Country | Link |
---|---|
US (1) | US7342401B2 (ja) |
JP (1) | JP4352062B2 (ja) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6259537A (ja) * | 1985-09-11 | 1987-03-16 | Shimadzu Corp | 屈折率分布型レンズの製造法 |
US7224160B1 (en) * | 2006-02-21 | 2007-05-29 | Keithley Instruments, Inc. | RF and pulse bias tee |
CN101034119B (zh) * | 2007-02-15 | 2010-10-06 | 长沙理工大学 | 配电网对地电容的测量方法 |
JP2010237099A (ja) * | 2009-03-31 | 2010-10-21 | Denso Corp | ノイズ評価方法及びノイズ評価システム |
JP6140432B2 (ja) * | 2012-11-30 | 2017-05-31 | 京セラ株式会社 | 半導体素子検査装置 |
US9553559B2 (en) * | 2014-03-19 | 2017-01-24 | Keithley Instruments, Inc. | Configurable bias tee |
CN105158546A (zh) * | 2015-10-16 | 2015-12-16 | 国家电网公司 | 中性点外加可调电抗的配电网电容电流测量方法 |
US11159127B2 (en) | 2019-04-30 | 2021-10-26 | Quantum Opus, LLC | Noise suppressing interface circuit for device with control circuits in different noise environments |
US20220312593A1 (en) * | 2021-03-29 | 2022-09-29 | KYOCERA AVX Components Corporation | Surface Mount Radiofrequency Component |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6396298B1 (en) * | 2000-04-14 | 2002-05-28 | The Aerospace Corporation | Active feedback pulsed measurement method |
US6657522B2 (en) * | 2002-02-01 | 2003-12-02 | M/A-Com | Wide bandwidth bias tee |
US7012486B2 (en) * | 2004-07-28 | 2006-03-14 | Scientific Components Corporation | Miniature wideband bias tee |
-
2005
- 2005-07-08 US US11/177,566 patent/US7342401B2/en active Active
-
2006
- 2006-05-22 JP JP2006141250A patent/JP4352062B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JP2007017429A (ja) | 2007-01-25 |
US7342401B2 (en) | 2008-03-11 |
US20070007972A1 (en) | 2007-01-11 |
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