JP3873088B2 - Optical inspection device - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an optical inspection apparatus that optically inspects a sample by irradiating light to a fixing portion of a test piece from which a sample such as urine is collected, and is particularly excellent in detecting uneven coloring. The present invention relates to an optical inspection apparatus that exhibits an effect.
[0002]
[Prior art]
2. Description of the Related Art Conventionally, an optical inspection apparatus that uses a sample such as urine as an inspection object includes a linear sensor or an area sensor type using a CCD. In such an optical inspection apparatus using a CCD, the fixing portion of a test piece from which a sample such as urine is collected is imaged by the CCD, and the color tone and the coloration state are determined based on the image information obtained thereby. By doing so, the contained component in the sample which showed the color reaction in the fixing part is inspected.
[0003]
On the other hand, in this type of other optical inspection apparatus, fixing is performed while irradiating light from a light source to a fixing unit from which a sample has been collected and moving an optical photometric means having a limited photometric area relative to the fixing unit. There is a miniaturized one that optically inspects a sample based on photometric data corresponding to the amount of light reflected from the unit.
[0004]
Such an optical inspection apparatus using the amount of light reflected from the fixing unit includes a photometric system having a light receiving element 33 as shown in FIG. 4 for receiving reflected light from the fixing unit through an optical system (not shown). . The light receiving element 33 has a light receiving region R of a certain size, and a region image on the fixing unit corresponding to the shape of the light receiving region R is transferred to the light receiving region R through the optical lens system or the like. It is designed to be projected. The photometric system moves relative to the fixing unit that is a photometric target. An output signal corresponding to the amount of light received in the light receiving region R is output to an A / D converter (not shown) via the amplifier 34, and digital photometric data can be obtained by this A / D converter. The photometric data obtained in this way is processed by a microcomputer or the like as digital information corresponding to the amount of reflected light. In order to determine the color tone of the sample of the fixing unit based on such photometric data, the diameter d of the light receiving region R needs to be a relatively large dimension of about 3 mm.
[0005]
[Problems to be solved by the invention]
However, in both the conventional CCD and the optical inspection apparatus using the reflected light amount, when urine is used as a sample to be inspected, the fixing part is caused by the fact that blood cells as urine components do not hemolyze. Color unevenness may occur partially due to blood cells scattered in In order to detect such color unevenness, the conventional optical inspection apparatus using the CCD has the following problems.
[0006]
That is, it is necessary to construct an image processing system that detects color unevenness based on image information obtained by a CCD. In such an image processing system, adjustment such as calibration is required and the system itself is complicated. End up. In addition, the imaging optical system using the CCD becomes large, and depending on the image information, the accuracy of detecting color unevenness caused by blood cells is poor.
[0007]
On the other hand, the conventional optical inspection apparatus using the reflected light quantity has no problem due to the CCD and is simple and downsized. However, as shown in FIG. 4, the diameter d of the light receiving region R is about 3 mm. Therefore, even in a situation where the color unevenness is small and partially scattered in the image projected onto the light receiving region R, the light amount of the entire light receiving region R can be greatly varied. In other words, there is a problem in that the color unevenness on the fixing unit cannot be accurately detected.
[0008]
The present invention has been conceived under the circumstances described above, and is simple and small in order to detect color unevenness in a fixing portion from which a sample is collected. It is an object of the present invention to provide an optical inspection apparatus that can perform the above.
[0009]
DISCLOSURE OF THE INVENTION
In order to solve the above problems, the present invention takes the following technical means.
[0010]
That is, the optical inspection apparatus provided by the first aspect of the present invention continuously collects a fixed portion having a predetermined area where a sample is collected and causes a color reaction while irradiating light from a light source. the moved, on the basis of photometric data obtained by photometry of light reflected from the fixing portion in a predetermined photometric area, an optical inspection apparatus for inspecting the sample, the predetermined metering area By selecting a plurality of partial photometry means for measuring each partial area divided into at least two areas including an area corresponding to an area having an area smaller than the area of the fixing unit, and the partial photometry means, and a state capable of obtaining photometric data of all areas, the photometric data selection means for selecting a state capable of obtaining photometric data of only one partial region corresponding to the region of smaller area than the area of the fixing portion The provided, by selecting a state capable of obtaining photometric data of only said one partial region, it is characterized in that allowed the detection of the color unevenness in the fixing unit.
[0011]
In the optical inspection apparatus provided by the first aspect in which the above technical means is provided, when the photometric data selection means selects all the partial photometry means, the entire photometry area is photometered by the partial photometry means, The photometric data of the entire area can be acquired. On the other hand, when the photometry data selection means selects only one partial photometry means, only one partial area in the photometry area is photometered, and the photometry data of only that one partial area can be obtained. That is, according to the selection operation of the photometric data selection means, photometric data corresponding to the amount of reflected light in the entire area of the photometric area and photometric data corresponding to the amount of reflected light in one partial area are obtained. With only the photometric data based on the amount of reflected light in the entire area obtained in this way, the amount of light in the entire area cannot be greatly changed, and it is difficult to capture the uneven coloring of the situation scattered in the entire area. However, by using the photometric data corresponding to one partial area, it is possible to capture color unevenness that is partially scattered.
[0012]
Therefore, according to the optical inspection device provided by the first aspect, the photometric data selection means selects the partial photometry means, so that the photometry data corresponding to the entire area of the photometry area and only one partial area are supported. As a result, it is possible to separately obtain color unevenness that is partially scattered by using the photometric data corresponding to only one partial area acquired in this way. As a device for detecting such color unevenness, it is simple and small in size, and highly accurate color unevenness detection can be realized.
[0013]
As the photometric data selection means, for example, a selection circuit that switches and controls partial photometry means connected in parallel to the A / D converter is applied.
[0014]
In a preferred embodiment, the partial photometry means measures the partial area corresponding to the area smaller than the area of the fixing portion near the center of the photometry area, and near the center. It is divided into those that measure the surrounding partial areas.
[0015]
According to such an embodiment, the partial photometry means is divided into one that measures the partial area near the center of the photometry area and one that measures the partial area near the center. Photometric data corresponding to the partial area near the center in the photometric area can be obtained, and the uneven coloring partially scattered by the photometric data corresponding to the partial area near the center is stochastically high. Therefore, the certainty of detection of uneven color development is further improved.
[0016]
In another preferred embodiment, the partial photometry means comprises a plurality of light receiving elements corresponding to the number of divisions of the photometry area.
[0017]
According to such an embodiment, the partial photometry means is composed of a plurality of light receiving elements corresponding to the number of divisions of the photometric area, so that the reflected light quantity of the partial area is changed from each light receiving element corresponding to each partial area of the photometric area. A corresponding output signal is obtained, and the photometric data selection means selects each of the light receiving elements, so that the photometric data based on the output signal corresponding to the reflected light quantity of the entire photometric area and the reflected light quantity of one partial area Photometric data based on the output signal can be acquired separately.
[0018]
As the light receiving element, for example, a photodiode is applicable, but the light receiving element is not particularly limited thereto, and other light receiving elements such as a phototransistor and a CdS cell may be used.
[0019]
Furthermore, in another preferred embodiment, the photometric data selection means comprises a circuit in which other than the plurality of partial photometry means are connected via an analog switch.
[0020]
According to such an embodiment, the photometry data selection means is composed of a circuit in which other than the plurality of partial photometry means except one is connected via an analog switch. By simply configuring a circuit incorporating an analog switch with the partial metering means, it can be used as it is without modifying the existing optical system such as a light source, and it is relatively easy to manufacture at low cost. can do.
[0021]
Other features and advantages of the present invention will become more apparent from the detailed description given below with reference to the accompanying drawings.
[0022]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, preferred embodiments of the present invention will be specifically described with reference to the drawings.
[0023]
FIG. 1 is a schematic configuration diagram schematically showing an embodiment of an optical inspection apparatus according to the present invention. As shown in this figure, the optical inspection apparatus has a sample such as urine collected. The sample is optically inspected based on the obtained photometric data by measuring the reflected light from the fixing unit 1a while irradiating the fixing unit 1a of the test piece 1 with light. A general test piece 1 used in this type of optical inspection apparatus has substantially rectangular fixing portions 1a arranged at a plurality of locations on a long and short strip-like base material 1b. Different types of impregnation reagents are attached to the part 1a in advance. When a sample such as urine is attached to such a fixing unit 1a, the entire fixing unit 1a exhibits a color reaction, and the contained components in the sample can be inspected based on the color tone and the color state. Yes. The test piece 1 can be moved by a slide mechanism (not shown), whereby each fixing portion 1a of the test piece 1 is measured while moving the irradiation position P.
[0024]
The optical inspection apparatus is roughly configured by a light source 10, an optical lens 11, a diaphragm aperture 12, a photometry unit 13, an amplifier 14, an A / D converter 15, and a microcomputer 16. In this optical inspection apparatus, an optical system is configured by the light source 10, the optical lens 11, and the aperture opening 12, and a photometric system is configured by the photometric unit 13, the amplifier 14, the A / D converter 15, and the microcomputer 16. Yes. The optical system is disposed inside the housing so as not to be affected by external light, and a spectral filter (not shown) is switchably disposed at an appropriate optical path position of the optical system. Photometric data based on light of a specific wavelength can be obtained by switching the spectral filter.
[0025]
First, an optical system will be described. The light source 10 uses, for example, a halogen lamp as a monochromatic light emitter that emits white light, and irradiates light toward an irradiation position P opened in a part of the housing. Are arranged as follows.
[0026]
The optical lens 11 is disposed so as to collect the reflected light from the fixing unit 1 a located immediately below the irradiation position P and guide it to the photometric unit 13 through the aperture 12. That is, according to the optical lens 11, the focal point of the reflected light guided from the fixing unit 1 a is adjusted so as to form an image on a light receiving element (to be described later) of the photometric unit 13.
[0027]
The aperture opening 12 guides the reflected light guided from the fixing unit 1 a through the optical lens 11 to a light receiving element (to be described later) of the photometry unit 13. The reflected light from the fixing unit 1a narrowed down by the diaphragm opening 12 is set so as to be received by the light receiving element with a light receiving region described later. Such a light receiving region corresponds to an image corresponding to a certain region on the fixing unit 1a, that is, a photometric region on the fixing unit 1a viewed from the light receiving element side.
[0028]
Next, FIG. 2 is a schematic explanatory diagram showing the internal configuration of the photometry unit 13 shown in FIG. 1 and relatively showing the size thereof. The photometry system will be described with reference to this figure.
[0029]
As well shown in FIG. 2, the photometry unit 13 includes four photodetecting elements 13a to 13d that measure a photometry area of a fixed size in the fixing unit 1a, that is, each partial area obtained by dividing the photodetection area R into four parts. The light receiving elements 13a to 13d and the analog switch 13e are formed by a circuit in a desired connection state.
[0030]
More specifically, the light receiving elements 13a to 13d are photodiodes that obtain an output signal corresponding to the amount of received light, for example. The light receiving element 13a corresponding to one partial region of the light receiving area R is connected to an amplifier 14 to be described later via a circuit, and the other three light receiving elements 13b to 13d other than the light receiving element 13a are analog. The amplifier 14 is connected in parallel via the switch 13e. Such an analog switch 13e is switched to either an on or off state based on a control signal from the microcomputer 16, whereby the three light receiving elements 13b to 13d are switched to or from the amplifier 14. It is done. That is, when the analog switch 13e is turned on, output signals corresponding to the amounts of light received from all the light receiving elements 13a to 13d are input to the amplifier 14 in a state where they flow in parallel, while the analog switch 13e is turned off. In this case, only an output signal corresponding to the amount of light received from one light receiving element 13a is input to the amplifier 14. Such switching operation of the analog switch 13e is performed at high speed.
[0031]
That is, the light receiving elements 13a to 13d realize a plurality of partial photometry means for photometry of each partial area obtained by dividing a predetermined photometry area into at least two areas.
[0032]
In addition, the circuit of the photometry unit 13 formed from the light receiving elements 13a to 13d to the amplifier 14 can obtain photometric data of the entire photometry area by selecting the partial photometry means, and only one partial area. The photometric data selection means for selecting the state in which the photometric data can be acquired is realized.
[0033]
The amplifier 14 amplifies the output signal from each of the light receiving elements 13a to 13d and supplies it to the A / D converter 15 at the subsequent stage.
[0034]
The A / D converter 15 converts the output signals from the light receiving elements 13 a to 13 d input via the amplifier 14 into digital signals and outputs them to the microcomputer 16. The digital signal output by the A / D converter 15 is processed by the microcomputer 16 as photometric data.
[0035]
The microcomputer 16 performs various data processing based on the photometric data obtained through the A / D converter 15 to detect color unevenness in the fixing unit 1a or determine the color tone thereof. Inspect the components in the sample. The inspection result is printed by a printer (not shown) connected to the microcomputer 16 or displayed on a monitor screen.
[0036]
Next, the main points of the operation of the optical inspection apparatus having the above configuration will be described.
[0037]
First, when light is emitted from the light source 10, the analog switch 13 e of the photometry unit 13 is on / off controlled based on a control signal from the microcomputer 16.
[0038]
In this situation, when the analog switch 13e is in the ON state, an output signal corresponding to the amount of light received from all the light receiving elements 13a to 13d is input to the A / D converter 15 via the amplifier 14. The photometric data corresponding to the total amount of light in the light receiving region R is supplied to the microcomputer 16.
[0039]
The microcomputer 16 performs a determination process such as a color tone in the fixing unit 1a based on photometric data corresponding to the total amount of light in the light receiving region R, and a sample showing a color reaction in the fixing unit 1a based on the determination result. The contained components are inspected. For such a color tone inspection, photometric data based on light of a specific wavelength obtained by switching a spectral filter (not shown) is used.
[0040]
On the other hand, when the analog switch 13e is turned off, three of the four light receiving elements 13a to 13d are disconnected, and only the output signal from the one light receiving element 13a passes through the amplifier 14 through the A / A. It is supplied to the D converter 15.
[0041]
As a result, photometric data corresponding to the amount of light received in one partial area in the light receiving area R is supplied to the microcomputer 16, and the microcomputer 16 fixes based on the photometric data corresponding to the one partial area. The partial color unevenness in the part 1a is detected. Such color unevenness is detected by switching the analog switch 13e at a high speed when the fixing unit 1a sequentially moves.
[0042]
With only the photometric data corresponding to the total light quantity of the light receiving region R obtained in this way, even if there is a partial color unevenness in the fixing unit 1a, the color unevenness of the situation scattered in the entire light receiving region R is captured. Although this is difficult, by using the photometric data corresponding to one partial region of the light receiving region R, it is possible to capture uneven coloring that is partially scattered. The reason for this is that, in the color unevenness partially scattered with respect to the entire size of the light receiving region R, the photometric data corresponding to the total light amount of the light receiving region R does not vary greatly, but one partial region This is because, in the photometric data corresponding to, the color unevenness partially scattered occupies a large proportion in the region.
[0043]
Therefore, according to the optical inspection apparatus having the above-described configuration and operation, the photometry data corresponding to the total light quantity of the light receiving region R and 1 are controlled by switching the light receiving elements 13a to 13d that measure the light in each partial region of the light receiving region R. It is possible to separately obtain photometric data corresponding to the amount of light in one partial region, and by using the photometric data corresponding to one partial region of the light receiving region R thus obtained, it is partially scattered in small portions. Since it is possible to capture uneven coloring, it is simple and small as a device for detecting such uneven coloring, and highly accurate detection of uneven coloring can be realized.
[0044]
Next, another embodiment of the optical inspection apparatus according to the present invention will be described with reference to FIG. The other embodiments are substantially the same as those shown in FIG. 1, and only the photometry unit shown in FIG. 2 is different. Therefore, only the photometry unit will be briefly described.
[0045]
FIG. 3 is a schematic explanatory view showing the internal configuration of the photometry unit 23 in another embodiment and relatively showing the size thereof. As shown in this figure, the photometry unit 23 includes a light receiving region R. A light receiving element 23a for measuring a partial area near the center of the light receiving element 23b and a light receiving element 23b for measuring a partial area near the center of the light receiving element 23a, 23b and the analog switch 23c in a desired connection state. It is formed by a circuit.
[0046]
These light receiving elements 23a and 23b are, for example, photodiodes that obtain an output signal corresponding to the amount of received light. The light receiving elements 23a corresponding to the vicinity of the center of the light receiving region R are connected to the amplifier 24 through a circuit. At the same time, the light receiving element 23b corresponding to the vicinity of the center is connected to the amplifier 24 through the analog switch 23c.
[0047]
According to such another embodiment, the light receiving elements 23a and 23b are divided into those that measure the vicinity of the central portion in the light receiving region R and those that measure the vicinity of the central portion. Photometric data corresponding to the amount of light in the vicinity of the central portion in the region R can be obtained, and uneven coloring partially scattered by the photometric data corresponding to the vicinity of the central portion can be captured with high probability. The certainty of color unevenness detection is further improved.
[0048]
In each of the above embodiments, a monochromatic illuminant is used to receive light of a specific wavelength by a spectral filter. However, apart from this, the spectral filter is excluded using a plurality of types of illuminants. It may be a simple configuration. In this case, it is possible to irradiate light of a specific wavelength by switching a plurality of types of light emitters. For example, an LED is applicable as a light emitter that emits light of a specific wavelength.
[Brief description of the drawings]
FIG. 1 is a schematic configuration diagram schematically showing an embodiment of an optical inspection apparatus according to the present invention.
FIG. 2 is a schematic explanatory diagram showing an internal configuration of the photometry unit shown in FIG. 1 and relatively showing the size thereof;
FIG. 3 is a schematic explanatory diagram showing an internal configuration of a photometry unit according to another embodiment and relatively showing its size.
FIG. 4 is a schematic explanatory view showing a relative size of a photometry unit in a conventional optical inspection apparatus using reflected light.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Test piece 1a Fixing part 10 Light source 11 Optical lens 12 Aperture opening part 13a-13d Light receiving element 13e Analog switch 15 A / D converter 23 Photometry part 23a, 23b Light receiving element 23c Analog switch 33 Light receiving element R Light receiving area (photometric area)

Claims (4)

A fixing unit having a predetermined area where a sample is collected and causing a color reaction is continuously moved while irradiating light from a light source, and reflected light reflected from the fixing unit is measured in a predetermined photometric region. An optical inspection apparatus for inspecting the sample based on photometric data obtained by
A plurality of partial photometry means for measuring each partial area obtained by dividing a predetermined photometry area into at least two areas including an area corresponding to an area smaller than the area of the fixing unit ;
By selecting the partial photometry means, photometric data of only one partial area corresponding to a state where the photometric data of the entire area of the photometric area can be obtained and an area having an area smaller than the area of the fixing unit is obtained. Photometric data selection means for selecting a possible state;
An optical inspection apparatus characterized in that color unevenness in the fixing unit can be detected by selecting a state in which photometric data of only the one partial area can be acquired . The partial photometric means measures the partial area near the center of the photometric area and corresponding to the area smaller than the area of the fixing unit and the partial area around the central area. The optical inspection device according to claim 1, which is divided into two.   The optical inspection apparatus according to claim 1, wherein the partial photometry unit includes a plurality of light receiving elements corresponding to the number of divisions of the photometry area.   4. The optical device according to claim 1, wherein the photometric data selection means comprises a circuit in which other ones of the plurality of partial photometry means are connected via an analog switch. Inspection device.

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