JP3865760B2 - Semiconductor manufacturing equipment and valve equipment - Google Patents

Semiconductor manufacturing equipment and valve equipment Download PDF

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JP3865760B2
JP3865760B2 JP2005313333A JP2005313333A JP3865760B2 JP 3865760 B2 JP3865760 B2 JP 3865760B2 JP 2005313333 A JP2005313333 A JP 2005313333A JP 2005313333 A JP2005313333 A JP 2005313333A JP 3865760 B2 JP3865760 B2 JP 3865760B2
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valve
valve body
semiconductor manufacturing
box
heater
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JP2006093727A (en
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幸二 遠目塚
正義 古市
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Hitachi Kokusai Electric Inc
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Description

本発明は半導体製造装置の圧力調整弁、例えば半導体製造装置の反応室内の反応ガスを所要の圧力に維持する為に用いられる圧力調整弁に関するものである。   The present invention relates to a pressure adjusting valve for a semiconductor manufacturing apparatus, for example, a pressure adjusting valve used for maintaining a reaction gas in a reaction chamber of a semiconductor manufacturing apparatus at a required pressure.

半導体製造装置の1つであるCVD装置は圧力調整弁を具備しており、該圧力調整弁は、反応室と排気ポンプとの間に設けられ、ガス圧力検知装置からの信号を基に弁の開度を調整し、前記反応室のガス圧力を所要の値に調整する。   A CVD apparatus, which is one of the semiconductor manufacturing apparatuses, includes a pressure regulating valve, which is provided between the reaction chamber and the exhaust pump, and based on a signal from the gas pressure detection apparatus, The opening is adjusted, and the gas pressure in the reaction chamber is adjusted to a required value.

前記CVD装置に於ける反応ガスは、チャンバを出た後、冷却表面上に凝固する排気ガス分により、流路壁面に固形膜を生成する性質がある。この為、狭小な間隙に生成した固形膜により弁体等の可動部と弁箱等の固定部が一体化し、圧力調整弁の作動抵抗が著しく増大し、アクチュエータであるモータが過負荷となって焼損することがある。   The reaction gas in the CVD apparatus has a property of generating a solid film on the wall surface of the flow path due to the exhaust gas that solidifies on the cooling surface after leaving the chamber. For this reason, the movable part such as the valve body and the fixed part such as the valve box are integrated by the solid film formed in the narrow gap, the operating resistance of the pressure regulating valve is remarkably increased, and the motor as the actuator is overloaded. May burn out.

従って、斯かる圧力調整弁は前記焼損を防止する為、定期的な分解清掃をする必要がある。ところが従来の圧力調整弁は前記弁体と該弁体の弁軸とが一体構成であり、或は弁体に弁軸を貫通させた構造であり、定期的な清掃を行うには軸受を外し、弁体を収納する弁箱を完全に分解するか、或は弁軸を引抜くかする等、清掃しにくい構造となっており、この為清掃には熟練者を要し且長時間を要する等、半導体製造装置の稼働率を低減させる原因となっていた。   Therefore, such a pressure regulating valve needs to be periodically disassembled and cleaned in order to prevent the burning. However, the conventional pressure regulating valve has a structure in which the valve body and the valve shaft of the valve body are integrated, or the valve body is passed through the valve body, and the bearing is removed for periodic cleaning. The structure that is difficult to clean, such as completely disassembling the valve box that houses the valve body or pulling out the valve stem, requires a skilled person and requires a long time for cleaning. For example, this is a cause of reducing the operating rate of the semiconductor manufacturing apparatus.

本発明は斯かる実情を鑑み、流路壁面に固形膜が形成されるのを防止して清掃についての負担を大幅に軽減し、半導体製造装置の稼働率を向上させようとするものである。   In view of such a situation, the present invention is intended to prevent a solid film from being formed on a flow path wall surface, greatly reduce the burden of cleaning, and improve the operating rate of a semiconductor manufacturing apparatus.

本発明は、弁箱と体とを有し、該弁体をアクチュエータが駆動し作動させる弁装置を反応室と排気ポンプとの間に設けた半導体製造装置であって、前記弁箱にヒータを固着し、弁軸に断熱カラーを介して、かつ、前記弁箱に断熱板を介して前記アクチュエータを取付けた半導体製造装置に係り、又半導体製造装置を用いて処理するCVD処理方法に係るものである
又、本発明は、半導体製造装置に於ける反応室と排気ポンプとの間に用いられ、箱と体とを有し、該弁体をアクチュエータが駆動し作動させる弁装置であって、前記弁箱にヒータを固着し、弁軸に断熱カラーを介して、かつ、前記弁箱に断熱板を介して前記アクチュエータを取付けた弁装置に係るものである

The present invention has a valve body and a valve body, a semiconductor manufacturing device provided between the exhaust pump and the reaction chamber a valve device for the actuator drives operate the valve body, heat to said valve body fixing a chromatography data, via a heat insulating collar to the valve shaft, and relates to a semiconductor manufacturing device fitted with the actuator via a heat insulating plate to said valve body, CVD method of processing using Matahan conductor manufacturing apparatus it relates to.
Further, the present invention includes a in the reaction chamber in a semiconductor manufacturing device used during the exhaust pump, and a valve body and a valve body, the valve body actuator is a BenSo location actuating drives , fixing a Heater to the valve body, via an insulating collar to the valve shaft, and those of the valve device fitted with the actuator via a heat insulating plate to said valve body.

流路に隣接する部分をヒータによって排気ガス分中の凝固温度以上に加熱維持する。従って流通する反応ガス中に含まれる凝固分が弁体、弁箱に触れても凝固することがなく、反応ガスによる固形膜を生成することがない。   A portion adjacent to the flow path is heated and maintained at a temperature equal to or higher than the solidification temperature in the exhaust gas by a heater. Therefore, the solidified component contained in the flowing reaction gas does not solidify even if it touches the valve body or the valve box, and a solid film is not generated by the reaction gas.

以下、図面を参照しつつ本発明の実施の形態を説明する。   Hereinafter, embodiments of the present invention will be described with reference to the drawings.

本実施の形態では、弁箱、弁座等の圧力調整弁の構成部品、特にガス流路に臨接する部品を加熱し、ガスの露点以上に保持し、流路壁面に固形膜が形成されるのを防止する。   In the present embodiment, the components of the pressure regulating valve such as the valve box and the valve seat, particularly the components adjacent to the gas flow path are heated and held above the gas dew point, and a solid film is formed on the wall surface of the flow path. To prevent.

以下、図1、図2に於いて具体的に説明する。   This will be described in detail below with reference to FIGS.

円筒中空部1を穿設した弁箱2に、前記円筒中空部1の軸心と直交する軸心を有するベアリングハウジング3,3を嵌着し、両ベアリングハウジング3,3にベアリング4,4を介して弁軸5,6を回転自在に挿通する。   Bearing housings 3 and 3 having an axis perpendicular to the axis of the cylindrical hollow portion 1 are fitted into a valve box 2 having a hollow cylindrical portion 1, and bearings 4 and 4 are fitted to both bearing housings 3 and 3. And the valve shafts 5 and 6 are rotatably inserted.

該弁軸5,6と前記弁箱2との間にはOリング7,7を挾設して、前記弁軸5,6と弁
箱2との間を気密にシールする。該両弁軸5,6は同一軸心上にあって、両弁軸5,6の内側端部には弁体9を固着する。該弁軸5,6の内一方の弁軸5に断熱カラー10を介しウォームホイール11を嵌着し、他方の弁軸6と弁体9との間にはOリング12を設ける。
O-rings 7 and 7 are provided between the valve shafts 5 and 6 and the valve box 2 to hermetically seal between the valve shafts 5 and 6 and the valve box 2. The valve shafts 5 and 6 are on the same axis, and a valve body 9 is fixed to the inner ends of the valve shafts 5 and 6. A worm wheel 11 is fitted to one of the valve shafts 5 and 6 via a heat insulating collar 10, and an O-ring 12 is provided between the other valve shaft 6 and the valve body 9.

前記弁箱2に断熱板13を介してモータ支持金具14を設け、該モータ支持金具14に減速器15を介して弁開閉モータ16を取付け、該弁開閉モータ16の出力軸17にはウォーム18を嵌着し、該ウォーム18には前記ウォームホイール11を噛合させる。   A motor support bracket 14 is provided on the valve box 2 via a heat insulating plate 13, a valve opening / closing motor 16 is attached to the motor support bracket 14 via a speed reducer 15, and a worm 18 is attached to an output shaft 17 of the valve opening / closing motor 16. The worm wheel 11 is engaged with the worm 18.

前記弁体9の形状は周面を曲面仕上した円盤状であり、該弁体9の2平面にはそれぞれ大径凹部19と該大径凹部19の中心部に更に形成した小径凹部20が形成され、該小径凹部20にはドーナッツ状に形成した弁体ヒータ21を収納させる。   The shape of the valve body 9 is a disk shape having a curved peripheral surface, and a large-diameter concave portion 19 and a small-diameter concave portion 20 further formed at the center of the large-diameter concave portion 19 are formed on the two planes of the valve body 9, respectively. Then, the small-diameter recess 20 accommodates a valve body heater 21 formed in a donut shape.

前記小径凹部20と同心にOリング8を埋設し、前記大径凹部19に蓋板22を嵌着し、前記小径凹部20を気密に閉塞する。又、前記弁体9には両小径凹部20,20を連通させる案内孔24と該案内孔24にT字状に連通する横孔25を穿設する。該横孔25は、前記他方の弁軸6と同一軸心上に設けられている。   An O-ring 8 is embedded concentrically with the small-diameter recess 20, and a cover plate 22 is fitted into the large-diameter recess 19 to close the small-diameter recess 20 in an airtight manner. The valve body 9 is provided with a guide hole 24 for communicating the small-diameter recesses 20 and 20 and a lateral hole 25 for communicating with the guide hole 24 in a T-shape. The lateral hole 25 is provided on the same axis as the other valve shaft 6.

該他方の弁軸6は中空となっており、該弁軸6を軸心に沿って貫通する通孔26は前記横孔25と連通する。   The other valve shaft 6 is hollow, and a through hole 26 penetrating the valve shaft 6 along the axial center communicates with the lateral hole 25.

前記通孔26には絶縁被覆付のリード線27を挿通し、該リード線27の一端を前記弁体ヒータ21に接続し、該リード線27の他端は図示しない温度制御装置に接続する。   A lead wire 27 with an insulating coating is inserted into the through hole 26, one end of the lead wire 27 is connected to the valve element heater 21, and the other end of the lead wire 27 is connected to a temperature control device (not shown).

前記一方の弁軸5には閉止穴28を穿設し、該閉止穴28に温度センサ29を挿入し、該温度センサ29のリード線30は前記図示しない温度制御装置に接続する。   The one valve shaft 5 is provided with a closing hole 28, a temperature sensor 29 is inserted into the closing hole 28, and the lead wire 30 of the temperature sensor 29 is connected to the temperature control device (not shown).

前記弁箱2の前記弁軸5,6が貫通していない2平面に平板状の弁箱ヒータ31を固着し、又前記弁箱2の温度を検出する温度センサ32を金具33により該弁箱2に密着させて取付ける。前記平板状の弁箱ヒータ31及び温度センサ32はそれぞれ図示しない前記温度制御装置に接続する。   A flat valve box heater 31 is fixed to two planes through which the valve shafts 5 and 6 of the valve box 2 do not penetrate, and a temperature sensor 32 for detecting the temperature of the valve box 2 is attached to the valve box by a fitting 33. 2 is attached in close contact. The flat valve box heater 31 and the temperature sensor 32 are connected to the temperature control device (not shown).

尚、本弁装置の関連機器への取付けは、断熱部材を介して行い、本弁装置からの熱の漏洩を防止する。   In addition, attachment to the related apparatus of this valve apparatus is performed via a heat insulation member, and the leak of the heat from this valve apparatus is prevented.

以下、作用について説明する。   The operation will be described below.

弁の開度の調整は、前記弁開閉モータ16を駆動し、前記ウォーム18、ウォームホイール11、弁軸5を介して前記弁体9を回転させる。該弁体9の回転角度は、前記弁開閉モータ16の回転数の検出、前記弁軸5の回転角度の検出により検知され、弁装置の開度が決定される。   The valve opening degree is adjusted by driving the valve opening / closing motor 16 and rotating the valve body 9 via the worm 18, the worm wheel 11 and the valve shaft 5. The rotational angle of the valve body 9 is detected by detecting the rotational speed of the valve opening / closing motor 16 and detecting the rotational angle of the valve shaft 5 to determine the opening degree of the valve device.

前記弁体ヒータ21、弁箱ヒータ31に通電し、弁体9、弁箱2を加熱保温する。この加熱保温温度は、35℃〜150℃位の範囲から選択され、目標設定温度とされる。   The valve body heater 21 and the valve box heater 31 are energized, and the valve body 9 and the valve box 2 are heated and kept warm. The heating and holding temperature is selected from a range of about 35 ° C. to 150 ° C. and is set as a target set temperature.

前記温度センサ29,32からの温度検知信号は、図示しない温度制御装置に入力され、該検知温度を基に前記弁体ヒータ21、弁箱ヒータ31の通電が制御される。而して前記弁箱2、弁体9等反応ガスが接する部分を80℃〜100℃の温度に維持制御する。又、斯かる制御が可能である様、前記弁体ヒータ21、弁箱ヒータ31の電気容量を決定し、且温度制御装置に支障を生じ、制御不能となった場合にもOリング等を焼損しない様印加電圧の最大値を選択する。   Temperature detection signals from the temperature sensors 29 and 32 are input to a temperature control device (not shown), and energization of the valve body heater 21 and the valve box heater 31 is controlled based on the detected temperature. Thus, the parts such as the valve box 2 and the valve body 9 that are in contact with the reaction gas are maintained and controlled at a temperature of 80 ° C. to 100 ° C. In addition, the electric capacity of the valve body heater 21 and the valve box heater 31 is determined so that such control is possible, and the temperature control device is hindered and the O-ring is burned out even when the control becomes impossible. Select the maximum value of the applied voltage so that it does not.

CVD処理と共に反応ガスが弁装置を流通するが、前記した様に弁体9、弁箱2はそれぞれ弁体ヒータ21、弁箱ヒータ31によって加熱保温されている。従って、反応ガス中に存在する凝固分は、円筒中空部1の壁面、弁体9の表面に接しても凝固することがない。而して、反応ガスを流通しても前記円筒中空部1の壁面、弁体9の表面に固形膜を生成することがない。   The reactive gas flows through the valve device together with the CVD process. As described above, the valve body 9 and the valve box 2 are heated and kept warm by the valve body heater 21 and the valve box heater 31, respectively. Therefore, the solidified component present in the reaction gas does not solidify even when it comes into contact with the wall surface of the cylindrical hollow portion 1 and the surface of the valve body 9. Thus, even when the reaction gas is circulated, a solid film is not generated on the wall surface of the cylindrical hollow portion 1 and the surface of the valve body 9.

尚、弁体ヒータ21、弁箱ヒータ31については種々考えられるが、弁体ヒータ21としては雲母の薄いドーナッツ状のベース34に所要の発熱体であるリボン線36を所要巻きし、雲母の円板35で挾持したものが挙げられ、又弁箱ヒータ31としては雲母の矩形薄板37に発熱体38を巻付け、雲母の薄板39で挟み、更に金属製のカバー40で覆い前記弁箱2の側面に固着したものが挙げられる。   Various valve body heaters 21 and valve box heaters 31 can be considered. As the valve body heater 21, a ribbon wire 36, which is a required heating element, is wound around a thin donut-shaped base 34 of mica, and a mica circle is formed. As the valve box heater 31, a heating element 38 is wound around a rectangular thin plate 37 of mica, sandwiched by a thin plate 39 of mica, and further covered with a metal cover 40. The thing fixed to the side surface is mentioned.

又弁箱ヒータは弁箱の内部に埋没する様にしてもよい。   The valve box heater may be embedded in the valve box.

以上述べた如く本発明によれば、流通するガスに晒れる部分を加熱し、流通するガス中に含まれる凝固分の凝固温度以上に維持するので、排気ガスによる固形膜が生成することがなく、従って固形膜除去の為の分解掃除が不要となる。   As described above, according to the present invention, the portion exposed to the circulating gas is heated and maintained at a temperature equal to or higher than the solidification temperature of the solidified component contained in the circulating gas, so that a solid film is not generated by the exhaust gas. Therefore, disassembly and cleaning for removing the solid film is not necessary.

而して、保弁作業の軽減を図り得ると共に分解掃除による装置の停止がなくなることで半導体製造装置の稼働率が向上する等、種々の優れた効果を発揮する。   Thus, the valve keeping operation can be reduced, and various excellent effects such as improvement in the operating rate of the semiconductor manufacturing apparatus can be achieved by eliminating the stoppage of the apparatus due to disassembly and cleaning.

本発明の実施の形態を示す一部破断斜視図である。It is a partially broken perspective view showing an embodiment of the present invention. 同前実施の形態の側断面図である。It is a sectional side view of the same embodiment.

符号の説明Explanation of symbols

1 円筒中空部
2 弁箱
9 弁体
21 弁体ヒータ
31 弁箱ヒータ
DESCRIPTION OF SYMBOLS 1 Cylindrical hollow part 2 Valve box 9 Valve body 21 Valve body heater 31 Valve box heater

Claims (3)

箱と体とを有し、該弁体をアクチュエータが駆動し作動させる弁装置を反応室と排気ポンプとの間に設けた半導体製造装置であって、前記弁箱にヒータを固着し、弁軸に断熱カラーを介して、かつ、前記弁箱に断熱板を介して前記アクチュエータを取付けたことを特徴とする半導体製造装置。 And a valve box and the valve body, a semiconductor manufacturing device provided between the exhaust pump and the reaction chamber a valve device for the actuator drives operate the valve element, securing the Heater in the valve body A semiconductor manufacturing apparatus, wherein the actuator is attached to the valve shaft via a heat insulating collar and the valve box via a heat insulating plate. 半導体製造装置に於ける反応室と排気ポンプとの間に用いられ、箱と体とを有し、該弁体をアクチュエータが駆動し作動させる弁装置であって、前記弁箱にヒータを固着し、弁軸に断熱カラーを介して、かつ、前記弁箱に断熱板を介して前記アクチュエータを取付けたことを特徴とする弁装置 And in the reaction chamber in a semiconductor manufacturing device used during the exhaust pump, and a valve body and a valve body, the valve body actuator is a BenSo location actuating drive, heat to said valve body The valve device is characterized in that the actuator is fixed to the valve shaft via a heat insulation collar and the valve box is attached to the valve box via a heat insulation plate . 請求項1の半導体製造装置を用いて処理するCVD処理方法

CVD processing method for processing using a semi-conductor manufacturing apparatus according to claim 1.

JP2005313333A 2005-10-27 2005-10-27 Semiconductor manufacturing equipment and valve equipment Expired - Lifetime JP3865760B2 (en)

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JP2005313333A JP3865760B2 (en) 2005-10-27 2005-10-27 Semiconductor manufacturing equipment and valve equipment

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JP2003145949A Division JP2004006880A (en) 2003-05-23 2003-05-23 Semiconductor manufacturing apparatus

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JP2006159768A Division JP4094034B2 (en) 2006-06-08 2006-06-08 Semiconductor manufacturing apparatus, CVD processing method for processing using the semiconductor manufacturing apparatus, and valve apparatus

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JP3865760B2 true JP3865760B2 (en) 2007-01-10

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