JP3788046B2 - Optical emission spectrometer - Google Patents
Optical emission spectrometer Download PDFInfo
- Publication number
- JP3788046B2 JP3788046B2 JP18596498A JP18596498A JP3788046B2 JP 3788046 B2 JP3788046 B2 JP 3788046B2 JP 18596498 A JP18596498 A JP 18596498A JP 18596498 A JP18596498 A JP 18596498A JP 3788046 B2 JP3788046 B2 JP 3788046B2
- Authority
- JP
- Japan
- Prior art keywords
- exit slit
- eccentric shaft
- slit
- exit
- movable base
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Description
【0001】
【発明の属する技術分野】
本発明は、元素の定量および定性測定を行う発光分光分析装置、特に多元素同時分析を行う分光器に関する。
【0002】
【従来の技術】
発光分光分析装置に用いられる分光器は入口スリットから入射した光を回折格子等の分散素子によって波長分散を行わせた後、出口スリット上に結像させる。この分光器には、一個の出口スリットを設けて、分散素子を回転させることによって出口スリットへの分析波長を順次変える方式のモノクロメータと、分散素子を回転させないかわりに複数個の出口スリットを配設して同時に多波長を分析できるポリクロメータがある。
【0003】
発光分光分析装置の一例を図5に示すが、分光器はポリクロメータ型が図示されている。図5で試料と対電極間での放電による発光は入口スリット10に入射し、回折格子11によって波長分散が行われ、各元素に応じた波長位置に出口スリット12a〜12dが配設される。出口スリット12a〜12dを通過した各波長の光強度が、ホトマルチプライア13a〜13dによって電気信号にかえられ、コンピュータ処理によって各元素の定性・定量値が出力される。
【0004】
このポリクロメータでは全ての光学素子(スリットも含め)が固定されているから、それらの位置は厳密に所定の位置に配設されるように調整されなければならない。なかでも出口スリットは隣合う測定波長が近接していると当然出口スリットも接近した位置にそれぞれを配設する必要があるから、狭い空間に微動ネジ等複雑な出口スリット調整機構を採用することはできない。
【0005】
そのため、従来では図3、4に示すような出口スリット調整機構が用いられている。図3は該調整機構を構成する部品の組み込みを展開して図示したものであり、図4はそれらが組み立てられたときの正面図である。図3に示すように、カム機構を形成する偏心軸3を用意し、この偏心軸3が出口スリット可動台2の上下端部に設けられたスロット穴に軸の偏心部分が嵌入されるようにしてあり、偏心軸3は基台4に取り付けられる。これによって偏心軸3を回転中心5で微動回転させたとき、偏心軸のカム機構によって出口スリット可動台2が波長分散方向に動き、出口スリット1の位置調整を行うことができる。この場合偏心軸に接する部分は軸径寸法に対して厳しいはめあい寸法で溝加工され、かつ厳しい平行面公差のスロット穴加工が要求される。
【0006】
【発明が解決しようとする課題】
従来の発光分光分析用分光器の出口スリットは、以上のように構成されているが、発光分光分析用に用いられる分光器は一般に高分解能が要求され、逆線分散は0.5nm/mm程度で出口スリットの開口幅は20〜50μmのものが用いられるから、波長プロファイルのピークを出口スリットへ合わせるためには、その分散方向への位置調整はミクロンオーダで行う必要がある。しかし、従来の構造では溝間の公差があまいとカム機構を形成する偏心軸との間に隙間が発生し(図4参照)、偏心軸の回転に対して所望の移動量が得られない場合が生じ、スムーズな移動ができず精密な調整が不可能となる。またマイナス公差では偏心軸に差し込めず、無理に差し込んでも動きが固く、スムーズな調整ができない。またこの際でも使用していくうちに動きは柔らかくなるが、いずれ軸との間に隙間が発生することになるという問題があった。
【0007】
本発明は、このような事情に鑑みてなされたものであって、カム機構を形成する偏心軸と出口スリット可動台との間に隙間を生じない出口スリット調整機構をもつ発光分光分析装置を提供することを目的とする。
【0008】
【課題を解決するための手段】
上記の目的を達成するため、本発明の発光分光分析装置は、分光器の出口スリット可動台に弾力性のある材料を用いて2片の板バネ構造とし、カム機構を形成する偏心軸を前記2片の板バネ部で挟むようにして、2片の板バネ部で挟まれた偏心軸径を2片の板バネ部の間隔に対してプラス公差としたものである。
これにより、出口スリット可動台の2片の板バネ部はカム機構を形成する偏心軸と共働して、偏心軸と出口スリット可動台との間の隙間は発生しなくなる。
【0009】
【発明の実施の形態】
本発明の発光分光分析用分光器の出口スリット調整機構の一実施例を図1、2により説明する。図1は出口スリット部の組立図であり、組み込み手法は図3と同様である。図2は出口スリット部の正面図である。1は出口スリットで極薄板にレーザ加工により幅20〜50μmのスリット穴があけられており、波長分散された単色光の入口スリット像がここに結像され、目的元素の波長のみを光電変換検出器であるホトマルチプライアへ導く。2は出口スリット可動台で板厚0.3mmのステンレスバネ鋼をUの字型に曲げ、その底部に出口スリット1が接着されている。さらに出口スリット可動台2の上下端には2片の板バネ部2Sが延設されるように形成されている。3はカム機構を形成する偏心軸で、基台4に嵌着される部分の軸径ならびに回転中心5と、出口スリット可動台2に挟まれる部分の軸径ならびにその軸中心とが異なるカム機構となっており、該軸中心と回転中心5は出口スリット1の波長分散方向調整移動幅として必要な量だけずらされている。そして基台4に偏心軸3を嵌着することにより結果的に出口スリット1が固定される。
【0010】
出口スリット部の組立は出口スリット可動台2の2片の板バネ部2Sで偏心軸3の偏心部を挟むように取り付け、偏心軸3を基台4に嵌着させる。これによって偏心軸3と出口スリット可動台2との間の間隙は無くなる。
【0011】
次に出口スリット可動台2を波長分散方向に微調整させ、波長プロファイルのピークを出口スリット1に合致させるための調整方法について述べる。偏心軸3を回転させると基台4に嵌着される軸と、出口スリット可動台2の2片の板バネ部2Sに挟まれている軸とが偏心させてあるため、そのカム機構によって出口スリット可動台2は偏心軸3の回転角をθとし、偏心量をeとしたとき、e(sinθ)分だけ波長分散方向に移動させることができる。出口スリット1は出口スリット可動台2に接着されているから従来法とは異なり、出口スリット1を目的量だけスムーズに、そして確実に移動調整ができる。
【0012】
本発明の特徴は以上説明したとおりであるが、板バネ部2Sの構成については図示例のように出口スリット可動台2と同一体として形成してもよいし、別部材を突設するようにしてもよい。たとえば出口スリット可動台2を金属材料で構成し、板バネ部2Sを樹脂材料で構成することもできる。
【0013】
【発明の効果】
本発明の発光分光分析装置は前記のように構成されており、出口スリット調整のために、カム機構を形成する偏心軸を出口スリット可動台の2片の板バネ部で挟むようにしたので、偏心軸と出口スリット可動台の間に隙間は発生せず、安定的に出口スリットの位置調整を精密に行うことができる。また、この構造では偏心軸を挟む部分の公差は、さほど厳しくなくとも良く、さらに板金構造で実現できるので、金型の使用により、安定的に効率的にまた安価に、この機構を製作できる。
【図面の簡単な説明】
【図1】 本発明の発光分光分析装置の出口スリット部の一実施例を示す図である。
【図2】 本発明の要部を示す図である。
【図3】 従来の発光分光分析装置の出口スリット部を示す図である。
【図4】 従来の発光分光分析装置の出口スリット部を示す図である。
【図5】 発光分光分析装置を示す図である。
【符号の説明】
1……出口スリット
2……出口スリット可動台
2S…板バネ部
3……偏心軸
4……基台
5……偏心軸回転中心[0001]
BACKGROUND OF THE INVENTION
The present invention relates to an emission spectroscopic analyzer that performs quantitative and qualitative measurement of elements, and more particularly to a spectroscope that performs multi-element simultaneous analysis.
[0002]
[Prior art]
A spectroscope used in an emission spectroscopic analysis apparatus causes light incident from an entrance slit to undergo wavelength dispersion by a dispersion element such as a diffraction grating, and then forms an image on the exit slit. This spectrometer is provided with a single exit slit and a monochromator that sequentially changes the analysis wavelength to the exit slit by rotating the dispersive element, and a plurality of exit slits instead of rotating the dispersive element. There is a polychromator that can be installed and analyze multiple wavelengths simultaneously.
[0003]
An example of an emission spectroscopic analyzer is shown in FIG. 5, and the spectrometer is of a polychromator type. In FIG. 5, light emitted by discharge between the sample and the counter electrode is incident on the entrance slit 10, and wavelength dispersion is performed by the diffraction grating 11, and exit slits 12a to 12d are disposed at wavelength positions corresponding to the respective elements. The light intensity of each wavelength that has passed through the exit slits 12a to 12d is converted into an electrical signal by the
[0004]
Since all the optical elements (including the slits) are fixed in this polychromator, their positions must be adjusted so that they are strictly disposed at predetermined positions. In particular, when the exit slits are close to each other in the measurement wavelength, it is necessary to arrange the exit slits close to each other, so it is necessary to employ a complicated exit slit adjustment mechanism such as a fine screw in a narrow space. Can not.
[0005]
Therefore, conventionally, an exit slit adjusting mechanism as shown in FIGS. FIG. 3 is an exploded view of the assembly of the parts constituting the adjusting mechanism, and FIG. 4 is a front view when they are assembled. As shown in FIG. 3, an eccentric shaft 3 forming a cam mechanism is prepared, and the eccentric shaft 3 is inserted into the slot holes provided in the upper and lower ends of the outlet slit movable base 2 so that the eccentric portion of the shaft is inserted. The eccentric shaft 3 is attached to the base 4. As a result, when the eccentric shaft 3 is finely rotated around the rotation center 5, the exit slit movable base 2 moves in the wavelength dispersion direction by the cam mechanism of the eccentric shaft, and the position of the exit slit 1 can be adjusted. In this case, the portion in contact with the eccentric shaft is grooved with a tight fitting dimension with respect to the shaft diameter, and a slot hole with a tight parallel surface tolerance is required.
[0006]
[Problems to be solved by the invention]
The exit slit of the conventional spectroscope for emission spectroscopic analysis is configured as described above. However, the spectroscope used for emission spectroscopic analysis generally requires high resolution, and the inverse dispersion is about 0.5 nm / mm. In order to match the peak of the wavelength profile to the exit slit, it is necessary to adjust the position in the dispersion direction on the order of microns. However, in the conventional structure, when the tolerance between the grooves is small, a gap is generated between the eccentric shaft forming the cam mechanism (see FIG. 4), and a desired amount of movement cannot be obtained with respect to the rotation of the eccentric shaft. As a result, smooth movement is impossible and precise adjustment becomes impossible. Also, with negative tolerances, it cannot be inserted into the eccentric shaft, and even if it is forcibly inserted, the movement is hard and smooth adjustment is not possible. In this case, the movement becomes softer as it is used, but there is a problem that a gap is generated between the shaft and the shaft.
[0007]
The present invention has been made in view of such circumstances, and provides an emission spectroscopic analyzer having an exit slit adjusting mechanism that does not create a gap between the eccentric shaft forming the cam mechanism and the exit slit movable base. The purpose is to do.
[0008]
[Means for Solving the Problems]
In order to achieve the above object, the emission spectroscopic analysis apparatus of the present invention has a two-plate leaf spring structure using an elastic material for the movable part of the exit slit of the spectrometer, and the eccentric shaft forming the cam mechanism is the above-described eccentric shaft. The eccentric shaft diameter sandwiched between the two leaf spring portions is set to be plus tolerance with respect to the interval between the two leaf spring portions so as to be sandwiched between the two leaf spring portions.
Thus, the two leaf spring portions of the exit slit movable base cooperate with the eccentric shaft forming the cam mechanism, and a gap between the eccentric shaft and the outlet slit movable base is not generated.
[0009]
DETAILED DESCRIPTION OF THE INVENTION
One embodiment of the outlet slit adjusting mechanism of the spectroscope for emission spectral analysis of the present invention will be described with reference to FIGS. FIG. 1 is an assembly drawing of the exit slit portion, and the assembling method is the same as that in FIG. FIG. 2 is a front view of the exit slit portion. Reference numeral 1 denotes an exit slit. A slit hole having a width of 20 to 50 μm is formed in a very thin plate by laser processing, and an entrance slit image of monochromatic light dispersed in wavelength is formed here, and only the wavelength of the target element is detected by photoelectric conversion. To the photomultiplier. Reference numeral 2 denotes an exit slit movable base, in which a stainless spring steel having a thickness of 0.3 mm is bent into a U shape, and an exit slit 1 is bonded to the bottom thereof. Furthermore, two pieces of leaf spring portions 2S are formed at the upper and lower ends of the exit slit movable base 2 so as to extend. Reference numeral 3 denotes an eccentric shaft that forms a cam mechanism. A cam mechanism in which the shaft diameter and the rotation center 5 of the portion fitted to the base 4 are different from the shaft diameter and the shaft center of the portion sandwiched by the outlet slit movable table 2. The axis center and the rotation center 5 are shifted by an amount necessary as a wavelength dispersion direction adjusting movement width of the exit slit 1. And the exit slit 1 is fixed by fitting the eccentric shaft 3 to the base 4 as a result.
[0010]
The outlet slit portion is assembled by sandwiching the eccentric portion of the eccentric shaft 3 by the two leaf spring portions 2S of the outlet slit movable base 2 and fitting the eccentric shaft 3 to the base 4. As a result, the gap between the eccentric shaft 3 and the exit slit movable base 2 is eliminated.
[0011]
Next, an adjustment method for finely adjusting the exit slit movable base 2 in the wavelength dispersion direction and matching the peak of the wavelength profile with the exit slit 1 will be described. When the eccentric shaft 3 is rotated, the shaft that is fitted to the base 4 and the shaft that is sandwiched between the two leaf spring portions 2S of the movable outlet slit 2 are made eccentric. The slit movable base 2 can be moved in the wavelength dispersion direction by e (sin θ), where θ is the rotation angle of the eccentric shaft 3 and e is the amount of eccentricity. Since the exit slit 1 is bonded to the exit slit movable base 2, unlike the conventional method, the exit slit 1 can be smoothly and reliably adjusted by a target amount.
[0012]
Although the features of the present invention are as described above, the configuration of the leaf spring portion 2S may be formed as the same body as the exit slit movable base 2 as shown in the drawing, or a separate member may be provided in a protruding manner. May be. For example, the exit slit movable base 2 can be made of a metal material, and the leaf spring portion 2S can be made of a resin material.
[0013]
【The invention's effect】
The emission spectroscopic analysis apparatus of the present invention is configured as described above, and for adjusting the exit slit, the eccentric shaft forming the cam mechanism is sandwiched between the two leaf spring portions of the exit slit movable base. A gap does not occur between the eccentric shaft and the exit slit movable base, and the position adjustment of the exit slit can be performed stably and precisely. Further, in this structure, the tolerance of the portion sandwiching the eccentric shaft does not have to be so severe, and can be realized by a sheet metal structure, so that the mechanism can be manufactured stably and efficiently by using a mold.
[Brief description of the drawings]
FIG. 1 is a diagram showing an embodiment of an exit slit portion of an emission spectroscopic analyzer of the present invention.
FIG. 2 is a diagram showing a main part of the present invention.
FIG. 3 is a view showing an exit slit portion of a conventional emission spectroscopic analyzer.
FIG. 4 is a view showing an exit slit portion of a conventional emission spectroscopic analyzer.
FIG. 5 is a diagram showing an emission spectroscopic analyzer.
[Explanation of symbols]
1 ... Exit slit 2 ... Exit slit movable base 2S ... Plate spring part 3 ... Eccentric shaft 4 ... Base 5 ... Eccentric shaft rotation center
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18596498A JP3788046B2 (en) | 1998-07-01 | 1998-07-01 | Optical emission spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18596498A JP3788046B2 (en) | 1998-07-01 | 1998-07-01 | Optical emission spectrometer |
Publications (2)
Publication Number | Publication Date |
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JP2000019116A JP2000019116A (en) | 2000-01-21 |
JP3788046B2 true JP3788046B2 (en) | 2006-06-21 |
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Application Number | Title | Priority Date | Filing Date |
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JP18596498A Expired - Lifetime JP3788046B2 (en) | 1998-07-01 | 1998-07-01 | Optical emission spectrometer |
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JP (1) | JP3788046B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102853910A (en) * | 2012-08-30 | 2013-01-02 | 昆山书豪仪器科技有限公司 | Left and right precision regulating device based on eccentric shaft |
CN103630237A (en) * | 2012-08-20 | 2014-03-12 | 苏州生物医学工程技术研究所 | Electric precision adjustable slit device with feedback function |
-
1998
- 1998-07-01 JP JP18596498A patent/JP3788046B2/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103630237A (en) * | 2012-08-20 | 2014-03-12 | 苏州生物医学工程技术研究所 | Electric precision adjustable slit device with feedback function |
CN102853910A (en) * | 2012-08-30 | 2013-01-02 | 昆山书豪仪器科技有限公司 | Left and right precision regulating device based on eccentric shaft |
Also Published As
Publication number | Publication date |
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JP2000019116A (en) | 2000-01-21 |
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