JP3750930B2 - Charged particle irradiation equipment - Google Patents

Charged particle irradiation equipment Download PDF

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JP3750930B2
JP3750930B2 JP2002008713A JP2002008713A JP3750930B2 JP 3750930 B2 JP3750930 B2 JP 3750930B2 JP 2002008713 A JP2002008713 A JP 2002008713A JP 2002008713 A JP2002008713 A JP 2002008713A JP 3750930 B2 JP3750930 B2 JP 3750930B2
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charged particle
irradiation
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irradiated
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JP2003215299A (en
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学 溝田
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Mitsubishi Electric Corp
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N5/00—Radiation therapy
    • A61N5/10—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
    • A61N5/1077—Beam delivery systems
    • A61N5/1081—Rotating beam systems with a specific mechanical construction, e.g. gantries
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61N—ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY
    • A61N5/00—Radiation therapy
    • A61N5/10—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy
    • A61N2005/1085—X-ray therapy; Gamma-ray therapy; Particle-irradiation therapy characterised by the type of particles applied to the patient
    • A61N2005/1087—Ions; Protons

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Description

【０００１】
【発明の属する技術分野】
この発明は、荷電粒子ビームを被照射体に照射する荷電粒子照射装置に関し、例えば陽子等を患部に照射して癌等の治療に用いられる荷電粒子照射装置に関するものである。
【０００２】
【従来の技術】
図１１は、従来の荷電粒子照射装置の構成を示す斜視図である。この荷電粒子照射装置は、例えば癌等の治療をする際に、患部に電子、陽子、あるいは重イオン等の荷電粒子ビームを照射する装置である。図１１において、荷電粒子照射装置１０１は、治療台１０２に乗せられた被照射体である患者１０３の周囲から荷電粒子ビームをその患部に照射するものである。荷電粒子照射装置１０１は、図示しない加速器で加速された荷電粒子ビームをこの治療台１０２に乗せられた患者１０３の周囲に誘導する輸送部１０４と、この誘導された荷電粒子ビームをこの周囲から患者１０３に向けて偏向させる偏向部１０５とを有した荷電粒子誘導手段１０６を備えている。また、荷電粒子照射装置１０１は、偏向部１０５で偏向された荷電粒子ビームを患者１０３における所定範囲である患部の形状に合うように整形する荷電粒子整形部１０７と、荷電粒子整形部１０７で整形された荷電粒子ビームを患者１０３の患部に照射する照射ノズル部１０８とを有した荷電粒子照射手段１０９を備えている。さらに、荷電粒子照射装置１０１は、荷電粒子誘導手段１０６及び荷電粒子照射手段１０９を支持し、荷電粒子誘導手段１０６及び荷電粒子照射手段１０９を軸線Ａを中心に回転させる支持回転手段１１０を備えている。この軸線Ａ上には患者１０３が配置されている。
【０００３】
輸送部１０４は、その端部１０４ａが加速器から延出して荷電粒子ビームを導く加速器輸送管１１１の端部１１１ａに回転ジョイント１１２によって連結されている。回転ジョイント１１２は、軸線Ａ上に配置されている。従って、輸送部１０４は、加速器輸送管１１１に連結したまま外気を内部に侵入させないで軸線Ａ周りに回転できるようになっている。なお、この回転ジョイント１１２の加速器側に図示しないビームモニタが設けられ、この箇所で荷電粒子ビームの通過及びそのビーム形状等を確認して、荷電粒子ビームの適正な輸送が行われるようになっている。輸送部１０４は、内部が真空で荷電粒子ビームの通過経路となっているビーム誘導管１１３と、このビーム誘導管１１３の軸線方向に複数配列され、荷電粒子ビームの収束あるいは拡散を防止する四極電磁石１１４と、荷電粒子ビームを軸線Ａから遠ざかるように偏向させる輸送偏向部１１５とを有している。従って、端部１０４ａから入射した荷電粒子ビームは、軸線Ａに沿ったビーム誘導管１１３内を通過して、輸送偏向部１１５によって軸線Ａから遠ざかる方向に偏向され再びビーム誘導管１１３内を通って偏向部１０５に入射するようになっている。
偏向部１０５は電磁石であり、輸送部１０４からの荷電粒子ビームを荷電粒子ビームの進行方向が軸線Ａに垂直となるように治療台１０２上の患者１０３に向けて偏向するようになっている。また偏向部１０５内は真空で、また偏向部１０５と荷電粒子照射手段１０９との間に隙間が存在しており、偏向された荷電粒子ビームは一旦偏向部１０５から空気中に出た後、荷電粒子照射手段１０９に入るようになっている。
【０００４】
荷電粒子整形部１０７は、患者１０３の患部の形状に荷電粒子ビームの形状を合わせるように整形するものである。荷電粒子整形部１０７は、荷電粒子ビームの断面形状を制限して患部の投影形状に合わせるコリメータと、患部の存在する深さで荷電粒子ビームの電離作用が大きくなる、即ちブラッグピークが患部の深さ幅に一致するように荷電粒子ビームのエネルギに分布を与えて調整する、リッジフィルタ及びレンジシフタ等の各種のフィルタとを有している。
照射ノズル部１０８は、照射口１０８ａを有しており、この照射口１０８ａが患者１０３の患部に向けられて荷電粒子整形部１０７で整形された荷電粒子ビームを照射するようになっている。
【０００５】
荷電粒子照射手段１０９はまた、患者１０３に向けてＸ線を曝射するＸ線曝射部１１６を有している。また、患者１０３を介してＸ線曝射部１１６に対向する位置には、Ｘ線曝射部１１６から曝射されたＸ線の分布量を測定するＸ線測定部であるＩＩ管１１７（Image Intensifier）が設けられている。このＩＩ管１１７は、支持回転手段１１０に支持されてＸ線曝射部１１６とともに軸線Ａを中心に回転するようになっており、常にＸ線曝射部１１６及びＩＩ管１１７が患者１０３を介して互いに対向するようになっている。さらに、患者１０３が乗せられた治療台１０２は、ＩＩ管１１７の測定結果に基づいて確認された患部の位置に照射ノズル１０８からの荷電粒子ビームが照射されるように適正な位置に移動するようになっている。
【０００６】
支持回転手段１１０は、荷電粒子誘導手段１０６及び荷電粒子照射手段１０９が固定されたトラス構造体１２０と、このトラス構造体１２０が固定され、トラス構造体１２０を軸線Ａ方向に挟むように配置された第１回転リング１２１及び第２回転リング１２２を有する回転リング結合体１２３と、第１回転リング１２１の外周面及び第２回転リング１２２の外周面にそれぞれ当接して回転リング結合体１２３を支持し軸線Ａを中心に回転させる支持駆動体１２４とを有している。
【０００７】
トラス構造体１２０は、複数の梁が組み立てられて全体として略円環状のトラス構造となっているものである。この略円環状のトラス構造体１２０は、その中心軸線が軸線Ａと一致するように配置されている。また、このトラス構造体１２０は、その略円環構造の一部が固定部１２０ａとなっており、この固定部１２０ａに偏向部１０５及び荷電粒子整形部１０７が固定されている。ここで、偏向部１０５はトラス構造体１２０の外周側に固定され、荷電粒子整形部１０７はトラス構造体１２０の第１回転リング１２１側の側面に固定されている。さらに、トラス構造体１２０は、固定部１２０ａに軸線Ａを挟んで対向する部分がカウンタバランス１２０ｂとなっており、このカウンタバランス１２０ｂが固定部１２０ａ、それに固定された荷電粒子誘導手段１０６及び荷電粒子照射手段１０９の合計重量とのバランスをとるようになっている。このカウンタバランス１２０ｂには複数の調整板１３０が取り付けられており、この調整板１３０の数を調整してカウンタバランス１２０ｂの重量調整ができるようになっている。
回転リング結合体１２３は、第１回転リング１２１の中心軸線及び第２回転リング１２２の中心軸線が軸線Ａに一致するように配置されている。また、回転リング結合体１２３は、第１回転リング１２１及び第２回転リング１２２の間に複数渡されて第１回転リング１２１及び第２回転リング１２２を互いに連結する連結梁１２５を有している。この連結梁１２５は軸線Ａに平行に配置され、かつ、略円環状のトラス構造体１２０の内周側空間を貫通するように配置されている。また、この複数の連結梁１２５にトラス構造体１２０の内周部分が固定されている。なお、回転リング結合体１２３には、患者１０３からこの荷電粒子照射装置１０１の構造が見えないように治療台１０２の周囲部分に化粧板が設けられている。
【０００８】
支持駆動体１２４は、軸線Ａに平行な軸線を有する複数（例えば２つ）のローラ１２６を有し、このローラ１２６に第１回転リング１２１の外周面、第２回転リングの外周面を当接させて支持する支持部１２７と、このローラ１２６をその軸線周りに回転駆動させる駆動部であるモータ１２８とを有している。支持部１２７は、第１回転リング１２１及び第２回転リング１２２の下側にそれぞれ複数（例えば２つ）配置され、第１回転リング１２１及び第２回転リング１２２を支持している。また、ローラ１２６は、第１回転リング１２１、第２回転リング１２２に滑りを生じないように当接しており、ローラ１２６が回転することによって第１回転リング１２１及び第２回転リング１２２も回転するようになっている。モータ１２８は、例えば第２回転リング１２２を支持する２つの支持部１２７にそれぞれ伝達機構を介して連結され、そのローラ１２６にモータ１２８の駆動力を伝達するようになっている。
従って、モータ１２８による駆動力でローラ１２６を回転させることにより、回転リング結合体１２３、トラス構造体１２０、荷電粒子照射手段１０９及び荷電粒子誘導手段１０６が一体となって軸線Ａを中心に回転するようになっている。なお、この一体となって回転する回転リング結合体１２３、トラス構造体１２０、荷電粒子照射手段１０９及び荷電粒子誘導手段１０６は、一体回転体１２９を構成している。
【０００９】
このような構成の荷電粒子照射装置１０１は、以下のようにして患者１０３の患部に荷電粒子ビームを照射する。まず、あらかじめ患者１０３の患部の位置をＣＴ等で確認しておく。次に、患者１０３が治療台１０２に乗せられた後、Ｘ線照射部１１６がＸ線を患者１０３に曝射し、ＩＩ管１１７によってそのＸ線の分布量が測定され透過像が得られる。このとき、患部の位置を確認するために、まず支持駆動体１２４により一体回転体１２９が軸線Ａを中心に回転し、それとともに患者１０３の上方に荷電粒子照射手段１０９が移動して１回目の測定が行われ、その後同様に支持駆動体１２４により一体回転体１２９が回転し患者１０３の側方に荷電粒子照射手段１０９が移動して２回目の測定が行われる。この２回の測定により空間的な患部の位置が把握される。また、患部の位置が軸線Ａ上にないときには、治療台１０２が移動して患部を軸線Ａ上に配置させる。その後、荷電粒子ビームの照射方向はあらかじめＣＴ等の検査結果をもとに検討されて決められており、その決められた照射方向から荷電粒子ビームを照射するために一体回転体１２９が回転して荷電粒子照射手段１０９がその照射方向の位置に移動する。
【００１０】
その後、加速器からの荷電粒子ビームが回転ジョイント１１２の加速器側に設けられたビームモニタによって荷電粒子ビームの断面形状等が確認され、荷電粒子誘導手段１０６によって荷電粒子照射手段１０９に導かれる。ここで、ビームモニタで確認された荷電粒子ビームの断面形状等が適正でないときは、加速器等の調整を行い適正な荷電粒子ビームとしてから荷電粒子照射装置１０１に送るようにする。
【００１１】
荷電粒子照射手段１０９に入った荷電粒子ビームは、コリメータによって周囲がカットされて患部の投影形状に一致した断面形状に、フィルタによって患部の深さにブラッグピークが一致するようなエネルギ分布に、調整される。その後、荷電粒子ビームは照射ノズル部１０８から患者１０３の患部に照射される。
【００１２】
【発明が解決しようとする課題】
しかしながら、この荷電粒子照射装置１０１は、荷電粒子誘導手段１０６及び荷電粒子照射手段１０９の両方の重量をトラス構造体１２０が支持するため、このトラス構造体１２０はこれら荷電粒子誘導手段１０６及び荷電粒子照射手段１０９の重量に耐えるだけの剛性を有する必要がある。また、トラス構造体１２０は、荷電粒子誘導手段１０６及び荷電粒子照射手段１０９の両方の重量、及び固定部１２０ａの重量につり合うだけの重量を有したカウンタバランス１２０ｂを有する必要がある。従って、トラス構造体１２０自体を重量化する必要があり、そのため一体回転体１２９を支持して回転する支持駆動体１２４も大型化する。このように荷電粒子照射装置１０１全体が大型化するため、この荷電粒子照射装置１０１を組み立てるためのクレーン等の設備が大型化し、組立作業が大がかりで時間がかかるという問題点があった。
【００１３】
また、例えば患部の位置を確認するためにＸ線曝射部１１６からＸ線を曝射する際には、Ｘ線曝射部１１６を移動させる必要があるが、荷電粒子誘導手段１０６を移動させる必要はない。しかしながら、このＸ線曝射部１１６は一体回転体１２９全体が回転しなければ移動できないため、例えば可動粒子誘導手段１０６のような患部の位置確認に必要のないものも一体として回転させることになる。従って、大きな一体回転体１２９が回転するために時間がかかり、また支持駆動体１２４のモータ１２８の消費電力も大きくなるという問題点があった。
【００１４】
また、トラス構造体１２０は、荷電粒子誘導手段１０６及び荷電粒子照射手段１０９の両方の重量、そして自重による撓みが回転角度によって異なり、また回転リング結合体１２３も、このトラス構造体１２０の重量によって撓みを生じるため、荷電粒子照射手段１０９から照射される荷電粒子ビームの照射方向が患部からズレる可能性があるという問題点もあった。
【００１５】
また、荷電粒子ビームの断面形状の確認及び通過の有無の確認等は、回転ジョイント１１２の加速器側でビームモニタによって行われるが、荷電粒子誘導手段１０６に入った後の荷電粒子ビームの断面形状等の確認は、実際に照射ノズル部１０８から荷電粒子ビームが射出されるまでできない。例えば荷電粒子誘導手段１０６内で荷電粒子ビームの断面形状が変形して不適正となったり、荷電粒子ビームが荷電粒子照射手段１０９に到達しなくなった場合でも、実際に照射ノズル部１０８から射出させなければ確認できない。特に、荷電粒子ビームの断面形状がコリメータの通過形状より小さいときには、断面形状が患部の投影形状に一致しない荷電粒子がそのまま患部に照射されることになり、適切な治療ができないという問題点もあった。
【００１６】
また、一体回転体１２９は重量が大きいため回転モーメントが大きく、例えば一体回転体１２９が回転して、照射ノズル部１０８が治療台１０２に接触しそうになったときに停止しようとしても、急に停止はできずにそのまま照射ノズル部１０８が治療台１０２に接触して破損する可能性があるという問題点もあった。
【００１７】
そこでこの発明は、上記のような問題点を解決することを課題とするもので、照射ノズル部の位置合わせ時間が短縮するとともに患部への荷電粒子ビーム照射の精度が向上すること等を実現する荷電粒子照射装置。
【００１８】
【課題を解決するための手段】
この発明に係る荷電粒子照射装置は、軸線上に設けられた被照射体に荷電粒子ビームを照射する荷電粒子照射装置であって、前記荷電粒子ビームを前記被照射体に向けて偏向させる荷電粒子誘導手段と、前記荷電粒子誘導手段を支持し、前記荷電粒子誘導手段を前記軸線を中心とした円環軌道上で移動させる誘導支持移動手段と、前記偏向された前記荷電粒子ビームを前記被照射体の所定範囲に照射すように整形して照射する荷電粒子照射手段と、前記荷電粒子照射手段を支持し、前記荷電粒子照射手段を前記軸線を中心とした円環軌道上で移動させる照射支持移動手段とを備え、前記荷電粒子誘導手段と前記荷電粒子照射手段とがそれぞれ独立して移動するようになっている。
【００１９】
また、前記誘導支持移動手段は、前記軸線が中心軸線である誘導円環状構造部と、前記誘導円環状構造部を支持し、前記誘導円環状構造部を前記軸線を中心に回転させる誘導回転駆動部とを有する。
【００２０】
また、前記誘導支持移動手段は、前記軸線が中心軸線である誘導円環レールと、前記荷電粒子誘導手段を支持固定し、前記誘導円環レール上を前記荷電粒子誘導手段とともに移動する誘導支持自走部とを有する。
【００２１】
また、前記照射支持移動手段は、前記軸線が中心軸線である照射円環状構造部と、前記照射円環状構造部を支持し、前記照射円環状構造部を前記軸線を中心に回転させる照射回転駆動部とを有する。
【００２２】
また、前記照射支持移動手段は、前記軸線が中心軸線である照射円環レールと、前記荷電粒子照射手段を支持固定し、前記照射円環レール上を前記荷電粒子照射手段とともに移動する照射支持自走部とを有する。
【００２３】
また、前記荷電粒子ビームを測定するビームモニタ及び前記ビームモニタを通過した前記荷電粒子ビームを遮るビームダンパを有するビーム測定手段が、前記荷電粒子照射手段と異なる位置に前記荷電粒子照射手段の円環軌道上で移動自在に設けられ、前記ビーム測定手段は、前記荷電粒子ビームが前記荷電粒子照射手段を介して前記被照射体に照射される前に、前記荷電粒子誘導手段及び前記被照射体の間に移動し、前記ビーム測定手段に前記荷電粒子ビームが照射されることにより、前記ビーム測定手段が前記荷電粒子ビームを測定するようになっている。
【００２４】
また、前記荷電粒子照射手段は、前記被照射体に向けてＸ線を曝射するＸ線曝射部を有し、また、前記Ｘ線曝射部からの前記Ｘ線の線量分布を測定するＸ線測定部が、前記被照射体を介して常に前記Ｘ線曝射部に対向して前記荷電粒子照射手段の円環軌道上に移動自在に設けられており、前記Ｘ線の曝射による前記Ｘ線測定部の測定結果に基づいて前記被照射体の位置を確認し、前記荷電粒子照射手段は前記位置に前記荷電粒子ビームを照射するようになっている。
【００２５】
また、この発明に係る荷電粒子照射装置は、軸線上に設けられた被照射体に荷電粒子ビームを照射する荷電粒子照射装置であって、前記荷電粒子ビームを前記被照射体の周囲に導いて前記被照射体に向けて偏向させる荷電粒子誘導手段と、前記荷電粒子誘導手段を支持し、前記荷電粒子誘導手段を前記軸線を中心とした円環軌道上で移動させる誘導支持移動手段と、前記偏向された前記荷電粒子ビームを前記被照射体の所定範囲に照射しうるように整形して前記被照射体に照射するとともに、前記軸線の周囲に複数設けられた荷電粒子照射手段とを備え、前記複数の荷電粒子照射手段は、前記荷電粒子誘導手段が移動することにより何れか１つを選択され、この選択された荷電粒子照射手段が前記荷電粒子誘導手段からの前記荷電粒子ビームを前記被照射体に照射するようになっている。
【００２６】
また、前記荷電粒子ビームの状態を測定するビームモニタ及び前記ビームモニタを通過した前記荷電粒子を遮るビームダンパを有するビーム測定手段が、前記軸線の周囲で前記荷電粒子照射手段と異なる位置に設けられ、前記荷電粒子誘導手段は、前記荷電粒子ビームが前記荷電粒子照射手段を介して前記被照射体に照射される前に、前記ビーム測定手段に前記荷電粒子を照射する位置に移動し、前記ビーム測定手段に前記荷電粒子ビームが照射されることにより、前記ビーム測定手段が前記荷電粒子ビームの前記状態を測定するようになっている。
【００２７】
また、前記荷電粒子照射手段は、径方向に移動可能になっており、前記被照射体が所定の位置に配置されるときに、前記荷電粒子照射手段が前記荷電粒子誘導手段と周方向にズレた位置で径方向外向きに移動して前記被照射体から離れるようになっている。
【００２８】
【発明の実施の形態】
以下にこの発明の実施の形態について説明するが、従来例のものと同一又は同等部材、部位は、同一符号を付して説明する。
実施の形態１．
図１は、この発明の実施の形態１に係る荷電粒子照射装置の模式的な側面図であり、図２は、図１の正面図である。図１及び図２において、荷電粒子照射装置１は、荷電粒子誘導手段１０６を支持する誘導支持移動手段２と、荷電粒子照射手段１０９を支持する照射支持移動手段３とを備えている。この誘導支持移動手段２と照射支持移動手段３とは軸線Ａ方向に並んで配置されている。
【００２９】
誘導支持移動手段２は、誘導円環状構造部である回転リング結合体１２３と、この回転リング結合体１２３を支持する誘導回転駆動部である支持駆動体１２４とを有している。回転リング結合体１２３は、従来の回転リング結合体と同様の構成となっているが、従来よりも連結梁１２５の長さが短くなって第１回転リング１２１及び第２回転リング１２２の間隔が狭く、それぞれの径が大きくなっている。回転リング結合体１２３の第１回転リング１２１側に照射支持移動手段３が配置されている。また、偏向部１０５が第１回転リング１２１の内周面に支持固定され、この偏向部１０５に軸線Ａを介してほぼ対向する連結梁１２５に重量バランスをとるカウンタバランス１２０ｂが固定されている。この回転リング結合体１２３は、荷電粒子誘導手段１０６を支持するだけでよいので、従来のようなトラス構造は必要ない。さらに、荷電粒子誘導手段１０６、回転リング結合体１２３、及びカウンタバランス１２０ｂは、支持駆動体１２４によって一体となって軸線Ａを中心に回転するようになっており、これらが一体回転体４を構成している。
なお、輸送部１０４は荷電粒子ビームの経路及び輸送偏向部１１５のみが示されている。
【００３０】
照射支持移動手段３は、全体として小さいが誘導支持移動手段２と同様の構成となっている。なお、照射支持移動手段３の誘導支持移動手段２に相当する部材、部位には同一符号に記号Ａを付して示す。即ち、照射支持移動手段３は、照射円環状構造部である回転リング結合体１２３Ａと、この回転リング結合体１２３Ａを支持する照射回転駆動部である支持駆動体１２４Ａとを有している。回転リング結合体１２３Ａ及び支持駆動体１２４Ａは、それぞれ回転リング結合体１２３及び支持駆動体１２４と同様の構成で、かつ、全体的に小さくなっている。荷電粒子照射手段１０９は、回転リング結合体１２３Ａの第１回転リング１２１Ａに支持固定され、この荷電粒子照射手段１０９に軸線Ａを介して対向する位置にＩＩ管１１７が連結梁１２５Ａに支持固定されて設けられている。カウンタバランスは、図においては設けられていないが、荷電粒子照射手段１０９とＩＩ管１１７との重量バランスがとれなければ、ＩＩ管１１７の近傍の連結梁１２５Ａに設けてもよい。従って、荷電粒子照射手段１０９、回転リング結合体１２３Ａ、及びＩＩ管１１７は、支持駆動体１２４Ａによって一体となって軸線Ａを中心に回転するようになっており、これらが一体回転体５を構成している。
さらに、治療台１０２は回転リング結合体１２３内には配置されず、回転リング結合体１２３Ａの内側に配置され、この治療台１０２上に乗せられた患者１０３の患部に荷電粒子ビームが照射されるようになっている。
【００３１】
なお、荷電粒子誘導手段１０６の偏向部１０５から出た荷電粒子ビームの進行方向が、一体回転体５の回転により荷電粒子照射手段１０９が移動する経路と交差するように、偏向部１０５及び荷電粒子照射手段１０９がそれぞれ誘導支持移動手段２及び照射支持移動手段３に支持されている。従って、一体回転体４及び一体回転体５がそれぞれ回転することにより偏向部１０５及び荷電粒子照射手段１０６が移動し、偏向部１０５と荷電粒子照射手段１０９とが軸線Ａの径方向に揃って配置されたときに、偏向部１０５から出た荷電粒子ビームが荷電粒子照射手段１０９に入るようになっている。他の構成は従来例と同様となっている。
【００３２】
このような構成の荷電粒子照射装置１は、以下のようにして患者１０３の患部に荷電粒子ビームを照射する。まず、従来と同様にして、あらかじめ患者１０３の患部の位置をＣＴ等で確認しておく。次に、患者１０３が治療台１０２に乗せられた後、Ｘ線照射部１１６がＸ線を患者１０３に曝射し、ＩＩ管１１７によってそのＸ線の分布量が測定され透過像が得られる。このとき、患部の正確な位置を確認するために、まず照射支持移動手段３における支持駆動体１２４Ａにより一体回転体５が軸線Ａを中心に回転し、それとともに患者１０３の上方に荷電粒子照射手段１０９が移動して１回目の測定が行われ、その後同様に支持駆動体１２４Ａにより一体回転体５が回転し患者１０３の側方に荷電粒子照射手段１０９が移動して２回目の測定が行われる。この２回の測定により空間的な患部の位置が把握される。また、患部の位置が軸線Ａ上にないときには、治療台１０２が移動して患部を軸線Ａ上に配置させる。
この患部の位置を測定している間に、あらかじめＣＴ等の検査結果をもとに検討されて決められた照射方向から荷電粒子ビームを照射するために一体回転体４が回転して荷電粒子誘導手段１０６がその照射方向の位置に移動する。従って、Ｘ線曝射部１１６及びＩＩ管１１７によって患部の位置測定をしている間に、偏向部１０５は移動して所定の照射位置に配置されてしまっている。
【００３３】
その後、一体回転体５が支持駆動体１２４Ａによって回転し、荷電粒子照射手段１０９があらかじめ決めておいた荷電粒子の照射位置、即ちすでに移動し終わっている偏向部１０５と揃う位置に移動する。
【００３４】
その後、従来と同様にして加速器から荷電粒子ビームが荷電粒子誘導手段１０６及び荷電粒子照射手段１０９を通じて患者１０３の患部に照射される。
【００３５】
従って、荷電粒子照射装置１は、荷電粒子誘導手段１０６が誘導支持移動手段２に、荷電粒子照射手段１０９が照射支持移動手段３に、それぞれ別々に支持されているので、誘導支持移動手段２及び照射支持移動手段３が支持する重量が小さくなり、それぞれの剛性を従来よりも大きくしなくてもよい。また、荷電粒子誘導手段１０６との重量バランスをとるだけでよいので、カウンタバランス１２０ｂも小さくなる。そのため、支持駆動体１２４及び支持駆動体１２４Ａはそれぞれ従来よりも小型化し、また荷電粒子照射装置１の組立作業も短時間で容易に行うことができる。
【００３６】
また、誘導支持移動手段２及び照射支持移動手段３は、それぞれ支持する重量が小さくなるので、その重量による撓みが小さくなり回転角度が異なっても従来ほど大きな撓みの差が生じることなく荷電粒子ビームの照射方向の精度を向上させることができる。
【００３７】
また、一体回転体４及び一体回転体５をそれぞれ別々のモータ１２８及びモータ１２８Ａで駆動し、荷電粒子誘導手段１０６と荷電粒子照射手段１０９とをそれぞれ独立に移動させるようにしているので、例えばＸ線曝射による患部の位置を測定する際に一体回転体５を駆動するモータ１２８Ａのみを駆動させればよく、従来のように不必要な荷電粒子誘導手段１０６を一緒に駆動することはない。このことから、モータ１２８及びモータ１２８Ａのそれぞれの消費電力をトータルしても従来の消費電力よりも小さくなる。
【００３８】
また、一体回転体５は、従来の一体回転体よりも小さく、そして軽量になっているので、回転モーメントが小さくなり、例えば照射ノズル部１０８が治療台１０２に接触しそうになったときに、照射ノズル部１０８の制動距離が小さくなって照射ノズル１０８が治療台１０２に接触して破損する可能性が小さくなる。
【００３９】
実施の形態２．
図３は、この発明の実施の形態２に係る荷電粒子照射装置の模式的な側断面図であり、図４は、図３の正面図である。図３及び図４において、荷電粒子照射装置１１は、荷電粒子誘導手段１０６を支持する誘導支持移動手段１２と、荷電粒子照射手段１０９を支持する照射支持移動手段１３とを備えている。また、荷電粒子照射装置１１は、奥行きのある壁をくり抜いて形成された軸線Ａを中心軸線に持つ空間１０内に存在している。空間１０は、軸線Ａに垂直な平面に沿った断面形状が円形であり、軸線Ａと平行である平行面１６と、この平行面１６から傾斜して断面の大きさが次第に小さくなっていく傾斜面１７とからその一部が形成されている。
【００４０】
誘導支持移動手段１２は、中心軸線が軸線Ａに一致するように設けられた誘導円環レール１４と、荷電粒子誘導手段１０６を支持固定して誘導円環レール１４上を荷電粒子誘導手段１０６とともに移動する誘導支持自走部１５とを有している。
誘導円環レール１４は、空間１０内に設けられており、平行面１６に２本固定されている。平行面１６では、壁面が軸線Ａと平行になっているので、誘導円環レール１４を２本固定すれば誘導支持自走部１５が安定して移動することができる。当然のことながら、この誘導円環レール１４は１本あるいは３本以上であっても構わない。
誘導支持自走部１５は、偏向部１０５を支持固定する支持固定部１８と、この支持固定部１８に固定されるとともに誘導円環レール１４に係合する車輪部１９と、支持固定部１８に設けられるとともに車輪部１９に駆動力を与える自走用モータ２０とを有している。この支持固定部１８は、例えば誘導支持自走部１５が誘導円環レール１４上を移動している際に偏向部１０５に生じる慣性力のように、偏向部１０５に与えられる外力によって偏向部１０５が車輪部１９に対して相対的な変位を生じない程度に偏向部１０５を支持固定するものであればどのようなものでもよい。また、車輪部１９は、誘導円環レール１４に当接して滑りなく転動し、スムーズに誘導円環レール１４に沿って移動する車輪１９ａを有している。例えば、誘導円環レール１４が断面Ｌ形状で、車輪部１９が複数（例えば２つ）の車輪を有しており、このＬ形状の突出部分を車輪１９ａが当接している。このように車輪１９ａが誘導円環レール１４を当接することにより、車輪部１９は安定して誘導円環レール１４に沿って移動することができる。
なお、車輪部１９の車輪１９ａが誘導円環レール１４を当接する構成とする必要はなく、車輪部１９が誘導円環レール１４に沿って安定して移動できる構成であれば構わない。従って、車輪部１９が無くても、例えば誘導円環レール１４と支持固定部１８とが係合して、互いに接触した面が滑るようになっていても構わない。
【００４１】
また、誘導支持移動手段１２は、輸送偏向部１１５を支持して軸線Ａを中心に回転させる誘導支持回転部２１を有している。この誘導支持回転部２１はモータ等の駆動部を有し、自ら輸送偏向部１１５を軸線Ａを中心に回転させる。また、この誘導支持移動手段１２は、輸送偏向部１１５が誘導支持自走部１５に同期するように輸送偏向部１１５を回転させるようになっている。即ち、偏向部１０５は、輸送偏向部１１５を含んだ輸送部１０４全体の相対的な位置関係が一定となるように誘導支持自走部１５によって移動するようになっている。
【００４２】
照射支持移動手段１３は、中心軸線が軸線Ａに一致するように設けられた照射円環レール２２と、荷電粒子照射手段１０９を支持固定して照射円環レール２２上を荷電粒子照射手段１０９とともに移動する照射支持自走部２３とを有している。また、照射支持移動手段１３は、治療台１０２の周囲で軸線Ａに垂直に設けられ空間１０の一部を形成する仕切り壁２４に設けられている。
照射円環レール２２は、空間１０内に設けられており、仕切り壁２４に２本固定されている。仕切り壁２４は軸線Ａに垂直に配置されているので、２本の照射円環レール２２は径の異なるものである。照射円環レール２２を２本固定すれば照射支持自走部２３が安定して移動することができる。当然のことながら、この照射円環レール２２は１本あるいは３本以上であっても構わない。
照射支持自走部２３は、形状は異なるが誘導支持自走部１５と同様の構成であり、荷電粒子照射手段１０９を支持固定する支持固定部２５と、この支持固定部２５に固定されるとともに照射円環レール２２に係合する車輪部と、図示されていないが、支持固定部２５に設けられるとともに車輪部に駆動力を与える自走用モータとを有している。この照射支持自走部２３は誘導支持自走部１５と同様にして照射円環レール２２に設けられ、照射支持自走部２３が照射円環レール２２に沿って安定して移動するようになっている。なお、この照射支持移動手段１３も誘導支持移動手段１２と同様に、車輪部がなくても照射円環レール２２と支持固定部２５とが係合して滑る構成としても構わない。
【００４３】
また、照射円環レール２２には、ＩＩ管１１７を支持する測定支持自走部２６が設けられている。測定支持自走部２６も照射支持自走部２３と同様の構成となっている。従って、測定支持自走部２６も照射円環レール２２に沿って安定して移動するようになっている。また、この測定支持自走部２６は、照射支持自走部２３に治療台１０２を介して対向して照射円環レール２２に設けられている。さらに、この測定支持自走部２６は、照射支持自走部２３に同期して照射円環レール２２に沿って移動するようになっており、測定支持自走部２６に支持されたＩＩ管１１７が常に照射支持自走部２３に支持された荷電粒子照射手段１０９に治療台１０２を介して対向するようになっている。
他の構成は実施の形態１と同様である。
【００４４】
このような構成の荷電粒子照射装置１１は、以下のようにして患者１０３の患部に荷電粒子ビームを照射する。まず、従来と同様にして、あらかじめ患者１０３の患部の位置をＣＴ等で確認しておく。次に、患者１０３が治療台１０２に乗せられた後、Ｘ線照射部１１６がＸ線を患者１０３に曝射し、ＩＩ管１１７によってそのＸ線の分布量が測定される。このとき、患部の正確な位置を確認するために、まず照射支持移動手段１３における照射支持自走部２３が照射円環レール２２に沿って移動し、患者１０３の上方に荷電粒子照射手段１０９が移動して１回目の測定が行われ（図５（ａ））、その後同様に照射支持自走部２３が照射円環レール２２に沿って移動し患者１０３の側方に荷電粒子照射手段１０９が移動して２回目の測定が行われる（図５（ｂ））。この上方及び側方からの測定により空間的な患部の位置が把握される。また、患部の位置が軸線Ａ上にないときには、治療台１０２が移動して患部を軸線Ａ上に配置させる。
この患部の位置を測定している間に、あらかじめＣＴ等の検査結果をもとに検討されて決められた照射方向から荷電粒子ビームを照射するために誘導支持自走部１５が誘導円環レール１４に沿って移動して荷電粒子誘導手段１０６がその照射方向の位置に移動する。従って、Ｘ線曝射部１１６及びＩＩ管１１７によって患部の位置測定をしている間に、偏向部１０５は移動して所定の照射位置に配置されてしまっている。
【００４５】
その後、照射支持自走部２３が照射円環レール２２に沿って移動し、荷電粒子照射手段１０９が、あらかじめ決めておいた荷電粒子の照射位置、即ちすでに移動し終わっている偏向部１０５と揃う位置に移動する（図５（ｃ））。
【００４６】
その後、従来と同様にして加速器から荷電粒子ビームが荷電粒子誘導手段１０６及び荷電粒子照射手段１０９を通じて患者１０３の患部に照射される。
【００４７】
従って、この荷電粒子照射装置１１は、実施の形態１と同様の効果を奏するとともに、荷電粒子誘導手段１０６及び荷電粒子照射手段１０９がそれぞれ安定した壁に固定された誘導円環レール１４を有した誘導支持移動手段１２及び照射円環レール２２を有した照射支持移動手段１３に設けられているので、さらに荷電粒子誘導手段１０６の重量及び荷電粒子照射手段１０９の重量による撓みが引き起こす荷電粒子ビームの照射方向のズレが小さくなる。
【００４８】
また、誘導支持移動手段１２の重量及び照射支持移動手段１３の重量がさらに小さくなるので、荷電粒子誘導手段１０６及び荷電粒子照射手段１０９の移動に消費する電力はさらに小さくなる。
【００４９】
実施の形態３．
図６は、この発明の実施の形態３に係る荷電粒子照射装置の模式的な正面図である。図６において、荷電粒子照射装置３１は、照射円環レール２２に設けられたビーム測定手段３２を備えている。ビーム測定手段３２は、荷電粒子ビームの断面形状、大きさ、及び通過確認等の荷電粒子ビームの状態を測定するビームモニタ３３と、ビームモニタ３３を通過した荷電粒子ビームを停止させて吸収するビームダンパ３４とを有している。このビーム測定手段３２は、ＩＩ管１１７を支持する測定支持自走部２６と同様の構成の支持自走部によって支持され照射円環レール２２に設けられており、この照射円環レール２２に沿って安定して移動するようになっている。また、このビーム測定手段３２を照射円環レール２２上に配置するために、ビーム測定手段３２は照射円環レール２２上の荷電粒子照射手段１０９及びＩＩ管１１７が配置されていない位置に設けられている。さらに、ビーム測定手段３２も荷電粒子照射手段１０９及びＩＩ管１１７と同期して照射円環レール２２上を移動するようになっており、ビーム測定手段３２、荷電粒子照射手段１０９及びＩＩ管１１７は相対的な位置関係が変化しないようになっている。
なお、図６においては、ビーム測定手段３２は荷電粒子照射手段１０９及びＩＩ管１１７の両方からほぼ同一距離だけ離れた位置に配置されているが、照射円環レール２２にビーム測定手段３２を設けることができればどのような位置でも構わない。また、ビーム測定手段３２の数は１つに限定されず、２つ以上であっても構わない。さらに、ビーム測定手段３２が荷電粒子照射手段１０９及びＩＩ管１１７に同期して移動するのは、ビーム測定手段３２が荷電粒子照射手段１０９及びＩＩ管１１７に衝突することを防止するためであるので、ビーム測定手段３２が荷電粒子照射手段１０９及びＩＩ管１１７に衝突しないように制御できれば同期する必要はない。
【００５０】
ビームモニタ３３は、例えば蛍光塗料を塗布した蛍光板、あるいは金属線が網目状に編まれて形成したものであり、荷電粒子ビームが通過する際にその通過面に発生する光を測定することにより、あるいは金属線にイオンが収集されることによる荷電粒子ビーム通過の際に生じる電流により荷電粒子ビームの通過の確認及び断面形状の確認等を行う。このビームモニタ３３は、照射円環レール２２の外周側に設けられており、その径方向内側面にビームダンパ３４が設けられている。
ビームダンパ３４は、アルミニウムあるいは鉛等の金属であり、荷電粒子ビームを通過しないものである。
他の構成は実施の形態２と同様である。
【００５１】
このような構成の荷電粒子照射装置３１は、以下のようにして患者１０３の患部に荷電粒子ビームを照射する。まず、実施の形態２と同様にして患部の位置を確認し患部を軸線Ａ上に移動させるとともに、偏向部１０５をあらかじめ決めておいた所定位置に移動させる（図７（ａ）、図７（ｂ））。次に、照射円環レール２２上のビーム測定手段３２を移動させて、ビーム測定手段３２と偏向部１０５とが径方向に揃うように配置する。その後、加速器からの荷電粒子ビームが輸送部１０４を介して偏向部１０５に入射し、偏向部１０５から出た荷電粒子ビームがビーム測定手段３２に照射される（図７（ｃ））。このビーム測定手段３２では、まず荷電粒子ビームがビームモニタ３３に照射されて荷電粒子ビームの断面形状等を測定し、ビームモニタ３３を通過した荷電粒子ビームがビームダンパ３４によって止められる。従って、偏向部１０５から出た荷電粒子ビームは患者１０３の患部には到達しない。荷電粒子ビームの断面形状等の状態が適正でない場合は、加速器からの荷電粒子ビームの供給を停止し、荷電粒子誘導手段１０６等を調整して適正な荷電粒子ビームとなるようにする。
【００５２】
その後、一旦加速器からの荷電粒子ビームの供給を停止した状態で、ビーム測定手段３２、荷電粒子照射手段１０９及びＩＩ管１１７を照射円環レール２２に沿って移動させて荷電粒子照射手段１０９及びＩＩ管１１７を荷電粒子ビームの照射方向に配置させ、実施の形態２と同様にして患者１０３の患部に荷電粒子ビームを照射する（図７（ｄ））。
【００５３】
従って、この荷電粒子照射装置３１は、実施の形態２と同様の効果を奏するとともに、荷電粒子ビームの断面形状等を測定して荷電粒子ビームの進行を止めるビーム測定手段３２が照射円環レール２２上で移動できるように設けられているので、正規に患部に荷電粒子ビームを照射する前において、患者１０３の患部には荷電粒子ビームを直接照射せずに偏向部１０５から出た荷電粒子ビームが適正がどうかを確認できる。このことから、従来では確認できなかった荷電粒子誘導手段１０６で荷電粒子ビームの状態が適正でなくなった場合であっても、偏向部１０５から出たところでその状態を確認して調整でき、適正な荷電粒子ビームを安定して照射することができる。
【００５４】
なお、このビーム測定手段３２は、実施の形態１における荷電粒子照射装置１の一体回転体５の第１回転リング１２１Ａに固定されても同様の効果を奏する。
【００５５】
実施の形態４．
図８は、この発明の実施の形態４に係る荷電粒子照射装置の模式的な正面図である。図８において、荷電粒子照射装置４１は、実施の形態２における荷電粒子照射装置１１のような照射支持移動手段１３は備えておらず、荷電粒子照射手段１０９が軸線Ａの周囲に設けられた仕切り壁２４に複数直接固定されている。この複数の荷電粒子照射手段１０９は、それぞれ照射ノズル部１０８が軸線Ａに向いており、照射ノズル部１０８から照射された荷電粒子ビームがそれぞれ軸線Ａに交差するように設けられている。また、患部の位置を正確に把握するために患者１０３の上方及び側方からのＸ線測定が必要となるので、ＩＩ管１１７は、２つあり、上方及び側方に配置された２つの荷電粒子照射手段１０９それぞれに軸線Ａを介して対向する位置にそれぞれ固定されている。
他の構成は実施の形態２と同様である。
【００５６】
このような構成の荷電粒子照射装置４１は、以下のようにして患者１０３の患部に荷電粒子ビームを照射する。まず、患者１０３の上方及び側方の荷電粒子照射手段１０９のＸ線曝射部１１６と対向する２つのＩＩ管１１７とによって、患部の位置を正確に確認し、患部を軸線Ａ上に移動させるとともに、偏向部１０５をあらかじめ決めておいた所定位置に移動させる。この所定位置は、固定された荷電粒子照射手段１０９と径方向に揃う位置である。荷電粒子照射手段１０９は複数あるので、あらかじめ最良の位置に設けられた荷電粒子照射手段１０９を選択しておくことができる。
その後、実施の形態２と同様にして患者１０３の患部に荷電粒子ビームを照射する。
【００５７】
従って、この荷電粒子照射装置４１は、実施の形態２と同様の効果を奏するとともに、複数の荷電粒子照射手段１０９が仕切り壁２４に固定されているので、さらに確実に荷電粒子ビームを患部に照射することができ、また患部の位置を確認するために荷電粒子照射手段１０９を移動させる必要がない。
【００５８】
なお、軸線Ａの周囲の仕切り壁２４に実施の形態３におけるビーム測定手段３２が固定されていると、偏向部１０５から荷電粒子ビームをこのビーム測定手段３２に照射させることにより、実施の形態３と同様の効果も奏する。
【００５９】
実施の形態５．
図９は、この発明に係る実施の形態５の荷電粒子照射装置の模式的な正面図である。図９において、荷電粒子照射装置５１においては、照射支持自走部２３はその支持固定部２５が径方向にスライドするスライド機構５２を有している。このスライド機構５２は、例えば２つの部材を係合させて滑らせる構成であっても、どちらか一方の部材にローラを設けて他方の部材を転動させる構成であってもよく、支持固定部２５が径方向にスライドできて、荷電粒子照射手段１０９が径方向に移動できる構成であればどのような構成であっても構わない。
他の構成は実施の形態２と同様である。
【００６０】
このような構成の荷電粒子照射装置５１では、この荷電粒子照射装置５１が使用されないときには、図１０に示すように、スライド機構５２によって荷電粒子照射手段１０９が径方向外向きに移動して所定の待機位置に存在している。このとき、当然のことながら、偏向部１０５は荷電粒子照射手段１０９と同一の径方向には存在していない。患者１０３が治療台１０２に乗って荷電粒子照射装置５１が使用され始めると、荷電粒子照射手段１０９が径方向内向きに移動し所定の使用位置に配置される。その後は、実施の形態２と同様にして患者１０３の患部に荷電粒子ビームを照射する。
【００６１】
従って、この荷電粒子照射装置５１は、実施の形態２と同様の効果を奏するとともに、荷電粒子照射装置５１を使用しないときには、スライド機構５２によって荷電粒子照射手段１０９を待機位置に移動させることができるので、治療台１０２の周囲の空間が広くなり、患者１０３が治療台１０２上に乗りやすくなる。
【００６２】
なお、実施の形態３と同様に照射円環レール２２上にビーム測定手段３２を設けることにより、実施の形態３と同様の効果を奏するようになる。
【００６３】
【発明の効果】
以上の説明から明らかなように、この発明に係る荷電粒子照射装置は、軸線上に設けられた被照射体に荷電粒子ビームを照射する荷電粒子照射装置であって、前記荷電粒子ビームを前記被照射体に向けて偏向させる荷電粒子誘導手段と、前記荷電粒子誘導手段を支持し、前記荷電粒子誘導手段を前記軸線を中心とした円環軌道上で移動させる誘導支持移動手段と、前記偏向された前記荷電粒子ビームを前記被照射体の所定範囲に照射すように整形して照射する荷電粒子照射手段と、前記荷電粒子照射手段を支持し、前記荷電粒子照射手段を前記軸線を中心とした円環軌道上で移動させる照射支持移動手段とを備え、前記荷電粒子誘導手段と前記荷電粒子照射手段とがそれぞれ独立して移動するようになっているので、前記荷電粒子照射手段を使用する必要があって前記荷電粒子誘導手段を使用する必要がない場合には、前記荷電粒子照射手段のみを移動させて、前記荷電粒子誘導手段はその次に使用する準備ができ、時間を短縮できるとともに、必要なものを必要距離だけ移動できて電力消費も低減できる。
【００６４】
また、前記誘導支持移動手段は、前記軸線が中心軸線である誘導円環状構造部と、前記誘導円環状構造部を支持し、前記誘導円環状構造部を前記軸線を中心に回転させる誘導回転駆動部とを有するので、前記荷電粒子照射手段及び前記荷電粒子誘導手段を別々に支持して支持重量が小さくなり、前記軸線を中心に確実に前記荷電粒子誘導手段は移動できる。
【００６５】
また、前記誘導支持移動手段は、前記軸線が中心軸線である誘導円環レールと、前記荷電粒子誘導手段を支持固定し、前記誘導円環レール上を前記荷電粒子誘導手段とともに移動する誘導支持自走部とを有するので、前記荷電粒子誘導手段が安定した前記誘導円環レールに沿って移動でき、さらに確実に前記軸線を中心に前記荷電粒子誘導手段は移動できる。
【００６６】
また、前記照射支持移動手段は、前記軸線が中心軸線である照射円環状構造部と、前記照射円環状構造部を支持し、前記照射円環状構造部を前記軸線を中心に回転させる照射回転駆動部とを有するので、前記荷電粒子照射手段及び前記荷電粒子誘導手段を別々に支持して支持重量が小さくなり、前記軸線を中心に確実に前記荷電粒子照射手段は移動できる。
【００６７】
また、前記照射支持移動手段は、前記軸線が中心軸線である照射円環レールと、前記荷電粒子照射手段を支持固定し、前記照射円環レール上を前記荷電粒子照射手段とともに移動する照射支持自走部とを有するので、前記荷電粒子照射手段が安定した前記照射円環レールに沿って移動でき、さらに確実に前記軸線を中心に前記荷電粒子照射手段は移動できる。
【００６８】
また、前記荷電粒子ビームを測定するビームモニタ及び前記ビームモニタを通過した前記荷電粒子ビームを遮るビームダンパを有するビーム測定手段が、前記荷電粒子照射手段と異なる位置に前記荷電粒子照射手段の円環軌道上で移動自在に設けられ、前記ビーム測定手段は、前記荷電粒子ビームが前記荷電粒子照射手段を介して前記被照射体に照射される前に、前記荷電粒子誘導手段及び前記被照射体の間に移動し、前記ビーム測定手段に前記荷電粒子ビームが照射されることにより、前記ビーム測定手段が前記荷電粒子ビームを測定するようになっているので、前記荷電粒子ビームの状態を前記荷電粒子整形部に入る直前で前記ビームモニタによって確認でき、安定して適正な前記荷電粒子ビームを照射することができる。
【００６９】
また、前記荷電粒子照射手段は、前記被照射体に向けてＸ線を曝射するＸ線曝射部を有し、また、前記Ｘ線曝射部からの前記Ｘ線の線量分布を測定するＸ線測定部が、前記被照射体を介して常に前記Ｘ線曝射部に対向して前記荷電粒子照射手段の円環軌道上に移動自在に設けられており、前記Ｘ線の曝射による前記Ｘ線測定部の測定結果に基づいて前記被照射体の位置を確認し、前記荷電粒子照射手段は前記位置に前記荷電粒子ビームを照射するようになっているので、確実に前記被照射体に前記荷電粒子ビームを照射できる。
【００７０】
また、この発明に係る荷電粒子照射装置は、軸線上に設けられた被照射体に荷電粒子ビームを照射する荷電粒子照射装置であって、前記荷電粒子ビームを前記被照射体の周囲に導いて前記被照射体に向けて偏向させる荷電粒子誘導手段と、前記荷電粒子誘導手段を支持し、前記荷電粒子誘導手段を前記軸線を中心とした円環軌道上で移動させる誘導支持移動手段と、前記偏向された前記荷電粒子ビームを前記被照射体の所定範囲に照射しうるように整形して前記被照射体に照射するとともに、前記軸線の周囲に複数設けられた荷電粒子照射手段とを備え、前記複数の荷電粒子照射手段は、前記荷電粒子誘導手段が移動することにより何れか１つを選択され、この選択された荷電粒子照射手段が前記荷電粒子誘導手段からの前記荷電粒子ビームを前記被照射体に照射するようになっているので、安定して前記荷電粒子照射手段を前記被照射体に向けることができ、前記被照射体にさらに確実に前記荷電粒子ビームを照射することができる。
【００７１】
また、前記荷電粒子ビームの状態を測定するビームモニタ及び前記ビームモニタを通過した前記荷電粒子を遮るビームダンパを有するビーム測定手段が、前記軸線の周囲で前記荷電粒子照射手段と異なる位置に設けられ、前記荷電粒子誘導手段は、前記荷電粒子ビームが前記荷電粒子照射手段を介して前記被照射体に照射される前に、前記ビーム測定手段に前記荷電粒子を照射する位置に移動し、前記ビーム測定手段に前記荷電粒子ビームが照射されることにより、前記ビーム測定手段が前記荷電粒子ビームの前記状態を測定するようになっているので、前記荷電粒子ビームの状態を前記荷電粒子整形部に入る直前で前記ビームモニタによって確認でき、安定して適正な前記荷電粒子ビームを照射することができる。
【００７２】
また、前記荷電粒子照射手段は、径方向に移動可能になっており、前記被照射体が所定の位置に配置されるときに、前記荷電粒子照射手段が前記荷電粒子誘導手段と周方向にズレた位置で径方向外向きに移動して前記被照射体から離れるようになっているので、周囲の空間が広がり前記被照射体が前記所定の位置に配置されやすくなる。
【図面の簡単な説明】
【図１】 この発明の実施の形態１に係る荷電粒子照射装置の模式的な側面図である。
【図２】 図１の正面図である。
【図３】 この発明の実施の形態２に係る荷電粒子照射装置の模式的な側断面図である。
【図４】 図３の正面図である。
【図５】 この発明の実施の形態２に係る荷電粒子照射装置によって被照射体に荷電粒子ビームを照射する手順を示す模式図であり、図５（ａ）は、被照射体に上方からＸ線を曝射するところを示す図、図５（ｂ）は、被照射体に側方からＸ線を曝射するところを示す図、図５（ｃ）は、荷電粒子照射手段から被照射体に荷電粒子ビームを照射するところを示す図である。
【図６】 この発明の実施の形態３に係る荷電粒子照射装置の模式的な正面図である。
【図７】 この発明の実施の形態３に係る荷電粒子照射装置によって被照射体に荷電粒子ビームを照射する手順を示す模式図であり、図７（ａ）は、被照射体に上方からＸ線を曝射するところを示す図、図７（ｂ）は、被照射体に側方からＸ線を曝射するところを示す図、図７（ｃ）は、ビーム測定手段を偏向部と径方向に揃えて配置して荷電粒子ビームを測定するところを示す図、図７（ｄ）は、荷電粒子照射手段から被照射体に荷電粒子ビームを照射するところを示す図である。
【図８】 この発明の実施の形態４に係る荷電粒子照射装置の模式的な正面図である。
【図９】 この発明の実施の形態５に係る荷電粒子照射装置の模式的な正面図である。
【図１０】 図９の荷電粒子照射装置のスライド機構によって荷電粒子照射手段が径方向外向きに移動して待機位置に存在している状態を示す模式的な正面図である。
【図１１】 従来の荷電粒子照射装置の斜視図である。
【符号の説明】
１，１１，３１，４１，５１ 荷電粒子照射装置、２，１２ 誘導支持移動手段、３，１３ 照射支持移動手段、１４ 誘導円環レール、１５ 誘導支持自走部、２２ 照射円環レール、２３ 照射支持自走部、３２ ビーム測定手段、３３ ビームモニタ、３４ ビームダンパ、１０６ 荷電粒子誘導手段、１０９ 荷電粒子照射手段、１１６ Ｘ線曝射部、１１７ ＩＩ管（Ｘ線測定部）、１２３ 回転リング結合体（誘導円環状構造部）、１２３Ａ 回転リング結合体（照射円環状構造部）、１２４ 支持駆動体（誘導回転駆動部）、１２４Ａ 支持駆動体（照射回転駆動部）。[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a charged particle irradiation apparatus that irradiates an object to be irradiated with a charged particle beam, for example, a charged particle irradiation apparatus that is used for treatment of cancer or the like by irradiating an affected area with protons or the like.
[0002]
[Prior art]
FIG. 11 is a perspective view showing a configuration of a conventional charged particle irradiation apparatus. This charged particle irradiation apparatus is an apparatus that irradiates a diseased site with a charged particle beam such as electrons, protons, or heavy ions when treating cancer or the like. In FIG. 11, a charged particle irradiation apparatus 101 irradiates the affected part with a charged particle beam from around a patient 103 that is an irradiation target placed on a treatment table 102. The charged particle irradiation apparatus 101 includes a transport unit 104 that guides a charged particle beam accelerated by an accelerator (not shown) around the patient 103 placed on the treatment table 102, and the guided charged particle beam from the periphery to the patient. A charged particle guiding means 106 having a deflecting portion 105 that deflects the light toward 103 is provided. In addition, the charged particle irradiation apparatus 101 is shaped by the charged particle shaping unit 107 that shapes the charged particle beam deflected by the deflecting unit 105 so as to match the shape of the affected part that is a predetermined range in the patient 103 and the charged particle shaping unit 107. A charged particle irradiation means 109 having an irradiation nozzle unit 108 for irradiating the affected part of the patient 103 with the charged particle beam. Further, the charged particle irradiation apparatus 101 includes a support rotating unit 110 that supports the charged particle guiding unit 106 and the charged particle irradiation unit 109 and rotates the charged particle guiding unit 106 and the charged particle irradiation unit 109 about the axis A. Yes. A patient 103 is disposed on the axis A.
[0003]
The transport part 104 is connected by a rotary joint 112 to an end part 111a of an accelerator transport pipe 111 whose end part 104a extends from the accelerator and guides a charged particle beam. The rotary joint 112 is disposed on the axis A. Therefore, the transport unit 104 can rotate around the axis A without being invaded by outside air while being connected to the accelerator transport pipe 111. A beam monitor (not shown) is provided on the accelerator side of the rotary joint 112, and the charged particle beam is appropriately transported by checking the passage of the charged particle beam and its beam shape at this location. Yes. The transport unit 104 includes a beam guide tube 113 having a vacuum inside and serving as a charged particle beam passage path, and a plurality of quadrupole electromagnets arranged in the axial direction of the beam guide tube 113 to prevent convergence or diffusion of the charged particle beam. 114 and a transport deflection unit 115 that deflects the charged particle beam away from the axis A. Therefore, the charged particle beam incident from the end 104a passes through the beam guide tube 113 along the axis A, is deflected in the direction away from the axis A by the transport deflector 115, and passes through the beam guide tube 113 again. The light enters the deflection unit 105.
The deflecting unit 105 is an electromagnet, and deflects the charged particle beam from the transport unit 104 toward the patient 103 on the treatment table 102 so that the traveling direction of the charged particle beam is perpendicular to the axis A. Further, the inside of the deflecting unit 105 is vacuum, and there is a gap between the deflecting unit 105 and the charged particle irradiation means 109. The deflected charged particle beam once exits from the deflecting unit 105 into the air and then charged. The particle irradiation means 109 is entered.
[0004]
The charged particle shaping unit 107 shapes the charged particle beam so as to match the shape of the affected part of the patient 103. The charged particle shaping unit 107 includes a collimator that limits the cross-sectional shape of the charged particle beam to match the projected shape of the affected part, and the ionization action of the charged particle beam increases at the depth at which the affected part exists, that is, the Bragg peak is the depth of the affected part. It has various filters such as a ridge filter and a range shifter that adjust the distribution of the charged particle beam energy so as to match the width.
The irradiation nozzle unit 108 has an irradiation port 108 a, and the irradiation port 108 a is directed to the affected part of the patient 103 and irradiates the charged particle beam shaped by the charged particle shaping unit 107.
[0005]
The charged particle irradiation means 109 also has an X-ray exposure unit 116 that emits X-rays toward the patient 103. Further, at a position facing the X-ray exposure unit 116 through the patient 103, an II tube 117 (Image) that is an X-ray measurement unit that measures the distribution amount of the X-rays emitted from the X-ray exposure unit 116. Intensifier). The II tube 117 is supported by the support rotation means 110 and rotates about the axis A together with the X-ray irradiation unit 116. The X-ray irradiation unit 116 and the II tube 117 always pass through the patient 103. So that they face each other. Further, the treatment table 102 on which the patient 103 is placed moves to an appropriate position so that the charged particle beam from the irradiation nozzle 108 is irradiated to the position of the affected part confirmed based on the measurement result of the II tube 117. It has become.
[0006]
The support rotation means 110 is arranged so that the charged particle guiding means 106 and the charged particle irradiation means 109 are fixed, and the truss structure 120 is fixed, and the truss structure 120 is sandwiched in the axis A direction. The rotating ring combined body 123 having the first rotating ring 121 and the second rotating ring 122 and the rotating ring combined body 123 are in contact with the outer peripheral surface of the first rotating ring 121 and the outer peripheral surface of the second rotating ring 122, respectively. And a support driving body 124 that rotates about the center axis A.
[0007]
The truss structure 120 has a substantially annular truss structure as a whole by assembling a plurality of beams. The substantially annular truss structure 120 is arranged such that the central axis thereof coincides with the axis A. The truss structure 120 has a part of a substantially annular structure as a fixing part 120a, and the deflection part 105 and the charged particle shaping part 107 are fixed to the fixing part 120a. Here, the deflection unit 105 is fixed to the outer peripheral side of the truss structure body 120, and the charged particle shaping unit 107 is fixed to the side surface of the truss structure body 120 on the first rotating ring 121 side. Further, in the truss structure body 120, a portion facing the fixed portion 120a across the axis A is a counter balance 120b. The counter balance 120b is the fixed portion 120a, the charged particle guiding means 106 fixed to the fixed portion 120a, and the charged particles. The total weight of the irradiation means 109 is balanced. A plurality of adjusting plates 130 are attached to the counter balance 120b, and the weight of the counter balance 120b can be adjusted by adjusting the number of the adjusting plates 130.
The rotating ring combination 123 is arranged so that the center axis of the first rotating ring 121 and the center axis of the second rotating ring 122 coincide with the axis A. The rotating ring combination 123 includes a connecting beam 125 that is passed between the first rotating ring 121 and the second rotating ring 122 and connects the first rotating ring 121 and the second rotating ring 122 to each other. . The connecting beam 125 is arranged in parallel to the axis A and is arranged so as to penetrate the inner circumferential space of the substantially annular truss structure body 120. The inner peripheral portion of the truss structure 120 is fixed to the plurality of connecting beams 125. The rotating ring combined body 123 is provided with a decorative plate around the treatment table 102 so that the structure of the charged particle irradiation apparatus 101 cannot be seen from the patient 103.
[0008]
The support driving body 124 has a plurality of (for example, two) rollers 126 having an axis parallel to the axis A, and the outer peripheral surface of the first rotating ring 121 and the outer peripheral surface of the second rotating ring are brought into contact with the rollers 126. And a motor 127 which is a driving unit for rotating the roller 126 around its axis. A plurality of (for example, two) support portions 127 are disposed below the first rotating ring 121 and the second rotating ring 122, and support the first rotating ring 121 and the second rotating ring 122. The roller 126 is in contact with the first rotating ring 121 and the second rotating ring 122 so as not to slip, and the first rotating ring 121 and the second rotating ring 122 rotate when the roller 126 rotates. It is like that. The motor 128 is connected to, for example, two support portions 127 that support the second rotating ring 122 via transmission mechanisms, and transmits the driving force of the motor 128 to the rollers 126.
Accordingly, by rotating the roller 126 with the driving force of the motor 128, the rotating ring combined body 123, the truss structure 120, the charged particle irradiation means 109, and the charged particle guiding means 106 are integrally rotated about the axis A. It is like that. The rotating ring combination 123, the truss structure 120, the charged particle irradiation means 109, and the charged particle guiding means 106 that rotate together form an integral rotating body 129.
[0009]
The charged particle irradiation apparatus 101 having such a configuration irradiates the affected part of the patient 103 with a charged particle beam as follows. First, the position of the affected part of the patient 103 is confirmed in advance by CT or the like. Next, after the patient 103 is placed on the treatment table 102, the X-ray irradiation unit 116 exposes the X-ray to the patient 103, and the distribution amount of the X-ray is measured by the II tube 117 to obtain a transmission image. At this time, in order to confirm the position of the affected area, first, the integral rotating body 129 is rotated around the axis A by the support driving body 124, and the charged particle irradiation means 109 is moved above the patient 103 together with the first rotation. The measurement is performed, and thereafter, similarly, the integral rotating body 129 is rotated by the support driving body 124, the charged particle irradiation means 109 is moved to the side of the patient 103, and the second measurement is performed. The spatial position of the affected area is grasped by these two measurements. When the position of the affected part is not on the axis A, the treatment table 102 moves and places the affected part on the axis A. Thereafter, the irradiation direction of the charged particle beam is determined in advance based on examination results such as CT, and the integral rotating body 129 rotates to irradiate the charged particle beam from the determined irradiation direction. The charged particle irradiation means 109 moves to the position in the irradiation direction.
[0010]
Thereafter, the charged particle beam from the accelerator is confirmed by a beam monitor provided on the accelerator side of the rotary joint 112 and the charged particle beam is guided to the charged particle irradiation unit 109 by the charged particle guiding unit 106. Here, when the cross-sectional shape or the like of the charged particle beam confirmed by the beam monitor is not appropriate, an accelerator or the like is adjusted so that the charged particle beam is sent to the charged particle irradiation apparatus 101 after being adjusted to an appropriate charged particle beam.
[0011]
The charged particle beam entering the charged particle irradiation means 109 is adjusted to an energy distribution in which the periphery is cut by a collimator and matches the projected shape of the affected area, and the energy distribution is such that the Bragg peak matches the depth of the affected area by the filter. Is done. Thereafter, the charged particle beam is irradiated to the affected part of the patient 103 from the irradiation nozzle unit 108.
[0012]
[Problems to be solved by the invention]
However, in this charged particle irradiation apparatus 101, since the truss structure 120 supports the weights of both the charged particle guiding means 106 and the charged particle irradiation means 109, the truss structure 120 includes the charged particle guiding means 106 and the charged particles. It is necessary to have rigidity sufficient to withstand the weight of the irradiation means 109. Further, the truss structure body 120 needs to have a counter balance 120b having a weight sufficient to balance the weight of both the charged particle guiding means 106 and the charged particle irradiation means 109 and the weight of the fixed portion 120a. Therefore, it is necessary to increase the weight of the truss structure 120 itself. Therefore, the support driving body 124 that rotates while supporting the integral rotating body 129 is also increased in size. Since the charged particle irradiation apparatus 101 as a whole is increased in size in this way, there is a problem that facilities such as a crane for assembling the charged particle irradiation apparatus 101 are increased in size, and the assembly work is large and takes time.
[0013]
For example, when X-ray exposure is performed from the X-ray exposure unit 116 in order to confirm the position of the affected part, the X-ray exposure unit 116 needs to be moved, but the charged particle guiding means 106 is moved. There is no need. However, since this X-ray irradiation part 116 cannot move unless the whole integral rotating body 129 rotates, for example, a part that is not necessary for confirming the position of the affected part such as the movable particle guiding means 106 is also rotated as a unit. . Therefore, it takes time for the large integral rotating body 129 to rotate, and the power consumption of the motor 128 of the support driving body 124 also increases.
[0014]
The truss structure 120 is different in the weight of both the charged particle guiding means 106 and the charged particle irradiation means 109 and the deflection due to its own weight depending on the rotation angle, and the rotating ring combination 123 is also dependent on the weight of the truss structure 120. Since bending occurs, there is also a problem that the irradiation direction of the charged particle beam irradiated from the charged particle irradiation means 109 may deviate from the affected part.
[0015]
In addition, confirmation of the cross-sectional shape of the charged particle beam, confirmation of the presence or absence of passage, and the like are performed by a beam monitor on the accelerator side of the rotary joint 112, but the cross-sectional shape of the charged particle beam after entering the charged particle guiding means 106, This confirmation cannot be performed until the charged particle beam is actually emitted from the irradiation nozzle unit 108. For example, even when the charged particle beam cross section of the charged particle guiding unit 106 is deformed and becomes inappropriate or the charged particle beam does not reach the charged particle irradiation unit 109, the charged particle beam is actually emitted from the irradiation nozzle unit 108. Without it you can't confirm. In particular, when the cross-sectional shape of the charged particle beam is smaller than the passing shape of the collimator, charged particles whose cross-sectional shape does not match the projected shape of the affected area are irradiated to the affected area as they are, and there is a problem that appropriate treatment cannot be performed. It was.
[0016]
Further, since the integral rotating body 129 is heavy and has a large rotational moment, for example, when the integral rotating body 129 rotates and the irradiation nozzle unit 108 is about to come into contact with the treatment table 102, it stops suddenly. There is also a problem that the irradiation nozzle part 108 may contact the treatment table 102 and be damaged as it is.
[0017]
In view of the above, the present invention has an object to solve the above-described problems, and realizes that the alignment time of the irradiation nozzle portion is shortened and the accuracy of charged particle beam irradiation to the affected portion is improved. Charged particle irradiation device.
[0018]
[Means for Solving the Problems]
A charged particle irradiation apparatus according to the present invention is a charged particle irradiation apparatus that irradiates an object to be irradiated provided on an axis with a charged particle beam, and deflects the charged particle beam toward the object to be irradiated. Guiding means, guiding support moving means for supporting the charged particle guiding means and moving the charged particle guiding means on a circular orbit centered on the axis, and the deflected charged particle beam being irradiated Charged particle irradiation means for shaping and irradiating a predetermined range of the body, and irradiation support for supporting the charged particle irradiation means and moving the charged particle irradiation means on a circular orbit around the axis Moving means, and the charged particle guiding means and the charged particle irradiation means move independently of each other.
[0019]
The guide support moving means supports the guide annular structure having the axis as a center axis and the guide annular structure, and rotates the guide ring structure around the axis. Part.
[0020]
The guide support moving means supports and fixes the guide ring rail whose axis is the center axis and the charged particle guide means, and moves along the guide ring rail together with the charged particle guide means. And a running section.
[0021]
Further, the irradiation support moving means supports an irradiation annular structure portion whose axis is a central axis, and an irradiation rotation drive for supporting the irradiation annular structure portion and rotating the irradiation annular structure portion around the axis. Part.
[0022]
In addition, the irradiation support moving means supports and fixes the irradiation annular rail whose axis is the central axis and the charged particle irradiation means, and moves the irradiation support on the irradiation annular rail together with the charged particle irradiation means. And a running section.
[0023]
In addition, a beam measuring unit having a beam monitor for measuring the charged particle beam and a beam damper for blocking the charged particle beam that has passed through the beam monitor has a circular orbit of the charged particle irradiation unit at a position different from the charged particle irradiation unit. The beam measuring means is provided between the charged particle guiding means and the irradiated object before the charged particle beam is irradiated onto the irradiated object via the charged particle irradiating means. When the charged particle beam is irradiated onto the beam measuring means, the beam measuring means measures the charged particle beam.
[0024]
The charged particle irradiation means includes an X-ray exposure unit that emits X-rays toward the irradiated object, and measures a dose distribution of the X-rays from the X-ray exposure unit. An X-ray measurement unit is provided on the circular orbit of the charged particle irradiation means so as to be always opposed to the X-ray irradiation unit via the irradiated body, and is provided by the X-ray irradiation. The position of the irradiated object is confirmed based on the measurement result of the X-ray measurement unit, and the charged particle irradiation means irradiates the position with the charged particle beam.
[0025]
The charged particle irradiation apparatus according to the present invention is a charged particle irradiation apparatus that irradiates an object to be irradiated provided on an axis with a charged particle beam, and guides the charged particle beam around the object to be irradiated. Charged particle guiding means for deflecting toward the irradiated object, guided support moving means for supporting the charged particle guiding means, and for moving the charged particle guiding means on a circular orbit around the axis; and The deflected charged particle beam is shaped so as to be able to irradiate a predetermined range of the irradiated object, and irradiated to the irradiated object, and a plurality of charged particle irradiation means provided around the axis line, and One of the plurality of charged particle irradiation means is selected by moving the charged particle guiding means, and the selected charged particle irradiation means selects the charged particle beam from the charged particle guiding means. The adapted to illuminate the irradiated body.
[0026]
In addition, a beam measurement unit having a beam monitor that measures the state of the charged particle beam and a beam damper that blocks the charged particle that has passed through the beam monitor is provided at a position different from the charged particle irradiation unit around the axis, The charged particle guiding unit moves to a position where the charged particle beam is irradiated to the beam measuring unit before the charged particle beam is irradiated to the irradiated object via the charged particle irradiation unit, and the beam measurement is performed. The beam measuring means measures the state of the charged particle beam by irradiating the means with the charged particle beam.
[0027]
Further, the charged particle irradiation means is movable in the radial direction, and when the irradiated object is disposed at a predetermined position, the charged particle irradiation means is displaced in the circumferential direction from the charged particle guiding means. It moves outward in the radial direction at a certain position so as to leave the irradiated body.
[0028]
DETAILED DESCRIPTION OF THE INVENTION
Embodiments of the present invention will be described below, but the same or equivalent members and parts as those of the conventional example will be described with the same reference numerals.
Embodiment 1 FIG.
FIG. 1 is a schematic side view of a charged particle irradiation apparatus according to Embodiment 1 of the present invention, and FIG. 2 is a front view of FIG. 1 and 2, the charged particle irradiation apparatus 1 includes a guide support moving unit 2 that supports the charged particle guide unit 106 and an irradiation support moving unit 3 that supports the charged particle irradiation unit 109. The guide support moving means 2 and the irradiation support moving means 3 are arranged side by side in the direction of the axis A.
[0029]
The guide support moving means 2 includes a rotary ring combined body 123 that is a guide annular structure portion, and a support drive body 124 that is a guide rotation drive unit that supports the rotary ring combined body 123. The rotating ring combined body 123 has the same configuration as the conventional rotating ring combined body, but the length of the connecting beam 125 is shorter than that of the conventional rotating ring combined body, and the distance between the first rotating ring 121 and the second rotating ring 122 is increased. Narrow and each diameter is large. The irradiation support moving means 3 is arranged on the first rotating ring 121 side of the rotating ring combination 123. Further, the deflecting portion 105 is supported and fixed on the inner peripheral surface of the first rotating ring 121, and a counter balance 120b that balances the weight of the connecting beam 125 that is substantially opposed to the deflecting portion 105 via the axis A is fixed. Since this rotating ring coupling body 123 only needs to support the charged particle guiding means 106, a conventional truss structure is not necessary. Further, the charged particle guiding means 106, the rotating ring coupling body 123, and the counter balance 120b are integrally rotated about the axis A by the support driving body 124, and these constitute the integral rotating body 4. is doing.
Note that only the charged particle beam path and the transport deflection unit 115 are shown in the transport unit 104.
[0030]
Although the irradiation support moving means 3 is small as a whole, it has the same configuration as the guide support moving means 2. Note that members and portions corresponding to the guide support moving means 2 of the irradiation support moving means 3 are denoted by the same reference numerals with the symbol A. That is, the irradiation support moving means 3 includes a rotating ring combined body 123A that is an irradiation annular structure part, and a support driving body 124A that is an irradiation rotation driving part that supports the rotating ring combined body 123A. The rotating ring coupling body 123A and the support driving body 124A have the same configuration as the rotating ring coupling body 123 and the support driving body 124, respectively, and are generally small. The charged particle irradiation means 109 is supported and fixed to the first rotating ring 121A of the rotating ring combined body 123A, and the II tube 117 is supported and fixed to the connecting beam 125A at a position facing the charged particle irradiation means 109 via the axis A. Is provided. The counter balance is not provided in the drawing, but may be provided on the connecting beam 125A in the vicinity of the II tube 117 if the weight balance between the charged particle irradiation means 109 and the II tube 117 is not achieved. Accordingly, the charged particle irradiation means 109, the rotating ring coupling body 123A, and the II tube 117 are integrally rotated about the axis A by the support driving body 124A, and these constitute the integral rotating body 5. is doing.
Further, the treatment table 102 is not arranged in the rotating ring combination 123 but is arranged inside the rotation ring combination 123A, and the affected part of the patient 103 placed on the treatment table 102 is irradiated with the charged particle beam. It is like that.
[0031]
The traveling direction of the charged particle beam emitted from the deflecting unit 105 of the charged particle guiding unit 106 intersects the path along which the charged particle irradiating unit 109 moves due to the rotation of the integral rotating body 5. The irradiation means 109 is supported by the guide support moving means 2 and the irradiation support moving means 3, respectively. Therefore, when the integral rotating body 4 and the integral rotating body 5 rotate, the deflecting unit 105 and the charged particle irradiation unit 106 move, and the deflecting unit 105 and the charged particle irradiation unit 109 are arranged in the radial direction of the axis A. When this is done, the charged particle beam emitted from the deflection unit 105 enters the charged particle irradiation means 109. Other configurations are the same as those of the conventional example.
[0032]
The charged particle irradiation apparatus 1 having such a configuration irradiates the affected part of the patient 103 with the charged particle beam as follows. First, the position of the affected part of the patient 103 is previously confirmed by CT or the like in the same manner as in the prior art. Next, after the patient 103 is placed on the treatment table 102, the X-ray irradiation unit 116 exposes the X-ray to the patient 103, and the distribution amount of the X-ray is measured by the II tube 117 to obtain a transmission image. At this time, in order to confirm the exact position of the affected area, first, the integral rotating body 5 is rotated around the axis A by the support driving body 124A in the irradiation support moving means 3, and at the same time, the charged particle irradiation means above the patient 103. 109 is moved and the first measurement is performed, and thereafter, similarly, the integral rotating body 5 is rotated by the support driving body 124A, and the charged particle irradiation means 109 is moved to the side of the patient 103 to perform the second measurement. . The spatial position of the affected area is grasped by these two measurements. When the position of the affected part is not on the axis A, the treatment table 102 moves and places the affected part on the axis A.
While measuring the position of the affected part, the integral rotating body 4 is rotated to irradiate the charged particle beam from the irradiation direction determined and examined in advance based on the examination result such as CT. The means 106 moves to the position in the irradiation direction. Therefore, while the position of the affected part is measured by the X-ray irradiation unit 116 and the II tube 117, the deflection unit 105 is moved and disposed at a predetermined irradiation position.
[0033]
Thereafter, the integral rotating body 5 is rotated by the support driving body 124A, and the charged particle irradiation means 109 moves to a predetermined charged particle irradiation position, that is, a position aligned with the deflection unit 105 that has already moved.
[0034]
Thereafter, the charged particle beam is irradiated from the accelerator onto the affected part of the patient 103 through the charged particle guiding means 106 and the charged particle irradiation means 109 in the same manner as in the prior art.
[0035]
Therefore, in the charged particle irradiation apparatus 1, the charged particle guiding means 106 is supported by the guiding support moving means 2 and the charged particle irradiation means 109 is separately supported by the irradiation supporting moving means 3, respectively. The weight supported by the irradiation support moving means 3 is reduced, and the respective rigidity does not need to be increased as compared with the conventional case. Further, since it is only necessary to balance the weight with the charged particle guiding means 106, the counter balance 120b is also reduced. Therefore, each of the support driver 124 and the support driver 124A can be made smaller than before, and the assembly work of the charged particle irradiation apparatus 1 can be easily performed in a short time.
[0036]
Further, since the guiding support moving means 2 and the irradiation support moving means 3 each support a small weight, the charged particle beam does not cause a large difference in bending as in the conventional case even if the bending due to the weight is small and the rotation angle is different. The accuracy of the irradiation direction can be improved.
[0037]
Further, the integrated rotating body 4 and the integrated rotating body 5 are driven by separate motors 128 and 128A, respectively, so that the charged particle guiding means 106 and the charged particle irradiation means 109 are moved independently of each other. When measuring the position of the affected part by radiation exposure, it is only necessary to drive the motor 128A that drives the integral rotating body 5, and the unnecessary charged particle guiding means 106 is not driven together as in the prior art. For this reason, even if the power consumption of each of the motor 128 and the motor 128A is totaled, it is smaller than the conventional power consumption.
[0038]
In addition, since the integrated rotating body 5 is smaller and lighter than the conventional integrated rotating body, the rotation moment is reduced. For example, when the irradiation nozzle portion 108 is likely to come into contact with the treatment table 102, irradiation is performed. The braking distance of the nozzle part 108 becomes small, and the possibility that the irradiation nozzle 108 contacts the treatment table 102 and is damaged is reduced.
[0039]
Embodiment 2. FIG.
3 is a schematic side sectional view of a charged particle irradiation apparatus according to Embodiment 2 of the present invention, and FIG. 4 is a front view of FIG. 3 and 4, the charged particle irradiation apparatus 11 includes a guide support moving unit 12 that supports the charged particle guide unit 106 and an irradiation support moving unit 13 that supports the charged particle irradiation unit 109. Further, the charged particle irradiation device 11 exists in a space 10 having an axis A formed by hollowing out a deep wall as a central axis. The space 10 has a circular cross-sectional shape along a plane perpendicular to the axis A, a parallel surface 16 that is parallel to the axis A, and an inclination in which the size of the cross-section gradually decreases from the parallel surface 16. A part of the surface 17 is formed.
[0040]
The guide support moving means 12 supports and fixes the guide annular rail 14 provided so that the center axis coincides with the axis A, and the charged particle guide means 106, and the charged particle guide means 106 on the guide annular rail 14. It has a guided support free-running portion 15 that moves.
Two guide ring rails 14 are provided in the space 10 and are fixed to the parallel surface 16. Since the wall surface of the parallel surface 16 is parallel to the axis A, if the two guide ring rails 14 are fixed, the guide support free-running portion 15 can move stably. As a matter of course, the guide ring rail 14 may be one or three or more.
The guide support free-running portion 15 includes a support fixing portion 18 that supports and fixes the deflection portion 105, a wheel portion 19 that is fixed to the support fixing portion 18 and that engages with the guide ring rail 14, and a support fixing portion 18. A self-propelled motor 20 that is provided and applies driving force to the wheel portion 19 is provided. For example, the support fixing unit 18 is configured so that the deflection unit 105 is driven by an external force applied to the deflection unit 105 such as an inertial force generated in the deflection unit 105 when the guidance support free-running unit 15 moves on the guide ring rail 14. As long as the deflection unit 105 is supported and fixed to such an extent that relative displacement with respect to the wheel unit 19 does not occur. Further, the wheel portion 19 has a wheel 19a that abuts on the guide ring rail 14 and rolls without slipping and moves along the guide ring rail 14 smoothly. For example, the guide ring rail 14 has an L-shaped cross section, the wheel portion 19 has a plurality of (for example, two) wheels, and the wheel 19a is in contact with the L-shaped protruding portion. Thus, when the wheel 19a abuts on the guide ring rail 14, the wheel portion 19 can stably move along the guide ring rail 14.
Note that the wheel 19 a of the wheel portion 19 does not need to be configured to abut the guide ring rail 14, and may be any configuration as long as the wheel portion 19 can move stably along the guide ring rail 14. Therefore, even if the wheel portion 19 is not provided, for example, the guide ring rail 14 and the support fixing portion 18 may be engaged so that the surfaces in contact with each other can slide.
[0041]
The guide support moving means 12 includes a guide support rotating unit 21 that supports the transport deflecting unit 115 and rotates it around the axis A. The guide support rotation unit 21 has a drive unit such as a motor, and rotates the transport deflection unit 115 about the axis A by itself. The guide support moving means 12 rotates the transport deflection unit 115 so that the transport deflection unit 115 is synchronized with the guide support free-running unit 15. That is, the deflection unit 105 is moved by the guide support free-running unit 15 so that the relative positional relationship of the entire transport unit 104 including the transport deflection unit 115 is constant.
[0042]
The irradiation support moving means 13 supports and fixes the irradiation annular rail 22 provided so that the center axis coincides with the axis A, and the charged particle irradiation means 109, and on the irradiation annular rail 22 together with the charged particle irradiation means 109. It has the irradiation support self-propelled part 23 which moves. Further, the irradiation support moving means 13 is provided on the partition wall 24 which is provided perpendicular to the axis A around the treatment table 102 and forms a part of the space 10.
The irradiation ring rails 22 are provided in the space 10 and are fixed to the partition wall 24 by two. Since the partition wall 24 is disposed perpendicular to the axis A, the two irradiation ring rails 22 have different diameters. If two irradiation ring rails 22 are fixed, the irradiation support free-running portion 23 can move stably. As a matter of course, one or three or more irradiation ring rails 22 may be provided.
The irradiation support self-propelled portion 23 has the same configuration as that of the guidance support self-propelled portion 15 although having a different shape, and is fixed to the support fixing portion 25 for supporting and fixing the charged particle irradiation means 109 and the support fixing portion 25. Although not shown in the drawing, a wheel portion that engages with the irradiation ring rail 22 and a self-propelled motor that is provided on the support fixing portion 25 and that gives a driving force to the wheel portion are included. This irradiation support free-running portion 23 is provided on the irradiation annular rail 22 in the same manner as the guidance support free-running portion 15, and the irradiation support free-running portion 23 moves stably along the irradiation annular rail 22. ing. Note that, similarly to the guide support moving means 12, the irradiation support moving means 13 may be configured to slide with the irradiation annular rail 22 and the support fixing part 25 engaged without the wheels.
[0043]
The irradiation ring rail 22 is provided with a measurement support free-running portion 26 that supports the II tube 117. The measurement support free-running portion 26 has the same configuration as the irradiation support free-running portion 23. Therefore, the measurement support free-running portion 26 also moves stably along the irradiation ring rail 22. Further, the measurement support self-propelled portion 26 is provided on the irradiation ring rail 22 so as to face the irradiation support self-propelled portion 23 via the treatment table 102. Further, the measurement support free-running portion 26 moves along the irradiation ring rail 22 in synchronization with the irradiation support free-running portion 23, and the II tube 117 supported by the measurement support free-running portion 26. Is always opposed to the charged particle irradiation means 109 supported by the irradiation support self-propelled portion 23 via the treatment table 102.
Other configurations are the same as those in the first embodiment.
[0044]
The charged particle irradiation apparatus 11 having such a configuration irradiates the affected part of the patient 103 with the charged particle beam as follows. First, the position of the affected part of the patient 103 is previously confirmed by CT or the like in the same manner as in the prior art. Next, after the patient 103 is placed on the treatment table 102, the X-ray irradiation unit 116 emits X-rays to the patient 103, and the amount of X-ray distribution is measured by the II tube 117. At this time, in order to confirm the exact position of the affected area, first, the irradiation support free-running portion 23 in the irradiation support moving means 13 moves along the irradiation ring rail 22, and the charged particle irradiation means 109 is located above the patient 103. The first measurement is performed after moving (FIG. 5A), and thereafter the irradiation support free-running portion 23 is moved along the irradiation ring rail 22 and the charged particle irradiation means 109 is located on the side of the patient 103. It moves and the second measurement is performed (FIG. 5B). The spatial position of the affected area is grasped by the measurement from above and from the side. When the position of the affected part is not on the axis A, the treatment table 102 moves and places the affected part on the axis A.
While the position of the affected part is being measured, the guide support free-running part 15 is guided to the guide ring rail in order to irradiate the charged particle beam from the irradiation direction determined based on the examination result such as CT in advance. 14, the charged particle guiding means 106 moves to a position in the irradiation direction. Therefore, while the position of the affected part is measured by the X-ray irradiation unit 116 and the II tube 117, the deflection unit 105 is moved and disposed at a predetermined irradiation position.
[0045]
Thereafter, the irradiation support free-running portion 23 moves along the irradiation ring rail 22, and the charged particle irradiation means 109 is aligned with a predetermined charged particle irradiation position, that is, the deflection portion 105 that has already moved. It moves to the position (FIG. 5C).
[0046]
Thereafter, the charged particle beam is irradiated from the accelerator onto the affected part of the patient 103 through the charged particle guiding means 106 and the charged particle irradiation means 109 in the same manner as in the prior art.
[0047]
Therefore, the charged particle irradiation device 11 has the same effect as that of the first embodiment, and has the guide ring rail 14 in which the charged particle guiding means 106 and the charged particle irradiation means 109 are respectively fixed to stable walls. Since it is provided in the irradiation support movement means 13 having the guidance support movement means 12 and the irradiation ring rail 22, the charged particle beam caused by the weight of the charged particle guidance means 106 and the weight of the charged particle irradiation means 109 is caused. The deviation in the irradiation direction is reduced.
[0048]
Further, since the weight of the guiding support moving means 12 and the weight of the irradiation supporting moving means 13 are further reduced, the power consumed for the movement of the charged particle guiding means 106 and the charged particle irradiation means 109 is further reduced.
[0049]
Embodiment 3 FIG.
FIG. 6 is a schematic front view of a charged particle irradiation apparatus according to Embodiment 3 of the present invention. In FIG. 6, the charged particle irradiation device 31 includes beam measuring means 32 provided on the irradiation ring rail 22. The beam measuring means 32 includes a beam monitor 33 that measures the state of the charged particle beam such as the cross-sectional shape, size, and passage confirmation of the charged particle beam, and a beam damper that stops and absorbs the charged particle beam that has passed through the beam monitor 33. 34. The beam measuring means 32 is supported by a support free-running part having the same configuration as the measurement support free-running part 26 that supports the II tube 117, and is provided on the irradiation annular rail 22. And move stably. Further, in order to arrange the beam measuring means 32 on the irradiation ring rail 22, the beam measurement means 32 is provided on the irradiation ring rail 22 at a position where the charged particle irradiation means 109 and the II tube 117 are not arranged. ing. Further, the beam measuring means 32 also moves on the irradiation ring rail 22 in synchronization with the charged particle irradiation means 109 and the II tube 117. The beam measurement means 32, the charged particle irradiation means 109, and the II tube 117 are The relative positional relationship does not change.
In FIG. 6, the beam measuring means 32 is disposed at a position that is substantially the same distance from both the charged particle irradiation means 109 and the II tube 117, but the beam measuring means 32 is provided on the irradiation annular rail 22. Any position is possible as long as it is possible. Further, the number of beam measuring means 32 is not limited to one and may be two or more. Further, the beam measurement means 32 moves in synchronization with the charged particle irradiation means 109 and the II tube 117 in order to prevent the beam measurement means 32 from colliding with the charged particle irradiation means 109 and the II tube 117. If the beam measuring means 32 can be controlled so as not to collide with the charged particle irradiation means 109 and the II tube 117, there is no need to synchronize.
[0050]
The beam monitor 33 is formed by, for example, a fluorescent plate coated with a fluorescent paint or a metal wire knitted in a mesh shape, and by measuring the light generated on the passing surface when a charged particle beam passes, Alternatively, confirmation of the passage of the charged particle beam, confirmation of the cross-sectional shape, and the like are performed by an electric current generated when the charged particle beam passes by collecting ions on the metal wire. The beam monitor 33 is provided on the outer peripheral side of the irradiation ring rail 22, and a beam damper 34 is provided on the radially inner side surface thereof.
The beam damper 34 is a metal such as aluminum or lead, and does not pass a charged particle beam.
Other configurations are the same as those of the second embodiment.
[0051]
The charged particle irradiation device 31 having such a configuration irradiates the affected part of the patient 103 with the charged particle beam as follows. First, in the same manner as in the second embodiment, the position of the affected part is confirmed, the affected part is moved on the axis A, and the deflecting part 105 is moved to a predetermined position (FIG. 7 (a), FIG. 7 ( b)). Next, the beam measuring unit 32 on the irradiation ring rail 22 is moved so that the beam measuring unit 32 and the deflecting unit 105 are aligned in the radial direction. Thereafter, the charged particle beam from the accelerator enters the deflecting unit 105 via the transport unit 104, and the charged particle beam emitted from the deflecting unit 105 is irradiated onto the beam measuring means 32 (FIG. 7C). In this beam measuring means 32, the charged particle beam is first irradiated onto the beam monitor 33 to measure the cross-sectional shape of the charged particle beam and the charged particle beam that has passed through the beam monitor 33 is stopped by the beam damper 34. Therefore, the charged particle beam emitted from the deflecting unit 105 does not reach the affected part of the patient 103. If the state of the cross-sectional shape of the charged particle beam is not appropriate, the supply of the charged particle beam from the accelerator is stopped, and the charged particle guiding means 106 and the like are adjusted so as to obtain an appropriate charged particle beam.
[0052]
Thereafter, with the supply of the charged particle beam from the accelerator once stopped, the beam measuring means 32, the charged particle irradiation means 109, and the II tube 117 are moved along the irradiation ring rail 22 to charge the charged particle irradiation means 109 and II. The tube 117 is arranged in the irradiation direction of the charged particle beam, and the affected part of the patient 103 is irradiated with the charged particle beam in the same manner as in the second embodiment (FIG. 7D).
[0053]
Therefore, the charged particle irradiation device 31 has the same effect as that of the second embodiment, and the beam measuring unit 32 that measures the cross-sectional shape of the charged particle beam and stops the progress of the charged particle beam is provided with the irradiation ring rail 22. Since it is provided so that it can move, the charged particle beam emitted from the deflecting unit 105 is not directly irradiated to the affected part of the patient 103 before the charged part is normally irradiated with the charged particle beam. Can check whether it is appropriate. Therefore, even if the charged particle beam state becomes unsuitable by the charged particle guiding means 106 that could not be confirmed in the prior art, the state can be confirmed and adjusted when it comes out of the deflecting unit 105, A charged particle beam can be stably irradiated.
[0054]
The beam measuring means 32 has the same effect even if it is fixed to the first rotating ring 121A of the integral rotating body 5 of the charged particle irradiation apparatus 1 in the first embodiment.
[0055]
Embodiment 4 FIG.
FIG. 8 is a schematic front view of a charged particle irradiation apparatus according to Embodiment 4 of the present invention. In FIG. 8, the charged particle irradiation device 41 does not include the irradiation support moving means 13 like the charged particle irradiation device 11 in the second embodiment, and the partition in which the charged particle irradiation means 109 is provided around the axis A. A plurality of parts are directly fixed to the wall 24. Each of the plurality of charged particle irradiation means 109 is provided such that the irradiation nozzle portion 108 faces the axis A, and the charged particle beams emitted from the irradiation nozzle portion 108 intersect with the axis A, respectively. In addition, since X-ray measurement from above and from the side of the patient 103 is necessary in order to accurately grasp the position of the affected part, there are two II tubes 117, and two charges arranged on the top and side. Each of the particle irradiation means 109 is fixed at a position facing the particle irradiation means 109 via the axis A.
Other configurations are the same as those of the second embodiment.
[0056]
The charged particle irradiation apparatus 41 having such a configuration irradiates the affected part of the patient 103 with the charged particle beam as follows. First, the position of the affected part is accurately confirmed by the two II tubes 117 facing the X-ray irradiation part 116 of the charged particle irradiation means 109 above and on the side of the patient 103, and the affected part is moved on the axis A. At the same time, the deflection unit 105 is moved to a predetermined position. This predetermined position is a position aligned with the fixed charged particle irradiation means 109 in the radial direction. Since there are a plurality of charged particle irradiation means 109, it is possible to select the charged particle irradiation means 109 provided in the best position in advance.
Then, the charged particle beam is irradiated to the affected part of the patient 103 as in the second embodiment.
[0057]
Therefore, the charged particle irradiation device 41 has the same effect as that of the second embodiment, and a plurality of charged particle irradiation means 109 are fixed to the partition wall 24, so that the charged particle beam is more reliably irradiated to the affected part. In addition, there is no need to move the charged particle irradiation means 109 in order to confirm the position of the affected part.
[0058]
If the beam measuring unit 32 in the third embodiment is fixed to the partition wall 24 around the axis A, the beam measuring unit 32 is irradiated with the charged particle beam from the deflecting unit 105, thereby causing the third embodiment. Also has the same effect.
[0059]
Embodiment 5. FIG.
FIG. 9 is a schematic front view of the charged particle irradiation apparatus according to the fifth embodiment of the present invention. In FIG. 9, in the charged particle irradiation apparatus 51, the irradiation support self-running portion 23 has a slide mechanism 52 in which the support fixing portion 25 slides in the radial direction. For example, the slide mechanism 52 may be configured to engage and slide two members, or may have a configuration in which a roller is provided on one of the members and the other member rolls. Any configuration may be used as long as 25 can slide in the radial direction and the charged particle irradiation means 109 can move in the radial direction.
Other configurations are the same as those of the second embodiment.
[0060]
In the charged particle irradiation apparatus 51 having such a configuration, when the charged particle irradiation apparatus 51 is not used, the charged particle irradiation means 109 is moved radially outward by the slide mechanism 52 as shown in FIG. It exists in the standby position. At this time, as a matter of course, the deflecting unit 105 does not exist in the same radial direction as the charged particle irradiation means 109. When the patient 103 gets on the treatment table 102 and the charged particle irradiation device 51 starts to be used, the charged particle irradiation means 109 moves inward in the radial direction and is arranged at a predetermined use position. Thereafter, similarly to the second embodiment, the affected part of the patient 103 is irradiated with a charged particle beam.
[0061]
Therefore, the charged particle irradiation device 51 has the same effect as that of the second embodiment, and when the charged particle irradiation device 51 is not used, the charged particle irradiation means 109 can be moved to the standby position by the slide mechanism 52. Therefore, the space around the treatment table 102 is widened, and the patient 103 can easily get on the treatment table 102.
[0062]
Similar to the third embodiment, by providing the beam measuring means 32 on the irradiation ring rail 22, the same effect as the third embodiment can be obtained.
[0063]
【The invention's effect】
As is apparent from the above description, the charged particle irradiation apparatus according to the present invention is a charged particle irradiation apparatus that irradiates an object to be irradiated provided on an axial line with the charged particle beam. A charged particle guiding means for deflecting toward an irradiating body; a guided support moving means for supporting the charged particle guiding means; and for moving the charged particle guiding means on a circular orbit centered on the axis; In addition, the charged particle beam is irradiated with the charged particle beam shaped to irradiate a predetermined range of the irradiated object, the charged particle irradiation unit is supported, and the charged particle irradiation unit is centered on the axis. Irradiation support moving means for moving on a circular orbit, and the charged particle guiding means and the charged particle irradiation means move independently of each other. If it is not necessary to use the charged particle guiding means, only the charged particle irradiation means is moved, and the charged particle guiding means is ready to be used next, reducing the time. As well as being able to move the necessary objects by the necessary distance, the power consumption can be reduced.
[0064]
The guide support moving means supports the guide annular structure having the axis as a center axis and the guide annular structure, and rotates the guide ring structure around the axis. The charged particle irradiating means and the charged particle guiding means are separately supported to reduce the support weight, and the charged particle guiding means can move reliably about the axis.
[0065]
The guide support moving means supports and fixes the guide ring rail whose axis is the center axis and the charged particle guide means, and moves along the guide ring rail together with the charged particle guide means. The charged particle guide means can move along the stable guide ring rail, and the charged particle guide means can move about the axis more reliably.
[0066]
Further, the irradiation support moving means supports an irradiation annular structure portion whose axis is a central axis, and an irradiation rotation drive for supporting the irradiation annular structure portion and rotating the irradiation annular structure portion around the axis. The charged particle irradiation means and the charged particle guiding means are separately supported to reduce the support weight, and the charged particle irradiation means can move reliably about the axis.
[0067]
In addition, the irradiation support moving means supports and fixes the irradiation annular rail whose axis is the central axis and the charged particle irradiation means, and moves the irradiation support on the irradiation annular rail together with the charged particle irradiation means. The charged particle irradiation means can move along the stable irradiation ring rail, and the charged particle irradiation means can move about the axis more reliably.
[0068]
In addition, a beam measuring unit having a beam monitor for measuring the charged particle beam and a beam damper for blocking the charged particle beam that has passed through the beam monitor has a circular orbit of the charged particle irradiation unit at a position different from the charged particle irradiation unit. The beam measuring means is provided between the charged particle guiding means and the irradiated object before the charged particle beam is irradiated onto the irradiated object via the charged particle irradiating means. When the charged particle beam is irradiated onto the beam measuring means, the beam measuring means measures the charged particle beam, so that the state of the charged particle beam is changed to the charged particle shaping. Immediately before entering the unit, it can be confirmed by the beam monitor, and the appropriate charged particle beam can be irradiated stably.
[0069]
The charged particle irradiation means includes an X-ray exposure unit that emits X-rays toward the irradiated object, and measures a dose distribution of the X-rays from the X-ray exposure unit. An X-ray measurement unit is provided on the circular orbit of the charged particle irradiation means so as to be always opposed to the X-ray irradiation unit via the irradiated body, and is provided by the X-ray irradiation. The position of the irradiated object is confirmed based on the measurement result of the X-ray measuring unit, and the charged particle irradiation means is configured to irradiate the charged particle beam to the position. Can be irradiated with the charged particle beam.
[0070]
The charged particle irradiation apparatus according to the present invention is a charged particle irradiation apparatus that irradiates an object to be irradiated provided on an axis with a charged particle beam, and guides the charged particle beam around the object to be irradiated. Charged particle guiding means for deflecting toward the irradiated object, guided support moving means for supporting the charged particle guiding means, and for moving the charged particle guiding means on a circular orbit around the axis; and The deflected charged particle beam is shaped so as to be able to irradiate a predetermined range of the irradiated object, and irradiated to the irradiated object, and a plurality of charged particle irradiation means provided around the axis line, and One of the plurality of charged particle irradiation means is selected by moving the charged particle guiding means, and the selected charged particle irradiation means selects the charged particle beam from the charged particle guiding means. Since the irradiated object is irradiated, the charged particle irradiation means can be stably directed to the irradiated object, and the charged particle beam can be irradiated more reliably to the irradiated object. it can.
[0071]
In addition, a beam measurement unit having a beam monitor that measures the state of the charged particle beam and a beam damper that blocks the charged particle that has passed through the beam monitor is provided at a position different from the charged particle irradiation unit around the axis, The charged particle guiding unit moves to a position where the charged particle beam is irradiated to the beam measuring unit before the charged particle beam is irradiated to the irradiated object via the charged particle irradiation unit, and the beam measurement is performed. Since the beam measuring means measures the state of the charged particle beam by irradiating the charged particle beam to the means, the state of the charged particle beam is immediately before entering the charged particle shaping unit. Thus, the charged particle beam can be irradiated stably and appropriately.
[0072]
Further, the charged particle irradiation means is movable in the radial direction, and when the irradiated object is disposed at a predetermined position, the charged particle irradiation means is displaced in the circumferential direction from the charged particle guiding means. Since it is moved radially outward at the position where it is separated from the irradiated body, the surrounding space is widened and the irradiated body is easily placed at the predetermined position.
[Brief description of the drawings]
FIG. 1 is a schematic side view of a charged particle irradiation apparatus according to Embodiment 1 of the present invention.
FIG. 2 is a front view of FIG.
FIG. 3 is a schematic side sectional view of a charged particle irradiation apparatus according to Embodiment 2 of the present invention.
4 is a front view of FIG. 3. FIG.
FIG. 5 is a schematic diagram showing a procedure for irradiating an object to be irradiated with a charged particle beam by the charged particle irradiation apparatus according to Embodiment 2 of the present invention; FIG. FIG. 5 (b) is a diagram showing a place where X-rays are exposed to the irradiated body from the side, and FIG. 5 (c) is a view showing the irradiated object from the charged particle irradiation means. It is a figure which shows the place which irradiates with a charged particle beam.
FIG. 6 is a schematic front view of a charged particle irradiation apparatus according to Embodiment 3 of the present invention.
FIG. 7 is a schematic diagram showing a procedure for irradiating an object to be irradiated with a charged particle beam by the charged particle irradiation apparatus according to Embodiment 3 of the present invention; FIG. FIG. 7 (b) is a diagram showing a place where X-rays are exposed to the irradiated body from the side, and FIG. 7 (c) is a diagram showing the beam measuring means as the deflection unit and the diameter. FIG. 7 (d) is a diagram showing a case where a charged particle beam is measured by being arranged in the same direction, and FIG. 7 (d) is a diagram showing a case where a charged particle beam is irradiated from a charged particle irradiation means to an irradiated object.
FIG. 8 is a schematic front view of a charged particle irradiation apparatus according to Embodiment 4 of the present invention.
FIG. 9 is a schematic front view of a charged particle irradiation apparatus according to Embodiment 5 of the present invention.
10 is a schematic front view showing a state where the charged particle irradiation means is moved radially outward by the slide mechanism of the charged particle irradiation apparatus of FIG. 9 and is present at the standby position.
FIG. 11 is a perspective view of a conventional charged particle irradiation apparatus.
[Explanation of symbols]
1,11,31,41,51 Charged particle irradiation device, 2,12 guidance support moving means, 3,13 irradiation support movement means, 14 induction annular rail, 15 induction support free-running part, 22 irradiation annular rail, 23 Irradiation support free-running part, 32 beam measurement means, 33 beam monitor, 34 beam damper, 106 charged particle guidance means, 109 charged particle irradiation means, 116 X-ray irradiation part, 117 II tube (X-ray measurement part), 123 rotating ring Combined body (induction ring structure part), 123A Rotating ring combination body (irradiation ring structure part), 124 Support drive body (induction rotation drive part), 124A Support drive body (irradiation rotation drive part)

Claims (10)

軸線上に設けられた被照射体に荷電粒子ビームを照射する荷電粒子照射装置であって、
前記荷電粒子ビームを前記被照射体に向けて偏向させる荷電粒子誘導手段と、
前記荷電粒子誘導手段を支持し、前記荷電粒子誘導手段を前記軸線を中心とした円環軌道上で移動させる誘導支持移動手段と、
前記偏向された前記荷電粒子ビームを前記被照射体の所定範囲に照射すように整形して照射する荷電粒子照射手段と、
前記荷電粒子照射手段を支持し、前記荷電粒子照射手段を前記軸線を中心とした円環軌道上で移動させる照射支持移動手段とを備え、
前記荷電粒子誘導手段と前記荷電粒子照射手段とがそれぞれ独立して移動するようになっていることを特徴とする荷電粒子照射装置。A charged particle irradiation apparatus that irradiates an irradiated object provided on an axis with a charged particle beam,
Charged particle guiding means for deflecting the charged particle beam toward the irradiated body;
A guide support moving means for supporting the charged particle guide means and moving the charged particle guide means on a circular orbit centered on the axis;
Charged particle irradiation means for shaping and irradiating the deflected charged particle beam so as to irradiate a predetermined range of the irradiated object;
An irradiation support moving means for supporting the charged particle irradiation means and moving the charged particle irradiation means on a circular orbit around the axis;
The charged particle irradiation apparatus, wherein the charged particle guiding means and the charged particle irradiation means move independently of each other. 前記誘導支持移動手段は、前記軸線が中心軸線である誘導円環状構造部と、
前記誘導円環状構造部を支持し、前記誘導円環状構造部を前記軸線を中心に回転させる誘導回転駆動部とを有することを特徴とする請求項１に記載の荷電粒子照射装置。The guiding support moving means includes a guiding annular structure portion in which the axis is a central axis,
The charged particle irradiation apparatus according to claim 1, further comprising: an induction rotation driving unit that supports the induction annular structure and rotates the induction annular structure around the axis. 前記誘導支持移動手段は、前記軸線が中心軸線である誘導円環レールと、
前記荷電粒子誘導手段を支持固定し、前記誘導円環レール上を前記荷電粒子誘導手段とともに移動する誘導支持自走部とを有することを特徴とする請求項１に記載の荷電粒子照射装置。The guide support moving means includes a guide ring rail in which the axis is a central axis,
The charged particle irradiation apparatus according to claim 1, further comprising: a guide support self-running portion that supports and fixes the charged particle guide means and moves along the guide ring rail together with the charged particle guide means. 前記照射支持移動手段は、前記軸線が中心軸線である照射円環状構造部と、
前記照射円環状構造部を支持し、前記照射円環状構造部を前記軸線を中心に回転させる照射回転駆動部とを有することを特徴とする請求項１乃至請求項３の何れかに記載の荷電粒子照射装置。The irradiation support moving means includes an irradiation annular structure portion in which the axis is a central axis,
The charge according to any one of claims 1 to 3, further comprising: an irradiation rotation driving unit that supports the irradiation annular structure and rotates the irradiation annular structure about the axis. Particle irradiation device. 前記照射支持移動手段は、前記軸線が中心軸線である照射円環レールと、
前記荷電粒子照射手段を支持固定し、前記照射円環レール上を前記荷電粒子照射手段とともに移動する照射支持自走部とを有することを特徴とする請求項１乃至請求項３の何れかに記載の荷電粒子照射装置。The irradiation support moving means includes an irradiation ring rail in which the axis is a central axis,
4. The self-propelled irradiation support unit that supports and fixes the charged particle irradiation unit and moves with the charged particle irradiation unit on the irradiation ring rail. Charged particle irradiation equipment. 前記荷電粒子ビームを測定するビームモニタ及び前記ビームモニタを通過した前記荷電粒子ビームを遮るビームダンパを有するビーム測定手段が、前記荷電粒子照射手段と異なる位置に前記荷電粒子照射手段の円環軌道上で移動自在に設けられ、
前記ビーム測定手段は、前記荷電粒子ビームが前記荷電粒子照射手段を介して前記被照射体に照射される前に、前記荷電粒子誘導手段及び前記被照射体の間に移動し、前記ビーム測定手段に前記荷電粒子ビームが照射されることにより、前記ビーム測定手段が前記荷電粒子ビームを測定するようになっている
ことを特徴とする請求項１乃至請求項５の何れかに記載の荷電粒子照射装置。A beam measurement unit having a beam monitor for measuring the charged particle beam and a beam damper for blocking the charged particle beam that has passed through the beam monitor is positioned on a circular orbit of the charged particle irradiation unit at a position different from the charged particle irradiation unit. It can be moved freely,
The beam measuring means moves between the charged particle guiding means and the irradiated object before the charged particle beam is irradiated onto the irradiated object via the charged particle irradiating means, and the beam measuring means 6. The charged particle irradiation according to claim 1, wherein the beam measuring means measures the charged particle beam by being irradiated with the charged particle beam. apparatus. 前記荷電粒子照射手段は、前記被照射体に向けてＸ線を曝射するＸ線曝射部を有し、
また、前記Ｘ線曝射部からの前記Ｘ線の線量分布を測定するＸ線測定部が、前記被照射体を介して常に前記Ｘ線曝射部に対向して前記荷電粒子照射手段の円環軌道上に移動自在に設けられており、
前記Ｘ線の曝射による前記Ｘ線測定部の測定結果に基づいて前記被照射体の位置を確認し、前記荷電粒子照射手段は前記位置に前記荷電粒子ビームを照射するようになっていることを特徴とする請求項１乃至請求項６の何れかに記載の荷電粒子照射装置。The charged particle irradiation means has an X-ray exposure unit that emits X-rays toward the irradiated object,
An X-ray measurement unit that measures a dose distribution of the X-rays from the X-ray irradiation unit always faces the X-ray irradiation unit via the irradiated body and is a circle of the charged particle irradiation unit. It is provided to move freely on the ring orbit,
The position of the irradiated object is confirmed based on the measurement result of the X-ray measurement unit by the X-ray exposure, and the charged particle irradiation means irradiates the charged particle beam to the position. The charged particle irradiation apparatus according to claim 1, wherein: 軸線上に設けられた被照射体に荷電粒子ビームを照射する荷電粒子照射装置であって、
前記荷電粒子ビームを前記被照射体の周囲に導いて前記被照射体に向けて偏向させる荷電粒子誘導手段と、
前記荷電粒子誘導手段を支持し、前記荷電粒子誘導手段を前記軸線を中心とした円環軌道上で移動させる誘導支持移動手段と、
前記偏向された前記荷電粒子ビームを前記被照射体の所定範囲に照射しうるように整形して前記被照射体に照射するとともに、前記軸線の周囲に複数設けられた荷電粒子照射手段とを備え、
前記複数の荷電粒子照射手段は、前記荷電粒子誘導手段が移動することにより何れか１つを選択され、この選択された荷電粒子照射手段が前記荷電粒子誘導手段からの前記荷電粒子ビームを前記被照射体に照射するようになっていることを特徴とする荷電粒子照射装置。A charged particle irradiation apparatus that irradiates an irradiated object provided on an axis with a charged particle beam,
Charged particle guiding means for guiding the charged particle beam around the irradiated body and deflecting the charged particle beam toward the irradiated body;
A guide support moving means for supporting the charged particle guide means and moving the charged particle guide means on a circular orbit centered on the axis;
The deflected charged particle beam is shaped so as to be able to irradiate a predetermined range of the irradiated object, and is irradiated to the irradiated object, and a plurality of charged particle irradiation means provided around the axis. ,
One of the plurality of charged particle irradiation means is selected by the movement of the charged particle guiding means, and the selected charged particle irradiation means receives the charged particle beam from the charged particle guiding means. A charged particle irradiation apparatus characterized by irradiating an irradiation body. 前記荷電粒子ビームの状態を測定するビームモニタ及び前記ビームモニタを通過した前記荷電粒子を遮るビームダンパを有するビーム測定手段が、前記軸線の周囲で前記荷電粒子照射手段と異なる位置に設けられ、
前記荷電粒子誘導手段は、前記荷電粒子ビームが前記荷電粒子照射手段を介して前記被照射体に照射される前に、前記ビーム測定手段に前記荷電粒子を照射する位置に移動し、前記ビーム測定手段に前記荷電粒子ビームが照射されることにより、前記ビーム測定手段が前記荷電粒子ビームの前記状態を測定するようになっていることを特徴とする請求項８に記載の荷電粒子照射装置。A beam measurement unit having a beam monitor for measuring the state of the charged particle beam and a beam damper for blocking the charged particle that has passed through the beam monitor is provided at a position different from the charged particle irradiation unit around the axis,
The charged particle guiding unit moves to a position where the charged particle beam is irradiated to the beam measuring unit before the charged particle beam is irradiated to the irradiated object via the charged particle irradiation unit, and the beam measurement is performed. 9. The charged particle irradiation apparatus according to claim 8, wherein the beam measuring means measures the state of the charged particle beam by irradiating the charged particle beam to the means. 前記荷電粒子照射手段は、径方向に移動可能になっており、前記被照射体が所定の位置に配置されるときに、前記荷電粒子照射手段が前記荷電粒子誘導手段と周方向にズレた位置で径方向外向きに移動して前記被照射体から離れるようになっていることを特徴とする請求項１乃至請求項９の何れかに記載の荷電粒子照射装置。The charged particle irradiation means is movable in a radial direction, and the charged particle irradiation means is displaced in the circumferential direction from the charged particle guiding means when the irradiated object is disposed at a predetermined position. The charged particle irradiation apparatus according to claim 1, wherein the charged particle irradiation apparatus is configured to move radially outward at a distance from the irradiated body.
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