JP3578777B2 - Method of manufacturing magnetoresistive head - Google Patents

Method of manufacturing magnetoresistive head Download PDF

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Publication number
JP3578777B2
JP3578777B2 JP33694792A JP33694792A JP3578777B2 JP 3578777 B2 JP3578777 B2 JP 3578777B2 JP 33694792 A JP33694792 A JP 33694792A JP 33694792 A JP33694792 A JP 33694792A JP 3578777 B2 JP3578777 B2 JP 3578777B2
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Japan
Prior art keywords
protective layer
layer
ion milling
magnetic
lead conductor
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Expired - Fee Related
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JP33694792A
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Japanese (ja)
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JPH06187618A (en
Inventor
祥子 竹村
淳一 兼
理明 金峰
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Fujitsu Ltd
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Fujitsu Ltd
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Description

【0001】
【産業上の利用分野】
本発明は、各種コンピュータの外部記憶装置の磁気ディスク装置あるいは磁気テープ装置に広く使用される再生専用の磁気抵抗効果型ヘッドに関する。
【0002】
磁気抵抗効果型ヘッドは再生出力が記録媒体の移動速度に依存せずに高出力がえられ、一般に用いられているインダクティブ型の記録・再生用磁気ヘッドに比べて狭トラックの情報再生に有利であることから、高密度記録化における再生専用ヘッドとして使用され、その磁気抵抗効果型ヘッドの性能および信頼性をより向上することが必要とされている。
【0003】
【従来の技術】
従来広く使用されている磁気ディスク装置等の磁気抵抗効果型ヘッドは、図3に示すように例えばNi−Znフェライト等からなる磁性体の一方のシールド1内部に、Alよりなる非磁性のギヤップ層2を形成して、この上にNi−Fe等の薄膜からなる磁気抵抗効果素子(以下MR素子と略称する)3を配設し、このMR素子3の中央部でそれぞれの端面が微小間隔で対向するようにAu,CuあるいはAlからなる引出し導体層4−1,4−2 が施されている。
【0004】
この引出し導体層4−1,4−2 の上部に配する非磁性のギヤップ層5との密着性を向上させるために、導体層4−1,4− 2の上面をイオンミーリング等によって面を清掃し、上記ギヤップ層2と同一材質のギヤップ層5を形成して、上記一方のシールド1と同一材質の他方のシールド6によりシールドされて磁気抵抗効果型のヘッドが構成されている。
【0005】
そして、移動する磁気記録媒体上に所定間隔をもって磁気抵抗効果型ヘッドを浮上配置し、上記引出し導体層4−1,4−2 からMR素子3にセンス電流を供給することによって発生する磁界により一方の前記シールド1が磁化され、この磁化によりMR素子3にバイアス磁界が印加される。
【0006】
このような状態のMR素子3の前記一対の引出し導体層4−1,4−2 によって画定された長方形の信号検出領域において、検出された前記磁気記録媒体からの信号磁界の変化に応じて生じる抵抗値の変化を、前記一対の引出し導体層4−1,4−2 より電圧の変化として取り出すことにより再生が行われている。
【0007】
【発明が解決しようとする課題】
以上説明した従来のヘッドアッセンブリで問題となるのは、引出し導体層4−1,4−2 の上部に施されるギヤップ層5との密着性を向上させるために、当該引出し導体層4−1,4−2 の上面をイオンミーリング等によって面を清浄化しているが、この引出し導体層4−1,4−2 は、図4に示すように端面がMR素子3の中央部において微小間隔で対向しているから、当該MR素子3のコア部分が前記微小間隔だけ露出して、イオンミーリング等により溝状に削り取られ、この段差により磁壁ができやすくなってバルクハウゼンノイズを誘発し易くなるという問題が生じている。
【0008】
本発明は上記のような問題点に鑑み、MR素子3のコア部分に段差が発生しない構成にしてバルクハウゼンノイズの発生を防止することができる磁気抵抗効果型ヘッドの提供を目的とする。
【0009】
【課題を解決するための手段】
本発明は、図1に示すように磁性体の一方のシールド1と薄膜のMR素子3の間に非磁性のギヤップ層2を形成して、当該MR素子3の引出し導体層4−1,4−2 側の面に、非磁性で且つ優れた導電性を有する保護層11をイオンミーリング量以上100Å以下の厚みに形成し、中央部に微小間隔で端面が対向するように引出し導体層4−1,4−2 を施した後に、この引出し導体層4−1,4−2 の上面をイオンミーリングにより面を清浄化し、当該イオンミーリング側と磁性体の他方のシールド6の間に非磁性のギヤップ層5を形成する。
【0010】
【作用】
本発明では、図1に示すようにMR素子3の引出し導体層4−1,4−2 側の面に、非磁性で且つ優れた導電性を有する保護層11をイオンミーリング量以上100Å以下の厚みに形成して、その保護層11の上に上記MR素子3の中央部で端面が微小間隔で対向するよう引出し導体層4−1,4−2 を施しているから、当該引出し導体層4−1,4−2 の上面をイオンミーリング等によって面を清浄化しても、図2に示すように該導体層4−1,4−2 の端面間より露出した保護層11が削られて溝ができるが、上記MR素子3のコア部分には溝による段差が発生しないので、当該MR素子3の段差による磁壁がなくなってバルクハウゼンノイズの発生を防止することが可能となる。
【0011】
【実施例】
以下図1および図2について本発明の実施例を詳細に説明する。
図1は一実施例による磁気抵抗効果型ヘッドを示す要部斜視図、図2は作用の要部断面図を示し、図中において、図3と同一部材には同一記号が付してある。
【0012】
本発明の磁気抵抗効果型ヘッドは、図1に示すように例えばNi−Znフェライト等からなる磁性体の一方のシールド1の上部に、Alよりなる非磁性のギヤップ層2を形成して、この上にNi−Fe等の薄膜からなるMR素子3を従来と同様に配設する。
【0013】
このMR素子3の引出し導体層4−1,4−2 を形成する面にスパッタまたは蒸着等により、例えば非磁性且つ優れた導電性を有する, 例えばTiあるいはTaからなる保護層11、または前記MR素子3よりも小さなMR効果を有する導電性磁性膜, 例えばNiFeCrからなる保護層11を、後工程のイオンミーリングで削り取られて生じる段差より厚く, 且つ100Å以下の膜厚に施して、その保護層11上面にAu,CuあるいはAlからなる引出し導体層4−1,4−2 を、当該保護層11の中央部でそれぞれの端面が微小間隔で対向するように形成する。
【0014】
そして、従来と同様に、この引出し導体層4−1,4−2 の上面をイオンミーリング等によって面を清浄化し、上記ギヤップ層2と同一材質のギヤップ層5を形成するとともに、一方の上記シールド1と同一材質の他方のシールド6により磁気抵抗効果型のヘッドを構成する。
【0015】
その結果、MR素子3のコア部分には溝による段差が発生しないので、当該MR素子3の段差による磁壁がなくなってバルクハウゼンノイズの発生を防止することができ、磁気抵抗効果型ヘッドの信頼性を向上させることができる。
【0016】
【発明の効果】
以上の説明から明らかなように本発明によれば極めて簡単な構成で、磁気抵抗効果型素子のコア部分には溝による段差がないのでバルクハウゼンノイズの発生を防止できて、磁気抵抗効果型ヘッドの信頼性を向上させることができる等の利点があり、著しい経済的及び、信頼性向上の効果が期待できる磁気抵抗効果型ヘッドの製造方法を提供することができる。
【図面の簡単な説明】
【図1】本発明の一実施例による磁気抵抗効果型ヘッドを示す要部斜視図である。
【図2】作用を示す要部断面図である。
【図3】従来の磁気抵抗効果型ヘッドを示す要部概略斜視図である。
【図4】従来の問題点を説明するための断面図である。
【符号の説明】
1,6はシールド、
2,5はギヤップ層、
3はMR素子、
4−1,4−2 は引出し導体層、
11は保護層、
[0001]
[Industrial applications]
The present invention relates to a read-only magnetoresistive head widely used for a magnetic disk device or a magnetic tape device of an external storage device of various computers.
[0002]
The magneto-resistive head has a high reproduction output without depending on the moving speed of the recording medium, and is advantageous for reproducing information on a narrow track as compared with a commonly used inductive type recording / reproducing magnetic head. For this reason, it is used as a read-only head in high-density recording, and it is necessary to further improve the performance and reliability of the magnetoresistive head.
[0003]
[Prior art]
As shown in FIG. 3, a magnetoresistive head of a magnetic disk device or the like which has been widely used in the past has a magnetic material made of, for example, Ni—Zn ferrite and a nonmagnetic material made of Al 2 O 3 inside one shield 1. Is formed, and a magnetoresistive effect element (hereinafter abbreviated as MR element) 3 made of a thin film of Ni—Fe or the like is provided thereon, and each end face is formed at the center of the MR element 3. Leading conductor layers 4-1 and 4-2 made of Au, Cu or Al are provided so as to face each other at a minute interval.
[0004]
In order to improve the adhesion between the Giyappu layer 5 of non-magnetic disposed on top of the conductive lead layers 4-1 and 4-2, the conductive layer 4-1, the surface of the upper surface of the 4-2 by ion milling or the like After cleaning, a gap layer 5 of the same material as the gap layer 2 is formed and shielded by the other shield 6 of the same material as the one shield 1 to form a magnetoresistive head.
[0005]
Then, a magnetoresistive head is levitated at a predetermined interval on the moving magnetic recording medium, and a magnetic field generated by supplying a sense current to the MR element 3 from the lead conductor layers 4-1 and 4-2 is used. The shield 1 is magnetized, and a bias magnetic field is applied to the MR element 3 by the magnetization.
[0006]
In the rectangular signal detection area defined by the pair of extraction conductor layers 4-1 and 4-2 of the MR element 3 in such a state, the signal is generated in accordance with the detected change in the signal magnetic field from the magnetic recording medium. Reproduction is performed by extracting a change in resistance value as a change in voltage from the pair of lead conductor layers 4-1 and 4-2.
[0007]
[Problems to be solved by the invention]
The problem with the conventional head assembly described above is that, in order to improve the adhesion with the gap layer 5 provided on the lead conductor layers 4-1 and 4-2, the lead conductor layer 4-1 has a problem. , 4-2 are cleaned by ion milling or the like. However, the end surfaces of the lead conductor layers 4-1 and 4-2 are arranged at minute intervals at the center of the MR element 3 as shown in FIG. Since they are opposed to each other, the core portion of the MR element 3 is exposed only at the minute interval and is cut into a groove shape by ion milling or the like. This step makes it easy to form a magnetic domain wall and easily induce Barkhausen noise. There is a problem.
[0008]
The present invention has been made in view of the above-described problems, and has as its object to provide a magnetoresistive head capable of preventing occurrence of Barkhausen noise by using a configuration in which a step does not occur in a core portion of an MR element 3.
[0009]
[Means for Solving the Problems]
In the present invention, as shown in FIG. 1, a non-magnetic gap layer 2 is formed between one shield 1 of a magnetic material and a thin-film MR element 3, and the lead conductor layers 4-1 and 4 of the MR element 3 are formed. A protective layer 11 having a non-magnetic and excellent conductivity is formed on the surface on the -2 side in a thickness of not less than the amount of ion milling and not more than 100 °, and the lead conductor layer 4 is formed so that the end faces thereof are opposed to each other at a minute interval at the center. After applying 1,4-2, the upper surfaces of the lead conductor layers 4-1 and 4-2 are cleaned by ion milling, and a non-magnetic material is provided between the ion milling side and the other shield 6 of the magnetic material. A gap layer 5 is formed.
[0010]
[Action]
In the present invention, as shown in FIG. 1, a protective layer 11 which is nonmagnetic and has excellent conductivity is provided on the surface of the MR element 3 on the side of the lead conductor layers 4-1 and 4-2 with an ion milling amount of not more than 100 °. Since the lead conductor layers 4-1 and 4-2 are formed on the protective layer 11 so that the end faces thereof face each other at a small interval at the center of the MR element 3, the lead conductor layers 4 and 4 are provided. Even if the upper surfaces of the first and second 4-2 are cleaned by ion milling or the like, as shown in FIG. 2, the protection layer 11 exposed from between the end surfaces of the conductor layers 4-1 and 4-2 is cut off to form grooves. However, since a step due to the groove does not occur in the core portion of the MR element 3, the domain wall due to the step of the MR element 3 disappears, and it is possible to prevent the occurrence of Barkhausen noise.
[0011]
【Example】
Hereinafter, an embodiment of the present invention will be described in detail with reference to FIGS.
FIG. 1 is a perspective view of a principal part showing a magnetoresistive head according to an embodiment, and FIG. 2 is a sectional view of a principal part of the operation. In the drawing, the same members as those in FIG.
[0012]
Magnetoresistive head of the present invention, one of the top shield 1 of the magnetic body so made of, for example, Ni-Zn ferrite or the like as shown in FIG. 1, to form a non-magnetic Giyappu layer 2 made of Al 2 O 2 Then, an MR element 3 made of a thin film of Ni-Fe or the like is disposed thereon in the same manner as in the prior art.
[0013]
The protective layer 11 made of, for example, Ti or Ta, which is nonmagnetic and has excellent conductivity, is formed on the surface of the MR element 3 on which the lead conductor layers 4-1 and 4-2 are formed by sputtering or vapor deposition. A conductive magnetic film having an MR effect smaller than that of the element 3, for example, a protective layer 11 made of NiFeCr is applied to a thickness greater than a step formed by ion milling in a later step and less than 100 ° to form the protective layer. Leading conductor layers 4-1 and 4-2 made of Au, Cu or Al are formed on the upper surface of the protective layer 11 such that their end faces face each other at a small interval at the center of the protective layer 11.
[0014]
Then, as in the prior art, the upper surfaces of the lead conductor layers 4-1 and 4-2 are cleaned by ion milling or the like to form a gap layer 5 of the same material as the gap layer 2 and one of the shield layers. The other shield 6 made of the same material as 1 forms a magnetoresistive head.
[0015]
As a result, a step due to the groove does not occur in the core portion of the MR element 3, so that a domain wall due to the step of the MR element 3 is eliminated, and Barkhausen noise can be prevented from occurring. Can be improved.
[0016]
【The invention's effect】
As is apparent from the above description, according to the present invention, since the core portion of the magnetoresistive element has no step due to the groove, the occurrence of Barkhausen noise can be prevented, and the magnetoresistive effect head can be prevented. It is possible to provide a method of manufacturing a magnetoresistive head in which the reliability can be improved.
[Brief description of the drawings]
FIG. 1 is a perspective view showing a main part of a magnetoresistive head according to an embodiment of the present invention.
FIG. 2 is a sectional view of a main part showing an operation.
FIG. 3 is a schematic perspective view showing a main part of a conventional magnetoresistive head.
FIG. 4 is a cross-sectional view for explaining a conventional problem.
[Explanation of symbols]
1, 6 are shields,
2 and 5 are gear layers,
3 is an MR element,
4-1 and 4-2 are lead conductor layers,
11 is a protective layer,

Claims (4)

非磁性のギャップ層に磁気抵抗効果素子を配設し、該磁気抵抗効果素子にイオンミーリングにより削り取られるよりも厚い厚さのイオンミーリング防止用の保護層を施し、前記磁気抵抗効果素子の中央部で端面が互いに対向する一対の引き出し導体層の各々を前記磁気抵抗効果素子の両端部の各々に前記保護層を介して接続されるように形成し、前記引き出し導体層の前記磁気抵抗効果素子に面する面と反対側の面側から前記一対の引き出し導体層と前記端面間の保護層との表面を前記保護層の厚さが残る範囲内でイオンミーリングし、前記イオンミーリングにより表面が清浄化された前記一対の引き出し層体層と前記端面間の保護層とに非磁性のギャップ層を形成することを特徴とする磁気抵抗効果型ヘッドの製造方法。 A non-magnetic gap layer is provided with a magneto-resistive element, and the magneto-resistive element is provided with a protective layer for preventing ion milling having a thickness greater than that cut off by ion milling. Each of the pair of lead conductor layers whose end faces are opposed to each other is formed so as to be connected to each of both ends of the magnetoresistive element via the protective layer, and is formed on the magnetoresistive element of the lead conductor layer. The surfaces of the pair of lead conductor layers and the protective layer between the end faces are ion-milled from the side opposite to the facing surface within a range where the thickness of the protective layer remains, and the surface is cleaned by the ion milling. Forming a non-magnetic gap layer between the pair of drawn-out layer body layers and the protective layer between the end faces . 前記保護層が、非磁性導体層であることを特徴とする請求項1記載の磁気抵抗効果型ヘッドの製造方法。2. The method according to claim 1, wherein the protective layer is a non-magnetic conductor layer. 前記保護層が、上記磁気抵抗効果素子よりも小さなMR効果を有する導電性磁性膜であることを特徴とする請求項1記載の磁気抵抗効果型ヘッドの製造方法。2. The method according to claim 1, wherein the protective layer is a conductive magnetic film having an MR effect smaller than that of the magnetoresistive element. 前記保護層の膜厚が、イオンミーリングされる深さよりも厚く、且つ100Å以下であることを特徴とする請求項1記載の磁気抵抗効果型ヘッドの製造方法。2. The method according to claim 1, wherein the thickness of the protective layer is greater than a depth at which the ion milling is performed, and is equal to or less than 100 [deg.].
JP33694792A 1992-12-17 1992-12-17 Method of manufacturing magnetoresistive head Expired - Fee Related JP3578777B2 (en)

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JP3578777B2 true JP3578777B2 (en) 2004-10-20

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