JP3496850B2 - Sample analyzer - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a sample analyzer for automatically performing probe cutting, sample peeling, sample direction control, and sample air feeding after sampling molten metal or the like with a probe in a high temperature furnace such as a converter. Regarding

[0002]

2. Description of the Related Art In a conventional sample analyzer, molten metal or the like is sampled by a probe in a high temperature furnace such as a converter, and after the probe is extracted, subsequent cutting, sample extraction, and sample air injection are sampled. In place,
Most of it was done manually and samples were sent to the analyzer.

Recently, a facility for automating these operations has been proposed. For example, Japanese Patent Laid-Open No. 249006/1993 discloses a series of procedures from sample cutting to probe cutting, sample peeling, sample air feeding, and analysis. An apparatus capable of automatically processing from sampling to analysis is disclosed by an automatic sample analyzer that performs processing.

[0004]

However, in the sample analyzer disclosed in the above publication, the probe is attached to the tip of the lance and placed in the high temperature furnace to collect a sample such as molten metal. In addition to the final probe, foreign matter such as metal attached to the lance falls along with the probe, is collected as it is, and enters the cutting device. This clogging of the foreign matter causes a failure.

Further, since the positioning at the time of cutting the probe is performed at the position inside the step of the stepped probe, it cannot be applied to the probe without the step.

Furthermore, in order to peel the sample from the sample chamber, the outer bottom surface of the sample chamber or the gripping clamp is continuously struck with a knocker while the sample chamber is clamped, but the outer periphery of the sample chamber is covered with a paper cylinder. Since the impact on the sample chamber becomes indirect, the impact is not sufficiently transmitted to the sample chamber and the impact effect is not sufficient, so that there is a disadvantage that it takes time to peel the sample.

In addition, since there is a lot of dust near the high temperature furnace in a bad environment, there is a problem that a lot of troubles due to dust occur in the sampling device.

Therefore, according to the present invention, foreign matter such as metal can be easily removed, the probe can be applied regardless of whether or not there is a step, the sample can be reliably peeled off, and the sample is resistant to dust, A reliable sample analyzer is provided.

[0009]

DISCLOSURE OF THE INVENTION The present invention is, in a sample analyzer, a damper which receives a probe sampled from a high temperature furnace such as a converter and a foreign matter such as a metal and discharges only the foreign matter such as a metal. The chamber and the probe transferred from the damper chamber to cut the sample chamber under the probe, and the rocking cartridge in which the cut sample chamber is placed with the cutting surface facing down is moved up and down rapidly. A sample peeling device having a vertical movement frame for discharging only the sample from the prepared hole of the cartridge receiver, a direction control device for the peeled sample, and a device for transferring the sample of which the direction is fixed to the air feeding tube. It is what

An openable and closable foreign matter discharge damper is provided at the bottom of the damper chamber, an openable and closable lid is provided on the side surface of the damper chamber, and a scraping gripping clamp is provided so as to be able to move in and out of the damper chamber.

An apparatus for cutting the probe includes a positioning stopper for the probe by pushing up the scraping and grasping clamp holding the probe, a cutting machine for cutting the sample chamber of the probe, a swinging and rotating operation for grasping the sample chamber. Composed of a possible lower clamp.

The sample peeling device comprises the rocking cartridge for loading the cut sample chamber and a vertically movable frame having a prepared hole for setting the rocking cartridge.

The direction control device comprises two vibrating plates having a gap and a sample receiving rod provided below the gap along the gap, and the two vibrating plates have their side surfaces facing each other. The sample is arranged so as to incline downward in the direction and has a downward slope in the direction in which the sample is transferred, and the gap has a size larger than the small diameter of the sample and smaller than the large diameter of the sample.

As another example of the direction control device,
A fixed chute that communicates with a prepared hole provided in the lower part of the vertical movement frame, and an elevating chute that is continuous with the fixed chute are provided.
It may be configured so as to include a sample moving and swiveling device which is rotated to align the directions.

[0015]

In the sample analyzer of the present invention, the probe extracted after the sampling is dropped into the damper chamber provided separately from the cutting device and clamped by the scraping and grasping clamp. After dropping it in the waste bin, only the necessary probe remains.

Since the scraping and grasping clamp can be rotated and moved up and down, after the probe is taken out from the damper chamber, the upper end of the probe can be positioned by holding the upper end of the probe against the upper positioning stopper while grasping the probe.

The cutting device which produces a large amount of dust is not affected by the dust when it is located far from the final sample take-out part, particularly the air feeding tube inlet.

The cut sample chamber is put into a cartridge, and the entire cartridge is rapidly moved up and down to slam the sample chamber up and down. Can be dropped more.

As means for aligning the directions of the dropped samples, two plates with a slight gap formed and a round bar arranged along the gap in the middle lower part of the gap, and two plates at the top of the plate Two round bars are placed upright, supported by four springs, and the sample is dropped onto two plates that are being oscillated by a vibrator. While the sample is oscillating, the sample is oriented in one direction. Due to the direction control device that aligns with, the dropped sample always has a large diameter at the bottom and a small diameter at the top. Further, the sample can be clamped and taken out as it is, and rotated by 180 ° to control the direction by dropping in a chute having an inner diameter slightly larger than its large diameter and being received by the base.

The inlet of the air feeding tube for feeding the sample is located at an upper part apart from the direction controlling device, and the sample is clamped and lifted by the hand from the direction controlling device having a lot of dust to be put into the air feeding pipe. Therefore, it is possible to prevent dust from mixing in the pneumatic tube.

[0021]

Embodiments of the present invention will be described with reference to the drawings.

FIG. 1 is a schematic view of the whole case of sampling in a converter. The probe 1 extracted from the lance 9 of the converter by the probe extraction grip clamp 7 falls in the chute 8. At that time, foreign matter 10 such as a metal that adheres to and grows on the lance 9 due to a splash of a molten material such as molten metal may fall into the chute during the extraction work.

The probe without sample is taken out manually by switching the transfer destination chute with the switching damper 6, opening the door 12. The probe with the sample drops to a foreign substance discharge damper (described below) provided in the lower portion of the foreign substance discharge damper chamber 5, stops, is clamped, and the damper is opened so that the foreign substance and dust fall into the lower discharge box 16. To do.
The probe having the sample is transferred to the analyzer through each device of the present invention.

FIG. 2 is an overall view showing an embodiment of the present invention, FIG.
Is a plan view of the apparatus, FIG. 4 is an explanatory view of a sampling probe, and FIG. 5 is an explanatory view of a sample.

The sample 3 below the probe 1 is cut at the upper X position, and the sample 3 contained in the sample chamber 2 is cut.
Take out and analyze.

In FIGS. 2 and 3, the switching damper 6 provided above the foreign matter discharge damper chamber 5 installed at the point b of the apparatus frame 4 separates the probe from which the sample is taken out and the probe from which the sample is not taken out. Fall down.

FIG. 6 is an explanatory view showing a state where the foreign matter 10 such as a metal and the probe 1 are mixed and fall.

Normally, only the probe 1 extracted by the probe extracting and grasping clamp 7 falls in the chute 8, but the foreign matter 10 such as the ingot which is grown by the molten metal or the like adhering to the lance tube 9 due to the splash or the like is extracted. It may fall into the chute 8 during work.

In FIGS. 6 and 7, the size of the foreign matter falling from the upper portion is such that the diameter f of the inlet chute is such that the probe can sufficiently pass through it, so the diameter of the portion below f is set to a dimension g larger than f. By setting the same size up to the outlet of the waste material box 16, the foreign material 10 is prevented from being caught in the middle.

FIG. 7 is a sectional view of the foreign matter discharge damper chamber. Of the probes that fall in the chute from the a direction,
The sampleless probe 11 is switched to the chute side with the door 12 by the switching damper 6 to transfer the falling object.
Open the door 12 and take it out manually. The probe 1 with sample falls to the foreign matter discharge damper 13 and stops. When the drop detection sensor 14 detects the drop of the probe 1, the scraping and drop grip clamp 15 clamps the probe 1.

FIG. 8, FIG. 9 and FIG. 10 are explanatory views of a state in which foreign matter is dropped from the foreign matter discharge damper chamber and the probe is held. With the probe 1 clamped, the foreign matter discharge damper 13 is opened, and the foreign matter 10 and dust are dropped into the lower discharge box 16, and then the foreign matter discharge damper 13 is closed and the scraping clamp 15 is opened, and the probe 1 is removed. After dropping onto the upper surface of the discharge damper 13, the scraping and grasping clamp 15 is closed and the probe 1 is clamped again. By doing so, the probe 1 can be clamped after the foreign matter is discharged, even if a large foreign matter or a small foreign matter is mixed.

FIG. 11 is a plan view of the scraping and grasping clamp 15, in which the probe 1 is scraped by a V-shaped scraping rod 20 on the plane shown in FIG. 12 to guide it to a plurality of clamp blades 21 provided at the center. As shown by 13, the clamp blade 21 is clamped in a state of biting into the probe 1.

As shown in FIGS. 14 and 15, in the damper chamber lid opening / closing device 17, the lid 18 is rotated around the bearing 19 to open it, and the scraping and grasping clamp 15 is centered around the swivel bearing 22 while the probe 1 is clamped. The probe 1 is taken out from the point b of the damper chamber, and is swung to the cutting position c.

FIG. 16 is a side view of the probe upper end positioning device at the cutting position. Scraping grip clamp 1
The probe 1 clamped by 5 and swiveled is guided by the guide roller 23, pushed up by the pushing-up drive cylinder 24, and hits the positioning stopper 25 located at the upper part. At this time, a pressure reducing valve 26 that can adjust the pressing force is installed to prevent the clamp blade 21 and the probe 1 from being displaced. When the probe 1 hits the positioning stopper 25, the upper clamp 27 and the lower clamp 28 located above and below the cutting position are closed.

17 and 18 are explanatory views of the cutting device, FIG.
9 is a side sectional view of the sample peeling device and the direction control device,
FIG. 20 is a view of the sample chamber 33 cut away, and FIG.
In FIG. 7 and FIG. 18, after the presence or absence of the cutting blade 29 is checked by the cutting blade confirmation sensor 38, the cutting blade drive motor 3
0 is rotated and the cutting blade 29 is rotated. The blade moving cylinder 32 is driven with the bearing 31 as the center of rotation, the lower portion of the probe 1 is cut, and the sample chamber 33 is cut off. As shown in FIGS. 3 and 16, the lower clamp 28 includes a slewing bearing 36.
With the drive cylinder 37 as a center, the sample is swung from the cutting position c to the sample peeling position d.

The upper residual probe 76 cut by the cutting device is swung from the cutting position c to the point b of the foreign matter discharging damper chamber 5 to open the discharging damper 13 and open the clamp 13 to the lower discharging box. It is dropped (Figs. 2 and 3).

In FIG. 20, the outer cylinder is a burnt paper cylinder 34,
Inside is a metal container 35, and the sample 3 is contained therein.

In FIG. 19, the sample chamber 33 swung to the sample peeling position d is driven by a 180 ° rotary cylinder 40 about a rotary bearing 39 on the extension line of the lower clamp 28 to close the lower clamp 28. Continue to rotate so that the cut surface of sample 3 faces downward.
Next, the lower clamp 28 is opened, and the sample chamber 33 is dropped at the center of the funnel 41, and then dropped into the swing cartridge 42 provided in the lower portion. At this time, the sample chamber 33
It is confirmed that the sample chamber 33 enters the cartridge 42 by pressing the cylinder 43 from above, assuming that the sample chamber 33 will stop in the middle of the funnel 41 or in the middle of the rocking cartridge 42. The inner diameter of the cartridge 42 is slightly larger than the outer diameter of the sample chamber 33. The swing cartridge 42 is guided by eight guide rollers 44 and four side guide rollers 45 as shown in FIGS.

The rocking cartridge 42 is placed on a receiving base 46 so that it can slide. The guide roller is attached to the U-shaped frame 47 and is attached to the air cylinder 48 with a straight guide.
When the sample chamber 33 is loaded into the cartridge 42,
The air cylinder 48 with a straight guide is driven in the horizontal direction to move the cartridge 42 into the peeling device 49. The peeling device 49 operates up and down, the frame 50 is formed in a U-shape, the guide roller and the side roller are provided, and the receiving bracket 52 to which the guide roller is attached is attached to the receiving base 46.

The vertical moving frame 50 is operated by a vertical driving air cylinder 53 provided above, and the vertical moving frame 5 is moved.
A prepared hole 54 slightly larger than the large diameter of the sample 3 is provided at the center of the lower part of 0.

In FIG. 23, the rocking cartridge 42 containing the sample chamber 33 is moved and set in the peeling device 49, and the vertically moving air cylinder 53 pulls up the vertically moving frame 50. FIG. 25 is a diagram showing a state in which the vertically movable frame 50 pulled up is rapidly moved vertically. The cartridge 42 is forcibly lowered by the vertical movement frame 50, but the sample chamber 33 inside is floated in the air. Then, when the vertical movement frame 50 is rapidly raised, the metal container 35 of the sample chamber 33 is placed on the lower surface. Is hit. By repeating this operation 2 to 3 times, the impact causes the sample 33 to drop downward from the prepared hole 54.

FIG. 26 is a cross-sectional view of the discharge device of the residual material sample chamber. The remaining sample chamber 56 moves to the peeling position d point,
Below the receiving base surface 46, there is a hole slightly larger than the inner diameter of the cartridge 42, and a movable lid 55 for closing the hole is provided. When the lid is opened, the residual material sample chamber 56 passes through the hole to discharge the material. It falls into the box 57.

Further, when the lower clamp 28 is rotated 180 ° at the peeling position d in FIG. 20, when only the sample 3 falls into the cartridge 42, the drop detection sensor 58 detects it, and then the cartridge 42 moves up and down. The sample 3 is moved into the sample 50 and dropped from the prepared hole 54.
After returning the cartridge 42 to the peeling position d, the movable lid 5
5 is opened and the lower clamp 28 waiting on the upper side is opened to drop the residual material sample chamber 56 into the discharge material box 57.

In FIG. 19, the sample 3 taken out of the sample chamber drops onto the direction control device 59 below. FIG. 27 is a sectional view of the direction control device, and FIG. 28 is a plan view thereof. The two vibrating plates 60 are slightly tilted, and a gap 61 is set which is slightly smaller than the large diameter of the sample 3 and slightly larger than the small diameter of the sample. Below the center of the gap 61, a sample receiving rod 62 is provided along the gap 61. The entire device 59 is suspended by four springs 63, and the entire device 59 vibrates a vibrator 64 attached to the lower part in the traveling direction of the sample 3. Sample 3
Guide plate 6 to prevent splashing when the
5 may be provided.

The sample 3 dropped on the vibrating plate 60 is received in various directions and the direction is not fixed, but the small diameter of the sample 3 is lowered in the gap 61 between the two vibrating plates 60. Moves toward the sample receiver 66.
Since the difference between the large diameter and the small diameter of the sample 3 is the difference of the draft of the casting, in order to prevent the sample 3 from getting into a biting state and stopping during the vibration movement, the sample 3 has a loose gap during movement as shown in FIG. I am trying. Further, the guide rod 68, which is erected vertically on the vibrating plate 68, is hit by the small diameter when the large diameter of the sample 3 enters the gap in the opposite direction and is transferred, and the small diameter is rotated and the small diameter is the gap of the vibrating plate 60. It is effective because it moves toward 61 and falls.

In FIG. 19, when the sample 3 arrives at the sample receiver 66 of the direction controller 59, it is detected by the detection sensor 69, the vibrator 64 is stopped, and the sample clamp 70 is lowered from the upper part by the elevating cylinder 71 to clamp the sample 3. Then, it moves up and moves to the air feeding position e by the moving cylinder with a guide 72.

At the air feeding position e, there is the air feeding damper 74 above the air feeding pipe 73, and when the damper 74 is opened, the air curtain 75 is used. The sample 3 is dropped therein and transferred to the analyzer by a pneumatic tube.

FIG. 29 shows another embodiment of the sample direction control device, in which the sample 3 always has a large diameter downward and a small diameter upward and drops from the hole 54 of the vertical movement frame. 54 is guided to a fixed chute 77 provided below 54 and an elevating chute 78 provided below the fixed chute 77,
Stops above 9. The lift chute 78 is guided by several guide rollers 80 and lifted by the drive cylinder 81 so that the sample 3 can be taken out.

FIG. 30 is a diagram showing a sample taking out state, in which the elevating chute 78 is raised, the sample 3 is clamped by the sample clamp 70 by the moving cylinder with a guide 83, and the sample 3 is taken out from the porous base 79. Perforated base 79
This prevents dust that falls during the operation of the vertically moving frame 50 at the upper part from falling onto the dust receiving pan 82 below and collecting on the base 79. The sample 3 taken out from the base 79 is reversed by the sample reversing device 85 so that the small diameter is lowered and the sample 3 is moved to the air feeding position e.

FIG. 31 is an explanatory view of the structure of the air feeding pipe inlet. At the air feeding position e, there is an air feeding damper 74 above the air feeding pipe 73, and when the damper 74 is opened, an air curtain 75 is provided. The sample 3 is dropped therein and is transferred to the analyzer by the pneumatic tube 3.

[0051]

The effects of the present invention are as follows.

(1) When collecting a probe after sampling molten metal or the like, it is possible to easily remove the falling foreign matter, so that the foreign matter does not damage the blade during cutting and the cutting operation rate is improved. Can be improved.

(2) By positioning the upper end of the probe, it is possible to deal with the presence or absence of the stepped portion of the probe.
Since conventionally used probes can be used and no special shape is required, the probes can be supplied at low cost, and the total cost can be reduced.

(3) In the present invention, when the sample is peeled off, the metal container on the outside of the sample is hit directly against the metal frame, which has a striking effect, and the sample peeling does not take time.

(4) For controlling the sample direction in a dusty place, the transfer direction is controlled by a vibration vibrator to eliminate rotation of parts, bearings, etc., and to supply a device resistant to dust, thereby stopping maintenance. The number of times can be extremely reduced, and the operating rate can be improved.

(5) Since the peeling device for the peeled sample always has a large diameter, the direction can be controlled only by providing a chute and receiving it directly below, so it is inexpensive, reliable, and highly reliable against dust. A stripping device is obtained.

(6) By reducing the sample air inlet from the foreign substance discharging device, the probe cutting device, and the direction control device, and providing an inlet damper and an air curtain at the inlet, the dust entrainment trouble is reduced in the final air feeding process. This improves the reliability of the pneumatic transportation of the sample.

[Brief description of drawings]

FIG. 1 is an overall schematic diagram of the sampling of the present invention.

FIG. 2 is an overall view of an apparatus showing an embodiment of the present invention.

FIG. 3 is a plan view of the device shown in FIG.

FIG. 4 is an explanatory diagram of a sampling probe.

FIG. 5 is an explanatory diagram of a sample.

FIG. 6 is an explanatory view showing a state in which a foreign matter and a probe fall in the present invention.

FIG. 7 is a sectional view of the foreign matter discharge damper chamber of the present invention.

FIG. 8 is a diagram showing a state in which the foreign matter and the probe have fallen into the foreign matter discharge damper chamber of the present invention.

FIG. 9 is a state diagram of dropping foreign matter from the foreign matter discharge damper chamber of the present invention.

FIG. 10 is a diagram showing a state in which the probe is held in the foreign matter discharge damper chamber of the present invention.

FIG. 11 is a plan view of the scraping grip clamp of the present invention.

FIG. 12 is a plan view of the scraping bar of the scraping grip clamp of the present invention.

FIG. 13 is a view showing a state where the probe is held by the scraping and grasping clamp of the present invention.

FIG. 14 is an explanatory view of turning of the probe by the scraping grip clamp of the present invention.

FIG. 15 is a plan view of the damper chamber lid opening / closing device of the present invention.

FIG. 16 is a side view of a probe upper end positioning device according to the present invention.

FIG. 17 is a side view of the cutting device of the present invention.

FIG. 18 is a plan view of the cutting device of the present invention.

FIG. 19 is a side sectional view of the sample peeling device and the direction control device of the present invention.

FIG. 20 is a cross-sectional view of the sample chamber cut away.

FIG. 21 is a side view of a guide of the swing cartridge of the present invention.

FIG. 22 is a plan view of a guide of the swing cartridge of the present invention.

FIG. 23 is an explanatory view showing a state in which the swing cartridge including the sample chamber is moved and set in the peeling device of the present invention.

FIG. 24 is a plan view of the support structure of the peeling device of the present invention.

FIG. 25 is an explanatory view of a state in which the vertical swing frame of the peeling device of the present invention is rapidly moved up and down.

FIG. 26 is a cross-sectional view of a discharge device for a residual material sample chamber according to the present invention.

FIG. 27 is a sectional view of the direction control device of the present invention.

FIG. 28 is a plan view of the direction control device of the present invention.

FIG. 29 is a sample control device of the present invention.

FIG. 30 is an explanatory diagram of a sample extracting device of the present invention.

FIG. 31 is an explanatory view of a structure of an air feeding pipe inlet according to the present invention.

[Explanation of symbols]

1 probe, 2 sample chamber, 3 sample 4 frame, 5 damper chamber, 6 switching damper, 7
Probe extraction grip clamp, 8 chute, 9
Lance, 10 foreign matter, 11 probe not sampled, 12 door, 13 foreign matter discharge damper, 14
Fall detection sensor, 15 scraping grip clamp,
16 waste box, 17 damper chamber lid opening / closing device, 18
Lid, 19 bearing, 20 scraping rod, 21 clamp blade, 22 slewing bearing, 23 guide roller,
24 push-up drive cylinder, 25 positioning stopper, 26 pressure reducing valve, 27 upper clamp, 28 lower clamp, 29 cutting blade, 30 cutting blade drive motor, 31 bearing, 32 is moving cylinder, 33
Sample chamber, 34 Paper tube, 35 Hardware container, 36
Slewing bearing, 37 drive cylinder, 38 blade confirmation sensor, 39 rotary bearing, 40 180 ° rotary cylinder, 41 funnel, 42 swing cartridge, 43 pressing cylinder, 44 guide roller, 45 side guide roller, 46 receiving base, 47 core Frame, 48 air cylinder with straight guide, 49 stripping device, 50 vertical movement frame, 51 guide roller, 52 guide roller, 53 vertical drive air cylinder, 54 pilot hole, 55 movable lid, 56 residual material sample chamber, 57
Discharge box, 58 drop detection sensor, 59 direction control device, 60 vibration plate, 61 gap, 62 sample receiving round bar, 63 coil spring, 64 vibrator, 65 guide plate, 66 sample receiver,
67 gap, 68 guide rod, 69 detection sensor,
70 sample clamp, 71 lifting cylinder,
72 moving cylinder with guide, 73 pneumatic tube,
74 pneumatic duct, 75 air curtain, 76 residual probe, 77 fixed seat, 78 lifting seat,
79 porous base, 80 guide roller, 81
Drive cylinder, 82 dust pan, 83 moving cylinder with guide, 84 sample reversing device,
85 sample moving and swiveling device, 86 chute type directional control device.

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Claims (6)

(57) [Claims] 1. A prober sampled from a high temperature furnace and a damper chamber for receiving foreign matter such as metal ingot and discharging only the foreign matter, and the probe transferred from the damper chamber are positioned, A device that cuts the sample chamber, a sample peeling device that has a vertical movement frame that discharges only the sample by abruptly moving the rocking cartridge with the cut surface facing downward, A sample analysis device, comprising: a sample direction control device; and a device for transferring the sample, the direction of which is fixed, to an air feeding tube. 2. A bottom of the damper chamber is provided with an openable / closable foreign matter discharge damper, a side face of the damper chamber is provided with an openable / closable lid, and a scraping grip clamp is provided so as to be able to move in and out of the damper chamber. The sample analyzer according to claim 1, wherein the sample analyzer is provided. 3. An apparatus for cutting the probe includes a positioning stopper for the probe by pushing up the scraping gripping clamp holding the probe, a cutting machine for cutting the sample chamber of the probe, and a gripping device for holding the sample chamber. The sample analyzer according to claim 1 or 2, wherein the sample analyzer comprises a lower clamp that is rotatable and rotatable. 4. The sample peeling device comprises the rocking cartridge for loading the cut sample chamber and a vertically movable frame having a prepared hole for setting the rocking cartridge. Item 1. The sample analyzer according to item 1, 2 or 3. 5. The direction control device has a gap 2 formed therein.
The two vibrating plates are composed of a vibrating plate and a sample receiving rod provided below the gap and along the gap. The two vibrating plates incline downward in a direction in which their side surfaces face each other and transfer a sample. 5. The sample analyzer according to claim 1, wherein the gap is arranged so as to have a downward gradient in the direction, and the gap has a size larger than the small diameter of the sample and smaller than the large diameter of the sample. . 6. The direction control device includes a fixed chute communicating with a prepared hole provided in a lower portion of the vertical movement frame,
5. The sample moving and swiveling device which is provided with an elevating chute continuously with the fixed chute and takes out the dropped sample and rotates it by 180 ° to align the directions, 5. Sample analyzer.