JP3492033B2 - Cooking device - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a heating cooker for performing heating cooking by controlling a heating means by a control means.

[0002]

Conventionally, the hardware inspection (test) in the manufacturing process of such a heating cooker is previously stored in a memory inside a microcomputer as a control means in addition to the control program of the heating cooker. The test program for inspection is built in, and the test program is executed, or the operation as the heating cooker is actually executed.

However, when the test program is incorporated in the internal memory of the microcomputer, the size of the test program increases as the hardware becomes complicated, and therefore the control program stored in the limited capacity of the memory. There was a problem that the size of was squeezed. Further, the test program, once started, executes all the test items according to a predetermined procedure, which is inconvenient when it is desired to test only specific test items. Then, when actually performing the operation as the heating cooker to perform the test, there are problems that the time required for the test becomes long and the detail test cannot be performed.

The present invention is intended to solve the above problems, and its object is to provide a hardware which does not require a large size of a test program, a test item can be selected, and a long time. It is to provide a heating cooker capable of performing the test of.

[0005]

In order to achieve the above object, the heating cooker according to claim 1 performs heating cooking by controlling the heating means by the control means, wherein the control means is operated by an operator. To operate the test switch
A test mode switching signal can be output based on the test mode, and a test signal input port to which a test means for outputting a test signal capable of selectively outputting a plurality of types of test signals is connected is provided. When a test signal is received while receiving a signal and being switched to the test mode,
It is characterized in that the output of the output port designated by the test signal is controlled. According to the heating cooker having such a configuration, it is possible to test whether or not the hardware connected to the output port designated by the test signal output by the test means functions normally.

In the heating cooker according to a second aspect of the present invention, the heating means cooks by controlling the heating means by the control means, wherein the control means is a test switch operated by an operator.
A test mode switching signal can be output based on the operation of, and a test signal input port to which a test means for outputting a test signal capable of selectively outputting a plurality of types of test signals is connected, When a test signal is received in a state where the signal for switching is received and switched to the test mode, the input state of the input port designated by the test signal is output to the outside as a test result signal. According to the heating cooker configured in this way,
It is possible to test whether or not the hardware connected to the input port designated by the test signal output by the test means functions normally.

In this case, the control means is provided with an A / D conversion input section, and the A / D conversion input section corresponding to the input port designated by the test signal output from the test means is connected to the A / D conversion input section.
The conversion may be started and the A / D conversion result may be output to the outside as a test result signal.
According to this structure, the hardware connected to the input port designated by the test signal output by the test means can output the analog signal and test it (claim 3).

Further, it has a plurality of keys, and has operation means for outputting an operation signal for cooking according to the operation of those keys, and the control means has an operation signal input port to which the operation means is connected. When it is determined that the operation signal output by the operation means indicates a special operation, a part of the operation signal input port may be switched and used as a test signal input port. There is no need to independently provide a test signal input port (claim 4).

Furthermore, a shift register which is connected to the serial data output port of the control means and outputs a drive signal to a plurality of loads as an extended output port is provided, and the control means controls the input state of the input port or the A / D conversion result. It may be configured to output as a test result signal to the serial data output port. With such a configuration, it is not necessary to provide an output port dedicated to the test result signal, and the test of the load driven by the shift register is possible. Can also be performed (Claim 5).

The control means may be configured to display the input state of the input port designated by the test signal or the A / D conversion result on the display means. With this configuration, the display means can be used for displaying the test result (claim 6).

In addition, the test means may be provided with a display section for inputting the test result signal of the control means and for displaying the contents of the input test result signal. The test result can be confirmed by (Claim 7).

[0012]

BEST MODE FOR CARRYING OUT THE INVENTION A first embodiment of the present invention will be described below with reference to FIGS. In FIG. 2 showing the main part of the electrical configuration, an operation signal input port of a microcomputer (hereinafter, referred to as a microcomputer) 2 which is a control means of a microwave oven 1 which is a cooking device is an output of an input key circuit 3 which is an operation means. It is connected to the terminal. Also,
The A / D conversion input port of the microcomputer 2 is connected to an output terminal of a sensor 4 such as a temperature sensor, and the output signal of the sensor 4 is given to an A / D conversion unit (not shown) inside the microcomputer 2 to be A / D conversion unit. After being D-converted, it is supplied to a control unit (not shown) inside the microcomputer 2.

On the other hand, the output port of the microcomputer 2 is connected to an input terminal of a display device 5 which is a display means composed of, for example, a 7-segment LED, and the microcomputer 2 is adapted to give a display signal to the display device 5. . The output port of the microcomputer 2 is connected to the input terminal of the magnetron 7 serving as heating means via the drive circuit 6, and the microcomputer 2 is adapted to give a drive signal to the magnetron 7. Also,
The output port of the microcomputer 2 is connected to the input terminal of the heater 9 which is a heating means via the drive circuit 8, and the microcomputer 2 is adapted to give a drive signal to the heater 9.

In FIG. 1 showing the electrical configuration of the main part when a hardware test is performed in the manufacturing process of the microwave oven 1 , the input ports DATA, CLK and CS, which are test signal input ports of the microcomputer 2, are The output terminals of the test device 10, which is a test means, are connected to each other, and the test device 10 supplies various test signals, which will be described later, to the microcomputer 2.

The output port OUT1 of the microcomputer 2
Is connected to ground via a series circuit of resistors 11 and 12, and the common connection point of resistors 11 and 12 is connected to the base of transistor 13. The emitter of the transistor 13 is connected to the ground, and the collector is connected to the driving power supply Vp via the exciting coil 14 a of the relay 14. Normally open contact 14b of relay 14
In place of the magnetron 7 shown in FIG. 2 , a series circuit of a battery 15 and a test lamp 16 is connected to both terminals of. The resistors 11 and 12, the transistor 13, and the relay 14 form a drive circuit 6 that is hardware.

The output port OUT2 of the microcomputer 2 is connected to the ground via the series circuit of the resistors 17 and 18, and the common connection point of the resistors 17 and 18 is the transistor 1
It is connected to 9 bases. The emitter of the transistor 19 is connected to the ground, and the collector is connected to the driving power supply Vp via the exciting coil 20a of the relay 20. In place of the heater 9 shown in FIG. 2 , a series circuit of a battery 21 and a test lamp 22 is connected to both terminals of the normally open contact 20b of the relay 20. In addition, resistance 1
7 and 18, the transistor 19 and the relay 20 constitute a drive circuit 8 which is hardware.

Next, the operation of the first embodiment will be described with reference to FIGS. 3 and 4. When the level of the chip select signal applied to the input port CS is low, the microcomputer 2 operates on the basis of the operation signal applied by the key input circuit 3 and the detection signal of the sensor 4 in accordance with a control program stored in advance. The heating signal is applied to the magnetron 7 or the heater 9 to heat and cook the food placed on the turntable in the cooking chamber (not shown).

Thus, when the level of the signal applied to the input port CS is high, the microcomputer 2 detects various hardware based on the test signal applied to the input port DATA by the test apparatus 10. It is designed to run tests.

The test apparatus 10 has a built-in microcomputer, and when a test switch (not shown) is turned on by an operator, a high-level signal is applied to the input port CS of the microcomputer 2 so that a microwave oven can be used. Switch 1 to test mode. Then, the test apparatus 10 operates the operation switch A or B to synchronize the rising edge of the clock signal supplied to the input port CLK and transmit the transmission data as the test signal to the input port DATA.
1 bit at a time as serial data. Then, as shown in FIG. 4C, the test apparatus 10 transmits the last 1 bit in the series of transmission data and, at the same time, gives the input port CS a signal that becomes a low level for a moment, thereby giving the microcomputer 2 a signal. Notify that the transmission of data has ended.

Here, the operation switch A is a switch for testing the drive circuit 6, and the test apparatus 10 supplies the data D1 to the input port DATA of the microcomputer 2 when the operation switch A is turned on and turns it off. Then, the data D2 is applied to the input port DATA. Further, the operation switch B is a switch for testing the drive circuit 8, and the test device 10 causes the data D3 to be input to the input port DATA when the operation switch B is turned on.
When it is turned off, the data D4 is given to the input port DATA.

In FIG. 3 showing a flow chart of the control contents of the microcomputer 2 of the part related to the hardware test,
The microcomputer 2 determines step S of "CS = High?"
At 1, it is determined whether or not the level of the signal applied to the input port CS is high. When the level of the signal applied to the input port CS is low and it is determined to be "NO" in the determination step S1,
The process proceeds to step S11 of "normal operation" and the process according to the normal control program is performed as described above.

Further, when the test switch of the test apparatus 10 is turned on by the operator and a high level signal is given to the input port CS of the microcomputer 2, the microcomputer 2 returns "YES" in the judgment step S1. Judgment is made and it is recognized that the mode has been shifted to the test mode, and the flow shifts to the next "data confirmed?"

At the decision step S2, the microcomputer 2
Waits until the transmission data from the test apparatus 10 is confirmed by referring to the input port CS. First,
It is assumed that the operation switch A of the test apparatus 10 is turned on. When the input port CS becomes low level and "YES" is determined in the determination step S2, the process proceeds to the next "data = D1?" Determination step S3.

In the judgment step S3, the microcomputer 2
Determines whether the transmission data confirmed in step S2 is D1. Here, since the operation switch A of the test apparatus 10 is turned on, the input port DAT
The data given to A is D1 (see FIG. 4 (a)), and if "YES" is determined in the determination step S2, the process proceeds to the next "OUT1 = High" processing step S4.

In processing step S4, the microcomputer 2
Outputs a high level signal to the output port OUT1 (see FIG. 4D). Then, the transistor 13 of the drive circuit 6 is turned on and the exciting coil 14 of the relay 14 is turned on.
A is energized and the normally open contact 14b is closed. Then, the test lamp 16 is energized by the battery 15 and is turned on. Then, the process proceeds to steps S1 and S2 and waits for the next transmission data to be determined.

Next, it is assumed that the operation switch A of the test apparatus 10 is turned off. Then, since the transmission data D2 is confirmed (see FIG. 4A), it is determined to be "YES" in step S2, and the process proceeds to step S3. Since the transmission data is D2, “NO” in step S3.
And the next “data = D2?” Determination step S
Go to 5. Then, in the determination step S5, it is determined as "YES", and the process proceeds to the next "OUT1 = Low" processing step S6.

In processing step S6, the microcomputer 2
Outputs low level data to the output port OUT1 (see FIG. 4D). Then, the transistor 13
Is turned off, the normally open contact 14b is opened, and the test lamp 16 is turned off. Then, in step S1,
The process proceeds to S2 and waits for the next transmission data to be confirmed.

Next, it is assumed that the operation switch B of the test apparatus 10 is turned on. Then, since the transmission data D3 is confirmed (see FIG. 4A), it is determined to be "YES" in step S2, and the process proceeds to step S3. Since the transmission data is D3, "NO" is determined in steps S3 and S5, and the process proceeds to determination step S7 of "data = D3?". Then, in the determination step S7, it is determined to be "YES" and the next "OUT2 = High".
The processing shifts to the processing step S8.

In processing step S8, the microcomputer 2
Outputs a high level signal to the output port OUT2 (see FIG. 4 (e)). Then, the transistor 19 of the drive circuit 8 is turned on and the exciting coil 20 of the relay 20 is turned on.
A is energized, and the normally open contact 20b is closed. Then, the test lamp 22 is energized by the battery 21 to be in a lighting state. Then, the process proceeds to steps S1 and S2, and waits until the next transmission data is confirmed.

Next, it is assumed that the operation switch B of the test apparatus 10 is turned off. Then, since the transmission data D4 is confirmed (see FIG. 4A), it is determined to be "YES" in step S2, and the process proceeds to step S3. Since the transmission data is D4, steps S3, S5 and S
In step 7, it is determined to be "NO", and the process proceeds to determination step S9 of "data = D4?". Then, in the determination step S9, it is determined to be "YES" and the next "OUT2 = Lo" is determined.
Then, the process proceeds to the process step S10 of "w".

In processing step 10, the microcomputer 2
Gives a low level signal to the output port OUT2 (see FIG. 4 (e)). Then, the transistor 19 is turned off, the normally open contact 20b is opened, and the test lamp 22 is turned off. Then, steps S1 and S
It shifts to 2 and waits for the next transmission data to be confirmed.

After that, when the test switch of the test apparatus 10 is turned off, the input port CS goes low and the process proceeds to step S3. However, since the transmission data is neither D1 to D4, steps S3 and S5. , S7,
In S9, each is judged as "NO" and the process proceeds to step S1.
In step S1, it is determined to be "NO" and the process proceeds to step S11.

As described above, according to this embodiment, when the microcomputer 2 receives the transmission data D1 to D4 given to the input port DATA when the operation switch A or B of the test apparatus 10 is turned on / off, Output port OUT1 or OUT2 corresponding to the transmitted data
Is controlled to a high or low level to give a control signal to the drive circuit 6 or 8 to turn on or off the test lamp 16 or 22.

Therefore, an operation test of the drive circuits 6 and 8 (test of normal function) is performed by the transmission data provided by the test apparatus 10 without requiring a large amount of test program size in the memory inside the microcomputer 2. Therefore, it is possible to secure a larger size of the control program, unlike the conventional case. Also,
According to the present embodiment, the operation test of the drive circuit 6 or 8 can be performed independently by operating the operation switch of the test apparatus 10. Therefore, the test can be performed from either side, or only one of them can be performed. You can also do a test.

5 to 7 show a second embodiment of the present invention. The same parts as those in the first embodiment are designated by the same reference numerals and the description thereof will be omitted. Only different parts will be described below. The input port IN1 of the microcomputer 2 is connected to the ground via the series circuit of the resistors 23 and 24, and the resistors 23 and 24 are connected.
Is connected to the control power supply Vc via the normally open key switch 3a of the input key circuit 3. Similarly, the input port IN2 of the microcomputer 2 has resistors 25 and 2
It is connected to the earth through the series circuit of 6 and the resistance 2
The common connection point of 5 and 26 is connected to the control power supply Vc via the normally open key switch 3b of the input key circuit 3. The output port DATA2 of the microcomputer 2 is connected to the input terminal of the test device 10. Further, the output terminal of the test device 10 is connected to the input terminal of the display unit 10a. Others are the same as those in the first embodiment,
In FIG. 5, only the portion according to the second embodiment is shown.

Next, the operation of the second embodiment will be described with reference to FIGS. 6 and 7. Operation switch C of the test apparatus 10
Is a switch for testing the input port IN1, and the test apparatus 10 has an input port DA of the microcomputer 2 when the operation switch C is turned on by a momentary operation.
Data D5 is given to TA. Further, the operation switch D is a switch for testing the input port IN2, and the test apparatus 10 operates the input port DAT when the operation switch D is turned on by a momentary operation.
The data D6 is given to A.

FIG. 6 shows a flow chart of the control contents of the microcomputer 2 of the part related to the hardware test. This flow chart is obtained by adding steps S12 to S15 after step S10 of the flow chart shown in FIG. Is. In FIG. 6, first, as in the first embodiment, when the test switch of the test apparatus 10 is turned on, a high level signal is given to the input port CS of the microcomputer 2, and the process proceeds to step S2. Here, when the operation switch C of the test apparatus 10 is turned on, the transmission data D5 is confirmed (see FIG. 7A).
Control goes to step S3.

Since the data given to the input port DATA is D5, the microcomputer 2 determines "NO" in the subsequent determination steps S3, S5, S7 and S9, and "data = D5?" The process moves to determination step S12. Then, in the determination step S12, "YES"
Therefore, the process moves to the next step S13 of “read IN1 and output to DATA2”.

In processing step S13, the microcomputer 2 reads the level (input state) of the signal given to the input port IN1 and outputs the read level signal to the output port DATA2 as a test result signal. To do. If the input key 3a is in the off state and the level of the input port IN1 is low, a low level signal is output to the output port DATA2 (FIG. 7).
(D), see). Then, the process proceeds to steps S1 and S2, and waits until the next transmission data is confirmed.

Thus, the test apparatus 10 has the output port D
The display unit 10a is caused to perform display according to the level of the signal output to the ATA2. In this case, since the level of the output signal is low, for example, a display LE (not shown)
Turn off D.

Next, when the operation switch D of the test apparatus 10 is turned on, the transmission data D6 is confirmed at the input port DATA (see FIG. 7A), step S.
Move to 3. Since the data given to the input port DATA is D6, the microcomputer 2 sets "N" in the subsequent determination steps S3, S5, S7, S9 and S12.
It is judged "O", and judgment step S of "data = D6?"
Move to 14. Then, since "YES" is determined in the determination step S14, the process proceeds to the next "read IN2 and output to DATA2" processing step S15.

In processing step S15, the microcomputer 2 reads the level (input state) of the signal given to the input port IN2 and outputs the read level signal to the output port DATA2 as a test result signal. To do. Here, assuming that the input key 3b is in the ON state and the level of the input port IN2 is high, a high level signal is output to the output port DATA2 (FIG. 7).
(D), see). Then, the process proceeds to steps S1 and S2, and waits until the next transmission data is confirmed. Therefore,
Since the level of the signal output to the output port DATA2 is high, the test apparatus 10 turns on the display LED of the display unit 10a.

Thereafter, when the operation switch C of the test apparatus 10 is turned on again (see FIG. 7A), the microcomputer 2 reads the level of the input port IN1 in the same procedure and outputs it as a test result signal. It is output to the output port DATA2 (see FIG. 7D).

As described above, according to the second embodiment, when the microcomputer 2 receives the transmission data D5 or D6 given to the input port DATA when the operation switch C or D of the test apparatus 10 is turned on. , The level of the signal given to the input port IN1 or IN2 corresponding to the transmitted data is read, and the read level signal is used as the test result signal at the output port DATA.
It is configured to output to 2. Also, the test device 10
Is configured to turn on or off the display LED of the display unit 10a according to the level of the signal output to the output port DATA2.

Therefore, the key switch 3a or 3 which is the hardware connected to the input port IN1 or IN2 by the transmission data provided by the test apparatus 10.
The state of b can be tested, and the test result can be easily confirmed by looking at the display LED of the display unit 10a.

8 to 10 show a third embodiment of the present invention. The same parts as those of the second embodiment are designated by the same reference numerals and the description thereof will be omitted. Only different parts will be described below. A / D conversion input port A which is the A / D conversion input section of the microcomputer 2
D1 is connected to the ground via a series circuit of resistors 27 and 28, and the common connection point of the resistors 27 and 28 is connected to the control power supply Vc via the temperature sensor 4a composed of, for example, a thermistor. The temperature sensor 4a is arranged to detect the temperature inside the cooking chamber.

Similarly, the A / D conversion input port AD2, which is the A / D conversion input section of the microcomputer 2, is connected to the ground via the series circuit of the resistors 29 and 30, and the common connection point of the resistors 29 and 30. Is connected to the control power supply Vc via the weight sensor 4b. The weight sensor 4b detects the weight of the food placed on the turntable. The output ports CLK2 and CS2 of the microcomputer 2 are connected to the input terminals of the test apparatus 10, respectively. Others have the same configuration as the second embodiment, but in FIG. 8, only the portion according to the third embodiment is shown.

Next, the operation of the third embodiment will be described with reference to FIGS.
The description will also be made with reference to. The operation switch E of the test apparatus 10 is a switch for testing the A / D conversion input port AD1, and when the operation switch E is turned on by a momentary operation, the test apparatus 10 inputs the input port DA.
Data D7 is given to TA. Further, the operation switch F is a switch for testing the A / D conversion input port AD2, and the test apparatus 10 applies the data D8 to the input port DATA when the operation switch F is turned on by the momentary operation. Has become.

FIG. 9 shows a flow chart of the control contents of the microcomputer 2 in the part related to the hardware test. This flow chart is obtained by adding steps S16 to S19 after step S15 of the flow chart shown in FIG. Is. In FIG. 9, first, similarly to the first embodiment, when the test switch of the test apparatus 10 is turned on, a high level signal is given to the input port CS of the microcomputer 2, and the process proceeds to step S2. Here, when the operation switch E of the test apparatus 10 is turned on, the transmission data D7 is confirmed at the input port DATA (see FIG. 10A), and the process proceeds to step S3.

Since the data given to the input port DATA is D7, the microcomputer 2 determines "NO" in the subsequent determination steps S3, S5, S7, S9, S12 and S14, and "data = Then, the process proceeds to determination step S16 of "D7?" Then, since "YES" is determined in the determination step S16, the process proceeds to the next "read AD1 and output to DATA2" processing step S17.

In processing step S17, the microcomputer 2 sets the voltage level applied to the A / D conversion input port AD1 according to the voltage value output by the temperature sensor 4a based on the temperature in the cooking chamber to A / D (not shown). A in the D conversion input section
When the / D conversion is started and read, the read voltage level A / D conversion result D7 ′ is output as serial data to the output port DATA2 as a test result signal (see FIG. 10D). At this time, the microcomputer 2 sends the serial data of the test result signal to the output port CLK2.
1-bit is output to the output port DATA2 in synchronism with the rising edge of the clock signal given to the input port, and as shown in FIGS. A signal that becomes high level for a moment is given to the port CS2 to notify the test apparatus 10 that the data transmission is completed. Then, the microcomputer 2 shifts to steps S1 and S2,
Wait for the next transmission data to be confirmed.

Thus, the test apparatus 10 has the output port D
The display unit 10a is caused to perform display according to the level of the signal output to the ATA2. For example, the value of the A / D conversion result D7 'is displayed on a liquid crystal display panel (not shown).

Next, when the operation switch F of the test apparatus 10 is turned on, the transmission data D8 is confirmed at the input port DATA (see FIG. 10A), and the process proceeds to step S3. Then, since the data given to the input port DATA is D8, the microcomputer 2 determines "NO" in the subsequent determination steps S3, S5, S7, S9, S12, S14 and S16, and "data = D8". ? "
The determination step S18 is moved to. Then, in the determination step S18, since the microcomputer 2 determines "YES", the process proceeds to the next "read AD2 and output to DATA2" processing step S19.

In processing step S19, the microcomputer 2 outputs the voltage applied to the A / D conversion input port AD2 in accordance with the voltage value output by the weight sensor 4b based on the weight of the food placed on the turntable. When the level is read by starting the A / D conversion in an A / D conversion input section (not shown), the read voltage level A / D conversion result D8 '
Is output as serial data to the output port DATA2 as a test result signal (see FIG. 10D).
Then, the process proceeds to steps S1 and S2, and waits until the next transmission data is confirmed. Thus, the test apparatus 10
In accordance with the level of the signal output to the output port DATA2, the A / D conversion result D is displayed on the liquid crystal display panel of the display unit 10a.
Display a value of 8 '.

As described above, according to the third embodiment, when the microcomputer 2 receives the transmission data D7 or D8 given to the input port DATA when the operation switch E or F of the test apparatus 10 is turned on. , A / D conversion of the voltage level applied to the A / D conversion input port AD1 or AD2 is read according to the transmission data, and the A / D conversion result of the read voltage level is read as a test result signal. Is output to the output port DATA2. Moreover, the test apparatus 10 is connected to the output port DA.
The value of the A / D conversion result output to TA2 is displayed on the display unit 10
The liquid crystal display panel of a is configured to display.

Therefore, it is possible to easily test the state of the thermistor 4a or the weight sensor 4b connected to the A / D conversion input port AD1 or AD2 by the transmission data provided by the test apparatus 10, and also the test result. Can be easily confirmed by looking at the liquid crystal display panel of the display unit 10a.

11 and 12 show a fourth embodiment of the present invention. The same parts as those in the first embodiment are designated by the same reference numerals and the description thereof will be omitted. Only different parts will be described below. The microcomputer 2 has an input port KI1 which is an operation signal input port.
To KI5, and input keys 3c to 3g of the input key circuit 3 are connected to the input ports KI1 to KI5.
The control power supply Vc is connected via. Then, among those input ports, the input ports KI1 to KI3
Is also used as the input ports DATA, CLK and CS in the first embodiment, and the test apparatus 10 is connected in the same manner as in the first embodiment. The other structure is the same as that of the first embodiment.

Next, the operation of the fourth embodiment will be described with reference to FIG. In FIG. 12 showing a flow chart of control contents, the microcomputer 2 firstly displays the “input key 3c
And 3e simultaneous ON operation? In the decision step R1 of “,” the input ports KI1 and KI3 are scanned,
It is determined whether or not the input keys 3c and 3e are simultaneously turned on. The simultaneous ON operation of the input keys 3c and 3e is a special operation which is not assigned as an operation of the microwave oven 1 which is usually performed by the user.

In the judgment step R1, the input key 3c
If 3 and 3e are not turned on at the same time and it is determined to be "NO", the process proceeds to the "normal operation" process step R5,
Normal heating and cooking as the microwave oven 1 is performed.
Further, in the judgment step R1, the input keys 3c and 3
If e is turned on at the same time and it is determined to be "YES", the microcomputer 2 determines that the special mode operation of the input key is performed and the microcomputer 2 shifts to the test mode, and the input port K
I1, KI2, and KI3 are input ports DATA, CLK, and C that are test signal input ports in the first embodiment.
At the same time as switching to the function as S, the process proceeds to the determination step R2 of "data confirmed?".

In the judgment step R2, as in the first embodiment, by referring to the input port KI3 (CS), the process waits until the transmission data from the test apparatus 10 is fixed. When the input port KI3 becomes low level and it is judged "YES" in the judgment step R2, the routine proceeds to a judgment step R3 of "normal key input request?".

In the judgment step R3, the microcomputer 2
Judges whether or not the data transmitted from the test device 10 is a data requesting a normal key input from the key input circuit 3, that is, a data requesting a transition from the test mode to a normal cooking operation. To do. For example, when the test mode release switch (not shown) of the test apparatus 10 is turned on, the above-mentioned normal key input request data is transmitted, and if “YES” is determined in the determination step R3, the process proceeds to step R1 to input the input key. If there is no special operation,
Further, the process proceeds to step R5 to perform normal operation.

On the other hand, when the data transmitted from the test apparatus 10 is not data requesting a normal key input, the operation switch A or B of the test apparatus 10 is turned on, as in the first embodiment. As a result, the transmission data D1 or D3 is transmitted, and if it is judged "NO" in the judgment step R3, "a test operation according to the data"
Process step R4, and as in the first embodiment,
The hardware is tested by controlling the I / O ports according to the transmitted data.

After that, the routine goes to Step R2, waits for the transmission data to be fixed again, and goes to Step R3. Then, if the transmission data is any of D1 to D8, the test operation is continuously executed, and if the transmission data is data requesting a normal key input, steps R1 and R5 are performed.
Then, the normal cooking operation is performed.

As described above, according to the fourth embodiment, in the microcomputer 2, when the input keys 3c and 3e connected to the operation signal input ports KI1 and KI3 are simultaneously turned on,
Since the input ports KI1, KI2, and KI3 are used by switching to the functions of the test signal input ports DATA, CLK, and CS, the number of input ports of the microcomputer 2 for connecting the test apparatus 10 is not increased, and the microcomputer 2 Can be made compact.

FIGS. 13 and 14 show a fifth embodiment of the present invention. The same parts as those of the third embodiment are designated by the same reference numerals and the description thereof will be omitted. Only different parts will be described below. In FIG. 13 showing the electrical configuration, output ports DATA2 and CLK2 which are serial data output ports of the microcomputer 2 are shown.
And CS2 are connected to the input terminals of the shift register 31 and the input terminals of the test apparatus 10, respectively. The shift register 31 is provided as an expansion output port of the microcomputer 2 and has a plurality of output ports, for example, four. This output port has
Although not all shown, loads to which a drive signal is applied based on the data applied to the shift register 31 are connected.

One of the four output ports 31a
Is connected to ground through a series circuit of resistors 32 and 33, and the common connection point of the resistors 32 and 33 is connected to the base of the transistor 34. Transistor 3
The emitter of 4 is connected to earth, and the collector is
Drive power supply Vp via the excitation coil 35a of the relay 35
It is connected to the.

The AD conversion input port A of the microcomputer 2
D3 is connected to ground via a series circuit of resistors 36 and 37, and the common connection point of resistors 36 and 37 is connected to one terminal of a gas sensor 4c that detects the water vapor concentration in the cooking chamber. The other terminal of the gas sensor 4c is connected to the control power source V via the normally open contact 35b of the relay 35.
connected to c. The other parts have the same configuration as the third embodiment, but only the parts relating to the fifth embodiment are shown.

Next, the operation of the fifth embodiment will be described with reference to FIG. When the test device 10 supplies the microcomputer 2 with transmission data for performing a read test of the input port AD3 via the input ports DATA, CLK, and CS, the microcomputer 2 causes the A / D conversion input unit to perform A / D conversion. Start conversion and output port DATA
2, the data D9 is output to CLK2 and CS2 as serial data (see FIG. 14A).

This transmission data D9 is stored in the shift register 3
1 is given to the shift register 31, and the shift register 31
When the transmission data D9 is read bit by bit in synchronization with the clock signal output to the output port CLK2 and the last 1 bit is output, the output port CS2 becomes high level for a moment (FIG. 14 (c), ), And validate the data D9 taken in. Also, the test device 1
When 0, the transmission data when the output port CS2 becomes high level for a moment is not taken in internally.

This data D9 is output to the output port 3
The data is set to give a high level signal to 1a, and therefore the transistor 34 is turned on. When the transistor 34 is turned on, the relay 35
The exciting coil 35a is energized, and the normally open contact 35b is turned on (closed). Then, energization of the gas sensor 4c is started by the control power supply Vc, and a voltage level according to the water vapor concentration in the cooking chamber is applied to the input port AD3.

Then, the microcomputer 2 transmits the transmission data D which is the A / D conversion result of the voltage level and is the test result signal.
10 is output as serial data to the output port DATA2 (see FIG. 14A). This transmission data D
10 is data given to the test apparatus 10,
Unlike the case of the transmission data D9, the microcomputer 2 maintains the output port CS2 at the low level for a moment, not at the high level when the last 1 bit is output. by this,
The test apparatus 10 determines that the transmission data D10 has been transmitted to itself and fetches it, and the shift register 31 does not validate the transmission data D10.

As described above, according to the fifth embodiment, the microcomputer 2 obtains the A / D conversion result of the voltage value given to the input port AD3 according to the water vapor concentration in the cooking chamber detected by the gas sensor 4c. Since the output is output to the output port DATA2 to which the shift register 31 provided as the extended output port of the microcomputer 2 and the test apparatus 10 are connected, it is not necessary to separately provide a port for outputting the test result, and the microcomputer 2 can be downsized. Can be configured. According to the fifth embodiment, the function of the hardware connected to the input port AD3 is tested and the function of the load connected to the shift register 31 is also tested by performing the above-described test operation. You can

FIGS. 15 and 16 show a sixth embodiment of the present invention. The same parts as those of the second and third embodiments are designated by the same reference numerals and the description thereof will be omitted. Only the different parts will be described below. To do. In FIG. 15 showing the electrical configuration, the input key IN3 is connected to the input port IN1 of the microcomputer 2 as in the second embodiment.
A signal level according to the on / off operation of a is provided, and the voltage level corresponding to the food weight detection result of the weight sensor 4b is applied to the input port AD2 of the microcomputer 2 as in the third embodiment. Is configured to be given. The other structure is the same as that of the second and third embodiments.

FIG. 16 shows a display state by the display device 5, and FIG. 16 (a) shows a state in which cooking time (cooking information) at the time of normal heating and cooking operation is displayed.
Further, in FIG. 16B, when the hardware test is executed as in the third embodiment, the weight sensor 4b supplies the input port AD2 of the microcomputer 2 in accordance with the weight of the food on the turntable. This is a state in which the A / D conversion result of the existing voltage level is displayed.

16C and 16D show the second
As in the embodiment, when the hardware test is executed, the input port IN1 is changed according to the operation state of the input key 3a.
16 (c) shows the case of the low level (L), and FIG. 16 (d) shows the case of the high level (H).

As described above, according to the sixth embodiment, the microcomputer 2 executes the hardware test so that the level of the signal applied to the input port IN1 or the voltage level A applied to the input port AD2 is A. Since the / D conversion result is displayed on the display unit 5 which normally displays the cooking time and the like during the heating and cooking operation, the display on the display unit 5 is viewed without providing a display unit for hardware test. As a result, the execution result of the hardware test can be confirmed.

The present invention is not limited to the embodiments described above and shown in the drawings, but the following modifications are possible. The number of input ports is not limited to two, IN1 and IN2, and may be changed as appropriate. Further, the number of A / D conversion input ports is not limited to three, AD1 to AD3, and may be changed as appropriate.

In the flowchart, the order of each of the determination steps for determining whether the data is D1 to D8 and the processing steps to be executed based on the determination result are not limited to those shown in the figure, and may be changed as appropriate. The heating cooker is not limited to the microwave oven 1, and the heater 9 may be omitted to use the microwave oven. Further, the magnetron 7 may be omitted and an electronic oven may be used.

The test signal input port may be composed of a parallel bus. The number of input keys 3a to 3g may be changed appropriately. In the fourth embodiment, the operation signal input ports which are also used as the test signal input ports are KI1 to KI3.
However, it may be changed as appropriate. Further, the configuration of switching a part of the operation signal input port to the test signal input port in the fourth embodiment may be applied to the second, third and fifth embodiments.

In the fifth embodiment, instead of transmitting the A / D conversion result of the voltage value applied to the A / D conversion input port AD3 as a test result signal, it is applied to either the input port IN1 or IN2. The level (input state) of the existing signal may be transmitted as the test result signal. The number of output ports of the shift register 31 is not limited to four and may be changed as appropriate. Further, the load driven by the drive circuit connected to the output port of the shift register 31 may not be driven when a hardware test is performed. The cooking information displayed on the display unit 5 is not limited to cooking time, but may be a cooking menu or heating intensity. Also,
The display unit 5 is not limited to the 7-segment LED, and may be a liquid crystal panel or the like.

[0081]

Since the present invention is as described above,
It has the following effects. According to the heating cooker of claim 1, the control means allows the operator to operate the test switch.
A test mode switching signal can be output based on this , and the output of the output port specified by the test means that can selectively output a plurality of types of test signals is controlled. It is possible to reduce the capacity of the test program stored in, and to perform the test operation of the hardware connected to the output port in the order designated by the test means.

According to the heating cooker of the second aspect, the control means can output a signal for switching the test mode based on the operation of the test switch by the operator, and
Since the input state of the designated input port is output to the outside as a test result signal by the test means capable of selectively outputting a plurality of types of test signals, the state of the hardware connected to the designated input port is tested. be able to.

According to the cooking device of the third aspect, the control means causes the A / D conversion input section corresponding to the input port designated by the test means to start the A / D conversion, and the A / D conversion. Since the conversion result is output to the outside as a test result signal, it is possible to test even the hardware connected to the designated input port outputs an analog signal.

According to the cooking device of the fourth aspect, when the control means determines that the operation signal output from the operation means indicates a special operation, a part of the operation signal input port is switched as a test signal input port. Since it is used, it is not necessary to provide a test signal input port independently, and the control means can be made compact.

According to the cooking device of the fifth aspect, the control means outputs the input state of the input port or the A / D conversion result to the serial data output port as a test result signal. Therefore, an output dedicated to the test result signal is provided. It is not necessary to provide a port, and the load driven by the shift register can be tested.

According to the cooker of the sixth aspect, the control means causes the display means to display the input state of the input port designated by the test signal or the A / D conversion result. It can also be used to display.

According to the heating cooker of the seventh aspect, the test means is provided with the display section for displaying the content of the input test result signal. Therefore, the test result can be confirmed by the test means.

[Brief description of drawings]

FIG. 1 is a diagram showing a main part of an electrical configuration in a first embodiment of the present invention.

FIG. 2 is a block diagram showing the overall electrical configuration.

[Fig. 3] Flow chart of control contents

FIG. 4 is a timing chart.

FIG. 5 is a view corresponding to FIG. 1 in the second embodiment of the present invention.

FIG. 6 is a view corresponding to FIG.

FIG. 7 is a view corresponding to FIG.

FIG. 8 is a view corresponding to FIG. 1 in a third embodiment of the present invention.

FIG. 9 is a view corresponding to FIG.

FIG. 10 is a view corresponding to FIG.

FIG. 11 is a diagram corresponding to FIG. 1 in a fourth embodiment of the present invention.

FIG. 12 is a view corresponding to FIG.

FIG. 13 is a diagram corresponding to FIG. 1 in a fifth embodiment of the present invention.

FIG. 14 is a view corresponding to FIG.

FIG. 15 is a view corresponding to FIG. 1 in a sixth embodiment of the present invention.

FIG. 16 is a diagram showing display contents of a display unit.

[Explanation of symbols]

1 is a microwave oven (heating cooker), 2 is a microcomputer (control means), 3 is an input key circuit (operating means), 5 is an indicator (display means), 7 is a magnetron (heating means), and 9 is a heater. (Heating means), 10 is a test device (test means), 10a is a display unit, and 31 is a shift register.

Claims (7)

(57) [Claims] 1. A heating cooker that performs heating and cooking by controlling the heating means by the control means, wherein the control means allows the operator to operate a test switch.
A test mode switching signal can be output based on the test mode, and a test signal input port connected to a test means capable of selectively outputting a plurality of types of test signals is provided, and the switching signal is received and tested. A heating cooker characterized by controlling the output of the output port designated by the test signal when the test signal is received in the state of being switched to the mode. 2. A heating cooker that performs heating and cooking by controlling the heating means by the control means, wherein the control means allows the operator to operate a test switch.
A test mode switching signal can be output based on the test mode, and a test signal input port connected to a test means capable of selectively outputting a plurality of types of test signals is provided, and the switching signal is received and tested. A heating cooker characterized in that, when the test signal is received in a state of being switched to the mode, the input state of the input port designated by the test signal is output to the outside as a test result signal. 3. The control means comprises an A / D conversion input section,
The A / D conversion input section corresponding to the input port designated by the test signal output by the test means is caused to start A / D conversion, and the A / D conversion result is output to the outside as a test result signal. The heating cooker according to claim 2, which is characterized in that. 4. An operation signal input port comprising a plurality of keys, the operation means outputting an operation signal for cooking according to an operation of the keys, the control means being an operation signal input port to which the operation means is connected. 4. When it is determined that the operation signal output by the operation means indicates a special operation, a part of the operation signal input port is switched and used as a test signal input port. The heating cooker according to any one of claims. 5. A shift register which is connected to the serial data output port of the control means and outputs a drive signal to a plurality of loads as an extended output port, wherein the control means displays an input state of the input port or an A / D conversion result. The heating cooker according to any one of claims 2 to 4, wherein a test result signal is output to the serial data output port. 6. A display means for displaying cooking information, wherein the control means causes the display means to display an input state of an input port designated by a test signal or an A / D conversion result. Item 6. A heating cooker according to any one of items 2 to 5. 7. The test means is provided with a display section for receiving the test result signal of the control means and displaying the content of the input test result signal.
The cooking device according to any one of 1 to 5.