JP3453662B2 - Polishing method - Google Patents

Polishing method

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Publication number
JP3453662B2
JP3453662B2 JP20917094A JP20917094A JP3453662B2 JP 3453662 B2 JP3453662 B2 JP 3453662B2 JP 20917094 A JP20917094 A JP 20917094A JP 20917094 A JP20917094 A JP 20917094A JP 3453662 B2 JP3453662 B2 JP 3453662B2
Authority
JP
Japan
Prior art keywords
polishing
substrate
polished
plate
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP20917094A
Other languages
Japanese (ja)
Other versions
JPH0852647A (en
Inventor
政志 大村
Original Assignee
富士写真光機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 富士写真光機株式会社 filed Critical 富士写真光機株式会社
Priority to JP20917094A priority Critical patent/JP3453662B2/en
Publication of JPH0852647A publication Critical patent/JPH0852647A/en
Application granted granted Critical
Publication of JP3453662B2 publication Critical patent/JP3453662B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Grinding Of Cylindrical And Plane Surfaces (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、中央に非研磨対象表面
を有する円盤状基板の研磨方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for polishing a disk-shaped substrate having a non-polishing target surface in the center.

【0002】[0002]

【従来の技術】平面板、レンズ等の光学部品の研磨は古
くから行なわれており、ピッチ皿、パッド皿などのみが
き皿を用い、酸化セリウムなどの研磨剤を用いて研磨が
行なわれている。
2. Description of the Related Art Polishing of optical components such as flat plates and lenses has been performed for a long time, and polishing is performed by using a polishing plate such as a pitch plate or a pad plate and an abrasive such as cerium oxide. .

【0003】これらの研磨は、基板表面とみがき皿とを
相対的に運動させつつ、みがき皿のみがき面と基板表面
との間に、水に懸濁した研磨剤を供給して磨く。具体的
には、ある一瞬をとらえると、みがき皿で覆われること
なく露出している基板表面に研磨剤を供給すると、いず
れその面が磨かれるとともに研磨剤が基板表面に行きわ
たり、最終的には研磨対象とする基板の全表面が研磨さ
れることになる。
In these polishings, while polishing the substrate surface and the polishing plate relative to each other, a polishing agent suspended in water is supplied between the polishing surface of the polishing plate and the substrate surface for polishing. Specifically, if you capture a moment, if you supply an abrasive to the exposed substrate surface without being covered with a polishing dish, that surface will eventually be polished and the abrasive will spread to the substrate surface, eventually Will polish the entire surface of the substrate to be polished.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、基板の
全表面が研磨対象表面ではなく、研磨してはいけない
面、研磨しない方が好ましい面、あるいは研磨できない
面が存在する場合がある。この一例として中央部に貫通
穴を有する円盤状基板がある。このようなドーナツ円盤
状基板を従来通りに全表面を研磨しようとすると、中央
貫通穴近傍での研磨の均一性に欠ける。また、CD盤
(コンパクトディスク)のように中央貫通穴の周囲が段
差をもって突出している場合には、この突出部が障害と
なり、その更に外周部の一段低い記録層の表面基板を研
磨することは極めて困難である。
However, the entire surface of the substrate is not the surface to be polished, and there may be a surface that should not be polished, a surface that should not be polished, or a surface that cannot be polished. As an example of this, there is a disk-shaped substrate having a through hole in the central portion. When it is attempted to polish the entire surface of such a donut disk-shaped substrate in the conventional manner, the uniformity of polishing in the vicinity of the central through hole is lacking. Further, when the periphery of the central through hole is projected with a step like a CD disk (compact disk), this protruding portion becomes an obstacle, and it is not possible to polish the surface substrate of the recording layer which is one step lower than the outer peripheral portion. It's extremely difficult.

【0005】[0005]

【課題を解決するための手段】そこで本発明者らは、上
記の如きドーナツ円盤状の基板のように中央部に非研磨
対象表面を有する円盤状基板の研磨方法について鋭意検
討した結果、みがき皿にみがき面を構成しない凹部を設
け、この凹部に非研磨対象表面を収納してこの収納部位
を研磨することなく、研磨対象表面をみがき面で研磨す
ることにより、上記不都合を解消して研磨しうることを
見い出した。
The inventors of the present invention have made extensive studies on a method for polishing a disk-shaped substrate having a non-polishing target surface in the center such as the donut disk-shaped substrate as described above, and as a result, a polishing plate. By providing a concave portion that does not form a polishing surface, and storing the non-polishing target surface in this concave portion and polishing the storage target surface with the polishing surface without polishing the storage area, the above disadvantage is eliminated and the polishing is performed. I found something to say.

【0006】すなわち、本発明の研磨方法は、中央に非
研磨対象表面を有する円盤状の被研磨基板の表面と、み
がき皿のみがき面との間に液状の研磨剤を供給し、該基
板を回転させると共に、みがき皿を該基板の面方向に往
復運動させみがき皿の外周側に該基板の研磨対象表面の
一部が露出するようにして、研磨剤により該基板を研磨
するに際し、
That is, according to the polishing method of the present invention, a liquid polishing agent is supplied between the surface of a disk-shaped substrate to be polished having a non-polishing target surface in the center and the polishing surface of a polishing dish, and the substrate is polished. While rotating, the polishing dish is reciprocated in the surface direction of the substrate so that a part of the polishing target surface of the substrate is exposed on the outer peripheral side of the polishing dish, and when polishing the substrate with an abrasive,

【0007】みがき皿として、みがき面を構成しない凹
部を有するみがき皿を用い、この凹部内に前記非研磨対
象表面を収納した状態で、これら非研摩対象表面を研磨
することなく、みがき皿の外周側に露出する研摩対象表
面に研磨剤を供給して研磨対象表面全体を研磨すること
を特徴とする。
As a polishing plate, a polishing plate having a recess that does not form a polishing surface is used. With the non-polishing target surface housed in the recess, the outer periphery of the polishing plate is polished without polishing the non-polishing target surface. A polishing agent is supplied to the surface to be polished exposed to the side to polish the entire surface to be polished.

【0008】上記の研磨方法は、中央に貫通穴を有する
場合や、中央部が段差を形成するようにして研磨対象表
面から突出している場合にも効果的であり、この突出段
差部をみがき皿の凹部に収納して研磨することにより、
この突出段差部に邪魔されることなく研磨対象表面を研
磨することができる。
The above-described polishing method is also effective when the through hole is formed in the center or when the center portion projects from the surface to be polished so as to form a step. By storing it in the concave part of and polishing
The surface to be polished can be polished without being disturbed by the protruding step portion.

【0009】また、みがき皿の凹部に非研磨対象表面が
収納される範囲でしかみがき皿を往復運動させることが
できないので、みがき皿の移動ストローク長が短かくな
る傾向があり、研磨時にみがき皿から露出している基板
面積が小さくなり、研磨剤の供給が不十分になりやす
い。そこで、本発明では、みがき皿からの基板露出部に
研磨剤を供給することに加え、みがき皿の凹部に透孔を
設け、この透孔を通して研磨剤液を基板表面に供給する
ことが望ましい。基板表面と透孔開口部との間には間隙
が存在するため、研磨剤液はスムーズに基板表面に供給
される。
Further, since the polishing plate can be reciprocated only within the range where the non-polishing target surface is accommodated in the recess of the polishing plate, the movement stroke length of the polishing plate tends to be short, and the polishing plate during polishing tends to be short. The area of the substrate exposed from the area becomes small, and the supply of the abrasive tends to be insufficient. Therefore, in the present invention, in addition to supplying the polishing agent to the exposed portion of the substrate from the polishing dish, it is desirable to provide a through hole in the recess of the polishing dish and supply the polishing agent solution to the substrate surface through the through hole. Since there is a gap between the surface of the substrate and the opening of the through hole, the abrasive liquid is smoothly supplied to the surface of the substrate.

【0010】[0010]

【実施例】図1は、本発明の研磨方法の実施例を示す説
明図である。また、図2は、図1の分解斜視図である。
但し、研磨治具は離面側から示し、正規の位置のものは
斜視図中に想像線で示してある。また、研磨剤供給ノズ
ル53は図示を省略してある。
EXAMPLE FIG. 1 is an explanatory view showing an example of the polishing method of the present invention. 2 is an exploded perspective view of FIG.
However, the polishing jig is shown from the release side, and the one in the proper position is shown by an imaginary line in the perspective view. Further, the abrasive supply nozzle 53 is not shown.

【0011】回転可能な基板ホルダー21のホルダーセ
ット部21aに基板11(被研磨基板)がセットされて
いる。基板11は、全体として平板型のドーナツ円盤状
を示し、中央部に貫通穴11bを、また、その周囲に凸
出した段差部11aを有し、テーパ部を経て表面積の大
部分を占める平坦部11cに連なっている。この表面部
のうち、貫通穴11b、段差部11a、テーパ部、テー
パ部極く近傍の平坦部11cが非研磨対象表面であり、
残余の平坦部11cの大部分が、研磨対象表面である。
The substrate 11 (substrate to be polished) is set on the holder setting portion 21a of the rotatable substrate holder 21. The substrate 11 has a flat plate type donut disk shape as a whole, has a through hole 11b in the central portion, and a step portion 11a protruding around the through hole 11b, and a flat portion occupying most of the surface area through the tapered portion. It is connected to 11c. Of this surface portion, the through hole 11b, the step portion 11a, the taper portion, and the flat portion 11c in the immediate vicinity of the taper portion are non-polishing target surfaces,
Most of the remaining flat portion 11c is the surface to be polished.

【0012】基板11の素材は、光学ガラス等のガラ
ス、ポリカーボネート、アクリル樹脂等のプラスチック
などがあるが、特に限定されるものではない。また、本
発明が研磨対象とする基板の形状は、図示したものに限
定されず、例えば、段差部11aが存在せずに平坦部1
1cと貫通穴11bとからなる典型的なドーナツ円盤状
のものでもよく、貫通穴11bが存在せず段差部11a
のみを有するものでもよく、あるいは段差部11aおよ
び貫通穴11bの双方を有さず何らかの理由で中央部が
非研磨対象表面であればよく、また、両面あるいは片面
が球面あるいは非球面のものでもよい。
The material of the substrate 11 includes glass such as optical glass, plastic such as polycarbonate and acrylic resin, but is not particularly limited. Further, the shape of the substrate to be polished by the present invention is not limited to that shown in the drawing, and for example, the flat portion 1 without the step portion 11a is present.
It may be a typical donut-shaped disc composed of 1c and a through hole 11b, in which the through hole 11b does not exist and the step portion 11a is formed.
Only, or the central portion may be a non-polishing target surface for some reason without having both the step portion 11a and the through hole 11b, and both surfaces or one surface may be spherical or aspherical. .

【0013】基板11上には、研磨治具31(みがき
皿)が載置される。研磨治具31は、駆動軸41からの
駆動力を受けるための治具側係合穴31bを上面に有
し、一方、下面側が一部を除いてみがき面を形成する。
研磨治具31の下面側には、その中央部に凹部31aを
有し、この凹部31aを除く部分にポリウレタンなどか
らなる研磨パッド33が固定されている。なお、図1、
2に示した実施例では、研磨治具31自体の下面中央部
を刻設して凹部31aを形成したが、研磨治具31自体
の下面は基板の面曲率と合わせた形状とし、研磨パッド
33としてリング状のものを用い、研磨パッド33の厚
みによって、みがき皿の凹部を形成するようにしてもよ
い。
On the substrate 11, a polishing jig 31 (polishing plate) is placed. The polishing jig 31 has a jig-side engaging hole 31b for receiving a driving force from the drive shaft 41 on its upper surface, while the lower surface side forms a polishing surface except for a part thereof.
On the lower surface side of the polishing jig 31, there is a recess 31a in the center thereof, and a polishing pad 33 made of polyurethane or the like is fixed to the portion excluding the recess 31a. Note that FIG.
In the embodiment shown in FIG. 2, the central portion of the lower surface of the polishing jig 31 itself is engraved to form the recess 31a. However, the lower surface of the polishing jig 31 itself has a shape that matches the surface curvature of the substrate, and the polishing pad 33 is used. Alternatively, a ring-shaped one may be used as the concave portion of the polishing plate depending on the thickness of the polishing pad 33.

【0014】研磨治具31の凹部31aには、研摩治具
31の上面から下面に貫ぬき基板11の表面に向けて開
口する透孔31cを有する。研磨に際しては、駆動軸4
1の軸側係合杆41aを治具側係合穴31bに嵌め込
み、研磨剤液供給ノズル51から研磨剤液53を供給し
つつ、基板ホルダー21をそのホルダー回転軸21aに
より回転させ、一方、駆動軸41を基板11の面方向に
沿って往復運動させる。研磨治具31は、軸側係合杆3
1bの囲りを回転可能に駆動軸41に係合・連結されて
いるので、駆動軸41により基板11の直径方向に移送
されつつ、摩擦により基板ホルダー21の回転力が伝達
されて研磨治具31が回転され、研磨パッド33および
研磨剤液53により基板11の表面が研磨される。
The recess 31a of the polishing jig 31 has a through hole 31c which is open from the upper surface to the lower surface of the polishing jig 31 toward the front surface of the substrate 11. Drive shaft 4 for polishing
The shaft side engaging rod 41a of No. 1 is fitted into the jig side engaging hole 31b, and while supplying the abrasive liquid 53 from the abrasive liquid supply nozzle 51, the substrate holder 21 is rotated by the holder rotating shaft 21a, while The drive shaft 41 is reciprocated along the surface direction of the substrate 11. The polishing jig 31 includes the shaft side engaging rod 3
Since the surroundings of 1b are rotatably engaged and connected to the drive shaft 41, the rotational force of the substrate holder 21 is transmitted by friction while being transferred in the diameter direction of the substrate 11 by the drive shaft 41, and the polishing jig is then transferred. 31 is rotated, and the surface of the substrate 11 is polished by the polishing pad 33 and the polishing agent liquid 53.

【0015】基板11の貫通穴11b、段差部11aを
中心とする非研磨対象表面は、研磨治具31の凹部31
a内に収納されており駆動軸41の往復運動のストロー
ク長を調整することにより、常に非研磨対象表面を治具
凹部31a内に位置せしめることができ、非研磨対象表
面が研磨パッドによって研磨されることがない。
The non-polishing target surface centering on the through hole 11b and the stepped portion 11a of the substrate 11 is the recess 31 of the polishing jig 31.
The non-polishing target surface can be always positioned in the jig concave portion 31a by adjusting the stroke length of the reciprocating motion of the drive shaft 41 housed in a, and the non-polishing target surface is polished by the polishing pad. Never.

【0016】研磨剤液53は、1つには、基板11の研
磨治具31で覆われていない面(図1中の領域A)に供
給され、研磨パッド33による研磨に供される。また、
更に図1、2に示した実施例では、研磨治具31の透孔
31cから基板11の表面に研磨剤液53が供給され
る。透孔31cの開口面と基板11の表面との間は密着
せず充分な空隙を有するので、研磨剤液53がスムーズ
に基板11の表面に供給される。
The polishing agent liquid 53 is supplied to the surface of the substrate 11 which is not covered with the polishing jig 31 (area A in FIG. 1) and is used for polishing by the polishing pad 33. Also,
Further, in the embodiment shown in FIGS. 1 and 2, the polishing agent liquid 53 is supplied to the surface of the substrate 11 from the through holes 31c of the polishing jig 31. Since the opening surface of the through hole 31c and the surface of the substrate 11 are not in close contact with each other and have a sufficient gap, the polishing agent liquid 53 is smoothly supplied to the surface of the substrate 11.

【0017】中央部に非研磨対象表面を有する円盤状の
基板11の研磨においては、この非研磨対象表面を常に
治具凹部31aに収納するようにして研磨する必要があ
るため、基板11の面方向へ移動する駆動軸41のスト
ローク長は自ずと制限を受け、そのため、研磨剤液53
が供給される領域Aの面積も制約されて十分な研磨剤液
53の供給が困難な場合もある。これに対して図1、2
に示した実施例では透孔31cからも研磨剤液53が供
給されるので、基板11表面への十分な研磨剤液53の
供給が可能となり、研磨時間の短縮、研磨品質の更なる
向上が可能となる。
In polishing the disk-shaped substrate 11 having the non-polishing target surface in the center, it is necessary to polish the disc-shaped substrate 11 so that the non-polishing target surface is always housed in the jig recess 31a. The stroke length of the drive shaft 41 moving in the direction is naturally limited, and therefore, the abrasive liquid 53
In some cases, the area of the region A to which is supplied is limited, and it may be difficult to supply the sufficient polishing agent liquid 53. On the other hand, Figs.
In the embodiment shown in (1), since the polishing agent liquid 53 is also supplied from the through holes 31c, it is possible to supply the polishing agent solution 53 to the surface of the substrate 11 sufficiently, which shortens the polishing time and further improves the polishing quality. It will be possible.

【0018】なお、本発明では研磨対象とする基板11
の種類、材質、用途等は問わないが、図1、2はコンパ
クトディスク(CD盤)を想定している。CD盤は使用
・取扱いにより表面にキズが生じることは避けられず、
これによりノイズの発生を招くが、本発明の研磨方法に
よれば、研磨対象表面のみを効率的に研磨して、キズを
消失させることができる。また、上述の実施例では、基
板11の上面を研磨する場合を示したが、基板ホルダー
21と研磨パッド33の位置関係を逆にして、基板11
の下面を研磨することもできる。
In the present invention, the substrate 11 to be polished is used.
The type, the material, the use, etc. of the disc are not limited, but FIGS. 1 and 2 assume a compact disc (CD disc). It is unavoidable that the CD disc will be scratched due to use and handling.
Although this causes noise, the polishing method of the present invention can efficiently polish only the surface to be polished to eliminate the scratches. Further, in the above-described embodiment, the case where the upper surface of the substrate 11 is polished has been shown, but the positional relationship between the substrate holder 21 and the polishing pad 33 is reversed and the substrate 11 is polished.
It is also possible to polish the lower surface of the.

【0019】[0019]

【発明の効果】請求項1に記載の本発明によれば、中央
に非研磨対象表面を有する円盤状の基板を、効率的に研
磨できる。また、請求項2に記載の本発明によれば、み
がき皿に設けた透孔を介して研磨剤を効率的に基板表面
に供給することができ、研磨時間の短縮、研磨品質の更
なる向上が可能となる。
According to the present invention as set forth in claim 1, it is possible to efficiently polish a disk-shaped substrate having a non-polishing target surface in the center. Further, according to the present invention as set forth in claim 2, the polishing agent can be efficiently supplied to the surface of the substrate through the through holes provided in the polishing plate, the polishing time can be shortened, and the polishing quality can be further improved. Is possible.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の研磨方法について示す断面図である。FIG. 1 is a cross-sectional view showing a polishing method of the present invention.

【図2】図1の分解斜視図である。FIG. 2 is an exploded perspective view of FIG.

【符号の説明】[Explanation of symbols]

11 基板 11a 段差部 11b 貫通穴 11c 平坦部 21 基板ホルダー 21a ホルダーセット部 21b ホルダー回転軸 31 研磨治具 31a 治具凹部 31b 治具側係合穴 31c 透孔 33 研磨パッド 41 駆動軸 41a 軸側係合杆 51 研磨剤液供給ノズル 53 研磨剤液 11 board 11a stepped portion 11b through hole 11c Flat part 21 board holder 21a Holder set part 21b Holder rotation axis 31 Polishing jig 31a jig recess 31b Jig side engaging hole 31c through hole 33 polishing pad 41 drive shaft 41a Shaft side engaging rod 51 Abrasive liquid supply nozzle 53 Abrasive liquid

───────────────────────────────────────────────────── フロントページの続き (58)調査した分野(Int.Cl.7,DB名) B24B 1/00 B24B 7/04 B24B 7/22 - 7/24 B24B 13/00 B24B 37/00 B24B 37/04 ─────────────────────────────────────────────────── ─── Continuation of front page (58) Fields surveyed (Int.Cl. 7 , DB name) B24B 1/00 B24B 7/04 B24B 7 /22-7/24 B24B 13/00 B24B 37/00 B24B 37 / 04

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 中央に非研磨対象表面を有する円盤状の
被研磨基板の表面と、みがき皿のみがき面との間に液状
の研磨剤を供給し、該基板を回転させると共に、みがき
皿を該基板の面方向に往復運動させみがき皿の外周側に
該基板の研磨対象表面の一部が露出するようにして、研
磨剤により該基板を研磨するに際し、 みがき皿として、みがき面を構成しない凹部を有するみ
がき皿を用い、この凹部内に前記非研磨対象表面を収納
した状態で、これら非研摩対象表面を研磨することな
く、みがき皿の外周側に露出する研摩対象表面に研磨剤
を供給して研磨対象表面全体を研磨することを特徴とす
る円盤状基板の研磨方法。
1. A liquid abrasive is supplied between the surface of a disk-shaped substrate to be polished having a non-polishing target surface in the center and the polishing surface of a polishing plate, and the substrate is rotated while the polishing plate is removed. When polishing the substrate with an abrasive so that a part of the polishing target surface of the substrate is exposed to the outer peripheral side of the polishing plate by reciprocating in the surface direction of the substrate, the polishing surface does not constitute a polishing plate Using a polishing dish having a concave portion and supplying the polishing agent to the surface to be polished exposed on the outer peripheral side of the polishing dish without polishing the non-polishing target surface while the non-polishing target surface is housed in the concave portion A method for polishing a disk-shaped substrate, characterized by polishing the entire surface to be polished.
【請求項2】 前記みがき皿の凹部に透孔が設けられ、
該透孔を介してみがき面の内周側の基板表面にも研磨剤
を供給して研磨対象表面を研磨する請求項1に記載の研
磨方法。
2. A through hole is provided in the recess of the polishing plate,
The polishing method according to claim 1, wherein the polishing target surface is polished by supplying an abrasive to the substrate surface on the inner peripheral side of the polishing surface through the through holes.
JP20917094A 1994-08-10 1994-08-10 Polishing method Expired - Fee Related JP3453662B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20917094A JP3453662B2 (en) 1994-08-10 1994-08-10 Polishing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20917094A JP3453662B2 (en) 1994-08-10 1994-08-10 Polishing method

Publications (2)

Publication Number Publication Date
JPH0852647A JPH0852647A (en) 1996-02-27
JP3453662B2 true JP3453662B2 (en) 2003-10-06

Family

ID=16568497

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20917094A Expired - Fee Related JP3453662B2 (en) 1994-08-10 1994-08-10 Polishing method

Country Status (1)

Country Link
JP (1) JP3453662B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008200787A (en) * 2007-02-19 2008-09-04 Toppan Printing Co Ltd Surface polishing machine

Also Published As

Publication number Publication date
JPH0852647A (en) 1996-02-27

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