JP3395209B2 - Image signal defect correction circuit - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention is used in a color image pickup device or the like having a solid-state image pickup section in which a color filter array is arranged on the image pickup plane, and an image pickup signal obtained from the solid-state image pickup section The present invention relates to an image pickup signal defect correction circuit that performs correction according to a defect.

[0002]

2. Description of the Related Art A solid-state image pickup device used for forming a video camera or the like for forming a video signal has a large number of pixels for photoelectric conversion arranged in an array on a semiconductor substrate, and a signal charge obtained at each pixel. Charge-coupled device (CC
D) and the like, and has an image pickup surface provided with a charge transfer region. It is not easy for the imaging surface of such a solid-state imaging device to have all of a large number of pixels properly function in the manufacturing process, and for example, a local crystal defect of a semiconductor or the like may occur. It is likely to include defective pixels due to abnormal operation. Then, when the solid-state image sensor whose image pickup surface is assumed to include defective pixels is used, sampling reading is performed according to a predetermined read line for a signal from each pixel on the image pickup surface, and Since the signal from the defective pixel is mixed as a noise component in the image pickup output signal formed based on the image pickup signal sequentially obtained by, the image pickup signal from the solid-state image pickup device is supplied and the image pickup output signal based on it is supplied. It is required that the signal processing circuit unit that forms a signal be subjected to a treatment for a noise component caused by the defective pixel, that is, a defect correction.

When such a solid-state image pickup device is used to form a color video camera for forming a color video signal, for example, a plurality of pixels respectively corresponding to a plurality of pixels arrayed and formed on the image pickup surface are used. A color filter array having an array of color filters is arranged so that image light is incident on the corresponding pixel through each color filter of the color filter array.

The image pickup surface of a solid-state image pickup device having a color filter array is provided with a color filter array FA of a complementary color system as shown in FIG. 3, for example. The color filter array FA shown in FIG. 3 is a filter of each color of green (G), magenta (M), yellow (Ye), and cyan (Cy) (hereinafter,
G filter, M filter, Ye filter and Cy respectively
(Hereinafter referred to as “filter”) are formed by mosaic arrangement, and the G filter, the M filter, the Ye filter, and the Cy filter are formed in a large number on the imaging surface which is shown in a rectangular shape by a broken line in FIG. Pixel PU
Are arranged in rows and columns corresponding to each other. G
The filters, the M filters, the Ye filters, and the Cy filters are arranged in such a manner that the G filters and the M filters are alternately arranged in the horizontal direction indicated by arrow h in FIG. 3 to form horizontal rows, and the Ye filters and the Cy filters are arranged. It is assumed that the filters are also alternately arranged in the horizontal direction to form another horizontal row, and these two kinds of horizontal rows are alternately arranged in the vertical direction shown by an arrow v in FIG. With respect to the horizontal rows by the arrangement of the Ye filters and the Cy filters, the positions of the Ye filters and the Cy filters are alternated for each row.

On the image pickup surface of such a solid-state image pickup device, the image light from the picked-up image is reflected by the color filter array F
Through each of the G filter, the M filter, the Ye filter, and the Cy filter forming A, a pixel corresponding to the G filter (hereinafter referred to as G pixel), a pixel corresponding to the M filter (hereinafter referred to as M pixel), and a Ye filter are formed. Each of the G pixel, the M pixel, the Ye pixel, and the Cy pixel is assumed to be incident on a corresponding pixel (hereinafter, “Ye pixel”) and a pixel corresponding to the Cy filter (hereinafter, “Cy pixel”). The signal charge is stored in. Then, the signal charge accumulated in each of the G pixel, the M pixel, the Ye pixel, and the Cy pixel is read out and transferred at a predetermined timing, and is transferred to the output end of the solid-state image sensor.
Imaging signals from each of the G pixel, the M pixel, the Ye pixel, and the Cy pixel are sequentially derived by sampling extraction. The sampling extraction of the image pickup signal from each of the G pixel, the M pixel, the Ye pixel, and the Cy pixel is performed based on, for example, two-phase sampling clock signals that are in opposite phases.

The sampling extraction of the image pickup signal based on the two-phase sampling clock signals in such a solid-state image pickup device is performed, for example, in field units.
In the field of, the pixel row set L _n , L _{n + 1} , L _{n + 2} , L _{n + 3} · ₂ consisting of two horizontal pixel rows corresponding to two adjacent horizontal row pairs of the color filter array FA.・ ・
Of the pixel row pairs L _n , L _{n + 1} , L _{n + 2} ,
A horizontal read line is formed by each of L _{n + 3} . Then, a set of pixel rows L _n , L _{n + 1} ,
For each of L _{n + 2} , L _{n + 3,} ..., Image pickup signals from two pixels arranged in the vertical direction are simultaneously taken out in accordance with the two-phase sampling clock signals, and
Two pixels from which image pickup signals are simultaneously taken out are sequentially shifted in the horizontal direction. For example, a set of pixel rows L _n
For G, which is two pixels arranged in the vertical direction.
The image pickup signals from the pixels and the Ye pixels, and the image pickup signals from the M pixels and the Cy pixels, which are also two pixels arranged in the vertical direction, alternate according to the two-phase sampling clock signals. To be extracted.

Subsequently, in the second field, the image is
Set of natural behavior L_n, L_{n + 1}, L_{n + 2}, L _{n + 3}To each of ...
On the other hand, two horizontal pixels that are adjacent to each other by being displaced by one horizontal pixel row
Pixel row set consisting of rows L '_n, L '_{n + 1}, L '_{n + 2}・ ・
. Is performed for each of, and the pixel row set L '_n, L '_{n + 1}，
L ’_{n + 2}The horizontal read line is shaped by
Will be made. Then, a set of pixel rows L ′_n, L '
_{n + 1}, L '_{n + 2}For each of the two ...
Vertically aligned according to the ring clock signal
Image signals from two pixels are taken out at the same time,
Two pixels from which image signals are taken out simultaneously are sequentially arranged in the horizontal direction.
The pixel row set L ′.
_nIs two pixels arranged vertically.
Imaging signals from Ye pixels and G pixels, and the same vertical
Cy pixel and M pixel which are two pixels arranged in the direction
The image pickup signals from the
The signals are alternately extracted according to the black signal.

In this way, in each of the first field and the second field, sampling extraction of the image pickup signal is performed with a sampling period corresponding to 1/2 of each period of the two-phase sampling clock signals. That is, the sampling extraction of the image pickup signal in the first field and the sampling extraction of the image pickup signal in the second field are alternately repeated. In addition, a set of pixel rows L _n , L _{n + 1} , L _{n + 2} in the first field,
Ln _{+ 3} ... Each sampling sampling period of the image pickup signal, and each of the pixel row pairs L' _n , L' _{n + 1} , L' _{n + 2} ... In the _{second field} The sampling extraction period of the image pickup signal, that is, the sampling extraction period of the image pickup signal in each horizontal reading line is set to one horizontal period (1H). Therefore, 1H is also a period for one horizontal readout line of the image pickup signals sequentially obtained from the solid-state image pickup device.

As described above, the solid-state image sensor having the color filter array FA shown in FIG. 3 includes defective pixels on its image pickup surface, and the defective pixels are labeled with (M _D ), for example. M pixel indicated by
If it is a pixel M _D ), defect correction will be performed in the signal processing circuit unit that forms an imaging output signal based on the imaging signal obtained from such a solid-state imaging device.
At that time, in the conventional, belong to a common read line and defective M pixel M _D, the color filter and the color filters of the same color corresponding to the defective M pixel M _D, i.e., is assumed to M filter corresponding defect M G pixel G ₂ adjacent to pixel M _D
M pixels M _f (hereinafter referred to as the immediately preceding M pixels) that are arranged adjacent to each other and that transmit a signal prior to the signal transmission from the defective M pixel M _D.
The signal obtained from the pixel M _f ) is referred to as a defective M pixel M _D
Signal processing of the previous value hold type used in place of the signal obtained from the above, or the signal obtained from the immediately preceding M pixel M _f ,
It belongs the defective M pixel M _D to the common read line, the color filters of the same color of the color filter corresponding to the defective M pixel M _D, i.e., is assumed to M filter corresponding defect M
Disposed in a position adjacent to the G pixel G ₃ adjacent to the pixel M _D, M pixel M _r (hereinafter, just referred to M pixel M _r) for sending a signal after signal transmission from the defect M pixel M _D obtained from the signal , And a signal obtained from the defective M pixel M _D , which is a selected one of the signals obtained by averaging the signal obtained from the immediately preceding M pixel M _f and the signal obtained from the immediately following M pixel M _r. It has been proposed that signal processing to be used instead of is performed.

In this case, the immediately preceding M pixel M_fAnd immediately after
M pixels M_rAre defective M pixels M _DImmediately before
It is a color pixel and the same color pixel immediately after. And such a lack
The image pickup signal that has been subjected to the dip correction is based on the luminance signal.
Image forming output signal for luminance signal, and
Then, the color signal is formed as a color signal imaging output signal.
And is sent from the signal processing circuit section.

[0011]

As described above, the color
Imaging signal from a solid-state image sensor equipped with a filter array
Signal is supplied and the image pickup output signal for luminance signal and
In the signal processing circuit that forms the imaging output signal for the color signal
When the defect correction processing is performed, the defect M image on the imaging surface
Elementary M_DAnd the previous M pixel M that is the previous same-color pixel_fOr straight
M pixels immediately after the same color pixel as M pixels_rBetween and at least
1 pixel (G pixel G₂Or G₃) Is allotted
It is assumed that there are intervals. Therefore, the captured image is a defect M image.
Elementary M_DAnd the previous M pixel M_fOr immediately after M pixels M_rBetween
Can cause a situation in which the content changes significantly
In that case, the last M pixels M_fObtained from
signal _,Immediately after M pixels M_rSignal obtained from
Previous M pixel M_fSignal obtained from M pixel M immediately after_rGet from
The signal obtained by averaging the
Pitch M pixel M_DAnd the signal to be obtained from the pixel taking the position of
The content of the
Is a defective M pixel M_DInstead of the signal obtained from the book
Coming defect M pixel M_DBelief that should be obtained from pixels taking
A signal that is significantly different from the signal will be used. So
Then, the image pickup signal subjected to such defect correction processing is
Signal output signal for color signal and image output signal for color signal
And, the color formed based on the color signal imaging output signal
The adverse effect of the defect correction process on the signal is relatively
Small, but formed based on the luminance signal imaging output signal
The brightness signal generated by the
The discontinuity will be formed with drastic changes
It is hard to say that it was obtained by performing various defect corrections.
turn into.

In view of the above point, according to the present invention, a solid-state image pickup unit in which a color filter array having a plurality of color filter arrays is arranged on an image pickup surface on which a plurality of pixels are arranged and formed is changed to a plurality of pixels on the image pickup surface. In order to obtain the image pickup output signal for the luminance signal and the image pickup output signal for the color signal by correcting the signal defect caused by the defective pixel, that is, the defect correction, the image pickup signal sequentially obtained according to the image pickup signal for the luminance signal. And the color signal imaging output signal, both the luminance signal formed based on the luminance signal imaging output signal and the color signal formed based on the color signal imaging output signal are adversely affected by the defect correction processing. It is an object of the present invention to provide an imaging signal defect correction circuit which can be obtained by performing appropriate defect correction, which is relatively small.

[0013]

In order to achieve the above object, an image pickup signal defect correction circuit according to the present invention is provided with a plurality of colors corresponding to a plurality of pixels on an image pickup surface in which a plurality of pixels are arranged and formed. An input end to which an image pickup signal sequentially obtained according to each of a plurality of pixels for each predetermined read line on the image pickup surface is supplied from a solid-state image pickup section in which a color filter array including an array of filters is supplied, and an image pickup signal When the image pickup signal includes a signal from a defective pixel on the image pickup surface, the first and second output end portions from which a luminance signal image pickup output signal and a color signal image pickup output signal based on And a correction processing unit configured to perform a defect correction process to form an image pickup output signal for a luminance signal and an image pickup output signal for a color signal. First and second sandwiching the defective pixel belongs
First and second signals including signals respectively obtained from two adjacent pixels
Corresponding to the average of the first image signal and the second image signal.
One of the first average image pickup signals is used instead of the image pickup signal including the signal obtained from the defective pixel to obtain a luminance signal image pickup output signal, and the defective pixel on the image pickup plane belongs to the image pickup signal. Defective pixel belonging to readout line
And sandwiching the array of first and second adjacent pixels,
Corresponding color filter with the same color as the corresponding color filter
From the first and second same-color pixels that are supposed to
Third and fourth image pickup signals including
4 and the second average image pickup signal corresponding to the average of the image pickup signal
Any one of them is used in place of the image pickup signal including the signal obtained from the defective pixel to perform correction to obtain a color signal image pickup output signal.

[0014]

In the image pickup signal defect correction circuit according to the present invention configured as described above, the defect on the image pickup surface is obtained as an image pickup signal sequentially obtained from each of a plurality of pixels on the image pickup surface of the solid-state image pickup element according to a predetermined read line. When a signal including a signal from a pixel is derived, instead of an imaging signal including a signal obtained from a defective pixel , two adjacent pixels that belong to the read line to which the defective pixel belongs on the imaging surface and sandwich the defective pixel are provided.
Two imaging signals including the signals obtained from the adjacent pixels
Either the shift or the average of the two image signals
The average image signal correction is performed to be used, together with the imaging output signal for luminance signal is formed, in place of the image pickup signal including the signal obtained from the defective pixel, belongs to a read line defective pixels on the imaging plane belongs to , by a defect pixel
Obtained from two pixels of the same color that sandwich each of two adjacent pixels
One of the two imaging signals, including the
Is an average image signal corresponding to the average of the two image signals.
No. correction is performed to be used, color signals for the image pickup output signal is formed.

Therefore, when an image pickup signal including a signal from a defective pixel on the image pickup surface is derived, a defect correction and color signal for obtaining a luminance signal image pickup output signal are applied to the image pickup signal. The defect correction, which is performed to obtain the image pickup output signal, will be different from the defect correction. The defect correction that is performed to obtain the image pickup output signal for the luminance signal includes the signal obtained from the defective pixel. As an alternative to the image pickup signal, an image pickup signal including a signal obtained from an adjacent pixel to the defective pixel is used, in which a signal substantially similar to the signal to be obtained from the pixel originally located at the position of the defective pixel is obtained, and
In the defect correction in which the image pickup output signal for the color signal is properly obtained, as an alternative to the image pickup signal including the signal obtained from the defective pixel, the signal obtained from the same-color pixel closest to the defective pixel is included. The image pickup signal is used.

As a result, the image pickup output signal for the luminance signal is
It is considered that the luminance signal formed on the basis of this is obtained by performing appropriate defect correction, which avoids the formation of a discontinuous portion accompanied by a rapid change caused by the defect correction processing, and , The color signal imaging output signal has a color signal formed based on the color signal, which has appropriate color information with a small adverse effect due to the defect correction processing.
It is assumed that it is obtained by performing appropriate defect correction.

[0017]

FIG. 2 shows a video camera having a solid-state image pickup section to which an example of an image pickup signal defect correction circuit according to the present invention is applied.

In the video camera shown in FIG. 2,
The solid-state imaging unit 11 is provided, and the solid-state imaging unit 11 is provided.
The image pickup surface is provided with a complementary color filter array FA as shown in FIG. Therefore, on the image pickup surface of the solid-state image pickup unit 11, G pixels, M pixels, which correspond to the G filter, the M filter, the Ye filter, and the Cy filter, respectively, which form the color filter array FA,
Ye pixels and Cy pixels are arranged in a matrix in the horizontal and vertical directions. Then, the G pixel, the M pixel, the Ye pixel, and the Cy, which are performed through the reading and transfer of the signal charges accumulated in the G pixel, the M pixel, the Ye pixel, and the Cy pixel, respectively.
Sampling extraction to the output end of the solid-state image pickup unit 11 for the image pickup signal from each of the pixels is supplied to the solid-state image pickup unit 11 from the pulse generation unit 12, and the two-phase sampling clock pulses which are out of phase with each other. It is performed based on φ ₁ and φ ₂ .

Sampler in the solid-state image pickup section 11
Clock clock φ₁And φ₂Of the imaging signal based on
Sampling and extraction are performed in field units, for example.
First, in the first field, as shown in FIG.
Two adjacent waters of color filter array FA
Of pixel rows consisting of two horizontal pixel rows corresponding to parallel sets
Set L_n, L_{n + 1}, L_{n + 2}, L_{n + 3}... for each of
The pixel row set L_n, L _{n + 1}, L_{n + 2}, L_{n + 3}···of
A horizontal read line is formed by each of them. That
And the pixel row set L_n, L_{n + 1}, L_{n + 2}, L_{n + 3}···of
For each, sampling clock pulse φ₁
And φ₂From two pixels arranged vertically according to
The imaging signals are taken out at the same time, and the imaging signals are
The two pixels that are sometimes taken out can be moved horizontally in sequence.
For example, the pixel row set L_nabout,
G pixel and Ye image that are two pixels arranged in the vertical direction
The image pickup signal from the element and the vertical array
Image signal from two pixels, M pixel and Cy pixel
, Sampling clock pulse φ₁And φ
₂Are alternately extracted according to.

Next, in the second field,
Pixel row set L as shown in FIG. _n, L_{n + 1}，
L_{n + 2}, L_{n + 3}Only one horizontal pixel row for each of ...
A set of pixel rows consisting of two horizontal pixel rows that are displaced and adjacent
L '_n, L '_{n + 1}, L '_{n + 2}It is carried out for each of ...
Pixel row set L '_n, L '_{n + 1}, L '_{n + 2}To each of ...
Therefore, a horizontal read line is formed. And the pixel
Row set L '_n, L '_{n + 1}, L ' _{n + 2}For each of ...
Even sampling clock pulse φ₁And φ₂To
Accordingly, the image pickup signals from the two pixels arranged in the vertical direction
Simultaneously taken out, imaging signals are taken out simultaneously
So that the two pixels can be moved horizontally in sequence.
For example, the set of pixel rows L ′_nVertical for
From the two pixels, Ye and G, arranged in
Image pickup signal and two vertically arrayed signals
The image pickup signals from the Cy pixel and the M pixel, which are pixels,
, Sampling clock pulse φ₁And φ₂In response
Then, they are extracted alternately.

In this way, sampling sampling of the imaging signal in each of the first field and the second field is performed by sampling clock pulses φ ₁ and φ.
Sampling period Ts, which corresponds to 1/2 of the period of ₂ of each
The sampling extraction of the image pickup signal in the first field and the sampling extraction of the image pickup signal in the second field are alternately repeated. Further, the sampling extraction period of the image pickup signal for each of the pixel row sets L _n , L _{n + 1} , L _{n + 2} , L _{n + 3} ... In the first field, and the second
A set of pixel rows L ′ _n , L ′ _{n + 1} in the field of
The sampling extraction period of the image pickup signal for each of L ′ _{n + 2} , that is, the sampling extraction period of the image pickup signal in each horizontal reading line is set to 1H. Therefore,
1H is 1 of the image pickup signals sequentially obtained from the solid-state image pickup unit 11.
It also means a period corresponding to the horizontal read line.

As described above, the image pickup signals sequentially extracted by the sampling extraction with the sampling period Ts from each of the G pixel, the M pixel, the Ye pixel and the Cy pixel on the image pickup surface are output to the output end of the solid-state image pickup section 11. It is derived as a series of image pickup signals SI and supplied to the analog-digital (A / D) converter 13. A / D converter 13
Is the sampling clock signal CP from terminal 14.
Is also supplied. Then, in the A / D converter 13,
The image pickup signal SI is provided for sampling and holding according to the sampling clock signal CP, and the sampling and holding signal obtained thereby is subjected to A / D conversion to form a digital image pickup signal DI.

The digital image pickup signal DI obtained from the A / D conversion unit 13 is supplied to the defect correction circuit unit 15 which is an example of the image pickup signal defect correction circuit according to the present invention. The defect correction circuit unit 15 cannot output an appropriate image pickup signal among the G pixel, M pixel, Ye pixel, and Cy pixel on the image pickup surface of the solid-state image pickup unit 11, that is, the image pickup signal SI due to the defective pixel. The signal defect to be mixed is corrected, and the luminance signal image pickup output signal DIY and the color signal image pickup output signal DIC are individually formed based on the image pickup signal SI.

The brightness signal image pickup output signal DIY obtained from the defect correction circuit section 15 is supplied to the brightness signal forming section 16. The brightness signal forming unit 16 performs various processes such as extraction of a brightness signal component from the brightness signal imaging output signal DIY, gamma correction and aperture correction on the extracted brightness signal component, and the digital brightness signal DY is obtained. It is formed. Then, the digital luminance signal DY obtained from the luminance signal forming unit 16 is digital-analog (D /
A) The conversion unit 17 converts the analog signal into the analog signal, the D / A conversion unit 17 obtains the luminance signal Y, and the luminance signal Y is output to the luminance signal output terminal 18.

The color signal image pickup output signal DIC obtained from the defect correction circuit section 15 is supplied to the synchronization processing section 19. The synchronization processing unit 19 obtains an imaging signal obtained by sampling extraction based on the sampling clock pulse φ ₁ and an imaging signal obtained from sampling extraction based on the sampling clock pulse φ ₂ for the imaging signal SI from the solid-state imaging unit 11. It is supposed to fulfill the function of synchronizing signals and the synchronization processing unit 1
9, the synchronized output signal DCS is obtained and the vertical processing unit 2
Supplied to zero. The vertical processing section 20 is supposed to perform a function of synthesizing the image pickup signal SI from the solid-state image pickup section 11 with regard to three horizontal read lines continuous in the vertical direction on the image pickup surface. 20
From, the color component signal DCV is obtained and supplied to the color signal processing unit 21.

In the color signal processing section 21, various processes such as matrix process, white balance adjustment and encoding process are performed on the color component signal DCV to form the digital color signal DC. Then, the digital color signal DC obtained from the color signal processing unit 21 is converted into an analog signal in the D / A conversion unit 22, and the color signal C is obtained from the D / A conversion unit 22, which is output to the color signal output terminal 23. Derived.

As described above, in the video camera shown in FIG. 2, the image pickup signal SI obtained from the solid-state image pickup section 11 is subjected to the defect correction by the defect correction circuit section 15 to obtain the luminance signal image pickup output signal DIY and the color. Signal imaging output signal D
IC, and the luminance signal Y and the color signal C are respectively formed based on the luminance signal imaging output signal DIY and the color signal imaging output signal DIC sent from the defect correction circuit unit 15.

FIG. 1 shows a specific configuration example of a defect correction circuit section 15 which is an example of an image pickup signal defect correction circuit according to the present invention, which is provided in the video camera shown in FIG.

In the defect correction circuit section 15 shown in FIG. 1, the solid-state image pickup section 11 shown in FIG.
A digital image pickup signal DI formed by digitizing the image pickup signal SI obtained from the above by the A / D conversion unit 13 is supplied. On the imaging surface of the solid-state imaging unit 11 as shown in FIG. 3, one of the M pixels is
Defective pixel that cannot transmit an appropriate imaging signal, that is, defect M
The pixel is M _D. The position of the defective M pixel M _{D on} the imaging surface of the solid-state imaging unit 11 is the read-only memory (RO) associated with the solid-state imaging unit 11.
M) is stored in 11A, ROM 11A has a terminal 1
By the operation control signal SRM supplied through 1B,
It is assumed that the reading is performed in synchronization with the sampling extraction of the image pickup signal from the solid-state image pickup unit 11.
The defect indication signal SD is sent at the timing at which the signal from the defective M pixel M _{D on} the image pickup plane is extracted.

The digital image pickup signal DI supplied to the input terminal 30 is further sequentially supplied to the six 1-bit delay units 31, 32, 33, 34, 35 and 36 connected in series. Each of the 1-bit delay units 31 to 36 outputs an input signal for the sampling clock pulse φ ₁
And a period corresponding to 1/2 of each cycle of φ ₂ , that is, a set of pixel rows L _{n on} the imaging surface of the solid-state imaging unit 11,
L _{n + 1} , L _{n + 2} , L _{n + 3} ... And a set of pixel rows L ′ _n ,
The sampling period Ts of the image pickup signal for each of L' _{n + 1} , L' _{n + 2} ... Is delayed, and therefore, the signals are obtained at the output ends of the 1-bit delay units 31 to 36. Signals DI6, DI5, DI4, DI3, DI
2 and DI1 respectively have a digital image pickup signal DI of 1
It is assumed that it is delayed by a period corresponding to Ts, 2Ts, 3Ts, 4Ts, 5Ts and 6Ts.

The signal DI3 obtained from the 1-bit delay section 34 is supplied to the selection contact 40a of the switch 40, and the signal DI3 obtained from the 1-bit delay section 32 is supplied.
5 is supplied to the selection contact 40b of the switch 40, and
After the signals DI3 and DI5 are added in the adder 42, the level thereof is reduced to 1/2 in the 1/2 attenuator 43, whereby the signal D obtained from the 1/2 attenuator 42 is obtained.
A signal DI7 corresponding to the average of I3 and the signal DI5 is supplied to the selection contact 40c of the switch 40. Further, the signal DI2 obtained from the 1-bit delay unit 35 is the switch 41.
Signal DI6 obtained from the 1-bit delay unit 31 is supplied to the selection contact 41b of the switch 41, and the signal DI2 and the signal DI6 are added in the adding unit 44, and then 1 In the / 2 attenuator 45, the level is reduced to 1/2, so that the signal DI8 corresponding to the average of the signals DI2 and DI6 obtained from the 1/2 attenuator 45 is changed to the selection contact 41 of the switch 41.
c and the selection contact 41d. Furthermore, the signal DI8 corresponding to the average of the signals DI2 and DI6 obtained from the 1/2 attenuator 45 is the selection contact 40d of the switch 40.
Will also be supplied.

The switch 40 and the switch 41 are interlocked with each other, and the movable contact 40 of the switch 40.
The signal obtained at e is supplied to the selection contact 46a of the switch 46, and the signal obtained at the movable contact 41e of the switch 41 is supplied to the selection contact 47a of the switch 47. Further, each of the selection contact 46b of the switch 46 and the selection contact 47b of the switch 47 has a 1-bit delay unit 3
The signal DI4 obtained from 3 is supplied. The switch 46 and the switch 47 are also interlocked with each other, and the signal obtained at the movable contact 46c of the switch 46 is led to the first imaging output signal terminal 48, and
The signal obtained at the movable contact 47c of the switch 47 is led to the second imaging output signal terminal 49.

On the other hand, the signal DI3 obtained from the 1-bit delay section 34 and the signal DI1 obtained from the 1-bit delay section 36.
Are subtracted in the subtraction unit 50, and the difference signal D1 corresponding to the absolute value of the difference between the signal DI3 and the signal DI1 obtained from the subtraction unit 50 is supplied to the first input terminal of the level determination unit 52. In addition, the digital imaging signal D from the input terminal 30
I and the signal DI5 obtained from the 1-bit delay unit 32 are subtracted in the subtraction unit 51, and the difference signal D2 corresponding to the absolute value of the difference between the digital imaging signal DI and the signal DI5 obtained from the subtraction unit 51 is level-determined. It is supplied to the second input end of the section 52. Further, a reference level L obtained from a reference level generating unit 53 provided in association with the level discriminating unit 52.
The reference level signal SR having is supplied to the third input end of the level discriminating unit 52.

The level discriminator 52 detects the difference signals D1 and D.
2 and the reference level signal SR are received, the difference signal D1 and the reference level signal SR are compared, and the difference signal D2 and the reference level signal SR are compared, and the level of the difference signal D1 is changed to the reference level signal SR. Control signal Qa is generated when the level of difference signal D2 is equal to or higher than the reference level L of reference level signal SR.
When the level of the difference signal D1 is greater than or equal to the reference level L of the reference level signal SR and the level of the difference signal D2 is less than the reference level L of the reference level signal SR,
Generate a control signal Qb; Generate a control signal Qc when both the level of the difference signal D1 and the level of the difference signal D2 are equal to or higher than the reference level L of the reference level signal SR;
When the level of the difference signal D1 and the level of the difference signal D2 are both smaller than the reference level L of the reference level signal SR, the control signal Qd is generated and the control signal Qd is generated.
A, Qb, Qc or Qd is supplied to the control ends of the switches 40 and 41.

At the control end of the switch 40,
When the control signal Qa is supplied, the movable contact 40e is connected to the selection contact 40a to obtain the signal DI3 at the movable contact 40e, and when the control signal Qb is supplied, the movable contact 40e
When e is connected to the selection contact 40b and the signal DI5 is obtained at the movable contact 40e and the control signal Qc is supplied, the movable contact 40e is connected to the selection contact 40c and the movable contact 40e.
When the signal DI7 is obtained at e and the control signal Qd is further supplied, the movable contact 40e is connected to the selection contact 40d and the signal DI8 is obtained at the movable contact 40e.

Further, in the switch 41, when the movable contact 40e of the switch 40 is connected to the selection contact 40a, the movable contact 41e is interlocked with the selection contact 41a.
When the movable contact 41e of the switch 40 is connected to the selection contact 40b, the movable contact 41e is connected to the selection contact 41b and connected to the movable contact 41e. When the signal DI6 is obtained and the movable contact 40e of the switch 40 is connected to the selection contact 40c, the movable contact 41e is connected to the selection contact 41c and the signal DI8 is transmitted to the movable contact 41e.
Further, when the movable contact 40e of the switch 40 is connected to the selection contact 40d, the movable contact 41e is connected to the selection contact 41d in conjunction with it.
The signal DI8 is obtained at e.

The defect indication signal SD sent from the ROM 11A is the switch 46 and the switch 47.
Is supplied to the control end of. In the switch 46, when the defect indication signal SD is not supplied to the control end, the movable contact 46c is connected to the selection contact 46b, the signal DI4 is obtained at the movable contact 46c, and the defect indication is given to the control end. When the signal SD is supplied, the movable contact 4
6c is connected to the selection contact 46a, and the signals DI3 and DI from the movable contact 40e of the switch 40 are supplied to the movable contact 46c.
5, DI7 or DI8 is obtained.

Also, in the switch 47, when the movable contact 46c of the switch 46 is connected to the selection contact 46b, the movable contact 47c is interlocked with the selection contact 47b.
And the signal DI4 is obtained at the movable contact 47c.
Further, the movable contact 46c of the switch 46 is the selection contact 46a.
, The movable contact 47c is connected to the selection contact 47a, and the signal DI2, DI6 or DI8 from the movable contact 41e of the switch 41 is obtained at the movable contact 47c.

Under such a condition, the image pickup signal SI obtained from the solid-state image pickup unit 11 is obtained from two normal G pixels, M pixels, Ye pixels and Cy pixels on the image pickup surface of the solid-state image pickup unit 11. In the state where the image pickup signal is used and the defect indication signal SD is not sent from the ROM 11A,
The switch 46 has its movable contact 46c whose selection contact 46b.
And the switch 47.
However, the movable contact 47c is placed in a state of being connected to the selection contact 47b. As a result, the signal DI4 obtained from the 1-bit delay unit 33 is passed through the switch 46 as the luminance signal image-capturing output signal DIY to the first image-capturing output signal terminal 4
8 and the signal DI4 obtained from the 1-bit delay unit 33 is led to the second image pickup output signal terminal 49 as the color signal image pickup output signal DIC through the switch 47. Therefore, the digital image pickup signal DI supplied to the input terminal 30 is 2 out of the normal G pixel, M pixel, Ye pixel and Cy pixel on the image pickup surface of the solid-state image pickup unit 11.
If the image pickup signal SI is obtained from the solid-state image pickup unit 11 and the digital image pickup signal DI is obtained by the bit delay units 31 and 3,
The signals are delayed by a period corresponding to 3Ts by 2 and 33, are led to the first image pickup output signal terminal 48 as the luminance signal image pickup output signal DIY, and are output as the color signal image pickup output signal DIC. It will be led to the imaging output signal terminal 49.

On the other hand, the image pickup signal SI obtained from the solid-state image pickup unit 11 is G pixel, M on the image pickup surface of the solid-state image pickup unit 11.
2 including defective pixel among pixel, Ye pixel and Cy pixel
When the signal is obtained from the individual pixels, for example, in the sampling extraction period of the imaging signal in the first field on the imaging surface shown in FIG. 3, the defective M pixel M _D in the pixel row set L _{n + 2} and in when the signal from the Cy pixels involved in it is being extracted to the imaging signal SI, after sampling the extraction start time of the signal from the Cy pixels accompanying it and defective M pixel M _D, a period corresponding to 3Ts ROM1 only for a period corresponding to 1 Ts from the point of time elapsed
The defect instruction signal SD is sent from 1A, during which the switch 46 is placed in a state in which its movable contact 46c is connected to the selection contact 46a, and the switch 47 is connected in its movable contact 47c to the selection contact 47a. Be put in a state.

Then, the defect indication signal S from the ROM 11A
In the period corresponding to 1 Ts in which D is transmitted, the digital image pickup signal DI corresponds to the image pickup signals from the G pixel G ₄ and the Ye pixel accompanying it in the pixel row set L _{n + 2} shown in FIG. Signal DI6 corresponds to the imaging signal from the immediately following M pixel M _r in the pixel row set L _{n + 2} and the accompanying Cy pixel,
The signal DT5 corresponds to the image pickup signal from the G pixel G ₃ in the pixel row set L _{n + 2} and the Ye pixel accompanying it, and the signal DI4 is the defect M in the pixel row set L _{n + 2} .
The signal from the pixel M _D and the Cy pixel accompanying it is assumed to be the signal, and the signal DI3 corresponds to the image pickup signal from the G pixel G ₂ and the Ye pixel accompanying it in the pixel row set L _{n + 2} . And the signal DI2 becomes the pixel row set L.
It is assumed that it corresponds to the imaging signal from the immediately preceding M pixel M _f in _{n + 2} and the Cy pixel accompanying it, and further, the signal DI1 is the G pixel G ₁ in the pixel row set L _{n + 2} and the associated Ye pixel. It corresponds to the image pickup signal from. Based on this, the immediately preceding M pixel M _f is the immediately preceding same color pixel with respect to the defective M pixel M _D , the immediately following M pixel M _r is immediately following same color pixel with respect to the defective M pixel M _D , and the pixel G ₂ and the pixel G ₃ is an adjacent pixel immediately before and immediately after the defective M pixel M _D.

Further, the defect indication signal S from the ROM 11A
During the period corresponding to 1 Ts when D is transmitted, the subtraction unit 50
A difference signal D1 is obtained from those having a level corresponding to the absolute value of the difference between the imaging signals from the imaging signal and the G pixel G _3, and Ye pixels accompanying it from Ye pixels accompanied G pixel G ₄ and it And the difference signal D2 obtained from the subtraction unit 51 is the G pixel G ₂ and the Ye associated therewith.
The image pickup signal from the pixel, the G pixel G ₁ and the Y accompanying it
It has a level according to the absolute value of the difference from the image pickup signal from the e pixel.

Under the circumstances, the level discriminating section 52
When it is determined that the level of the difference signal D1 is lower than the reference level L and the level of the difference signal D2 is equal to or higher than the reference level L, that is, immediately before the defective M pixel M _D and immediately before the same color pixel M The degree of correlation of the image pickup signals from the pixels before and after the pixel M _f is large, and the degree of correlation of the image pickup signals from the pixels before and after the immediately after M pixel M _r which is the immediately after the same color pixel to the defective M pixel M _D is high. When it is small, the level discriminating unit 52 outputs the control signal Qa. As a result, in the switch 40, the movable contact 40e becomes the selection contact 4
Is taken state of being connected to 0a, the movable contact 40e of the switch 40, the signal DI3 corresponding to the imaging signals from the Ye pixel accompanied G pixel G ₂ and it is immediately before the side adjacent pixels for defective M pixel M _D Obtained, it is switch 4
6 is led to the first image pickup output signal terminal 48 as a luminance signal image pickup output signal DIY, and the movable contact 41e of the switch 41 is connected to the selection contact 41a. To
A signal DI2 corresponding to the image pickup signal from the immediately preceding M pixel M _f that is the immediately previous same-color pixel with respect to the defective M pixel M _D and the Cy pixel accompanying it is obtained, which is passed through the switch 47.
It is led out to the second image pickup output signal terminal 49 as a color signal image pickup output signal DIC.

Further, the level discriminating unit 52 causes the difference signal D
1 level is equal to or higher than the reference level L and the difference signal D
When it is determined that the level of 2 is smaller than the reference level L, that is, the degree of correlation of the image pickup signals from the pixels before and after the immediately preceding M pixel M _f which is the immediately previous same color pixel with respect to the defective M pixel M _D is small. When the degree of correlation of the image pickup signals from the pixels before and after the immediately subsequent M pixel M _r , which is the immediately same color pixel with respect to the defective M pixel M _D, is small, the level determination unit 5
The control signal Qb is transmitted from the signal line 2. As a result, the movable contact 40e of the switch 40 is brought into a state of being connected to the selection contact 40b, and the movable contact 40e of the switch 40 is
Then, a signal DI5 corresponding to the image pickup signal from the G pixel G ₃ which is the immediately adjacent pixel to the defective M pixel M _D and the Ye pixel accompanying it is obtained, and this is sent through the switch 46 to the luminance signal image pickup output signal DIY. As a result, the movable contact 41e of the switch 41 is connected to the selection contact 41b while being led to the first image pickup output signal terminal 48, and the movable contact 41e of the switch 41 has a defect M.
A signal DI6 corresponding to the imaging signal from the immediately following M pixel M _r which is the immediately same color pixel with respect to the pixel M _D and the accompanying Cy pixel is obtained through the switch 47 as the color signal imaging output signal DIC. Imaging output signal terminal 4
9 is derived.

Subsequently, the level discriminating unit 52 causes the difference signal
Both the level of D1 and the level of the difference signal D2 are reference levels.
When it is determined that the image size is equal to or greater than L, that is, the defect M image
Elementary M _DTo the previous M pixel that is the same color pixel immediately before_fBefore
Degree M of Correlation of Imaging Signals from Subsequent Pixels and Defect M
Pixel M_DImmediately after M pixels that are the same color pixel_rof
Any of the degree of correlation of the image pickup signals from the pixels before and after
When it is small, the level discriminating unit 52 outputs the control signal Qc.
Is sent. This allows the switch 40 to move.
If the contact 40e is connected to the selection contact 40c,
Then, the movable contact 40e of the switch 40 has a defective M pixel M_D
G which is the immediately preceding adjacent pixel to G₂And accompanying
And a signal DI3 corresponding to the image pickup signal from the Ye pixel
Defect M pixel M_DImmediately adjacent to G is G pixel G
₃And the imaging signal from the Ye pixel accompanying it
A signal DI7 corresponding to the average of the signal DI5
That is, through the switch 46, the luminance signal imaging output signal D
When derived as IY to the first imaging output signal terminal 48
In both cases, the movable contact 41e of the switch 41 is selectively connected.
It is connected to the point 41c and the switch 41
Defective M pixel M on moving contact 41e_DThe same color pixel immediately before
Immediately before M pixels M_fAnd the Cy pixels that accompany it
DI2 corresponding to the image pickup signal of M and defective M pixel M_DAgainst
Immediately after the same color pixel immediately after the M pixel M_rAnd accompanying
Signal DI6 corresponding to the image pickup signal from the Cy pixel
A signal DI8 corresponding to the average is obtained, which is switch 4
2 through the second image pickup output signal DIC for color signals.
It is led to the image output signal terminal 49.

Further, the level discriminating unit 52 causes the difference signal
Both the level of D1 and the level of the difference signal D2 are reference levels.
When it is determined that it is smaller than L, that is, the defect M
Pixel M_DTo the previous M pixel that is the same color pixel immediately before_fof
Degree of correlation of image pickup signals from front and rear pixels, and defects
M pixels M_DImmediately after M pixels that are the same color pixel _r
Any of the degree of correlation of the imaging signals from the pixels before and after
Is high, the control signal Q
d is sent. This allows switch 40
If the moving contact 40e is connected to the selection contact 40d,
Then, the movable contact 40e of the switch 40 has a defective M pixel M_D
To the previous M pixel that is the same color pixel immediately before_fAnd to that
Signal DI2 corresponding to the image pickup signal from the accompanying Cy pixel
And defective M pixel M_DImmediately after M pixels with the same color pixel
Elementary M_rAnd the imaging signal from the Cy pixel accompanying it
A signal DI8 corresponding to the average of the corresponding signal DI6 is obtained.
Which is output through the switch 46 for the luminance signal imaging output signal.
No. DIY is output to the first imaging output signal terminal 48
And the movable contact 41e is selected in the switch 41.
The switch 41 is connected to the selection contact 41d.
To the movable contact 41e of the defective M pixel M_DImmediately before the same color as
Immediately before pixel M pixel M_fAnd the Cy pixel accompanying it
DI2 corresponding to the image pickup signal from M and defective M pixel M_D
Immediately after M pixels that are the same color pixel_rAnd to that
Signal DI6 corresponding to the image pickup signal from the accompanying Cy pixel
A signal DI8 corresponding to the average of
As a color signal imaging output signal DIC,
Is output to the imaging output signal terminal 49.

In this way, the information obtained from the solid-state image pickup unit 11 is obtained.
The image pickup signal SI is
Defect image of G pixel, M pixel, Ye pixel and Cy pixel
When the signals from the two pixels including the pixel are considered, the first
Imaging output signal for luminance signal derived to the image output signal terminal 48
In the case of No. DIY, defective M pixel M_DJust before the M picture
Elementary M_fThe degree of correlation of image signals from pixels before and after
And the defective M pixel M_DImmediately after M pixels M_rBefore
If the degree of correlation of the image signals from the subsequent pixels is small,
Defective M pixel M_DImmediately before M pixels M_fBefore and after
The degree of correlation of the image pickup signal from the source is small, and the defect M
Pixel M_DImmediately after M pixels M_rTaken from pixels before and after
When the degree of correlation of image signals is large, and when the defect M image
Elementary M_DImmediately before M pixels M_fImaging from pixels before and after
Degree of signal correlation and defective M pixel M _DImmediately after M picture
Elementary M_rWith the degree of correlation of imaging signals from pixels before and after
In both cases where both are small, defective M pixel M
_DAnd the signal from the Cy pixel accompanying it,
Pitch M pixel M_DG which is the immediately preceding adjacent pixel to G ₂
And the imaging signal from the Ye pixel accompanying it, and the defective M image
Elementary M_DImmediately adjacent to G is G pixel G₃And so
Image signal from Ye pixel accompanied with it, or it
Are formed using a signal corresponding to their average, while
Color signal imaging derived to the second imaging output signal terminal 49
In the output signal DIC, the defective M pixel M_DDirect against
Previous M pixel M_fDegree of correlation of image signals from pixels before and after
Large but defective M pixels M_DImmediately after M pixels M
_rThe degree of correlation of the image pickup signals from the pixels before and after
Defective M pixel M_DImmediately before M pixels M_fBefore and after
The degree of correlation of the image signals from the pixels
Pitch M pixel M_DImmediately after M pixels M_rFrom the pixels before and after
If the degree of correlation of the image pickup signal of
M_DImmediately before M pixels M_fImaging signals from pixels before and after
Degree of correlation of the number and defective M pixel M_DImmediately after
M pixels M_rDegree of correlation of image signals from pixels before and after
If both are small, and defective M pixel M_DDirect against
Previous M pixel M_fDegree of correlation of image signals from pixels before and after
Mouth defect M pixel M_DImmediately after M pixels M_rBefore and after
When both the degree of correlation of the image pickup signal from the source and the degree of correlation are large.
In both cases, defective M pixel M_DAnd accompanying
Defective signal M pixel M_DAgainst
Immediately before M pixels that are the same color pixel M_fAnd accompanying
Image signal from Cy pixel, defective M pixel M_DAgainst
Immediately after M pixels immediately after the same color pixel M_rAnd accompanying
Image signal from Cy pixel or its average
It is formed using the corresponding signal.

Accordingly, the luminance signal image pickup output signal DIY
However, it is considered that the luminance signal formed on the basis of this is obtained by performing proper defect correction, which avoids the formation of a discontinuous portion accompanied by a rapid change caused by the defect correction processing. Further, the color signal imaging output signal DIC has the color signal formed based on the color signal imaging information DIC having appropriate color information because the adverse effect of the defect correction processing is small.

The image pickup signal SI obtained from the solid-state image pickup unit 11 is the G pixel, M on the image pickup surface of the solid-state image pickup unit 11.
2 including defective pixel among pixel, Ye pixel and Cy pixel
When the signal from the pixels, before and after the pixel of M pixel M _r immediately for the degree and defective M pixel M _D of the correlation of the image signal from the preceding and succeeding pixels in the immediately preceding M pixel M _f for defective M pixel M _D And the degree of correlation of the image pickup signal from the image pickup signal is large, the luminance signal image pickup output signal DIY derived to the first image pickup output signal terminal 48 is the defective M pixel M _D and Cy accompanying it. Instead of signals from pixels,
An imaging signal from the immediately preceding M pixel M _f that is the immediately previous same-color pixel with respect to the defective M pixel M _D and the accompanying Cy pixel and the immediately following M pixel M _r that is immediately after the same-color pixel with respect to the defective M pixel M _D
And a signal corresponding to the average of the image pickup signals from the Cy pixels accompanying it are used. This means that the G pixel G ₂ and the immediately following side of the defective M pixel M _D are the immediately adjacent pixels. Since the G pixel G ₃ which is an adjacent pixel is associated with a color filter different from that of the defective M pixel M _D , the level difference of the image pickup signal obtained from each pixel due to the difference in the color filter is a problem. Is seen,
G pixel G, which is the immediately preceding pixel adjacent to the defective M pixel M _D
2 and the image pickup signal from the Ye pixel accompanied therewith and the image pickup signal from the G pixel G ₃ which is the immediately adjacent pixel to the defective M pixel M _D and the Ye pixel accompanied therewith are not used.

[0050]

As is apparent from the above description, in the image pickup signal defect correction circuit according to the present invention, the image pickup signal from the solid-state image pickup unit includes the signal from the defective pixel on the image pickup surface. At this time, the defect correction for obtaining the image pickup output signal for the luminance signal and the defect correction for obtaining the image pickup output signal for the color signal are separate from each other,
In the defect correction in which the image pickup output signal for the luminance signal is properly obtained, as an alternative to the image pickup signal including the signal obtained from the defective pixel, a signal substantially similar to the signal that should be obtained from the pixel originally positioned at the defective pixel is used. An image pickup signal including a signal obtained from a pixel adjacent to the defective pixel from which a signal is obtained is used, and a signal obtained from the defective pixel is included in the defect correction in which an image pickup output signal for a color signal is properly obtained. As an alternative to the image pickup signal, an image pickup signal including a signal obtained from the same color pixel closest to the defective pixel is used. As a result, according to the image pickup signal defect correction circuit of the present invention, the image pickup output signal for the luminance signal is formed, and the luminance signal formed based on the image pickup signal is formed of a discontinuous portion accompanied by a rapid change due to the defect correction processing. Therefore, the defect correction processing can be performed, and the color signal formed based on the color signal imaging output signal is not adversely affected by the defect correction processing. It can be obtained by performing appropriate defect correction, which is small and has appropriate color information.

[Brief description of drawings]

FIG. 1 is a block diagram showing an example of an image pickup signal defect correction circuit according to the present invention.

FIG. 2 is a block configuration diagram showing an example of a video camera to which an example of the imaging signal defect correction circuit according to the present invention is applied.

FIG. 3 is a configuration diagram provided for explaining an example of a pixel array and a color filter array in a solid-state imaging unit used together with the example shown in FIG.

[Explanation of symbols]

11 Solid-state imaging unit 11A ROM 12 pulse generator 13 A / D converter 15 Defect correction circuit section 16 Luminance signal forming unit 21 Color signal processing unit 31, 32, 33, 34, 35, 36 1-bit delay unit 40, 41, 46, 47 switch 42,44 adder 43,45 1/2 attenuator 50,51 Subtraction unit 52 Level discriminator 53 Reference level generator

Claims (3)

(57) [Claims] 1. A solid-state image pickup section in which a color filter array including an array of a plurality of color filters respectively corresponding to the plurality of pixels is arranged on an image pickup surface in which a plurality of pixels are formed in an array, and a predetermined image is formed on the image pickup surface. An input end to which an image pickup signal sequentially obtained corresponding to each of the plurality of pixels is supplied for each read line, and a luminance signal image pickup output signal and a color signal image pickup output signal based on the image pickup signal. When the first and second output ends and the image pickup signal include a signal from a defective pixel on the image pickup surface, defect correction processing is performed on the image pickup signal to obtain the luminance signal image pickup output signal and the color signal. A correction processing unit for forming an image pickup output signal, the correction processing unit belonging to a read line to which the defective pixel on the imaging surface belongs , and sandwiching the defective pixel between the first and second correction lines .
First and second imaging including signals respectively obtained from adjacent pixels
Which corresponds to the average of the image signal and the first and second image pickup signals
While performing correction using one of the first average image pickup signals in place of the image pickup signal including the signal obtained from the defective pixel to obtain the luminance signal image pickup output signal,
The defective pixel and the first and second adjacent pixels belonging to the read line to which the defective pixel belongs on the imaging surface
A color filter corresponding to the defective pixel is sandwiched between the array
The first and second color filters of the same color correspond to each other.
Third and third signals including signals respectively obtained from the second same-color pixels
4 and the average of the third and fourth image pickup signals
Image pickup characterized by obtaining the color signal image pickup output signal by performing correction using any one of the corresponding second average image pickup signals in place of the image pickup signal including the signal obtained from the defective pixel. Signal defect correction circuit. 2. A correction processing unit is provided with the first and second image pickup signals.
A first average corresponding to the average of the first and second imaging signals
One of the imaging signals, and the third and fourth imaging
An image signal and a third image signal corresponding to an average of the third and fourth image pickup signals.
One of the two average image pickup signals is used as the first image pickup signal.
The image signal and the first same-color pixel are sandwiched between the first adjacent pixel
The difference from the image pickup signal including the signal obtained from the pixel, and
The second image pickup signal and the second same-color pixel are regarded as the second adjacent pixel.
Difference from the image pickup signal including the signal obtained from the pixel sandwiched by
The image pickup signal defect correction circuit according to claim 1, wherein the image pickup signal defect correction circuit is selected according to 3. A correction processing section is provided with a first image pickup signal and a first image pickup signal.
Obtained from pixels that sandwich the color pixel with the first adjacent pixel
The difference from the image pickup signal including the signal is smaller than a predetermined value, and
The second image pickup signal and the second same-color pixel are referred to as the second adjacent pixel.
The difference from the image pickup signal including the signal obtained from the sandwiched pixel is high.
When the value is equal to or more than the predetermined value, the first image pickup signal and the third image pickup signal are obtained.
An image signal is selected, and the first imaging signal and the first same color are selected.
Obtained from a pixel sandwiching the pixel with the first adjacent pixel
The difference from the image pickup signal including the signal
The second image pickup signal and the second same color pixel
Includes signals obtained from pixels sandwiched by two adjacent pixels
When the difference from the image pickup signal is smaller than the predetermined value, the
The second image pickup signal and the fourth image pickup signal are selected, and the first image pickup signal
The imaging signal and the first same-color pixel as the first adjacent pixel
With the imaging signal including the signal obtained from the pixel sandwiched by
The difference between the second image pickup signal and the second same-color pixel
A signal obtained from a pixel sandwiched by the second adjacent pixel
Any difference from the image pickup signal including
At this time, the first average image pickup signal and the second average image pickup signal are selected.
The image signal defect correction according to claim 2, wherein
Positive circuit.