JP3340048B2 - Friction and wear testing machine - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a friction and wear tester for performing a friction and wear test on a sample. More specifically, the present invention relates to a friction and wear tester capable of adjusting a sliding position between a disk sample and a piece sample that slides on the disk sample during a friction and wear test.

[0002]

2. Description of the Related Art Conventionally, tribology, that is, friction,
Friction wear tests have been performed to measure wear phenomena. In this friction and wear test, a so-called piece sample such as a pin-shaped pin sample, a ball-shaped ball sample, and a ring-shaped ring sample is pressed on a disk-shaped disk sample with a predetermined load, and the disk sample is rotated. In some cases, the friction / wear phenomenon between the disk sample and the piece sample is measured.

[0003] Further, there is a type in which the base end of the above-mentioned arm is attached to a rotating shaft, and the torque of the rotating shaft is measured by a torque detector to measure the frictional force. When such a friction and wear test is performed, it may be necessary to adjust the sliding contact position of the piece sample to a predetermined position with respect to the rotation center of the disk sample. In such a case, in the above-described conventional testing machine, it is necessary to change the mounting position of the piece sample to be mounted on the distal end of the arm and adjust the position where the piece sample slides on the disk sample.

However, there is a problem that such adjustment of the mounting position of the piece sample is troublesome and inefficient, and that the adjustment accuracy of the sliding position between the piece sample and the disk sample is low.

[0005]

SUMMARY OF THE INVENTION The present invention has been made in view of the above circumstances, and allows a piece sample such as a pin sample to be brought into sliding contact with an arbitrary position with respect to the center of rotation of a disk sample. It is an object of the present invention to provide a highly reliable friction and wear testing machine that can easily and accurately adjust the sliding contact position, has a simple structure, and is highly reliable.

[0006]

According to a first aspect of the present invention, there is provided a base, a disk driving mechanism for rotating and driving a disk sample, a load arm for holding a piece sample slidably contacting the disk sample, A load pressurizing mechanism for applying a predetermined load to the piece sample held at the distal end of the load arm; and a friction detecting a force acting on the load arm by friction between the disk sample and the piece sample. A force detecting mechanism, and the load arm, the load pressing mechanism, and the frictional force detecting mechanism are installed on the base, and the disk drive mechanism is moved in a horizontal direction with respect to the base. An eccentric mechanism is provided.

Therefore, by moving the moving table to move the disk drive mechanism, the relative position between the piece sample mounted on the distal end of the load arm and the center of rotation of the disk sample is adjusted. The piece sample can be accurately slid into contact with an arbitrary position on the disk sample.

In the present invention, only the disk drive mechanism is moved, and the other mechanisms are fixedly installed on the base, so that the structure is simple. Also, this disk drive mechanism only drives the disk sample to rotate, and its structure is simpler and more unitized than other mechanisms. The structure is less complicated and the accuracy is not reduced.

Further, by rotating the disk sample and moving the disk drive mechanism at the same time, the piece sample can be slid on the disk sample by drawing an arbitrary trajectory. There is.

According to a second aspect of the present invention, the eccentric mechanism includes a movable table to which the disk drive mechanism is attached and is movably guided with respect to the base. A moving micrometer mechanism. Therefore, the disk drive mechanism can be accurately moved, and the operation of the movement is simple.

[0011]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to the drawings. This embodiment is an arm-type friction / wear tester for performing a friction / wear test between a disk sample and a piece sample. First, an outline of the friction and wear tester of this embodiment will be described with reference to FIGS.

This tester comprises a measuring section 1 and a control section 2. The measuring unit 1 has a box shape with a frame, and has functions of changing the internal temperature and pressure, and also having a function of circulating oil. Room temperature, constant temperature, low temperature, high temperature, vacuum,
A friction and wear test can be performed in various atmospheres such as oil circulation.

The control section 2 is provided with various control devices, and can control and measure each mechanism of a friction and wear test described later, control the atmosphere in the measurement section, and the like. Further, the control unit 2 has a program function capable of automatically executing a friction and wear test of a predetermined process.

A device for performing a friction and wear test is provided in the measuring unit 1. In the measuring section 1, a lower base 10 serving as a base of the apparatus and an upper base 20 erected above the lower base 10 are provided.

The lower base 10 is provided with a disk drive mechanism 11. The disk drive mechanism 11 includes mechanisms such as a servomotor and a speed reducer,
A disk sample mounting plate 12 of a disk shape is horizontally mounted on this upper end, and a disk sample is mounted thereon.
The disk drive mechanism 11 is controlled by the control unit 2 to rotate the disk sample mounted on the disk sample mounting plate 12 at an arbitrary speed. An oil container 19 for accommodating the disk sample mounting plate 12 is provided above the disk drive mechanism 11 so that a friction and wear test can be performed in an oil circulation atmosphere. The whole disk drive mechanism 11 can be moved horizontally with respect to the lower base 10 as described later.

On the lower base 10, a high-load arm 13 and a low-load arm 14 are provided as load arms. The base ends of the high-load arm 13 and the low-load arm 14 are rotatably supported in a horizontal direction on vertical shafts 15 and 16 parallel to the rotation axis of the disk drive mechanism 11. A piece sample such as a pin sample is attached to the tip, and these arms 13 and
By rotating the tip of the disk drive 14 above the disk sample of the disk drive mechanism 11 and pressing the piece sample on the disk sample and rotating the disk sample, the friction and wear between these samples are increased. The test is performed.

It should be noted that the shafts 15,
16 is one with respect to the disk drive mechanism 11 described above.
The arms 13,
14 are configured not to interfere with each other.

Further, holders 31 and 34 for holding the piece samples are provided at the distal ends of the arms 13 and 14, respectively. A mechanism for detecting is mounted.

The high load arm 13 is used when a high friction load of, for example, 5000 N is applied to the piece sample to perform a wear friction test. The low-load arm is, for example, 0.5 to 50 N
Is used when performing a friction and wear test by applying a low load to the piece sample. In addition, these arms 13,
Reference numeral 14 denotes a standby position where the tip is rotated to a use position where the tip is positioned above the disk sample when used, and the tip is separated from the disk drive mechanism 11 when not used. Pivoted to the position. FIG. 3 shows a state in which the high-load arm 13 is in the use position and the low-load arm 14 is in the standby position. In addition,
When these arms 13 and 14 are in the standby position,
Their tips are held by a block-shaped holding block 21. In addition, these holding blocks 21 are removable.

The upper base 20 is provided with a load pressing mechanism for pressing a predetermined load on the piece sample. FIG. 3 shows a high-load pressurizing mechanism 22 that presses a high load on the high-load arm 13. For example, a pressurized air is supplied to a bellofram mechanism to apply an arbitrary load in the above-described range. It acts on the tip of the high load arm 13. The low-load arm 14
, A predetermined load is applied by a weight.

In order to offset the weights of the arms 13 and 14 and the shafts 15 and 16, a balance mechanism 1 is provided.
7 and 18 are provided, respectively, and an upward load is applied to the shafts 15 and 16 by weights or the like which are balanced with these weights to offset these weights.

On the lower base 10, a high load frictional force detecting mechanism 23 and a low load frictional force detecting mechanism 24 are provided.
Is provided. These friction force detection mechanisms 23, 24
Is an arm type, which abuts against the side of the distal end of the high load arm 13 or the low load arm 14 at the use position from the circumferential direction of rotation of the disk sample, and the gap between the piece sample and the disk sample Of these arms 13,
The load in the horizontal direction generated at the distal end of 14 is detected by a load cell or the like, and the frictional force is measured.

Next, each of the above mechanisms will be described. First, the high-load pressurizing mechanism 22 includes the above-described belofram mechanism 35, which is supplied with pressurized air at a controlled predetermined pressure and generates a predetermined pressurized load. This pressing load is applied to the rod 36 which can slide up and down.
Via the holder 3 at the tip of the high load arm 13
1 is pressed from above. A roller 37 is provided at the lower end of the rod 36 so as not to restrict the movement of the tip end of the high-load arm 13 in the rotational circumferential direction of the disk sample. The pressing load of the high-load pressing mechanism 22 is detected by a load cell provided at an appropriate location.

The high-load arm 13 includes an arm body 30, the holder 31 provided at the distal end of the arm body 30, and the base end of the arm body 30 connected to the shaft 15 as described above. And a bearing portion 32 which is rotatably supported on the shaft.

The above-described high-load frictional force detecting mechanism 2
3 includes an arm member 41 and a load cell 42 for detecting a frictional force as shown in FIG. The distal end of the arm member 41 is in contact with a side portion of the holder portion 31 of the high load arm 13, for example, a side surface formed vertically, via the non-constrained joint mechanism 43.

The unconstrained joint mechanism 43 applies a component component in the rotation circumferential direction and horizontal direction of the disk sample from the holder 31 to the arm member 41, that is, the disk sample A and the pin sample shown in FIG. B transmits only a component force component that accurately corresponds to the frictional force with the piece sample B such as B.

As shown in FIGS. 4 and 5, the unconstrained joint mechanism 43 includes, for example, a roller 44 rotatably supported by a vertical shaft 46 on the holder 31 side, and
A roller 45 rotatably supported by a horizontal shaft 47 orthogonal to the shaft 46 is provided on the tip end side of the arm member 41, and the peripheral surfaces of these rollers 44, 45 are in contact with each other. Have been.

As shown in FIG. 4, the friction surface between the disk sample A and the pin sample B is generally located at a position away from the center of twist of the high load arm 13, so that the frictional force between them causes this friction surface. The torsional deformation occurs in the arm 13. The arm 13 is provided with the high-load pressurizing mechanism 22 described above.
Other loads from the like also act. Therefore, when a friction and wear test is performed, a complicated deformation or load acts on the arm 13, and these are subjected to the above-described friction detection mechanism 23 for high load.
Error is generated when the data is transmitted to the load cell.

However, the above-mentioned unconstrained joint mechanism 43
Since the peripheral surfaces of the pair of rollers 44 and 45 rotatably supported by the shafts 46 and 47 in directions orthogonal to each other are in contact with each other, a predetermined direction from the holder 31 to the arm member, that is, the disk sample A The load other than the component component in the rotation circumferential direction and the horizontal direction of the rollers 4
All are released by the rotation of 4, 45. Therefore, only the force in the above direction is transmitted to the load cell 42,
The force in this direction exactly corresponds to the frictional force between the disk sample A and the pin sample B, so that the frictional force can be accurately measured.

The non-constrained joint mechanism is not limited to the structure as shown in FIG. 5, but various structures as shown in FIGS. 6 and 7 are conceivable. The unrestricted joint mechanism 43a shown in FIG. 6 has a roller 51 rotatably supported by a horizontal shaft 52 on the arm member 41 side in the same manner as described above, and a pair of seat members 53 on the holder member 31 side. A ball joint having a steel ball 54 interposed therebetween is provided. Such an unconstrained joint mechanism 43a
Also operates in the same manner as the above-described unconstrained joint mechanism 43.

The unconstrained joint mechanism 43b shown in FIG.
Is provided with a rotary ball bearing 55 called a free bear on the arm member 41 side, and a seat surface member 58 having a smooth finished vertical seat surface on the holder portion 31 side. The free bear 55 accommodates a steel ball 56 in a seat member 57 having a substantially hemispherical concave portion, and a plurality of small steel balls (between the steel ball 56 and the concave portion of the seat member 57. (Not shown). In this structure, the steel ball 56 is rotated in an arbitrary direction by the rolling of the small steel ball, and the same operation as that of the non-restrained joint mechanism 43 is performed.

The holder 31 of the high load arm 13 has the following structure in order to accurately press a piece sample such as a pin sample B against a disk sample A.

That is, the holder 31 has a U-shape as shown in FIG. 4, and both ends of the leaf spring member 60 are attached to both ends thereof. As shown in FIG. 8, the leaf spring member 60 is formed by cutting a block of a steel material, and has a block-shaped mounting portion 6 at both ends.
1 is formed, and a block-shaped sample mounting portion 62 is formed in the center portion, and a pin sample B is mounted here. Reference numeral 64 denotes a mounting screw for the pin sample B.

A pair of upper and lower leaf spring portions 63 are formed integrally between the sample mounting portion 62 and the mounting portions 61 at both ends. Therefore, when the leaf spring portion 63 is elastically deformed, the leaf spring member 60 acts as a leaf spring. In addition, since the upper and lower leaf spring portions 63 have a box-like structure integrally formed, the leaf spring member 6
0 has a predetermined rigidity, for example, a predetermined rigidity against torsional deformation.

As described above, when various undesired deformations occur in the high-load arm 13, this leaf spring member 60
These undesired deformations are absorbed by the elastic deformation of the leaf spring portion 63, and the pin sample B can be pressed onto the disk sample A in an accurate direction, for example, an accurate vertical direction. Further, since the plate spring member 60 has rigidity in a predetermined direction, the pin sample B itself is prevented from being undesirably inclined by the frictional force acting on the pin sample B. You.

The leaf spring member 60 is provided with a mechanism for directly detecting vibration of a piece sample such as the pin sample B described above. That is, this leaf spring member 6
An acceleration detector 65 is provided above the zero sample mounting part 62. The acceleration detector 65 detects, for example, vertical acceleration.
Is sent to the control unit 2 of the friction and wear tester via a signal line 66 and the like, and the acceleration signal is integrated, for example, to obtain a pin sample B or the like mounted on the sample mounting unit 62. The vibration, amplitude and the like of the piece sample can be calculated.

The measurement of the vibration of such a pin sample B is as follows.
It is measured when analyzing the behavior of friction and wear. In the above-described apparatus, since the acceleration detector 65 is directly mounted on the sample mounting portion 62, the vibration of the pin sample B is transmitted to the acceleration detector 65. The transmitted path is short, and this vibration is less likely to be attenuated due to deformation or internal loss of a member in the middle, or inertial mass, and the vibration of the pin sample B can be detected with high accuracy.

In this embodiment, since the sample mounting portion 62 has a block shape, the attenuation when the vibration of the pin sample B is transmitted is extremely small, and the measurement accuracy can be further increased. Further, this leaf spring member 60 is
Since it is not formed by joining a plurality of members but is formed integrally by cutting a block-shaped material, these members are joined between the joined portions of the plurality of members by the vibration of the pin sample B. The phenomenon of vibration in another mode, so-called chatter, does not occur, and the measurement accuracy can be further improved.

The holder 34 provided at the distal end of the low load arm 14 has the same configuration as described above, and the same leaf spring member as described above is attached to the holder 34. Further, a low-load friction force detection mechanism 24 is provided corresponding to the low-load arm 14, and the low-load friction force detection mechanism 24 has the same configuration as the high-load friction force detection mechanism 23 described above. Also, it is in contact with the side surface of the holder portion 34 of the low load arm 14 via the same non-restraining joint mechanism as described above. These mechanisms are of course designed for low loads.

FIG. 12 shows the acceleration detector 6 as described above.
5 shows an example of a friction and wear test performed by detecting the vibration of the pin sample B. In this test, while measuring the relationship between the load and the frictional force between the pin sample B and the disk sample A,
The vertical acceleration of the pin sample B is measured by the acceleration detector 65 described above. Then, as shown in FIG.
When this acceleration increases abruptly in a certain area, it is found that the pin sample B has a seizure phenomenon on the friction surface and surface roughness has occurred.

FIGS. 9 to 11 show a state in which the low-load arm 14 is in the use position. The low load arm 14 is formed to be lightweight for low load, for example, by forming a reduction hole 70 or the like. The low-load pressurizing mechanism of the low-load arm 14 uses a weight 71 in this embodiment.
A mechanism for mounting the weight 71 is provided on the holder portion 34.

The bearing 3 of the low load arm 14
Reference numeral 5 uses a rolling bearing such as a ball bearing as shown in FIG. 11, and is configured so that the rotation resistance with the shaft 16 is reduced. Since only a low load acts on the low-load arm 14, the load due to this load can be supported by the rolling bearing 35 as described above.

Each mechanism other than the disk drive mechanism 11 described above, ie, the high load arm 13, the low load arm 14, the high load pressurizing mechanism 22, the balance mechanisms 17, 18 and the high load friction force The detection mechanism 23, the low-load frictional force detection mechanism 24, and the like are fixedly installed on the lower base 10 and the upper base 20 described above. The above-described disk drive mechanism 11 is configured to be movable in a horizontal direction with respect to the lower base 10 by an eccentric mechanism 80.

That is, the disk drive mechanism 11
The entirety of the arm 1 is mounted on a moving table 81, and the moving table 81 is moved along a rail 82 so that the arm 1 in the use position is
It is possible to move in a direction parallel to 3 and 14. Also,
On the lower base 10, a micrometer mechanism 83 capable of accurately moving the movable base 81 is provided. Further, the movable table 81 can be fixed at an arbitrary position by a clamp mechanism 84 shown in FIGS.

Therefore, this micrometer mechanism 83
Is operated, the disk drive mechanism 11 moves in the horizontal direction together with the movable table 81, and the arms 13,
Pin sample B attached to 14 holders 31 and 34
And the eccentric amount of the rotation center of the disk sample A can be adjusted. Thus, the pin sample B can be brought into accurate contact with an arbitrary position of the disk sample A.

Therefore, instead of arranging the mechanisms such as the arms 13 and 14 so as to be movable, the eccentricity can be adjusted as described above by arranging the disk drive mechanism 11 so as to be movable. And the structure is simplified.

The present invention is not limited to the above embodiment. For example, the present invention is not limited to one provided with both a high-load arm and a low-load arm, and may be applied to a friction and wear tester provided with only one of them.

The eccentric mechanism for moving the above-mentioned disk drive mechanism is not necessarily limited to the above-mentioned structure, but may be other mechanisms such as a rack and pinion mechanism and a link mechanism. Can be adopted.

[0049]

As described above, according to the present invention, by moving the moving table to move the disk drive mechanism, the piece sample mounted on the distal end of the load arm and the rotation center of the disk sample can be moved. Can be adjusted, and the piece sample can be accurately brought into sliding contact with an arbitrary position on the disk sample.

In the present invention, only the disk drive mechanism is moved, and the other mechanisms are fixedly installed on the base, so that the structure is simple. Also, this disk drive mechanism only drives the disk sample to rotate, and its structure is simpler and more unitized than other mechanisms. The structure is less complicated and the accuracy is not reduced.

[Brief description of the drawings]

FIG. 1 is an overall front view of a friction and wear tester according to an embodiment of the present invention.

FIG. 2 is a front view of a part of the measuring device of FIG. 1;

FIG. 3 is a view taken along line 3-3 in FIG. 2;

FIG. 4 is a view taken in the direction of arrows 4-4 in FIG. 3;

FIG. 5 is a schematic configuration diagram of an unconstrained joint mechanism.

FIG. 6 is a schematic configuration diagram of another form of a non-restraint joint mechanism.

FIG. 7 is a schematic configuration diagram of a non-restraint joint mechanism of still another embodiment.

FIG. 8 is a perspective view of a leaf spring member.

FIG. 9 is a rear view of the state in which the low-load arm is at the use position as viewed from the rear.

FIG. 10 is a view taken along line 10-10 of FIG. 9;

FIG. 11 is an enlarged side view of the low load arm.

FIG. 12 is a diagram illustrating an example of a friction and wear test.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 11 Disk drive mechanism 13 High load arm 14 Low load arm 22 High load pressurization mechanism 23 High load friction force detection mechanism 24 Low load friction force detection mechanism 71 Weight 80 Eccentric mechanism 81 Moving table 83 Micrometer mechanism A disk sample B pin sample

Continuation of the front page (56) References JP-A-63-52037 (JP, A) JP-A-61-258145 (JP, A) JP-A-60-246058 (JP, A) JP-A-8-327523 (JP) JP-A-8-219968 (JP, A) JP-A-6-201572 (JP, A) JP-A-3-53146 (JP, A) (58) Fields investigated (Int. Cl. ⁷ , DB (Name) G01N 3/56

Claims (2)

(57) [Claims] 1. A base, a disk drive mechanism for rotatingly driving a disk sample, a load arm for holding a piece sample that slides on the disk sample, and the piece sample held at a tip end of the load arm A load pressing mechanism for applying a predetermined load to the disk arm and a frictional force detecting mechanism for detecting a force acting on the load arm by friction between the disk sample and the piece sample. A friction and wear test, comprising: a pressure mechanism and a frictional force detection mechanism installed on the base; and an eccentric mechanism for moving the disk drive mechanism in a horizontal direction with respect to the base. Machine. 2. The eccentric mechanism according to claim 1, wherein said eccentric mechanism comprises a movable table to which said disk drive mechanism is attached and is movably guided with respect to said base, and a micrometer mechanism for moving said movable table. The friction and wear testing machine according to claim 1, wherein: