JP3319906B2 - Circuit breaker with open phase protection - Google Patents

Circuit breaker with open phase protection

Info

Publication number
JP3319906B2
JP3319906B2 JP06936695A JP6936695A JP3319906B2 JP 3319906 B2 JP3319906 B2 JP 3319906B2 JP 06936695 A JP06936695 A JP 06936695A JP 6936695 A JP6936695 A JP 6936695A JP 3319906 B2 JP3319906 B2 JP 3319906B2
Authority
JP
Japan
Prior art keywords
circuit
voltage
phase
detection
reference voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP06936695A
Other languages
Japanese (ja)
Other versions
JPH0898395A (en
Inventor
毅 田中
雅隆 神田
仁 牧永
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP06936695A priority Critical patent/JP3319906B2/en
Publication of JPH0898395A publication Critical patent/JPH0898395A/en
Application granted granted Critical
Publication of JP3319906B2 publication Critical patent/JP3319906B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は、単相3線式電源相の欠
相を検出した場合に電路を遮断する欠相保護機能付き遮
断器に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a circuit breaker having an open-phase protection function for interrupting an electric circuit when an open-phase of a single-phase three-wire power supply phase is detected.

【0002】[0002]

【従来の技術】従来この種の欠相保護機能付き遮断器に
おいては、負荷側の中性線と各相との間の負荷電圧と、
基準電圧とを比較して、負荷電圧が基準電圧を越えると
電路に挿入してある主接点を開放して電源遮断を行い負
荷を保護している。しかしながら例えば定格電圧の15
0%の電圧と、200%の電圧が印加された場合にも同
一時間で遮断してしまい、近年の家電製品のようにマイ
クロコンピュータを搭載して過電圧耐圧が低下している
ものが負荷の場合、負荷を十分に保護できないという問
題があった。
2. Description of the Related Art Conventionally, in this type of circuit breaker having an open-phase protection function, a load voltage between a neutral line on a load side and each phase,
When the load voltage exceeds the reference voltage and the load voltage exceeds the reference voltage, the main contact inserted in the electric circuit is opened to shut off the power and protect the load. However, for example, the rated voltage of 15
When a 0% voltage and a 200% voltage are applied, the load is cut off in the same time, and the load is such as a recent home appliance equipped with a microcomputer and having a reduced overvoltage withstand voltage. However, there is a problem that the load cannot be sufficiently protected.

【0003】そこで、本出願人は、特開平5−2906
85号に示すものを提案している。このものは負荷側の
中性線と各相との間の負荷電圧と基準電圧とを比較して
負荷電圧が基準電圧以上になると一定電流でコンデンサ
を充電してコンデンサの電圧が一定以上に達するまで欠
相検出信号の出力を遅延させる構成を持つものである。
Accordingly, the present applicant has disclosed in Japanese Patent Laid-Open No. 5-2906 / 1993.
No. 85 is proposed. This device compares the load voltage between the neutral line on the load side and each phase with the reference voltage, and when the load voltage exceeds the reference voltage, charges the capacitor with a constant current and the capacitor voltage reaches a certain level or more The configuration has a configuration for delaying the output of the open phase detection signal up to this point.

【0004】[0004]

【発明が解決しようとする課題】上記の特開平5−29
0685号に示す従来例は欠相時に負荷にかかる電圧の
値に応じた遅延時間を確保し、保護性能の向上を図った
ものであるが、しかしながら動作時間の設定が困難であ
った。本発明は上記問題点に鑑みて為されたもので、請
求項1の発明の目的とするところは、複数の検出段階を
持ち、各検出段階で遅延時間を設定できる欠相保護機能
付き遮断器を提供するにある。
The above-mentioned JP-A-5-29
In the conventional example shown in Japanese Patent No. 0685, a delay time corresponding to the value of the voltage applied to the load at the time of phase loss is ensured to improve the protection performance, however, it is difficult to set the operation time. SUMMARY OF THE INVENTION The present invention has been made in view of the above problems, and an object of the present invention is to provide a circuit breaker having an open-phase protection function having a plurality of detection stages and setting a delay time in each detection stage. To provide.

【0005】請求項2の発明の目的とするところは、請
求項1の発明の目的に加えて負荷保護をより確実にした
欠相保護機能付き遮断器を提供するにある。請求項3の
発明の目的とするところは、請求項1又は請求項2の発
明の目的に加えて部品点数を少なくした欠相保護機能付
き遮断器を提供するにある。請求項4の発明の目的とす
るところは、請求項3の発明の目的に加えて、欠相遮断
後、欠相状態のまま再投入され際に即欠相検出が行えて
負荷保護が図れる欠相保護機能付き遮断器を提供するに
ある。
It is an object of the present invention to provide a circuit breaker having an open-phase protection function which more reliably protects a load in addition to the object of the present invention. A third object of the present invention is to provide a circuit breaker with an open-phase protection function in which the number of parts is reduced in addition to the objects of the first or second aspect of the present invention. The object of the invention of claim 4 is that, in addition to the object of the invention of claim 3, it is possible to immediately detect an open phase when the power is turned on again after the open phase is cut off, thereby protecting the load. An object of the present invention is to provide a circuit breaker with a phase protection function.

【0006】[0006]

【課題を解決するための手段】上記目的を達成するため
に請求項1の発明では、負荷側の中性線と各相との間の
負荷電圧と基準電圧とを比較して負荷電圧が基準電圧以
上になると欠相を検出する検出回路と、この検出回路が
欠相検出すると検出回路からの一定電流でコンデンサを
充電してコンデンサの電圧が一定以上に達するまで欠相
検出信号の出力を遅延させる遅延回路とを有した欠相検
出手段と、この欠相検出手段から出力される欠相検出信
号にてオンするスイッチ手段と、このスイッチ手段で励
磁される主接点の引外しコイルとを備え、引外しコイル
の励磁によって電路に挿入された主接点を開放する欠相
保護機能付き遮断器において、上記欠相検出手段には夫
々異なる基準電圧を持ち負荷電圧が基準電圧以上となっ
た時に欠相を検出する少なくとも2つの検出回路を有し
たものである。
In order to achieve the above object, according to the first aspect of the present invention, a load voltage between a neutral line on the load side and each phase is compared with a reference voltage, and the load voltage is set to a reference voltage. A detection circuit that detects a phase loss when the voltage exceeds the voltage, and when the detection circuit detects a phase loss, charges the capacitor with a constant current from the detection circuit and delays the output of the phase loss detection signal until the voltage of the capacitor reaches a certain level or more An open-phase detecting means having a delay circuit for turning on, a switch means to be turned on by an open-phase detection signal output from the open-phase detecting means, and a trip coil for a main contact excited by the switch means. In a circuit breaker with an open-phase protection function that opens a main contact inserted into an electric circuit by excitation of a trip coil, the open-phase detection means have different reference voltages and are disconnected when the load voltage becomes higher than the reference voltage. Detect phase That those having at least two detection circuits.

【0007】請求項2の発明では、請求項1の発明にお
いて、前記検出回路の少なくとも一つに、基準電圧以上
の負荷電圧が検出されると、当該検出回路からの一定電
流とともに前記コンデンサへ負荷電圧に応じた電流を流
す充電制御手段を備えたものである。請求項3の発明で
は、請求項1又は2の発明において、前記遅延回路は、
各検出回路に対して共通とし、各検出回路が欠相検出す
ると夫々に対応して一定電流で共通のコンデンサを充電
するものである。
According to a second aspect of the present invention, in the first aspect of the present invention, when a load voltage equal to or higher than a reference voltage is detected in at least one of the detection circuits, a load is applied to the capacitor with a constant current from the detection circuit. It is provided with charging control means for flowing a current corresponding to the voltage. According to a third aspect of the present invention, in the first or second aspect, the delay circuit comprises:
The common capacitor is used for each detection circuit, and when each of the detection circuits detects a phase loss, the common capacitor is charged with a constant current corresponding to each.

【0008】請求項4の発明では、請求項3の発明にお
いて、基準電圧が高い方の検出回路の基準電圧を電源投
入時から一定率で上昇させて定常値に達するまでの時間
を、他方の検出回路の基準電圧が定常値に達するまでの
時間よりも遅くしたものである。
[0008] In the invention of claim 4, the invention of claim 3 is provided.
The time required for the reference voltage of the detection circuit having the higher reference voltage to be increased at a constant rate from power-on until reaching a steady value is longer than the time required for the reference voltage of the other detection circuit to reach a steady value. It was slow.

【0009】[0009]

【作用】請求項1の発明によれば、欠相検出手段には夫
々異なる基準電圧を持ち負荷電圧が基準電圧以上となっ
た時に欠相を検出する少なくとも2つの検出回路を有し
ているので、複数の検出段階を持つことができ、各検出
段階で遅延時間を設定することが可能となる。
According to the first aspect of the present invention, the open phase detecting means has at least two detection circuits which have different reference voltages and detect the open phase when the load voltage becomes higher than the reference voltage. , A plurality of detection stages, and a delay time can be set in each detection stage.

【0010】請求項2の発明によれば、請求項1の発明
において、前記検出回路の少なくとも一つに、所定電圧
以上の負荷電圧が検出されると、前記遅延回路からの一
定電流とともに前記コンデンサへ負荷電圧に応じた電流
を流す充電制御手段を備えたものであるから、負荷電圧
が所定電圧以上になるとコンデンサの充電を早めること
ができて、負荷保護をより確実なものとすることができ
る。
According to a second aspect of the present invention, in the first aspect of the present invention, when a load voltage equal to or more than a predetermined voltage is detected in at least one of the detection circuits, the capacitor together with a constant current from the delay circuit is detected. Since charge control means for supplying a current according to the load voltage to the load is provided, when the load voltage becomes a predetermined voltage or more, the charging of the capacitor can be accelerated, and the load protection can be further ensured. .

【0011】請求項3の発明によれば、請求項1又は2
の発明において、遅延回路は、各検出回路が夫々の基準
電圧以上になると各検出回路から一定電流で共通のコン
デンサを充電するので、遅延回路を共通化できて回路部
品の点数を削減できる。請求項4の発明によれば、請求
項3の発明において、基準電圧が高い方の検出回路の基
準電圧を電源投入時から一定率で上昇させて定常値に達
するまでの時間を、他方の検出回路の基準電圧が定常値
に達するまでの時間よりも遅くしたので、定常時におい
て基準電圧の高い方の検出回路が電源投入時には他方の
検出開路が欠相を検出するタイミングよりも早い時期で
欠相を検出することが可能とあんり、そのため欠相状態
で電源が投入された場合にあっても、即時に欠相検出が
行えて速やかに負荷保護が図れ、特に欠相遮断後、欠相
原因が除去されないまま再投入された場合にも確実に負
荷保護が図れる。
According to the invention of claim 3, claim 1 or 2
In the present invention, the delay circuit charges a common capacitor with a constant current from each detection circuit when each detection circuit exceeds the respective reference voltage. Therefore, the delay circuit can be shared and the number of circuit components can be reduced. According to a fourth aspect of the present invention, in the third aspect of the present invention, the time from when the power supply is turned on to the time when the reference voltage of the detection circuit having the higher reference voltage is increased at a constant rate to reach a steady value is determined by the other detection circuit. Since the time required for the reference voltage of the circuit to reach the steady-state value is delayed, when the detection circuit with the higher reference voltage in the steady state is turned on, the other detection open circuit is disconnected earlier than the timing of detecting the open phase. Because it is possible to detect the phase, even if the power is turned on in the open phase state, the open phase can be detected immediately and the load can be protected immediately. The load protection can be ensured even when the power supply is re-input without removing.

【0012】[0012]

【実施例】以下、本発明の実施例を図面を参照して説明
する。 (実施例1)図2は本発明の基本となる回路構成を示し
ており、単相3線の各電路L1 ,L 2 及び中性線路Nに
は主接点S1 を夫々挿入してある。一点鎖線の枠で囲ま
れた部分は中性欠相保護回路を示しており、この保護回
路内では電路L1 ,L2 がダイオードDBにより全波整
流されて欠相検出回路部Aの端子、間に入力し、ま
た中性線路Nからの検出線Lnは、電路L1 ,L2 間に
接続した抵抗R1 、R 2 (=R1 )の分圧点に接続さ
れ、この分圧点は更に抵抗R3 を通じて欠相検出回路部
1の検出端子に接続してある。
Embodiments of the present invention will be described below with reference to the drawings.
I do. (Embodiment 1) FIG. 2 shows a basic circuit configuration of the present invention.
And each single-phase three-wire circuit L1, L TwoAnd neutral line N
Is the main contact S1Are inserted respectively. Surrounded by a dashed line frame
The shaded portion indicates the neutral phase loss protection circuit.
Electric circuit L in the road1, LTwoIs full-wave rectified by diode DB
Input to the terminal of the open-phase detection circuit section A,
The detection line Ln from the neutral line N1, LTwoBetween
Connected resistor R1, R Two(= R1) Connected to the partial pressure point
This partial pressure point is further added to the resistance RThreeOpen phase detection circuit section through
1 detection terminal.

【0013】検出端子の電圧は電源及び負荷が正常に
接続されている場合には振幅の揃った脈流電圧が現れる
ことになるが、中性線路Nが断線して欠相が生じると、
1相、L2 相の負荷による分圧比によって交互に大小
となる脈流電圧になり、この端子の電位が所定レベル
を越えると欠相検出回路部Aで欠相検出が行われて欠相
検出信号が出力端子より出力され、この欠相検出信号
でスイッチング手段であるサイリスタSCRをオンさ
せ、上記の引外しコイルCLに励磁電流を流して主接点
1 の開放を行い、負荷保護を図るのである。尚ZNR
1 …はサージ吸収素子である。
When the power supply and the load are normally connected, a pulsating voltage having a uniform amplitude appears as the voltage at the detection terminal.
L 1 phase, becomes the ripple voltage becomes large and small alternately by dividing ratio according to the load of the L 2 phase, phase loss potential of the terminal is performed the open phase detected exceeds a predetermined level open-phase detecting circuit section A detection signal is outputted from an output terminal, in this open phase detection signal to turn on the thyristor SCR is switching means performs opening of the main contact S 1 by passing the tripping exciting current to the coil CL, achieve load protection It is. ZNR
1 are surge absorbing elements.

【0014】ここで、本実施例における欠相検出回路部
Aは図1に示すように構成してある。つまり端子は定
電圧回路1の入力端に、端子はグランドに接続され、
ダイオードブリッジDBからの脈流電圧を一定電圧の直
流に変換して欠相検出回路部Aの各回路への動作電源を
得ている。
Here, the open phase detecting circuit section A in the present embodiment is configured as shown in FIG. That is, the terminal is connected to the input terminal of the constant voltage circuit 1, the terminal is connected to the ground,
The pulsating voltage from the diode bridge DB is converted into a constant DC voltage to obtain an operating power supply for each circuit of the phase loss detection circuit A.

【0015】検出端子は、比較器2a,2bの非反転
端子に夫々接続され、検出端子の電圧が比較器2a,
2bの反転端子に印加してある基準電圧Vs1 ,Vs2
と比較されるようになっている。比較器2a,2bは波
形整形回路3a,3bとで、夫々第1、第2の検出回路
I,IIを構成しており、欠相が生じて検出端子に図3
(a)に示すような脈流電圧が現れ、比較器2a或いは
比較器2bの基準電圧Vs1 或いはVs2 以上になる
と、比較器2a或いは2bよりその期間中検出出力が発
生する。
The detection terminals are connected to the non-inverting terminals of the comparators 2a and 2b, respectively.
Reference voltages Vs 1 and Vs 2 applied to the inverting terminal of 2b
Is to be compared to. The comparators 2a and 2b form first and second detection circuits I and II together with the waveform shaping circuits 3a and 3b, respectively.
Appears pulsating voltage as shown (a), the comparator 2a or comparator when 2b becomes the reference voltage Vs 1 or Vs 2 or more, the comparator 2a or the period during detection output from 2b occurs.

【0016】波形整形回路3a(或いは3b)は図5に
示すように構成されており、比較器2a(或いは2b)
の出力が”H”になると、コンデンサC1 (或いは
2 )の電荷をノットゲートを介して放電し、負荷電圧
が基準電圧Vs1 或いはVs2 以下になって比較器2a
(或いは2b)の出力が”L”になると定電流源20に
よりコンデンサC1 (或いはC2 )を図3(b)或いは
(c)に示すように充電する。そしてこの電圧が波形整
形回路3a(或いは3b)内の比較器21のスレッショ
ルドレベルVth1 (或いはVth2 )を越えた場合に
比較器21より”L”出力が発生し、以下時には”H”
出力が発生する。ここでコンデンサC1 (或いはC2
の充電がスレッショルドレベルVth1 (或いはVth
2 )を越えるには少なくとも交流電源周波数の3サイク
ル以上、負荷電圧が基準電圧Vs1 或いはVs2 以下を
継続することが必要となるように設定している。
The waveform shaping circuit 3a (or 3b) is configured as shown in FIG. 5, and the comparator 2a (or 2b)
Becomes the output is "H", the capacitor C 1 (or C 2) the charge of the discharge through the NOT gate, comparator 2a load voltage becomes equal to or lower than the reference voltage Vs 1 or Vs 2
When the output of (or 2b) becomes “L”, the capacitor C 1 (or C 2 ) is charged by the constant current source 20 as shown in FIG. 3 (b) or (c). The "L" output from the comparator 21 occurs when the voltage exceeds the threshold level Vth 1 of the comparator 21 of the waveform shaping circuit 3a (or 3b) within (or Vth 2), hereinafter sometimes "H"
Output occurs. Where capacitor C 1 (or C 2 )
Is charged to the threshold level Vth 1 (or Vth 1
2) at least AC power supply frequency of 3 cycles or more in excess, are set to be required to load voltage to continue the reference voltage Vs 1 or Vs 2 below.

【0017】波形整形回路3a,3bの出力は夫々遅延
回路4a,4bに接続されており、この波形整形回路3
a,3bの比較器21の”H”出力を受けて遅延回路4
a,4bは図3(d)(e)に示すように夫々に設けて
あるコンデンサC3 ,C4 を定電流で充電するようにな
っている。つまり図5に示すように遅延回路4a(或い
は4b)は比較器21の出力が”H”になると、コンデ
ンサC3 (或いはC4)を定電流源22により一定電流
で充電する。このコンデンサC3 ,C4 の電圧は比較器
5a,5bで、スレッショルドレベルVth3 ,Vth
4 と比較されるようになっており、このスレッショルド
レベルVth3 ,Vth4 をコンデンサC3 ,C4 の電
圧が越えたえたときに比較器5a,5bから”H”信号
を出力する。
The outputs of the waveform shaping circuits 3a and 3b are connected to delay circuits 4a and 4b, respectively.
a and 3b receiving the "H" output of the comparator 21 and the delay circuit 4
As shown in FIGS. 3D and 3E, a and 4b charge capacitors C 3 and C 4 provided at a constant current, respectively. That is, as shown in FIG. 5, when the output of the comparator 21 becomes “H”, the delay circuit 4 a (or 4 b) charges the capacitor C 3 (or C 4 ) with a constant current by the constant current source 22. The voltages of the capacitors C 3 and C 4 are supplied to the comparators 5 a and 5 b, respectively, and the threshold levels Vth 3 and Vth
4 is adapted to be compared, and outputs a signal "H" from the comparator 5a, 5b when the threshold level Vth 3, Vth 4 is the voltage of the capacitor C 3, C 4 and withstand exceeded.

【0018】比較器5a,5bの出力はオアゲート6を
介して出力回路7に入力しており、出力回路7は何れか
の比較器5a,5bの出力が”H”になると、欠相検出
信号を図3(f)に示すように出力端子より出力す
る。このように本実施例では第1、第2の検出回路I、
IIを備え、夫々において設定してある基準電圧Vs1
Vs2 を負荷電圧が越えたときに、遅延回路4a,4b
におけるコンデンサC3 ,C4 の充電を開始するもの
で、複数(実施例では2)の検出段階を持ち、また夫々
に対応する遅延回路4a、4bのコンデンサC 3 ,C4
に対する充電電流の大きさ或いはコンデンサの容量を異
ならせ、高い基準電圧を設定している側の第2の検出回
路に対応する遅延回路4bの方が充電開始から短い時間
でスレッショルドレベルVth3 に達するようにしてあ
る。従って負荷電圧が高い場合には短時間で欠相検出信
号が発生し、速やかに負荷保護が図れ、逆に負荷電圧が
低い場合には欠相検出信号が発生するまでの時間が長く
して、一過性による動作等を防いで信頼性を高めてい
る。
The outputs of the comparators 5a and 5b are connected to the OR gate 6.
Input to the output circuit 7 via the
When the outputs of the comparators 5a and 5b become "H", the open phase is detected.
The signal is output from the output terminal as shown in FIG.
You. Thus, in the present embodiment, the first and second detection circuits I,
II and the reference voltage Vs set in each1,
VsTwoDelay circuits 4a and 4b
Capacitor C atThree, CFourTo start charging
And has a plurality of (two in the embodiment) detection stages, and
C of the delay circuits 4a and 4b corresponding to Three, CFour
The magnitude of the charging current or the capacitance of the capacitor
The second detection circuit on the side where the high reference voltage is set.
The delay circuit 4b corresponding to the road has a shorter time from the start of charging.
And the threshold level VthThreeTo reach
You. Therefore, if the load voltage is high, the open-phase detection
Signal is generated and load protection can be achieved promptly.
If it is low, the time until the open phase detection signal is generated is long
To improve reliability by preventing transient operation, etc.
You.

【0019】図4は本実施例における保護領域を示して
おり、X1 は第1の検出回路I、X 2 は第2の検出回路
IIの保護領域を示す。 (実施例2)上記実施例1の欠相検出回路部Aでは第
1、第2の検出回路に対応して遅延回路4a,4bを設
けたが、本実施例では図6に示すように遅延回路4a,
4bを共通化して一つの遅延回路4と、比較器5とで欠
相検出信号の遅延を行い、回路部品数の低減を図ってい
る。
FIG. 4 shows a protected area in this embodiment.
Yes, X1Are the first detection circuits I and X TwoIs the second detection circuit
The protected area of II is shown. (Embodiment 2) In the phase loss detection circuit section A of Embodiment 1 described above,
Delay circuits 4a and 4b are provided corresponding to the first and second detection circuits.
However, in the present embodiment, as shown in FIG.
4b is shared and one delay circuit 4 and comparator 5 are missing.
The phase detection signal is delayed to reduce the number of circuit components.
You.

【0020】つまり本実施例では波形整形回路3a,3
bの出力を遅延回路4が受けてコンデンサC5 を充電す
るようになっており、第1の検出回路I側の波形整形回
路3aの出力を受けて図7(d)に示すように遅延回路
4はコンデンサC5 の充電を開始し、その後第2の検出
回路II側の検出レベルを越えたとき波形整形回路3bの
出力を受けて充電電流を増加させ、コンデンサC5 を充
電するのである。この場合遅延回路4には各波形成形回
路3a,3bに対応する定電流源22を備え、その電流
を加算するようになっている。
That is, in this embodiment, the waveform shaping circuits 3a and 3
b outputs the delay circuit 4 receives with the adapted to charge the capacitor C 5, the first detecting circuit I side delay circuit as shown in FIG. 7 (d) receiving an output of the waveform shaping circuit 3a of 4 begins charging the capacitor C 5, then receives the output of the second detecting circuit II side of the waveform shaping circuit 3b when exceeding the detection level increases the charging current is to charge the capacitor C 5. In this case, the delay circuit 4 is provided with a constant current source 22 corresponding to each of the waveform shaping circuits 3a and 3b, and the currents are added.

【0021】そして第2の検出回路II側の波形整形回路
3bの出力を受けると、コンデンサC5 の充電電圧の上
昇が速くなり、その分比較器5のスレッショルドレベル
Vth5 を越えるまでの時間が短縮され、図7(e)に
示す出力回路7からの欠相検出信号の出力されるまでの
時間が早くなる。尚第1、第2の検出回路I、IIの動作
は実施例1と同様に動作するもので、図7(a)は検出
端子の電圧と、比較器2a,2bの基準電圧Vs1
Vs2 との関係を示し、図7(b)(c)は、図3
(b)(c)と同様に夫々波形整形回路3a,3bの動
作状態の波形を示している。
[0021] When the receiving output of the second detecting circuit II side of the waveform shaping circuit 3b, increase in the charging voltage of the capacitor C 5 is faster, the time until it exceeds the threshold level Vth 5 of that amount comparator 5 As a result, the time until the output of the phase loss detection signal from the output circuit 7 shown in FIG. The operation of the first and second detection circuits I and II is the same as that of the first embodiment. FIG. 7A shows the voltage of the detection terminal and the reference voltages Vs 1 and Vs 1 of the comparators 2a and 2b.
7 (b) and 7 (c) show the relationship with Vs 2 .
7B and 7C show waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively.

【0022】図8は本実施例における保護領域を示して
おり、X1 は第1の検出回路I、X 2 は第2の検出回路
IIの保護領域を示す。 (実施例3)本実施例の欠相検出回路部Aは実施例1の
回路構成を基本とするとともに、図9に示すように負荷
電圧が基準電圧Vs1 以上となったときに行われる図1
0(d)に示す定電流I1 による遅延回路4aのコンデ
ンサC3 の充電に加え、負荷電圧の大きさに対応した電
流I2 を図10(e)に示すようにコンデンサC3 に流
して充電する電圧−電流変換回路8を第1の検出回路I
に付設したものである。
FIG. 8 shows a protected area in this embodiment.
Yes, X1Are the first detection circuits I and X TwoIs the second detection circuit
The protected area of II is shown. (Embodiment 3) The open phase detection circuit section A of the present embodiment is
In addition to the basic circuit configuration, as shown in FIG.
Voltage is reference voltage Vs1Figure 1 performed when it becomes the above
0 (d) constant current I1Of delay circuit 4a
Sensor CThreeIn addition to charging the battery,
Style ITwoTo the capacitor C as shown in FIG.ThreeFlow
The voltage-current conversion circuit 8 for charging by charging the first detection circuit I
It is attached to.

【0023】つまり本実施例では比較器2aの基準電圧
Vs1 と同じ電圧をツエナー電圧とするツエナーダイオ
ードDZを電圧−電流変換回路8の入力側に接続して負
荷電圧がツエナー電圧を越えると、このツエナーダイオ
ードDZを介して入力される電圧の大きさに応じた電流
2 を図10(e)に示すように遅延回路4aのコンデ
ンサC3 に流して充電するのである。
[0023] That Zener diode DZ voltage to the Zener voltage of the same voltage as the reference voltage Vs 1 of the comparator 2a in the present embodiment - when the load voltage is connected to the input side of the current converter circuit 8 exceeds a Zener voltage, the Zener current I 2 corresponding to the magnitude of the voltage input via a diode DZ is to charge flowing to the delay circuit 4a capacitor C 3 of, as shown in FIG. 10 (e).

【0024】従って、図10(a)に示す負荷電圧のレ
ベルが高くなると、それに対応してコンデンサC3 を充
電する充電電流が増大して、図10(f)に示すコンデ
ンサC3 の電圧の上昇が早くなって、比較器2aのスレ
ッショルドレベルVth3 に達するまでの時間が短縮さ
れる。つまり負荷電圧に応じて遅延動作時間を可変する
ことができるのである。
Therefore, when the level of the load voltage shown in FIG. 10A increases, the charging current for charging the capacitor C 3 increases correspondingly, and the voltage of the capacitor C 3 shown in FIG. rise is earlier and reduces the time to reach the threshold level Vth 3 comparators 2a. That is, the delay operation time can be varied according to the load voltage.

【0025】尚第2の検出回路II側の動作は実施例1に
準じており、図10(g)に示す遅延回路4bのコンデ
ンサC4 の充電電圧は比較器5bでスレッショルドレベ
ルVth4 と比較される。比較器5a,5bの出力はオ
アゲート6を通じて出力回路7に入り、出力回路7は比
較器5a,5bの何れかの出力が”H”になったときに
図10(h)に示す欠相検出信号を出力する。
[0025] Note that operation of the second detection circuit II side is prepared analogously to Example 1, the charging voltage of the capacitor C 4 of the delay circuit 4b shown in FIG. 10 (g) and the threshold level Vth 4 in comparator 5b compares Is done. The outputs of the comparators 5a and 5b enter the output circuit 7 through the OR gate 6, and the output circuit 7 detects the open phase shown in FIG. 10 (h) when any of the outputs of the comparators 5a and 5b becomes "H". Output a signal.

【0026】尚図10(b)(c)は、図3(b)
(c)と同様に夫々波形整形回路3a,3bの動作状態
の波形を示している。図11は本実施例における保護領
域を示しており、X1 は第1の検出回路I、X2 は第2
の検出回路IIの保護領域を示す。 (実施例4)本実施例の欠相検出回路部Aは実施例2の
回路構成に実施例3の回路構成を加えたもので、図12
に示すように負荷電圧が基準電圧Vs1 以上となったと
きに負荷電圧の大きさに対応した図13(e)に示す電
流I2 を遅延回路4のコンデンサC5 に流して充電する
電圧−電流変換回路8を付設したものである。
FIGS. 10 (b) and 10 (c) correspond to FIGS.
7C shows the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIG. FIG. 11 shows a protection area in the present embodiment, where X 1 is the first detection circuit I, and X 2 is the second detection circuit.
3 shows a protection area of the detection circuit II. (Embodiment 4) An open-phase detection circuit portion A of this embodiment is obtained by adding the circuit configuration of Embodiment 3 to the circuit configuration of Embodiment 2 and FIG.
Voltage load voltage to charge flowing to the capacitor C 5 of the reference voltage Vs 1 or more when the became current shown in FIG. 13 (e) corresponding to the magnitude of the load voltage I 2 a delay circuit 4 as shown in - It is provided with a current conversion circuit 8.

【0027】つまり本実施例では比較器2aの基準電圧
Vs1 と同じ電圧のツエナー電圧とするツエナーダイオ
ードDZを電圧−電流変換回路8の入力側に接続して負
荷電圧がツエナー電圧を越えると、このツエナーダイオ
ードDZを介して入力される電圧の大きさに応じた電流
2 を図13(e)に示すように遅延回路4のコンデン
サC5 に流して充電するのである。
[0027] That the Zener diode DZ to Zener voltage of the same voltage as the reference voltage Vs 1 of the comparator 2a in the present embodiment the voltage - the load voltage is connected to the input side of the current converter circuit 8 exceeds a Zener voltage, the Zener current I 2 corresponding to the magnitude of the voltage input via a diode DZ is to charge flowing to the capacitor C 5 of the delay circuit 4 as shown in FIG. 13 (e).

【0028】従って、波形整形回路3a,3bの出力を
受けて遅延回路4のコンデンサC5に図13(d)に示
す定電流I1 が流れて充電されるのに加えて図13
(a)に示す負荷電圧のレベルに応じた電流I2 がコン
デンサC5 を充電するため、その分図13(f)に示す
コンデンサC5 の電圧の上昇が早くなり、比較器5のス
レッショルドレベルVth5 に達するまでの時間が短縮
される。つまり負荷電圧に応じて遅延動作時間を可変す
ることができるのである。
[0028] Thus, in addition to the waveform shaping circuit 3a, receives the output of the 3b to the capacitor C 5 of the delay circuit 4 is a constant current I 1 shown in FIG. 13 (d) are charged flows 13
Since the current I 2 corresponding to the level of the load voltage illustrated in (a) charges the capacitor C 5, increase in the voltage of the capacitor C 5 is faster shown in the-figures 13 (f), the threshold level of the comparator 5 time to reach the Vth 5 is shortened. That is, the delay operation time can be varied according to the load voltage.

【0029】尚第1、第2の検出回路I、IIの動作は実
施例1、2に準じているため、構成及び動作の説明は省
略する。尚図13(b)(c)は、図3(b)(c)と
同様に夫々波形整形回路3a,3bの動作状態の波形を
示し、図13(g)は出力回路7の欠相検出信号を示
す。
Since the operations of the first and second detection circuits I and II are in accordance with the first and second embodiments, the description of the configuration and operation is omitted. FIGS. 13B and 13C show the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIGS. 3B and 3C. FIG. Indicates a signal.

【0030】図14は本実施例における保護領域を示し
ており、X1 は第2の検出回路I、X2 は第2の検出回
路IIの保護領域を示す。以上のように構成された本実施
例は実施例2の特徴と実施例3の特徴とを併せ持つこと
になる。 (実施例5)実施例3における電圧−電流変換回路8は
第1の検出回路Iに付設したものであるが、本実施例は
図15に示すように第2の検出回路IIに付設したもので
ある。つまり本実施例では負荷電圧が基準電圧Vs2
上となったときに行われる図16(d)に示す定電流I
1 による遅延回路4bのコンデンサC4 の充電に加え、
基準電圧Vs2 以上の負荷電圧の大きさに対応した電流
2 を図16(e)に示すようにコンデンサC4 に流し
て充電するようにしている。
FIG. 14 shows a protected area in the present embodiment. X 1 indicates a protected area of the second detection circuit I and X 2 indicates a protected area of the second detection circuit II. The present embodiment configured as described above has both the features of the second embodiment and the features of the third embodiment. (Embodiment 5) The voltage-current conversion circuit 8 in Embodiment 3 is provided in the first detection circuit I, but in this embodiment, the voltage-current conversion circuit 8 is provided in the second detection circuit II as shown in FIG. It is. That is, in the present embodiment, the constant current I shown in FIG. 16D performed when the load voltage becomes equal to or higher than the reference voltage Vs 2 .
In addition to charging of the capacitor C 4 of the delay circuit 4b according to 1,
The current I 2 corresponds to the magnitude of the reference voltage Vs 2 or more load voltage flowing in the capacitor C 4, as shown in FIG. 16 (e) are to be charged.

【0031】つまり本実施例では比較器2bの基準電圧
Vs2 と同じ電圧をツエナー電圧とするツエナーダイオ
ードDZ’を電圧−電流変換回路8の入力側に接続して
負荷電圧がツエナー電圧を越えると、このツエナーダイ
オードDZ’を介して入力される電圧の大きさに応じた
電流I2 を図16(e)に示すように遅延回路4bのコ
ンデンサC4 に流して充電するのである。
[0031] That the Zener diode DZ 'to the Zener voltage of the same voltage as the reference voltage Vs 2 of the comparator 2b in the present embodiment the voltage - the load voltage is connected to the input side of the current converter circuit 8 exceeds a Zener voltage is to charge by applying a current I 2 corresponding to the magnitude of the voltage input through the Zener diode DZ 'to capacitor C 4 of the delay circuit 4b as shown in FIG. 16 (e).

【0032】従って、図16(a)に示す基準電圧Vs
2 以上の負荷電圧が発生すると負荷電圧に応じてコンデ
ンサC4 を充電する充電電流が増大し、図16(g)に
示すコンデンサC4 の電圧の上昇が早くなり、比較器5
bのスレッショルドレベルVth4 に達するまでの時間
が短縮される。つまり負荷電圧に応じて遅延動作時間を
可変することができるのである。
Therefore, the reference voltage Vs shown in FIG.
2 or more and the load voltage is generated increases the charging current for charging the capacitor C 4 in accordance with the load voltage, increase in the voltage of the capacitor C 4 shown in FIG. 16 (g) is fast, the comparator 5
b time to reach the threshold level Vth 4 of is shortened. That is, the delay operation time can be varied according to the load voltage.

【0033】尚第2の検出回路I側の動作は実施例1に
準じており、図16(f)に示す遅延回路4aのコンデ
ンサC3 の充電電圧は比較器2aでスレッショルドレベ
ルVth3 と比較される。比較器5a,5bの出力はオ
アゲート6を通じて出力回路7に入り、出力回路7は比
較器5a,5bの何れかの出力が”H”になったときに
図16(h)に示す欠相検出信号を出力する。
It should be noted operation of the second detection circuit I side is prepared analogously to Example 1, the charging voltage of the capacitor C 3 of the delay circuit 4a that shown in FIG. 16 (f) and the threshold level Vth 3 the comparator 2a comparison Is done. The outputs of the comparators 5a and 5b enter the output circuit 7 through the OR gate 6, and the output circuit 7 detects the phase loss shown in FIG. 16 (h) when one of the outputs of the comparators 5a and 5b becomes "H". Output a signal.

【0034】尚図16(b)(c)は、図3(b)
(c)と同様に夫々波形整形回路3a,3bの動作状態
の波形を示している。図17は本実施例における保護領
域を示しており、X1 は第1の検出回路I、X2 は第2
の検出回路IIの保護領域を示す。 (実施例6)本実施例の欠相検出回路部Aは実施例2の
回路構成に実施例5の回路構成を加えたもので、図18
に示すように負荷電圧が基準電圧Vs2 以上となったと
きに負荷電圧の大きさに対応した電流I2 を図19
(e)に示すように遅延回路4のコンデンサC5 に流し
て充電する電圧−電流変換回路8を付設したものであ
る。
FIGS. 16 (b) and 16 (c) correspond to FIGS.
7C shows the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIG. FIG. 17 shows a protection area in the present embodiment, where X 1 is the first detection circuit I, and X 2 is the second detection circuit.
3 shows a protection area of the detection circuit II. (Embodiment 6) The open phase detection circuit section A of this embodiment is obtained by adding the circuit configuration of the fifth embodiment to the circuit configuration of the second embodiment.
As shown in FIG. 19, when the load voltage becomes equal to or higher than the reference voltage Vs 2, the current I 2 corresponding to the magnitude of the load voltage is
(E) it is shown so that the voltage charged by flowing in the capacitor C 5 of the delay circuit 4 - is obtained by attaching a current converting circuit 8.

【0035】つまり本実施例では比較器2bの基準電圧
Vs2 と同じ電圧をツエナー電圧とするツエナーダイオ
ードDZ’を電圧−電流変換回路8の入力側に接続して
負荷電圧がツエナー電圧を越えると、このツエナーダイ
オードDZを介して入力される電圧の大きさに応じた電
流I2 を図19(e)に示すように遅延回路4のコンデ
ンサC5 に流して充電するのである。
[0035] That the Zener diode DZ 'to the Zener voltage of the same voltage as the reference voltage Vs 2 of the comparator 2b in the present embodiment the voltage - the load voltage is connected to the input side of the current converter circuit 8 exceeds a Zener voltage is to charge by applying a current I 2 corresponding to the magnitude of the voltage input through the Zener diode DZ to the capacitor C 5 of the delay circuit 4 as shown in FIG. 19 (e).

【0036】従って、波形整形回路3a,3bの出力を
受けて遅延回路4のコンデンサC5に図19(d)又は
(f)に示す定電流I1 又I3 が流れて充電されるのに
加えて図19(a)に示す基準電圧Vs2 以上の負荷電
圧に応じた電流I2 がコンデンサC5 を充電するため、
その分図19(g)に示すコンデンサC5 の電圧の上昇
が早くなり、比較器5のスレッショルドレベルVth5
も達するまでの時間が短縮される。つまり負荷電圧に応
じて遅延動作時間を可変することができるのである。
[0036] Accordingly, the waveform shaping circuit 3a, to receive the output of the 3b to the capacitor C 5 of the delay circuit 4 is a constant current I 1 also I 3 shown in FIG. 19 (d) or (f) are charged flows since the addition current I 2 corresponding to the reference voltage Vs 2 or more load voltage shown in FIG. 19 (a) and charges the capacitor C 5,
Increase in the voltage of the capacitor C 5 is faster shown in the-figures 19 (g), the threshold level Vth 5 of comparator 5
The time it takes to reach That is, the delay operation time can be varied according to the load voltage.

【0037】尚第1、第2の検出回路I、IIの動作は実
施例1、2に準じているため、構成及び動作の説明は抄
訳する。尚図19(b)(c)は、図3(b)(c)と
同様に夫々波形整形回路3a,3bの動作状態の波形を
示し、図19(g)は出力回路7の欠相検出信号を示
す。
Since the operations of the first and second detection circuits I and II are similar to those of the first and second embodiments, the description of the configuration and operation will be translated. FIGS. 19B and 19C show the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIGS. 3B and 3C. FIG. Indicates a signal.

【0038】図20は本実施例における保護領域を示し
ており、X1 は第1の検出回路I、X2 は第2の検出回
路IIの保護領域を示す。以上のように構成された本実施
例は実施例2の特徴と実施例5の特徴とを併せ持つこと
になる。 (実施例7)本実施例の欠相検出回路部Aは実施例5の
構成に図21に示すように比較器2c、波形整形回路3
cからなる第3の検出回路III と、それに対応する遅延
回路4c、比較器5cを加え、オアーゲート6に3入力
のものを使用したものである。
FIG. 20 shows a protected area in the present embodiment. X 1 indicates a protected area of the first detection circuit I and X 2 indicates a protected area of the second detection circuit II. The present embodiment configured as described above has both the features of the second embodiment and the features of the fifth embodiment. (Embodiment 7) As shown in FIG. 21, a comparator 2c and a waveform shaping circuit 3 are provided in the configuration of the fifth embodiment.
A third detection circuit III composed of a c, a delay circuit 4c and a comparator 5c corresponding to the third detection circuit III are added, and a three-input OR gate 6 is used.

【0039】つまり第3の検出回路III の比較器2cは
図22(a)に示すように基準電圧Vs3 以上の負荷電
圧が検出端子に入力すると検出出力を発生する。対応
する波形整形回路3cは図22(d)に示すようにコン
デンサC6 の充電、放電を比較器5cの検出出力に応じ
て行い、スレッショルドレベルVth6 をコンデンサC
6 の電圧が越えていない場合に出力を遅延回路4cに与
える。遅延回路4cはこの出力を受けて一定電流でコン
デンサC7 を図22(i)に示すように充電する。比較
器5cはこのコンデンサC7 の電圧がスレッショルドレ
ベルVth7 を越えたときに”H”信号をオアゲート6
に出力するのである。
[0039] That comparator 2c of the third detection circuit III is the reference voltage Vs 3 or more of the load voltage, as shown in FIG. 22 (a) generating a detection output to an input to the detection terminal. Corresponding waveform shaping circuit 3c performs in accordance with the detected output of the charge, discharge comparator 5c of the capacitor C 6, as shown in FIG. 22 (d), the threshold level Vth 6 capacitor C
When the voltage of 6 does not exceed, the output is given to the delay circuit 4c. Delay circuit 4c charges the capacitor C 7 at a constant current by receiving the output as shown in FIG. 22 (i). Comparator 5c is an OR gate the "H" signal when the voltage of the capacitor C 7 exceeds the threshold level Vth 7 6
Is output to

【0040】つまりこの第3の検出回路III 及び遅延回
路4c、比較器5cの動作は第1、第2の検出回路I,
IIと同様な動作を為すのである。そして比較器2a乃至
5cの何れかから”H”信号が出力すると、出力回路7
は図22(j)に示すように欠相検出信号を出力する。
尚図22(b)(c)は図3(b)(c)と同様に夫々
波形整形回路3a,3bの動作状態の波形を示し、図2
2(e)は波形整形回路3bの出力に対応する遅延回路
4bのコンデンサC4 に流す定電流I1 を示し、図22
(f)は電圧−電流変換回路8によるコンデンサC4
流す電流I2 を示し、また図22(g)(h)は夫々遅
延回路4a,4bのコンデンサC3 ,C4 の電圧を示
す。
That is, the operation of the third detection circuit III, the delay circuit 4c, and the comparator 5c are performed by the first and second detection circuits I,
It performs the same operation as II. When an "H" signal is output from any of the comparators 2a to 5c, the output circuit 7
Outputs an open phase detection signal as shown in FIG.
FIGS. 22 (b) and 22 (c) show the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIGS. 3 (b) and 3 (c).
2 (e) shows the constant current I 1 flowing through the capacitor C 4 of the delay circuit 4b corresponding to the output of the waveform shaping circuit 3b, FIG. 22
(F) a voltage - indicates current I 2 flowing in the capacitor C 4 by the current converting circuit 8, and FIG. 22 (g) (h) shows the respective delay circuits 4a, a capacitor C 3, the voltage of C 4 to 4b.

【0041】本実施例によれば実施例5の特徴に加えて
検出段階を3段に増やしたもので、動作時間の設定をよ
りやり易くしている。図23は本実施例における保護領
域を示しており、X1 は第1の検出回路I、X2 は第2
の検出回路II、X3 は第3の検出回路III の保護領域を
示す。 (実施例9)本実施例の欠相検出回路部Aは実施例6の
構成に図24に示すように比較器2c、波形整形回路3
cからなる第3の検出回路III と、それに対応する遅延
回路4c、比較器5cを加えたものである。
According to the present embodiment, in addition to the features of the fifth embodiment, the number of detection steps is increased to three, thereby making it easier to set the operation time. FIG. 23 shows a protection area in the present embodiment, where X 1 is the first detection circuit I, and X 2 is the second detection circuit.
The detection circuit II, X 3 represents a protecting region of the third detection circuit III. (Embodiment 9) The open-phase detection circuit section A of the present embodiment is different from the configuration of the embodiment 6 in that the comparator 2c and the waveform shaping circuit 3 as shown in FIG.
c, a third detection circuit III including a delay circuit 4c and a comparator 5c corresponding to the third detection circuit III.

【0042】この第3の検出回路III の動作は実施例8
と同じものであり、この第3の検出回路III の波形整形
回路3cの出力を受けた遅延回路4は、第1、第2の検
出回路I,IIの波形整形回路3a,3bの出力に対応し
た図25(e)(f)に示す定電流I1 ,I2 による充
電、更に図25(g)に示す電圧−電流変換回路8によ
る電流I3 による充電に加えて、図25(h)に示す定
電流I4 による充電を行い、図25(i)に示すコンデ
ンサC5 の充電電圧の上昇を早め、比較器5のスレッシ
ョルドレベルVth5 を越えるまでの時間を早め、図2
5(j)に示す出力回路7から出力する欠相検出信号を
発生させるまでの遅延時間を可変している。
The operation of the third detection circuit III is similar to that of the eighth embodiment.
The delay circuit 4 receiving the output of the waveform shaping circuit 3c of the third detection circuit III corresponds to the output of the waveform shaping circuits 3a and 3b of the first and second detection circuits I and II. In addition to the charging by the constant currents I 1 and I 2 shown in FIGS. 25E and 25F, and the charging by the current I 3 by the voltage-current conversion circuit 8 shown in FIG. It was charged by constant current I 4 shown in FIG. 25 accelerate the rise of the charging voltage of the capacitor C 5 shown in (i), accelerating the time to exceed the threshold level Vth 5 of comparator 5, FIG. 2
The delay time until the generation of an open phase detection signal output from the output circuit 7 shown in FIG.

【0043】尚図25(a)は検出端子に入力する負
荷電圧を、また図25(b)(c)は図3(b)(c)
と同様に夫々波形整形回路3a,3bの動作状態の波形
を示し、図25(d)は波形整形回路3cの動作状態の
波形を示している。本実施例は実施例6の特徴と実施例
8の特徴を併せ持つものである。 (実施例10)本実施例の欠相検出回路部Aは実施例1
の構成に図26に示すように比較器2c、波形整形回路
3cからなる第3の検出回路III と、それに対応する遅
延回路4c、比較器5cを加え、オアーゲート6に3入
力のものを使用したものである。第3の検出回路III の
動作は実施例8と同じあるからその説明は省略する。
FIG. 25 (a) shows the load voltage inputted to the detection terminal, and FIGS. 25 (b) and (c) show FIGS. 3 (b) and 3 (c).
25 shows the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, and FIG. 25D shows the waveforms of the operating states of the waveform shaping circuit 3c. This embodiment has both the features of the sixth embodiment and the features of the eighth embodiment. (Embodiment 10) The phase loss detection circuit section A of this embodiment is the same as that of the first embodiment.
26, a third detection circuit III composed of a comparator 2c and a waveform shaping circuit 3c, a delay circuit 4c and a comparator 5c corresponding to the third detection circuit III as shown in FIG. Things. The operation of the third detection circuit III is the same as that of the eighth embodiment, and the description thereof is omitted.

【0044】図27(a)は検出端子に入力する負荷
電圧を、また図27(b)(c)は図3(b)(c)と
同様に夫々波形整形回路3a,3bの動作状態の波形を
示し、図29(d)は波形整形回路3cの動作状態の波
形を示し、図27(e)(f)(g)は夫々遅延回路5
a,5b,5cのコンデンサC3 ,C4 ,C7 を示し、
図27(h)は出力回路7の欠相検出信号を示す。
FIG. 27 (a) shows the load voltage input to the detection terminal, and FIGS. 27 (b) and (c) show the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIGS. 3 (b) and 3 (c). FIG. 29 (d) shows the waveform of the operation state of the waveform shaping circuit 3c, and FIGS. 27 (e), (f) and (g) show the delay circuit 5 respectively.
a, 5b and 5c denote capacitors C 3 , C 4 and C 7 ,
FIG. 27H shows an open phase detection signal of the output circuit 7.

【0045】而して本実施例では検知段階が3段とな
り、保護領域が図28に示すようになる。尚X1 は第1
の検出回路I、X2 は第2の検出回路II、X3 は第3の
検出回路III の保護領域を示す。 (実施例11)本実施例の欠相検出回路部Aは実施例2
の構成に図29に示すように比較器2c、波形整形回路
3cからなる第3の検出回路III と、それに対応する遅
延回路4c、比較器5cを加え、オアーゲート6に3入
力のものを使用したものである。換言すれば実施例10
における遅延回路と、その後ろの比較器を夫々一つと
し、オアゲートを不要にしたものである。
In this embodiment, the number of detection steps is three, and the protection area is as shown in FIG. It should be noted that X 1 is the first
The detection circuit I, X 2 of the second detection circuit II, X 3 represents a protected area of the third detection circuit III. (Embodiment 11) The phase loss detection circuit section A of the present embodiment is different from that of the second embodiment.
As shown in FIG. 29, a third detection circuit III comprising a comparator 2c and a waveform shaping circuit 3c, a corresponding delay circuit 4c and a comparator 5c are added to the configuration shown in FIG. Things. In other words, Example 10
In this example, one delay circuit and one comparator behind it are used, and an OR gate is not required.

【0046】尚第3の検出回路III の動作は実施例8と
同じあるからその説明は省略する。而して本実施例では
実施例10に比べて回路部品数が削減できることにな
る。図30(a)は検出端子に入力する負荷電圧を、
また図30(b)(c)は図3(b)(c)と同様に夫
々波形整形回路3a,3bの動作状態の波形を示し、図
30(d)は波形整形回路3cの動作状態の波形を示
し、図30(e)は遅延回路5のコンデンサCを示し、
図30(f)は出力回路7の欠相検出信号を示す。
Since the operation of the third detection circuit III is the same as that of the eighth embodiment, its explanation is omitted. Thus, in this embodiment, the number of circuit components can be reduced as compared with the tenth embodiment. FIG. 30A shows the load voltage input to the detection terminal,
FIGS. 30B and 30C show the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIGS. 3B and 3C, and FIG. 30D shows the operating states of the waveform shaping circuit 3c. FIG. 30E shows a capacitor C of the delay circuit 5,
FIG. 30F shows an open phase detection signal of the output circuit 7.

【0047】(実施例12)本実施例の欠相検出回路部
Aの構成は図31に示すように実施例2の構成におい
て、定常時の基準電圧が検出回路Iの比較器2aの定常
時の基準電圧Vs1 よりも高い検出回路IIの比較器2b
では、電源投入から一定率で基準電圧値を上昇させて定
常時の基準電圧Vs2 に達するまでの時間を検出回路I
の比較器2aの基準電圧Vs1 の立ち上がりよりも遅く
している。具体的には端子、の電圧、つまり外部に
両端子間に図2に示すように接続されているコンデ
ンサC0の電圧を抵抗R1 、R2 で分圧し、その分圧電
圧で基準電圧Vs2 を得るようにしたものである。
(Embodiment 12) As shown in FIG. 31, the configuration of the open-phase detection circuit section A of this embodiment is different from that of Embodiment 2 in that the reference voltage at the steady state is the same as that of the comparator 2a of the detection circuit I at the steady state. 2b of the detection circuit II higher than the reference voltage Vs 1
Then, the detection circuit I detects the time from when the power is turned on to when the reference voltage value is increased at a constant rate to reach the reference voltage Vs 2 in the steady state.
It is slower than the rise of the reference voltage Vs 1 of the comparator 2a for. Pressure specific to the terminal, the voltage, that is external to the resistor R 1 to the voltage of the capacitor C 0 which is connected as shown in FIG. 2 between the two terminals, R 2 minute, the reference voltage Vs in the divided voltage This is to get 2 .

【0048】従って主接点S1 が投入されて電源が供給
されると検出回路Iの比較器2aの基準電圧Vs1 は図
32(a)に示すように即時に立ち上がるが、検出回路
IIの比較器2aの基準電圧Vs2 は外付けのコンデンサ
0 の充電電圧の上昇に伴って一定率で上昇して所定電
圧に達するまでに時間がかかることになる。従って、欠
相が発生している状態で主接点S1 が投入されると、検
出端子の電圧が、比較器2bの基準電圧Vs2 を即越
えて、比較器2bより検出出力が発生する。この検出出
力を受けて図32(d)に示すように遅延回路4はコン
デンサC5 の充電を開始し、その後検出回路I側の波形
整形回路3aの出力を受けて充電電流を増加させ、コン
デンサC5 を充電するのである。
[0048] Thus the comparator reference voltage Vs 1 of 2a of the main contact S 1 is turned on is the detection circuit I power is supplied is rises immediately as shown in FIG. 32 (a), the detection circuit
Reference voltage Vs 2 of II comparators 2a would take time to reach a predetermined voltage starts increasing at a constant rate with increasing the charging voltage of the capacitor C 0 of the external. Therefore, when the main contact S 1 is being turned in a state in which the phase failure occurs, the voltage of the detection terminal is beyond immediate reference voltage Vs 2 of comparator 2b, the detected output from the comparator 2b is generated. The delay circuit 4 as shown in FIG. 32 (d) receiving the detection output begins to charge the capacitor C 5, to increase the charging current in response to an output of the subsequent detection circuit I side of the waveform shaping circuit 3a, a capacitor than is to charge the C 5.

【0049】つまり電源投入時から早い時期にコンデン
サC5 の充電電圧が比較器5のスレッショルドレベルV
th5 を越えて図32(e)に示す出力回路7からの欠
相検出信号の出力されるこにになり、欠相状態で主接点
1 が投入された場合には即時に欠相を検出して回路遮
断を行い、速やかに負荷の保護が図れるのである。尚基
準電圧Vs2 が立ち上がってからの欠相発生時の動作は
実施例2と同じであるため、その説明は省略する。
[0049] That threshold level V of charging voltage comparator fifth capacitor C 5 early from power
th 5 the past becomes the this output phase loss detection signal from the output circuit 7 shown in FIG. 32 (e), the open phase immediately when the main contact point S 1 is being turned in the open phase state The circuit is detected and the circuit is cut off, so that the load can be protected quickly. Note for operation in open phase occurs, from the rise reference voltage Vs 2 are the same as in Example 2, a description thereof will be omitted.

【0050】尚図32(b)(c)は、図7(b)
(c)と同様に夫々波形整形回路3a,3bの動作状態
の波形を示している。また図33は本実施例における保
護領域を示しており、X1 は第1の検出回路I、X2
第2の検出回路IIの保護領域を示し、X3 は電源投入時
の第2の検出回路IIの保護領域を示す。
FIGS. 32 (b) and (c) correspond to FIG. 7 (b)
7C shows the waveforms of the operating states of the waveform shaping circuits 3a and 3b, respectively, as in FIG. FIG. 33 shows a protected area in the present embodiment. X 1 indicates the protected area of the first detection circuit I, X 2 indicates the protected area of the second detection circuit II, and X 3 indicates the second detection area when the power is turned on. 4 shows a protection area of the detection circuit II.

【0051】[0051]

【発明の効果】請求項1の発明は、欠相検出手段には夫
々異なる基準電圧を持ち負荷電圧が基準電圧以上となっ
た時に欠相を検出する少なくとも2つの検出回路を有し
ているので、複数の検出段階を持つことができ、各検出
段階で遅延時間を設定することが可能となるという効果
がある。
According to the first aspect of the present invention, the open phase detecting means has at least two detection circuits each having a different reference voltage and detecting an open phase when the load voltage becomes higher than the reference voltage. , A plurality of detection stages, and the delay time can be set in each detection stage.

【0052】請求項2の発明は、請求項1の発明におい
て、前記検出回路の少なくとも一つに、所定電圧以上の
負荷電圧が検出されると、前記遅延回路からの一定電流
とともに前記コンデンサへ負荷電圧に応じた電流を流す
充電制御手段を備えたものであるから、負荷電圧が所定
電圧以上になるとコンデンサの充電を早めることができ
て、負荷保護をより確実なものとすることができる。
According to a second aspect of the present invention, in the first aspect of the present invention, when a load voltage equal to or more than a predetermined voltage is detected in at least one of the detection circuits, a load is applied to the capacitor with a constant current from the delay circuit. Since the apparatus is provided with the charge control means for supplying a current corresponding to the voltage, when the load voltage becomes equal to or higher than the predetermined voltage, the charging of the capacitor can be accelerated, and the load protection can be further ensured.

【0053】請求項3の発明は、請求項1又は2の発明
において、前記遅延回路を、各検出回路に対して共通と
し、各検出回路が欠相検出すると夫々に対応して一定電
流で共通のコンデンサを充電するので、遅延回路を共通
化できて回路部品の点数を削減できるという効果があ
る。請求項4の発明は、請求項3の発明において、基準
電圧が高い方の検出回路の基準電圧を電源投入時から一
定率で上昇させて定常値に達するまでの時間を、他方の
検出回路の基準電圧が定常値に達するまでの時間よりも
遅くしたので、定常時において基準電圧の高い方の検出
回路が電源投入時には他方の検出開路が欠相を検出する
タイミングよりも早い時期で欠相を検出することが可能
とあんり、そのため欠相状態で電源が投入された場合に
あっても、即時に欠相検出が行えて速やかに負荷保護が
図れ、特に欠相遮断後、欠相原因が除去されないまま再
投入された場合にも確実に負荷保護が図れるという効果
がある。
The invention of claim 3 is the invention of claim 1 or 2.
In the above, the delay circuit is common to each of the detection circuits, and when each of the detection circuits detects a phase loss, a common capacitor is charged with a constant current corresponding thereto, so that the delay circuit can be shared and circuit components can be used. There is an effect that the score can be reduced. According to a fourth aspect of the present invention, in the third aspect of the present invention, the time from when the power supply is turned on to the time when the reference voltage of the detection circuit having the higher reference voltage is increased at a constant rate until the reference voltage reaches a steady value is determined by the other detection circuit. Since the time until the reference voltage reaches the steady-state value is later than the time when the detection circuit with the higher reference voltage at the steady state detects the phase loss at the time of power-on, the other detection open circuit detects the phase loss earlier than the timing of detecting the phase loss. It is easy to detect, so even if the power is turned on in the open phase state, the open phase can be detected immediately and the load can be protected quickly, especially after the open phase is cut off, the cause of the open phase is removed. There is an effect that load protection can be surely achieved even when the power is re-input without being performed.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の実施例1の欠相検出回路部の回路構成
図である。
FIG. 1 is a circuit configuration diagram of an open phase detection circuit unit according to a first embodiment of the present invention.

【図2】同上の全体の回路構成図である。FIG. 2 is an overall circuit configuration diagram of the same.

【図3】同上の動作説明用波形図である。FIG. 3 is a waveform diagram for explaining the operation of the above.

【図4】同上の保護領域説明図である。FIG. 4 is a diagram illustrating a protected area according to the first embodiment;

【図5】同上の要部の具体回路図である。FIG. 5 is a specific circuit diagram of a main part of the above.

【図6】本発明の実施例2の欠相検出回路部の回路構成
図である。
FIG. 6 is a circuit configuration diagram of an open phase detection circuit unit according to a second embodiment of the present invention.

【図7】同上の動作説明用波形図である。FIG. 7 is a waveform diagram for explaining the operation of the above.

【図8】同上の保護領域説明図である。FIG. 8 is an explanatory diagram of a protection area according to the embodiment.

【図9】本発明の実施例3の欠相検出回路部の回路構成
図である。
FIG. 9 is a circuit configuration diagram of an open-phase detection circuit unit according to a third embodiment of the present invention.

【図10】同上の動作説明用波形図である。FIG. 10 is a waveform chart for explaining the operation of the above.

【図11】同上の保護領域説明図である。FIG. 11 is an explanatory diagram of a protected area according to the embodiment.

【図12】本発明の実施例4の欠相検出回路部の回路構
成図である。
FIG. 12 is a circuit configuration diagram of an open phase detection circuit unit according to a fourth embodiment of the present invention.

【図13】同上の動作説明用波形図である。FIG. 13 is a waveform diagram for explaining the operation of the above.

【図14】同上の保護領域説明図である。FIG. 14 is an explanatory diagram of a protected area according to the embodiment.

【図15】本発明の実施例5の欠相検出回路部の回路構
成図である。
FIG. 15 is a circuit configuration diagram of an open phase detection circuit unit according to a fifth embodiment of the present invention.

【図16】同上の動作説明用波形図である。FIG. 16 is a waveform chart for explaining the above operation.

【図17】同上の保護領域説明図である。FIG. 17 is an explanatory diagram of a protected area according to the embodiment.

【図18】本発明の実施例6の欠相検出回路部の回路構
成図である。
FIG. 18 is a circuit configuration diagram of an open phase detection circuit unit according to a sixth embodiment of the present invention.

【図19】同上の動作説明用波形図である。FIG. 19 is a waveform chart for explaining the operation of the above.

【図20】同上の保護領域説明図である。FIG. 20 is an explanatory diagram of a protected area according to the embodiment.

【図21】本発明の実施例7の欠相検出回路部の回路構
成図である。
FIG. 21 is a circuit configuration diagram of an open phase detection circuit unit according to a seventh embodiment of the present invention.

【図22】同上の動作説明用波形図である。FIG. 22 is a waveform diagram for explaining the operation of the above.

【図23】同上の保護領域説明図である。FIG. 23 is an explanatory diagram of a protected area according to the embodiment.

【図24】本発明の実施例8の欠相検出回路部の回路構
成図である。
FIG. 24 is a circuit configuration diagram of an open phase detection circuit unit according to an eighth embodiment of the present invention.

【図25】同上の動作説明用波形図である。FIG. 25 is a waveform diagram for explaining the operation of the above.

【図26】同上の保護領域説明図である。FIG. 26 is an explanatory diagram of a protected area according to the third embodiment.

【図27】本発明の実施例9の欠相検出回路部の回路構
成図である。
FIG. 27 is a circuit configuration diagram of an open phase detection circuit unit according to a ninth embodiment of the present invention.

【図28】同上の保護領域説明図である。FIG. 28 is an explanatory diagram of a protected area according to the embodiment.

【図29】本発明の実施例10の欠相検出回路部の回路
構成図である。
FIG. 29 is a circuit configuration diagram of an open phase detection circuit section according to Embodiment 10 of the present invention.

【図30】同上の動作説明用波形図である。FIG. 30 is a waveform diagram for explaining the above operation.

【図31】本発明の実施例11の欠相検出回路部の回路
構成図である。
FIG. 31 is a circuit configuration diagram of an open phase detection circuit section according to Embodiment 11 of the present invention.

【図32】同上の動作説明用波形図である。FIG. 32 is a waveform chart for explaining the operation of the above.

【図33】同上の保護領域説明図である。FIG. 33 is an explanatory diagram of a protected area according to the third embodiment.

【符号の説明】[Explanation of symbols]

1 定電圧回路 2a,2b 比較器 3a,3b 波形整形回路 4a,4b 遅延回路 5a,5b 比較器 6 オアゲート 7 出力回路 I,II 検出回路 A 欠相検出回路部 C1 乃至C4 コンデンサ Vs1 ,Vs2 基準電圧 Vth3 スレッショルドレベル1 constant voltage circuit 2a, 2b comparator 3a, 3b waveform shaping circuit 4a, 4b delay circuit 5a, 5b comparator 6 OR gate 7 output circuit I, II detecting circuit A phase loss detection circuit unit C 1 to C 4 capacitors Vs 1, Vs 2 reference voltage Vth 3 threshold level

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平3−169220(JP,A) 実開 平3−104038(JP,U) (58)調査した分野(Int.Cl.7,DB名) H02H 3/08 - 3/253 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-3-169220 (JP, A) JP-A-3-104038 (JP, U) (58) Fields investigated (Int. Cl. 7 , DB name) H02H 3/08-3/253

Claims (4)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】負荷側の中性線と各相との間の負荷電圧と
基準電圧とを比較して負荷電圧が基準電圧以上になると
欠相を検出する検出回路と、この検出回路が欠相検出す
ると一定電流でコンデンサを充電してコンデンサの電圧
が一定以上に達するまで欠相検出信号の出力を遅延させ
る遅延回路とを有した欠相検出手段と、この欠相検出手
段から出力される欠相検出信号にてオンするスイッチ手
段と、このスイッチ手段で励磁される主接点の引外しコ
イルとを備え、引外しコイルの励磁によって電路に挿入
された主接点を開放する欠相保護機能付き遮断器におい
て、上記欠相検出手段には夫々異なる基準電圧を持ち負
荷電圧が基準電圧以上となった時に欠相を検出する少な
くとも2つの検出回路を有して成ることを特徴とする欠
相保護機能付き遮断器。
1. A detection circuit for comparing a load voltage between a neutral line on a load side and each phase with a reference voltage and detecting an open phase when the load voltage exceeds the reference voltage. When the phase is detected, the capacitor is charged with a constant current and a delay circuit for delaying the output of the phase loss detection signal until the voltage of the capacitor reaches a certain level or more, and the phase loss detection means outputs the phase loss detection signal. It has a switch means that is turned on by a phase loss detection signal and a trip coil for the main contact that is excited by the switch means, and has a phase loss protection function that opens the main contact inserted into the electric circuit by excitation of the trip coil. In the circuit breaker, the open phase detecting means has at least two detection circuits each having a different reference voltage and detecting an open phase when the load voltage becomes higher than the reference voltage. Functional shielding Vessel.
【請求項2】前記検出回路の少なくとも一つに、所定電
圧以上の負荷電圧が検出されると、当該検出回路からの
一定電流とともに前記コンデンサへ負荷電圧に応じた電
流を流す充電制御手段を備えていることを特徴とする
求項1記載の欠相保護機能付き遮断器。
2. At least one of the detection circuits includes a charge control unit that, when a load voltage equal to or more than a predetermined voltage is detected, supplies a current corresponding to the load voltage to the capacitor together with a constant current from the detection circuit. A contract that is characterized by
The circuit breaker with an open-phase protection function according to claim 1 .
【請求項3】前記遅延回路は、各検出回路に対して共通
とし、各検出回路が欠相検出すると夫々に対応して一定
電流で共通のコンデンサを充電することを特徴とする請
求項1又は2記載の欠相保護機能付き遮断器。
3. The delay circuit according to claim 1, wherein the delay circuit is common to each of the detection circuits, and charges a common capacitor with a constant current in response to each of the detection circuits detecting a phase loss. 2. The circuit breaker with open-phase protection function according to item 2.
【請求項4】基準電圧が高い方の検出回路の基準電圧を
電源投入時から一定率で上昇させて定常値に達するまで
の時間を、他方の検出回路の基準電圧が定常値に達する
までの時間よりも遅くしたことを特徴とする請求項3記
載の欠相保護機能付き遮断器。
4. The time from when the power supply is turned on to the time when the reference voltage of the detection circuit having the higher reference voltage is increased at a constant rate until the reference voltage reaches the steady-state value is determined. The circuit breaker with an open-phase protection function according to claim 3, wherein the circuit breaker is set later than the time.
JP06936695A 1994-07-26 1995-03-28 Circuit breaker with open phase protection Expired - Lifetime JP3319906B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP06936695A JP3319906B2 (en) 1994-07-26 1995-03-28 Circuit breaker with open phase protection

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP17454194 1994-07-26
JP6-174541 1994-07-26
JP06936695A JP3319906B2 (en) 1994-07-26 1995-03-28 Circuit breaker with open phase protection

Publications (2)

Publication Number Publication Date
JPH0898395A JPH0898395A (en) 1996-04-12
JP3319906B2 true JP3319906B2 (en) 2002-09-03

Family

ID=26410568

Family Applications (1)

Application Number Title Priority Date Filing Date
JP06936695A Expired - Lifetime JP3319906B2 (en) 1994-07-26 1995-03-28 Circuit breaker with open phase protection

Country Status (1)

Country Link
JP (1) JP3319906B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101021259B1 (en) * 2009-05-20 2011-03-11 김동균 Onen phase relay circuit and open phase warning circuit for three phase motor
JP2014143860A (en) * 2013-01-24 2014-08-07 Furuno Electric Co Ltd Overcurrent protective device and marine electric apparatus with the same

Also Published As

Publication number Publication date
JPH0898395A (en) 1996-04-12

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