JP3307662B2 - 測定装置を校正するための方法 - Google Patents

測定装置を校正するための方法

Info

Publication number
JP3307662B2
JP3307662B2 JP25882291A JP25882291A JP3307662B2 JP 3307662 B2 JP3307662 B2 JP 3307662B2 JP 25882291 A JP25882291 A JP 25882291A JP 25882291 A JP25882291 A JP 25882291A JP 3307662 B2 JP3307662 B2 JP 3307662B2
Authority
JP
Japan
Prior art keywords
calibrating
measuring device
inspection
measuring
dielectric constant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP25882291A
Other languages
English (en)
Japanese (ja)
Other versions
JPH04307361A (ja
Inventor
プーレン フィリップ
パガノン アンリ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Robert Bosch GmbH
Original Assignee
Robert Bosch GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robert Bosch GmbH filed Critical Robert Bosch GmbH
Publication of JPH04307361A publication Critical patent/JPH04307361A/ja
Application granted granted Critical
Publication of JP3307662B2 publication Critical patent/JP3307662B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP25882291A 1990-10-06 1991-10-07 測定装置を校正するための方法 Expired - Fee Related JP3307662B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE4031754.4 1990-10-06
DE4031754A DE4031754A1 (de) 1990-10-06 1990-10-06 Verfahren zum kalibrieren einer messeinrichtung

Publications (2)

Publication Number Publication Date
JPH04307361A JPH04307361A (ja) 1992-10-29
JP3307662B2 true JP3307662B2 (ja) 2002-07-24

Family

ID=6415778

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25882291A Expired - Fee Related JP3307662B2 (ja) 1990-10-06 1991-10-07 測定装置を校正するための方法

Country Status (3)

Country Link
EP (1) EP0480161B1 (index.php)
JP (1) JP3307662B2 (index.php)
DE (2) DE4031754A1 (index.php)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3225554A1 (de) * 1982-07-08 1984-01-12 Robert Bosch Gmbh, 7000 Stuttgart Messeinrichtung fuer fluidstrahlen

Also Published As

Publication number Publication date
EP0480161A3 (index.php) 1994-02-23
EP0480161A2 (de) 1992-04-15
DE59106819D1 (de) 1995-12-07
DE4031754A1 (de) 1992-04-09
JPH04307361A (ja) 1992-10-29
EP0480161B1 (de) 1995-11-02

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Legal Events

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