JP3135143U - Material testing platen, material testing machine and hardness tester - Google Patents

Abstract

An object of the present invention is to prevent sample displacement when a compression test force is applied to a granular sample.
A plurality of indentations (holding portions) having a predetermined depth t are formed on an upper surface of a platen 10 for material testing using an indenter of a hardness meter. When a test force is applied to the granular sample 1, the sample 1 is inserted into the holding portion 11 on the platen. As a result, the sample 1 is restrained by the holding unit 11, and the displacement of the sample 1 when the compression test force is loaded from the indenter 4 can be prevented.
[Selection] Figure 2

Description

  The present invention relates to a material testing platen, a material testing machine, and a hardness tester that hold a sample against a test force.

  There is known a material testing machine that applies a compression test force to a sample placed on a platen and evaluates the strength of the sample (see, for example, Patent Document 1). In the material testing machine described in Patent Document 1, a granular sample having a particle size of 1 mm or less is placed on a platen, the tip of the indenter is brought into contact with the surface of the sample, and a compressive force is applied. To measure.

Japanese Patent Laid-Open No. 5-93683

  However, if a granular sample is placed on the platen as in the test machine described in Patent Document 1, the position of the sample cannot be fixed, and the sample may be displaced when a compressive force is applied to the sample. is there.

The material test platen according to the present invention is a material test platen that holds a granular sample against the test force from above, and that the upper surface of the platen is provided with a recess for positioning the sample. Features.
It is preferable to provide a plurality of concave portions at predetermined intervals on the upper surface of the platen.
A concave portion for positioning may be formed by an indenter of a hardness meter whose tip is a pyramid shape, and the concave portion may be an indentation having a depth corresponding to the size of the sample.
A plurality of indentations having different depths may be provided on the upper surface of the platen.
A material testing machine according to the present invention includes the platen described above, and load means for applying a test force from above to a sample positioned in a concave portion of the platen.
In addition, the hardness meter according to the present invention is characterized by comprising a platen on which an indentation is formed, and load means for applying a test force from above to the sample positioned in the concave portion of the platen.

  According to the present invention, since the concave portion for positioning the sample is provided on the upper surface of the platen, it is possible to prevent the sample from being displaced when a test force is applied.

Hereinafter, an embodiment of a material testing machine according to the present invention will be described with reference to FIGS.
FIG. 1 is a diagram showing a schematic configuration of a material testing machine according to an embodiment of the present invention. This material tester is a micro compression tester that applies a compressive force to a granular sample 1 having a small particle size (for example, a particle size of 1 mm or less) such as glass beads or resin beads.

  The testing machine 100 includes a frame 1, a sample table 2 provided on the frame 1 so as to be movable up and down, an XY stage 3 installed on the sample table 2 and movable in a horizontal direction (XY direction), and a pressure plate gripper (not shown). The platen 10 is fixed on the XY stage 3 and the sample 1 is placed thereon, and the indenter 4 presses the sample 1 on the platen 10. The frame 1 includes a load device 5 that applies a test force to the sample 1 via the indenter 4 and a detector 6 that measures the displacement of the indenter 4. The indenter 4 is a flat indenter with a flat tip (FIG. 3), and the diameter of the tip is, for example, about 50 to 100 μm.

  The frame 1 is provided with a plurality of objective lenses 7 attached to a revolver, and observation light incident on the objective lens 7 is magnified and observed by an eyepiece lens 9 via a photographing optical system 8. The detector 6 is composed of, for example, a differential transformer type displacement detector, and a signal from the detector 6 is input to the controller 101. The load device 5 is composed of, for example, an electronic balance type variable load device. The load device 5 has an electromagnetic coil 51, and the indenter 4 presses the sample 1 by the electromagnetic force of the electromagnetic coil 51. The current supplied to the electromagnetic coil 51 is controlled by the controller 101. Thus, a compressive force is applied to the sample 1 at a constant increase rate, and the deformation amount of the sample 1 at this time is automatically measured by the detector 6 to evaluate the compressive fracture strength of the sample 1.

  In the above compression test, when a compressive force is applied to the sample 1, the sample 1 may slip or roll, and the sample 1 may be displaced on the platen. In order to prevent this, for example, when the sample 1 is fixed to the upper surface of the platen 10 using an adhesive, the test results vary due to the influence of the adhesive layer, and the strength evaluation of the sample 1 cannot be performed with high accuracy. Moreover, it is necessary to remove the adhesive adhering to the platen 10 every time the test is completed, and the cleaning work is troublesome. Therefore, in the present embodiment, in order to hold the sample 1 on the platen, a concave holding portion 11 is provided on the upper surface of the platen 10 as follows.

  2A is a plan view of the platen 10 according to the present embodiment as viewed from above, and FIG. 2B is a cross-sectional view taken along the line bb of FIG. 2A. A plurality of holding portions 11 having a predetermined depth t are regularly provided on the upper surface of the platen 10 at predetermined pitches Px and Py in the X direction and the Y direction in the drawing, respectively. In the figure, the holding portions 11 are provided in three rows in the X direction and four rows in the Y direction, but the number of the holding portions 11 is not limited thereto.

  The platen 10 used for the compression test is required to have high hardness (for example, about Hv 500 or more). In order to process the holding part 11 on the surface of such a platen 10, a Vickers hardness meter is used in this embodiment. The Vickers hardness tester is a testing machine that presses a square pyramid diamond indenter into a test surface of a sample with a constant test force and measures the hardness of the sample from the size of the resulting indentation.

  When processing the holding part 11, first, the platen 10 is set on the Vickers hardness tester. Next, a predetermined test force F0 is applied to the surface of the platen 10 using a diamond indenter to form one indentation. Further, the platen 10 is shifted by a predetermined pitch Px, Py in the X direction or the Y direction, the test force F0 is similarly applied, and a predetermined number of indentations are formed. As described above, a plurality of indentations are formed on the upper surface of the platen 10, and the holding unit 11 is provided.

  In the present embodiment, a diamond indenter having a regular quadrangular pyramid having a facing angle of 136 ° is used for the Vickers hardness tester, for example. For this reason, as shown in FIG. 2A, when viewed from above, the holding portion 11 has a square shape with a diagonal length L, and has four triangular slopes 11a having an ascending slope centered on the point O. is doing. The point O corresponds to the apex position of the diamond indenter.

  There is a predetermined relationship between the depth t of the indentation and the diagonal length L, and the diagonal length L is determined according to the particle size of the sample 1. For example, when the particle diameter of the sample 1 is 400 μm, the diagonal length L may be about 90 μm. At this time, the pitches Px and Py of the indentations are preferably about 100 μm, for example. The test force F0 necessary to form such an indentation is, for example, about 20N.

  When the sample 1 is placed on the upper surface of the platen 10 formed as described above, the sample 1 rolls on the platen and is fitted into one of the holding portions 11. When performing the compression test, it is confirmed through which eyepiece 9 the sample 1 has entered the holding unit 11, the XY stage 3 is operated to move the platen 10 by a predetermined amount, and the sample 1 is placed below the indenter 4. Position. In this state, the indenter 4 is brought into contact with the upper portion of the sample 1 and a compressive force is applied by the load device 5.

  FIG. 3 is a diagram illustrating a state in which a compression test force is loaded on the sample 1. The bottom peripheral surface of the sample 1 is in contact with the four inclined surfaces 11a (FIG. 2) of the holding unit 11, and the sample 1 is held at four points. As a result, the periphery of the sample 1 is restrained by the holding unit 11, so that it is possible to prevent the sample 1 from being displaced when a compressive force is applied to the sample 1.

According to the present embodiment, the following operational effects can be obtained.
(1) A plurality of indentations are formed on the upper surface of the platen 10 with a diamond indenter, and a holding portion 11 for holding the spherical sample 1 is provided. Thereby, the position shift of the sample 1 when the compression test force is loaded can be prevented, and the physical property evaluation of the sample can be performed with high accuracy.
(2) Since the indentation is formed on the upper surface of the platen 10 using the Vickers hardness meter, the holding portion 11 can be easily processed even on the high-hardness platen 10.
(3) Since an indentation is formed on the upper surface of the platen 10 using a Vickers hardness tester, the indentation depth of the diamond indenter can be adjusted with high accuracy, and the size of the holding portion 11 can be easily changed.
(4) Since indentations are regularly formed on the upper surface of the platen at predetermined pitches Px and Py, the relative position of the sample 1 on the platen can be easily grasped, and the indenter 4 and the sample 1 can be aligned. It can be done easily.

  In the above embodiment, a plurality of holding portions 11 having a fixed shape are provided on the upper surface of the platen 10, but a plurality of holding portions 11 having different shapes are provided on the upper surface of one platen 10 as shown in FIG. You may do it. In FIG. 4, the surface of the platen 10 is divided into three regions 10A, 10B, and 10C, and a plurality of holding portions having diagonal lengths LA, LB, and LC and indentation depths tA, tB, and tC in the regions 10A to 10C, respectively. 11A to 11C are provided. Here, each diagonal length LA to LC and indentation depth tA to tC have a relationship of LA <LB <LC and tA <tB <tC. The holding part 11A holds the sample 1 having a small particle size (for example, 10 μm), the holding part 11B holds the sample having a medium particle size (for example, 50 μm), and the holding part 11C has a large particle size (for example, 400 μm). Sample 1 is held. Accordingly, the sample 1 having different particle diameters can be held by one platen 10, and it is not necessary to replace the platen 10 every time the particle diameter of the sample 1 is changed.

  In the above embodiment, the platen 10 is applied to the compression tester, but the present invention can also be applied to other material testers that evaluate the physical properties of the spherical sample 1. An example is shown in FIG. FIG. 5 is an example applied to a micro hardness tester, and shows a state in which the tip of the diamond indenter 12 is in contact with the upper surface of the sample 1 held by the holding unit 11. The shape of the indenter 12 of the hardness meter is different from the shape of the indenter 4 (FIG. 1) of the compression tester, but the other configuration is the same as that shown in FIG. That is, the hardness meter includes a sample stage 2, an XY stage 3, a load device 5, a detector 6, an objective lens 7, an eyepiece lens 9, and the like. From the state of FIG. 5, the hardness test can be performed by pushing the diamond indenter 12 into the sample 1 by the load device 5, whereby the hardness of the spherical sample 1 can be easily measured.

  In this case, an indentation (holding portion 11) may be formed on the upper surface of the platen 10 with the diamond indenter 12, and the sample 1 may be inserted into the holding portion 11 to perform a hardness test. Thereby, the processing of the holding part 11 and the hardness measurement of the sample 1 can be performed with one testing machine. In the hardness test, changes in test force and indentation depth of the indenter 12 can be grasped, and hardness measurement as a nanoindenter is possible.

  In the above embodiment, the indentation (recessed portion) is formed on the surface of the platen 10 with the Vickers hardness meter, but the recessed portion may be formed with a Rockwell hardness meter, Knoop hardness meter, Brinell hardness meter, or the like to be the holding portion 11. In addition, a concave portion may be formed on the surface of the platen 10 by ion beam processing or the like to form the holding portion 11. As shown in FIG. 6, depressions 15 may be formed in a lattice shape on the surface of the platen 10, and the intersection of the depressions 15 may be the holding part 11, and the shape of the concave part for positioning the sample 1 is not limited to that described above. Although the holding portions 11 are provided on the surface of the platen 10 for each of the predetermined pitches Px and Py, the holding portions 11 may be provided at random.

  Although the test force is loaded using the load device 5 and the indenters 4 and 12, the configuration of the load means is not limited to this. For example, instead of a load method using electromagnetic force, a load method using a motor drive may be used. That is, as long as the features and functions of the present invention can be realized, the present invention is not limited to the material testing machine of the embodiment.

The figure which shows schematic structure of the material testing machine which concerns on embodiment of this invention. (A) is a top view of the platen concerning this Embodiment, (b) is the bb sectional view taken on the line of Fig.2 (a). The figure which shows the state which applied the compression test force to the sample with the material testing machine which concerns on this Embodiment. The figure which shows the modification of FIG. The figure which shows the modification of FIG. The figure which shows another modification of FIG.

Explanation of symbols

1 Sample 5 Loading device 10 Platen 11 Holding part 12 Diamond indenter

Claims (6)

A material test platen that holds a granular sample against a test force from above,
A platen for material testing, wherein a concave portion for positioning a sample is provided on an upper surface of the platen. In the material test platen according to claim 1,
The material test platen, wherein a plurality of the recesses are provided at predetermined intervals on the upper surface of the platen. The platen for material testing according to claim 1 or 2,
2. The material test platen according to claim 1, wherein the recess is an indentation formed by a hardness meter indenter having a pyramid tip at a depth corresponding to a sample size. The material test platen according to claim 3,
A platen for material testing, wherein a plurality of indentations having different depths are provided on an upper surface of the platen. The platen according to any one of claims 1 to 4,
A material testing machine comprising load means for applying a test force from above to a sample positioned in a concave portion of the platen. A platen according to claim 3 or 4,
A hardness meter comprising load means for applying a test force from above to the sample positioned in the concave portion of the platen by the indenter.

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