JP3023157B2 - Light incident position detector for sun sensor - Google Patents
Light incident position detector for sun sensorInfo
- Publication number
- JP3023157B2 JP3023157B2 JP2260493A JP26049390A JP3023157B2 JP 3023157 B2 JP3023157 B2 JP 3023157B2 JP 2260493 A JP2260493 A JP 2260493A JP 26049390 A JP26049390 A JP 26049390A JP 3023157 B2 JP3023157 B2 JP 3023157B2
- Authority
- JP
- Japan
- Prior art keywords
- output signal
- incident position
- ccd
- light incident
- sunlight
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Description
【発明の詳細な説明】 [発明の目的] (産業上の利用分野) この発明は、例えば人工衛生等に搭載されて太陽との
なす角を検出するのに用いる太陽センサの光入射位置検
出装置に関する。[Detailed Description of the Invention] [Object of the Invention] (Industrial application field) The present invention relates to a light incident position detecting device of a sun sensor which is mounted on, for example, artificial hygiene and used to detect an angle formed with the sun. About.
(従来の技術) 一般に、太陽センサにおいては、第3図に示すよう
に、CCDリニアイメージセンサと称する画素10aをリニア
式に配列した固体撮像素子(CCD)受光部10を遮蔽部材1
1の太陽光通過用のスリット12と略直交させて対向さ
せ、相互間が距離Hを隔てて配置される。そして、この
CCD受光部10は、スリット面法線より感度軸回りに角度
Θを有した方向からの太陽光がスリット12を通過して入
射すると、その画素10a上に太陽像Aが形成されること
により、この光の入射位置xを後述するように検出し
て、 Θ=tan-1(x/H) の式により、太陽光の入射した角度Θが求められる。(Prior Art) In general, in a sun sensor, as shown in FIG. 3, a solid-state imaging device (CCD) light receiving unit 10 in which pixels 10a called a CCD linear image sensor are linearly arranged is provided with a shielding member 1.
One of the slits 12 for passing sunlight is substantially orthogonal to and opposed to each other, and is arranged with a distance H therebetween. And this
When sunlight from a direction having an angle Θ around the sensitivity axis from the slit surface normal passes through the slit 12 and enters the CCD light receiving unit 10, a solar image A is formed on the pixel 10a, The incident position x of the light is detected as described later, and the angle 太 陽光 at which the sunlight is incident is obtained from the equation Θ = tan −1 (x / H).
すなわち、太陽光がスリット12を通過してCCD受光部1
0に入射すると、CCD受光部10は、その画素10aに光の強
度分布に比例した電荷が蓄積される。このCCD受光部10
に入射される太陽光は、第4図(a)に示すような光の
強度分布を有し、その画素10aに蓄積された電荷が、第
4図(b)に示すような図示しない駆動回路からの1画
素に対応するクロック信号に応動して順次に出力される
(第4図(c)参照)。このCCD受光部10からのCCD出力
信号は、増幅された後、図示しない比較器でしきい値TH
と比較され、この比較器の出力信号より時間t1とt2を上
記クロック信号のパルス数で計測し、そのt1+t2/2が第
4図(a)に示す光の強度分布の中心Cを表わす時間と
して、そのクロック信号との関係から光の入射位置xが
求められる。That is, sunlight passes through the slit 12 and passes through the CCD light receiving section 1
When the light enters the pixel 0, the CCD light receiving unit 10 accumulates charges in the pixel 10a in proportion to the light intensity distribution. This CCD receiver 10
Has a light intensity distribution as shown in FIG. 4 (a), and the electric charge accumulated in the pixel 10a is changed into a driving circuit (not shown) as shown in FIG. 4 (b). Are sequentially output in response to a clock signal corresponding to one pixel from the pixel (see FIG. 4 (c)). After the CCD output signal from the CCD light receiving unit 10 is amplified, a threshold value T H is output from a comparator (not shown).
Is compared with the output signal from the time t 1 and t 2 of the comparator is measured in number of pulses of the clock signal, the center of the intensity distribution of the light that t 1 + t 2/2 is shown in FIG. 4 (a) As the time representing C, the light incident position x is obtained from the relationship with the clock signal.
ところが、上記のように光入射位置を検出していたの
では、その構成上、検出の分解能としてCCD受光部10の
画素間隔の1/2に設定するのが限界であることにより、
検出精度の向上を図ることが困難なものであった。However, in the case where the light incident position was detected as described above, the resolution of the detection is limited to 1/2 of the pixel interval of the CCD light receiving unit 10 due to its configuration.
It has been difficult to improve the detection accuracy.
(発明が解決しようとする課題) 以上述べたように、従来の光入射位置の検出手段で
は、分解能の向上に限界を有するため、検出精度の向上
を図ることが困難であるという問題を有していた。(Problems to be Solved by the Invention) As described above, the conventional light incident position detecting means has a problem that it is difficult to improve the detection accuracy because there is a limit in improving the resolution. I was
この発明は上記の事情に鑑みてなされたもので、分解
能の向上を図って、可及的に高精度化を実現し得るよう
にした太陽センサの光入射位置検出装置を提供すること
を目的とする。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a light incident position detecting device for a solar sensor that improves resolution and achieves as high a precision as possible. I do.
[発明の構成] (課題を解決するための手段) この発明は遮蔽部材のスリットを通過して入射した太
陽光の強度分布に対応した出力信号を読出用クロック信
号に応動して出力する固体撮像素子受光部と、この固体
撮像素子受光部の出力信号からクロック成分を除去する
フィルタ手段と、このフィルタ手段の出力信号をしきい
値と比較する比較手段と、この比較手段の出力信号の基
準時間からしきい値範囲の中心までの時間を計測用クロ
ック信号で計測して前記太陽光の入射位置を検出するカ
ウンタ手段とを備えて太陽センサの光入射位置検出装置
を構成したものである。[Structure of the Invention] (Means for Solving the Problems) The present invention provides a solid-state imaging device that outputs an output signal corresponding to the intensity distribution of sunlight incident through a slit of a shielding member in response to a read clock signal. An element light receiving unit, a filter means for removing a clock component from an output signal of the solid state imaging element light receiving unit, a comparing means for comparing the output signal of the filter means with a threshold value, and a reference time of the output signal of the comparing means And a counter means for detecting the incident position of the sunlight by measuring the time from the time to the center of the threshold value range with a measuring clock signal to constitute a light incident position detecting device of the sun sensor.
(作用) 上記構成によれば、検出の分解能は読出用クロック信
号と計測用クロック信号の周波数の比により、適宜に設
定することができる。従って、検出の分解能の向上が簡
便に実現され、可及的に検出精度の向上を図ることがで
きる。(Operation) According to the above configuration, the resolution of detection can be appropriately set by the ratio of the frequency of the read clock signal to the frequency of the measurement clock signal. Therefore, the resolution of the detection can be easily improved, and the detection accuracy can be improved as much as possible.
(実施例) 以下、この発明の実施例について、図面を参照して詳
細に説明する。Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings.
第1図はこの発明の一実施例に係る太陽センサの光入
射位置検出装置を示すもので、前記第3図に示すように
遮蔽部材11のスリット20を通過した太陽光はCCD受光部1
0に入射される。このCCD受光部10は、上述したように第
2図(a)に示すような強度分布を有する太陽光を光電
変換してCCD出力信号を生成し(第2図(c)参照)、C
CD駆動回路20からの読出用クロック信号に応動してロー
パスフィルタ(LPF)21に出力する。このLPF21はCCD出
力信号よりクロック成分を除去して比較器22に出力する
(第2図(d)参照)。この比較器22は入力したLPF20
からのLPF出力信号をしきい値THと比較してカウンタ回
路22に出力する(第2図(e)参照)。このカウンタ回
路23は比較器22の比較器出力信号の基準時間からの立上
がり及び立下がりの時間t1及びt2を、上記読出用クロッ
ク信号より数十倍速い周波数を有した第2図(f)に示
すような計測用クロック信号で計測して、そのt1+t2/2
をLPF出力信号の波形中心C2を表わす時間とし、太陽像
の中心C1及び読出用クロック信号との関係よりCCD受光
部上の光の入射位置xを計測する。そして、このカウン
タ回路23からの入射位置xデータは図示しない演算部に
導かれ、上述した Θ=tan-1(x/H) の式により太陽光の入射した角度Θが求められる。FIG. 1 shows a light incident position detecting device of a sun sensor according to one embodiment of the present invention. As shown in FIG.
It is incident on 0. The CCD light receiving unit 10 photoelectrically converts sunlight having an intensity distribution as shown in FIG. 2A to generate a CCD output signal (see FIG. 2C).
The signal is output to a low-pass filter (LPF) 21 in response to a read clock signal from the CD drive circuit 20. The LPF 21 removes the clock component from the CCD output signal and outputs the signal to the comparator 22 (see FIG. 2 (d)). This comparator 22 receives the input LPF 20
Compared with the threshold T H of the LPF output signal from the output to the counter circuit 22 (see FIG. 2 (e)). The counter circuit 23 is a comparator 22 the rise and the time t 1 and t 2 falling from a reference time of the comparator output signal, a second view having a several tens of times faster frequency than the read clock signal (f ) to be measured by the measuring clock signal as shown, that t 1 + t 2/2
Was a time representing the waveform center C 2 of the LPF output signal, measures the incident position x of the light on the CCD light receiving unit from the relationship between the center C 1 and the read clock signal of the sun image. Then, the incident position x data from the counter circuit 23 is led to an arithmetic unit (not shown), and the incident angle 太 陽光 of the sunlight is obtained by the above-described equation of Θ = tan −1 (x / H).
なお、上記比較器出力信号の波形中心C2は、太陽光の
強度分布の中心C1に対してtdの遅れが生じるが、その遅
れtdが一定値となることにより、この波形中心C2より太
陽光の強度分布の中心C1を検出することが可能なもので
ある。The waveform center C 2 of the comparator output signal is delayed for td occurs with respect to the center C 1 of the intensity distribution of sunlight, by the delay td is a constant value, from the waveform center C 2 those capable of detecting the center C 1 of the intensity distribution of sunlight.
このように、上記太陽センサの光入射位置検出装置は
CCD出力信号からクロック成分を除去したLPF出力信号を
しきい値と比較し、この比較器出力信号の基準時間から
しきい値範囲の中心までの時間を計測用クロック信号で
計測して前記太陽光の入射位置を検出するように構成し
たことにより、検出の分解能が読出用クロック信号と計
測用クロック信号の周波数の比に応じてCCD受光部10の
画素間隔の数十分の1まで向上させることが可能となる
ために、可及的に検出精度の向上を実現することができ
る。Thus, the light incident position detecting device of the sun sensor is
The LPF output signal obtained by removing the clock component from the CCD output signal is compared with a threshold value, and the time from the reference time of the comparator output signal to the center of the threshold range is measured by a clock signal for measurement and the sunlight is measured. The detection resolution can be improved to one-tenth of the pixel interval of the CCD light receiving unit 10 according to the ratio of the frequency of the read clock signal to the frequency of the measurement clock signal. Is possible, so that the detection accuracy can be improved as much as possible.
なお、上記実施例では、CCD受光部10として画素10aを
リニア式を配列したCCD受光部を用いて構成した場合で
説明したが、これに限ることなく、いわゆるCCDエリア
イメージセンサと称する画素を複数に配列したCCD受光
部を配設して、そのうちの1列を使用して構成すること
も可能である。In the above-described embodiment, the case where the pixels 10a are configured by using the CCD light receiving units in which the linear type is arranged as the CCD light receiving units 10 has been described, but the present invention is not limited to this. It is also possible to arrange the CCD light receiving units arranged in a row and use one of the rows.
また、上記実施例では、CCD出力信号からクロック成
分を除去するのにLPF21を用いて構成したが、これに限
ることなく、バンドパスフィルタ(BPF)を用いて構成
することも可能である。In the above embodiment, the LPF 21 is used to remove the clock component from the CCD output signal. However, the present invention is not limited to this, and it is also possible to use a band-pass filter (BPF).
さらに、上記実施例では、LPF21からのLPF出力信号を
比較器22に入力するように構成したが、これに限ること
なく、これらLPF21と比較器22との間にゲイン調整回路
を介在して構成することも可能である。よって、この発
明は上記実施例に限ることなく、その他、この発明の要
旨を逸脱しない範囲で、種々の変形を実施し得ることは
勿論のことである。Further, in the above embodiment, the LPF output signal from the LPF 21 is configured to be input to the comparator 22, but the configuration is not limited to this, and a gain adjustment circuit may be interposed between the LPF 21 and the comparator 22. It is also possible. Therefore, it is needless to say that the present invention is not limited to the above-described embodiment, but can be variously modified without departing from the gist of the present invention.
[発明の効果] 以上詳述したように、この発明によれば、分解能の向
上を図って、可及的に高精度化し実現し得るようにした
太陽センサの光入射位置検出装置を提供することができ
る。[Effects of the Invention] As described in detail above, according to the present invention, it is possible to provide a light incident position detecting device for a solar sensor that can improve the resolution and achieve as high accuracy as possible. Can be.
第1図はこの発明の一実施例に係る太陽センサの光入射
位置検出装置を示す回路図、第2図は第1図の動作を説
明するために示した波形図、第3図はこの発明の適用さ
れる太陽センサを説明するために示した図、第4図は従
来の光入射位置を検出する手段の問題点を説明するため
に示した波形図である。 10……CCD受光部、10a……画素、11……遮蔽部材、12…
…スリット、20……CCD駆動回路、21……LPF、22……比
較器、23……カウンタ回路。FIG. 1 is a circuit diagram showing a light incident position detecting device for a sun sensor according to an embodiment of the present invention, FIG. 2 is a waveform diagram for explaining the operation of FIG. 1, and FIG. FIG. 4 is a waveform diagram for explaining a problem of a conventional means for detecting a light incident position. 10 CCD receiver, 10a Pixel, 11 Shielding member, 12
... Slit, 20 ... CCD drive circuit, 21 ... LPF, 22 ... Comparator, 23 ... Counter circuit.
───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 平3−195921(JP,A) 特開 昭62−211506(JP,A) 特開 昭62−75307(JP,A) 特開 昭60−27870(JP,A) (58)調査した分野(Int.Cl.7,DB名) B64G 1/36 G01C 1/00,21/02 ──────────────────────────────────────────────────続 き Continuation of the front page (56) References JP-A-3-195921 (JP, A) JP-A-62-111506 (JP, A) JP-A-62-175307 (JP, A) JP-A-60-1985 27870 (JP, A) (58) Fields investigated (Int. Cl. 7 , DB name) B64G 1/36 G01C 1/00, 21/02
Claims (1)
陽光の強度分布に対応した出力信号を読出用クロック信
号に応動して出力する固体撮像素子受光部と、この固体
撮像素子受光部の出力信号からクロック成分を除去する
フィルタ手段と、このフィルタ手段の出力信号をしきい
値と比較する比較手段と、この比較手段の出力信号の基
準時間からしきい値範囲の中心までの時間を計測用クロ
ック信号で計測して前記太陽光の入射位置を検出するカ
ウンタ手段とを具備したことを特徴とする太陽センサの
光入射位置検出装置。1. A solid-state imaging device light-receiving unit for outputting an output signal corresponding to an intensity distribution of sunlight incident through a slit of a shielding member in response to a read clock signal, and a solid-state imaging device light-receiving unit. Filter means for removing a clock component from the output signal; comparison means for comparing the output signal of the filter means with a threshold value; and measuring the time from the reference time of the output signal of the comparison means to the center of the threshold range. A light incident position detecting device for a sun sensor, comprising: counter means for measuring the incident position of the sunlight by measuring the incident clock signal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2260493A JP3023157B2 (en) | 1990-10-01 | 1990-10-01 | Light incident position detector for sun sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2260493A JP3023157B2 (en) | 1990-10-01 | 1990-10-01 | Light incident position detector for sun sensor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH04138998A JPH04138998A (en) | 1992-05-13 |
JP3023157B2 true JP3023157B2 (en) | 2000-03-21 |
Family
ID=17348732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2260493A Expired - Lifetime JP3023157B2 (en) | 1990-10-01 | 1990-10-01 | Light incident position detector for sun sensor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3023157B2 (en) |
-
1990
- 1990-10-01 JP JP2260493A patent/JP3023157B2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH04138998A (en) | 1992-05-13 |
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