JP2994050B2 - Security test support equipment - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a security test support device for supporting the execution of security tests on various devices in a plant.

[0002]

2. Description of the Related Art Conventionally, as a security test support device for supporting the execution of security tests on various equipments of a plant,
For example, there are those described in JP-A-63-135202 and JP-A-62-118407.

[0003] The former security test support device confirms security test conditions, suppresses fluctuations in the operating state of the target device prior to the security test, and after the test is completed, returns to the normal operating state again to secure the security. The test can be performed in a state that is as stable as possible. Further, the latter security test support device is provided with storage means for storing the results of the security test, so that the security test history stored in this storage means can be displayed sequentially.

[0004]

If the result of the security test is not good, the equipment that has been subjected to the security test is inspected and sometimes repaired. There is a high possibility that an abnormality will occur at home. Conventional security test support equipment does not make use of such test results in the next security test at all, and performs it at the same interval as the previous test interval, so equipment failure before the next security test is performed. It often happened, making security tests meaningless to prevent equipment failures.

In the case where the result of the security test is defective, the cause of the failure of the device subjected to the security test is conventionally checked by directly checking various parts of the device or by the support device. The operator called the security test history of the target device, and the operator himself estimated the cause of the failure by looking at the huge data.

In such a conventional security test support device, as described above, only the security test history is displayed, and the security test history cannot be used for the next security test, so that an effective security test cannot be performed. There was a problem.

The present invention has been made in view of such conventional problems, and makes use of the security test history in the next security test to make the security test more effective and improve the stable operation of the plant. An object of the present invention is to provide a security test support device that can be designed.

[0008]

A security test support device for achieving the above object is provided with an input for inputting a cause of a device failure.
Force equipment and the results of security testing indicate that the equipment is
Device status determining means for determining whether or not the security test
The results of the security test and the results of the security test.
Storage means for storing the cause of the failure, and the device state determination means
When it is determined that the device is defective,
From the storage means, the past of similar security test results
Select security tests and review the security
A failure cause extracting means for extracting a good cause;
Display means for displaying the cause of failure.
It is a sign. Here, the display means is configured to
A good cause is displayed and the corresponding past security test
It is preferable to display the result of the test. In addition, the security
Strike support apparatus, instructs the implementation of safety test to the control device of the regular basis the device, the device status determination
If the device is determined to be defective by the means ,
A test instruction unit for instructing the control device of the appliance to perform a security test again may be provided .

Further , the security test support device includes an execution interval storage means for storing an execution interval of the security test, and a control device of a target device in accordance with the execution interval stored in the execution interval storage means. Test instruction means for instructing a security test to be performed, and the device state determination means
When it is judged that the Symbol device is defective by, it may be provided and working distance changing means for shortening the implementation interval stored in the exemplary interval storage means.

[0010] Here, the execution interval changing means, when the equipment is judged to be good once or twice or more continuously in a security test performed after the execution interval is once shortened, is executed. Preferably, the interval can be changed to the original implementation interval.

[0011]

[0012]

In general, when a security test determines that a target device is defective, the security test is performed again to determine whether the device itself is defective or the test environment is bad. Often implemented. In addition, if the device is determined to be defective, and if the device is actually defective, it is likely that a failure will occur again in a short period of time, so the next security test is often performed early.

Therefore, in the present invention, when the target device is judged to be defective by the device state judging unit, the security control test is performed again by the test instruction unit so that the control device of the device is immediately controlled by the test instruction unit. Is instructed to perform a security test, and a retest is automatically performed. Also, when the target device is determined to be defective,
The execution interval changing unit shortens the execution interval stored in the execution interval storage unit and shortens the interval until the next execution.

Thus, according to the result of the security test,
By automatically changing the period until the next security test, not only the labor of the operator can be reduced, but also plant abnormalities caused by equipment failure can be prevented beforehand, and stable plant operation can be achieved. Can be.

If a security test reveals that a device is defective, it is necessary to immediately inspect and repair the device. In this repair, if the cause of the defect can be grasped in advance, it is not necessary to repair a portion not requiring repair, and the work can be performed in a short time. Therefore, in the present invention, a failure cause extraction unit is provided so that the failure cause can be immediately known to the operator.

The cause of the failure is stored in the storage means in correspondence with the result of each security test. When a security test is performed and it is determined that the device is defective, the defect cause extraction unit selects a past security test stored in the storage unit that is similar to the security test result performed. However, the cause of failure corresponding to this is extracted. The extracted cause of failure is displayed on the display means.

As described above, by estimating the cause of a defect by using the history of the past security test, the repair work of the equipment can be performed quickly and the repair can be surely performed. Stable operation can be achieved.

[0018]

DESCRIPTION OF THE PREFERRED EMBODIMENTS One embodiment of the present invention will be described below with reference to FIGS.

As shown in FIG. 1, the security test support device 1
0 is connected to a process device control device 23 for controlling various devices in the plant and a process information processing device 24 for processing data from various devices in the plant.

The security test support device 10 includes an input unit 11 for inputting various information, a test execution timing processing unit 12 for storing a security test execution interval and having a timer function and designating a security test execution timing. A test permission condition determination processing unit 13 that determines whether or not the device is in a state suitable for performing a security test based on data from the process information processing device 24 after a lapse of the security test execution time.
And a test result storage unit 1 for storing security test results and the like
5 and the test result storage unit 1 by controlling data from each unit.
5 and the test result storage unit 15
, A display unit 16 for displaying various data, and a test instruction processing unit 17 for instructing the process equipment control unit 23 to execute a security test. And the process information processing device 2
And a test result judging section 18 for judging whether or not the target device is good based on the security test result data from the test device 4. The plant equipment group 26 is provided with a test switch 28 so that a security test can be performed by a manual operation of an operator.

As shown in FIG. 2, the security test support device 10 is provided as a device for performing a security test on various plant equipment of a plant to which a combined cycle is applied.

The plant equipment group 26 of this plant includes an air compressor 26A, a gas turbine 26B, a generator 26C,
Steam turbine 26D, condensate pump 26E, circulating water pump 26F, condenser backwash valve 26G, high pressure steam control valve 26H,
It is composed of a low-pressure steam control valve 26I, a high-pressure main steam stop valve 26J, a low-pressure main steam stop valve 26K, a condenser 26L, and the like, and a sensor (not shown) for detecting a state of each device.
Is supplied to the process information processing device 24 as process information indicating the operation state of the plant.

Next, the operation of the security test support apparatus 20 configured as described above will be specifically described by taking security tests for various devices as examples.

First, a security test of the high-pressure main steam stop valve 26J will be described with reference to FIGS. FIG. 3 illustrates the operation of each part in the security test of the high-pressure main steam stop valve 26J. In the figure, the symbols T ₁ and T ₂ are timers, and A ₁ , A ₂ , A ₃ , A ₄ , A ₅ , A ₆ ,
The A ₇ is AND logic, O1, O2 and the OR logic, N _1, N
₂ , N ₃ and N ₄ indicate NOT logic.

In this embodiment, the time when the state of the equipment to be tested is in the test executable state is the time when the high-pressure main steam stop valve 26J is fully open for 24 hours, so that the high-pressure main steam stop valve 26J fully open state monitors the fully open state is set to output the signal from the timer T ₁ of the test execution timing processor 12 when continued for 24 hours. Since the security test for the high-pressure main steam stop valve 26J is performed once a day, the security test may be performed 24 hours after the previous test is performed.
Therefore, and as to output a signal for designating the test time from the timer T ₁ when the high-pressure main steam stop valve 26J becomes 24 hours fully open. Further, since the high-pressure main steam stop valve 26J is often closed once within 24 hours, the test timing for the high-pressure main steam stop valve 26J is set to 24 hours.
If the time is set, the security test for the high-pressure main steam stop valve 26J can be omitted. That is, the purpose of the security test for the high-pressure main steam stop valve 26J is to confirm that the valve is not sticky and can be closed at the time of a trip to properly shut off steam. For this reason,
By setting the test time as described above, unnecessary test operations can be omitted.

When a security test is performed on the high-pressure main steam stop valve 26J, a test permission condition determination processing unit 13 determines whether or not the operation state of the plant satisfies the test conditions before the start of the security test. When making this determination, the state in which the load on the plant, for example, the load on the generator has been 50% or more, has continued for 10 minutes or more.
K fully open, high pressure steam control valve 26H fully open, low pressure steam control valve 2
It is determined whether or not the 6I fully open condenser 26L satisfies the AND condition of normal vacuum. Then, when the AND condition is satisfied and the high-pressure main steam stop valve 26J is fully opened for 24 hours, the test instruction processing unit 17 instructs the process device controller 23 to execute a security test for the high-pressure main steam stop valve 26J. Prompt. When the test switch 28 has been operated to the automatic side, the test solenoid valve is excited by the execution command, and the high-pressure main steam stop valve 26J is closed.

When the test switch 28 is not operated to the automatic side, an operation message "Please carry out the open / close test of the high-pressure main steam stop valve."
2 is displayed on the screen. When the operator operates the manual test switch 28 based on the operation message, the test solenoid valve is excited, and the high-pressure main steam stop valve 26J is operated.
Is closed. The operation message can also be given by voice. Outputting the operation message is effective when the operator forgets to operate the test switch 28.

After the high-pressure main steam stop valve 26J is closed, the test solenoid valve is de-energized, and the high-pressure main steam stop valve 2 is closed.
6J returns to the fully open state, and the security test ends. When the security test is completed, the high-pressure main steam stop valve 26
The test result determination unit 18 determines whether J is good or not. This determination is made based on the following three items. (1) The required test time is within the specified value. (2) The valve opening change rate during the short time during the test is the specified value. (3) Almost the same as the normal valve opening / closing pattern (time vs. valve opening) When all the conditions are satisfied, the test result is displayed as good, and otherwise, the test result is displayed as bad.

It is to be noted that a more accurate determination result can be obtained by setting the required time using the main steam pressure as a parameter in advance for the required time of the test and the specified value (normal value) of the valve opening change rate. . By preparing a plurality of patterns using the main steam pressure parameter as the valve opening / closing pattern, a more accurate determination result can be obtained.
The security test is performed during load operation, but when the plant is controlled by the AFC signal from the central power dispatching center, the load control ALR mode (power plant side main control mode) is more stable. It is possible to carry out a security test in an appropriate state.

As described above, in the present embodiment, the security test can be automatically executed only when the operation state of the plant is in a state suitable for the security test, so that the operation state of the plant is adversely affected. Therefore, a security test can be performed and the burden on the operator can be reduced.

Here, a display example of the security test result will be described with reference to FIG. On the security test display screen, operation item names, test dates and times, test pass / fail judgment results, operation curves, and the like are displayed. This screen can be constantly displayed on the screen of the display unit 16 during the test, and the test process can be monitored by an operation curve.
It is also possible to automatically display only in the case of. In addition, since the security test is often based on the results of the previous time, the results of the previous or previous time (the operation curves shown by the two-dot broken line in FIG. 4) are now performed ( It is also possible to display in addition to the operation curves shown by solid lines in FIG. The result of the security test is stored in the test result storage unit 1 as a security test history.
5, and the contents can be sequentially displayed on the display unit 16 by operating the input unit 11.
When it is determined by the security test that the high-pressure main steam stop valve 26J is defective, “NO” is displayed on the screen and the cause of the failure is also displayed.

The display of the cause of the failure will be described with reference to the flowchart of FIG. When the security test is performed (Step 11), the test result determination unit 18 determines whether the test result is acceptable (Step 12). If the test result is good, "good" is immediately displayed on the screen (step 13). If the test result is bad,
The storage processing unit 14 searches the test result storage unit 15 (step 14), and if there is no similar record (step 1).
5) In addition to displaying "No" of the test result, a failure cause candidate registered in advance is displayed (step 17).
Here, as possible causes of the failure of the high-pressure main steam stop valve 26J, “abnormal valve stick”, “abnormal test solenoid valve”, and “abnormal valve opening detection system” are cited. Now, all of these are displayed. If there is a similar result (step 15), "No" of the test result is displayed, and the failure cause of the similar result among the above-mentioned failure cause candidates is displayed separately from other failure causes (step 16). ).

In this embodiment, since a similar cause of failure is "abnormal stick stick", the color of the display area is changed to distinguish it from other causes of failure. Similar past results (operation curves shown by one-dot broken lines in FIG. 4) are displayed on the screen together with the present results and the previous results.

The cause of the failure is actually confirmed at the time of the inspection of the equipment after the security test result is determined to be defective, and the result is stored in the input unit 11 in correspondence with the security test result and stored. It is input to the unit 15. The operation of extracting the cause of the defect from the past results in Steps 14 and 15 is performed by the storage processing unit 14. As described above, when the cause of the defect is displayed, the operator takes action to eliminate the cause of the defect. However, in actuality, the operator repeats the same security test again as a “reproduction test”. Often, the cause is determined.

In this embodiment, a security test to be performed again is automatically performed. This operation will be described with reference to the flowchart of FIG. A security test is performed (step 21), and when it is determined that the test result is good (step 22), "good" is immediately displayed as described above (step 27), but the test result is bad. Is determined (step 22), the security test is performed again (step 23). Then, after the number of retests is counted (step 24), the result of the retest is determined (step 25). At this time, if the test result is bad, “No” is immediately displayed. If the test result is good, it is determined whether the number of retests is the first time (step 26), and then the retest is performed again (step 23). If the test result is bad (step 25), "No" is displayed on the screen (step 28), and if the test result is good (step 2).
5) Since the second retest is good, the first security test is judged to be a test error due to the influence of the test environment or the like, and "good" is displayed on the screen (step 27). Here, an instruction re-test, as well as the first safety test, but carried out at the test instruction processing unit 17, the determination at test permission condition determination processing unit 13, the AND condition of the timer T ₁ is not considered That is, the test timing is not considered, but only whether the high-pressure main steam stop valve 26J is in a state suitable for performing the test.

In this embodiment, the retest is performed twice. However, the number of retests cannot be fixedly determined, but is determined for each device in consideration of the importance of the device. It should be. Therefore, the number of retests may be one if the importance of the device is low, or may be three or more if the importance of the device is high.

If the result of the security test is not good, there is a method of immediately re-testing as described above.
Separately or in combination, the security test may be performed at a shorter interval. In other words, if the result of the security test is bad, the cause will be investigated and the countermeasures will be taken, for example, by the above-mentioned retest.
It is conceivable that the failure once occurs in the device once the failure has occurred, so that it is desirable to advance the next security test execution time (for example, to half the normal cycle). This is similar to the case where a human is found to have abnormalities during the annual health checkup,
Even if this is completely cured, for the time being, measures are taken such that the frequency of diagnosis is, for example, once every six months.

A method of shortening the security test execution interval when the result of the security test is defective will be described with reference to the flowchart of FIG. A security test is performed (step 31). If the test result is good (step 32), the next security test is performed without shortening the test execution interval (step 37). If the result of the security test is bad (step 32), the security test execution interval is shortened (step 32). The execution interval is shortened by the test execution timing processing unit 12 changing the execution interval stored in the test execution timing processing unit 12 in response to an instruction from the test result determination unit 18. Then, the next security test is performed at the shortened execution interval (step 34).
It is determined whether or not the test result is good (step 35). If the test result is good, the execution interval is restored (step 36), and the security test is executed at the regular execution interval from the next time (step 37). If the test result is bad, the next security test is performed with the execution interval shortened (step 37). When the test result is determined to be defective twice consecutively, the execution interval may be further shortened. Also, when the execution interval is restored, the execution interval is not returned when the test result is good twice or more continuously, instead of returning the execution interval to the original one. It may be.

Next, a security test of the high-pressure steam control valve 26H will be described with reference to FIG. When performing the security test of the high-pressure steam control valve 26H, as shown in FIG. 8, by performing the operation at one month, the security test can be automatically performed similarly to the high-pressure main steam stop valve 26J. .

Next, a security test of the ST (Steam Turbin) trip solenoid valve will be described with reference to FIG. Although not shown in FIG. 2, the ST trip solenoid valve controls the high-pressure main steam stop valve 26J.
Two actuators are connected in series to the J actuator.

The security test of the ST trip solenoid valve is performed in such a manner that the execution time of one solenoid valve 1 is one week, the execution time of the other solenoid valve is one week + α, and the test is further executed. Is determined that the steam turbine 26D is not in the stop phase. Since a steam turbine trip is normally performed once a week, it may be performed one week after the previous test. That is, since the ST trip solenoid valve is necessarily de-energized by stopping the unit within one week, this operation is a security test of the ST trip solenoid valve, and the security test can be omitted. However, since the ST trip solenoid valve outputs a trip signal in a non-excited state, two solenoid valves are provided from the viewpoint of malfunction prevention and the interlock is set to AN.
The turbine trip signal is generated based on the condition D.

Therefore, the test of the ST trip solenoid valve must be performed one by one. That is, both S
When the T-trip solenoid valves are simultaneously de-energized, the unit is stopped. Therefore, there is a slight difference α between the execution timings of both ST trip solenoid valves. This difference α needs to be longer than the time required for the ST trip solenoid valve test.

Next, a security test of the ST preceding emergency governor circuit will be described with reference to FIG. The ST preceding emergency governor circuit is a circuit for preventing a sudden increase in the turbine speed when the load on the steam turbine 26D suddenly disappears. This circuit is not shown in FIG. In the security test of the ST preceding emergency governor circuit, the execution timing for each of the circuits A, B, and C is set to one week, and the start condition and the stop phase are not determined as the determination conditions for performing the security test. That is, it is performed on condition that the steam turbine is in operation.

Next, a security test of the ST emergency oil pump will be described with reference to FIG. In order to carry out the security test of the ST emergency oil pump, the state where the oil pump is stopped is 1
The time continued for a week is set as the execution time, and it is detected that the test phase is not the start phase and the stop phase is not the test phase. Then, the oil pump is deactivated by the execution command, the oil pressure is reduced, and the oil pump is activated. When the oil pump is stopped, the test valve is set to the normal side and the oil pump is stopped on condition that the discharge pressure of the oil pump has become equal to or higher than a specified value for a certain period of time.

Next, a security test of the condenser backwash valve 26G will be described with reference to FIG.

The safety test of the condenser backwash valve 26J is performed when the backwash valve normal washing position is continued for 24 hours.
Seawater system master not in progress, circulating water pump 26F
During operation, the fact that the condenser 26L is in a normal vacuum state is implemented as a test condition determination item.

When the security test of the condenser backwash valve 26G is automatically performed, the condition is that the backwash operation of the condenser backwash valve 26G is automatically performed and the condenser backwash position is reached. 30
After a minute, the backwash valve 26G is returned to the normal wash position. Then, the quality of the execution result is displayed based on whether the backwash valve 26G is in the backwash state or the normal wash state. And when the implementation result is negative, the backwash valve stick as the presumed cause,
A failure of the electric system of the backwash valve motor is displayed.

As described above, the security tests of the high-pressure main steam stop valve 26J, the high-pressure steam control valve 26H, the ST trip solenoid valve, the preceding emergency governor circuit, the ST emergency oil pump, and the condenser backwash valve 26G are specifically described. As explained in
Needless to say, the security test support device 10 performs a re-security test, displays the cause of the failure, and the like, other than the high-pressure main steam stop valve 26J, similarly to the high-pressure main steam stop valve 26.

As described above, the results of the security test for various devices are stored in the test result storage unit 15 as described above. Since the security test is repeatedly performed, the storage capacity required for the security test support device 10 becomes enormous. There is a storage period for storing the results of the security test based on laws and regulations or the standards set by each power plant, etc. After this period, the items to be deleted should be deleted to avoid unnecessary memory increase and confusion of information. Becomes

Since various methods can be considered for erasing the security test result, the erasing method will be described with reference to FIG. Carry out security tests (steps 41 and 42),
When storing the results, the storage processing unit 14 determines whether or not any of the test results stored in the test result storage unit 15 has passed the storage expiration date (step 4).
3). If there is no one whose storage period has expired, this test result is immediately stored in the test result storage unit 15. If there is a storage whose expiration date has passed, it is deleted by the following three methods from among those whose storage expiration date has passed in consideration of the importance of the test result and the importance of the target device.
Case 1: Everything whose storage period has expired is deleted (step 44-1). Case 2: All the storages whose storage expiration dates have passed are deleted except for those whose test results are defective (step 44-2). Therefore, even if the storage period has expired, a test result with a bad test result is stored. Case 3: Of the items whose storage period has expired, all items are deleted except for those with bad test results and test items with good test results and execution dates (step 44-).
3). When the erasure of the expired storage is completed, the test result is stored (step 45). In this test result storage, the retest result is of course stored, but whether to save the test result before retest by rewriting it or to add the retest result to the test result before retest and save it I do not care.

Even if the storage expiration date has passed, for a test that must be stored, such as a very unusual test result, a code indicating that data cannot be erased is added to the beginning of the test result data. You may make it impossible to erase.

The results of the security test can be displayed in detail as described with reference to FIG. 4. However, as shown in FIG. 14, the security test for each device is simply displayed in a totaled form. You can also. On this display screen, the test item, the date and time of execution, the execution result, the cause of failure, and the like are displayed. These can be sequentially retrieved from the test result storage unit 15 as needed and displayed on the display unit 16, and can also be output as a security test execution result report from a printer (not shown in FIG. 1). it can.

[0053]

According to the present invention, the next security test time can be advanced in accordance with the result of the security test, and the security test can be performed before a plant abnormality or the like due to equipment failure occurs. Therefore, plant abnormalities can be prevented beforehand, and stable operation of the plant can be achieved.

Further, since the cause of the failure can be estimated and the cause of the failure can be grasped by using the history of the past security test, the repair work of the equipment can be performed quickly and the reliable repair can be performed. So, as above,
A stable operation of the plant can be achieved.

[Brief description of the drawings]

FIG. 1 is a functional block diagram of a security test support device according to one embodiment of the present invention.

FIG. 2 is a system diagram of a power plant according to the present embodiment.

FIG. 3 is an explanatory diagram showing an operation of a security test of the high-pressure main steam stop valve according to the embodiment.

FIG. 4 is an explanatory diagram of a display screen of a security test result according to the present embodiment.

FIG. 5 is a flowchart for estimating a cause of failure according to the embodiment;

FIG. 6 is a flowchart illustrating a procedure for performing a re-security test according to the present embodiment.

FIG. 7 is a flowchart illustrating a procedure of performing a security test with a reduced execution interval according to the present embodiment.

FIG. 8 is an explanatory diagram showing an operation of a security test of the high-pressure steam control valve according to the embodiment.

FIG. 9 is an explanatory diagram showing an operation of a security test of the ST trip solenoid valve according to the embodiment.

FIG. 10 is an explanatory diagram showing an operation of a security test of the preceding emergency governor circuit according to the embodiment.

FIG. 11 is an explanatory diagram showing an operation of a security test of the ST emergency oil pump according to the embodiment.

FIG. 12 is an explanatory diagram showing an operation of a safety test of the condenser backwash valve according to the present embodiment.

FIG. 13 is a flowchart illustrating a security test result recording procedure according to the present embodiment.

FIG. 14 is an explanatory diagram for describing the contents of a security test execution result report according to the present embodiment.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 10 ... Security test support apparatus, 11 ... Input part, 12 ... Test execution timing processing part, 13 ... Test permission condition judgment processing part, 14 ... Storage processing part, 15 ... Test result storage part, 1
6 display unit, 17 test instruction processing unit, 18 test result determination unit, 23 process device control device, 24 process information processing device, 26 plant equipment group.

──────────────────────────────────────────────────続 き Continuing on the front page (72) Inventor Makoto Futagawahara 3-1-1 Sachimachi, Hitachi-shi, Ibaraki Pref. Hitachi, Ltd. Hitachi Plant (72) Inventor Masayuki Fukai 3-1-1 Sachimachi, Hitachi-shi, Ibaraki No. 1 Hitachi, Ltd., Hitachi Plant (72) Inventor Satoshi Kusaka 3-1-1, Sakaimachi, Hitachi, Ibaraki Pref. Hitachi, Ltd. Inside Hitachi Plant (56) References JP-A-1-305108 (JP) JP-A-64-36040 (JP, A) JP-A-63-145588 (JP, A) JP-A-64-88892 (JP, A) (58) Fields investigated (Int. Cl. ⁶ , DB G01D 21/00 G05B 23/02 G07C 3/00-3/06

Claims (5)

(57) [Claims] 1. A security test support apparatus for supporting the execution of a security test performed on various devices in a plant, wherein the input means for inputting the cause of the failure of the device and the result of the security test indicate that the device is good. Whether or not
Device status determination means for determining whether the device is defective, storage means for storing the result of the security test, and the cause of failure in accordance with the result of the security test, and the device status determination means When the security test is performed, a past security test similar to the security test result is selected from the storage unit , and a failure cause extraction unit for extracting a failure cause in the past security test is provided. A security test support device comprising: display means for displaying. Wherein said display means, said displays an failure cause, corresponding the security test support device according to claim 1, wherein the results of the past security testing and displaying. 3. instructs the implementation of safety test to the control device of the regular basis the device, the device state determining means
By when it is determined that the device is defective, again, characterized in that it comprises a test instruction means for instructing the implementation of safety test to the control unit of the device 請
The security test support device according to any one of claims 1 and 2 . 4. An execution interval storage unit for storing an execution interval of a security test, and a test instruction for instructing a control device of the device to execute a security test in accordance with the execution interval stored in the execution interval storage unit. characterized in that it comprises means, when it is judged that the Symbol device is defective by the apparatus state determining means, and working distance changing means for shortening the implementation interval stored in the exemplary interval memory means The method according to any one of claims 1 and 2,
Security test support device. 5. The security device according to claim 1, wherein the execution interval changing means determines that the device is good at least once or twice continuously in a security test performed after the execution interval is once shortened.
The security test support device according to claim 4, wherein the execution interval is changed to an original execution interval.