JP2965348B2 - Recording device setup method - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a dark potential and exposure in a recording apparatus which forms an electrostatic latent image on a photosensitive material and records the electrostatic latent image by developing with toner. It is about the quantity setup method.

[Conventional technology]

A setup in a conventional copying machine will be described with reference to FIGS.

FIG. 4 is a view showing an example of a copying machine using a belt as a photosensitive material, in which 11 is a platen, 12 is a reference density patch, 13
Is an exposure lamp, 15 is a mirror, 16 is an imaging lens, 17 is a shutter, 18 is a mirror, 20 is a charge corotron (CC), 21
Is a surface electrometer (ESV sensor), 22 is an amplifier, 30 is a CPU, 31
Is a ROM, 32 is a RAM, 33 is a non-volatile memory (NVM), 34 is a high-voltage power supply circuit, and 35 is a drive circuit.

When the power switch is turned on as in the first use of the copier in the morning, the main motor is turned on, the photosensitive material belt 10 is driven, the exposure lamp 13 is turned on, and the shutter 17 is closed. On the other hand, when the CPU 30 receives the power ON signal based on the control program of the ROM 31, the CPU 30 sends a control signal to the high-voltage power supply circuit 34 and power is supplied to the CC 20. CC
20 discharges at a predetermined rise time to uniformly charge the entire surface of the photosensitive material 10, the charged potential is detected by the ESV sensor 21, and the detected value is taken into the CPU 30.

On the other hand, the reference value of the dark potential (VDDP) is set in the NVM 33, the CPU 30 compares the read surface potential with the reference value, and sends a control signal to the high-voltage power supply circuit 34 based on the difference,
The grid voltage of CC20 is controlled so that VDDP becomes equal to the reference value. VDDP by such a feedback system
Is controlled to become the reference value set in the NVM 33.

When VDDP is set, the shutter 17 is opened, and the reference density (0.2 Gra
y) Irradiate the patch with light, and the optical image of the patch is mirror 15,
An image is formed on the photosensitive material 10 through the lens 16, the shutter 17, and the mirror 18. As a result, the potential on the photosensitive material decreases, and the potential is read by the ESV sensor 21 and taken into the CPU 30.

The CPU 30 compares the potential with the reference density of 0.2 Gray set in the NVM 33, and drives the exposure lamp 13 through the drive circuit 35.
Is controlled. As a result, the light amount of the exposure lamp changes, and the light amount reflected from the reference density patch 12 changes, so that the potential on the photosensitive material also changes. The changed surface potential is read again, and the CPU 30 controls the current of the exposure lamp through the drive circuit 35 in the same manner as compared with the reference density potential. The feedback system controls the photosensitive material potential at the exposed portion to be V0.2G.

FIG. 5 is a diagram showing the time course of the above-described VDDP setup and V0.2G setup. First, VDDP is set up in steps of about 20 seconds so that VDDP becomes a reference value.
After VDDP setup is completed, the next exposure is
In about 20 seconds, the potential of the exposed part becomes the reference value
V0.2G setup will be performed.

Figure 6 shows the ESV sensor and CC for VDDP setup
It shows the change of the grid control signal (V grid remote). As shown in the figure, the CPU 30 first sends the initial output value of the CC grid to control the CC, and reads the photosensitive material surface potential at that time with the ESV sensor, and sequentially. By increasing the CC grid control signal, complete the setup when the detection value of the ESV sensor falls within a certain allowable range with respect to the reference level, and the sampling value is within the allowable range of a predetermined number of times. I have.

In such a VDDP, V0.2G setup, rough potential setting by power ON is performed, but during operation, finer control of VDDP or exposure amount is performed.

[Problems to be solved by the invention]

By the way, in the conventional copier, when power is turned on, VDD
The setup of P and V0.2G is performed, but the rise time of the CC and ESV sensors, and when a belt is used as the photosensitive material, due to the long distance from the CC to the ESV sensor, etc. The setup takes approximately 40 seconds as schematically shown in the figure, and if set up every time the power is turned on / off as in the past, the user's waiting time is unnecessarily lengthened and the work efficiency is reduced. I might let it. In addition, it may be turned ON / OFF frequently during maintenance,
If the setup takes 40 seconds each time, there is a problem that maintenance work is hindered. In addition, there is a situation in which power is not turned on / off in specifications in foreign countries, particularly in the United States and the like. Therefore, in a multinational model, it is not possible to cope with a system in which setup is triggered by turning on the power.

 The present invention has been made to solve the above problems.

An object of the present invention is to prevent setup from being performed every time the power is turned on / off.

It is another object of the present invention to avoid set up when the fuser temperature is high.

Another object of the present invention is to ensure that setup is performed even in a multinational model.

[Means and actions for solving the problem]

The present invention focuses on the fact that the temperature of the fuser is high during use and turns off the fuser when not in use or low because it is controlled at low temperature, and when the power is turned on or when any key is operated If the temperature of the fuser is detected and the value is equal to or higher than the predetermined value, the unused time is short, so the setup is not performed, the detected temperature is lower than the predetermined value, and then the fuser temperature when the start key is pressed is lower than the predetermined value. If the value is equal to or more than the value, the setup is performed.

The fuser is automatically turned off or low-temperature controlled when the timer reaches the unused time that can be set in one-hour increments by the timer. In this case, the fuser temperature can be reduced from about 200 ° C to about one hour. Drop to room temperature. Therefore, the fuser temperature is checked when the power is turned on or an arbitrary key is operated, and if the temperature is lower than the predetermined temperature, it is determined that the fuser has not been used for a long time, and when the start key is pressed, the fuser temperature becomes higher than the predetermined value. If this is the case, the fuser heat roll is also driven to rotate, so by performing the setup, it is possible to prevent the setup from being performed every time the power is turned ON / OFF, and to set up the trigger for the multinational model. Can also be handled.

〔Example〕

 Hereinafter, embodiments will be described with reference to the drawings.

FIG. 1 is a schematic configuration diagram showing an embodiment of the present invention, FIG. 2 is a diagram showing a change in fuser temperature, and FIG. 3 is a diagram showing a flow of the present invention. Note that the configuration shown in FIG. 1 is basically the same as that shown in FIG. 4, and therefore a brief description thereof will be omitted.

In FIG. 1, the CPU 30 monitors a fuser temperature signal, an arbitrary key pressing signal or a power ON signal, and a start key pressing signal as conditions for starting the setup, and performs the setup when these satisfy predetermined conditions.

As shown in FIG. 2, the temperature of the fuser is reduced by turning off the power, and is reduced to approximately room temperature in 1 to 2 hours. Therefore, for example, a temperature like T2 is set, and the power is turned on before the fuser temperature drops to that point,
In the case of the characteristic A in the figure where the fuser temperature rises again, since the unused time is short, the setup is not performed even when the power is turned on. On the other hand, unused time is long,
If the fuser temperature is lower than the set temperature T2 when turning on the power or operating any key, the unused time is long, so the fuser temperature will be higher than the set temperature T1 when the start key is pressed afterwards. In this case, the CPU 30 controls the high-voltage power supply circuit 34 and the drive circuit 35 to set up VDDP and V0.2G.

The condition that the fuser temperature is higher than T1 is that the rotation of the fuser heat roll is performed after a temperature at which toner particles or the like attached to the heat roll is melted and the heat roll is not damaged, The setup is performed under the condition that the fuser operates normally.

Next, the setup flow of the present invention will be described with reference to FIG.

When a power-on signal or a signal for depressing an arbitrary key is input, the CPU 30 resets the setup flag from 1 to 0 (step,). Then, the temperature of the fuser heat roll is detected (step), and the detected temperature t and the set temperature are detected.
Compare with T2. If the detected temperature t is equal to or lower than T2, the setup flag is set from 0 to 1 (step, step 2).
If the start key is pressed in this state, the fuser heat roll temperature is detected again (step,). If the detected temperature t is equal to or higher than T1, VDDP and V0.2G are set on condition that the setup flag is 1. Set up (Step ~).

If the fuser heat roll temperature is equal to or higher than T2 in the step, the unused time is short, so that the setup is not performed. In addition, if the fuser heat roll temperature does not reach T1 in the step, the fuser heat roll must wait until the set temperature is reached and the fuser heat roll starts rotating, and in the step, the setup flag is reset for some reason. Is not 1, the set-up is not performed.

〔The invention's effect〕

As described above, according to the present invention, when the fuser temperature is high, the setup is not performed even when the power is turned on / off, so that it is possible to avoid performing the setup every time the power is turned on / off, and particularly during maintenance. Frequent power supply
Since the setup does not have to be performed each time the power is turned on / off, the service work can be smoothly performed. Power ON / OFF
It is possible to surely obtain and execute a setup trigger even for a multinational model that may not perform the operation.

[Brief description of the drawings]

FIG. 1 is a schematic diagram showing an embodiment of the present invention, FIG. 2 is a diagram showing a change in fuser temperature, FIG. 3 is a diagram showing a flow of the present invention, and FIG. FIG. 5 is a diagram showing a temporal state of a conventional VDDP setup, and FIG. 6 is a diagram showing changes in an ESV sensor and a CC grid control signal in the conventional VDDP setup. 11 ... platen, 12 ... reference patch, 13 ... light source, 15 ...
… Mirror, 16… Image forming lens, 17 …… Shutter, 18 ……
Mirror, 20 Charge corotron (CC), 21 Surface voltage meter (ESV), 22 Amplifier, 30 CPU, 31 RO
M, 32 ... RAM, 33 ... NVM, 34 ... High-voltage power supply circuit, 35 ...
... Drive circuit.

──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int. Cl. ⁶ , DB name) G03G 21/00 370-540 G03G 21/14 G03G 15/00 303

Claims (1)

(57) [Claims] 1. A method for controlling a charging device based on a surface potential, setting a photosensitive material dark potential to a predetermined level based on the detected value, and then controlling an exposure amount so that a potential of a photosensitive material exposed portion becomes a predetermined level. A fuser temperature detecting means, wherein a fuser temperature is lower than or equal to a first set temperature T1 when an arbitrary key other than a start key is operated or when power is turned on, and when the start key is pressed. A dark potential and an exposure amount are set up on condition that the temperature is equal to or higher than a second set temperature T2 (T2> T1).