JP2860500B2 - Thermal analysis analyzer - Google Patents

Description

Description: TECHNICAL FIELD The present invention relates to a thermal analysis analyzer.

[Summary of the Invention]

The present invention aims to reduce the time required for analysis that handles a plurality of thermal analysis measurement data, for example, the analysis time for overwriting analysis and the like, the learning time for the analysis operation method, and the development time for the thermal analysis analyzer. A data read unit, a data designator, and a data temporary storage unit, a storage switch unit, a data analyzer, and a data display unit that are faster in storage access time than a plurality of storage units, and a data storage unit designated by the data designator. The above thermal analysis measurement data is stored in the data temporary storage specified by the storage switch, and the data analysis analyzer and data display analyze and display the thermal analysis measurement data on the data temporary storage specified by the storage switch. By doing so, a plurality of thermal analysis measurement data can be analyzed.

[Conventional technology]

2. Description of the Related Art A conventionally used thermal analysis analyzer that handles a plurality of thermal analysis measurement data, for example, an overwrite analyzer, has a configuration as shown in FIG.

The thermal analysis measurement data on the data accumulator 1 designated by the data designator 2 is read into the data temporary storage 6 by the data reader 3. The thermal analysis measurement data read into the temporary data storage 6 is analyzed and displayed by the data analyzer 4 and the data display 9. When the analysis result performed here is subjected to overwriting analysis or the like, the thermal analysis measurement data in the data temporary storage 6 and the analysis result are written into the data storage 1. In the overwriting analysis, the waveform of the thermal analysis measurement data is overlapped. In the case of the apparatus shown in FIG. 2, the thermal analysis measurement data on the data storage unit 1 designated by the data designator 2 is displayed as a data overwrite display.
11 only reads and displays multiple data.

The operation when performing the overwriting analysis with the apparatus shown in FIG. 2 is as shown in the flowchart of FIG. The operation will be described below with reference to FIG. 3. When there is data that needs to be analyzed (in most cases, it is necessary to analyze), data to be read is specified by the data specifying unit 2. Then, the thermal analysis measurement data on the data storage 10 is read into the data temporary storage 6 [S1 to S2]. Analyze while looking at the data read and displayed [S3-S4], and when the analysis is complete,
The thermal analysis measurement data in the temporary data storage 6 is written to the data storage 1 so that the analysis result is also displayed at the next display [S5]. When there is no more data that needs to be analyzed [when S1 is NO], the data is overwritten. In the overwriting display, the thermal analysis measurement data on the data storage unit 1 to be overwritten is specified and read by the data specifying unit 2 [S6]. This is repeated for the required data, and when the reading is completed, the overwriting display is performed [S7 to S8].

[Problems to be solved by the invention]

A thermal analysis analyzer that handles a plurality of thermal analysis measurement data, for example, an overwrite analyzer, is an important process in which analysis is performed by trial and error while comparing a plurality of data. Due to the fact that the part is divided into two parts through the data storage, there are the following disadvantages.

When analyzing data, all data to be overwritten when overwriting data must be specified one by one.

The analyzed data is temporarily stored in the data storage device, and data is read from the data storage device again at the time of overwriting, so that it takes time to complete the overwriting analysis.

According to the above, more operations and more time are required when performing a trial-and-error analysis in which analysis is performed, the overwriting is performed, and the analysis is performed again to view the overwriting.

There are several alternatives to overcome these shortcomings, but we will consider them.

As a first case, the speed of the data storage is increased. This is costly to speed up the entire data storage having a large data capacity. In addition, the disadvantage of multiple operations cannot be overcome.

As a second case, the components of the analysis unit, the data reader 3, the data analyzer 4, the data temporary storage 5, and the data display 16 shown in FIG. 2 are modified so that they can be overwritten. This has a problem in that it takes a long development time to remodel each device, and that the user has to newly learn an operation method for handling a plurality of data in each device.

[Means for solving the problem]

The present invention has been developed to eliminate the above-mentioned disadvantages, and its main components are a data storage, a data designator, a data reader, a storage switch, and a data temporary storage having a shorter access time than a plurality of data storages. And a data analyzer and data display.

[Action]

The operation of the above configuration is as follows. First, data to be subjected to overwrite analysis is designated by a data designator, and a data reader reads data from a data storage in which data exists into a data temporary storage designated by a storage switch, and stores the data. By switching the data temporary storage operated by the switch, the data is analyzed by the data analyzer and displayed by the data display, thereby achieving the purpose of analyzing individual data and displaying a plurality of data in a superimposed manner.

〔Example〕

Hereinafter, the present invention will be described in detail with reference to the drawings shown in one embodiment.

FIG. 1 shows a data storage, which stores a plurality of thermal analysis measurement data. Reference numeral 2 denotes a data designator, which designates the thermal analysis measurement data to be read from the data storage 1 to the data reader 3. The read thermal analysis measurement data is temporarily stored in a plurality of temporary data storages 6 specified by the storage switch 5, and the data analyzer 4 performs thermal analysis of the temporary data storage specified by the storage switch 5. Displays measurement data.

Here, the memory switch will be described in more detail.
FIG. 4 is an internal block diagram of the memory switch 5. In FIG. 4, a switch (1) 17 connects the data reader 3 and each data temporary storage 6. The switch (2) 18 connects the data analyzer 4 and each data temporary storage 6. The switch (3) 19 connects the data display 9 and each data temporary storage 6. Each of the switches 17, 18, and 19 can be automatically switched for each terminal access in addition to manual switching, and the characteristics thereof are programmable. When each switch is set as follows, the switch (1) switches the data temporary storage 5 every time the data reader 3 reads data. The first read data is stored in the first data temporary storage 6, the second read data is transferred to the next data in the temporary storage 6, and the nth read data is stored in the nth data temporary storage. Can be placed.

Switch (2) When the user needs to switch to the data temporary storage 6, which is manually set and contains the data to be analyzed by the user.

Switch (3) Set to manual. The user switches to a temporary data storage device containing data to be displayed when the user needs it.

The operation for performing the overwriting analysis is as shown in the flowchart of FIG. The operation will be described below with reference to FIG.
The data to be subjected to the overwriting analysis is designated by the data designator 2. Then, the thermal analysis measurement data on the data storage 1 becomes 1
The data is read into the temporary data storage 6 [S9]. (At this time, the switch (1) 17 in FIG. 4 indicates the second data temporary storage 6). If the read data needs to be analyzed [when S10 is YES]. The switch (3) 19 in FIG. 4 indicates the first data temporary storage 6 to display data [S11 to S12], and the switch (2) 18 in FIG. The analysis is performed while looking at the data displayed so as to indicate the storage device 6 [S1
3 to S14]. The operations from S9 to S14 are repeated until the data to be overwritten and analyzed is read into each data temporary storage 6 [S15]. When the data to be overwritten is aligned on each data temporary storage 6, a display device such as a plotter in which data displayed once remains remains while switching the switch (3) 19 in FIG. Display the data [S16-S18].

The overwriting analysis is performed by the above operation. Although the number of steps to be operated is increased as compared with the operation of the conventional example shown in FIG. 3, each data temporary storage which can be accessed at a higher speed without performing the operation of writing data into the data storage and reading it again. By putting the data on 6, the analysis time will be shortened, and the time difference when performing analysis by trial and error, such as analysis and overwriting, and analysis and overwriting, will be further widened. In addition, it is possible to use the conventional operation method without learning new operation of the data overwriting display device. A display example in the embodiment of FIG. 6 is provided.
It is clear that each data is overwritten.

FIG. 7 is a block diagram of another embodiment according to the present invention. In FIG. 7, a data storage 1, a data designator 2, a data reader 3, a data analyzer 4, a storage switch 5, and a plurality of temporary data storages 6 are the same as those in FIG. Seventh
A plurality of data display units 29 in the figure are designed to display all the data sent from the storage switching unit 5 even if they are a plurality of data. The display position of each data is specified by a display offset. The offset is provided in each of the X and Y directions by the device 28, and a different line type of each data, a mark for each data point, and the like can be displayed by the display line type / mark designator 30. Here, the setting of the memory switch 24 in FIG. 7 will be described with reference to FIG. When the switch (1) 17, the switch (2) 18, and the switch (3) 19 are set as follows, the switch (1) switches the data temporary storage unit 6 each time the data read unit reads the data. The first read data is placed in the first data temporary storage, and the nth read data is placed in the nth data temporary storage. Switch (2) The first data to be analyzed is the first data The temporary storage is switched to select the data temporary storage for the n-th data to be analyzed n-th.

Switch (3) Switches so that the data read so far is continuously sent to the multiple data display 29. For example, if there is data in the second data temporary storage device and the fifth data temporary storage device 6, the data in the second data temporary storage device 6 and the fifth data temporary storage device 6
Is sent in the order of the data.

The operation at the time of performing the overwriting analysis is a flowchart shown in FIG. Hereinafter, the operation will be described with reference to FIG. 8, where data to be overwritten is designated by the data designator 2. Then, the thermal analysis measurement data on the data storage 1 is read into the first data temporary storage 6 [S19]. If the read data needs to be analyzed, it is displayed (at this time, if there is more than one read data on multiple data temporary storages, multiple data is displayed), and the analysis is performed while looking at the displayed data. Perform [S20-22].

The operations from S19 to S23 are repeated until the data to be overwritten and analyzed is read into the respective data temporary storages 6 and the operation is completed [S23]. When the data to be overwritten is stored in the temporary data storage 6, the display is performed by simply performing the display [S24]. Compared with the operation of the conventional example shown in FIG. 3, the number of steps to be operated and the analysis time are both reduced, and the progress of overwriting can be seen during the analysis, and no special overwriting display is required. Can also get an overlaid display.

Finally, as another method of realizing the storage switching device, a file name may be assigned to each data temporary storage device 6, and input / output of data to / from each data temporary storage device may be realized as access to a file.

Although the embodiments according to the present invention have been described above, the device according to the present invention and the individual components used in the device may be realized by an electric circuit or may be realized by software.
It goes without saying that it belongs to the discretion of the user of the present invention.

〔The invention's effect〕

As described above, according to the present invention, in the analysis device that handles a plurality of thermal analysis measurement data, the plurality of thermal analysis measurement data is placed in the data temporary storage that can be accessed at high speed, and is analyzed and displayed via the storage switch. The analysis time can be shortened. Further, since the components of the conventional analyzer can be used with minimal modification, the learning of the analysis operation method is facilitated, and the development time of the analyzer can be reduced.

[Brief description of the drawings]

FIG. 1 is a block diagram of an embodiment of the present invention, FIG. 2 is a block diagram of a conventional example, FIG.
FIG. 4 is an internal block diagram of the memory switch, FIG. 5 is an operation flow diagram in the embodiment, FIG. 6 is a display example diagram in the embodiment, FIG. 7 is a block diagram of another embodiment according to the present invention,
FIG. 8 is an operation flowchart in another embodiment. DESCRIPTION OF SYMBOLS 1 ... Data storage device 2 ... Data designator 3 ... Data reading device 4 ... Data analyzer 5 ... Storage switching device 6 ... Data temporary storage (1) 7 ... Data temporary storage (2) 8 Data temporary storage (n) 9, 16 Data display 11 Data overwrite display 17 Switch (1) 18 Switch (2) 19 Switch (3) 28 Display offset designator 29 …… Multiple data display 30 …… Display line type / mark designator

Claims (1)

(57) [Claims] 1. A data accumulator storing a plurality of thermal analysis measurement data, a data designator for designating the thermal analysis measurement data on the data accumulator, and the data accumulator designated by the data designator A data reader for reading the thermal analysis measurement data, and the data reader, the data analyzer, and the data display connected to the data reader, the data analyzer, the data display, and a plurality of data temporary storages. A storage switching unit for connecting / switching the input / output of the data and the data temporary storage unit, and temporarily storing the thermal analysis measurement data read by the data reading unit, and an access time of the storage from the data storage unit. A plurality of temporary data storages, and a transition temperature detection / melting heat amount of the thermal analysis measurement data in the temporary data storage specified by the storage switch. A thermal analyzer comprising: a data analyzer for performing analysis such as data output; and a data analyzer for displaying the thermal analysis measurement data of the temporary data storage specified by the storage switch on a display device such as a CRT / plotter. Analysis device.